DE10392545A5 - Elektronische Schaltungsanordnung zur fehlerabgesicherten Analog-/Digital-Umwandlung von Signalen - Google Patents

Elektronische Schaltungsanordnung zur fehlerabgesicherten Analog-/Digital-Umwandlung von Signalen Download PDF

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Publication number
DE10392545A5
DE10392545A5 DE10392545T DE10392545T DE10392545A5 DE 10392545 A5 DE10392545 A5 DE 10392545A5 DE 10392545 T DE10392545 T DE 10392545T DE 10392545 T DE10392545 T DE 10392545T DE 10392545 A5 DE10392545 A5 DE 10392545A5
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DE
Germany
Prior art keywords
error
signals
digital conversion
electronic circuitry
proof
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE10392545T
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English (en)
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DE10392545B4 (de
Inventor
Wolfgang Fey
Mario Engelmann
Peter Oehler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Continental Teves AG and Co OHG
Original Assignee
Continental Teves AG and Co OHG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Continental Teves AG and Co OHG filed Critical Continental Teves AG and Co OHG
Priority to DE10392545.7T priority Critical patent/DE10392545B4/de
Publication of DE10392545A5 publication Critical patent/DE10392545A5/de
Application granted granted Critical
Publication of DE10392545B4 publication Critical patent/DE10392545B4/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1071Measuring or testing
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/1205Multiplexed conversion systems
    • H03M1/122Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages
    • H03M1/1225Shared using a single converter or a part thereof for multiple channels, e.g. a residue amplifier for multiple stages using time-division multiplexing

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)
DE10392545.7T 2002-05-08 2003-05-08 Elektronische Schaltungsanordnung zur fehlerabgesicherten Analog-/Digital-Umwandlung von Signalen Expired - Fee Related DE10392545B4 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE10392545.7T DE10392545B4 (de) 2002-05-08 2003-05-08 Elektronische Schaltungsanordnung zur fehlerabgesicherten Analog-/Digital-Umwandlung von Signalen

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102207623 2002-05-08
DE10220762 2002-05-08
PCT/EP2003/004805 WO2003096540A1 (de) 2002-05-08 2003-05-08 Elektronische schaltungsanordnung zur fehlerabgesicherten analog-/digital-umwandlung von signalen
DE10392545.7T DE10392545B4 (de) 2002-05-08 2003-05-08 Elektronische Schaltungsanordnung zur fehlerabgesicherten Analog-/Digital-Umwandlung von Signalen

Publications (2)

Publication Number Publication Date
DE10392545A5 true DE10392545A5 (de) 2013-09-19
DE10392545B4 DE10392545B4 (de) 2018-03-15

Family

ID=29413725

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10392545.7T Expired - Fee Related DE10392545B4 (de) 2002-05-08 2003-05-08 Elektronische Schaltungsanordnung zur fehlerabgesicherten Analog-/Digital-Umwandlung von Signalen

Country Status (5)

Country Link
US (1) US7135998B2 (de)
EP (1) EP1506616A1 (de)
JP (1) JP4354906B2 (de)
DE (1) DE10392545B4 (de)
WO (1) WO2003096540A1 (de)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005016800A1 (de) * 2005-04-12 2006-10-19 Robert Bosch Gmbh Wandleranordnung und Testverfahren für einen Wandler
DE102005050768A1 (de) * 2005-10-24 2007-04-26 Robert Bosch Gmbh Parametrischer ADC-Test
US7710299B2 (en) * 2007-11-01 2010-05-04 Conexant Systems, Inc. System and method providing channel multiplexing for analog-to-digital conversion
US8174419B2 (en) * 2009-03-31 2012-05-08 Stmicroelectronics S.R.L. Analog-digital converter and corresponding system and method
US8510073B2 (en) * 2009-12-01 2013-08-13 Qualcomm, Incorporated Real-time adaptive hybrid BiST solution for low-cost and low-resource ate production testing of analog-to-digital converters
US8570103B2 (en) 2011-06-16 2013-10-29 Donald C. D. Chang Flexible multi-channel amplifiers via wavefront muxing techniques
CN101931409B (zh) * 2010-08-17 2013-08-14 惠州Tcl移动通信有限公司 一种移动终端及其adc模块的校准装置
US9252799B2 (en) * 2010-09-09 2016-02-02 Spatial Digital Systems, Inc. Receiver with orthogonal beam forming technique
US9496886B2 (en) 2011-06-16 2016-11-15 Spatial Digital Systems, Inc. System for processing data streams
DE102012010143B3 (de) 2012-05-24 2013-11-14 Phoenix Contact Gmbh & Co. Kg Analogsignal-Eingangsschaltung mit einer Anzahl von Analogsignal-Erfassungskanälen
US9136857B2 (en) * 2012-07-02 2015-09-15 Ifineon Technologies Ag ADC with sample and hold
CN105745195A (zh) 2013-11-15 2016-07-06 康宁股份有限公司 氧化烯合成
KR102108322B1 (ko) * 2014-02-25 2020-05-28 삼성전자주식회사 이미지 센서에서의 데이터 이송 장치 및 데이터 이송 방법
US20240128961A1 (en) 2022-10-13 2024-04-18 Eve Energy Co., Ltd. Signal conditioning circuit and measurement device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4774498A (en) 1987-03-09 1988-09-27 Tektronix, Inc. Analog-to-digital converter with error checking and correction circuits
US5185607A (en) * 1992-01-31 1993-02-09 Motorola, Inc. Method and apparatus for testing an analog to digital converter
US5594439A (en) * 1994-08-24 1997-01-14 Crystal Semiconductor Corporation Diagnosing problems in an electrical system by monitoring changes in nonlinear characteristics
JPH08154055A (ja) 1994-11-25 1996-06-11 Oki Electric Ind Co Ltd アナログ/デジタル変換器
US5659312A (en) * 1996-06-14 1997-08-19 Logicvision, Inc. Method and apparatus for testing digital to analog and analog to digital converters
DE19640937B4 (de) 1996-10-04 2013-11-28 Robert Bosch Gmbh Vorrichtung zur Überwachung der Meßwerterfassung bei einer Motorsteuerung
DE19705406A1 (de) * 1997-02-13 1998-08-27 Telefunken Microelectron Verfahren zur Umwandlung analoger in digitaler Signale (A/D-Wandlung)
FR2784193B1 (fr) 1998-10-05 2001-01-05 Texas Instruments France Mecanisme integre permettant une detection de defaillances par test automatique en temps reel pour un convertisseur analogique/numerique
DE19912766A1 (de) 1998-12-03 2000-06-08 Continental Teves Ag & Co Ohg Schaltungsanordnung mit A/D-Wandler für sicherheitskritische Anwendungen
JP2002531986A (ja) 1998-12-03 2002-09-24 コンティネンタル・テーベス・アクチエンゲゼルシヤフト・ウント・コンパニー・オッフェネ・ハンデルスゲゼルシヤフト 安全上重要な用途のためのa/dコンバータを備えた回路装置
DE10037737B4 (de) * 2000-08-02 2007-03-22 Siemens Ag Verfahren und Vorrichtung zur sicheren einkanaligen Auswertung von Sensorsignalen
FR2829321B1 (fr) * 2001-09-05 2004-12-24 Crouzet Automatismes Entree analogique pour circuit electronique

Also Published As

Publication number Publication date
US20050190088A1 (en) 2005-09-01
JP4354906B2 (ja) 2009-10-28
DE10392545B4 (de) 2018-03-15
US7135998B2 (en) 2006-11-14
JP2005525038A (ja) 2005-08-18
EP1506616A1 (de) 2005-02-16
WO2003096540A1 (de) 2003-11-20

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R018 Grant decision by examination section/examining division
R020 Patent grant now final
R119 Application deemed withdrawn, or ip right lapsed, due to non-payment of renewal fee