CN102116831A - Integrated circuit (IC) detection device - Google Patents
Integrated circuit (IC) detection device Download PDFInfo
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- CN102116831A CN102116831A CN2009102476863A CN200910247686A CN102116831A CN 102116831 A CN102116831 A CN 102116831A CN 2009102476863 A CN2009102476863 A CN 2009102476863A CN 200910247686 A CN200910247686 A CN 200910247686A CN 102116831 A CN102116831 A CN 102116831A
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Abstract
The invention relates to an integrated circuit (IC) detection device. The IC detection device comprises a first material containing device and a material moving device, wherein the first material containing device is used to hold at least one material tray for containing ICs to be detected; the material moving device is used to take the ICs to be detected on the first material containing device to a first carrying device and a second carrying device respectively; the first and second carrying devices are used to shift the ICs to be detected to a testing device; the testing device is provided with a plurality of testers and picking and placing devices behind the first and second carrying devices; the picking and placing devices are used to take the ICs detected by the testers on the first and second carrying devices and place the ICs to be detected on the first and second carrying devices in the testers for detection; the first and second carrying devices take the detected ICs out to ensure that the material moving device takes out one detected IC and places the next IC to be detected; and the material moving device places the detected IC on a second material containing device for storage. Therefore, the operation time can be effectively reduced, the productivity can be increased and the cost can be saved.
Description
Technical field
The present invention relates to a kind of IC pick-up unit, particularly relate to a kind of effective reduction activity duration and boost productivity and cost-effective IC pick-up unit.
Background technology
Now, businessman is at integrated circuit (IntegratedCircuit, be called for short IC) complete after, all can utilize an IC pick-up unit executive circuit to detect operation, whether damage in process of production and eliminate out defective products to detect IC, see also shown in Figure 1, be No. 91210786 " conveyer of IC pick-up unit " patent case of TaiWan, China of the previous application of applicant, it is provided with a feed frame 1, be used for holding the charging tray of at least one splendid attire IC to be measured, one left cantilever fetching device 2 is that drive fetching device 3 is made first direction (as directions X) and second direction (as the Y direction) is displaced to feed frame 1 place, making fetching device 3 do third direction (as the Z direction) displacement takes out the IC to be measured in the charging tray, and transfer is to the microscope carrier 5 of a transshipment acitivity 4, described transshipment acitivity 4 be make microscope carrier 5 do the second direction displacement and with IC transfer to be measured to array monitor station 6 places, one right cantilever fetching device 7 is to drive fetching device 8 to do first, two directions are displaced to microscope carrier 5 tops, making fetching device 8 do the third direction displacement takes out the IC to be measured on the microscope carrier 5, and transfer is in a monitor station 6, carry out the detection operation for monitor station 6, after detection finishes, described right cantilever fetching device 7 is that the intact survey IC in the monitor station 6 is taken out, and be seated on the microscope carrier 5 of transshipment acitivity 4, described microscope carrier 5 is made second direction and is oppositely resetted, 3 of described left cantilever fetching devices take out the intact survey IC on the microscope carrier 5, and transfer is taken in to a rewinding frame 9 places, detect operation and finish robotization: still, described machines also has dissatisfactory place in the use, that is:
1. described machines is with right cantilever fetching device 75 taking and putting measured/intact IC of survey of microscope carrier at monitor station 6 and transshipment acitivity 4, this will cause carrying out when having taken out survey IC and moving at monitor station 6 when right cantilever fetching device 7, if the microscope carrier 5 of transshipment acitivity 4 has carried IC to be measured to monitor station 6 places, after then described microscope carrier 5 promptly must wait for that right cantilever fetching device 7 is finished the action of having taken out survey IC, can be with IC to be measured by taking out on the microscope carrier 5, causing monitor station 6 and microscope carrier 5 need wait for all that right cantilever fetching device 7 arrives can carry out behind the described place gets, put the to be measured/intact IC of survey action, and then increase the production stand-by period, cause whole inspection process time length and the reduction prouctiveness.
2. described machines is to carry out confession/rewinding and the action that takes, puts material at monitor station 6 respectively with left cantilever fetching device 2 and right cantilever fetching device 7, causes the disappearance that increases the assembly cost.
3。Described machines is to be equipped with left cantilever fetching device 2 and right cantilever fetching device 7 at feed frame 1 and 6 of monitor stations, so that assembles loaded down with trivial details and expend time in, and causes the disappearance that reduces throughput rate.
4. described machines is to be equipped with left cantilever fetching device 2 and right cantilever fetching device 7 at feed frame 1 and 6 of monitor stations, causes the disappearance that increases the machine volume and take up room.
Summary of the invention
The objective of the invention is to: a kind of IC pick-up unit is provided, need not take, put to be measured/intact IC of survey at the proving installation place so that move materials device, and can simplify actuating travel, and proving installation is directly to take, put to be measured/intact IC of survey at the loading and transmitting device place, do not need to wait for that moving materials device takes, puts IC, and can effectively reduce the stand-by period, reach the Practical Benefit of significantly saving the activity duration and boosting productivity.
The present invention also aims to: a kind of IC pick-up unit is provided,, reaches cost-effective Practical Benefit with effective reduction arrangement of components.
The present invention also aims to: a kind of IC pick-up unit is provided,, reaches the Practical Benefit that is easy to assembly and boosts productivity with effective reduction device configuration.
The present invention also aims to: a kind of IC pick-up unit is provided,, reaches and dwindle the machine volume and save the Practical Benefit that takes up room with the configuration of effective reduction device.
For achieving the above object, the technical solution used in the present invention is:
A kind of IC pick-up unit comprises: first puts materials device: be the charging tray that is used for holding at least one splendid attire IC to be measured; Second puts materials device: be the charging tray with the intact IC of survey of at least one splendid attire of Song Rongna; Proving installation: be to be provided with array tester and fetching device, each tester is to be used for test I C, and fetching device then can be done the second direction displacement and be used for taking, putting to be measured/intact IC of survey; At least one loading and transmitting device: be provided in a side of the place ahead of proving installation, and move at each tester place, to be measured for taking, putting/the intact IC that surveys; Move materials device: be used for first and second put between materials device and loading and transmitting device transfer to be measured/the intact IC of survey.
Above-mentioned IC pick-up unit, described first puts materials device more includes bearing mechanism, pallet body and conveying mechanism, described bearing mechanism is the charging tray that is used for holding at least one splendid attire IC to be measured, pallet body is to do the third direction displacement with Song's bearing charging tray, conveying mechanism then is used for the transfer charging tray and is displaced to predeterminated position as second direction, gets material for moving materials device.
Above-mentioned IC pick-up unit, described second puts materials device more includes bearing mechanism, pallet body and conveying mechanism, described bearing mechanism is the charging tray that is used for holding the intact IC of survey of at least one splendid attire, pallet body is to be used for the bearing charging tray to do the third direction displacement, conveying mechanism then is used for the transfer charging tray and is displaced to predeterminated position as second direction, for moving the materials device blowing.
Above-mentioned IC pick-up unit, described loading and transmitting device more include driving mechanism and are used for driving microscope carrier and do the first direction displacement, and for the fetching device of proving installation with move materials device and take, put to be measured/intact IC of survey.
Above-mentioned IC pick-up unit, the described materials device that moves more includes driving mechanism and is used for driving fetching device and does first and second direction displacement, and does the third direction displacement and put at first and second and to take, put to be measured/intact IC of survey between materials device and loading and transmitting device with fetching device.
Above-mentioned IC pick-up unit more includes heating arrangement, is to be used for heating IC to be measured.
Above-mentioned IC pick-up unit more includes blank panel and puts the dish device, is to be used for holding empty charging tray.
The advantage that adopts the present invention of technique scheme to have is: save the activity duration and boost productivity; The reduction arrangement of components is saved cost; The reduction device configuration is easy to assembly; Dwindle the machine volume and save and take up room.
Description of drawings
Fig. 1 is the synoptic diagram of the conveyer of IC pick-up unit described in the patent No. 91210786;
Fig. 2 is each device architecture synoptic diagram of the present invention;
Embodiment
Below, for a more detailed description to the present invention in conjunction with the accompanying drawings with embodiment.These embodiment only are the descriptions to best mode for carrying out the invention, scope of the present invention are not had any restriction.
Embodiment 1
Seeing also shown in Figure 2ly, is for the present invention carries out a kind of embodiment that IC detects, and comprises:
First puts materials device 10: its bearing mechanism 11 is the charging trays that are used for holding at least one splendid attire IC to be measured, described pallet body 12 is to be used for the bearing charging tray to do the third direction displacement, and charging tray is put on a conveying mechanism 13, but 13 transfer charging trays of described conveying mechanism are displaced to predeterminated position for getting material as second direction;
Second puts materials device 20: its bearing mechanism 21 is the charging trays that are used for holding the intact IC of survey of at least one splendid attire, described pallet body 22 is to be used for the bearing charging tray to do the third direction displacement, and charging tray is put on a conveying mechanism 23, but 23 transfer charging trays of described conveying mechanism are displaced to predeterminated position as second direction, for rewinding;
Proving installation 30: be to be provided with array tester 31 and fetching device 32, each organizes tester 31 is to be used for test I C, fetching device 32 then can drive fetching device 33 do the second direction displacement be used for transfer to be measured/the intact IC of survey;
First loading and transmitting device 40: be the place ahead that is positioned at the left side array tester 31 of proving installation 30, and drive microscope carriers 42 with driving mechanism 41 and do the first direction displacement and move 31 of each group testers, be used for transfer to be measured/the intact IC of survey;
Second loading and transmitting device 50: be the place ahead that is positioned at the right side array tester 31 of proving installation 30, and drive microscope carriers 52 with driving mechanism 51 and do the first direction displacement and move 31 of each group testers, with Song's transfer to be measured/the intact IC that surveys;
Move materials device 60: be first and second put materials device 10,20 and 40,50 of first and second loading and transmitting devices be used for transfer to be measured/the intact IC of survey, it is to drive fetching devices 62 with driving mechanism 61 to do first and second direction displacements, and does the third direction displacement with fetching device 62 and be used for taking, putting IC;
Heating arrangement 70: be provided in a side of first side of putting materials device 10, be used for heating IC to be measured;
Blank panel is put dish device 80: being provided in a side of first opposite side of putting materials device 10, is to drive a board 82 that is used for the empty charging tray of bearing with travel mechanism 81 to do the second direction displacement.
More than explanation is just illustrative for the purpose of the present invention, and it is nonrestrictive, those of ordinary skills understand, under the situation of the spirit and scope that do not break away from claim and limited, can make many modifications, change, or equivalence, but but all will fall within the claim restricted portion of the present invention.
Claims (9)
1. IC pick-up unit, it is characterized in that: it comprises:
First puts materials device: be in order to hold the charging tray of at least one splendid attire IC to be measured;
Second puts materials device: be in order to hold the charging tray of the intact IC of survey of at least one splendid attire;
Proving installation: described proving installation is provided with array and is used for the tester and the fetching device that is used for taking, putting to be measured/intact IC of survey of test I C;
At least one loading and transmitting device: be to be used between each tester of proving installation, carrying to be measured/intact IC of survey;
Move materials device: be used for first and second put between materials device and the loading and transmitting device transfer to be measured/the intact IC of survey;
The fetching device of described proving installation drives fetching device and does the second direction displacement, and takes, puts to be measured/intact IC of survey between described tester and described loading and transmitting device.
2. IC pick-up unit according to claim 1, it is characterized in that: first puts materials device includes bearing mechanism, pallet body and conveying mechanism, its bearing mechanism is the charging tray that is used for holding at least one splendid attire IC to be measured, pallet body is to be used for the bearing charging tray to do the third direction displacement, and conveying mechanism then is used for the transfer charging tray and is displaced to predeterminated position as second direction.
3. IC pick-up unit according to claim 1, it is characterized in that: second puts materials device includes bearing mechanism, pallet body and conveying mechanism, its bearing mechanism is the charging tray that is used for holding the intact IC of survey of at least one splendid attire, pallet body is to be used for the bearing charging tray to do the third direction displacement, and conveying mechanism then is used for the transfer charging tray and is displaced to predeterminated position as second direction.
4. IC pick-up unit according to claim 1, it is characterized in that: described at least one loading and transmitting device is to be respectively equipped with first and second loading and transmitting device in left and right array tester the place ahead of proving installation, and first and second loading and transmitting device then moves and carry to be measured/intact IC of survey respectively between left and right array tester.
5. IC pick-up unit according to claim 4 is characterized in that: described first loading and transmitting device is to do the first direction displacement with the drive mechanism microscope carrier.
6. IC pick-up unit according to claim 4 is characterized in that: described second loading and transmitting device is to do the first direction displacement with the drive mechanism microscope carrier.
7. IC pick-up unit according to claim 1, it is characterized in that: the described materials device that moves is to drive fetching device with driving mechanism to do first and second direction displacement, and do the third direction displacement with fetching device, put at first and second and take, put to be measured/intact IC of survey between materials device and the loading and transmitting device.
8. IC pick-up unit according to claim 1 is characterized in that: more comprise the heating arrangement that is used for heating IC to be measured.
9. IC pick-up unit according to claim 1 is characterized in that: more comprise blank panel and put the dish device, it is provided with above a travel mechanism and is used for the board of the empty charging tray of bearing, and board drives empty charging tray and does the second direction displacement.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102476863A CN102116831A (en) | 2009-12-30 | 2009-12-30 | Integrated circuit (IC) detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102476863A CN102116831A (en) | 2009-12-30 | 2009-12-30 | Integrated circuit (IC) detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102116831A true CN102116831A (en) | 2011-07-06 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN2009102476863A Pending CN102116831A (en) | 2009-12-30 | 2009-12-30 | Integrated circuit (IC) detection device |
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Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54152976A (en) * | 1978-05-24 | 1979-12-01 | Fujitsu Ltd | Testing method for integrated circuit |
| JPS5895271A (en) * | 1981-12-01 | 1983-06-06 | Nec Corp | Testing device for semiconductor integrated circuit |
| TW551500U (en) * | 2002-07-12 | 2003-09-01 | Hon Tech Inc | Conveying apparatus of IC tester |
| TWI233997B (en) * | 2004-04-16 | 2005-06-11 | Hon Tech Inc | IC inspection device |
| CN1715940A (en) * | 2004-06-29 | 2006-01-04 | 鸿劲科技股份有限公司 | IC detector suitable for different IC's |
| TWI274029B (en) * | 2006-03-16 | 2007-02-21 | Hon Tech Inc | Testing machine for integrated circuits |
| CN101082651A (en) * | 2006-05-30 | 2007-12-05 | 鸿劲科技股份有限公司 | ICDetecting machine |
| CN101308707A (en) * | 2007-05-15 | 2008-11-19 | 鸿劲科技股份有限公司 | Sorting machine for memory IC detection |
-
2009
- 2009-12-30 CN CN2009102476863A patent/CN102116831A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS54152976A (en) * | 1978-05-24 | 1979-12-01 | Fujitsu Ltd | Testing method for integrated circuit |
| JPS5895271A (en) * | 1981-12-01 | 1983-06-06 | Nec Corp | Testing device for semiconductor integrated circuit |
| TW551500U (en) * | 2002-07-12 | 2003-09-01 | Hon Tech Inc | Conveying apparatus of IC tester |
| TWI233997B (en) * | 2004-04-16 | 2005-06-11 | Hon Tech Inc | IC inspection device |
| CN1715940A (en) * | 2004-06-29 | 2006-01-04 | 鸿劲科技股份有限公司 | IC detector suitable for different IC's |
| TWI274029B (en) * | 2006-03-16 | 2007-02-21 | Hon Tech Inc | Testing machine for integrated circuits |
| CN101082651A (en) * | 2006-05-30 | 2007-12-05 | 鸿劲科技股份有限公司 | ICDetecting machine |
| CN101308707A (en) * | 2007-05-15 | 2008-11-19 | 鸿劲科技股份有限公司 | Sorting machine for memory IC detection |
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Application publication date: 20110706 |