CN1715940A - IC detector suitable for different IC's - Google Patents
IC detector suitable for different IC's Download PDFInfo
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- CN1715940A CN1715940A CN 200410049784 CN200410049784A CN1715940A CN 1715940 A CN1715940 A CN 1715940A CN 200410049784 CN200410049784 CN 200410049784 CN 200410049784 A CN200410049784 A CN 200410049784A CN 1715940 A CN1715940 A CN 1715940A
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- 239000000463 material Substances 0.000 claims abstract description 134
- 238000012360 testing method Methods 0.000 claims description 21
- 238000007599 discharging Methods 0.000 claims description 20
- 230000003028 elevating effect Effects 0.000 claims description 14
- 238000001514 detection method Methods 0.000 abstract description 11
- 238000010586 diagram Methods 0.000 description 10
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000000007 visual effect Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
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- 238000006073 displacement reaction Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
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Abstract
The IC detector suitable for different IC's includes one detection device, the first conveying device on one side, the first feeding device for bearing the material tray or material pipe to feed material, the first loading/unloading device capable of moving between the first conveying device and the first feeding device to set the IC on the conveying device for carrying to the detection device, the second conveying device on the other side for conveying the detected IC, the second feeding device for bearing the material tray or material pipe to discharge material, and the second loading/unloading device capable of moving between the second conveying device and the second feeding device to set the IC on the second feeding device. The present invention can suit for different IC holders, tray or pipe, for convenient loading and unloading.
Description
Technical field
The present invention relates to a kind of can be applicable to the going into of different IC splendid attire object (charging tray or material pipe), discharging,, and significantly save equipment cost and promote the IC machines that IC detects the applicable different IC splendid attire object of benefit with all types of IC of extensive detection.
Background technology
Now, science and technology is is constantly researched and developed and is innovated, in the past must be by many large-scale electronic circuits in conjunction with the work that just can finish, fully by integrated circuit (integrated circuit, abbreviation IC) replaces, because the pin pattern variation of IC, object in order to splendid attire is also inequality, generally be divided into two kinds of charging tray and material pipes, for example the stacked splendid attire of the IC of both sides tool pin is managed in material, and the IC of each side tool pin, then the horizontal splendid attire is impaired to prevent pin in charging tray, right IC need pass through the multiple tracks job sequence in process of production, for guaranteeing product quality, after IC completes, all can carry out the electric circuit inspection operation, whether damage to detect, and then eliminate out defective products, existing charging tray of brief description analysis and the material pipe splendid attire object detection special machine of using out of the ordinary:
1, charging tray dedicated test machine: see also shown in Figure 1, this machines is provided with loading and transmitting device 2 in the both sides of a pick-up unit 1,3, and be provided with in the side of a loading and transmitting device 2 and put materials device 4 for the charging tray of putting splendid attire IC, one fetching device 5 is in loading and transmitting device 2 and put 4 of materials devices and move, so that the IC in the charging tray is picked and placeed to loading and transmitting device 2, to be carried to pick-up unit 1 side, the suction nozzle of this pick-up unit 1 is about to IC and picks and places to examination and test in the scaffold tower 6, behind to be tested the finishing, IC is picked and placeed to the loading and transmitting device 3 of other side again and send, and the side of loading and transmitting device 3 also be provided with the bearing charging tray put materials device 7,8 of another fetching devices are in loading and transmitting device 3 and put 7 of materials devices and move, in order to do placing, and finish the detection operation so that the IC on the loading and transmitting device 3 is picked and placeed to the charging tray of putting materials device 7; But this machines is only limited to supply disk and is done into, discharging, and can't be suitable for different splendid attire objects, so that utilization benefit is limited.
2, material pipe dedicated test machine, see also shown in Figure 2, be provided with the rail set 9 of a tool gradient, its two ends respectively for plant in order to the material pipe 10,11 of splendid attire IC do, discharging, 12 tops of being located at rail set 9 of pick-up unit, and then the IC in the top material pipe 10 is slipped in rail set 9, install after testing 12 detect finish after, slip in the material pipe 11 of end placing again, and finish the detection operation; But this machines is also only limited to feeder sleeve and is done into, discharging, and can't be suitable for different splendid attire objects, so that utilization benefit is limited.
So the above-mentioned special machine that respectively detects also can't be done in response to different splendid attire objects (charging tray or material pipe), discharging, it is limited not only to detect the IC type, when dealer's desire detects IC in the different splendid attire objects, must purchase two kinds of different special machines that detect, the disappearance that more causes equipment cost to increase, and respectively detect going into of special machine, discharging splendid attire object is all identical, and can't look the different splendid attire objects of the required and conversion of next workstation, so that the conversion of IC splendid attire object is poor, cause dealer's conversion splendid attire object in addition, for example the IC of splendid attire in the charging tray is replaced splendid attire again and in the material pipe, place, cause the inconvenience of the follow-up flow process operation of IC.
Summary of the invention
The IC machines that the purpose of this invention is to provide a kind of applicable different IC splendid attire object, mainly be to be provided with loading and transmitting device in the both sides of pick-up unit, and being provided with first, the side of a loading and transmitting device puts materials device, for the bearing charging tray or expect the effective pan feeding that comes, first fetching device is put between materials device in loading and transmitting device and first and is moved, and IC is picked and placeed to loading and transmitting device, to be carried to the pick-up unit place, drawing IC for pick-up unit tests, behind to be tested the finishing, send by another loading and transmitting device, and the side of this loading and transmitting device is provided with second and puts materials device, and it can or expect the effective discharging that comes for the bearing charging tray, and second fetching device is put between materials device mobile in loading and transmitting device and second, in order to do placing, and finish the detection operation IC is picked and placeed put on the materials device to second; By this, visual IC splendid attire object (charging tray or material pipe), and select the required materials device of putting to do needn't purchase different special machines into, discharging, and can widespread use detect all types of IC, reach significantly to save equipment cost and promote IC and detect benefit.
The visual follow-up work of the present invention station operation is required, puts materials device with second and is made as the material pipe and puts materials device or charging tray is put materials device, makes discharging place for bearing material pipe or charging tray, places the splendid attire object of IC and then the transfer operation of convenient IC with Direct Transform.
Machines of the present invention can be gone into for different IC splendid attire object, discharging, needn't purchase special machine separately, can reduce machine and take up room, and then more effectively utilize and plan the factory building work.
In order further to understand the present invention, describe the present invention in detail with preferred embodiment below in conjunction with accompanying drawing.
Description of drawings
Fig. 1 is the arrangement plan of habit formula charging tray dedicated test machine;
Fig. 2 is the arrangement plan of habit formula material pipe dedicated test machine;
Fig. 3 is an arrangement plan of the present invention;
Fig. 4 is the use synoptic diagram of the present invention with material pipe pan feeding, charging tray discharging;
Fig. 5 puts the synoptic diagram of materials device for the material pipe;
Fig. 6 puts the use synoptic diagram of materials device for the material pipe;
Fig. 7 is the synoptic diagram that first fetching device picks and places IC to the first loading and transmitting device;
Fig. 8 transfers load to the synoptic diagram that pick-up unit is done test for IC;
Fig. 9 is that second fetching device picks and places IC puts materials device to charging tray synoptic diagram;
Figure 10 does for the present invention manages with material, the use synoptic diagram of discharging;
Figure 11 puts the synoptic diagram of materials device for the material pipe;
Figure 12 makes use synoptic diagram into, discharging for the present invention with charging tray;
Figure 13 is the use synoptic diagram of the present invention with charging tray pan feeding, the discharging of material pipe.
Description of reference numerals: pick-up unit 1; Loading and transmitting device 2,3; Put materials device 4; Fetching device 5; Examination scaffold tower 6; Put materials device 7; Fetching device 8; Rail set 9; Material pipe 10,11; Pick-up unit 12; The material pipe is put materials device 20; Support 21; Track 22; Bearing seat 23; Charging tray is put materials device 30; Charging tray 31; First loading and transmitting device 40; Microscope carrier 41; First fetching device 50; Vertical shift mechanism 51; Transverse-moving mechanism 52; Elevating mechanism 53; Suction nozzle 54; Pick-up unit 60; Examination scaffold tower 61; Transverse-moving mechanism 62; Elevating mechanism 63; Suction nozzle 64; Second loading and transmitting device 70; Microscope carrier 71; Charging tray is put materials device 80; Charging tray 81; The material pipe is put materials device 90; Entrance track 91; Web 92; Electromagnetic shaker 93; Switching track 94; Second fetching device 100; Vertical shift mechanism 101; Transverse-moving mechanism 102; Elevating mechanism 103; Suction nozzle 104; Material pipe 110,120.
Embodiment
See also shown in Figure 3, the present invention is provided with first in board and puts materials device in order to pan feeding IC, this first put materials device for the material pipe put materials device 20 for bearing material pipe, or put materials device 30 for the bearing charging trays for charging tray, first the place ahead of putting materials device is provided with first loading and transmitting device 40 of tool microscope carrier 41, first fetching device 50 is put 40 of materials device and first loading and transmitting devices in first and is moved in order to pick and place IC, one pick-up unit 60 with examination scaffold tower 61 is located at first loading and transmitting device, 40 sides, and be provided with second loading and transmitting device 70 in other side, the side in addition of this second loading and transmitting device 70 is provided with second and puts materials device in order to discharging IC, second to put materials device be that charging tray is put materials device 80 for the bearing charging tray for this, or put materials device 90 for bearing material pipe for the material pipe, second fetching device 100 is put 70 of materials device and second loading and transmitting devices in second and is moved in order to pick and place IC;
See also Fig. 4～shown in Figure 6, when with material pipe pan feeding during the charging tray discharging, this first put materials device for the material pipe put materials device 20, it is provided with in a row tilting track 22 in support 21, and the bearing seat 23 that can swing that is pivoted in the top of each track 22, and then the material pipe 110 of splendid attire IC can be inserted in the bearing seat 23, and bearing seat 23 upwards started, IC in the material pipe 110 is slipped in track 22, and fall to placing track 22 ends, get material for first fetching device 50;
See also Fig. 3, shown in Figure 7, this first fetching device 50 is provided with longitudinal and transverse moving mechanism 51,52 and elevating mechanism 53, and is provided with suction nozzle 54 in elevating mechanism 53, and then draws the material pipes with suction nozzle 54 and put IC to the first loading and transmitting device 40 places on the materials device 20;
See also Fig. 3, Fig. 7, shown in Figure 8, this first loading and transmitting device 40 is with the motor driven belt pulley set, and the microscope carrier 41 on the drive belt pulley set is made shift reciprocately, when first fetching device 50 is positioned over IC on the microscope carrier 41, this microscope carrier 41 is about to IC and is carried to pick-up unit 60 places, this pick-up unit 60 is provided with a test board 61, and be provided with one group of transverse-moving mechanism 62 and elevating mechanism 63 in the both sides of test board 61, and be provided with suction nozzle 64 in transverse-moving mechanism 62, do traversing and the lifting displacement to drive suction nozzle 64, and then this pick-up unit 60 is promptly drawn IC on first loading and transmitting device, 40 microscope carriers 41 to test board 61 tests with suction nozzle 64, behind to be tested the finishing, IC is transferred load on the microscope carrier 71 of second loading and transmitting device 70 with another suction nozzle 64, its microscope carrier 71 is about to IC and is carried to second side of putting materials device again;
See also Fig. 3, Fig. 8, shown in Figure 9, second to put materials device be that charging tray is put materials device 80 for this, but its supply disk 81 is put, and second fetching device 100 of side also is provided with longitudinal and transverse moving mechanism 101,102 and elevating mechanism 103, and be provided with suction nozzle 104 in elevating mechanism 103, and then second fetching device 100 promptly draw on IC on second loading and transmitting device 70 puts materials device 80 to charging tray the charging tray 81 and place with suction nozzle 104, to finish the detection operation.
See also Figure 10, shown in Figure 11, when doing with the material pipe, during discharging, this second put materials device for the material pipe put materials device 90, it is provided with a horizontal entrance track 91 for putting IC, the below of this entrance track 91 is provided with web 92 to link electromagnetic shaker 93, the side then on frame a tilting switching track 94 for the material pipe 120 of planting, and then this material pipe is put the material pipe 110 of materials device 20 for plant tool IC, and the suction nozzle 54 of first fetching device 50 will expect that the IC that pipe is put on the materials device 20 picks and places to first loading and transmitting device 40, test to be carried to pick-up unit 60, behind to be tested the finishing, by second loading and transmitting device 70 IC is carried to the side that the material pipe is put materials device 90 again, the suction nozzle 104 of second fetching device 100 is about to IC on second loading and transmitting device 70 and picks and places in the material pipe and put in the entrance track 91 of materials device 90, and utilize electromagnetic shaker 93 to shake entrance tracks 91, make IC directly slip in material pipe 120 and place, and finish the detection operation.
See also shown in Figure 12, when do with charging tray into, during discharging, first to put materials device be that charging tray is put materials device 30 for bearing charging tray 31 for this, this second is put materials device and then puts materials device 80 for bearing charging trays 81 for charging tray, the suction nozzle 54 of first fetching device 50 is promptly drawn the IC on the charging tray 31, and be positioned on the microscope carrier 41 of first loading and transmitting device 40, test to be carried to pick-up unit 60 places, behind to be tested the finishing, being about to IC picks and places on the microscope carrier 71 of second loading and transmitting device 70, put materials device 80 sides to be carried to charging tray, the suction nozzle 104 of second fetching device 100 is about to IC on second loading and transmitting device 70 and picks and places on charging tray is put the charging tray 81 of materials device 80 and place, and finishes the detection operation.
See also Figure 11, shown in Figure 13, when expecting to manage discharging with the charging tray pan feeding, this first is put materials device system dish and puts materials device 30 for bearing charging tray 31, this second put materials device then for the material pipe put materials device 90 for bearing material pipe 120, and then the suction nozzle 54 of first fetching device 50 is put charging tray, and IC picks and places on first loading and transmitting device 40 on the charging tray 31 of materials device 30, test to be carried to pick-up unit 60 places, behind to be tested the finishing, and IC picked and placeed on second loading and transmitting device 70, put materials device 90 sides to be carried to the material pipe, the suction nozzle 104 of second fetching device 100 is about to IC and picks and places to the material pipe and put on the entrance track 91 of materials device 90, make IC directly slip in material pipe 120 and place, and finish the detection operation; Thereby visual follow-up work station operation is required and select to reach the splendid attire object that Direct Transform places IC, with the operation of convenient subsequent flows journey with charging tray or the rewinding of material pipe.
Claims (10)
1, a kind of IC machines of applicable different IC splendid attire object comprises:
Pick-up unit is provided with test board and tests for IC;
First puts materials device, is located at the side of pick-up unit, and supplies the effective pan feeding IC of coming of bearing material;
Second puts materials device, is located at the side of pick-up unit, in order to confess material IC;
Fetching device is put materials device and second in pick-up unit, first and is put between materials device and to move, in order to pick and place IC.
2, according to the IC machines of the described applicable different IC splendid attire object of claim 1, wherein, this first is put materials device and puts materials device for the material pipe, is provided with tilting track in support, for the material pipe of planting.
3, according to the IC machines of the described applicable different IC splendid attire object of claim 1, wherein, the side of this pick-up unit is provided with loading and transmitting device and is used for carrying IC.
4, according to the IC machines of the described applicable different IC splendid attire object of claim 1, wherein, this pick-up unit is provided with a test board, and is provided with transverse-moving mechanism and elevating mechanism in both sides, picks and places IC to drive suction nozzle.
5, according to the IC machines of the described applicable different IC splendid attire object of claim 1, wherein, this fetching device is provided with longitudinal and transverse moving mechanism and elevating mechanism, and is provided with suction nozzle to pick and place IC in elevating mechanism.
6, a kind of IC machines of applicable different IC splendid attire object comprises:
Pick-up unit is provided with test board and tests for IC;
First puts materials device, is located at the side of pick-up unit, in order to pan feeding IC;
Second puts materials device, is located at the side of pick-up unit, supplies the effective discharging IC of coming of bearing material;
Fetching device is put materials device and second in pick-up unit, first and is put between materials device and to move, and is used for picking and placeing IC.
7, according to the IC machines of the described applicable different IC splendid attire object of claim 6, wherein, this second is put materials device and puts materials device for the material pipe, is provided with the switching track for the material pipe of planting in support.
8, according to the IC machines of the described applicable different IC splendid attire object of claim 6, wherein, the side of this pick-up unit is provided with loading and transmitting device, is used for carrying IC.
9, according to the IC machines of the described applicable different IC splendid attire object of claim 6, wherein, this pick-up unit is provided with a test board, and is provided with transverse-moving mechanism and elevating mechanism in both sides, picks and places IC to drive suction nozzle.
10, according to the IC machines of the described applicable different IC splendid attire object of claim 6, wherein, this fetching device is provided with longitudinal and transverse moving mechanism and elevating mechanism, and is provided with suction nozzle to pick and place IC in elevating mechanism.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410049784 CN1715940A (en) | 2004-06-29 | 2004-06-29 | IC detector suitable for different IC's |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410049784 CN1715940A (en) | 2004-06-29 | 2004-06-29 | IC detector suitable for different IC's |
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| Publication Number | Publication Date |
|---|---|
| CN1715940A true CN1715940A (en) | 2006-01-04 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200410049784 Pending CN1715940A (en) | 2004-06-29 | 2004-06-29 | IC detector suitable for different IC's |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101082633B (en) * | 2006-06-01 | 2010-09-29 | 鸿劲科技股份有限公司 | IC detecting machine capable of simultaneously multiple parallel built-in testing |
| CN101082631B (en) * | 2006-05-31 | 2010-10-13 | 鸿劲科技股份有限公司 | IC detecting machine capable of simultaneously multiple parallel built-in testing |
| CN101308707B (en) * | 2007-05-15 | 2011-04-06 | 鸿劲科技股份有限公司 | Sorting machine for memory IC detection |
| CN102116831A (en) * | 2009-12-30 | 2011-07-06 | 上海允科自动化有限公司 | Integrated circuit (IC) detection device |
| CN101234704B (en) * | 2007-01-29 | 2011-11-16 | 鸿劲科技股份有限公司 | Electronic component transfer loading device and method |
| CN101342532B (en) * | 2007-07-13 | 2013-05-01 | 鸿劲科技股份有限公司 | Memory body IC detecting and sorting machine |
-
2004
- 2004-06-29 CN CN 200410049784 patent/CN1715940A/en active Pending
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101082631B (en) * | 2006-05-31 | 2010-10-13 | 鸿劲科技股份有限公司 | IC detecting machine capable of simultaneously multiple parallel built-in testing |
| CN101082633B (en) * | 2006-06-01 | 2010-09-29 | 鸿劲科技股份有限公司 | IC detecting machine capable of simultaneously multiple parallel built-in testing |
| CN101234704B (en) * | 2007-01-29 | 2011-11-16 | 鸿劲科技股份有限公司 | Electronic component transfer loading device and method |
| CN101308707B (en) * | 2007-05-15 | 2011-04-06 | 鸿劲科技股份有限公司 | Sorting machine for memory IC detection |
| CN101342532B (en) * | 2007-07-13 | 2013-05-01 | 鸿劲科技股份有限公司 | Memory body IC detecting and sorting machine |
| CN102116831A (en) * | 2009-12-30 | 2011-07-06 | 上海允科自动化有限公司 | Integrated circuit (IC) detection device |
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