CN2686278Y - Test protection apparatus combination - Google Patents
Test protection apparatus combination Download PDFInfo
- Publication number
- CN2686278Y CN2686278Y CN 200420043847 CN200420043847U CN2686278Y CN 2686278 Y CN2686278 Y CN 2686278Y CN 200420043847 CN200420043847 CN 200420043847 CN 200420043847 U CN200420043847 U CN 200420043847U CN 2686278 Y CN2686278 Y CN 2686278Y
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- CN
- China
- Prior art keywords
- test
- protective device
- socket connector
- stitch
- cpu
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The utility model relates to a test protection device combination, comprising a socket connector and a plurality of stitches. The socket connector comprises an insulating body and a plurality of terminals contained in the insulating body, and the terminals are respectively conducted with the stitches. The test protection device combination utilizes the existing socket connectors and stitches to substitute the existing test protection seats, the use of the terminals of the test protection seats with special process forms is avoided, and cost is effectively reduced.
Description
[technical field]
The utility model is about a kind of protective device combination, is meant the test protective device combination that a kind of CPU of protection sample is not destroyed in frequent test especially.
[background technology]
Whether computer main frame panel production firm generally all will test each parts after motherboard is produced, qualified to verify its product.Wherein very important one is that CPU socket is tested, and generally all can use an intact CPU (hereinafter referred to as the CPU sample) to be placed in order to ensure the reliability of test and allow it in running order in the slot, and can see operate as normal.As shown in Figure 1,6 is host circuit board, and 5 for being welded on the CPU socket on the motherboard 6, and 4 is the CPU sample.Manufacturer tests in order to save the CPU sample of all using up after cost can not each piece motherboard be produced, generally all can use same CPU sample test polylith motherboard, the problem that must bring is like this, the CPU sample uses the stitch (as shown in Figure 1 label be 41 part) of back on it in frequent plug, damages especially easily.A general intact CPU price all compares expensive, the price that has even surpass motherboard.For effective protection CPU sample, generally is at present on a kind of cpu test protection seat 3 that attaches it to as shown in Figure 2, this protection seat 3 is made up of insulating body 31 and the special terminal 32 that holds again wherein.As shown in Figure 3, terminal 32 first halves are the accommodation section 321 of a hollow barrel, and CPU sample stitch can be plugged in wherein, are inserted on the motherboard in the CPU socket but Lower Half is stitch shape structure 322 replaced C PU samples.But this test protection seat 3 terminals 32 structures are more special, so difficulty of processing is than higher, and cost is expensive especially.
Therefore, be necessary to design a kind of new test protective device.
[summary of the invention]
The novel purpose of this use is to provide a kind of cost lower, and protection CPU sample makes it exempt from ruined test protective device combination in frequent test.
In order to realize the purpose of this utility model, a kind of test protective device combination of the utility model, it comprises socket connector and some stitch, this socket connector comprises insulating body and is located in plurality of terminals in the insulating body that this terminal is distinguished conducting with stitch.
Compared with prior art, the utility model test protective device is used in combination existing socket connector and stitch replaces existing test protection seat, has avoided using the test protection seat terminal of processing specific formation, has reduced cost effectively.
[description of drawings]
Fig. 1 is the lateral plan of the cpu test motherboard relevant with the utility model.
Fig. 2 is the CPU sample relevant with the utility model and the three-dimensional view of protection seat.
Fig. 3 is the side sectional view of Test Host plate after CPU sample shown in Figure 2 and protection seat are pegged graft.
Fig. 4 is the utility model testing apparatus combined side decomposition view.
Fig. 5 is the cutaway view of the stitch circuit board in the utility model testing apparatus combination shown in Figure 4.
Fig. 6 is another embodiment side decomposition view of the utility model.
[embodiment]
Below in conjunction with drawings and Examples the utility model is further described.
See also Fig. 4, Fig. 5, the combination of the utility model test protective device includes a socket connector 9 and a circuit board 8.Wherein socket connector 9 comprises insulating body and is located in plurality of terminals in the insulating body, terminal ends is connected with tin ball 91 (BGA electric connector promptly commonly used at present), circuit board 8 includes a main body 83, its upper surface is provided with and the tin ball 91 corresponding pads 81 of going up, lower surface is provided with and upper surface pad 81 corresponding pads 82 down, corresponding last pad 81 and the metal conducting layer mutual conduction of following pad 82 by plating on main body 83 inside aperture 85.Be welded with stitch 84 on the following pad 82.
During assembling, the tin ball 91 of socket connector 9 by the bottom is welded on the circuit board 8, the terminal in the socket connector 9 and the last pad 81 of circuit board are electrically conducted, so just constituted the combination of test protective device.
During work, CPU sample 4 is plugged on the socket connector 9, and stitch 84 is plugged on the motherboard 6 CPU socket connectors 5 to be detected.This test protective device made up and CPU sample 4 can be used as an integral body and takes away from CPU socket connector 5 after test finished, and tested next piece motherboard.Use the combination of the utility model test protective device and can substitute protection seat 3 fully, reach the effect of protection CPU sample 4.And the socket connector 9 in the combination of the utility model test protective device is very general with circuit board 8, so the more existing test protection of cost seat cost is much lower, so reduced cost effectively.
Figure 6 shows that another embodiment of the present utility model; this test protective device combination comprises socket connector and directly is welded on the stitch 94 of socket connector 9 bottoms; the same like this effect that can reach protection CPU sample, and cost is much lower compared to existing test protection seat.
Compare with existing test protection seat; it is combined that the utility model test protective device combination utilization is extensive use of socket connector and stitch at present; socket connector terminal and stitch are conducted, destroyed thereby protection CPU sample is exempted from it in frequent test, and can significantly reduce its cost.
Certainly, the combination of the utility model test protective device is not limited to be applied in the test of CPU socket connector, also can be used on obviously in the test of other socket connector, goes up especially in the test of other IC socket connector.
Claims (4)
1. test protective device combination, it comprises socket connector and some stitch, this socket connector comprises insulating body and is located in plurality of terminals in the insulating body that this terminal is distinguished conducting with stitch.
2. test protective device combination as claimed in claim 1, it is characterized in that: each terminal ends is connected with the tin ball, and terminal and stitch system connect in succession by the tin ball bonding.
3. test protective device combination as claimed in claim 1; it is characterized in that: this test protective device combination further comprises circuit board; these circuit board two surfaces are respectively equipped with the last pad and following pad of corresponding conducting; above-mentioned stitch is welded on the corresponding following pad, and above-mentioned terminal then is conducted with corresponding last pad.
4. test protective device as claimed in claim 3 combination is characterized in that: above-mentioned terminal is what connect in succession by the tin ball bonding with corresponding last pad.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420043847 CN2686278Y (en) | 2004-03-23 | 2004-03-23 | Test protection apparatus combination |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200420043847 CN2686278Y (en) | 2004-03-23 | 2004-03-23 | Test protection apparatus combination |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN2686278Y true CN2686278Y (en) | 2005-03-16 |
Family
ID=34671772
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200420043847 Expired - Fee Related CN2686278Y (en) | 2004-03-23 | 2004-03-23 | Test protection apparatus combination |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN2686278Y (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101183137B (en) * | 2006-11-14 | 2010-05-19 | 深圳市顶星数码网络技术有限公司 | Fixation method of detecting probe type circuit board testing tool |
| CN112975823A (en) * | 2021-03-02 | 2021-06-18 | 上海航天电子通讯设备研究所 | Mainboard dismouting device |
-
2004
- 2004-03-23 CN CN 200420043847 patent/CN2686278Y/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101183137B (en) * | 2006-11-14 | 2010-05-19 | 深圳市顶星数码网络技术有限公司 | Fixation method of detecting probe type circuit board testing tool |
| CN112975823A (en) * | 2021-03-02 | 2021-06-18 | 上海航天电子通讯设备研究所 | Mainboard dismouting device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C19 | Lapse of patent right due to non-payment of the annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |