CN207832826U - Conducting probe frame for afm scan probe to be clamped - Google Patents
Conducting probe frame for afm scan probe to be clamped Download PDFInfo
- Publication number
- CN207832826U CN207832826U CN201721769074.7U CN201721769074U CN207832826U CN 207832826 U CN207832826 U CN 207832826U CN 201721769074 U CN201721769074 U CN 201721769074U CN 207832826 U CN207832826 U CN 207832826U
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- CN
- China
- Prior art keywords
- conducting wire
- probe
- unthreaded hole
- limited block
- conducting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000000523 sample Substances 0.000 title claims abstract description 48
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims abstract description 14
- 239000010453 quartz Substances 0.000 claims abstract description 11
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910000639 Spring steel Inorganic materials 0.000 claims description 3
- 239000000463 material Substances 0.000 claims description 3
- 239000011347 resin Substances 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- 230000005284 excitation Effects 0.000 abstract description 6
- 238000012545 processing Methods 0.000 abstract description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- 241001074085 Scophthalmus aquosus Species 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000004768 organ dysfunction Effects 0.000 description 1
- 230000004962 physiological condition Effects 0.000 description 1
- 238000004621 scanning probe microscopy Methods 0.000 description 1
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- Measuring Leads Or Probes (AREA)
Abstract
The utility model is used to be clamped the conducting probe frame of afm scan probe, belongs to the technical field detected to bioelectric signal, solves the technical issues of probe carriage in the prior art cannot achieve the excitation to cell electric signal and acquisition；The utility model is an integral structure, including locating module, limited block, conducting wire unthreaded hole I and conducting wire unthreaded hole II and screw；Further include quartz window and conducting wire；Quartz window is located above locating module, limited block is located at locating module lower left, conducting wire unthreaded hole I and conducting wire unthreaded hole II are respectively equipped on limited block, limited block is fixedly connected with the pedestal of invention provides a double-probe atomic power, the scanning probe of atomic force microscope is clamped on locating module, after conducting wire is each passed through conducting wire unthreaded hole I and conducting wire unthreaded hole II, conducting wire and screw connection；The utility model is realized to cell signal into row energization and acquisition, and have the advantages that be readily produced, processing cost it is low.
Description
Technical field
The utility model belongs to the technical field detected to bioelectric signal, and in particular to one kind is for being clamped atomic force
The conducting probe frame of micro- scarnning mirror probe.
Background technology
The invention of scanning probe microscopy and to apply in field of nanometer technology be a development with milestone significance.It sweeps
It includes scanning tunneling microscope and atomic force microscope to retouch probe microscope.Their appearance not only enables scientist directly to see
Microcosmic atom and molecule are measured, but also directly they can be manipulated, indicates nanotechnology research from concept rank
Section enters substantive conceptual phase.
The detection of the various electric signals of organism, which has become, understands the new of each organ dysfunction of organism, medical diagnosis on disease and treatment
Approach.Idioelectric deficiency cannot be measured since atomic force microscope overcomes scanning tunneling microscope, and high with precision,
Operation flexibly, strong applicability, can under liquid environment directly measure with manipulate etc. advantages, for study cell physics characteristic carry
New method has been supplied, has had become one of the important tool of research biological cell and macromolecular at present.
Currently, the probe carriage of atomic force microscope is used only for the scanning probe of clamping atomic force microscope, but cannot lead
Electricity cannot achieve the excitation to cell electric signal and acquisition.
Utility model content
The purpose of this utility model is to provide a kind of conducting probe frame for afm scan probe to be clamped, solution
Certainly probe carriage cannot be conductive in the prior art, the technical issues of cannot achieve the excitation to cell electric signal and acquisition.
In order to solve the above technical problems, the utility model provides following technical scheme：
The utility model is used to be clamped the conducting probe frame of afm scan probe, is an integral structure, including
Locating module, limited block, conducting wire unthreaded hole I and conducting wire unthreaded hole II and screw；Further include quartz window and conducting wire；The positioning mould
Block is an intermediate plate；
Quartz window is located above locating module, and limited block is located at locating module lower left, is respectively equipped on limited block
Conducting wire unthreaded hole I and conducting wire unthreaded hole II, limited block are fixedly connected with the pedestal of invention provides a double-probe atomic power, atomic force microscope
Scanning probe is clamped on locating module, after conducting wire is each passed through conducting wire unthreaded hole I and conducting wire unthreaded hole II, conducting wire and screw connection.
Conducting probe frame is made of resin, quartz glass or 65Mn spring steel materials.
The operation principle of the utility model：Conducting wire one end of the utility model is connect with signal picker, signal picker
It is connect with computer, after conducting wire is each passed through conducting wire unthreaded hole I and conducting wire unthreaded hole II, the other end screw connection of conducting wire, signal occurs
To cell, into the excitation of horizontal electrical signal, to which cell electric signal changes, electric signal is connected by conductive probe tip in device
To the capture card of signal picker.
The advantageous effects of the utility model：The limited block of the utility model is mounted on invention provides a double-probe atomic power
On, conducting wire is penetrated into hole by conducting wire and connects micro-cantilever probe location module and metal screws, needle point is moved into laser region,
Laser is adjusted to tip cantilever top and reaches maximum SUM value, you can very convenient to be applicable in into horizontal electrical signal excitation and acquisition operations；
Electric signal is given to cell by conducting probe frame to encourage and acquire, reduce the diffusion of electric signal as far as possible, realize in nanometer ruler
On degree, the detection of electrical characteristics multidimensional information and characterization are carried out to living cells in physiological conditions；And the utility model have be easy to raw
The low advantage of production, processing cost.
Description of the drawings
Fig. 1 is the conducting probe frame for the conducting probe frame that the utility model is used to be clamped afm scan probe
Sectional view；
Wherein, 1, quartz window, 2, locating module, 3, limited block, 4, conducting wire unthreaded hole I, 5, screw, 6, conducting wire unthreaded hole
Ⅱ。
Specific implementation mode
The utility model is further elaborated below in conjunction with the accompanying drawings.
Specific embodiment one：
Referring to attached drawing 1, the utility model is used to be clamped the conducting probe frame of afm scan probe, is integral type
Structure, including locating module 2, limited block 3, conducting wire unthreaded hole I 4 and conducting wire unthreaded hole II 6 and screw 5, further include quartz window 1
And conducting wire；The locating module 2 is an intermediate plate, and quartz window 1 is located at 2 top of locating module, and limited block 3 is located at locating module
2 lower lefts are respectively equipped with conducting wire unthreaded hole I 4 and conducting wire unthreaded hole II 6, limited block 3 and invention provides a double-probe atomic power on limited block 3
Pedestal be fixedly connected, the scanning probe of atomic force microscope is clamped on locating module 2, and conducting wire is each passed through conducting wire unthreaded hole I 4
After conducting wire unthreaded hole II 6, conducting wire is connect with screw 5.
Conducting probe frame is made of resin, quartz glass or 65Mn spring steel materials.
Specific embodiment two：
Referring to attached drawing 1, the conducting probe frame for afm scan probe to be clamped is an integral structure, including
Locating module 2, limited block 3, conducting wire unthreaded hole I 4 and conducting wire unthreaded hole II 6 and screw 5 further include quartz window 1 and conducting wire；Quartz
Windowpane 1 is located at 2 top of locating module, and limited block 3 is located at 2 lower left of locating module, conducting wire unthreaded hole is respectively equipped on limited block 3
I 4 and conducting wire unthreaded hole II 6, limited block 3 be fixedly connected with the pedestal of invention provides a double-probe atomic power, locating module 2 and atomic force are aobvious
The scanning probe of micro mirror is fixedly connected, and conducting wire one end is connect with signal picker, and signal picker is connect with computer, conducting wire difference
After conducting wire unthreaded hole I 4 and conducting wire unthreaded hole II 6, another terminal screw 5 of conducting wire connects, and double probes are placed on conducting probe frame；
Signal generator is used to cell, into the excitation of horizontal electrical signal, to which cell electric signal changes, pass through conductive probe needle
Electric signal is connected to the capture card of signal picker in point.
Claims (2)
1. the conducting probe frame for afm scan probe to be clamped, which is characterized in that be an integral structure, including fixed
Position module (2), limited block (3), conducting wire unthreaded hole I (4) and conducting wire unthreaded hole II (6) and screw (5), further include quartz window (1)
And conducting wire；The locating module (2) is an intermediate plate, and quartz window (1) is located above locating module (2), and limited block (3) is located at
Locating module (2) lower left, is respectively equipped with conducting wire unthreaded hole I (4) and conducting wire unthreaded hole II (6) on limited block (3), limited block (3) with
The pedestal of invention provides a double-probe atomic power is fixedly connected, and the scanning probe of atomic force microscope is clamped on locating module (2), leads
After line is each passed through conducting wire unthreaded hole I (4) and conducting wire unthreaded hole II (6), conducting wire is connect with screw (5).
2. the conducting probe frame according to claim 1 for afm scan probe to be clamped, which is characterized in that
Conducting probe frame is made of resin, quartz glass or 65Mn spring steel materials.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721769074.7U CN207832826U (en) | 2017-12-18 | 2017-12-18 | Conducting probe frame for afm scan probe to be clamped |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201721769074.7U CN207832826U (en) | 2017-12-18 | 2017-12-18 | Conducting probe frame for afm scan probe to be clamped |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN207832826U true CN207832826U (en) | 2018-09-07 |
Family
ID=63387969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201721769074.7U Expired - Fee Related CN207832826U (en) | 2017-12-18 | 2017-12-18 | Conducting probe frame for afm scan probe to be clamped |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN207832826U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110108905A (en) * | 2019-05-22 | 2019-08-09 | 长春理工大学 | A kind of nervous cell membrane potential and neuron membrane repair behavioral value method and device |
| CN115128304A (en) * | 2021-03-25 | 2022-09-30 | 长春理工大学 | Liquid-phase conductive atomic force probe and preparation method thereof |
-
2017
- 2017-12-18 CN CN201721769074.7U patent/CN207832826U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110108905A (en) * | 2019-05-22 | 2019-08-09 | 长春理工大学 | A kind of nervous cell membrane potential and neuron membrane repair behavioral value method and device |
| CN110108905B (en) * | 2019-05-22 | 2021-08-06 | 长春理工大学 | Method and device for detecting membrane potential and nerve cell membrane repairing behaviors of nerve cells |
| CN115128304A (en) * | 2021-03-25 | 2022-09-30 | 长春理工大学 | Liquid-phase conductive atomic force probe and preparation method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180907 |