CN115308453B - Aging test fixture and aging test system - Google Patents
Aging test fixture and aging test system Download PDFInfo
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- CN115308453B CN115308453B CN202211233232.2A CN202211233232A CN115308453B CN 115308453 B CN115308453 B CN 115308453B CN 202211233232 A CN202211233232 A CN 202211233232A CN 115308453 B CN115308453 B CN 115308453B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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Abstract
The invention relates to the technical field of component aging, in particular to an aging test fixture and an aging test system. The aging test fixture comprises a base, a mounting part, a butt joint mechanism and a connecting end. The mounting part, the butt joint mechanism and the connecting end are all arranged on the base. The installation part is used for installing and fixing the element to be tested, and the two groups of installation parts are arranged in series. The butt joint mechanism and the connecting end are respectively arranged on two opposite sides of the base, and are electrically connected between the two groups of mounting parts. The butt joint mechanism is used for being electrically connected with the connecting end of the adjacent aging test fixture. The aging test system comprises the aging test fixture. The method can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on the aging process of other elements, is beneficial to the efficient implementation of the aging test, and reduces the time waste.
Description
Technical Field
The invention relates to the technical field of component aging, in particular to an aging test fixture and an aging test system.
Background
The installation inspection of current ageing test board is all carried out the secondary inspection through the mode of visual inspection after the staff carries out the installation of test board, and the very easy hourglass that appears.
When the aging test is carried out, test faults need to be checked, and common test faults mainly comprise: poor contact, unstable connection, etc. In general, these problems are examined immediately after the start of the aging test and immediately after the energization, thereby ensuring the smooth progress of the subsequent aging test.
However, in the actual aging test, the test failure may not occur immediately after the aging test is performed for a certain period of time, and the test failure may occur. The test faults need to be checked in time once occurring, but if the test faults are checked by directly powering off, the normal aging process of other elements is affected.
In view of this, the present application is specifically proposed.
Disclosure of Invention
The invention aims at providing the aging test fixture which is simple in structure and convenient to use, can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on the aging process of other elements, is beneficial to the efficient performance of the aging test, and reduces the time waste.
The second object of the invention is to provide a burn-in test system, which can be used for completing the investigation work of test faults in the burn-in test process, is simple and efficient, reduces the interference of the investigation work on the burn-in process of other elements, is beneficial to the efficient performance of the burn-in test, and reduces the time waste.
Embodiments of the present invention are implemented as follows:
an aging test fixture, comprising: base, installation department, docking mechanism and link. The mounting part, the butt joint mechanism and the connecting end are all arranged on the base. The installation part is used for installing and fixing the element to be tested, and the two groups of installation parts are arranged in series. The butt joint mechanism and the connecting end are respectively arranged on two opposite sides of the base, and are electrically connected between the two groups of mounting parts. The butt joint mechanism is used for being electrically connected with the connecting end of the adjacent aging test fixture.
Further, the docking mechanism includes: an adjustment assembly and a docking post. The adjusting assembly includes: the device comprises a sliding block, a guide block, a rotating wheel and a screw rod.
The rotating wheel is rotatably arranged on the base, and the screw rod is coaxial with and fixedly connected with the rotating wheel. The sliding block is slidably matched with the base, and the sliding direction of the sliding block is along the axial direction of the screw rod. The sliding block is provided with a threaded hole matched with the screw rod. The guide block is fixedly connected to the sliding block and is provided with a guide surface which is obliquely arranged relative to the screw rod.
The butt joint post is matched with the base in a sliding mode, the sliding direction of the butt joint post is perpendicular to the axial direction of the screw rod, and the end portion of the butt joint post is attached to the guide surface. The butt column is also matched with a first elastic piece for pushing the butt column to reset. The butt-joint column is electrically connected between the two groups of mounting parts.
The rotating wheel can drive the sliding block to move so as to control the butt joint column to be close to and far away from the connecting end by utilizing the guide surface.
Further, the connection terminal includes: the device comprises a sleeve, a moving block, a second elastic piece and a first conductive sheet.
The sleeve is fixedly arranged on the base, the opening of the sleeve faces the butt joint column, and one end, far away from the sleeve, of the sleeve is of a closed structure. The sleeve and the butt-joint column are coaxially arranged.
One side of the sleeve is provided with a mounting notch penetrating through the side wall of the sleeve, the first conducting strip is arranged on the mounting notch, and the inner side surface of the first conducting strip is flush with the inner side wall of the sleeve. The first conductive sheet is electrically connected between the two groups of mounting parts.
The moving block is slidably accommodated in the sleeve, the second elastic piece is arranged between the moving block and the inner end wall of the sleeve, and the moving block is positioned at the opening of the sleeve in a natural state.
Further, a guide post is further arranged in the sleeve, the guide post and the sleeve are coaxially arranged, the guide post is fixedly connected to the inner end wall of the sleeve, and the outer end face of the guide post is flush with the opening of the sleeve. The motion block is provided with a matching through hole matched with the positioning column.
Further, the butt-joint column comprises a column body, a second conducting strip and a rotating block. The second conductive sheet is connected between the two groups of mounting parts.
The cylinder is hollow structure, and the rotating block is rotatably installed in the cylinder, and the axis of rotation of the rotating block is perpendicular to the axis of the cylinder. The rotating block is provided with an abutting surface and a connecting surface, and the abutting surface is obliquely arranged relative to the connecting surface. The second conducting strip is connected to the connecting surface, and the abutting surface is located at one side of the rotating block, which is close to the connecting end.
The end part of the column body, which is close to the connecting end, is provided with a yielding hole for the guide column to pass through, and the side wall of the end of the column body, which is close to the connecting end, is provided with a yielding hole for the first conducting strip to extend out.
Under the natural state, the abutting surface is inclined relative to the guide post, when the abutting post is matched with the sleeve, the guide post abuts against the abutting surface and pushes the rotating block to rotate, so that the second conducting strip extends out of the yielding port to be attached to the first conducting strip, and electric conduction is achieved.
Further, the second conductive sheet is made of an elastic conductive material. The second conducting strip includes integrated into one piece's first electrically conductive section and second electrically conductive section, and first electrically conductive section sets up and fixed mounting in the middle of the cylinder along the axial of cylinder, and the second electrically conductive section is located the one end that first electrically conductive section is close to the link, and the second electrically conductive section is the slope setting relative first electrically conductive section.
The second conductive segment is connected to the connection surface and extends towards the abdication opening.
When the butt-joint column is matched with the sleeve, the guide column is abutted against the abutting surface and pushes the rotating block to rotate, so that the second conductive section extends out of the yielding port to be attached to the first conductive sheet to realize electrical conduction.
Further, the column further comprises: and resetting the assembly. The reset component comprises a guide arm, an abutting plate and a third elastic piece.
One end of the guide arm is hinged to the inner side wall of the column body, the guide arm is hinged to one side, far away from the rotating block, of the second conductive section, and the rotating axis of the guide arm is parallel to and spaced from the rotating axis of the rotating block. The abutting plate is slidably matched with the guide arm, the third elastic piece abuts against between the abutting plate and the hinged end of the guide arm, and the abutting plate abuts against one side, away from the rotating block, of the second conductive section.
Further, the abutting plate is provided with a first matching hole for the guide arm to pass through, the second conductive section is provided with a second matching hole for the guide arm to pass through, and the rotating block is provided with a third matching hole for the guide arm to pass through.
The apertures of the first matching hole and the second matching hole are slightly larger than the diameter of the guide arm, and the apertures of the first matching hole and the second matching hole are smaller than the aperture of the third matching hole.
A burn-in test system comprises the burn-in test fixture.
Further, the burn-in test system includes: the terminal control computer, the MCU circuit, the constant current control loop, the aging test loop and the current sampling circuit.
The aging test loop is electrically connected with the constant current control loop, the constant current control loop is electrically connected with the current sampling circuit, the constant current control loop and the current sampling circuit are electrically connected with the MCU circuit, and the MCU circuit is electrically connected with the terminal control computer.
The aging test loop comprises a plurality of parallel constant current loops, an aging test clamp is arranged in each constant current loop, and each constant current loop is also provided with a voltage detection module for detecting the actual voltage of each element to be tested.
The technical scheme of the embodiment of the invention has the beneficial effects that:
in the aging test process, the aging test fixture provided by the embodiment of the invention assumes that the element a has an open-circuit fault along with the aging test, and the fault is required to be checked. At this time, the aging test fixtures in the two loops can be electrically connected through the butt joint mechanism and the connecting end, namely, the addition of the line L is equivalent, at this time, the element b and the element d become in parallel connection, and the element b and the element d are connected in parallel and then connected in series with the element c. In this way, in the process of troubleshooting the failure of the element a, the element b is still in a conducting state, and the aging process can still be continued, so that the influence degree of the failure of the element a on the aging process of the element b is reduced. After the fault at the element a is completely checked, the abutting mechanism and the connecting end of the two adjacent aging test fixtures are disconnected, and the line L is disconnected and returns to the normal aging state.
In general, the aging test fixture provided by the embodiment of the invention has a simple structure and is convenient to use, the aging test fixture can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on aging processes of other elements, is beneficial to the efficient performance of aging tests, and reduces the time waste. The aging test system provided by the embodiment of the invention can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on the aging process of other elements, is beneficial to the efficient implementation of the aging test, and reduces the time waste.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, it being understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and other related drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic view of the overall structure of the aging test jig according to embodiment 1 of the present invention;
FIG. 2 is a schematic diagram showing the use process of the aging test jig according to embodiment 1 of the present invention;
fig. 3 is a schematic diagram (disconnection state) of the mating mechanism and the connection end of the aging test fixture according to embodiment 1 of the present invention;
FIG. 4 is a schematic view of the internal structure of FIG. 3;
FIG. 5 is an enlarged view of a portion of FIG. 4;
FIG. 6 is an enlarged view of a portion of FIG. 5;
fig. 7 is a schematic view of a first intermediate state of a docking mechanism and a connection end of the aging test fixture provided in embodiment 1 of the present invention during docking;
fig. 8 is a schematic diagram of a second intermediate state of the docking mechanism and the connection end of the aging test fixture provided in embodiment 1 of the present invention during docking;
fig. 9 is a schematic diagram of a third intermediate state of the docking mechanism and the connection end of the aging test fixture provided in embodiment 1 of the present invention in the docking process;
fig. 10 is a schematic diagram of the docking mechanism of the aging test fixture provided in embodiment 1 of the present invention in a state when docking with the connection end is completed;
FIG. 11 is an enlarged view of a portion of FIG. 10;
fig. 12 is a schematic structural diagram of the aging test system provided in embodiment 2 of the present invention;
fig. 13 is a schematic diagram of the aging test system according to embodiment 2 of the present invention when the "line L" is connected.
Reference numerals illustrate:
aging test fixture 1000; a base 100; a mounting portion 110; a docking mechanism 200; an adjustment assembly 210; a slider 211; a guide block 212; a guide surface 213; a wheel 214; a screw 215; docking post 300; a column 310; a second conductive sheet 320; a first conductive segment 321; a second conductive segment 322; a second fitting hole 322a; a rotating block 330; an abutment surface 331; a connection surface 332; a third fitting hole 333; a relief hole 340; a yielding port 350; a first elastic member 360; an annular flange 370; a connection end 400; a sleeve 410; mounting notch 411; a motion block 420; a second elastic member 430; a first conductive sheet 440; a guide post 450; a reset assembly 500; a guide arm 510; an abutment plate 520; a first mating hole 521; a third elastic member 530; aging test system 2000; the aging test loop 2100.
Detailed Description
For the purpose of making the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention, and it is apparent that the described embodiments are some embodiments of the present invention, but not all embodiments of the present invention. The components of the embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.
Thus, the following detailed description of the embodiments of the invention, as presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further definition or explanation thereof is necessary in the following figures.
The terms "first," "second," "third," and the like are used merely to distinguish between descriptions and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "parallel," "perpendicular," and the like, do not denote that the components are required to be absolutely parallel or perpendicular, but may be slightly inclined. For example, "parallel" merely means that the directions are more parallel than "perpendicular" and does not mean that the structures must be perfectly parallel, but may be slightly tilted.
In the description of the present invention, it should also be noted that, unless explicitly specified and limited otherwise, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present invention will be understood in specific cases by those of ordinary skill in the art.
Example 1
Referring to fig. 1, the present embodiment provides a burn-in test jig 1000, wherein the burn-in test jig 1000 includes: base 100, mounting portion 110, docking mechanism 200, and connection end 400. The mounting portion 110, the docking mechanism 200, and the connection end 400 are all provided to the base 100. The mounting portion 110 is used for mounting and fixing the element to be tested, and two groups of mounting portions 110 are arranged in series. The burn-in test fixture 1000 is used for accessing a burn-in test circuit, and when the components to be tested are mounted and fixed on the mounting portions 110, the components to be tested on the two groups of mounting portions 110 are in a series connection relationship.
The docking mechanism 200 and the connecting end 400 are respectively disposed on two opposite sides of the base 100, and the docking mechanism 200 and the connecting end 400 are electrically connected between the two sets of mounting portions 110. The docking mechanism 200 is used for electrically connecting with the connecting end 400 of the adjacent burn-in test fixture 1000 to realize the circuit connection between the adjacent burn-in test fixtures 1000.
For example, a burn-in test circuit has a plurality of burn-in test fixtures 1000, and the burn-in test fixtures 1000 are connected in parallel, and two devices to be tested mounted on each burn-in test fixture 1000 are connected in series. As shown in fig. 2. Element a and element b are connected in series and belong to an independent loop. Element c and element d are connected in series and belong to another adjacent independent loop. The two loops are in parallel connection.
In the aging test, as the aging test proceeds, it is assumed that an open-circuit fault occurs at the element a, and the fault needs to be checked. At this time, the burn-in test fixture 1000 in two loops may be electrically connected to the connection end 400 through the docking mechanism 200, that is, the addition of the line L is equivalent to the parallel connection of the element b and the element d, and the parallel connection of the element b and the element d is followed by the series connection of the element c. In this way, in the process of troubleshooting the failure of the element a, the element b is still in a conducting state, and the aging process can still be continued, so that the influence degree of the failure of the element a on the aging process of the element b is reduced. When the troubleshooting at the component a is completed, the docking mechanism 200 and the connection end 400 of the adjacent two burn-in test jigs 1000 are disconnected, and the line L is disconnected and returns to the normal burn-in state.
In general, the aging test fixture 1000 has a simple structure and is convenient to use, the aging test fixture can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on the aging process of other elements, is beneficial to the efficient performance of the aging test, and reduces the time waste.
Referring to fig. 3 to 11, in the present embodiment, the docking mechanism 200 includes: an adjustment assembly 210 and a docking post 300. The adjustment assembly 210 includes: a sliding block 211, a guiding block 212, a rotating wheel 214 and a screw 215.
As shown in fig. 3 to 6, the base 100 has an inner cavity, the rotating wheel 214 is rotatably installed in the inner cavity of the base 100, the rotating axis of the rotating wheel 214 is disposed along the axial direction of the base 100, and the screw rod 215 is coaxially and fixedly connected with the rotating wheel 214. The tread of the wheel 214 extends through the top wall of the base 100 and to the far left exterior to facilitate turning of the wheel 214 from the exterior of the base 100.
The sliding block 211 is slidably fitted in the base 100, and a sliding direction of the sliding block is set along an axial direction of the screw rod 215. The sliding block 211 is provided with a screw hole (not shown) for being matched with the screw rod 215, and the sliding block 211 is matched with the screw rod 215 through the screw hole. The screw rod 215 can drive the sliding block 211 to slide by rotating the rotating wheel 214, and the sliding direction of the sliding block 211 can be regulated and controlled by changing the rotating direction of the rotating wheel 214.
The guide block 212 is fixedly connected to the slide block 211, and the guide block 212 has a guide surface 213 inclined with respect to the screw rod 215. The guide surface 213 is located on a side of the guide block 212 adjacent to the connecting end 400 of the other burn-in jig 1000.
The docking post 300 is slidably engaged with the base 100, the sliding direction of the docking post 300 is perpendicular to the axial direction of the screw rod 215, and the end of the docking post 300 away from the connecting end 400 of the other aging test fixture 1000 is attached to the guiding surface 213. The docking post 300 is also fitted with a first resilient member 360 for urging it to return. The outer portion of the docking post 300 has an annular flange 370, and the first elastic member 360 is sleeved on the docking post 300 and is abutted between the annular flange 370 and a side wall of the base 100, which is close to one side of the other aging test fixture 1000.
The sidewall of the base 100 is provided with an opening from which the tool abutment post 300 protrudes.
When the runner 214 is rotated to bring the slider 211 closer to the runner 214, the guide surface 213 of the guide block 212 pushes the docking post 300 out of the base 100, so that the docking post 300 moves toward the connection end 400 of the other burn-in jig 1000 for completing the electrical connection. When the wheel 214 is rotated in the opposite direction to move the sliding block 211 away from the wheel 214, the docking post 300 is retracted back into the base 100 by the guide surface 213 and the first elastic member 360. That is, the sliding block 211 can be driven to move by rotating the rotating wheel 214 to control the approaching and separating of the docking post 300 to and from the connection end 400 by the guide surface 213.
Further, the connection terminal 400 includes: the sleeve 410, the moving block 420, the second elastic member 430, and the first conductive sheet 440.
The sleeve 410 is fixedly mounted on the base 100, the opening of the sleeve 410 faces the docking post 300, and one end of the sleeve 410 away from the sleeve 410 is a closed structure. Sleeve 410 is disposed coaxially with docking post 300. The interior cavity of the sleeve 410 is adapted to the docking post 300 and the shape of the motion block 420 is also adapted to the interior cavity of the sleeve 410.
One side of the sleeve 410 is provided with a mounting notch 411 penetrating through the side wall thereof, the first conductive sheet 440 is arranged at the mounting notch 411, and the inner side surface of the first conductive sheet 440 is flush with the inner side wall of the sleeve 410. The first conductive sheet 440 is electrically connected between the two sets of mounting portions 110 through a conductive wire or a printed circuit.
The moving block 420 is slidably accommodated in the sleeve 410, and the second elastic member 430 is disposed between the moving block 420 and an inner end wall of the sleeve 410, and in a natural state, the moving block 420 is located at a mouth of the sleeve 410.
When the docking post 300 moves toward the connection end 400, the docking post 300 can be matched into the sleeve 410, the moving block 420 is pushed toward the inside of the sleeve 410, so that the moving block 420 moves through the first conductive sheet 440 and exposes the first conductive sheet 440, and thus the docking post 300 and the first conductive sheet 440 are electrically conducted smoothly, and the connection of the line L between the adjacent two aging test fixtures 1000 is completed.
When the docking mechanism 200 and the connecting end 400 of two adjacent aging test jigs 1000 are not connected, the docking post 300 is accommodated in the base 100, and the mouth of the sleeve 410 of the other aging test jig 1000 is closed by the moving block 420, so that the situation of unexpected connection cannot occur, dust can be prevented from entering, and the occurrence probability of poor contact and other problems is reduced.
In this embodiment, a guiding post 450 is further disposed in the sleeve 410, the guiding post 450 is coaxially disposed with the sleeve 410, the guiding post 450 is fixedly connected to an inner end wall of the sleeve 410, and an outer end surface of the guiding post 450 is flush with the mouth of the sleeve 410. The moving block 420 is provided with a matching through hole matched with the positioning column. The guide post 450 can improve stability of the motion block 420.
Further, the docking post 300 includes a post 310, a second conductive piece 320, and a rotational block 330. The second conductive sheet 320 is connected between the two sets of mounting portions 110.
The column 310 is hollow, the rotating block 330 is rotatably installed inside the column 310, and the axis of rotation of the rotating block 330 is perpendicular to the axis of the column 310. The rotating block 330 has an abutting surface 331 and a connecting surface 332, the abutting surface 331 is inclined with respect to the connecting surface 332, and the rotating surface and the abutting surface 331 are parallel to the axis of rotation of the rotating block 330. The second conductive piece 320 is connected to the connection surface 332, and the abutment surface 331 is located on a side of the rotation block 330 near the connection end 400.
The end of the column body 310 near the connecting end 400 is provided with a yielding hole 340 for the guiding column 450 to pass through, and the side wall of the column body 310 near the connecting end 400 is provided with a yielding hole 350 for the first conducting strip 440 to extend out.
In a natural state, the abutting surface 331 is inclined relative to the guide post 450, and when the abutting post 300 is mated to the sleeve 410, the guide post 450 abuts against the abutting surface 331 and pushes the rotating block 330 to rotate, so that the second conductive sheet 320 extends from the yielding opening 350 to be attached to the first conductive sheet 440 for electrical conduction, as shown in fig. 7-10.
Specifically, the second conductive sheet 320 is made of an elastic conductive material. The second conductive piece 320 includes a first conductive section 321 and a second conductive section 322 that are integrally formed, the first conductive section 321 is disposed along an axial direction of the pillar 310 and is fixedly mounted in the pillar 310, the second conductive section 322 is located at an end of the first conductive section 321 near the connection end 400, and the second conductive section 322 is disposed obliquely with respect to the first conductive section 321. The first conductive segment 321 is electrically connected between the two sets of mounting portions 110 through a wire or a printed circuit.
Second conductive segment 322 is coupled to coupling face 332 and extends toward relief port 350.
In a natural state, the end of second conductive segment 322 is located within relief port 350.
When the docking post 300 is mated to the sleeve 410, the guide post 450 extends into the post 310 from the yielding hole 340 and contacts the abutment surface 331 of the rotating block 330, and when the docking post 300 is fully mated to the sleeve 410, the guide post 450 further enters the post 310 and applies a pushing force to the abutment surface 331 to rotate the rotating block 330, so that the second conductive segment 322 extends out from the yielding hole 350 to be attached to the first conductive sheet 440 for electrical conduction.
In the present embodiment, the abutment surface 331 extends toward the side of the second conductive segment 322 along the axial direction of the pillar 310 and pointing toward the connecting end 400 of the other burn-in jig 1000.
Since the second conductive sheet 320 itself is made of an elastic conductive material, when the cylinder 310 is separated from the connection terminal 400, the second conductive sheet 320 can be restored by its elastic restoring force and simultaneously promote the rotational restoration of the rotational block 330.
In order to secure the reset effect of the second conductive piece 320 and the rotating block 330, the column 310 further includes: reset assembly 500. The reset assembly 500 includes a guide arm 510, an abutment plate 520, and a third elastic member 530.
One end of the guiding arm 510 is hinged to the inner side wall of the column 310, and the guiding arm 510 is hinged to one side of the second conductive section 322 away from the rotating block 330, and the rotation axis of the guiding arm 510 is parallel to and spaced apart from the rotation axis of the rotating block 330. The abutting plate 520 is slidably engaged with the guide arm 510, the third elastic member 530 abuts between the abutting plate 520 and the hinge end of the guide arm 510, and the abutting plate 520 abuts on a side of the second conductive segment 322 away from the rotating block 330.
Specifically, the abutting plate 520 is provided with a first matching hole 521 through which the guiding arm 510 passes, the second conductive section 322 is provided with a second matching hole 322a through which the guiding arm 510 passes, and the rotating block 330 is provided with a third matching hole 333 through which the guiding arm 510 passes.
The apertures of both the first and second fitting holes 521 and 322a are slightly larger than the diameter of the guide arm 510, and the apertures of both the first and second fitting holes 521 and 322a are smaller than the aperture of the third fitting hole 333.
Through the above design, the reset assembly 500 not only can adapt to the movement process of the second conductive piece 320 moving towards the yielding port 350, but also can push the second conductive piece 320 and the rotating block 330 to be fully reset after the cylinder 310 is separated from the connecting end 400.
Since the first, second and third fitting holes 521, 322a and 333 are provided, the guide arm 510 is less likely to be jammed during the movement of the second conductive segment 322. In the present embodiment, the apertures of both the first and second fitting holes 521 and 322a are slightly larger than the diameter of the guide arm 510 and smaller than twice the diameter of the guide arm 510, and the aperture of the third fitting hole 333 is larger than or equal to 4 times the diameter of the guide arm 510.
The connection and disconnection of the "line L" can be conveniently accomplished using the burn-in test fixture 1000.
Example 2
Referring to fig. 12, the present embodiment provides a burn-in test system 2000, wherein the burn-in test system 2000 includes a burn-in test fixture 1000 of embodiment 1. The burn-in test system 2000 may be used for a burn-in test of electrical resistance.
The aging test system 2000 includes: the terminal control computer, the MCU circuit, the constant current control loop, the aging test loop 2100 and the current sampling circuit.
The aging test circuit 2100 is electrically connected with the constant current control circuit, the constant current control circuit is electrically connected with the current sampling circuit, the constant current control circuit and the current sampling circuit are electrically connected with the MCU circuit, and the MCU circuit is electrically connected with the terminal control computer.
The burn-in test circuit 2100 includes a plurality of parallel constant current circuits, each of which is provided with a burn-in test jig 1000, and each of which is further provided with a voltage detection module for detecting an actual voltage of each element to be tested.
In this embodiment, 1 aging test fixture 1000 is disposed in each constant current loop, and the resistor to be tested is installed in the constant current loop through the aging test fixtures 1000, so as to realize the series connection of the resistor to be tested in the constant current loop. The 20 constant current loops are connected in parallel to form a burn-in test loop 2100, and the burn-in test loop 2100 can perform a burn-in test on 40 resistors (R1, R2, R3 and R40) at one time.
It will be appreciated that the number of constant current loops in the burn-in test loop 2100, and the number of resistors mountable in each constant current loop, may be flexibly set according to actual needs, and are not limited thereto.
The terminal control computer is electrically connected with the MCU circuit, the MCU circuit is electrically connected with the constant current control loop, the constant current control loop is specifically 20 paths, and an operational amplifier circuit is arranged between the constant current control loop and the current sampling circuit.
The actual voltage of each resistor can be obtained through calculation, and the calculation process comprises the following steps: determining an input voltage Vin according to the set aging voltage, detecting tail end voltages (V1, V2, V3, & gtV 40) of each resistor, and calculating the actual voltage of each resistor according to the input voltage Vin and the tail end voltages (V1, V2, V3, & gtV 40).
In order to more clearly illustrate the method of troubleshooting the resistance burn-in test system 2000 during the burn-in test, an exemplary description is provided in connection with the resistance burn-in test system 2000 in this example. The explanation is made by taking the example that the aging voltage of each resistor is set to 5V, and the aging current is set to 100mA, and the labeling parameter of the resistor to be measured is 0.5W/50Ω. It will be appreciated that the actual burn-in voltage and current may be flexibly adjusted according to the actual situation and is not limited thereto.
Mode one: if the actual current of one constant current loop is shown as "0", it is checked whether the actual voltages of 2 resistors of the constant current loop are normal. If the actual current of the second constant current loop is shown as "0", the actual voltage of the resistor R3 is shown as "5.00V", the actual voltage of the resistor R4 is shown as "0", V3 is shown as "5.00V", V4 is shown as "0", and Vin is shown as "10.5V". The calculated blocking is r3=50Ω, r4=0Ω. Then it is prioritized that resistor R4 is not properly installed resulting in a current loop failure. If there is no problem in the installation of the resistor R4, then the resistor R4 itself is considered to be broken or damaged.
Mode two: if the actual current of one constant current loop is shown as 100mA, the actual voltage of one resistor in 2 resistors of the constant current loop is found to be slightly higher than the aging voltage. For example, in the scanning interface, the actual current of the third constant current loop is shown as "100mA", but the actual voltage of R5 is shown as "5.00V", the actual voltage of R6 is shown as "5.53V", vin is "10.5V", V5 is shown as "5.5V", V6 is shown as "0.03V", the resistance calculation shows r5=50Ω, r6=55Ω, the poor contact of the aging fixture of R6 is preferentially considered, and then, the resistance value exceeds the nominal allowable error, for example, the resistance value error of the resistor is considered to be 1%, then R6 completely exceeds the allowable error range thereof, special marks are needed, and finally whether the test is qualified or not is finally determined after the test is finished.
Mode three: if the actual current of all the constant current loops is lower than 100mA required by aging, checking shows that the actual voltage of 2 resistors of the constant current loops is slightly higher than the aging voltage of the device, and the aging test condition is set unsuitable in priority. For example, the actual currents I0 to I20 are all random values in the range of "80mA to 90mA", and the actual voltages of all resistors are all "4.3 to 4.6V", and it is determined that the aging voltage is not sufficiently set, and the set value is increased.
When a test fault occurs at one resistor in a certain constant current loop, the fault checking can be performed by using a connection "line L" manner as in embodiment 1, specifically, the docking mechanism 200 and the connection end 400 of the aging test fixture 1000 of two adjacent constant current loops are electrically connected, as shown in fig. 12 for example, so as to reduce the influence degree of the fault checking process on the aging process of other resistors in the fault loop.
In summary, the aging test fixture 1000 provided by the embodiment of the invention has a simple structure and is convenient to use, the aging test fixture can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on the aging process of other elements, is beneficial to the efficient performance of the aging test, and reduces the time waste. The aging test system 2000 provided by the embodiment of the invention can be used for completing the investigation work of test faults in the aging test process, is simple and efficient, reduces the interference of the investigation work on the aging process of other elements, is beneficial to the efficient implementation of the aging test, and reduces the time waste.
The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. An aging test fixture, comprising: the device comprises a base, a mounting part, a butt joint mechanism and a connecting end; the mounting part, the docking mechanism and the connecting end are all arranged on the base; the mounting part is used for mounting and fixing the element to be tested, and the two groups of mounting parts are arranged in series; the butt joint mechanism and the connecting end are respectively arranged on two opposite sides of the base, and are electrically connected between the two groups of mounting parts; the butt joint mechanism is used for being electrically connected with the connecting end of the adjacent aging test fixture;
the docking mechanism includes: an adjustment assembly and a docking post; the adjustment assembly includes: the device comprises a sliding block, a guide block, a rotating wheel and a screw rod;
the rotating wheel is rotatably arranged on the base, and the screw rod is coaxial with the rotating wheel and fixedly connected with the rotating wheel; the sliding block is slidably matched with the base, and the sliding direction of the sliding block is along the axial direction of the screw rod; the sliding block is provided with a threaded hole matched with the screw rod; the guide block is fixedly connected to the sliding block and is provided with a guide surface which is obliquely arranged relative to the screw rod;
the butt joint column is matched with the base in a sliding manner, the sliding direction of the butt joint column is perpendicular to the axial direction of the screw rod, and the end part of the butt joint column is attached to the guide surface; the butt joint column is also matched with a first elastic piece for pushing the butt joint column to reset; the butt-joint column is electrically connected between the two groups of mounting parts;
rotating the rotating wheel can drive the sliding block to move so as to control the butt joint column to approach and depart from the connecting end by utilizing the guide surface;
the connection terminal comprises: the device comprises a sleeve, a moving block, a second elastic piece and a first conductive sheet;
the sleeve is fixedly arranged on the base, an opening of the sleeve faces the butt joint column, and one end of the sleeve, which is far away from the sleeve, is of a closed structure; the sleeve and the butt joint column are coaxially arranged;
one side of the sleeve is provided with a mounting notch penetrating through the side wall of the sleeve, the first conducting strip is arranged on the mounting notch, and the inner side surface of the first conducting strip is flush with the inner side wall of the sleeve; the first conductive sheet is electrically connected between the two groups of mounting parts;
the moving block is slidably accommodated in the sleeve, the second elastic piece is arranged between the moving block and the inner end wall of the sleeve, and the moving block is positioned at the opening of the sleeve in a natural state;
the sleeve is internally provided with a guide post which is coaxially arranged with the sleeve, the guide post is fixedly connected with the inner end wall of the sleeve, and the outer end surface of the guide post is level with the opening of the sleeve; the moving block is provided with a matching through hole matched with the positioning column;
the butt joint column comprises a column body, a second conducting strip and a rotating block; the second conducting strip is connected between the two groups of mounting parts;
the column body is of a hollow structure, the rotating block is rotatably arranged in the column body, and the rotating axis of the rotating block is perpendicular to the axis of the column body; the rotating block is provided with an abutting surface and a connecting surface, and the abutting surface is obliquely arranged relative to the connecting surface; the second conducting strip is connected to the connecting surface, and the abutting surface is positioned on one side of the rotating block close to the connecting end;
the end part of the cylinder, which is close to the connecting end, is provided with a yielding hole for the guide post to pass through, and the side wall of the end of the cylinder, which is close to the connecting end, is provided with a yielding hole for the first conducting strip to extend out;
in a natural state, the abutting surface is inclined relative to the guide post, and when the abutting post is matched with the sleeve, the guide post abuts against the abutting surface and pushes the rotating block to rotate, so that the second conducting plate extends out of the yielding port and is attached to the first conducting plate to realize electrical conduction;
the second conductive sheet is made of elastic conductive material; the second conductive sheet comprises a first conductive section and a second conductive section which are integrally formed, the first conductive section is arranged along the axial direction of the column body and is fixedly arranged in the column body, the second conductive section is positioned at one end of the first conductive section, which is close to the connecting end, and the second conductive section is obliquely arranged relative to the first conductive section;
the second conductive segment is connected to the connection surface and extends towards the abdication port;
when the butt joint column is matched with the sleeve, the guide column is abutted to the abutting surface and pushes the rotating block to rotate, so that the second conductive section extends out of the yielding port and is attached to the first conductive sheet to realize electrical conduction.
2. The burn-in jig of claim 1 wherein the column further comprises: a reset assembly; the resetting component comprises a guide arm, an abutting plate and a third elastic piece;
one end of the guide arm is hinged to the inner side wall of the column body, the guide arm is hinged to one side, far away from the rotating block, of the second conductive section, and the rotating axis of the guide arm is parallel to the rotating axis of the rotating block at intervals; the abutting plate is slidably matched with the guide arm, the third elastic piece abuts against between the abutting plate and the hinged end of the guide arm, and the abutting plate abuts against one side, away from the rotating block, of the second conductive section.
3. The aging test fixture of claim 2, wherein the abutment plate is provided with a first mating hole through which the guide arm passes, the second conductive segment is provided with a second mating hole through which the guide arm passes, and the turning block is provided with a third mating hole through which the guide arm passes;
the apertures of the first matching hole and the second matching hole are slightly larger than the diameter of the guide arm, and the apertures of the first matching hole and the second matching hole are smaller than the aperture of the third matching hole.
4. A burn-in test system, comprising: the aging test fixture according to any one of claims 1 to 3.
5. The burn-in system of claim 4, wherein the burn-in system comprises: the terminal control computer, the MCU circuit, the constant current control loop, the aging test loop and the current sampling circuit;
the aging test loop is electrically connected with the constant current control loop, the constant current control loop is electrically connected with the current sampling circuit, the constant current control loop and the current sampling circuit are electrically connected with the MCU circuit, and the MCU circuit is electrically connected with the terminal control computer;
the aging test loop comprises a plurality of parallel constant current loops, wherein each constant current loop is provided with one aging test clamp, and each constant current loop is also provided with a voltage detection module for detecting the actual voltage of each element to be tested.
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