CN103941047A - Circuit board signal testing clamp - Google Patents
Circuit board signal testing clamp Download PDFInfo
- Publication number
- CN103941047A CN103941047A CN201410160949.8A CN201410160949A CN103941047A CN 103941047 A CN103941047 A CN 103941047A CN 201410160949 A CN201410160949 A CN 201410160949A CN 103941047 A CN103941047 A CN 103941047A
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- circuit board
- grip block
- probe
- test clip
- signal test
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Abstract
The invention relates to a circuit board signal testing clamp which comprises an upper clamping board and a lower clamping board which are used for clamping a circuit board to be tested. The circuit board signal testing clamp is characterized in that the upper clamping board is a PCB (01), the PCB (01) is provided with connecting wires (33), one ends of the connecting wires (33) are used for being connected with the circuit board to be tested, and the other ends of the connecting wires (33) are used for being connected with probes (21). According to the circuit board signal testing clamp, the connecting wires are fixed to the upper clamping PCB through the PCB technology, and contacts can be prevented from being deviated by the fact that the probes are pulled by the connecting wires; the PCB further brings convenience to fixing the probes through bonding pads and fixing a connector device (02), probe rods are eliminated, the structure is accordingly simple, and the operating efficiency is accordingly improved.
Description
Technical field
The present invention relates to a kind of circuit board signal test clip.
Background technology
In equipment Manufacture Process, circuit board need carry out program burn writing, operational factor configuration or the functional test in later stage after completing welding toward contact, and conventional test fixture volume is large, and cost is high.For this reason, need the test clip of Simple portable, can realize electrical connection with circuit-under-test plate.Chinese invention patent < < circuit board test clamp > > (patent No. CN200810301461.7) has proposed a kind of structure of circuit board test clamp, as shown in Figure 1, this circuit board test clamp is by holder 101, elastic probe 104, survey and connect wire 103 and tester probe 102 compositions, holder 101 clamping circuit board 100 to be tested, pad or solder joint that elastic probe 104 connects on circuit board 100 to be tested, signal is connected to wire 103 by detection, tester probe 102 is connected to test circuit, to carry out dependence test.
This test accompanies number of drawbacks:
First, the devices such as probe need to be installed on holder before testing, and owing to being subject to surveying wire influence of tractive force, probe contact position is easily offset, operation inconvenience.And the holder of test clip and tester probe non-standard component, need customization.
The second, testing, while changing test point, need to break holder into two with one's hands, necessary bimanualness, but also to take into account the position of adjusting circuit board to be tested simultaneously.This structure is not easy to use.
The 3rd, circuit board to be tested can tightly be pushed, but is easy to cause circuit board to be tested crooked.
The 4th, open holder, need to break its both sides into two with one's hands, the inconvenient one-handed performance of structure of holder.
The 5th, elastic probe adopts has certain flexible tinsel formation, and its elastic telescopic is limited in scope, and when a plurality of elastic probes are tested side by side, there will be the fault of loose contact.
Summary of the invention
The object of this invention is to provide a kind of circuit board signal test clip, in order to solve existing test clip complex structure, unhandy problem.
For achieving the above object, the solution of the present invention comprises:
A kind of circuit board signal test clip, comprise for clamping upper grip block and the lower grip block of circuit board to be tested, described upper grip block is a PCB circuit board (01), on this PCB circuit board, be laid with and connect wire (33), connect wire one end for connecting test circuit, the other end is for linking probe (21).
Described probe is spring probe.
Described probe (21) is fixed on described PCB circuit board, to described lower grip block, extends and arranges; Probe (21) connects described connection wire (33) by pad (24).
On described PCB circuit board, be also fixed with for pushing down the pressing plate pillar (16) of circuit board to be tested, pressing plate pillar extends and arranges to described lower grip block.
The part that the downward grip block of described pressing plate pillar extends is length-adjustable bolt structure.
Described lower grip block is provided with for treating testing circuit board and carries out spacing reference column.
Described reference column comprises treats the longitudinal register post that testing circuit board carries out longitudinal spacing, and treats the located lateral post that testing circuit board carries out cross spacing.
Described longitudinal register post is fixed in the longitudinal register post slide opening (15) of lower grip block, and described located lateral post is fixed in the located lateral post slide opening (22) of lower grip block.
At least one reference column passes PCB circuit board (01) by the location slide opening (31) on PCB circuit board (01), and this location slide opening (31) is long strip type.
The present invention is fixed on by PCB technique on the PCB circuit board of upper clamping connecting wire, can not cause the skew of contact because of the traction probe that connects wire; PCB circuit board is also convenient to stationary probe (passing through pad) and interface arrangement (02), has saved probe, makes simple in structurely, improves operating efficiency.
Further, employing spring probe can be so that the testing weld pad on test clip and circuit-under-test plate keeps good contact.Simultaneously that the function of clamping is separated with upper grip block, and by the pressing plate pillar arranging on upper grip block, completed the function that compresses circuit board to be tested, by adjustable for height pressing plate pillar between test clip, can be pressed in the strength on circuit-under-test plate by regulating spring probe, avoid loose contact or because of the excessive situation about damaging of spring probe pressure.Lower grip block can be fixed on the fixed parts such as base or desktop, facilitates one hand to operate.
Further, lower grip block is provided with reference column, can treat testing circuit board and position, and prevents its deflection.And, by the slide opening on lower grip block, can regulate the position of reference column, can adapt to circuit board needs to be tested, realize the accurate location of probe to testing weld pad on circuit-under-test plate, facilitate batch testing.
Accompanying drawing explanation
Fig. 1 is the test clip of prior art;
Fig. 2 is a kind of example structure figure;
100. circuit boards to be tested, 101. holder, 102. tester probes, 103. survey connection wire, 104. elastic probe, grip block plate on 01., 02. interface arrangement, 03. ring spring via hole, 04. time grip block, 11. spring clamp turning axles, 12. spring clamp bodies, 13. longitudinal register posts, 14. reference column hold-down nuts, 15. longitudinal register post slide openings, 16. screws regulate the pressing plate pillar of height, the contact pad of 20. probes, 21. probes, 22. located lateral post slide openings, 23. located lateral posts, 24. probe solder pad, 31. location slide openings, 32. reference columns pass the part of acquisition of signal plate, 33. conductive lead wires, 34. ring springs.
Embodiment
Basic scheme of the present invention is: a kind of circuit board signal test clip, comprise for clamping upper grip block and the lower grip block of circuit board to be tested, described upper grip block is a PCB circuit board, this PCB circuit board is provided with connection wire, connect wire one end for connecting test circuit, the other end is for linking probe.
Below in conjunction with accompanying drawing, the present invention will be further described in detail.
As shown in Figure 2, upper grip block 01, lower grip block 02 are arranged on respectively on two retained parts of a spring clamp 12, and 11 is spring clamp rotating shaft.Upper grip block is a PCB circuit board, connects wire and is fixed on circuit board by PCB technique, connects wire one end and is connected to interface arrangement 02 by respective pad, and interface arrangement 02 is for connecting test circuit, and interface arrangement 02 is located at the inner side of grip block 01; Connect the wire other end and be connected to the pad 24 on circuit board, on pad 24, welding is to the spring probe 21 of downward-extension.
Lower grip block 04, is also constructed to PCB circuit board, is provided with contact pad 20 with the position of corresponding probe on upper grip block, and these contact pads 20, in order to when not testing circuit-under-test plate, are protected the probe of probe 21.In the present embodiment, comprise 4 spring probes 21, employing spring probe can be so that the testing weld pad on test clip and circuit-under-test plate keeps good contact.
On upper grip block 01, be also fixed with for pushing down the pressing plate pillar 16 of circuit board to be tested, the downward grip block of pressing plate pillar extends setting.The part that the downward grip block of pressing plate pillar extends is length-adjustable bolt structure.
Lower grip block 04 is provided with for treating testing circuit board and carries out spacing reference column.As shown in the figure, reference column comprises treats the longitudinal register post 13 that testing circuit board carries out longitudinal spacing, and treat the located lateral post 23 that testing circuit board carries out cross spacing, longitudinal register post is fixed in the longitudinal register post slide opening 15 of lower grip block, and described located lateral post is fixed in the located lateral post slide opening 22 of lower grip block.Reference column is insulated column, by nut, fix, in order to block the circuit-under-test plate of sending into test clip, and make the position of signal pad of circuit-under-test plate and the probe positions of probe corresponding.At least one reference column, as described in Figure, a reference column 32 in longitudinal register post 13 passes PCB circuit board 01 by the location slide opening 31 on PCB circuit board 01, and this location slide opening 31 be long strip type, in order to limit longitudinal contact position of test clip when closure probe and circuit-under-test plate.
In when test, at ring spring 34(ring spring 34 through the spring eye 03 on upper and lower grip block) under effect, upper grip block and lower grip block are in sound end clamping, probe 21 and pressing plate pillar 16 are pushed down circuit-under-test plate.Pressing plate pillar 16 one end are fixed on grip block, and the other end is an insulation screw, and when test clip is closed, pressing plate pillar will be pushed down the circuit-under-test plate of sending into.By rotary screw, can regulate pressing plate to prop up column length, thus the length of probe 21 while regulating test clip closed.
More than provided a kind of concrete embodiment, but the present invention is not limited to described embodiment.Basic ideas of the present invention are above-mentioned basic scheme, and for those of ordinary skills, according to instruction of the present invention, model, formula, the parameter of designing various distortion do not need to spend creative work.The variation of without departing from the principles and spirit of the present invention embodiment being carried out, modification, replacement and modification still fall within the scope of protection of the present invention.
Claims (9)
1. a circuit board signal test clip, comprise for clamping upper grip block and the lower grip block of circuit board to be tested, it is characterized in that, described upper grip block is a PCB circuit board (01), on this PCB circuit board, be laid with and connect wire (33), connect wire one end for connecting test circuit, the other end is for linking probe (21).
2. a kind of circuit board signal test clip according to claim 1, is characterized in that, described probe is spring probe.
3. a kind of circuit board signal test clip according to claim 2, is characterized in that, described probe (21) is fixed on described PCB circuit board, to described lower grip block, extends and arranges; Probe (21) connects described connection wire (33) by pad (24).
4. a kind of circuit board signal test clip according to claim 1, is characterized in that, is also fixed with for pushing down the pressing plate pillar (16) of circuit board to be tested on described PCB circuit board, and pressing plate pillar extends and arranges to described lower grip block.
5. a kind of circuit board signal test clip according to claim 4, is characterized in that, the part that the downward grip block of described pressing plate pillar extends is length-adjustable bolt structure.
6. a kind of circuit board signal test clip according to claim 1, is characterized in that, described lower grip block is provided with for treating testing circuit board and carries out spacing reference column.
7. a kind of circuit board signal test clip according to claim 6, is characterized in that, described reference column comprises treats the longitudinal register post that testing circuit board carries out longitudinal spacing, and treats the located lateral post that testing circuit board carries out cross spacing.
8. a kind of circuit board signal test clip according to claim 7, it is characterized in that, described longitudinal register post is fixed in the longitudinal register post slide opening (15) of lower grip block, and described located lateral post is fixed in the located lateral post slide opening (22) of lower grip block.
9. a kind of circuit board signal test clip according to claim 6, is characterized in that, at least one reference column passes PCB circuit board (01) by the location slide opening (31) on PCB circuit board (01), and this location slide opening (31) is long strip type.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201410160949.8A CN103941047B (en) | 2014-04-21 | 2014-04-21 | Circuit board signal testing clamp |
Applications Claiming Priority (1)
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CN201410160949.8A CN103941047B (en) | 2014-04-21 | 2014-04-21 | Circuit board signal testing clamp |
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CN103941047A true CN103941047A (en) | 2014-07-23 |
CN103941047B CN103941047B (en) | 2017-04-12 |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106291326A (en) * | 2016-08-23 | 2017-01-04 | 王文庆 | A kind of fixed point testing agency for integrated circuit |
CN107991538A (en) * | 2017-12-29 | 2018-05-04 | 许继变压器有限公司 | A kind of no-load loss test coil device and no-load loss tester |
CN108051618A (en) * | 2017-11-28 | 2018-05-18 | 南京晨光集团有限责任公司 | A kind of frock clamp for circuit board testing |
CN109298313A (en) * | 2018-09-12 | 2019-02-01 | 闻泰通讯股份有限公司 | Oscillograph subtest circuit board and oscillograph detection device |
CN111722085A (en) * | 2020-06-29 | 2020-09-29 | 华勤通讯技术有限公司 | PCB function test device and system |
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CN1111357A (en) * | 1994-01-06 | 1995-11-08 | 国际商业机器公司 | Printed circuit board test fixture and method |
US5572144A (en) * | 1993-02-22 | 1996-11-05 | Seagate Technology | Test jig and method for probing a printed circuit board |
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CN101458970A (en) * | 2007-12-14 | 2009-06-17 | 鸿富锦精密工业(深圳)有限公司 | Circuit board test clamp |
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CN203275453U (en) * | 2013-04-10 | 2013-11-06 | 南京同尔电子科技有限公司 | Manual one-piece type circuit board testing fixture |
CN203825045U (en) * | 2014-04-21 | 2014-09-10 | 国家电网公司 | Circuit board signal test clip |
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US5572144A (en) * | 1993-02-22 | 1996-11-05 | Seagate Technology | Test jig and method for probing a printed circuit board |
CN1111357A (en) * | 1994-01-06 | 1995-11-08 | 国际商业机器公司 | Printed circuit board test fixture and method |
CN2591635Y (en) * | 2002-12-05 | 2003-12-10 | 曾家棠 | Testing mould for printed-circuit board tester |
CN201156865Y (en) * | 2007-12-14 | 2008-11-26 | 天津太精电子有限公司 | Clamp for flexible printed circuit board FPC inspection |
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CN203117226U (en) * | 2013-01-15 | 2013-08-07 | 西门子数控(南京)有限公司 | Test fixture |
CN203275453U (en) * | 2013-04-10 | 2013-11-06 | 南京同尔电子科技有限公司 | Manual one-piece type circuit board testing fixture |
CN203825045U (en) * | 2014-04-21 | 2014-09-10 | 国家电网公司 | Circuit board signal test clip |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106291326A (en) * | 2016-08-23 | 2017-01-04 | 王文庆 | A kind of fixed point testing agency for integrated circuit |
CN106291326B (en) * | 2016-08-23 | 2018-10-12 | 台州贝蕾丝电子商务有限公司 | A kind of fixed point testing agency for integrated circuit |
CN108051618A (en) * | 2017-11-28 | 2018-05-18 | 南京晨光集团有限责任公司 | A kind of frock clamp for circuit board testing |
CN107991538A (en) * | 2017-12-29 | 2018-05-04 | 许继变压器有限公司 | A kind of no-load loss test coil device and no-load loss tester |
CN109298313A (en) * | 2018-09-12 | 2019-02-01 | 闻泰通讯股份有限公司 | Oscillograph subtest circuit board and oscillograph detection device |
CN111722085A (en) * | 2020-06-29 | 2020-09-29 | 华勤通讯技术有限公司 | PCB function test device and system |
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