CN103413747B - Space plasma measurement apparatus - Google Patents
Space plasma measurement apparatus Download PDFInfo
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- CN103413747B CN103413747B CN201310302876.7A CN201310302876A CN103413747B CN 103413747 B CN103413747 B CN 103413747B CN 201310302876 A CN201310302876 A CN 201310302876A CN 103413747 B CN103413747 B CN 103413747B
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Abstract
Space plasma measurement apparatus, be conducive to improving speed and the precision of space plasma parameter measurement, including PCI6251 multifunctional data acquisition card, this card side connects industrial computer, opposite side is by photoelectric isolating circuit linking probe scanning power circuit respectively, probe current testing circuit and probe voltage testing circuit, magnitude of voltage is transferred to described data collecting card with the form of digital signal according to the scanning voltage parameter set by described industrial computer, the digital signal of described magnitude of voltage is converted to analog signal output, and in described photoelectric isolating circuit after one-level Phototube Coupling amplifies, it is added on probe again through probe scanning power circuit；Probe voltage on probe voltage testing circuit measuring probe, probe current on probe current testing circuit measuring probe, the A/D port of PCI6251 multifunctional data acquisition card converts analog signals into digital signal, and is transferred to described industrial computer and draws space plasma parameter.
Description
Technical field
The present invention relates to space plasma diagnostic test technologies, particularly a kind of space plasma measurement apparatus.
Background technology
Space plasma probe diagnostics technology is the same with other measuring technologies, requires constantly to improve the speed measured and precision, reduce the disturbance measuring object in its evolution.According to the difference of space plasma character, measuring method gradually forms two big measuring technology " static test technology " and " instantaneous measurement technology ".For steady-state spatial plasma, owing to it is in stable state, it is possible at any time, record gathers data, adopt static measurement technology for this.During research transient state space plasma, due to the existence of decay and fluctuation, it is necessary to instantaneous record data, adopt dynamic measuring tech for this.No matter being adopt which kind of measurement technology, it is identical for having a bit, that is, being required for the change probe current potential to space plasma rapidly, recording the probe current corresponding to this current potential, thus completing the measurement of probe C-V characteristic simultaneously.The multiplex PLC of product of space plasma probe measurement device of the prior art or chip microcontroller, scanning speed and the certainty of measurement of system are not ideal enough, and capacity of resisting disturbance is not strong, and software programming is more complicated, not intuitively.Some investigators is separately had still to use resolution element to build diagnostic system, the voltage scanning of system relies on manual adjustments to complete, the reading of data is with to select also be by being accomplished manually, and this speed that directly affects measurement and accuracy, measurement result can not truly reflect the parameter of space plasma.It is badly in need of the measurement apparatus developing a kind of applicable different densities space plasma with satisfied research needs.Need from research, the development of space plasma probe measurement device is inevitable towards following trend: 1. so that quickly scanning and data acquisition replace traditional manual measurement mode automatically, to improve measuring speed, within the shorter time, obtain more information data.2. adopt high-precision scanning output and data acquisition element, to improve the precision of data, reduce the experimental error because device itself causes as far as possible；The capacity of resisting disturbance of intensifier, makes great efforts to improve accuracy and the reliability of measurement result.3. improving integrated level, and make device can be connected in PC, the power by PC carries out high-speed data process and abundant result intuitively shows.4. improve the versatility of device, make it to meet the measurement requirement of different spaces plasma.5. install the mechanical scanning part of probe additional so that device can the space plasma parameter of one-shot measurement difference, thus obtaining the spatial distribution of space plasma parameter.6. friendly man machine operation interface is provided so that arranging of user energy intuitive and convenient is measured parameter and read measurement result.
Summary of the invention
The present invention is directed to the defect or deficiency that exist in prior art, it is provided that a kind of space plasma measurement apparatus, be conducive to improving speed and the precision of space plasma parameter measurement.
Technical scheme is as follows:
Space plasma measurement apparatus, it is characterized in that, including PCI6251 multifunctional data acquisition card, described PCI6251 multifunctional data acquisition card side connects industrial computer, opposite side is by photoelectric isolating circuit linking probe scanning power circuit respectively, probe current testing circuit and probe voltage testing circuit, magnitude of voltage is transferred to described PCI6251 multifunctional data acquisition card with the form of digital signal according to the scanning voltage parameter set by described industrial computer, the digital signal of described magnitude of voltage is converted to analog signal output by the D/A output port of described PCI6251 multifunctional data acquisition card, and in described photoelectric isolating circuit after one-level Phototube Coupling amplifies, it is added on probe as scanning voltage after being amplified to specified multiple again through probe scanning power circuit；Probe voltage on described probe voltage testing circuit measuring probe, probe current on described probe current testing circuit measuring probe, described probe voltage and described probe current convert analog signals into digital signal by the A/D port of described PCI6251 multifunctional data acquisition card after described photoelectric isolating circuit amplifies, and give described industrial computer by probe voltage digital signal and probe current digital data transmission；Described industrial computer calculates space plasma parameter according to described probe voltage digital signal and probe current digital signal.
Described PCI6251 multifunctional data acquisition card has 24 duplex channel numeral I/O lines and 18 analog ports, and described digital port is to recommend form driven for emitting lights diode.
Described 24 digital ports include 1 2.5V normal voltage port and 1 5V power supply port, and 2.5V normal voltage is produced by digital to analog converter DAC, and 5V power supply is provided by industrial computer.
Described probe current testing circuit includes sampling resistor, and described sampling resistor is connected in probe loop, probe current changes into probe voltage with measurement.
Described probe current testing circuit includes isolation amplification chip ISO100AP.
Described probe voltage testing circuit adopts electric resistance partial pressure type circuit.
Described probe voltage testing circuit includes isolation amplification chip ISO100AP, and adopts ISO100AP one pole input connection that described probe voltage testing circuit is used as in-phase amplifier.
The technique effect of the present invention is as follows: this space plasma measurement apparatus, it includes five parts such as high-precision PCI6251 multifunctional data acquisition card, probe scanning power circuit, probe voltage testing circuit, probe current testing circuit and photoelectric isolating circuit, so as to improve speed and the precision of space plasma parameter measurement.It is as follows that the present invention is capable of index: 1. voltage scan range: maximum-100V～100V, and scope is stepless adjustable, can realize the voltage scanning output of asymmetric scope.2. maximum probe current: 100mA.3. voltage scan rate: renewal rate 2.86MS/s.4. voltage scanning precision: minimum step 0.01V.5. voltage detecting precision: 0.01V.6. current detection accuracy: 0.01mA.7. acquisition speed: sample rate 1.25MS/s.Virtual instrument software can also be utilized to complete basic output and acquisition function, show electric current, voltage, I-V curve in real time, and data are exported in table form, carry out later stage process to facilitate.
Accompanying drawing explanation
Fig. 1 is the space plasma measurement apparatus schematic diagram implementing the present invention.
Detailed description of the invention
Below in conjunction with accompanying drawing 1, the present invention will be described.
Fig. 1 is the space plasma measurement apparatus schematic diagram implementing the present invention.As shown in Figure 1, space plasma measurement apparatus, including PCI6251 multifunctional data acquisition card, described PCI6251 multifunctional data acquisition card side connects industrial computer, opposite side is by photoelectric isolating circuit linking probe scanning power circuit respectively, probe current testing circuit and probe voltage testing circuit, magnitude of voltage is transferred to described PCI6251 multifunctional data acquisition card with the form of digital signal according to the scanning voltage parameter set by described industrial computer, the digital signal of described magnitude of voltage is converted to analog signal output by the D/A output port of described PCI6251 multifunctional data acquisition card, and in described photoelectric isolating circuit after one-level Phototube Coupling amplifies, it is added on probe as scanning voltage after being amplified to specified multiple again through probe scanning power circuit；Probe voltage on described probe voltage testing circuit measuring probe, probe current on described probe current testing circuit measuring probe, described probe voltage and described probe current convert analog signals into digital signal by the A/D port of described PCI6251 multifunctional data acquisition card after described photoelectric isolating circuit amplifies, and give described industrial computer by probe voltage digital signal and probe current digital data transmission；Described industrial computer calculates space plasma parameter according to described probe voltage digital signal and probe current digital signal.Described PCI6251 multifunctional data acquisition card has 24 duplex channel numeral I/O line caps and 18 analog ports.Described 24 digital ports include 1 2.5V normal voltage port and 1 5V power supply port, and 2.5V normal voltage is produced by digital to analog converter DAC, and 5V power supply is provided by industrial computer.Described probe current testing circuit includes sampling resistor, and described sampling resistor is connected in probe loop, probe current changes into probe voltage with measurement.Described probe current testing circuit includes isolation amplification chip ISO100AP.Described probe voltage testing circuit adopts electric resistance partial pressure type circuit.Described probe voltage testing circuit includes isolation amplification chip ISO100AP, and adopts ISO100AP one pole input connection that described probe voltage testing circuit is used as in-phase amplifier.
The core parts that PCI6251 multifunctional data acquisition card is the present invention of American National instrument (NI) company.At this, capture card mainly achieves following functions: 1. provide high-speed PCI passage and computer communication so that whole system can be connected with computer；2. the D/A data conversion output of high-speed, high precision is realized；3. the conversion of A/D data and the collection of high-speed, high precision are realized.The digital port of PCI6251 inputs, output voltage range is: 0V～5V, port has significantly high input impedance.
PCI6251 multifunctional data acquisition card self is provided that 24 duplex channel numeral I/O lines, and control an analog-digital converter (ADC) respectively provide 16 analog input end mouths (AI0～AI15), two digital to analog converters (DAC) to provide 2 analog output mouths (AO0, AO1) by spi bus.Finally it is connected with corresponding simulation input, outlet terminal and numeral input, outlet terminal by these ports.PCI6251 has 24 bi-directional digital ports.The normal voltage port of 2.5V is produced by DAC, and the power supply of 5V is to be provided by computer.PCI6251 has 18 analog ports, wherein 16 difference analogue input ports (AI0～AI15), 2 analog outputs mouth (AO0 and AO1), 16 simulation ground ports.In simulation ground port, AI0 and AI4, AI1 and AI5, AI2 and AI6, AI3 and AI7 share a simulation ground port respectively, two other simulation ground port corresponding A O0 and AO1 respectively.
What current detecting part adopted is utilize sampling resistor to be connected in series into probe loop, and probe current changes into what the method for voltage measured.The maximum output area of voltage is-100V～100V, and voltage span is not as big, therefore adopts general electric resistance partial pressure type circuit just can reach certainty of measurement requirement.Circuit adopts ISO100AP one pole input connection to use as in-phase amplifier, voltage detecting circuit adopts electric resistance partial pressure type circuit, a series circuit being made up of current-limiting resistance R5 and sample resistance RPot6 in parallel, the voltage URPot6=VpR5/RPot6 on such resistance RPot6 over the ground at the probe place of power supply.This voltage enters the A/D input port of capture card after one-level Phototube Coupling amplifies K3 times, reasonably chooses the resistance of R5 and RPot6 so that URPot6 and K3 × URPot6 is respectively less than the extreme voltage values of optical isolation amplifier and capture card A/D input.K3 × the URPot6 finally collected is probe actuation voltage actual value after amplifying R5/K3RPot6 times by software, this completes the data acquisition to probe voltage.Scanning power circuit operation principle is as follows: first, the scanning voltage V0 needed for probe is exported by the analog port of capture card, obtaining V0'(amplification actually herein through ISO100AP isolation amplification is that 1, ISO100AP starting voltage isolates the effect followed, therefore has V0=V0')；Then, it is the output of ambipolar voltage owing to the simulation of capture card exports, the voltage signal V0' after isolation is sent into after high-power amplifier PA93 amplifies K times and obtains the voltage Vp required for probe.
It is hereby stated that, described above contribute to skilled artisan understands that the present invention, but and the protection domain of unrestricted the invention.Any enforcement that equivalent replacement described above, modification are improved and/or delete numerous conforming to the principle of simplicity and carry out without departing from the invention flesh and blood, each falls within the protection domain of the invention.
Claims (3)
1. space plasma measurement apparatus, it is characterized in that, including PCI6251 multifunctional data acquisition card, described PCI6251 multifunctional data acquisition card side connects industrial computer, opposite side is by photoelectric isolating circuit linking probe scanning power circuit respectively, probe current testing circuit and probe voltage testing circuit, magnitude of voltage is transferred to described PCI6251 multifunctional data acquisition card with the form of digital signal according to the scanning voltage parameter set by described industrial computer, the digital signal of described magnitude of voltage is converted to analog signal output by the D/A output port of described PCI6251 multifunctional data acquisition card, and in described photoelectric isolating circuit after one-level Phototube Coupling amplifies, it is added on probe as scanning voltage after being amplified to specified multiple again through probe scanning power circuit；Probe voltage on described probe voltage testing circuit measuring probe, probe current on described probe current testing circuit measuring probe, described probe voltage and described probe current convert analog signals into digital signal by the A/D port of described PCI6251 multifunctional data acquisition card after described photoelectric isolating circuit amplifies, and give described industrial computer by probe voltage digital signal and probe current digital data transmission；Described industrial computer calculates space plasma parameter according to described probe voltage digital signal and probe current digital signal；Described probe current testing circuit includes isolation amplification chip ISO100AP；Described probe voltage testing circuit includes isolation amplification chip ISO100AP, and adopts ISO100AP one pole input connection that described probe voltage testing circuit is used as in-phase amplifier；
Described PCI6251 multifunctional data acquisition card has 24 digital ports and 18 analog ports, and described digital port is to recommend form driven for emitting lights diode；Described 24 digital ports include 1 2.5V normal voltage port and 1 5V power supply port, and 2.5V normal voltage is produced by digital to analog converter DAC, and 5V power supply is provided by industrial computer.
2. space plasma measurement apparatus according to claim 1, it is characterised in that described probe current testing circuit includes sampling resistor, described sampling resistor is connected in probe loop, probe current changes into probe voltage with measurement.
3. space plasma measurement apparatus according to claim 1, it is characterised in that described probe voltage testing circuit adopts electric resistance partial pressure type circuit.
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| CN201310302876.7A CN103413747B (en) | 2013-07-18 | 2013-07-18 | Space plasma measurement apparatus |
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| CN201310302876.7A CN103413747B (en) | 2013-07-18 | 2013-07-18 | Space plasma measurement apparatus |
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| CN103413747B true CN103413747B (en) | 2016-07-06 |
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Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107462767A (en) * | 2017-09-18 | 2017-12-12 | 广州城市职业学院 | plasma probe measurement and control system |
| CN109975720B (en) * | 2017-12-25 | 2021-04-13 | 核工业西南物理研究院 | Method for simulating and testing volt-ampere characteristic of probe |
| CN109596245A (en) * | 2018-07-02 | 2019-04-09 | 哈尔滨工业大学 | It is good to draw electron temperature and plasma density measurement method and system in clean refined magnetic well |
| CN109688686B (en) * | 2018-12-10 | 2021-02-02 | 兰州空间技术物理研究所 | Langmuir probe volt-ampere characteristic simulation device in plasma environment |
| CN110673195B (en) * | 2019-08-26 | 2021-04-13 | 北京控制工程研究所 | Device and method for measuring transient ion flow field of plasma thruster |
| CN114071848B (en) * | 2021-09-29 | 2024-02-23 | 太原市华纳方盛科技有限公司 | Plasma diagnostic circuit and method |
| CN114236222A (en) * | 2021-12-03 | 2022-03-25 | 北京东方计量测试研究所 | Electrostatic probe current measuring device |
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| CN101539483A (en) * | 2009-04-29 | 2009-09-23 | 北京航空航天大学 | Electric propulsion testing platform measurement control device |
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