CN1902502A - 延迟故障测试电路以及相关方法 - Google Patents
延迟故障测试电路以及相关方法 Download PDFInfo
- Publication number
- CN1902502A CN1902502A CNA2004800391635A CN200480039163A CN1902502A CN 1902502 A CN1902502 A CN 1902502A CN A2004800391635 A CNA2004800391635 A CN A2004800391635A CN 200480039163 A CN200480039163 A CN 200480039163A CN 1902502 A CN1902502 A CN 1902502A
- Authority
- CN
- China
- Prior art keywords
- clock
- ratio
- threshold value
- delay fault
- time clock
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
- G01R31/3016—Delay or race condition test, e.g. race hazard test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Pulse Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Semiconductor Integrated Circuits (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
- Emergency Protection Circuit Devices (AREA)
Abstract
Description
Df_en | Scan_en | Clkout |
0 | 0 | Clk |
0 | 1 | Clk |
1 | 0 | 脉冲 |
1 | 1 | clk |
Claims (15)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0330076.1 | 2003-12-27 | ||
GBGB0330076.1A GB0330076D0 (en) | 2003-12-27 | 2003-12-27 | Delay fault test circuitry and related method |
PCT/IB2004/052847 WO2005066645A1 (en) | 2003-12-27 | 2004-12-17 | Delay fault test circuitry and related method |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1902502A true CN1902502A (zh) | 2007-01-24 |
CN1902502B CN1902502B (zh) | 2010-06-09 |
Family
ID=31503217
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2004800391635A Expired - Fee Related CN1902502B (zh) | 2003-12-27 | 2004-12-17 | 延迟故障测试电路以及相关方法 |
Country Status (8)
Country | Link |
---|---|
US (1) | US7457992B2 (zh) |
EP (1) | EP1702218B1 (zh) |
JP (1) | JP2007518976A (zh) |
CN (1) | CN1902502B (zh) |
AT (1) | ATE375519T1 (zh) |
DE (1) | DE602004009475T2 (zh) |
GB (1) | GB0330076D0 (zh) |
WO (1) | WO2005066645A1 (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110999086A (zh) * | 2017-10-16 | 2020-04-10 | 微芯片技术股份有限公司 | 容错时钟监视器*** |
CN111130162A (zh) * | 2018-10-31 | 2020-05-08 | 丰田自动车株式会社 | 电源设备 |
CN112438022A (zh) * | 2018-07-11 | 2021-03-02 | 西门子工业公司 | 确保计数器正确计数的故障安全计数器评估器 |
CN112816858A (zh) * | 2020-12-31 | 2021-05-18 | 成都华微电子科技有限公司 | 数字电路延时测试方法、测试电路和集成电路芯片 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7024324B2 (en) * | 2004-05-27 | 2006-04-04 | Intel Corporation | Delay element calibration |
CN100366006C (zh) * | 2005-12-26 | 2008-01-30 | 北京中星微电子有限公司 | 通用串行总线物理层收发器嵌入式自我测试的方法及装置 |
US11092648B2 (en) | 2019-04-15 | 2021-08-17 | Grammatech, Inc. | Systems and/or methods for anomaly detection and characterization in integrated circuits |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5349587A (en) * | 1992-03-26 | 1994-09-20 | Northern Telecom Limited | Multiple clock rate test apparatus for testing digital systems |
US6081913A (en) * | 1997-06-03 | 2000-06-27 | Sun Microsystems, Inc. | Method for ensuring mutual exclusivity of selected signals during application of test patterns |
JP2953435B2 (ja) * | 1997-06-09 | 1999-09-27 | 日本電気株式会社 | 遅延テスト方法および該遅延テスト方法に使用するフリップフロップ |
US6966021B2 (en) * | 1998-06-16 | 2005-11-15 | Janusz Rajski | Method and apparatus for at-speed testing of digital circuits |
WO2000065364A1 (fr) * | 1999-04-23 | 2000-11-02 | Hitachi, Ltd. | Ci a semi-conducteur et son procede d'elaboration |
US6510534B1 (en) * | 2000-06-29 | 2003-01-21 | Logicvision, Inc. | Method and apparatus for testing high performance circuits |
US6954887B2 (en) * | 2001-03-22 | 2005-10-11 | Syntest Technologies, Inc. | Multiple-capture DFT system for scan-based integrated circuits |
JP2003043109A (ja) * | 2001-07-30 | 2003-02-13 | Nec Corp | 半導体集積回路装置及びその試験装置 |
GB0119300D0 (en) * | 2001-08-08 | 2001-10-03 | Koninkl Philips Electronics Nv | Delay fault test circuitry and related method |
US7058866B2 (en) * | 2002-04-24 | 2006-06-06 | International Business Machines Corporation | Method and system for an on-chip AC self-test controller |
-
2003
- 2003-12-27 GB GBGB0330076.1A patent/GB0330076D0/en not_active Ceased
-
2004
- 2004-12-17 AT AT04820969T patent/ATE375519T1/de not_active IP Right Cessation
- 2004-12-17 WO PCT/IB2004/052847 patent/WO2005066645A1/en active IP Right Grant
- 2004-12-17 JP JP2006546453A patent/JP2007518976A/ja not_active Withdrawn
- 2004-12-17 EP EP04820969A patent/EP1702218B1/en not_active Not-in-force
- 2004-12-17 US US10/584,705 patent/US7457992B2/en not_active Expired - Fee Related
- 2004-12-17 CN CN2004800391635A patent/CN1902502B/zh not_active Expired - Fee Related
- 2004-12-17 DE DE602004009475T patent/DE602004009475T2/de active Active
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110999086A (zh) * | 2017-10-16 | 2020-04-10 | 微芯片技术股份有限公司 | 容错时钟监视器*** |
CN110999086B (zh) * | 2017-10-16 | 2024-03-08 | 微芯片技术股份有限公司 | 容错时钟监视器*** |
CN112438022A (zh) * | 2018-07-11 | 2021-03-02 | 西门子工业公司 | 确保计数器正确计数的故障安全计数器评估器 |
CN112438022B (zh) * | 2018-07-11 | 2024-05-14 | 西门子股份公司 | 确保计数器正确计数的故障安全计数器评估器 |
CN111130162A (zh) * | 2018-10-31 | 2020-05-08 | 丰田自动车株式会社 | 电源设备 |
CN111130162B (zh) * | 2018-10-31 | 2023-08-22 | 丰田自动车株式会社 | 电源设备 |
CN112816858A (zh) * | 2020-12-31 | 2021-05-18 | 成都华微电子科技有限公司 | 数字电路延时测试方法、测试电路和集成电路芯片 |
CN112816858B (zh) * | 2020-12-31 | 2022-09-16 | 成都华微电子科技股份有限公司 | 数字电路延时测试方法、测试电路和集成电路芯片 |
Also Published As
Publication number | Publication date |
---|---|
DE602004009475T2 (de) | 2008-07-24 |
CN1902502B (zh) | 2010-06-09 |
DE602004009475D1 (de) | 2007-11-22 |
JP2007518976A (ja) | 2007-07-12 |
WO2005066645A1 (en) | 2005-07-21 |
EP1702218A1 (en) | 2006-09-20 |
GB0330076D0 (en) | 2004-02-04 |
US20070168158A1 (en) | 2007-07-19 |
EP1702218B1 (en) | 2007-10-10 |
ATE375519T1 (de) | 2007-10-15 |
US7457992B2 (en) | 2008-11-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NXP CO., LTD. Free format text: FORMER OWNER: KONINKLIJKE PHILIPS ELECTRONICS N.V. Effective date: 20070817 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20070817 Address after: Holland Ian Deho Finn Applicant after: Koninkl Philips Electronics NV Address before: Holland Ian Deho Finn Applicant before: Koninklijke Philips Electronics N.V. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: KALAI HANXILE CO., LTD. Free format text: FORMER OWNER: KONINKL PHILIPS ELECTRONICS NV Effective date: 20120112 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120112 Address after: American Delaware Patentee after: NXP BV Address before: Holland Ian Deho Finn Patentee before: Koninkl Philips Electronics NV |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100609 Termination date: 20131217 |