DE102006049120A1 - An organic photodiode imager and method of making the same - Google Patents
An organic photodiode imager and method of making the same Download PDFInfo
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- 229910004262 HgTe Inorganic materials 0.000 description 1
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14665—Imagers using a photoconductor layer
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
- H10K30/30—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation comprising bulk heterojunctions, e.g. interpenetrating networks of donor and acceptor material domains
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- H—ELECTRICITY
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/10—Transparent electrodes, e.g. using graphene
- H10K2102/101—Transparent electrodes, e.g. using graphene comprising transparent conductive oxides [TCO]
- H10K2102/103—Transparent electrodes, e.g. using graphene comprising transparent conductive oxides [TCO] comprising indium oxides, e.g. ITO
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- H—ELECTRICITY
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- H10K39/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic radiation-sensitive element covered by group H10K30/00
- H10K39/30—Devices controlled by radiation
- H10K39/32—Organic image sensors
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
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- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/211—Fullerenes, e.g. C60
- H10K85/215—Fullerenes, e.g. C60 comprising substituents, e.g. PCBM
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Abstract
Die Erfindung betrifft einen Bildaufnehmer, wie eine Digitalkamera und/oder eine Videokamera, die für verschiedene Spektralbereiche, wie auch beispielsweise für den Infrarot-Spektralbereich, einsetzbar ist.The invention relates to an image recorder, such as a digital camera and / or a video camera, which can be used for different spectral ranges, as well as for example for the infrared spectral range.
Description
Die Erfindung betrifft einen Bildaufnehmer, wie eine Digitalkamera und/oder eine Videokamera, die für verschiedene Spektralbereiche, wie auch beispielsweise für den Infrarot-Spektralbereich, einsetzbar ist.The The invention relates to an imager, such as a digital camera and / or a video camera for different spectral ranges, as for example for the infrared spectral range, can be used.
In digitalen Bildaufnehmern werden als Auslesechips CCD oder CMOS (Complementary Metal Oxide Semiconductor) Chips mit mehreren Megapixeln Auflösung eingesetzt.In digital imagers are used as readout chips CCD or CMOS (Complementary Metal Oxide Semiconductor) chips with a resolution of several megapixels.
Speziell CMOS Chips setzen sich immer mehr gegenüber CCD Chips durch, da diese CMOS Chips bereits sehr viel Logik in dem Chip integriert haben. Neben der aktiven Fläche ist eine Vielzahl weiterer Funktionen wie Weißabgleich, Belichtungskontrolle, etc. bereits im Chip integriert. Weiterhin erfolgt die Analog-Digital-Wandlung ebenfalls im Chip, so dass alle externen Signale bereits digital vorhanden sind. Diese Bildaufnehmer haben eine typische Baugröße von einigen mm2 bei einer Pixelgröße zwischen 2 und 10 μm. Die Chips werden in herkömmlicher Halbleitertechnologie aus Silizium gefertigt. Jeder Bildpunkt hat einen Dünnfilmtransistor (TFT) als Schalter und einer Photodiode zur Detektion des einfallenden Lichts. Dies nennt man auch Aktiv-Matrix-Ansteuerung.Especially CMOS chips are becoming more and more common with CCD chips because these CMOS chips already have a lot of logic integrated into the chip. In addition to the active surface, a variety of other functions such as white balance, exposure control, etc. already integrated in the chip. Furthermore, the analog-to-digital conversion also takes place in the chip, so that all external signals are already available digitally. These image recorders have a typical size of a few mm 2 with a pixel size between 2 and 10 μm. The chips are made of silicon using conventional semiconductor technology. Each pixel has a thin film transistor (TFT) as a switch and a photodiode for detecting the incident light. This is called active matrix control.
Nachteilig an den bisher bekannten CMOS Bildaufnehmern ist, dass sie wegen der herkömmlichen Halbleitertechnologie auf Silizium basierend hohe Herstellungskosten haben. Zudem ist es nicht möglich, mit der auf Silizium basierenden Photodiode einen Bildaufnehmer für einen breitbandigen Bereich zu schaffen, weil die Silizium-Photodioden in ihrem Empfindlichkeitsbereich festgelegt sind (ca. 350 bis 1000 nm).adversely on the previously known CMOS imagers is that because of the conventional one Semiconductor technology based on silicon high production costs to have. Moreover, it is not possible with the silicon-based photodiode an imager for one to create broadband area, because the silicon photodiodes within their sensitivity range (about 350 to 1000 nm).
Ein weiterer Nachteil ist darin zu sehen, dass das Verhältnis von aktiver Fläche zur Fläche der Dünnfilmtransistoren sehr klein ist. Dieses als Füllfaktor bezeichnete Verhältnis liegt bei den CMOS Chips oft unter 50%, das heißt, dass die Hälfte der Lichtquanten nicht detektiert werden. Zwar werden Mikrolinsenarrays eingesetzt, jedoch führt dies wieder zu einer Komplikation des Gerätes und zur Kostensteigerung.One Another disadvantage is the fact that the ratio of active area to the surface the thin-film transistors is very small. This as a fill factor designated ratio is often below 50% for CMOS chips, that is, half of the light quanta can not be detected. Although microlens arrays are used, however, leads this again to a complication of the device and to increase costs.
Aufgabe der Erfindung ist es daher, großflächige Photodioden mit hoher Quanteneffizienz und einer einfach einstellbaren Bandbreite zur Verfügung zu stellen.task The invention is therefore, large-area photodiodes with high quantum efficiency and an easily adjustable bandwidth available too put.
Gegenstand der Erfindung ist ein Bildaufnehmer, eine Schaltmatrix mit zumindest ein Substrat, einen Silizium-basierten Auslesechip und einen Elektrodenkontakt umfassend, wobei auf dem Elektrodenkontakt eine unteren Elektrode aufgebracht ist, auf der zumindest eine organisch basierte photoaktive Schicht und darauf eine obere transparente Elektrode aufgebracht ist.object The invention is an image sensor, a switching matrix with at least a substrate, a silicon-based readout chip, and an electrode contact comprising, on the electrode contact, a lower electrode is applied on the at least one organically based photoactive Layer and applied to an upper transparent electrode is.
Photodioden auf der Basis von organischen Halbleitermaterialien bieten die Möglichkeit, großflächige Photodioden mit hohen Quanteneffizienzen herzustellen. Die hierbei eingesetzten dünnen organischen Schichtsysteme können mit bekannten Herstellungsverfahren wie Spin-Coating, Rakeln oder Druckverfahren kostengünstig hergestellt werden und ermöglichen so einen Preisvorteil, vor allem für größerflächige Bildaufnehmer.photodiodes based on organic semiconductor materials offer the possibility large-area photodiodes produce with high quantum efficiencies. The used here thin organic layer systems can with known manufacturing processes such as spin coating, doctor blading or printing process economical be produced and enable such a price advantage, especially for larger image sensors.
Nach einer vorteilhaften Ausführungsform der Erfindung werden Halbleitermaterialien eingesetzt, die im IR (infraroten) Bereich absorbieren, so dass ein Bildaufnehmer für den IR-Bereich geschaffen wird.To an advantageous embodiment of the Invention are semiconductor materials used in the IR (infrared) Absorb area so that an image sensor for the IR range is created.
Nach einer weiteren Ausführungsform können Bildaufnehmer mit einer an das menschliche Auge angepassten Empfindlichkeitskurve hergestellt werden. Dafür ist das organische Material viel besser geeignet als das auf Silizium basierende, da Silizium in dem für das menschliche Auge unsichtbaren NIR Bereich > 700 nm besonders empfindlich ist, d.h. dieser Bereich muss bei einem Silizium basierten Bildaufnehmer aufwendig weggefiltert werden.To a further embodiment can Image sensor with a sensitivity curve adapted to the human eye getting produced. Therefore the organic material is much better suited than that on silicon based, since silicon in the for the human eye invisible NIR range> 700 nm is particularly sensitive, i. This area must be complicated with a silicon-based image sensor be filtered out.
Nach einer anderen Ausführungsform wird als Schaltmatrix eine CMOS-Schaltmatrix, beispielsweise wie sie von der Firma Omnivision bekannt ist, eingesetzt. Das Blockdiagramm eines CMOS-Bildaufnehmers der Firma Omnivision zeigt, dass hier neben der tatsächlich aktiven Fläche des Chips eine Vielzahl weiterer Funktionen integriert ist.To another embodiment is a switching matrix CMOS switching matrix, such as It is used by the company Omnivision. The block diagram a CMOS imager the company Omnivision shows that here in addition to the actually active area the chip is integrated with a variety of other functions.
Im Folgenden wird die Erfindung noch anhand zweier Figuren näher erläutert:in the The invention will be explained in more detail below with reference to two figures:
Zu
Das
im Beispiel und in der
Durch Verwendung anderer organischer Halbleiterkombinationen kann die spektrale Empfindlichkeit des Detektors leicht angepasst werden. Weiterhin kann durch den Zusatz von Kohlenstoff-Nanoröhrchen oder anorganischer Nanokristalle wie HgTe, CdSe, PbS, etc. der Spektralbereich bis zu 4 μm erweitert werden.By Use of other organic semiconductor combinations may be spectral sensitivity of the detector can be easily adjusted. Furthermore, by the addition of carbon nanotubes or inorganic nanocrystals such as HgTe, CdSe, PbS, etc. the spectral range up to 4 μm be extended.
Zur
Herstellung eines CMOS Imagers mit organischer Photodiode kann beispielsweise
wie folgt vorgegangen werden:
Eine fertige Schaltmatrix, wie
beispielsweise die eines CMOS-Imagers,
bei dem die Photodiode noch nicht aufgebracht ist, wird handelsüblich erhalten. Dieser
CMOS Imager hat bevorzugt noch eine untere beispielsweise strukturierte
Elektrode für
jede Photodiode. Auf diese untere Elektrode wird ganzflächig die
organische photoaktive Schicht (Bulk-heterojunction) aufgebracht.
Darauf kann, ebenfalls ganzflächig und
unstrukturiert, die obere Elektrode aufgebracht werden.To produce a CMOS imager with an organic photodiode, for example, proceed as follows:
A finished switching matrix, such as that of a CMOS imager, in which the photodiode is not yet applied, is obtained commercially. This CMOS imager preferably has a lower, for example, structured electrode for each photodiode. The organic photoactive layer (bulk heterojunction) is applied over this entire surface to this lower electrode. On top, also the whole surface and unstructured, the upper electrode can be applied.
Die ganzflächigen Schichten können extrem kostengünstig durch Spin Coating, Sprühen, Rakeln etc. aufgebracht werden.The whole-area Layers can extremely inexpensive by spin coating, spraying, Squeegees, etc. are applied.
Aufgrund der durchgängigen photoaktiven Schicht konnte der Crosstalk (übersprechen, das bei Erzeugen einer Spannung an einem Pixel die benachbarten Pixel auch zumindest teilweise aktiviert) zwischen den Pixeln unter 5% gedrückt werden.by virtue of the universal one photoactive layer could crosstalk (crosstalk when generating a voltage at a pixel, the neighboring pixels also at least partially activated) between pixels below 5%.
Auf diesen, wie gesagt auch einfach eingekauften oder selbst hergestellten Aufbau wird nun großflächig mit einem kostengünstigen Verfahren eine unstrukturierte photoaktive Schicht, beispielsweise eine Bulk-heterojunction, wie oben beschrieben, aufgebracht.On this, as I said, also simply bought or self-made Construction will now be extensive a cost-effective Process an unstructured photoactive layer, for example a bulk heterojunction is applied as described above.
Diese
Bulk-Heterojunction umfasst in der Regel zwei Schichten, eine Schicht
aus einem lochtransportierendem Polythiophen (Schicht
Auf
diese Schicht kann wiederum unstrukturiert und durch billige Herstellungsmethoden
realisierbar, die obere Elektrode
Nach einer Ausführungsform der Erfindung werden die Bildaufnehmer einfach durch Beschichtungsverfahren hergestellt indem auf eine fertige CMOS-Schaltmatrix durch Beschichten wie Rakeln, Sprühen, coating, dipcoating, spincoating etc. zunächst eine oder mehrere photoaktive Schichten und dann eine unstrukturierte Elektrodenschicht aufgebracht werden.To an embodiment In accordance with the invention, image sensors are easily formed by coating methods made by coating on a finished CMOS switching matrix like doctoring, spraying, coating, dipcoating, spincoating etc. initially one or more photoactive Layers and then applied an unstructured electrode layer become.
Da die organisch basierte photoaktiven Halbleiterschichten ganzflächig und ohne Strukturierung aufgebracht werden, erstrecken sich diese Schichten über 100% der Fläche und damit wird der Füllfaktor bei CMOS-artigen Bildaufnehmern enorm gesteigert und beträgt ungefähr 100%.There the organically based photoactive semiconductor layers over the entire surface and applied without structuring, these layers extend over 100% the area and thus the fill factor becomes CMOS-type image sensors increased enormously and is approximately 100%.
Durch Verwendung passender organischer Halbleitersysteme kann auf einfache Weise ein schmalbandiger Photodetektor realisiert werden. Selbst der infrarote Spektralbereich ist durch diesen einfachen Ansatz mit sehr niedrigen Prozesskosten abgedeckt. Die CMOS-Schaltmatrix ist für alle Detektoren gleich. Es wird am Ende des Prozesses lediglich der passende organische Halbleiter großflächig, unter Vermeidung teurer Lithographieprozesse, aufgebracht.By Use of suitable organic semiconductor systems can be simple Way a narrowband photodetector can be realized. Even the infrared spectral range is through this simple approach covered with very low process costs. The CMOS switching matrix is for all detectors equal. It will only be at the end of the process the suitable organic semiconductor over a large area, while avoiding expensive Lithography processes, applied.
In der vorliegenden Erfindung wird erstmals eine CMOS-Schaltmatrix eines Bildaufnehmers mit einer organischen photoaktiven Schicht kombiniert. Dadurch können schmalbandige Detektoren und Detektoren für unterschiedliche Spektralbereiche kostengünstig hergestellt werden.In the present invention, for the first time, a CMOS switching matrix of an image sensor is combined with an organic photoactive layer. As a result, narrowband detectors and De be produced at low cost for different spectral ranges.
Claims (8)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
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DE102006049120A DE102006049120A1 (en) | 2006-10-18 | 2006-10-18 | An organic photodiode imager and method of making the same |
PCT/EP2007/060891 WO2008046789A2 (en) | 2006-10-18 | 2007-10-12 | Image recorder with an organic photodiode and method for the production thereof |
EP07821258A EP2082428A2 (en) | 2006-10-18 | 2007-10-12 | Image recorder with an organic photodiode and method for the production thereof |
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DE102006049120A DE102006049120A1 (en) | 2006-10-18 | 2006-10-18 | An organic photodiode imager and method of making the same |
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Cited By (2)
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DE102016220086A1 (en) | 2016-10-14 | 2018-04-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Microstructured organic sensor device and method for its production |
FR3126546A1 (en) * | 2021-09-01 | 2023-03-03 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Process for manufacturing an optoelectronic device |
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JP2004134933A (en) * | 2002-10-09 | 2004-04-30 | Konica Minolta Holdings Inc | Digital still camera and manufacturing method thereof |
CA2519608A1 (en) * | 2005-01-07 | 2006-07-07 | Edward Sargent | Quantum dot-polymer nanocomposite photodetectors and photovoltaics |
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Cited By (5)
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DE102016220086A1 (en) | 2016-10-14 | 2018-04-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Microstructured organic sensor device and method for its production |
WO2018069501A1 (en) | 2016-10-14 | 2018-04-19 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Microstructured organic sensor component and method for producing same |
US10797109B2 (en) | 2016-10-14 | 2020-10-06 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Micro-structured organic sensor device and method for manufacturing same |
FR3126546A1 (en) * | 2021-09-01 | 2023-03-03 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Process for manufacturing an optoelectronic device |
EP4145507A1 (en) * | 2021-09-01 | 2023-03-08 | Commissariat à l'énergie atomique et aux énergies alternatives | Method for manufacturing an optoelectronic device and optoelectronic device |
Also Published As
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WO2008046789A3 (en) | 2008-08-21 |
WO2008046789A2 (en) | 2008-04-24 |
EP2082428A2 (en) | 2009-07-29 |
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