CN213071071U - 一种半导体晶粒检测装置 - Google Patents
一种半导体晶粒检测装置 Download PDFInfo
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CN117388544A (zh) * | 2023-12-12 | 2024-01-12 | 扬州奕丞科技有限公司 | 一种半导体检测用探针台 |
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CN117388544A (zh) * | 2023-12-12 | 2024-01-12 | 扬州奕丞科技有限公司 | 一种半导体检测用探针台 |
CN117388544B (zh) * | 2023-12-12 | 2024-03-15 | 扬州奕丞科技有限公司 | 一种半导体检测用探针台 |
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Effective date of registration: 20220712 Address after: 518000 303, Sichuang science and technology building, No. 021, Gaoxin South 1st Road, high tech Zone community, Yuehai street, Nanshan District, Shenzhen, Guangdong Province Patentee after: Shenzhen Xinfu Technology Co.,Ltd. Address before: B203, Shenzhen industry university research base building, Huazhong University of science and technology, No.9, Yuexing Third Road, high tech Zone community, Yuehai street, Nanshan District, Shenzhen City, Guangdong Province Patentee before: Shenzhen Xintan Technology Co.,Ltd. |
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Effective date of registration: 20240517 Address after: 518109, 10th Floor, Building 3, Changyi Industrial Plant, No.1 Lirong Road, Xinshi Community, Dalang Street, Longhua District, Shenzhen City, Guangdong Province Patentee after: Xintetong (Shenzhen) Semiconductor Co.,Ltd. Country or region after: China Address before: 518000 303, Sichuang science and technology building, No. 021, Gaoxin South 1st Road, high tech Zone community, Yuehai street, Nanshan District, Shenzhen, Guangdong Province Patentee before: Shenzhen Xinfu Technology Co.,Ltd. Country or region before: China |
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