CN1257999C - 基片处理过程中用于消除废白粉的装置 - Google Patents

基片处理过程中用于消除废白粉的装置 Download PDF

Info

Publication number
CN1257999C
CN1257999C CNB018218059A CN01821805A CN1257999C CN 1257999 C CN1257999 C CN 1257999C CN B018218059 A CNB018218059 A CN B018218059A CN 01821805 A CN01821805 A CN 01821805A CN 1257999 C CN1257999 C CN 1257999C
Authority
CN
China
Prior art keywords
chamber
gas
substrate processing
exhaust
cleaning gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB018218059A
Other languages
English (en)
Chinese (zh)
Other versions
CN1531606A (zh
Inventor
S·亚达夫
Q·商
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Applied Materials Inc
Original Assignee
Applied Materials Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Applied Materials Inc filed Critical Applied Materials Inc
Publication of CN1531606A publication Critical patent/CN1531606A/zh
Application granted granted Critical
Publication of CN1257999C publication Critical patent/CN1257999C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01DSEPARATION
    • B01D46/00Filters or filtering processes specially modified for separating dispersed particles from gases or vapours
    • B01D46/10Particle separators, e.g. dust precipitators, using filter plates, sheets or pads having plane surfaces
    • B01D46/12Particle separators, e.g. dust precipitators, using filter plates, sheets or pads having plane surfaces in multiple arrangements
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4401Means for minimising impurities, e.g. dust, moisture or residual gas, in the reaction chamber
    • C23C16/4405Cleaning of reactor or parts inside the reactor by using reactive gases
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4412Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32798Further details of plasma apparatus not provided for in groups H01J37/3244 - H01J37/32788; special provisions for cleaning or maintenance of the apparatus
    • H01J37/32816Pressure
    • H01J37/32834Exhausting
    • H01J37/32844Treating effluent gases
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02CCAPTURE, STORAGE, SEQUESTRATION OR DISPOSAL OF GREENHOUSE GASES [GHG]
    • Y02C20/00Capture or disposal of greenhouse gases
    • Y02C20/30Capture or disposal of greenhouse gases of perfluorocarbons [PFC], hydrofluorocarbons [HFC] or sulfur hexafluoride [SF6]

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Metallurgy (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • General Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Filtering Materials (AREA)
  • Filtering Of Dispersed Particles In Gases (AREA)
CNB018218059A 2001-01-09 2001-12-20 基片处理过程中用于消除废白粉的装置 Expired - Fee Related CN1257999C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US75684101A 2001-01-09 2001-01-09
US09/756,841 2001-01-09

Publications (2)

Publication Number Publication Date
CN1531606A CN1531606A (zh) 2004-09-22
CN1257999C true CN1257999C (zh) 2006-05-31

Family

ID=25045280

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB018218059A Expired - Fee Related CN1257999C (zh) 2001-01-09 2001-12-20 基片处理过程中用于消除废白粉的装置

Country Status (5)

Country Link
JP (1) JP2004537844A (ja)
KR (1) KR20030065593A (ja)
CN (1) CN1257999C (ja)
TW (1) TW536739B (ja)
WO (1) WO2002055756A1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8066634B2 (en) 2003-07-28 2011-11-29 Welch Allyn, Inc. Digital otoscope
JP4596805B2 (ja) 2004-03-31 2010-12-15 財団法人国際科学振興財団 真空管製造装置
KR101755970B1 (ko) * 2008-02-11 2017-07-07 엔테그리스, 아이엔씨. 이온 공급원 챔버를 포함하는 이온 주입 시스템의 성능 향상 및 수명 연장 방법
CN103071646A (zh) * 2011-10-25 2013-05-01 深圳市迅捷兴电路技术有限公司 一种用等离子体去除软硬结合板钻污的方法
CN102600675B (zh) * 2012-03-22 2013-12-04 西安航空制动科技有限公司 化学气相沉积炉用尾气处理装置
KR101628077B1 (ko) * 2014-07-22 2016-06-08 위너스 주식회사 질소가스 분사장치
KR101820821B1 (ko) * 2017-06-27 2018-01-22 (주)제이솔루션 설치가 용이한 반도체 및 lcd 제조공정의 배기가스 가열용 3중 배관 가열장치
KR102157876B1 (ko) * 2018-08-28 2020-09-18 한국기계연구원 리모트 플라즈마 장치를 구비한 진공 펌프 시스템
CN109621578A (zh) * 2018-11-28 2019-04-16 中核新能核工业工程有限责任公司 一种真空管道多重可拆卸网式过滤器
WO2021142028A1 (en) * 2020-01-10 2021-07-15 Lam Research Corporation Ammonia abatement for improved roughing pump performance

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60198394A (ja) * 1984-03-21 1985-10-07 Anelva Corp 真空処理装置の排気装置
US5647945A (en) * 1993-08-25 1997-07-15 Tokyo Electron Limited Vacuum processing apparatus
US5928426A (en) * 1996-08-08 1999-07-27 Novellus Systems, Inc. Method and apparatus for treating exhaust gases from CVD, PECVD or plasma etch reactors

Also Published As

Publication number Publication date
CN1531606A (zh) 2004-09-22
KR20030065593A (ko) 2003-08-06
JP2004537844A (ja) 2004-12-16
TW536739B (en) 2003-06-11
WO2002055756A1 (en) 2002-07-18

Similar Documents

Publication Publication Date Title
US8343317B2 (en) In situ cleaning of CVD System exhaust
EP0839930B1 (en) Apparatus for vacuum line cleaning in substrate processing equipment
JP3897382B2 (ja) Cvdシステムの真空ラインのクリーニング方法及び装置
CN1282992C (zh) 半导体制造装置的净化方法和半导体器件的制造方法
CN1257999C (zh) 基片处理过程中用于消除废白粉的装置
US20130133697A1 (en) Prevention of post-pecvd vacuum and abatement system fouling using a fluorine containing cleaning gas chamber
KR20010021403A (ko) 실리콘-산소-탄소 증착 공정의 기판 처리챔버배기라인으로부터 잔류물을 제거하기 위한 방법
TW200402092A (en) CVD apparatus and method for cleaning the same
US10892143B2 (en) Technique to prevent aluminum fluoride build up on the heater
CN1891858A (zh) 用于反应气净化工具部件的方法和工艺
JP5329951B2 (ja) 堆積工程のための高効率トラップ
CN112020766A (zh) 用于气体副产品消除和前级管线清洁的设备
KR20010112652A (ko) 반도체 프로세싱의 동안 가스들의 사용 효율을 증가시키기위한 장치와 방법들
CN111069192A (zh) 原位清洗装置和半导体处理设备
CN1131587A (zh) 以最小的污染和颗粒分配超高纯度气体的方法
CN1283343C (zh) 排气净化方法、排气净化装置及其所使用的除尘装置
EP1441043A2 (en) Supply of gas to semiconductor process chamber
US20220112598A1 (en) Trap filter system for semiconductor equipment
KR20030081592A (ko) 반도체 제조설비의 배기라인 부산물 제거장치
JP4491696B2 (ja) 排気ガス処理装置
US20060054183A1 (en) Method to reduce plasma damage during cleaning of semiconductor wafer processing chamber
EP1154037A1 (en) Methods for improving chemical vapor deposition processing
JP3688742B2 (ja) 化学的気相成長装置排ガス処理装置
JP4452956B2 (ja) 有機シリコン含有排気ガス処理方法
Raoux et al. A Plasma Reactor for Solid Waste Treatment on Pecvd Production Systems

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20060531

Termination date: 20121220