CN1226592C - 位置检测方法、位置检测装置、及印刷电路板的定位方法 - Google Patents

位置检测方法、位置检测装置、及印刷电路板的定位方法 Download PDF

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Publication number
CN1226592C
CN1226592C CNB031067808A CN03106780A CN1226592C CN 1226592 C CN1226592 C CN 1226592C CN B031067808 A CNB031067808 A CN B031067808A CN 03106780 A CN03106780 A CN 03106780A CN 1226592 C CN1226592 C CN 1226592C
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CN
China
Prior art keywords
mentioned
benchmark
position detecting
picture
circuit board
Prior art date
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Expired - Fee Related
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CNB031067808A
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English (en)
Chinese (zh)
Other versions
CN1487265A (zh
Inventor
福岛正人
村松义和
崎野忠志
酒井庄三
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UHT Corp
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UHT Corp
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Publication of CN1487265A publication Critical patent/CN1487265A/zh
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Publication of CN1226592C publication Critical patent/CN1226592C/zh
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
CNB031067808A 2002-02-28 2003-02-28 位置检测方法、位置检测装置、及印刷电路板的定位方法 Expired - Fee Related CN1226592C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP53958/2002 2002-02-28
JP2002053958A JP2003254714A (ja) 2002-02-28 2002-02-28 位置検出方法及び位置検出装置並びにプリント基板の位置決め方法

Publications (2)

Publication Number Publication Date
CN1487265A CN1487265A (zh) 2004-04-07
CN1226592C true CN1226592C (zh) 2005-11-09

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CNB031067808A Expired - Fee Related CN1226592C (zh) 2002-02-28 2003-02-28 位置检测方法、位置检测装置、及印刷电路板的定位方法

Country Status (4)

Country Link
JP (1) JP2003254714A (ja)
KR (1) KR20030071533A (ja)
CN (1) CN1226592C (ja)
TW (1) TW591198B (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106444852A (zh) * 2015-08-07 2017-02-22 欧姆龙株式会社 图像处理装置、位置校正方法及工业装置

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101672616B (zh) * 2008-09-11 2012-09-05 北大方正集团有限公司 电路板成型防漏铣治具及其防漏铣检验方法
JP2017190955A (ja) * 2016-04-11 2017-10-19 株式会社太陽機械製作所 認識装置
TW201930826A (zh) * 2017-12-26 2019-08-01 日商索尼股份有限公司 外觀檢查裝置、外觀檢查方法、程式及工件之製造方法
CN112254666A (zh) * 2020-09-14 2021-01-22 海伯森技术（深圳）有限公司 一种单工位多视角的视觉检测装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106444852A (zh) * 2015-08-07 2017-02-22 欧姆龙株式会社 图像处理装置、位置校正方法及工业装置
US10334239B2 (en) 2015-08-07 2019-06-25 Omron Corporation Image processing apparatus, calibration method, and calibration program
CN106444852B (zh) * 2015-08-07 2019-07-26 欧姆龙株式会社 图像处理装置、位置校正方法及工业装置

Also Published As

Publication number Publication date
TW200304539A (en) 2003-10-01
JP2003254714A (ja) 2003-09-10
KR20030071533A (ko) 2003-09-03
CN1487265A (zh) 2004-04-07
TW591198B (en) 2004-06-11

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Granted publication date: 20051109