CN110824327A - Linearity testing device and method for simulating photoelectric transmission system - Google Patents

Linearity testing device and method for simulating photoelectric transmission system Download PDF

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Publication number
CN110824327A
CN110824327A CN201911141973.6A CN201911141973A CN110824327A CN 110824327 A CN110824327 A CN 110824327A CN 201911141973 A CN201911141973 A CN 201911141973A CN 110824327 A CN110824327 A CN 110824327A
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test
transmission system
linearity
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王玮
孙中玉
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Shandong University of Technology
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

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Abstract

A linearity testing device and a testing method for an analog photoelectric transmission system belong to the technical field of electrical measurement. The method is characterized in that: the device comprises an upper computer and a lower computer which are connected with each other, wherein an analog photoelectric transmission system to be tested is arranged in the lower computer, and the device further comprises the following steps: 1001, reading test parameters in an upper computer; step 1002, a signal generation module outputs a test voltage signal; step 1003, the signal receiving module receives the test output voltage; step 1004, storing the test point data; step 1005, testing whether the voltage signal reaches the maximum value; step 1006, updating the test input voltage; step 1007, the test ends. In step 1008, the linearity of the analog optical-to-electrical transmission system is determined. By the linearity testing device and the linearity testing method for the analog photoelectric transmission system, the actual linearity of each set of analog photoelectric transmission system can be tested, and then the targeted compensation is carried out according to the actual data of the linearity, so that the precision of the electrical measurement equipment is finally improved.

Description

Linearity testing device and method for simulating photoelectric transmission system
Technical Field
A linearity testing device and a testing method for an analog photoelectric transmission system belong to the technical field of electrical measurement.
Background
In the electrical measurement field, the physical quantity to be measured is mostly the electric current, the voltage magnitude that are located the high voltage side, in order to realize the electrical isolation at high, low voltage both ends, improves the interference killing feature of the signal transmission of awaiting measuring under the strong electromagnetic environment simultaneously, uses optic fibre to carry out the transmission of signal in the engineering more. As shown in fig. 5, a conventional analog photoelectric transmission system is configured such that an electrical signal to be transmitted is converted into an optical signal at a transmitting end through electrical/optical conversion, and the electrical signal to be transmitted is obtained at a receiving end through optical/electrical conversion after being transmitted through an optical fiber; the second mode is to transmit the physical electrical signal to be measured to the low-voltage side in the mode of simulating the optical signal by using the optical intensity modulation mode, and the optical intensity modulation mode can keep the complete waveform information to be measured without sampling by using an A/D system on the high-voltage side, so the frequency band of the transmittable signal is far wider than that of the digital transmission mode, and the analog photoelectric transmission system can be applied to small current measurement application, traveling wave measurement application, impulse voltage/current measurement application and the like which have wider frequency band requirements, which cannot be compared with the digital transmission system. And because the sampling link of the high-voltage side A/D system is avoided, the power consumption of the high-voltage side circuit is greatly reduced, and the problem of energy extraction of the high-voltage side for the A/D system is solved. However, the light intensity modulation method has the following problems: to ensure high transmission precision when signals are transmitted in this way, an electric/optical and optical/electric transmission system with high linearity must be established, i.e. the linearity of optical path transmission largely determines the precision of system measurement.
In the prior art, chinese patent application No. ZL201610682973.7 discloses an apparatus and method for transmitting impulse voltage by directly driving LED light emission, which uses a direct LED light emission manner, and because LED light emission has a dead zone, it uses a linear region of LED light emission to realize transmission of a signal to be measured. The chinese patents with application numbers 201410379248.3 and 201510102017.2 apply direct-drive LED lighting to the design of an electronic current transformer, and in none of these inventions, the nonlinear transmission characteristic of the system is measured and compensated, so that it is difficult to achieve high measurement accuracy in application.
In the chinese patents with application numbers 201610678421.9, 201610678235.5, and 201610683194.9, in order to solve the non-linearity problem existing when directly driving the LED to emit light, the LED is indirectly driven to emit light through an optical path feedback mechanism, thereby realizing the linearization of the LED light emission and the driving signal. However, in such a technical solution, the linearity of the whole optical-electrical transmission system is substantially represented by the linearity of a photodiode with high linearity, that is, the linearity of the optical-electrical transmission system completely depends on the linearity of the photodiode used in the feedback optical path, so when the linearity of the photodiode approaches to ideal linearity, these methods can achieve good effect and high transmission accuracy, however, once the linearity of the photodiode used is not ideal enough, especially when a large photoelectric conversion dynamic range of the photodiode needs to be occupied, the photodiode is difficult to ensure high linearity in a wide range, and at this time, the measurement accuracy of the system is usually difficult to meet the requirement of high measurement accuracy.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: the linearity testing device and the linearity testing method for the analog photoelectric transmission system overcome the defects of the prior art, and aim compensation is performed according to actual data of linearity by testing the actual linearity and the testing points which do not meet the linearity of each set of analog photoelectric transmission system, so that the accuracy of electrical measuring equipment is finally improved.
The technical scheme adopted by the invention for solving the technical problems is as follows: the linearity testing device for the analog photoelectric transmission system is characterized in that: the testing device comprises an upper computer and a lower computer which are connected with each other, wherein an analog photoelectric transmission system to be tested is arranged in the lower computer, the lower computer comprises a signal transmitting module, a central control module and a signal receiving module, the output end of the central control module is connected with the input end of the signal generating module, the signal generating module generates a testing voltage signal and sends the testing voltage signal to the input end of the analog photoelectric transmission system to be tested, the output end of the analog photoelectric transmission system to be tested is connected with the input end of the central control module, and the central control module is in two-way connection with the upper computer.
Preferably, the upper computer comprises a test parameter setting module and a linearity analysis module, the output end of the test parameter setting module is connected with the input end of a central control module in the lower computer, and the output end of the central control module is connected with the input end of the linearity analysis module.
Preferably, the signal generating module adopts a digital-to-analog conversion module, and the signal receiving module adopts an analog-to-digital conversion module.
Preferably, the central control module adopts a microprocessor.
A linearity test method for simulating a photoelectric transmission system is characterized by comprising the following steps: the method comprises the following steps:
1001, reading a test parameter set in an upper computer by a central control module in a lower computer;
step 1002, the central control module controls the signal generation module to output a test voltage signal U according to the test parameters read from the upper computerINAnd testing the voltage signal UINSending the analog photoelectric transmission system to be tested;
step 1003, after delaying △ t, the central control module controls the signal receiving module to receive a test voltage signal U sent by the analog photoelectric transmission system to be testedOUT；
Step 1004, obtaining a test voltage signal U output by the analog photoelectric transmission system to be testedOUTThereafter, the central control module obtains a set of test point data (U)IN，UOUT)；
Step 1005, the central control module judges the test voltage signal UINWhether or not the preset maximum value U is reachedINMAXIf the preset maximum U has not been reachedINMAX Step 1006 is executed if the voltage signal U has been testedINHas reached a predetermined maximum value UINMAXStep 1007 is executed;
step 1006, the central control module updates the test voltage signal UINThen, returning to step 1002 and repeatedly executing steps 1002 to 1006 to obtain data of each test point: (U)IN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3)……(UINn，UOUTn)；
Step 1007, after the test, the central control module sends all the stored test point data to the upper computer;
step 1008, the upper computer performs test point data (U) according to all the test pointsIN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3).......(UINn，UOUTn) And obtaining a curve of the simulated photoelectric transmission system to be tested, and finding out points which do not meet the linearity relation.
Preferably, the test parameters in step 1001 include: test voltage signal UINInitial value of (1), test voltage signal UINIncrease step △ DC, test voltage signal UINMaximum value of UINMAXAnd sends out a test voltage signal UINTime interval T.
Compared with the prior art, the invention has the beneficial effects that:
1. by the linearity testing device and the linearity testing method for the analog photoelectric transmission system, the actual linearity of each set of analog photoelectric transmission system and the testing points which do not meet the linearity can be tested, and then the pertinence compensation is carried out according to the actual data of the linearity, so that the precision of the electrical measuring equipment is finally improved.
2. The analog photoelectric transmission system consists of a linear electric/optical conversion module, an optical fiber and a linear optical/electric conversion module, is influenced by the precision of the linear electric/optical conversion module and the linear optical/electric conversion module, so that the analog photoelectric transmission system is not an ideal linear system, the high-precision measurement of the analog photoelectric transmission system is difficult to realize by utilizing the analog photoelectric transmission system, the reject ratio of products is influenced due to the individual precision difference of photodiodes in the mass production in the engineering even aiming at the application with low precision, and the problem of poor transmission precision of the analog photoelectric transmission system caused by the individual precision difference of the photodiodes can be solved by the linearity testing device and the testing method for the analog photoelectric transmission system.
3. Aiming at the LED indirect light-emitting analog photoelectric transmission system realized by utilizing the optical path feedback mechanism, the measurement precision can be further improved by performing targeted compensation on points with non-ideal linearity. The requirement on the linearity of the photodiode which is the most critical device for determining the linearity of the analog optical-electrical transmission system is lowered, the cost of related finished products is lowered, and the qualified rate of products is improved.
Drawings
Fig. 1 is a schematic block diagram of a linearity testing apparatus for an analog optical-electrical transmission system.
Fig. 2 is a flow chart of a linearity testing method for an analog optical-electrical transmission system.
Fig. 3 is a graph showing an input-output relationship of a simulated photoelectric transmission system.
Fig. 4 is a graph of input-output transmission linearity of the analog photoelectric transmission system.
Fig. 5 is a schematic block diagram of a prior art analog optical-to-electrical transmission system.
Detailed Description
Fig. 1 to 5 are preferred embodiments of the present invention, and the present invention will be further described with reference to fig. 1 to 5.
As shown in fig. 1, a linearity testing apparatus for an analog photoelectric transmission system includes an upper computer and a lower computer connected to each other, and a signal generating module, a central control module, a signal receiving module, and an analog photoelectric transmission system to be tested (hereinafter referred to as a system to be tested) are disposed in the lower computer. The output end of the central control module is connected with the input end of the signal generation module, the signal generation module generates a test voltage signal, the voltage signal is connected to the input end (transmitting end in fig. 5) of the system to be tested, the input end (receiving end in fig. 5) of the system to be tested outputs the test voltage signal transmitted by the system to be tested, the test voltage signal transmitted by the system to be tested is connected to the input end of the signal receiving module, and the output end of the signal receiving module is connected to the input end of the central control module.
The upper computer is provided with a test parameter setting module and a linearity analysis module, the output end of the test parameter setting module is connected with the input end of the central control module in the lower computer, and the output end of the central control module in the lower computer is connected with the input end of the linearity analysis module.
In determining the linearity of the system to be tested, the evaluation can be performed as follows: and respectively inputting direct current voltage signals with different sizes to the system to be tested, and correspondingly obtaining each corresponding output voltage signal after the voltage signals are transmitted by the system to be tested. Respectively recording the DC voltage signals of the input system to be tested as UIN1、UIN2、UIN3。。。。。。。UINnThe voltage signals output correspondingly are respectively marked as UOUT1、UOUT2、UOUT3。。。。。。。UOUTnThereby obtaining a compound of (U)IN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3)........(UINn，UOUTn) This series of test point data. If the system under test has an ideal linear transmission relationship, i.e., it has ideal linearity, then each UINAnd UOUTPoints will both be in the standard UOUT＝K·UINThe measurement achieved by the analog optical-electrical transmission system is theoretically error-free at this time.
Therefore, as shown in fig. 2, the linearity testing method of the system to be tested includes the following steps:
1001, reading parameters in an upper computer by a lower computer;
and a central control module in the lower computer reads the test parameters set by the test parameter setting module in the upper computer.
The central control module in the lower computer is realized by a microprocessor (such as a singlechip), and the central control module has the function of outputting corresponding test voltage signals according to the parameter control signal generation module sent by the test parameter setting module. The signal generation module is realized by a high-precision digital-to-analog conversion (D/A conversion) module and is used for controlling according to the centerThe control of the system module sends out analog direct current voltages (test voltage signal U) with different sizesIN). The signal receiving module is realized by a high-precision analog-to-digital conversion (A/D conversion) module and has the function of converting UINCorresponding output signal U after input of analog photoelectric transmission systemOUTThe samples are converted to digital quantities.
And the test parameters set by the test parameter setting module include: test voltage signal UINInitial value of (1), test voltage signal UINIncrease step △ DC, test voltage signal UINMaximum value of UINMAXAnd sends out a test voltage signal UINTime interval T.
Step 1002, controlling a signal generation module in a lower computer to output a test voltage signal;
the central control module controls the signal generation module to output a test voltage signal according to the test parameters set by the test parameter setting module.
Step 1003, controlling a signal receiving module in the lower computer to sample to obtain test output voltage;
after waiting for △ t, the central control module controls the signal receiving module to receive a test voltage signal U sent by the system to be testedOUT。
Test voltage signal UINThe signal enters the system to be tested from the beginning to obtain an output signal UOUTThere is a short delay τ (μ s for analog photoelectric transmission signals, different analog photoelectric transmission systems have different specific delay times), so that the central control module sends U from the control signal generation moduleINThereafter, it must wait a time △ t (△ t)>τ) and then to the output signal UOUTSampling is performed.
Step 1004, storing the test point data;
obtaining a test voltage signal U output by a system to be testedOUTThereafter, the central control module obtains a set of test point data (U)IN，UOUT) And the first set of test point data is marked as (U)IN1，UOUT1)。
Step 1005, testing whether the voltage signal reaches a preset maximum value;
central control module judges test voltage signal UINWhether or not the preset maximum value U is reachedINMAXIf the preset maximum U has not been reachedINMAX Step 1006 is executed if the voltage signal U has been testedINHas reached a predetermined maximum value UINMAXStep 1007 is executed.
Step 1006, updating the test input voltage according to the increase step size of the preset voltage value;
the central control module updates the test input voltage, i.e., U, in accordance with the preset voltage value increase step △ DCIN＝UIN+ △ DC, then returning to step 1002 and repeating steps 1002-1006 to obtain each test point data (U)IN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3)……(UINn，UOUTn)。
And step 1007, finishing the test, and sending all the test point data to an upper computer.
And after the test is finished, the central control module sends all the stored test point data to the linearity analysis module of the upper computer.
Step 1008, determine the linearity curve of the analog photoelectric transmission system, and find out the points that do not satisfy the linearity relation.
The linearity analysis module is used for analyzing all the test point data (U)IN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3).......(UINn，UOUTn) And obtaining a curve of the system to be tested, and finding out points which do not satisfy the linearity relation.
The following is a detailed description of an example:
taking any analog optical-electrical transmission system (such as the analog optical-electrical transmission system disclosed in the chinese patent with the applicant's application number of 201610678235.5) as an example, assume that the maximum dc voltage signal U used in the analog optical-electrical transmission system is the same as the maximum dc voltage signal U used in the analog optical-electrical transmission systemINMAXIs 5V, (i.e. U)INMAX5V) may be obtained as shown in fig. 3, an input-output relationship graph may be obtainedAnd can obtain each UINAnd UOUTPoint, both will be in the standard UOUT＝K·UINLinear relationship (straight line La in fig. 3). To obtain UINFrom 0 to UINMAXThe true linearity of the analog optical-electrical transmission system in this range can be obtained by testing several points in the range:
if a test point is required to be arranged every 100mV (the more test points, the more real the relation of linearity and the higher the precision after calibration compensation), the signal generation module needs to be respectively enabled to send out UINA total of 50 test points of 100mV, 200mV, 300mV, andOUTsetting △ mV at this moment, if it is hoped to finish the test of one test point every 0.1S, setting the time interval T of test point to 0.1S, then obtaining the test parameter of the test parameter setting module, UIN1Is initialized to 100mV, UINMAX5V, 0.1S time interval T, 100mV △ DC.
After the central control module obtains the test parameters, the central control module drives the signal generation module to send out different test voltage signals U according to the test parametersINThus, after 5S, the test of 50 test points can be completed, and the corresponding test voltage signal U is correspondingly obtainedOUT. Here test time interval T and central control module pair UOUTThe generation of the waiting time △ t of the sample is realized by a timer of a microprocessor in the central control module in order to ensure UINAnd UOUTThe signal generating module and the signal receiving module respectively use 16-bit D/A and 16-bit A/D, and if the reference voltage of the A/D and the D/A is 5V, the resolution of the A/D and the D/A can reach 5V/216The microprocessor in the corresponding central control module also uses a 16-bit microprocessor, such as a 16-bit MPS430 singlechip.
After the test of all 50 test points is completed, 50 groups of data are obtained: (U)IN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3).......(UIN50，UOUT50) The central control module sends the 50 groups of data to the upper computer software by using a serial port or a network port, and the software is transmitted to the upper computer software by the central control moduleThe linearity analyzing module analyzes the linearity of the system to obtain an input-output transmission linearity relation curve chart shown in fig. 4, where it is to be noted that, for the purpose of illustration in fig. 4, the test point data of all 50 test points are not listed, and the test point data that does not satisfy the linearity relation (each point in the area a in fig. 4) is obtained, and the obtained test point that does not satisfy the linearity relation is taken as the data point that needs to be compensated, and is compensated in the actual transmission, so that the transmission accuracy of the system to be tested in the actual transmission is effectively improved.
The foregoing is directed to preferred embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow. However, any simple modification, equivalent change and modification of the above embodiments according to the technical essence of the present invention are within the protection scope of the technical solution of the present invention.

Claims (6)

1. A linearity testing device for simulating an optical-electrical transmission system is characterized in that: the testing device comprises an upper computer and a lower computer which are connected with each other, wherein an analog photoelectric transmission system to be tested is arranged in the lower computer, the lower computer comprises a signal transmitting module, a central control module and a signal receiving module, the output end of the central control module is connected with the input end of the signal generating module, the signal generating module generates a testing voltage signal and sends the testing voltage signal to the input end of the analog photoelectric transmission system to be tested, the output end of the analog photoelectric transmission system to be tested is connected with the input end of the central control module, and the central control module is in two-way connection with the upper computer.
2. The linearity test device for an analog optical-electrical transmission system of claim 1, wherein: the upper computer comprises a test parameter setting module and a linearity analysis module, the output end of the test parameter setting module is connected with the input end of a central control module in the lower computer, and the output end of the central control module is connected with the input end of the linearity analysis module.
3. The linearity test device for an analog optical-electrical transmission system of claim 1, wherein: the signal generating module adopts a digital-to-analog conversion module, and the signal receiving module adopts an analog-to-digital conversion module.
4. The linearity test device for an analog optical-electrical transmission system of claim 1, wherein: the central control module adopts a microprocessor.
5. A linearity test method realized by the linearity test device for the analog optical-electrical transmission system according to any one of claims 1 to 4, characterized in that: the method comprises the following steps:
1001, reading a test parameter set in an upper computer by a central control module in a lower computer;
step 1002, the central control module controls the signal generation module to output a test voltage signal U according to the test parameters read from the upper computerINAnd testing the voltage signal UINSending the analog photoelectric transmission system to be tested;
step 1003, after delaying △ t, the central control module controls the signal receiving module to receive a test voltage signal U sent by the analog photoelectric transmission system to be testedOUT；
Step 1004, obtaining a test voltage signal U output by the analog photoelectric transmission system to be testedOUTThereafter, the central control module obtains a set of test point data (U)IN，UOUT)；
Step 1005, the central control module judges the test voltage signal UINWhether or not the preset maximum value U is reachedINMAXIf the preset maximum U has not been reachedINMAXStep 1006 is executed if the voltage signal U has been testedINHas reached a predetermined maximum value UINMAXStep 1007 is executed;
step 1006, the central control module updates the test voltage signal UINThen, returning to step 1002 and repeatedly executing steps 1002 to 1006 to obtain data of each test point: (U)IN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3)……(UINn，UOUTn)；
Step 1007, after the test, the central control module sends all the stored test point data to the upper computer;
step 1008, the upper computer performs test point data (U) according to all the test pointsIN1，UOUT1)、(UIN2，UOUT2)、(UIN3，UOUT3).......(UINn，UOUTn) And obtaining a curve of the simulated photoelectric transmission system to be tested, and finding out points which do not meet the linearity relation.
6. The linearity test method of claim 5, wherein: the test parameters described in step 1001 include: test voltage signal UINInitial value of (1), test voltage signal UINIncrease step △ DC, test voltage signal UINMaximum value of UINMAXAnd sends out a test voltage signal UINTime interval T.
CN201911141973.6A 2019-11-20 2019-11-20 Linearity testing device and method for simulating photoelectric transmission system Pending CN110824327A (en)

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CN103969531A (en) * 2014-05-09 2014-08-06 王允 Automatic testing device for linearity of linear optical coupler
CN107016848A (en) * 2017-04-03 2017-08-04 中国人民解放军理工大学 Carry the Lightning Electromagnetic Pulse optical fiber transmission measuring syste of calibration and compensation

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Application publication date: 20200221