CN203881868U - An automatic testing device for the linearity of linear optocouplers - Google Patents
An automatic testing device for the linearity of linear optocouplers Download PDFInfo
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- CN203881868U CN203881868U CN201420246912.2U CN201420246912U CN203881868U CN 203881868 U CN203881868 U CN 203881868U CN 201420246912 U CN201420246912 U CN 201420246912U CN 203881868 U CN203881868 U CN 203881868U
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Abstract
The utility model relates to an automatic testing device for the linearity of linear optocouplers. The automatic testing device comprises a test circuit which mainly consists of a signal source circuit 21, a signal input circuit 22, a signal output circuit 23, an analog-digital conversion module 24 and a microprocessor 25. The output end of the signal source circuit 21 is connected with the signal input circuit 22; the signal input circuit 22 is used for connection with input of the to-be-tested linear optocoupler; the signal output circuit 23 is used for connection with the output of the to-be-tested linear optocoupler; the output of the signal output circuit 23 and the output of the signal source circuit 21 are connected with the microprocessor 25 through the analog-digital conversion module 24. With the microprocessor, output signals of a signal source are collected and signals of the signal source, which are processed by the linear optocouplers, are collected. The two kinds of signals are compared for determining the performance of the linear optocouplers. Therefore, the automation degree of testing is increased and the efficiency is increased.
Description
Technical field
The utility model relates to a kind of linear optical coupling linearity automatic testing equipment.
Background technology
Linear optical coupling is widely used in simulating signal isolation transmission, as signal isolator, signal conditioner, isolating transmitter, isolated analogue collection module, in the equipment such as isolating safety grid, be all widely used linear optical coupling, because the linearity of linear optical coupling can reach 0.01%, therefore linear optical coupling can be used on high-precision signal isolation transmission equipment, on 0.05% precision high-speed, high precision analog signal isolator, so because linear optical coupling is as semiconductor devices, its linearity parameter exists dispersed, the linearity that is not all linear optical coupling all can reach 0.01%, in fact, the linearity of linear optical coupling is distributed in 0.01% to 0.05% level mostly, for linearity error, it is more than 0.03% linear optical coupling, when itself and amplifier, when the external circuit couplings such as capacitance-resistance are used, the linearity error of whole circuit just may surpass 0.05%, if in advance the linearity of linear optical coupling is not tested, in the batch production of high-precision analog signal isolator, can make product debug for the first time qualification rate not high, additionally increased debug time, if can be by the linear optical coupling linearity be tested, linear error is rejected out before use higher than 0.03% linear optical coupling, just can greatly improve high-precision analog signal xegregating unit product and debug for the first time qualification rate.
It is existing that to the linear optical coupling linearity, test is that linear optical coupling is fixed on linear optical coupling fixed part with welding manner, be used in conjunction with again high-precision signal source, high precision standard scale, artificial selection high-precision signal source is exported different reference signals, read the measurement data of high precision standard scale on different reference points, calculate according to this linearity of linear optical coupling.There are the following problems in existing linearity test: manually the linear optical coupling linearity is tested, need the data volume of test and record larger, cause testing efficiency low, and easily make mistakes, cannot adapt to the requirement of in the batch production of high-precision analog signal xegregating unit, the larger amt linear optical coupling linearity being tested, seriously restrict first debugging qualification rate and the production efficiency of product.Therefore, be necessary to develop a kind of device that the linear optical coupling linearity is carried out to automatic test, to accurately and efficiently linearity error was rejected out before using higher than 0.03% linear optical coupling fast,, improve high-precision analog signal xegregating unit product and debug for the first time qualification rate, enhance productivity.
Utility model content
The purpose of this utility model is to provide a kind of linear optical coupling linearity automatic testing equipment, and in order to solve, existing test mode automaticity is low, complicated operation, inefficient problem.
For achieving the above object, scheme of the present utility model comprises:
A kind of linear optical coupling linearity automatic testing equipment, comprise test circuit, test circuit mainly consists of signal source circuit (21), signal input circuit (22), signal output apparatus (23), analog-to-digital conversion module (24) and microprocessor (25), the output terminal of signal source circuit (21) connects the input of signal input circuit (22), the output of signal input circuit (22) is for connecting the input end of linear optical coupling to be tested, and the input of signal output apparatus (23) is for connecting the output terminal of linear optical coupling to be tested; The output of the output of signal output apparatus (23), signal source circuit (21) all connects microprocessor (25) by analog-to-digital conversion module (24).
Described signal source circuit output at least three road voltage references, signal source circuit described in described microprocessor control linkage, for selecting the output voltage benchmark of signal source circuit.
Described test circuit is arranged on testing circuit board (2).
Also comprise a linear optical coupling fixed part (1), described linear optical coupling fixed part (1) is provided with for connecting the electric connection terminal (111) of each pin of linear optical coupling to be tested, and electric connection terminal (111) is connected respectively with signal input circuit (22), signal output apparatus (23) on described testing circuit board (2).
Described linear optical coupling fixed part (1) comprises pedestal (11) and pressing plate (12); Described electric connection terminal (111) is located on pedestal (11), electric connection terminal (111) is elastic spring, described pressing plate (12) is pushed down linear optical coupling to be tested, so that the pin of linear optical coupling to be tested forms stable contact with elastic spring.
Described elastic spring comprises reed, and it is upper that reed one end is fixed on pedestal (11), and the other end and pedestal are provided with spring between (11), and this one end that spring is set is provided with the groove (112) for holding the pin of linear optical coupling to be tested.
It is characterized in that, on described pedestal (11), be also provided with the lug boss (L1, L2) for spacing linear optical coupling to be tested.
Described pressing plate (12) is a rotating disk, and the turning axle of this rotating disk is vertical with pedestal (11) place plane, be fixed on pedestal (11).
Described rotating disk is provided with a guide ramp, and described guide ramp is that on rotating disk turns up structure.
Linear optical coupling proving installation of the present utility model, adopt microprocessor, the output signal in one side collection signal source, the signal of collection signal source after linear optical coupling is processed on the other hand, these two kinds of signals are compared, with the performance of judgement linear optical coupling, improved the automaticity of test, improved efficiency.
Signal source arranges multiple voltage benchmark, any linear optical coupling is carried out the test of multiple voltage benchmark under the control of microprocessor, embodiment linear optical coupling performance that can be complete.
The utility model also provides a kind of fixed part for linear optical coupling test, fixed part is pushed down linear optical coupling to be tested by a pressing plate, the pin of linear optical coupling is formed to firm contacting with the elastic spring on pedestal, and elastic spring itself is electrically connected to test circuit, thereby by linear optical coupling, chip is reliably connected with test circuit, can carry out test operation, during operation, only linear optical coupling need be put on the desired location of pedestal, then by pressing plate, be pushed down.
Further, pressing plate adopts turntable structure, when needs are put into chip, dial rotation is removed, and exposes the desired location of chip placement, in the time of need to pressing by dial rotation to desired location, push down chip to complete test, operation is very easy.
Accompanying drawing explanation
Fig. 1 is structure principle chart of the present utility model;
Fig. 2 is the multivoltage benchmark architecture schematic diagram of signal source circuit;
Fig. 3 is signal input circuit schematic diagram;
Fig. 4 is signal output apparatus schematic diagram;
Fig. 5 is adopted a kind of analog to digital converter;
Fig. 6 is linear optical coupling fixed part structural drawing;
Fig. 7 is elastic spring vertical view;
Fig. 8 is elastic spring horizontal view;
Fig. 9 is pressure plate structure figure;
Figure 10 is test operation initial state schematic diagram;
Figure 11 is view in test operation.
Embodiment
Below in conjunction with accompanying drawing, the utility model is described in more detail.
As Fig. 1, basic scheme of the present utility model is: a kind of linear optical coupling linearity automatic testing equipment, comprise test circuit, test circuit mainly consists of signal source circuit 21, signal input circuit 22, signal output apparatus 23, analog-to-digital conversion module 24 and microprocessor 25, the output terminal of signal source circuit 21 connects the input of signal input circuit 22, the output of signal input circuit 22 is for connecting the input of linear optical coupling to be tested, and the input of signal output apparatus 23 is for connecting the output of linear optical coupling to be tested; The output of the output of signal output apparatus 23, signal source circuit 21 all connects microprocessor 25 by analog-to-digital conversion module 24.
Microprocessor is by the output signal in analog-to-digital conversion module while collection signal source, and the signal of signal source after linear optical coupling is processed, and these two kinds of signals is compared, to judge the performance of linear optical coupling.
Based on this basic scheme, provide a kind of embodiment below.
Microprocessor adopts single-chip microcomputer.
Signal source circuit can be set to comprise output at least three road voltage references; Microprocessor control linkage signal source circuit, for selecting the output voltage benchmark of signal source circuit.As shown in Figure 2, signal source circuit 21 comprises n branch road, the first branch road comprises the first K switch 1 that the first benchmark REF1 is connected with it, the second branch road comprises the second switch K2 that the second benchmark REF2 is connected with it, successively, n branch road comprises the n K switch n that n benchmark REFn is connected with it, K1, K2 ... the output terminal parallel connection of Kn is as the output terminal of signal criterion circuit 21, K1, K2 ... the control end A1 of Kn, A2 ... An is connected with the IO pin of single-chip microcomputer 25, to realize, under the control of single-chip microcomputer, select a certain branch road benchmark access signal input circuit 22, the number n of branch road is more than or equal to 3.As single-chip microcomputer is set to significant level by the IO pin being connected with A1, and the IO pin that A2-An is connected is set to inactive level, has realized the first benchmark access signal input circuit; As single-chip microcomputer is set to significant level by the IO pin being connected with A2, and be set to inactive level with all the other all IO pins that are connected of A1-An, realized the second benchmark access signal input circuit, by optionally accessing unlike signal benchmark, can realize the test for the treatment of the survey linear optical coupling linearity on different reference points.
Concrete, provide the relevant physical circuit that embodiment adopts below:
As shown in Figure 3, signal input circuit 21 comprises the first resistance R 1, the second resistance R 2, amplifier U1, capacitor C 1, positive-negative-positive triode Q1, positive supply VP1, the input end of signal input circuit 21 connects the first resistance R 1, and by R1, connect the negative input end of amplifier U1, shunt capacitance C1 between the negative input end of amplifier U1 and its output terminal, the positive input terminal of amplifier U1 is by the second resistance R 2 ground connection, R2 is build-out resistor, can reduce the additive error that the input bias current of amplifier U2 produces circuit, the base stage of the output termination triode Q1 of amplifier U1, the emitter of triode Q1, the negative input end of amplifier U1, the ground of signal input circuit and positive supply VP1 are all connected to linear optical coupling fixed part.
As shown in Figure 4, signal output apparatus comprises resistance R 3, resistance R 4, resistance R 5 and amplifier U2, one end of resistance R 3 connects the negative input end of amplifier U2, the positive input terminal of amplifier is by resistance R 5 ground connection, between the negative input end of amplifier U2 and output terminal and connecting resistance R4, resistance R 3, resistance R 4, resistance R 5 and amplifier U1 form an anti-phase scale operation amplifying circuit, and resistance R 5 is build-out resistors, can reduce the additive error that the input bias current of amplifier U2 produces operational amplification circuit.The signal ground of the other end of resistance R 3 and signal output apparatus 23 is being connected to property optocoupler fixed part all.
In the present embodiment, analog-to-digital conversion module adopts analog to digital converter, be one to have the analog to digital converter of 24 bit resolutions, its pin branch as shown in Figure 5, input end connection mode number converter the 9th pin AIN0 of signal input circuit 22, the 10th pin AIN1 of the output terminal connection mode number converter 24 of signal output apparatus 23, under the control of single-chip microcomputer 25, analog to digital converter 24 can be realized the gathering of the signal-selectivity on AIN0 and AIN1, and the signal collecting is transferred to single-chip microcomputer 25 calculates and process.
As other embodiments, microprocessor also can adopt the model of built-in analog-to-digital conversion module, and such microprocessor is a lot, does not repeat them here.
Lower mask body is introduced the physical arrangement of proving installation:
As Fig. 6, test circuit is arranged on testing circuit board 2.Linear optical coupling to be tested (below also referred to as chip) is arranged on a linear optical coupling fixed part 1, and linear optical coupling fixed part 1 comprises pedestal 11 and pressing plate 12; Linear optical coupling fixed part 1 is provided with electric connection terminal 111, and 111 pairs of outsides of electric connection terminal are for connecting each pin of chip to be tested, to inside be with testing circuit board 2 on signal input circuit 22, signal output apparatus 23 be connected respectively.
As Fig. 7,8, electric connection terminal 111 is located on pedestal 11, and electric connection terminal 111 is elastic spring.This elastic spring comprises spring and reed, and reed one end (passing through screw) is fixed on pedestal 11, between the other end and pedestal 11, is provided with spring 114, and this one end that spring is set is provided with for holding the groove 112 of chip pin to be tested; At this end, reed is to having a projection 113, and spring 114 is enclosed within this projection 113, the syndeton of formation and reed, and spring 114 is located in the respective aperture 115 of pedestal 11 with pedestal 11 coupling parts.
As shown in Figure 6, elastic spring has 8, is numbered respectively T1-T8, and they are fixing on desired location, and each pin of the corresponding chip of difference, to form one for connecting the position of chip to be tested.When chip is inserted to this desired location, chip pin is inserted in the groove 112 of each elastic spring just.T1-T8 located lateral chip to be tested, protruding stupefied L1, L2 and T1-T8 on pedestal be arranged in parallel, for longitudinal register chip to be tested.
Now, pressing plate 12 is pushed down to linear optical coupling to be tested, spring provides the stress making progress to reed, has realized closely reliably contacting of linear optical coupling pin and reed.
Pressing plate 12 is a rotating disk, and the turning axle of this rotating disk is vertical with pedestal 11 place planes, be fixed on pedestal 11.Rotating disk is provided with a guide ramp, and described guide ramp is that on rotating disk turns up structure.As shown in Figure 9, this turns up with the angle of horizontal direction is 5-70 °, and the existence of turning up makes to realize more smooth to being fixed of linear optical coupling by rotating sheet disk.
Linear optical coupling to be tested is placed on schematic diagram in linear optical coupling fixed part as shown in figure 10, and the schematic diagram that linear optical coupling to be tested is fixed on linear optical coupling fixed part as shown in figure 11.
Linear optical coupling linearity automatic test approach is as follows:
Step 1, is placed in linear optical coupling fixed part by linear optical coupling to be measured fixing, and start powers on.Concrete, rotate sheet disk, expose copper sheet, by the groove on the corresponding copper sheet of linear optical coupling pin difference, set level, rotate sheet disk, make sheet disk push down the upper surface of linear optical coupling, fix linear optical coupling, start powers on.
Step 2, the first switch on Single-chip Controlling signal source circuit is closed, rest switch beyond the first switch all disconnects, realization is by first signal benchmark access signal input circuit, the output end signal of Single-chip Controlling analog to digital converter difference collection signal input circuit input end signal and signal output apparatus, the relative error of calculating first signal reference point.It is closed that single-chip microcomputer is controlled second switch to the N switch more successively, all the other all switches all disconnect, realization by second to n-signal benchmark access signal input circuit, the input end signal of signal input circuit and the output end signal of signal output apparatus when Single-chip Controlling analog to digital converter gathers respectively secondary signal benchmark access signal input circuit to the n-signal benchmark access signal input circuit, calculate respectively the relative error of secondary signal reference point to the n-signal reference point.
Step 3, single-chip microcomputer carries out computing, the relative error of secondary signal reference point is deducted to the relative error of first signal reference point, obtain the difference of first relative error, by that analogy, until the relative error of n-signal reference point is deducted to the relative error of N-1 signal criterion point, obtain the difference of N-1 relative error, get a linear error as tested linear optical coupling maximum in this N-1 relative error difference.
Step 4, power-off, rotates sheet disk, takes out linear optical coupling.
More than provided concrete embodiment, but the utility model is not limited to described embodiment.Basic ideas of the present utility model are above-mentioned basic scheme, and for those of ordinary skills, according to instruction of the present utility model, model, formula, the parameter of designing various distortion do not need to spend creative work.The variation of in the situation that not departing from principle of the present utility model and spirit, embodiment being carried out, modification, replacement and modification still fall in protection domain of the present utility model.
Claims (9)
1. a linear optical coupling linearity automatic testing equipment, it is characterized in that, comprise test circuit, test circuit mainly consists of signal source circuit (21), signal input circuit (22), signal output apparatus (23), analog-to-digital conversion module (24) and microprocessor (25), the output terminal of signal source circuit (21) connects the input of signal input circuit (22), the output of signal input circuit (22) is for connecting the input end of linear optical coupling to be tested, and the input of signal output apparatus (23) is for connecting the output terminal of linear optical coupling to be tested; The output of the output of signal output apparatus (23), signal source circuit (21) all connects microprocessor (25) by analog-to-digital conversion module (24).
2. a kind of linear optical coupling linearity automatic testing equipment according to claim 1, it is characterized in that, described signal source circuit output at least three road voltage references, signal source circuit described in described microprocessor control linkage, for selecting the output voltage benchmark of signal source circuit.
3. a kind of linear optical coupling linearity automatic testing equipment according to claim 1, is characterized in that, described test circuit is arranged on testing circuit board (2).
4. a kind of linear optical coupling linearity automatic testing equipment according to claim 3, it is characterized in that, also comprise a linear optical coupling fixed part (1), described linear optical coupling fixed part (1) is provided with for connecting the electric connection terminal (111) of each pin of linear optical coupling to be tested, and electric connection terminal (111) is connected respectively with signal input circuit (22), signal output apparatus (23) on described testing circuit board (2).
5. a kind of linear optical coupling linearity automatic testing equipment according to claim 4, is characterized in that, described linear optical coupling fixed part (1) comprises pedestal (11) and pressing plate (12); Described electric connection terminal (111) is located on pedestal (11), electric connection terminal (111) is elastic spring, described pressing plate (12) is pushed down linear optical coupling to be tested, so that the pin of linear optical coupling to be tested forms stable contact with elastic spring.
6. a kind of linear optical coupling linearity automatic testing equipment according to claim 5, it is characterized in that, described elastic spring comprises reed, reed one end is fixed on pedestal (11), the other end and pedestal are provided with spring between (11), and this one end that spring is set is provided with the groove (112) for holding the pin of linear optical coupling to be tested.
7. a kind of linear optical coupling linearity automatic testing equipment according to claim 5, is characterized in that, is also provided with the lug boss (L1, L2) for spacing linear optical coupling to be tested on described pedestal (11).
8. a kind of linear optical coupling linearity automatic testing equipment according to claim 5, is characterized in that, described pressing plate (12) is a rotating disk, and the turning axle of this rotating disk is vertical with pedestal (11) place plane, be fixed on pedestal (11).
9. a kind of linear optical coupling linearity automatic testing equipment according to claim 8, is characterized in that, described rotating disk is provided with a guide ramp, and described guide ramp is that on rotating disk turns up structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420246912.2U CN203881868U (en) | 2014-05-09 | 2014-05-14 | An automatic testing device for the linearity of linear optocouplers |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410195111.2 | 2014-05-09 | ||
| CN201410195111 | 2014-05-09 | ||
| CN201420246912.2U CN203881868U (en) | 2014-05-09 | 2014-05-14 | An automatic testing device for the linearity of linear optocouplers |
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| CN203881868U true CN203881868U (en) | 2014-10-15 |
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| CN201420246912.2U Expired - Fee Related CN203881868U (en) | 2014-05-09 | 2014-05-14 | An automatic testing device for the linearity of linear optocouplers |
| CN201410202938.1A Expired - Fee Related CN103969531B (en) | 2014-05-09 | 2014-05-14 | Automatic testing device for linearity of linear optical coupler |
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| CN201410202938.1A Expired - Fee Related CN103969531B (en) | 2014-05-09 | 2014-05-14 | Automatic testing device for linearity of linear optical coupler |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969531A (en) * | 2014-05-09 | 2014-08-06 | 王允 | Automatic testing device for linearity of linear optical coupler |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106092145B (en) * | 2016-08-30 | 2019-01-18 | 南京理工大学 | A kind of silicon micro-gyroscope measure and control device based on the separation of gauge outfit plate |
| CN108037394A (en) * | 2017-12-22 | 2018-05-15 | 浙江八达电子仪表有限公司 | A kind of device of optocoupler time response detection |
| CN108572285B (en) * | 2018-03-26 | 2019-12-31 | 北京航空航天大学 | High-speed optocoupler screening method based on low-frequency broadband noise |
| CN110824327A (en) * | 2019-11-20 | 2020-02-21 | 山东理工大学 | Linearity testing device and method for simulating photoelectric transmission system |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN2476824Y (en) * | 2001-04-19 | 2002-02-13 | 安徽工业大学 | Automatic testing device for property of photoelectric coder and speedometer |
| CN100384551C (en) * | 2005-02-02 | 2008-04-30 | 浙江中控技术股份有限公司 | Optical coupling screening device |
| JP4801180B2 (en) * | 2009-03-06 | 2011-10-26 | 株式会社日立製作所 | Multichannel analog input / output circuit failure diagnosis apparatus and failure diagnosis method |
| CN101769968B (en) * | 2009-12-24 | 2013-05-01 | 宁波电业局 | Mutual inductor no-load voltage ratio tester |
| CN202057476U (en) * | 2011-03-01 | 2011-11-30 | 上海奉天电子有限公司 | Linearity testing device |
| CN203881868U (en) * | 2014-05-09 | 2014-10-15 | 王允 | An automatic testing device for the linearity of linear optocouplers |
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2014
- 2014-05-14 CN CN201420246912.2U patent/CN203881868U/en not_active Expired - Fee Related
- 2014-05-14 CN CN201410202938.1A patent/CN103969531B/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969531A (en) * | 2014-05-09 | 2014-08-06 | 王允 | Automatic testing device for linearity of linear optical coupler |
| CN103969531B (en) * | 2014-05-09 | 2017-02-15 | 王允 | Automatic testing device for linearity of linear optical coupler |
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| Publication number | Publication date |
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| CN103969531A (en) | 2014-08-06 |
| CN103969531B (en) | 2017-02-15 |
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