CN115291477A - 一种半导体制造晶圆光刻设备 - Google Patents
一种半导体制造晶圆光刻设备 Download PDFInfo
- Publication number
- CN115291477A CN115291477A CN202211036479.5A CN202211036479A CN115291477A CN 115291477 A CN115291477 A CN 115291477A CN 202211036479 A CN202211036479 A CN 202211036479A CN 115291477 A CN115291477 A CN 115291477A
- Authority
- CN
- China
- Prior art keywords
- wafer
- block
- axis
- semiconductor manufacturing
- top surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001259 photo etching Methods 0.000 title claims abstract description 35
- 239000004065 semiconductor Substances 0.000 title claims abstract description 20
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 19
- 239000000428 dust Substances 0.000 claims abstract description 37
- 230000000694 effects Effects 0.000 claims abstract description 15
- 230000005540 biological transmission Effects 0.000 claims description 41
- 239000000919 ceramic Substances 0.000 claims description 39
- 238000010438 heat treatment Methods 0.000 claims description 30
- 230000002457 bidirectional effect Effects 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 14
- 238000000926 separation method Methods 0.000 claims description 11
- 238000005485 electric heating Methods 0.000 claims description 7
- 238000001459 lithography Methods 0.000 claims description 7
- 229920000297 Rayon Polymers 0.000 claims description 4
- 239000000853 adhesive Substances 0.000 claims description 4
- 230000001070 adhesive effect Effects 0.000 claims description 4
- 238000000605 extraction Methods 0.000 claims description 2
- 238000000034 method Methods 0.000 description 5
- 239000000084 colloidal system Substances 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001681 protective effect Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70925—Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
- G03F7/7075—Handling workpieces outside exposure position, e.g. SMIF box
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67207—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process
- H01L21/67225—Apparatus for manufacturing or treating in a plurality of work-stations comprising a chamber adapted to a particular process comprising at least one lithography chamber
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Epidemiology (AREA)
- Health & Medical Sciences (AREA)
- Public Health (AREA)
- Environmental & Geological Engineering (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Plasma & Fusion (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211036479.5A CN115291477B (zh) | 2022-08-26 | 2022-08-26 | 一种半导体制造晶圆光刻设备 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202211036479.5A CN115291477B (zh) | 2022-08-26 | 2022-08-26 | 一种半导体制造晶圆光刻设备 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN115291477A true CN115291477A (zh) | 2022-11-04 |
CN115291477B CN115291477B (zh) | 2023-07-25 |
Family
ID=83831682
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202211036479.5A Active CN115291477B (zh) | 2022-08-26 | 2022-08-26 | 一种半导体制造晶圆光刻设备 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN115291477B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115903396A (zh) * | 2022-11-15 | 2023-04-04 | 江苏华兴激光科技有限公司 | 一种微纳结构及其制备方法 |
CN117817135A (zh) * | 2024-03-05 | 2024-04-05 | 鑫业诚智能装备(无锡)有限公司 | 一种激光自动标刻装置及标刻方法 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07249559A (ja) * | 1994-03-09 | 1995-09-26 | Tokyo Electron Ltd | 回転処理装置 |
JP2004063645A (ja) * | 2002-07-26 | 2004-02-26 | Enzan Seisakusho:Kk | 半導体ウェハの保護部材剥離装置 |
JP2006147693A (ja) * | 2004-11-17 | 2006-06-08 | Tokyo Electron Ltd | 処理システム |
CN102460677A (zh) * | 2009-04-16 | 2012-05-16 | 休斯微技术股份有限公司 | 用于临时晶片接合和剥离的改进装置 |
CN112198769A (zh) * | 2020-10-27 | 2021-01-08 | 广东莱宝智能装备股份有限公司 | 一种平行光源非接触的单面自动光刻机 |
-
2022
- 2022-08-26 CN CN202211036479.5A patent/CN115291477B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07249559A (ja) * | 1994-03-09 | 1995-09-26 | Tokyo Electron Ltd | 回転処理装置 |
JP2004063645A (ja) * | 2002-07-26 | 2004-02-26 | Enzan Seisakusho:Kk | 半導体ウェハの保護部材剥離装置 |
JP2006147693A (ja) * | 2004-11-17 | 2006-06-08 | Tokyo Electron Ltd | 処理システム |
CN102460677A (zh) * | 2009-04-16 | 2012-05-16 | 休斯微技术股份有限公司 | 用于临时晶片接合和剥离的改进装置 |
CN112198769A (zh) * | 2020-10-27 | 2021-01-08 | 广东莱宝智能装备股份有限公司 | 一种平行光源非接触的单面自动光刻机 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115903396A (zh) * | 2022-11-15 | 2023-04-04 | 江苏华兴激光科技有限公司 | 一种微纳结构及其制备方法 |
CN117817135A (zh) * | 2024-03-05 | 2024-04-05 | 鑫业诚智能装备(无锡)有限公司 | 一种激光自动标刻装置及标刻方法 |
CN117817135B (zh) * | 2024-03-05 | 2024-05-31 | 鑫业诚智能装备(无锡)有限公司 | 一种激光自动标刻装置及标刻方法 |
Also Published As
Publication number | Publication date |
---|---|
CN115291477B (zh) | 2023-07-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN115291477A (zh) | 一种半导体制造晶圆光刻设备 | |
CN116638429B (zh) | 一种可调式晶圆边缘抛光装置 | |
CN112403812A (zh) | 一种基于芯片加工的晶圆喷胶机构 | |
CN212660495U (zh) | 一种中速多功能ysm10贴片机 | |
CN117564905A (zh) | 一种自动化晶托表面除胶*** | |
CN112024995A (zh) | 一种可自动清理废屑且可以翻转材料的机械雕刻机 | |
CN217142758U (zh) | 一种分光多焦点激光加工用工作台 | |
CN216660461U (zh) | 一种贴膜治具 | |
CN109015195B (zh) | 一种有机玻璃回收用玻璃修边机 | |
CN211027196U (zh) | 一种用于加工导光板的除尘装置 | |
CN113118793A (zh) | 一种机械加工用数控车床原料放置平台及其辅助清洁机构 | |
CN219075086U (zh) | 双工位模式的场镜座车削设备 | |
CN116618771B (zh) | 一种线切割机床的切割保护装置 | |
CN218109721U (zh) | 一种全自动激光机 | |
CN220781730U (zh) | 一种桥梁伸缩缝止水带用清理装置 | |
CN217224777U (zh) | 减速箱输出轴加工用除尘装置 | |
CN217616290U (zh) | 一种复合弓加工用除尘装置 | |
CN220952862U (zh) | 一种标线清除装置 | |
CN216183733U (zh) | 一种彩色印刷机的除尘机构 | |
CN220921734U (zh) | 一种可废屑收集的金属板材修边装置 | |
CN218797560U (zh) | 一种具有除尘装置的笔记本外壳涂装机 | |
CN219335070U (zh) | 一种机械加工用残渣清除机构 | |
CN221160615U (zh) | 一种新型数控V-cut机 | |
CN219235556U (zh) | 工业用数控双轴雕刻机 | |
CN210181331U (zh) | 一种液晶显示器贴片机用工作台 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20240221 Address after: No.88 Liaohe West Road, Pizhou Economic Development Zone, Xuzhou City, Jiangsu Province Patentee after: SU Normal University Semiconductor Materials and Equipment Research Institute (Pizhou) Co.,Ltd. Country or region after: China Patentee after: Jiangsu Normal University Address before: No.88 Liaohe West Road, Pizhou Economic Development Zone, Xuzhou City, Jiangsu Province Patentee before: SU Normal University Semiconductor Materials and Equipment Research Institute (Pizhou) Co.,Ltd. Country or region before: China |
|
TR01 | Transfer of patent right |