DE102004014584A1 - Hochfrequenz-Quadrupolsysteme mit Potentialgradienten - Google Patents

Hochfrequenz-Quadrupolsysteme mit Potentialgradienten Download PDF

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Publication number
DE102004014584A1
DE102004014584A1 DE102004014584A DE102004014584A DE102004014584A1 DE 102004014584 A1 DE102004014584 A1 DE 102004014584A1 DE 102004014584 A DE102004014584 A DE 102004014584A DE 102004014584 A DE102004014584 A DE 102004014584A DE 102004014584 A1 DE102004014584 A1 DE 102004014584A1
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DE
Germany
Prior art keywords
systems
potential gradients
high frequency
quadrupole systems
frequency quadrupole
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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DE102004014584A
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English (en)
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DE102004014584B4 (de
Inventor
Jochen Franzen
Gerhard Weis
Carsten Stoermer
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Bruker Daltonics GmbH and Co KG
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Bruker Daltonik GmbH
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Application filed by Bruker Daltonik GmbH filed Critical Bruker Daltonik GmbH
Priority to DE102004014584A priority Critical patent/DE102004014584B4/de
Priority to GB0505986A priority patent/GB2412493B/en
Priority to US11/090,316 priority patent/US7164125B2/en
Publication of DE102004014584A1 publication Critical patent/DE102004014584A1/de
Application granted granted Critical
Publication of DE102004014584B4 publication Critical patent/DE102004014584B4/de
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Expired - Lifetime legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/443—Dynamic spectrometers

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)

Abstract

Die Erfindung betrifft zweidimensionale Quadrupolsysteme, längs deren Achse ein axiales Gleichspannungsfeld überlagert wird. Solche Systeme sind beispielsweise aus US 5,847,386 bekannt. DOLLAR A Die Erfindung besteht darin, die hyperbiolischen oder zylindrischen Oberflächen von Quadrupolsystemen mit isoliert aufgebrachten Metallfilmen zu beschichten und durch entsprechende elektrische Beschaltung mit hochfrequenzüberlagerten Gleichspannungspotentialen axiale Potentialgradienten oder Sattelrampen zu erzeugen. Solche Systeme haben viele Einsatzmöglichkeiten, die von Massenfiltern hoher Transmission bis zu Fragmentierungszellen mit extrem geringen Ionenverlusten reichen.
DE102004014584A 2004-03-25 2004-03-25 Hochfrequenz-Quadrupolsysteme mit Potentialgradienten Expired - Lifetime DE102004014584B4 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
DE102004014584A DE102004014584B4 (de) 2004-03-25 2004-03-25 Hochfrequenz-Quadrupolsysteme mit Potentialgradienten
GB0505986A GB2412493B (en) 2004-03-25 2005-03-23 RF quadrupole systems with potential gradients
US11/090,316 US7164125B2 (en) 2004-03-25 2005-03-25 RF quadrupole systems with potential gradients

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102004014584A DE102004014584B4 (de) 2004-03-25 2004-03-25 Hochfrequenz-Quadrupolsysteme mit Potentialgradienten

Publications (2)

Publication Number Publication Date
DE102004014584A1 true DE102004014584A1 (de) 2005-10-20
DE102004014584B4 DE102004014584B4 (de) 2009-06-10

Family

ID=34530474

Family Applications (1)

Application Number Title Priority Date Filing Date
DE102004014584A Expired - Lifetime DE102004014584B4 (de) 2004-03-25 2004-03-25 Hochfrequenz-Quadrupolsysteme mit Potentialgradienten

Country Status (3)

Country Link
US (1) US7164125B2 (de)
DE (1) DE102004014584B4 (de)
GB (1) GB2412493B (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007024858A1 (de) 2007-04-12 2008-10-23 Bruker Daltonik Gmbh Massenspektrometer mit einer elektrostatischen Ionenfalle

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004014582B4 (de) * 2004-03-25 2009-08-20 Bruker Daltonik Gmbh Ionenoptische Phasenvolumenkomprimierung
DE102004048496B4 (de) * 2004-10-05 2008-04-30 Bruker Daltonik Gmbh Ionenführung mit HF-Blendenstapeln
WO2006047889A1 (en) * 2004-11-08 2006-05-11 The University Of British Columbia Ion excitation in a linear ion trap with a substantially quadrupole field having an added hexapole or higher order field
GB0427634D0 (en) 2004-12-17 2005-01-19 Micromass Ltd Mass spectrometer
DE102005025497B4 (de) * 2005-06-03 2007-09-27 Bruker Daltonik Gmbh Leichte Bruckstückionen mit Ionenfallen messen
DE102007021701B4 (de) * 2006-07-31 2011-09-22 Bruker Daltonik Gmbh Kompensation unerwünschter Flugzeitdispersion von Ionen
US7868289B2 (en) * 2007-04-30 2011-01-11 Ionics Mass Spectrometry Group Inc. Mass spectrometer ion guide providing axial field, and method
US20090194679A1 (en) * 2008-01-31 2009-08-06 Agilent Technologies, Inc. Methods and apparatus for reducing noise in mass spectrometry
JP5083160B2 (ja) * 2008-10-06 2012-11-28 株式会社島津製作所 四重極型質量分析装置
DE102010013546B4 (de) * 2010-02-01 2013-07-25 Bruker Daltonik Gmbh Ionenmanipulationszelle mit maßgeschneiderten Potenzialprofilen
US8455814B2 (en) * 2010-05-11 2013-06-04 Agilent Technologies, Inc. Ion guides and collision cells
US8227748B2 (en) 2010-05-20 2012-07-24 Bruker Daltonik Gmbh Confining positive and negative ions in a linear RF ion trap
US8487249B2 (en) 2010-12-14 2013-07-16 The Regents Of The University Of Michigan Office Of Technology Transfer Auxiliary frequency parametric excitation of quadrupole mass spectrometers
DE102011100525B4 (de) 2011-05-05 2015-12-31 Bruker Daltonik Gmbh Betrieb eines Flugzeitmassenspektrometers mit orthogonalem Ionenauspulsen
GB2499587B (en) 2012-02-21 2016-06-01 Thermo Fisher Scient (Bremen) Gmbh Apparatus and methods for ion mobility spectrometry
GB2506362B (en) 2012-09-26 2015-09-23 Thermo Fisher Scient Bremen Improved ion guide
JP6244012B2 (ja) 2013-04-23 2017-12-06 レコ コーポレイションＬｅｃｏ Ｃｏｒｐｏｒａｔｉｏｎ 高スループットを有する多重反射質量分析計
DE112014005915T5 (de) 2013-12-19 2016-09-08 Micromass Uk Limited Massenauflösende Hochdruck-Ionenführung mit axialem Feld
DE102015117635B4 (de) * 2015-10-16 2018-01-11 Bruker Daltonik Gmbh Strukturaufklärung von intakten schweren Molekülen und Molekülkomplexen in Massenspektrometern

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US584368A (en) * 1897-06-15 Horatio keyes
DE1448178A1 (de) * 1961-06-15 1968-10-24 Levbold Heraeus Gmbh & Co Kg Massenspektrometerroehre
US3699330A (en) * 1971-02-22 1972-10-17 Bendix Corp Mass filter electrode
DE2737903B1 (de) * 1977-08-23 1979-03-01 Franzen Analysentech Verfahren zur Herstellung eines Analysatorsystems fuer ein Multipol-Massenfilter
US4213557A (en) * 1977-08-23 1980-07-22 Dr. Franzen Analysentechnik Gmbh & Co. Kommanditgesellschaft Method for producing a mass filter analyzer system and analyzer system produced according to the method
US4963736A (en) * 1988-12-12 1990-10-16 Mds Health Group Limited Mass spectrometer and method and improved ion transmission
US5572035A (en) * 1995-06-30 1996-11-05 Bruker-Franzen Analytik Gmbh Method and device for the reflection of charged particles on surfaces
WO1997007530A1 (en) * 1995-08-11 1997-02-27 Mds Health Group Limited Spectrometer with axial field
DE19703081A1 (de) * 1996-01-30 1997-07-31 Shimadzu Corp Vielpol-Massenfilter
EP0817239B1 (de) * 1996-07-02 2003-06-11 Hitachi, Ltd. Ionenspeicherungsvorrichtung für Massenspektrometrie

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3334225A (en) * 1964-04-24 1967-08-01 California Inst Res Found Quadrupole mass filter with means to generate a noise spectrum exclusive of the resonant frequency of the desired ions to deflect stable ions
US7064322B2 (en) * 2004-10-01 2006-06-20 Agilent Technologies, Inc. Mass spectrometer multipole device

Patent Citations (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US584368A (en) * 1897-06-15 Horatio keyes
DE1448178A1 (de) * 1961-06-15 1968-10-24 Levbold Heraeus Gmbh & Co Kg Massenspektrometerroehre
US3699330A (en) * 1971-02-22 1972-10-17 Bendix Corp Mass filter electrode
DE2737903B1 (de) * 1977-08-23 1979-03-01 Franzen Analysentech Verfahren zur Herstellung eines Analysatorsystems fuer ein Multipol-Massenfilter
US4213557A (en) * 1977-08-23 1980-07-22 Dr. Franzen Analysentechnik Gmbh & Co. Kommanditgesellschaft Method for producing a mass filter analyzer system and analyzer system produced according to the method
US4963736A (en) * 1988-12-12 1990-10-16 Mds Health Group Limited Mass spectrometer and method and improved ion transmission
US4963736B1 (en) * 1988-12-12 1999-05-25 Mds Inc Mass spectrometer and method and improved ion transmission
US5572035A (en) * 1995-06-30 1996-11-05 Bruker-Franzen Analytik Gmbh Method and device for the reflection of charged particles on surfaces
WO1997007530A1 (en) * 1995-08-11 1997-02-27 Mds Health Group Limited Spectrometer with axial field
US5847386A (en) * 1995-08-11 1998-12-08 Mds Inc. Spectrometer with axial field
DE19703081A1 (de) * 1996-01-30 1997-07-31 Shimadzu Corp Vielpol-Massenfilter
EP0817239B1 (de) * 1996-07-02 2003-06-11 Hitachi, Ltd. Ionenspeicherungsvorrichtung für Massenspektrometrie

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
F. v. Busch, W. Paul:"Über nichlineare Resonanzen ein elektrischer Massenfaktor als Folge von Feld- fehlern", Zeitschrift für Physik 164, 588-594 (1961) *
P.H. Dawson:"Performance of the Quadrupol Mass Filter with separated RF and DC Fringing Fields, Int. J. Mass. Spectrum. 10N PHYS. 25 (1977), 375- 392 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007024858A1 (de) 2007-04-12 2008-10-23 Bruker Daltonik Gmbh Massenspektrometer mit einer elektrostatischen Ionenfalle
DE102007024858B4 (de) * 2007-04-12 2011-02-10 Bruker Daltonik Gmbh Massenspektrometer mit einer elektrostatischen Ionenfalle

Also Published As

Publication number Publication date
US20050274887A1 (en) 2005-12-15
GB2412493B (en) 2006-07-26
GB0505986D0 (en) 2005-04-27
DE102004014584B4 (de) 2009-06-10
GB2412493A (en) 2005-09-28
US7164125B2 (en) 2007-01-16

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OP8 Request for examination as to paragraph 44 patent law
8364 No opposition during term of opposition
R081 Change of applicant/patentee

Owner name: BRUKER DALTONICS GMBH & CO. KG, DE

Free format text: FORMER OWNER: BRUKER DALTONIK GMBH, 28359 BREMEN, DE

R071 Expiry of right