CN1276535A - 射线探测器 - Google Patents
射线探测器 Download PDFInfo
- Publication number
- CN1276535A CN1276535A CN00117976A CN00117976A CN1276535A CN 1276535 A CN1276535 A CN 1276535A CN 00117976 A CN00117976 A CN 00117976A CN 00117976 A CN00117976 A CN 00117976A CN 1276535 A CN1276535 A CN 1276535A
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- 239000003990 capacitor Substances 0.000 claims abstract description 86
- 238000006243 chemical reaction Methods 0.000 claims abstract description 14
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Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
- H01L27/14658—X-ray, gamma-ray or corpuscular radiation imagers
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/63—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to dark current
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
- H04N25/671—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction
- H04N25/673—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response for non-uniformity detection or correction by using reference sources
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
- H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
- H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/70—SSIS architectures; Circuits associated therewith
- H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
Landscapes
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Facsimile Heads (AREA)
- Light Receiving Elements (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Closed-Circuit Television Systems (AREA)
Abstract
Description
Claims (52)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16021399 | 1999-06-07 | ||
JP160213/1999 | 1999-06-07 | ||
JP2000108099A JP2001056382A (ja) | 1999-06-07 | 2000-04-10 | 放射線検出器及び放射線診断装置 |
JP108099/2000 | 2000-04-10 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1276535A true CN1276535A (zh) | 2000-12-13 |
CN1183390C CN1183390C (zh) | 2005-01-05 |
Family
ID=26486769
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB001179764A Expired - Fee Related CN1183390C (zh) | 1999-06-07 | 2000-06-06 | 射线探测器 |
Country Status (4)
Country | Link |
---|---|
US (1) | US6696687B1 (zh) |
EP (1) | EP1067606B1 (zh) |
JP (1) | JP2001056382A (zh) |
CN (1) | CN1183390C (zh) |
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100507604C (zh) * | 2002-07-05 | 2009-07-01 | 株式会社东芝 | 调整偏移分量的射线探测器 |
CN102885632A (zh) * | 2011-07-20 | 2013-01-23 | 佳能株式会社 | 放射线检测装置和包括该放射线检测装置的检测*** |
CN102224433B (zh) * | 2008-11-24 | 2014-05-14 | 皇家飞利浦电子股份有限公司 | X射线探测器 |
CN104068876A (zh) * | 2013-03-27 | 2014-10-01 | 西门子公司 | 探测器单元 |
CN104704390A (zh) * | 2012-09-27 | 2015-06-10 | 富士胶片株式会社 | 放射线图像检测装置 |
CN113805221A (zh) * | 2020-06-11 | 2021-12-17 | 睿生光电股份有限公司 | 辐射检测装置 |
CN115855271A (zh) * | 2023-02-22 | 2023-03-28 | 昆明钍晶科技有限公司 | 一种具有大电荷处理能力的读出电路及红外热成像仪 |
Families Citing this family (37)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2002151669A (ja) * | 2000-11-14 | 2002-05-24 | Toshiba Corp | X線撮像装置 |
JP4723767B2 (ja) * | 2001-09-13 | 2011-07-13 | 株式会社東芝 | X線画像診断装置 |
US7248671B2 (en) * | 2002-06-26 | 2007-07-24 | Kabushiki Kaisha Toshiba | X-ray diagnosis apparatus |
US6989538B2 (en) * | 2003-07-22 | 2006-01-24 | General Electric Co. | Method of reducing recovery time in an x-ray detector |
US7550732B2 (en) * | 2004-09-30 | 2009-06-23 | Fujifilm Corporation | Radiation image detector |
US7302039B2 (en) * | 2005-02-24 | 2007-11-27 | Canon Kabushiki Kaisha | Radiography apparatus, radiography system, and control method thereof |
JP4773768B2 (ja) * | 2005-08-16 | 2011-09-14 | キヤノン株式会社 | 放射線撮像装置、その制御方法及び放射線撮像システム |
JP4847202B2 (ja) | 2006-04-27 | 2011-12-28 | キヤノン株式会社 | 撮像装置及び放射線撮像システム |
US7659518B2 (en) * | 2006-07-27 | 2010-02-09 | Shimadzu Corporation | Light or radiation image pickup apparatus |
JP5406473B2 (ja) * | 2007-07-19 | 2014-02-05 | キヤノン株式会社 | 放射線検出装置 |
JP4949964B2 (ja) * | 2007-08-10 | 2012-06-13 | 富士フイルム株式会社 | 放射線画像検出器 |
JP5171431B2 (ja) * | 2008-06-26 | 2013-03-27 | 株式会社ジャパンディスプレイウェスト | 光電変換装置、放射線撮像装置及び放射線検出装置 |
EP2303126A4 (en) * | 2008-07-28 | 2017-03-08 | Orthosoft, Inc. | X-ray detection device for c-arm tracker and method |
WO2011055277A2 (en) * | 2009-11-03 | 2011-05-12 | Koninklijke Philips Electronics N.V. | Detector unit for detecting electromagnetic radiation |
JP5335006B2 (ja) | 2010-02-26 | 2013-11-06 | 三菱電機株式会社 | 赤外線固体撮像素子 |
KR101306512B1 (ko) * | 2010-03-09 | 2013-09-09 | 가부시키가이샤 시마즈세이사쿠쇼 | 이차원 어레이 x선 검출기의 검사 방법 |
JP4779054B1 (ja) | 2010-03-31 | 2011-09-21 | 富士フイルム株式会社 | 固体撮像素子及び撮像装置 |
JP2012090032A (ja) * | 2010-10-19 | 2012-05-10 | Toshiba Corp | ラインアーチファクト検出器及びその検出方法 |
JP2012130406A (ja) * | 2010-12-20 | 2012-07-12 | Shimadzu Corp | 二次元画像撮影装置 |
JP5676503B2 (ja) | 2011-02-01 | 2015-02-25 | 富士フイルム株式会社 | 放射線画像撮影装置、放射線画像撮影装置の制御プログラム、及び放射線画像撮影装置の制御方法 |
JP6021344B2 (ja) * | 2011-05-12 | 2016-11-09 | キヤノン株式会社 | 固体撮像装置、固体撮像装置の駆動方法、固体撮像システム |
JP5583191B2 (ja) * | 2011-11-25 | 2014-09-03 | 富士フイルム株式会社 | 放射線画像検出装置およびその作動方法 |
TWI488500B (zh) * | 2011-12-23 | 2015-06-11 | Ind Tech Res Inst | X射線主動式畫素感測器讀取電路與讀取方法 |
CN104160695B (zh) * | 2012-03-09 | 2017-04-26 | 富士胶片株式会社 | 放射线图像拍摄装置、放射线图像拍摄***以及放射线图像拍摄装置的控制方法 |
KR20130104563A (ko) * | 2012-03-14 | 2013-09-25 | 삼성디스플레이 주식회사 | 유기 발광 표시 장치의 어레이 시험 장치 및 시험 방법, 및 유기 발광 표시 장치의 제조 방법 |
JP6174849B2 (ja) * | 2012-08-10 | 2017-08-02 | キヤノン株式会社 | 放射線撮像装置及び放射線撮像システム |
KR102065807B1 (ko) * | 2012-10-30 | 2020-01-13 | 케어스트림 헬스 인코포레이티드 | 디지털 방사선 촬영 검출기들을 위한 전하 주입 보상 |
JP5886793B2 (ja) | 2013-06-11 | 2016-03-16 | 浜松ホトニクス株式会社 | 固体撮像装置 |
CN110233978B (zh) | 2014-02-07 | 2022-03-11 | 拉姆伯斯公司 | 馈通补偿图像传感器 |
JP6404661B2 (ja) * | 2014-09-29 | 2018-10-10 | 東芝電子管デバイス株式会社 | 放射線検出器用アレイ基板、および放射線検出器 |
JP6512909B2 (ja) * | 2015-04-09 | 2019-05-15 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
US10306168B2 (en) * | 2015-05-04 | 2019-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, imaging system, and electronic device |
TWI738569B (zh) * | 2015-07-07 | 2021-09-01 | 日商半導體能源研究所股份有限公司 | 成像裝置及其運作方法 |
CN107710740B (zh) * | 2015-07-13 | 2020-03-10 | 夏普株式会社 | 放射线检测器 |
TWI785342B (zh) * | 2020-06-11 | 2022-12-01 | 睿生光電股份有限公司 | 輻射偵測裝置 |
JP2022012182A (ja) * | 2020-07-01 | 2022-01-17 | キヤノン電子管デバイス株式会社 | 放射線検出器 |
WO2023153375A1 (ja) * | 2022-02-09 | 2023-08-17 | 国立大学法人静岡大学 | 距離計測装置及び距離計測方法 |
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JP2803098B2 (ja) * | 1988-08-09 | 1998-09-24 | 富士ゼロックス株式会社 | 画像読取装置 |
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JP4088986B2 (ja) * | 1997-07-30 | 2008-05-21 | 株式会社島津製作所 | 2次元放射線検出器 |
JPH1187681A (ja) * | 1997-09-04 | 1999-03-30 | Shimadzu Corp | フラット・パネル形センサ |
JP3027569B2 (ja) * | 1998-04-14 | 2000-04-04 | 松下電子工業株式会社 | 増幅型固体撮像装置、その駆動方法及び物理量分布検知半導体装置 |
JP3618232B2 (ja) * | 1998-09-17 | 2005-02-09 | シャープ株式会社 | 固体撮像装置のクランプ回路 |
-
2000
- 2000-04-10 JP JP2000108099A patent/JP2001056382A/ja active Pending
- 2000-04-17 EP EP00108384A patent/EP1067606B1/en not_active Expired - Lifetime
- 2000-04-18 US US09/550,800 patent/US6696687B1/en not_active Expired - Lifetime
- 2000-06-06 CN CNB001179764A patent/CN1183390C/zh not_active Expired - Fee Related
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100507604C (zh) * | 2002-07-05 | 2009-07-01 | 株式会社东芝 | 调整偏移分量的射线探测器 |
CN102224433B (zh) * | 2008-11-24 | 2014-05-14 | 皇家飞利浦电子股份有限公司 | X射线探测器 |
CN102885632A (zh) * | 2011-07-20 | 2013-01-23 | 佳能株式会社 | 放射线检测装置和包括该放射线检测装置的检测*** |
CN102885632B (zh) * | 2011-07-20 | 2014-09-24 | 佳能株式会社 | 放射线检测装置和包括该放射线检测装置的检测*** |
CN104704390A (zh) * | 2012-09-27 | 2015-06-10 | 富士胶片株式会社 | 放射线图像检测装置 |
CN104068876A (zh) * | 2013-03-27 | 2014-10-01 | 西门子公司 | 探测器单元 |
CN113805221A (zh) * | 2020-06-11 | 2021-12-17 | 睿生光电股份有限公司 | 辐射检测装置 |
CN115855271A (zh) * | 2023-02-22 | 2023-03-28 | 昆明钍晶科技有限公司 | 一种具有大电荷处理能力的读出电路及红外热成像仪 |
Also Published As
Publication number | Publication date |
---|---|
EP1067606B1 (en) | 2012-07-04 |
CN1183390C (zh) | 2005-01-05 |
EP1067606A3 (en) | 2002-06-05 |
EP1067606A2 (en) | 2001-01-10 |
US6696687B1 (en) | 2004-02-24 |
JP2001056382A (ja) | 2001-02-27 |
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