CN1465985A - IC test processing machine for high-frequency IC test - Google Patents

Abstract

The invention is a high-frequency IC test processor, mainly composed of machine platform and test platform, the machine platform set with IC feeding mechanism used to largely provide tested IC; and set with tested/test-finishing IC feeding mechanism used to move the IC on the machine platform to each mechanism for processing; and also set with test-finished IC test-level separating holding pan; in addition set with at least a group of test ports to connect with the test platform, the test ports set with tested/test-finished IC buffer bearing to pre-hold the tested IC or used as the test-finished IC buffer device, and the test ports also set with IC test suction nozzle to press the test IC in the insert-connect seat of the test platform or take out the tested IC from the seat to make the tested/test-finishing IC feeding mechanism move the tested IC out of the test platform.

Description

Be applied to the IC test handler of high-frequency IC test

Technical field

The present invention is a kind of IC test handler that is applied to high-frequency IC test, when referring to that especially the IC that is tested is high-performance, high-speed chip, the generally too high and difficult making of frequency of using at the measuring head of partly being arranged in pairs or groups with the mechanism of IC test handler, cause fetch long price and be difficult to acceptance, even measuring head can't be commercial during more fast frequency, promptly is application of the present invention.

Background technology

Please earlier with reference to Fig. 1, at present the ubiquitous IC test handler measuring head 12 ' testing tool that mainly utilizes a board 1 ' and to sell by manufacturer formed, this board 1 ' should possess at least have feeding machanism 11 ' that IC to be measured is entered in advance, and can transport this IC and survey the intact IC of survey of IC/ conveying mechanism 12 ' to sending of each station, utilization send the intact IC of survey of survey IC/ conveying mechanism 12 ' that IC is delivered on the intact IC of survey of the IC/ to be measured buffer zone 121 ', and after IC moved into test section 2 ', draw IC and be pressed into measuring head 21 ' by the test cartridge on the test I C conveying arm 13 ' 131 ' and test, measuring head 21 ' also produces test data to behind the board 1 ', with test I C conveying arm 13 ' IC is removed to the intact IC of survey of IC/ to be measured buffer zone 121 ' equally again, survey the intact IC of survey of IC/ conveying mechanism 12 ' by sending again, in the grade of the intact survey IC holding tray 14 ' under IC is dispensed into according to test data.But also there are some shortcomings in this public IC test handler:

1. the used measuring head instrument of its IC test handler belongs to the simulated environment test, but not the actual environment test, therefore the some functions that can't simulate just can't be tested and be obtained, and promptly doing test with measuring head is not complete functional test.

2. the cost of this measuring head belongs to the expensive part of whole IC test handler, and general measuring head is fixed a price according to the frequency environment that can simulate, can test the more IC of high frequency, its price is higher, therefore this IC test handler is under certain function/price ratio, the side is able to survive on market, many as for spending to the measuring head that extremely high frequency IC tests, it is arranged in pairs or groups with relative IC test handler one, the expense of entire machine, but non-general manufacturer can accept, so for a long time, the test of ultrahigh frequency IC is only limited to the big factory of minority to be carried out, and the testing factory of general scale can't manage this part market at all.

3. because advancing by leaps and bounds of chip technology in recent years, its technology and speed constantly update (especially central processor CPU or painting processor FPU chip), and the more and more difficult exploitation of the tester that can be applicable to this IC, more and more release market evening, the speed of its tester research and development does not catch up with the speed of new IC already, and more can have new IC in vain and do not have the situation that suitable measuring head is tested future.

Summary of the invention

For solving the problem of above-mentioned public IC test processor, purpose of the present invention is for providing a kind of IC test handler that is applied to high-frequency IC test, it utilizes a power supply unit, the public plate of test to form a test platform with basic starting up's environment (being motherboard Mainboard) and substitutes public measuring head partly, this work kenel belongs to the actual environment test, can make the most detailed test jobs to this IC, can improve the correctness of IC test.And owing to motherboard, the public plate of test of this test platform is the support product of this tested IC manufacturer or its cooperation authentication manufacturer, this tested IC one sample presentation, have supplier's research and development and release market at once, so can very cheap price obtain, and the supply of material does not have anxiety, can decline to a great extent to the cost of whole board.

The present invention mainly comprises:

One board: the intact survey of the IC/ to be measured IC that this board provides the action of a central control unit with other mechanism of control coordination board, the feeding machanism of tested IC, tested IC/ to finish the feed mechanism of surveying IC, the setting of corresponding test port number cushions bearing and at least one IC test suction nozzle and test port with linking test platform, intact survey IC test grades sorting bearing dish;

One test platform: this test platform is arranged on the assembling frame in the test port of aforementioned board, comprise a power supply unit, the public plate of a test and basic starting up's environment (being motherboard), it tests the support product of public plate for the cooperation factory of this tested IC manufacturer, and establish IC test in the weldering of this bonding station and plug together seat, to insert tested IC; Power supply unit and basic starting up's environment are tested the element that public plate (after inserting tested IC) can be kept system's normal operation for this is provided, this basic starting up's environment includes an output/input system, can be by the external winding displacement of the central control unit of board to output/input system, reach signal by test platform read test result to central control unit to send controlling signal by central control unit in good time to test platform.

Description of drawings

Fig. 1 is the public IC test handler structural representation of seeing that includes tester.

Fig. 2 is an IC test handler board mesa structure schematic perspective view of the present invention.

Fig. 3 is arranged at the stereographic map exploded view of board test port for test platform of the present invention.

Fig. 4 is arranged at another angle three-dimensional combination figure of board test port for test platform of the present invention.

Description of reference numerals:

1 ': board

11 ': feeding machanism

12 ': send and survey intact IC bearing dish and the conveying mechanism surveyed of IC/

13 ': test I C conveying arm

131 ': test cartridge

14 ': the intact IC holding tray of surveying

15 ': the IC conveying mechanism

151 ': test cartridge

2 ': the test section

21 ': measuring head

1: board

11: central control unit

12: the feeding machanism of tested IC

13: the intact feed mechanism of surveying IC of tested IC/

14: the intact IC buffering bearing of surveying of IC/ to be measured

15:IC tests suction nozzle

16: test port

161: the assembling frame

17: the intact IC test grades sorting bearing dish of surveying

2: test platform

21: power supply unit

22: test public plate

The 221:IC test plugs together seat

23: basic starting up's environment

23 1: output/input system

3: winding displacement

Embodiment

Please refer to Fig. 2, the present invention mainly is made up of a board 1 and a test platform 2, and it is distinctly formed member and is:

One board 1: this board 1 provides the action of a central control unit 11 with control coordination board 1 other mechanism, and the feeding machanism 12 of tested IC, the feed mechanism 13 of the intact IC of survey of tested IC/, the intact IC of survey of IC/ to be measured cushion bearing 14 and at least one IC test suction nozzle 15 and test port 16 to be connected test platform 2, the intact IC of survey test grades sorting bearing dish 17;

One test platform 2 (as shown in Figure 3): this test platform 2 is arranged on the assembling frame 161 in the test port 16 of aforementioned board 1, comprise a power supply unit 21, the public plate 22 of a test and basic starting up's environment 23, it tests the support product of public plate 22 for this tested IC manufacturer or its cooperation manufacturer, and separate postwelding at the IC of this product, establish IC test in other weldering of its bonding station and plug together seat 221, to insert tested IC; Power supply unit 21 and basic starting up's environment 23 (being motherboard) are tested the element that public plate 22 (after inserting tested IC) can be kept system's normal operation for this is provided, this basic starting up's environment 23 includes an output/input system 231, can be by board 1 central control unit 11 external winding displacements 3 to output/input system 231, by central control unit 11 send in good time that controlling signal is given test platform 2 and by test platform 2 read test results' signal to central control unit 11.

According to above-mentioned each member, and with reference to Fig. 4, its operation workflow is for putting into IC to be tested the feeding machanism 12 of tested IC on the board 1 earlier, and utilize the feed mechanism 13 of the intact IC of survey of tested IC/ that IC to be tested is delivered in the intact IC of the survey buffering of the IC/ to be measured bearing 14, continue by IC test suction nozzle 15 and carry out the true environment test in the seat 221 by the intact IC of the survey buffering of IC/ to be measured bearing 14 interior IC test on the public plate 22 of IC built-in test to be measured is plugged together, cover after having surveyed and insert in the intact IC of the survey buffering of the IC/ to be measured bearing 14, and finish the feed mechanism 13 of surveying IC by tested IC/ and send, and read from the test data of output/input system 231 judgement grade, and insert in the suitable intact survey IC test grades sorting bearing dish 17 according to central control unit 11.

Assembling framves 161 in the test port 16 of above-mentioned board 1 can be answered the public plate 22 of the test of different size (may there be different component placement positions in each tame manufacturer on the specification of same support) and basic starting up's environment (motherboard) 23 and can be done the adjustment of support body position and still fixed this machine plate.

Test platform 2 of the present invention also can be according to the needs of board 1, set up to many group test platforms 2 and deposit, certainly, the test port 16 of the bearing test platform 2 of board 1 and assemble 161, the intact IC of the survey buffering of IC/ to be measured bearing 14 etc. all needs relative increase group number.

In addition, this test platform 2 also can provide its direct supply by board 1.

In sum, the IC test handler that is applied to high-frequency IC test of the present invention is also unexposed before application, had its novelty, and it can solve the traditional IC test handler to involving great expense on the high-frequency IC test, even inorganic available problem, its invention has possessed progressive, meets the patent of invention requirement, proposes patented claim in accordance with the law.The above is embodiments of the invention only, is not to be used for limiting scope of the invention process, and promptly all equalizations of being done according to the present patent application claim change and modify, and are all Patent right requirement scope of the present invention and contain.

Claims (2)

1. IC test handler that is applied to high-frequency IC test is characterized by: mainly comprise:

One board: the intact survey of the IC/ to be measured IC that this board provides the action of a central control unit with other mechanism of control coordination board, the feeding machanism of tested IC, tested IC/ to finish the feed mechanism of surveying IC, the setting of corresponding test port number cushions bearing and at least one IC test suction nozzle and test port with linking test platform, intact survey IC test grades sorting bearing dish;

One test platform: this test platform is arranged on the assembling frame in the test port of aforementioned board, comprise a power supply unit, the public plate of a test and basic starting up's environment (being motherboard), it tests the support product of public plate for the cooperation factory of this tested IC manufacturer, and establish IC test in the weldering of this bonding station and plug together seat, to insert tested IC; Power supply unit and basic starting up's environment are tested the element that public plate (after inserting tested IC) can be kept system's normal operation for this is provided, this basic starting up's environment includes an output/input system, can be by the external winding displacement of the central control unit of board to output/input system, reach signal by test platform read test result to central control unit to send controlling signal by central control unit in good time to test platform.

2. the IC test handler that is applied to high-frequency IC test as claimed in claim 1, it is characterized by: this test platform does not contain power supply unit and can be provided by board.

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