DE102020108117A8 - TIRFM-fähiges Mikroskop und Verfahren zum Betreiben eines TIRFM-fähigen Mikroskops - Google Patents

TIRFM-fähiges Mikroskop und Verfahren zum Betreiben eines TIRFM-fähigen Mikroskops Download PDF

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Publication number
DE102020108117A8
DE102020108117A8 DE102020108117.0A DE102020108117A DE102020108117A8 DE 102020108117 A8 DE102020108117 A8 DE 102020108117A8 DE 102020108117 A DE102020108117 A DE 102020108117A DE 102020108117 A8 DE102020108117 A8 DE 102020108117A8
Authority
DE
Germany
Prior art keywords
tirfm
capable microscope
microscope
operating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
DE102020108117.0A
Other languages
English (en)
Other versions
DE102020108117A1 (de
DE102020108117B4 (de
Inventor
Michael Schaefer
Klaus Christian SCHUERMANN
Jennifer-Rose Krüger
Frank Wienhausen
Yuya Miyazono
Daniel Krüger
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Evident Technology Center Europe De GmbH
Original Assignee
Olympus Soft Imaging Solutions GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Soft Imaging Solutions GmbH filed Critical Olympus Soft Imaging Solutions GmbH
Priority to DE102020108117.0A priority Critical patent/DE102020108117B4/de
Priority to CN202110305399.4A priority patent/CN113448072B/zh
Priority to JP2021048672A priority patent/JP7179894B2/ja
Priority to US17/210,738 priority patent/US11754826B2/en
Publication of DE102020108117A1 publication Critical patent/DE102020108117A1/de
Publication of DE102020108117A8 publication Critical patent/DE102020108117A8/de
Application granted granted Critical
Publication of DE102020108117B4 publication Critical patent/DE102020108117B4/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365—Control or image processing arrangements for digital or video microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
    • G02B27/46—Systems using spatial filters
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B2207/00—Coding scheme for general features or characteristics of optical elements and systems of subclass G02B, but not including elements and systems which would be classified in G02B6/00 and subgroups
    • G02B2207/113—Fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
DE102020108117.0A 2020-03-24 2020-03-24 Mikroskop und Verfahren zum Betreiben eines Mikroskops Active DE102020108117B4 (de)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE102020108117.0A DE102020108117B4 (de) 2020-03-24 2020-03-24 Mikroskop und Verfahren zum Betreiben eines Mikroskops
CN202110305399.4A CN113448072B (zh) 2020-03-24 2021-03-22 具有tirfm能力的显微镜及其操作方法
JP2021048672A JP7179894B2 (ja) 2020-03-24 2021-03-23 Ｔｉｒｆｍ対応顕微鏡、及びｔｉｒｆｍ対応顕微鏡の動作方法
US17/210,738 US11754826B2 (en) 2020-03-24 2021-03-24 TIRFM-capable microscope and method for operating a TIRFM-capable microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102020108117.0A DE102020108117B4 (de) 2020-03-24 2020-03-24 Mikroskop und Verfahren zum Betreiben eines Mikroskops

Publications (3)

Publication Number Publication Date
DE102020108117A1 DE102020108117A1 (de) 2021-09-30
DE102020108117A8 true DE102020108117A8 (de) 2021-11-25
DE102020108117B4 DE102020108117B4 (de) 2023-06-15

Family

ID=77658486

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102020108117.0A Active DE102020108117B4 (de) 2020-03-24 2020-03-24 Mikroskop und Verfahren zum Betreiben eines Mikroskops

Country Status (4)

Country Link
US (1) US11754826B2 (de)
JP (1) JP7179894B2 (de)
CN (1) CN113448072B (de)
DE (1) DE102020108117B4 (de)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6597499B2 (en) 2001-01-25 2003-07-22 Olympus Optical Co., Ltd. Total internal reflection fluorescence microscope having a conventional white-light source
US20150009315A1 (en) 2012-06-05 2015-01-08 Nikon Corporation Microscope apparatus

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5641427B2 (ja) * 2011-01-17 2014-12-17 株式会社ニコン 顕微鏡装置及び観察方法
JP5307868B2 (ja) * 2011-09-16 2013-10-02 オリンパス株式会社 全反射型顕微鏡
US9599805B2 (en) * 2011-10-19 2017-03-21 National Synchrotron Radiation Research Center Optical imaging system using structured illumination
JP6000554B2 (ja) * 2012-01-24 2016-09-28 オリンパス株式会社 顕微鏡システム
JP6396137B2 (ja) * 2014-09-18 2018-09-26 オリンパス株式会社 顕微鏡照明装置、顕微鏡照明方法および顕微鏡
EP3465158B1 (de) * 2016-05-27 2020-11-25 Verily Life Sciences LLC Auf räumlichem lichtmodulator basierende hyperspektrale konfokale mikroskope und verfahren zur verwendung
US10520714B2 (en) * 2016-08-23 2019-12-31 The United States Of America, As Represented By The Secretary, Department Of Health And Human Services Systems and methods for instant total internal reflection fluorescence/ structured illumination microscopy
CN107356566B (zh) * 2017-03-30 2019-07-30 浙江大学 宽场三维超高分辨定位和成像方法与装置
CN108742532B (zh) * 2018-06-08 2020-04-24 清华大学 基于时空聚焦的宽视场层析超光谱显微成像方法及装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6597499B2 (en) 2001-01-25 2003-07-22 Olympus Optical Co., Ltd. Total internal reflection fluorescence microscope having a conventional white-light source
US20150009315A1 (en) 2012-06-05 2015-01-08 Nikon Corporation Microscope apparatus

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
KOGEL, A. ; KALWA, H. ; URBAN, N ; SCHAEFER, M. : Artifact-free objective-type multicolor total internal reflection fluorescence microscopy with light-emitting diode light sources—Part I, in: Journal of Biophotonics, Vol. 12, Issue 11, 2019, S. 1 – 11, ISSN: 1864-0648
SCHAEFER, M. ; KALWA, H. : Theoretical background of light-emitting diode total internal reflection fluorescence microscopy and photobleaching lifetime analysis of membrane-associated proteins—Part II, in: Journal of Biophotonics, Vol. 13, Issue 4, 2020, S. 1 – 14, ISSN: 1864-0648

Also Published As

Publication number Publication date
DE102020108117A1 (de) 2021-09-30
DE102020108117B4 (de) 2023-06-15
CN113448072B (zh) 2023-07-14
JP7179894B2 (ja) 2022-11-29
JP2021167941A (ja) 2021-10-21
US11754826B2 (en) 2023-09-12
CN113448072A (zh) 2021-09-28
US20210302714A1 (en) 2021-09-30

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Representative=s name: BALS & VOGEL PATENTANWAELTE PARTG MBB, DE

R016 Response to examination communication
R018 Grant decision by examination section/examining division
R081 Change of applicant/patentee

Owner name: EVIDENT TECHNOLOGY CENTER EUROPE GMBH, DE

Free format text: FORMER OWNER: OLYMPUS SOFT IMAGING SOLUTIONS GMBH, 48149 MUENSTER, DE

R020 Patent grant now final