CN201508399U - Testing jig of tester special for testing wiring board - Google Patents
Testing jig of tester special for testing wiring board Download PDFInfo
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- CN201508399U CN201508399U CN2009201344133U CN200920134413U CN201508399U CN 201508399 U CN201508399 U CN 201508399U CN 2009201344133 U CN2009201344133 U CN 2009201344133U CN 200920134413 U CN200920134413 U CN 200920134413U CN 201508399 U CN201508399 U CN 201508399U
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- net point
- conducting element
- point assembly
- test
- testing
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Abstract
The utility model relates to a testing jig of a tester special for testing wiring board which comprises a dial plate, an upper grid point component, a down grid point component and a base. The upper grid point component comprises a test region butt jointed with the upper grid point component directly, a first conducting element of the upper grid point component in the testing region opposites to and electrically connects with a second conducting element of the down grid point component; the upper grid point is installed on the back of the dial plate, a testing probe scatters needles in the testing region and electrically connects with the first conducting element in the testing region, simultaneously, the oblique rate of the testing probe is in the setting range. The utility model avoid the testing probe contacting with the upper grid point component directly; the wiring board with various size is tested by changing the dial plate and increasing the conversion wiring board only. The testing jig has advantages of increasing universality, simplifying manufacturing and changing flow, and shortening manufacturing time greatly.
Description
[technical field]
The utility model relates to the electric performance test device, relates in particular to the short circuit of testing printed circuit and the measurement jig that opens circuit.
[background technology]
Wiring board manufacturer all will open circuit to the circuit on the wiring board and short-circuit test behind the wiring board that completes.Prior art comprises special tester, universal testing machine and flying probe tester to wiring board short circuit and the testing apparatus that opens circuit, wherein the flying probe tester test speed is slow, mainly be suitable for the testing engineering sample, the testing apparatus that is used to produce in batches the circuit plate then mainly is special tester and universal testing machine.
Special tester mainly is could test wiring board by the composite test device that electrically contacts with wiring board; Composite test device comprises dials and drum, and dials is the assembly that a plurality of test probes are housed, and each test probe is corresponding one by one with each test point on needing the measurement circuit plate; Drum is the assembly that a plurality of elastic partss are housed, and the tail end of each test probe all can contact with one of them elastic parts on the drum.The elasticity that elastic parts provides makes each test probe and wiring board to be tested that excellent contact be arranged, and reduces each test probe stabbing wiring board simultaneously again.Because the Bobbin structure of composite test device is relatively complicated, its Production Time is also long, and each composite test device is at the wiring board of different model, its dials and drum all will be made again, increased cost, and the Production Time of drum is long, and this has also brought inconvenience to the user.
[utility model content]
The technical problems to be solved in the utility model is to provide a kind of measurement jig simple in structure, that cost is low, that be used for measurement circuit plate special tester.
The technical scheme that its technical matters that solves the utility model adopts is: a kind of measurement jig that is used for measurement circuit plate special tester is provided, comprise the dials that is provided with a plurality of test probes and the test signal conductor wire on described special tester, described test probe is corresponding with the test point of circuit board to be tested;
Described measurement jig also comprises the last net point assembly that is provided with a plurality of first conducting elements, the base that is provided with the following net point assembly of a plurality of second conducting elements and is located at described following net point assembly downside;
Have the socket points that can be connected on the described base with the test signal conductor wire; Described second conducting element conducts electricity with the socket points on the described base and is connected;
Described upward net point assembly comprises the test zone that directly connects with described net point assembly down, the described relative one by one and electrical connection of second conducting element of going up the net point assembly at first conducting element with the described net point assembly down of described test zone;
Describedly go up the back side that the net point assembly is installed in described dials, and described test probe spreads pin in described test zone, is electrically connected with first conducting element in the described test zone, the slope of described test probe of while is in setting range.
In measurement jig of the present utility model, the setting range of the described slope of described test probe is within 5.5 degree.
In measurement jig of the present utility model, described first conducting element of described test zone on described on the net point assembly spacing embark on journey, become column distribution equably; And described second conducting element equates with the distribution density of described first conducting element.
In measurement jig of the present utility model, the described lower surface of going up the net point assembly is stretched out in the lower end of described first conducting element, simultaneously, an end of described second conducting element stretches out the described upper surface of net point assembly down, with the lower end formation good electrical contact of described first conducting element.
In measurement jig of the present utility model, be respectively equipped with corresponding registration holes on described dials, last net point assembly, following net point assembly and the base.
In measurement jig of the present utility model, described going up between net point assembly and the described time net point assembly is provided with buttcover plate, and described buttcover plate is provided with and described first conducting element and second conducting element conductive hole one to one.
Compare with prior art, the beneficial effect that the utility model is used for the measurement jig of measurement circuit plate special tester is:
The following net point assembly of the utility model measurement jig is contained in measurement circuit plate on the special tester, with general-purpose elastic parts base on the universal testing machine similar functions is arranged; And be electrically connected with test probe by last net point assembly, be electrically connected by last net point assembly and following net point assembly again, avoided test probe directly contacting with following net point assembly; And, when the wiring board of needs test different model, can only get final product by replacing with the net point assembly or increasing the conversion line plate.Increase the versatility of equipment, and simplified the flow process of making, replacing, shortened Production Time greatly.
[description of drawings]
Fig. 1 is the cross-sectional schematic of the measurement jig that is used for measurement circuit plate special tester of an embodiment of the utility model;
Fig. 2 is the axonometric projection decomposing schematic representation of measurement jig of the present utility model;
Fig. 3 be measurement jig of the present utility model test probe spread pin effect synoptic diagram;
Fig. 4 is the synoptic diagram that the following net point assembly of measurement jig of the present utility model adopts elastic insulated plate and electrically conductive particles;
Fig. 5 is the cross-sectional schematic that measurement jig of the present utility model adopts the bigger last net point assembly of area;
Fig. 6 is the cross-sectional schematic that measurement jig of the present utility model increases the embodiment of buttcover plate.
[embodiment]
Below in conjunction with each accompanying drawing the utility model is described in further detail.
Referring to Fig. 1 to Fig. 3, be a specific embodiment of the utility model measurement jig of being used for measurement circuit plate special tester, comprise the dials 200, the test signal conductor wire on special tester (the figure acceptance of the bid is drawn) that are provided with a plurality of test probes 210, go up net point assembly 110, net point assembly 130 and base 140 down.
Should go up net point assembly 110 and comprise a plurality of elasticity first conducting elements 111, following net point assembly 130 comprises a plurality of elasticity second conducting elements 131.Flexible first conducting element 111 embarks on journey, becomes column distribution among each first through hole 112 in spacing on the last net point assembly 110 equably.Flexible second conducting element 131 be distributed in down among each second through hole 132 of net point assembly 130.
In the present embodiment, the size of this last net point assembly 110 is big or small identical with following net point assembly 130, first conducting element 111 of the test zone that it directly connects with following net point assembly is relative one by one with second conducting element 131 and be electrically connected, thereby the conducting element 111 of winning is directly docked with second conducting element 131.Certainly, as shown in Figure 5, the area of last net point assembly also can be greater than the area that descends the net point assembly, as long as guarantee be electrically connected relative one by one with second conducting element of first conducting element of the test zone that last net point assembly and following net point assembly connect.When test probe can't meet the demands after test zone spreads pin, because it is bigger to go up the size of net point assembly, can rationally spread pin on the net point assembly on whole, again by increasing by second conducting element that change-over panel is connected to down net point assembly correspondence, make whole tool have better generality, save cost.
This dials 200 is made according to wiring board 400 to be tested, and the different dials 200 of wiring board 400 correspondences of different model makes that the test probe 210 of dials 200 is corresponding with the test point of wiring board to be tested.The number of test points of wiring board 400 to be tested is less than the number of test points in the special tester.
A plurality of test probes 210 heads on the dials 200 withstand on each test point (figure acceptance of the bid draw) of wiring board 400 correspondences to be tested, and electrically contact with each test point of wiring board 400 to be tested.Last net point assembly 110 be installed in dials 200 below, elasticity first conducting element 111 heads corresponding on a plurality of test probes 210 afterbodys on the dials 200 and the last net point assembly 110 electrically contact.
When by the test zone of special-purpose making software at second conducting element 131 of following net point assembly 130, promptly go up net point assembly 110 and the test zone that following net point assembly 130 directly connects, spread pin.At second conducting element 131 of following net point assembly 130 corresponding an electrical connection is arranged if guarantee the test probe of each test point correspondence, and the slope of test probe is then gone up the test that net point assembly and following net point assembly are applicable to this wiring board in setting range simultaneously.As shown in Figure 3, the slope here refers to the included angle A between test probe 210 and its vertical line.The scope of this included angle A remains in 5.5 degree, thereby can control contact point the distance L the subpoint of surface level between of the contact point of the test probe 210 and first conducting element 111, can more help the pin that spreads of test probe to test probe 210 and wiring board test point to be measured.For example, be the test probe of 40mm for length, its distance L should be between 0-2.5mm; For length is the test probe of 60mm, and its distance L should be between 0-5mm.
Referring to Fig. 2, be respectively equipped with corresponding pilot hole 205,115,135,145 on dials 200, last net point assembly 110, following net point assembly 130 and the base 140, conveniently they are installed together.And the feasible test zone and the accurate contraposition in the zone at second conducting element, 131 places of following net point assembly 130 of going up net point assembly 110 realized the directly electrical connection one by one of first conducting element 111 and second conducting element 131.
Referring to Fig. 2, base 140 stretches out, and the socket points 147 that is electrically connected with each test signal conductor wire is fixed on this base 140 outward extending positions 146.Base 140 be provided with following net point assembly 130 flexible second conducting element 131 positions conductiving point 141 one to one, conductiving point 141 and elasticity second conducting element 131 are equivalent amount, thereby second conducting element 131 is electrically connected to test machine.
Used elasticity first conducting element 111 of the utility model can be used the applicant and apply on Dec 16th, 2004, in Chinese utility model patent " wiring board test switching spring " the technology manufacturing of 02 month 22 days Granted publications in 2006, its patent No. is ZL 200420103000.6.Elasticity second conducting element 131 can be the inner tailored version probe that spring is housed of spring or band.The lower surface of net point assembly 110 is stretched out in the lower end of these first conducting elements 111, and simultaneously, an end of second conducting element 131 stretches out the down upper surface of net point assembly 130, thereby forms good electrical contact with the lower end of first conducting element 111.
Upward net point assembly of the present utility model and/or following grid assembly can also adopt another embodiment.As shown in Figure 4, last net point assembly and following net point assembly are elastic insulated plate, and the position that first conducting element 111 and second conducting element 131 are set at needs is mixed with electrically conductive particles, by electrically conductive particles and elastic insulated harden to close form first conducting element 111 and second conducting element 131.Can possess conduction and flexible speciality in the elastic insulated plate behind the admixture conductive fine powder.Such mode can reduce the height of net point assembly down, also plays the effect of the height that reduces whole switching device simultaneously.
As shown in Figure 6, be the synoptic diagram of another specific embodiment of measurement jig of the present utility model, the difference of itself and a last embodiment is, between last net point assembly 110 and following net point assembly 130, has increased buttcover plate 150.This buttcover plate is provided with and second conducting element 131 of first conducting element 111 of last net point assembly 110 and following net point assembly 130 conductive hole 151 one to one.By buttcover plate 150 is set, can so that the butt joint between first conducting element 111 and second conducting element 131 must make things convenient for more, accurately.Other structures and a last embodiment are basic identical, so do not give unnecessary details.
Above embodiment has only expressed preferred implementation of the present utility model, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the utility model claim; Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the utility model design, can also make some distortion and improvement, these all belong to protection domain of the present utility model; Therefore, all equivalents and modifications of being done with the utility model claim scope all should belong to the covering scope of the utility model claim.
Claims (6)
1. measurement jig that is used for measurement circuit plate special tester, comprise the dials (200) that is provided with a plurality of test probes (210) and the test signal conductor wire on described special tester, described test probe (210) is corresponding with the test point of circuit board to be tested; It is characterized in that:
Described measurement jig also comprises the last net point assembly (110) that is provided with a plurality of first conducting elements (111), the base (140) that is provided with the following net point assembly (130) of a plurality of second conducting elements (131) and is located at described following net point assembly (130) downside;
Have the socket points (147) that is connected with the test signal conductor wire on the described base (140); Described second conducting element (131) conducts electricity with the socket points (147) on the described base (140) and is connected;
Described upward net point assembly (110) comprises the test zone that directly connects with described net point assembly (130) down, the described relative one by one and electrical connection of second conducting element (131) of going up net point assembly (110) at first conducting element (111) with the described net point assembly (130) down of described test zone;
Described upward net point assembly (110) is installed in the back side of described dials (200), and described test probe (210) spreads pin in described test zone, be electrically connected with first conducting element (111) in the described test zone, the slope of described test probe (210) is in setting range simultaneously.
2. the measurement jig that is used for measurement circuit plate special tester according to claim 1 is characterized in that:
The setting range of the described slope of described test probe (210) is within 5.5 degree.
3. the measurement jig that is used for measurement circuit plate special tester according to claim 1 is characterized in that:
Described first conducting element (111) of described test zone net point assembly (110) on described is gone up spacing and is embarked on journey, becomes column distribution equably; And described second conducting element (131) equates with the distribution density of described first conducting element (111).
4. the measurement jig that is used for measurement circuit plate special tester according to claim 1 is characterized in that:
The described lower surface of going up net point assembly (110) is stretched out in the lower end of described first conducting element (111), simultaneously, one end of described second conducting element (131) stretches out the described upper surface of net point assembly (130) down, with the lower end formation good electrical contact of described first conducting element (111).
5. the measurement jig that is used for measurement circuit plate special tester according to claim 1 is characterized in that: be respectively equipped with corresponding registration holes (205,115,135,145) on described dials (200), last net point assembly (110), following net point assembly (130) and the base (140).
6. the measurement jig that is used for measurement circuit plate special tester according to claim 1, it is characterized in that: described going up between net point assembly (110) and the described time net point assembly (130) is provided with buttcover plate (150), and described buttcover plate (150) is provided with and described first conducting element (111) and second conducting element (131) conductive hole (151) one to one.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201344133U CN201508399U (en) | 2009-07-31 | 2009-07-31 | Testing jig of tester special for testing wiring board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201344133U CN201508399U (en) | 2009-07-31 | 2009-07-31 | Testing jig of tester special for testing wiring board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201508399U true CN201508399U (en) | 2010-06-16 |
Family
ID=42469526
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009201344133U Expired - Fee Related CN201508399U (en) | 2009-07-31 | 2009-07-31 | Testing jig of tester special for testing wiring board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201508399U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106324460A (en) * | 2016-11-08 | 2017-01-11 | 沈小晴 | Universal test mechanism with switchable dial |
| CN107229012A (en) * | 2017-06-13 | 2017-10-03 | 日月光封装测试(上海)有限公司 | Measurement jig and its arrangement method for testing pin hole |
-
2009
- 2009-07-31 CN CN2009201344133U patent/CN201508399U/en not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106324460A (en) * | 2016-11-08 | 2017-01-11 | 沈小晴 | Universal test mechanism with switchable dial |
| CN106324460B (en) * | 2016-11-08 | 2024-03-22 | 沈小晴 | Universal test mechanism with replaceable dial |
| CN107229012A (en) * | 2017-06-13 | 2017-10-03 | 日月光封装测试(上海)有限公司 | Measurement jig and its arrangement method for testing pin hole |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100616 Termination date: 20120731 |