CN115201661B - Thyristor voltage monitoring board detection system and method - Google Patents

Thyristor voltage monitoring board detection system and method Download PDF

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Publication number
CN115201661B
CN115201661B CN202210823230.2A CN202210823230A CN115201661B CN 115201661 B CN115201661 B CN 115201661B CN 202210823230 A CN202210823230 A CN 202210823230A CN 115201661 B CN115201661 B CN 115201661B
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detected
monitoring board
signal
monitoring
voltage
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CN115201661A (en
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王振
胡列文
张怿宁
肖凯
邹延生
王奇
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Maintenance and Test Center of Extra High Voltage Power Transmission Co
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Maintenance and Test Center of Extra High Voltage Power Transmission Co
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Priority to CN202210823230.2A priority Critical patent/CN115201661B/en
Publication of CN115201661A publication Critical patent/CN115201661A/en
Priority to PCT/CN2022/131407 priority patent/WO2024011801A1/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836Fault-finding or characterising
    • G01R31/2843In-circuit-testing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The application relates to a thyristor voltage monitoring board detection system and a thyristor voltage monitoring board detection method. Comprising the following steps: the signal generating device is used for sending a test signal of the function to be verified to the monitoring board to be detected; the acquisition device is connected with the signal generation device, the output end of the monitoring board to be detected and a plurality of nodes to be detected in the monitoring board to be detected, and is used for determining the working state of the monitoring board to be detected according to the test signals and the optical pulse signals output after the monitoring board to be detected receives the test signals, and sequentially acquiring waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state. And the processor is connected with the acquisition device and used for determining the health state of the monitoring board to be detected according to the waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state and the parameters of the monitoring board to be detected. Thereby realizing the prediction of the service life of the monitoring board to be detected.

Description

Thyristor voltage monitoring board detection system and method
Technical Field
The application relates to the technical field of electrical equipment detection, in particular to a thyristor voltage monitoring board detection system and method.
Background
With the development of power grid construction, more and more extra-high voltage power transmission stations are built, a converter valve is a key device of a direct current power transmission project, reliable operation of the converter valve is crucial to the direct current power transmission project, a thyristor is a basic unit in the converter valve, and in order to ensure reliable operation of the converter valve, the operation state of the thyristor needs to be monitored. Therefore, each stage of thyristors needs to be provided with a thyristor voltage monitoring board, and the thyristor voltage monitoring board provides indication signals for triggering, turning-off and overvoltage of the thyristors so as to enable a power grid system to make corresponding control instructions. The thyristor voltage monitoring board (TVM) has the functions of direct current voltage equalizing, forward voltage monitoring, reverse voltage monitoring, thyristor BOD (Break Over Diode) voltage monitoring and the like. If the thyristor voltage monitoring board cannot work normally, the power grid system cannot monitor the running state of the thyristor and cannot send out a correct control instruction, so that the thyristor voltage monitoring board needs to be detected.
In the prior art, before the thyristor voltage monitoring board is formally put into use, and when the thyristor voltage monitoring board breaks down and maintains, the thyristor voltage monitoring board can be detected.
However, in the conventional art, the service life of the thyristor voltage monitoring board cannot be estimated, so that a fault condition in the use process of the thyristor voltage monitoring board cannot be avoided.
Disclosure of Invention
Based on the above, it is necessary to provide a system and a method for detecting a thyristor voltage monitoring board, which can determine the health status of the thyristor voltage monitoring board during the use process of the thyristor voltage monitoring board, so as to avoid the loss of a power grid system caused by the failure of the thyristor voltage monitoring board during the operation process.
A thyristor voltage monitor board detection system, comprising: the signal generating device is connected with the input end of the monitoring board to be detected and is used for sending a test signal of the function to be verified to the monitoring board to be detected; the acquisition device is connected with the signal generation device, the output end of the monitoring board to be detected and a plurality of nodes to be detected in the monitoring board to be detected, and is used for determining the working state of the monitoring board to be detected according to the test signal and the optical pulse signal output by the monitoring board to be detected after the monitoring board to be detected receives the test signal, and sequentially acquiring waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state, wherein the working state of the monitoring board to be detected corresponds to the function to be verified, and the working state comprises one of a positive voltage monitoring state, a negative voltage monitoring state and a thyristor breakdown voltage monitoring state; and the processor is connected with the acquisition device and is used for determining the health state of the monitoring board to be detected according to the waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state and the parameters of the monitoring board to be detected.
In one embodiment, the collection device comprises: the node switching module comprises a plurality of signal input ports and a signal output port, the plurality of signal input ports of the node switching module are respectively connected with a plurality of nodes to be detected of the monitoring board to be detected in a one-to-one correspondence manner, and the control end of the node switching module is connected with the processor and is used for sequentially conducting the channels between the signal input ports and the signal output ports under the control of the processor; the photoelectric conversion module is connected with the output end of the monitoring board to be detected and is used for converting the optical pulse signal output by the monitoring board to be detected into a feedback signal; the waveform acquisition module is respectively connected with the signal generation device, the signal output port of the node switching module and the photoelectric conversion module, and is used for determining the working state of the monitoring board to be detected according to the test signal and the feedback signal and acquiring a waveform signal of a target node to be detected, wherein the target node to be detected corresponds to the current conducted signal input port.
In one embodiment, the waveform acquisition module is further configured to align and normalize the acquired waveform signals of the nodes to be detected corresponding to the same working state of the monitoring board to be detected.
In one embodiment, the node switching module further includes: the filtering units are connected with the signal input ports in a one-to-one correspondence manner and are used for filtering waveform signals input by the corresponding signal input ports.
In one embodiment, the signal generating device comprises: the device comprises a voltage source and a pulse generation module, wherein the voltage source is connected with a power port of the monitoring board to be detected, and the pulse generation module is connected with an input end of the monitoring board to be detected; the voltage source is used for supplying power to the monitoring board to be detected, wherein the frequency and the amplitude of the voltage signal output by the voltage source are both corresponding preset values; the pulse generation module is used for outputting the test signal to verify each function to be verified of the monitoring board to be detected, wherein the test signal is a pulse signal with preset pulse width and preset amplitude.
In one embodiment, the signal generating device further comprises: the phase adjustment module is arranged between the voltage source and the pulse generation module and the monitoring board to be detected, is respectively connected with a power port of the monitoring board to be detected, an input end of the monitoring board to be detected, the voltage source and the pulse generation module, and is used for respectively adjusting the phase of the voltage signal and the phase of the test signal so that the phase difference of the voltage signal and the phase of the test signal is a preset phase difference, transmitting the adjusted voltage signal to the power port of the monitoring board to be detected and transmitting the adjusted test signal to the input end of the monitoring board to be detected.
In one embodiment, the system further comprises: the impedance measuring device is respectively connected with the processor and a preset port of the monitoring board to be detected, and is used for measuring an equivalent impedance value of the preset port of the monitoring board to be detected under a preset condition and transmitting the equivalent impedance value to the processor; the processor is further configured to determine a health state of the monitoring board to be detected according to waveform signals of nodes to be detected when the monitoring board to be detected is in the working state, parameters of the monitoring board to be detected, and equivalent impedance values of a preset port of the monitoring board to be detected under a preset condition.
In one embodiment, the system further comprises: the input end of the isolation power supply is used for being connected with the mains supply, and the output end of the isolation power supply is respectively connected with the signal generating device, the acquisition device and the processor and is used for respectively supplying power to the signal generating device, the acquisition device and the processor.
In one embodiment, the to-be-verified function of the to-be-detected monitoring board comprises one of a positive voltage monitoring function, a negative voltage monitoring function and a thyristor breakdown voltage monitoring function.
A method for detecting a thyristor voltage monitoring board comprises the following steps:
sending a test signal of a function to be verified to a monitoring board to be detected;
acquiring an optical pulse signal output by the monitoring board to be detected after receiving the test signal;
determining the working state of the monitoring board to be detected according to the test signal and the optical pulse signal;
Respectively acquiring waveform signals of each node to be detected when the monitoring board to be detected is in the working state, wherein the working state of the monitoring board to be detected corresponds to the function to be verified, and the working state comprises one of a positive voltage monitoring state, a negative voltage monitoring state and a thyristor breakdown voltage monitoring state;
And determining the health state of the monitoring board to be detected according to the waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state and the parameters of the monitoring board to be detected.
According to the thyristor voltage monitoring board detection system and the thyristor voltage monitoring board detection method, the signal generation device is arranged, so that the test signal can be sent to the monitoring board to be detected, and the test signal corresponds to the function to be verified. Therefore, an actual working environment is simulated for the monitoring board to be detected, and various functions of the monitoring board to be detected can be verified conveniently. Through setting up collection system, can gather the light pulse signal of waiting to detect monitoring board output to according to the light pulse signal of waiting to detect monitoring board output and the test signal that signal generating device sent, confirm the operating condition who waits to detect the monitoring board, thereby be convenient for follow-up collection corresponding wave form signal. After the working state of the monitoring board to be detected is determined, waveform signals of all nodes to be detected are sequentially obtained, so that when the monitoring board to be detected works in a certain state, the waveform signals of all corresponding nodes to be detected are obtained. Through setting up the treater, can be according to waiting to detect the waveform signal of each node department of waiting to detect under the monitoring board is in operating condition to and wait to detect the parameter of monitoring board, thereby can confirm whether wait to verify that the function that the current operating condition of waiting to detect the monitoring board corresponds is normal, after having confirmed whether each function of waiting to verify of waiting to detect the monitoring board is normal, can further synthesize and confirm the healthy state of waiting to detect the monitoring board, thereby realized the prediction of waiting to detect the life-span of monitoring board.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments or the conventional techniques of the present application, the drawings required for the descriptions of the embodiments or the conventional techniques will be briefly described below, and it is apparent that the drawings in the following description are only some embodiments of the present application, and other drawings may be obtained according to the drawings without inventive effort for those skilled in the art.
FIG. 1 is a schematic diagram of a thyristor voltage monitor board detection system in one embodiment;
FIG. 2 is a schematic diagram of a thyristor voltage monitor board detection system according to another embodiment;
FIG. 3 is a block diagram of a node switch module in one embodiment;
FIG. 4 is a schematic diagram of a thyristor voltage monitor board detection system according to yet another embodiment;
FIG. 5 is a schematic diagram of a thyristor voltage monitor board detection system according to yet another embodiment;
FIG. 6 is a schematic diagram of a thyristor voltage monitor board detection system according to yet another embodiment;
FIG. 7 is a schematic diagram of a thyristor voltage monitor board detection system according to yet another embodiment;
fig. 8 is a flow chart of a method of thyristor voltage monitor board detection in one embodiment.
Reference numerals illustrate: the device comprises a 10-signal generating device, a 20-monitoring board to be detected, a 21-node to be detected, a 22-output end of the monitoring board to be detected, a 30-acquisition device, a 40-processor, a 31-node switching module, a 32-photoelectric conversion module, a 33-waveform acquisition module, 310-multiple signal input ports, a 311-filtering unit, a 312-multichannel relay module, a 313-signal output port, a 314-state feedback circuit, a 315-driving circuit, a 316-power supply module, a 317-main control chip, a 318-network communication interface, a 11-voltage source, a 12-pulse generating module, a 13-phase adjustment module, a 50-impedance measuring device and a 60-isolation power supply.
Detailed Description
In order that the application may be readily understood, a more complete description of the application will be rendered by reference to the appended drawings. Embodiments of the application are illustrated in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or be connected to the other element through intervening elements. Further, "connection" in the following embodiments should be understood as "electrical connection", "communication connection", and the like if there is transmission of electrical signals or data between objects to be connected.
As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and/or "comprising," and/or the like, specify the presence of stated features, integers, steps, operations, elements, components, or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, or groups thereof.
In one embodiment, as shown in fig. 1, there is provided a thyristor voltage monitoring board detection system comprising: signal generation device 10, collection device 30, processor 40. Wherein:
The signal generating device 10 is connected with the input end of the monitoring board 20 to be detected, and is used for sending a test signal of the function to be verified to the monitoring board 20 to be detected.
Illustratively, the test signal corresponds to a function to be verified, and for verifying a different function of the monitor board 20 to be detected, a different test signal needs to be input to the monitor board 20 to be detected. The function to be verified of the monitor board 20 to be detected includes one of a positive voltage monitor function, a negative voltage monitor function, and a thyristor breakdown voltage monitor function.
For example, corresponding to the positive voltage monitoring function, the monitoring board 20 to be detected is first powered from the outside, a voltage driving signal is input, then the testing signal is a +15v pulse signal, the voltage driving signal is used for driving the monitoring board 20 to be detected to work, and the monitoring board 20 to be detected is powered, so that each circuit node in the monitoring board 20 to be detected can have sufficient electric energy to act. The +15v pulse signal is a function for verifying positive voltage monitoring of the monitoring board 20 to be detected, and if the +15v pulse signal can be indicated to be monitored by the optical pulse signal output by the monitoring board 20 to be detected after the +15v pulse signal is input to the monitoring board 20 to be detected, the positive voltage monitoring function of the monitoring board 20 to be detected is judged to reach the standard. Corresponding to the negative voltage monitoring function, the monitoring board 20 to be detected is powered from the outside first, a voltage driving signal is input, and the test signal is a pulse signal of-15V. Corresponding to the thyristor breakdown voltage monitoring function, the test signal is a +25V pulse signal, and the +25V pulse signal can simulate the voltage when the thyristor is broken down, and can output a corresponding optical pulse signal according to whether the monitoring board 20 to be detected can output or not, so that whether the thyristor breakdown voltage monitoring function of the monitoring board 20 to be detected meets the standard is judged.
The acquisition device 30 is connected with the signal generating device 10, the output end 22 of the monitoring board to be detected and a plurality of nodes 21 to be detected in the monitoring board to be detected 20, and is used for determining the working state of the monitoring board to be detected 20 according to the test signal and the optical pulse signal output by the monitoring board to be detected 20 after receiving the test signal, and sequentially acquiring waveform signals of the nodes 21 to be detected when the monitoring board to be detected 20 is in the working state.
Specifically, the operation state of the monitor board 20 to be detected corresponds to the function to be verified, and the operation state includes one of a positive voltage monitor state, a negative voltage monitor state, and a thyristor breakdown voltage monitor state. When the test signal of the corresponding function to be verified is input, the monitor board 20 to be detected will operate in the corresponding working state, for example, the input test signal is a voltage driving signal corresponding to the positive voltage monitoring function and a pulse signal of +15v, and the monitor board 20 to be detected will operate in the positive voltage monitoring state due to the input pulse signal of +15v.
Specifically, the acquisition device 30 acquires the test signal emitted by the signal generating device 10, so that when the value of the optical pulse signal output by the monitoring board 20 to be detected can be determined according to the test signal, the value represents what working state the monitoring board 20 to be detected is in, and the working state of the monitoring board 20 to be detected is determined according to the test signal and the optical pulse signal output by the monitoring board 20 to be detected. For example, assuming that the test signal is a +10v pulse signal and a voltage driving signal, the acquisition device 30 can expect the monitoring board to output a 0-5V light pulse signal, which represents that the monitoring board 20 to be detected is in a positive voltage monitoring state. At this time, if the obtained optical pulse signal output by the monitoring board to be detected 20 is actually within the 0-5V range, it can be determined that the monitoring board to be detected 20 is in the positive voltage monitoring state. Otherwise, it is determined that the monitoring board 20 to be detected is not in the positive voltage monitoring state.
Specifically, after determining the working state of the monitoring board 20 to be detected, the collecting device 30 may determine the period in which the monitoring board 20 to be detected is in the working state, and then sequentially acquire the waveform signals of the nodes 21 to be detected when the monitoring board 20 to be detected is in the working state, i.e. intercept the waveform of the period in which the waveform signals correspond to the working state. Thereby facilitating the subsequent judgment of whether the function corresponding to the working state of the monitoring board 20 to be detected reaches the standard or not according to the waveform signal of each node 21 to be detected in the working state of the corresponding monitoring board 20 to be detected. For example, when the acquisition device 30 determines that the time for which the monitoring board 20 to be detected is in the positive voltage monitoring state is 8 to 9 points, the acquisition device 30 sequentially acquires the waveform signals of the nodes 21 to be detected between 8 to 9 points, and the waveform signals of the nodes 21 to be detected acquired at this time are waveforms corresponding to the positive voltage monitoring state of the monitoring board 20 to be detected. Thereby facilitating subsequent analysis.
The processor 40 is connected to the acquisition device 30, and is configured to determine the health status of the monitoring board 20 to be detected according to the waveform signals of the nodes 21 to be detected when the monitoring board 20 to be detected is in the working state and the parameters of the monitoring board 20 to be detected.
Specifically, the processor 40 compares the waveform signals of each node 21 to be detected with corresponding waveform signals in the database, and compares the waveform signals of each node 21 to be detected with the corresponding multi-dimensional information such as the signal amplitude, the variation trend, the waveform correlation and the like of the standard waveform signals, so as to determine whether each node 21 to be detected of the monitoring board 20 to be detected is normal, and then presets corresponding weights for each node 21 to be detected, so that the health status of each node 21 to be detected can be quantified. Parameters of the monitoring board 20 to be detected include production date, installation place, working time length and historical fault information of the monitoring board 20 to be detected, and corresponding weights are set for the parameters. Finally, the health state of the monitoring board 20 to be detected can be comprehensively determined according to the numerical value and the corresponding weight of each evaluation factor.
In the present embodiment, by providing the signal generating device 10, it is possible to send a test signal to the monitoring board 20 to be detected, the test signal corresponding to the function to be verified. Thus, the actual working environment is simulated for the monitoring board 20 to be detected, and various functions of the monitoring board 20 to be detected can be verified conveniently. Through setting up collection system 30, can gather the light pulse signal that waits to detect monitoring board 20 output to according to the light pulse signal that waits to detect monitoring board 20 output and the test signal that signal generation device 10 sent, confirm the operating condition who waits to detect monitoring board 20, thereby be convenient for follow-up collection corresponding wave form signal. After the working state of the monitoring board 20 to be detected is determined, waveform signals at the nodes 21 to be detected are sequentially obtained, so that when the monitoring board 20 to be detected works in a certain state, the waveform signals at the corresponding nodes 21 to be detected are obtained. By setting the processor 40, it is able to determine whether the function to be verified corresponding to the current working state of the monitoring board 20 to be detected is normal according to the waveform signal of each node 21 to be detected in the working state of the monitoring board 20 to be detected and the parameters of the monitoring board 20 to be detected, and after determining whether each function to be verified of the monitoring board 20 to be detected is normal, it is able to further comprehensively determine the health state of the monitoring board 20 to be detected, thereby realizing the prediction of the life of the monitoring board 20 to be detected.
In one embodiment, as shown in FIG. 2, the acquisition device 30 includes: the device comprises a node switching module 31, a photoelectric conversion module 32 and a waveform acquisition module 33. Wherein:
the node switching module 31 comprises a plurality of signal input ports and a signal output port, the plurality of signal input ports of the node switching module 31 are respectively connected with a plurality of nodes 21 to be detected of the monitoring board 20 to be detected in a one-to-one correspondence manner, and a control end of the node switching module 31 is connected with the processor 40 and is used for sequentially conducting the channels between the signal input ports and the signal output ports under the control of the processor 40.
Specifically, the node switching module 31 is a channel selection switch, and can select a corresponding channel to be conducted according to a control instruction of the processor 40, and sequentially conduct paths between each signal input port and each signal output port in a time-sharing sampling manner, so as to collect waveform signals of each node 21 to be detected.
Illustratively, the node switch module 31 is a 16-channel selector with a bandwidth of 100M or more.
As shown in fig. 3, the node switching module 31 includes a plurality of signal input ports 310, a signal output port 313, a plurality of filtering units 311, a multi-channel relay module 312, a status feedback circuit 314, a driving circuit 315, a power supply module 316, a main control chip 317, and a network communication interface 318, wherein the plurality of filtering units 311 are connected to the plurality of signal input ports 310 in a one-to-one correspondence manner, the signal input ports are also connected to the filtering units 311, the multi-channel relay module 312 is respectively connected to the filtering units 311, the status feedback circuit 314, and the driving circuit 315, the status feedback circuit 314, and the main control chip 317 is respectively connected to the power supply module 316, the driving circuit 315, the status feedback circuit 314, and the network communication interface 318. The filtering unit 311 is configured to perform filtering processing on the waveform signal input by the corresponding node to be detected 21. The multi-channel relay module 312 is used for gating the corresponding channel under the driving of the driving circuit 315. The status feedback circuit 314 is configured to feed back the channel gated by the multi-channel relay module 312 to the main control chip 317. The power supply module 316 is used for supplying power to the main control chip 317. The network communication interface 318 is used to implement communication interaction between the main control chip 317 and the processor 40.
The photoelectric conversion module 32 is connected to the output end 22 of the monitoring board to be detected, and is configured to convert the optical pulse signal output by the monitoring board to be detected 20 into a feedback signal.
Specifically, the photoelectric conversion module 32 can convert the optical pulse signal into a pulse electric signal of a fixed voltage, thereby facilitating subsequent processing.
The waveform acquisition module 33 is respectively connected with the signal generating device 10, the signal output port of the node switching module 31 and the photoelectric conversion module 32, and is configured to determine the working state of the monitoring board 20 to be detected according to the test signal and the feedback signal, and acquire the waveform signal of the target node 21 to be detected, where the target node 21 to be detected corresponds to the signal input port that is currently turned on.
Specifically, the waveform acquisition module 33 determines the working state of the monitoring board 20 to be detected according to the feedback signal and the test signal, and acquires the waveform signal of the corresponding node 21 to be detected.
Specifically, the waveform collection module 33 is further configured to align and normalize the collected waveform signals of the nodes 21 to be detected corresponding to the same working state of the monitoring board 20 to be detected. The waveform signals of the nodes 21 to be detected of the monitoring board 20 to be detected in the same working state are aligned and synchronized based on time base, so that comparison is facilitated, and whether the nodes are correct or not is conveniently analyzed. And the time is normalized, so that each waveform signal is conveniently limited in a certain range, and adverse effects caused by singular waveform data are eliminated.
Illustratively, the waveform acquisition module 33, after sampling the waveform signal, performs analog-to-digital conversion on the waveform signal, then performs signal separation, then buffers the obtained data, performs waveform conditioning and trigger calculation on the signal, thus obtaining the required data, and then saves the data for transmission to the processor 40 through the communication interface.
In the present embodiment, by setting the node switching module 31, acquisition of waveform signals of different nodes 21 to be detected can be achieved. By providing the photoelectric conversion module 32, the optical pulse signal can be converted into an electrical signal, thereby facilitating subsequent processing. By providing the waveform acquisition module 33, waveform signals corresponding to the working state of the monitoring board 20 to be detected can be acquired, so that whether the function of the monitoring board 20 to be detected is correct or not can be analyzed conveniently.
In one embodiment, as shown in fig. 4, the signal generating apparatus 10 includes: the voltage source 11 and the pulse generation module 12 are connected with the power port of the monitoring board 20 to be detected, and the pulse generation module 12 is connected with the input end of the monitoring board 20 to be detected.
A voltage source 11 for supplying power to the monitoring board 20 to be tested.
Specifically, the frequency and the amplitude of the voltage signal output by the voltage source 11 are both corresponding preset values.
The voltage source 11 is a low-voltage ac voltage source 11, and is a programmable voltage source 11 with a network communication function, the frequency range of the output ac voltage can be set to 45-60Hz, the amplitude of the ac voltage is 0-300V, and the amplitude, frequency and output time of the output voltage can be adjusted by programming instructions, so that a stable voltage input can be provided for the to-be-detected monitoring board 20, and the stable voltage input can be used as a working energy source of the to-be-detected monitoring board 20.
The pulse generating module 12 is configured to output a test signal to verify each function to be verified of the monitor board 20 to be detected.
Specifically, the test signal is a pulse signal with a preset pulse width and a preset amplitude. The pulse generating module 12 is also connected with the waveform collecting module 33, and sends the test signal to the waveform collecting module 33 at the same time, so that the waveform collecting module 33 can conveniently judge the working state of the monitoring board 20 to be detected.
For example, the pulse generation module 12 may output a positive pulse signal or a negative pulse signal, and the amplitude and pulse width of the output pulse signal may be adjusted. The pulse generating module 12 is connected to the dc voltage equalizing port of the monitoring board 20 to be detected, and is used as a trigger signal for the monitoring board 20 to be detected to come in or go out of the corresponding pulse signal of the function to be verified.
Specifically, the functions to be verified of the monitor board 20 to be detected include a positive voltage monitor function, a negative voltage monitor function, a thyristor breakdown voltage monitor function. The monitoring board 20 to be tested works as follows:
Detection of positive voltage monitoring function/negative voltage monitoring function of the monitoring board to be detected 20: the method comprises the steps of acquiring an optical pulse signal output by the monitoring board 20 to be detected when the monitoring board is subjected to positive/negative voltage, recording a corresponding voltage value, comparing the recorded optical pulse voltage value with engineering design parameters of the monitoring board 20 to be detected, and judging whether the pulse width and the wavelength amplitude of the optical pulse signal meet the requirements or not to determine whether the positive voltage monitoring function/the negative voltage monitoring function are normal or not.
Detection of the monitoring function of the breakdown voltage of the thyristor of the monitoring board 20 to be detected: the voltage source 11 is adopted to apply overvoltage protection action voltage values (generally 7200V) exceeding the design of the monitoring board 20 to be detected at two ends of the monitoring board 20 to be detected, so as to obtain the light pulse signals output by the monitoring board 20 to be detected at the moment, if the pulse signals are detected in the overvoltage protection action voltage interval designed by the monitoring board 20 to be detected, the function is normal, otherwise, the function is abnormal.
In this embodiment, by setting the voltage source 11, enough energy can be provided for the operation of the to-be-detected monitoring board 20, so as to facilitate the test and verification of the to-be-detected monitoring board 20, and by setting the pulse generating module 12, a test signal can be output to the to-be-detected monitoring board 20, so as to simulate the actual working state of the to-be-detected monitoring board 20, thereby testing various functions of the to-be-detected monitoring board 20.
In one embodiment, as shown in fig. 5, the signal generating device 10 further includes: a phase adjustment module 13.
The phase adjustment module 13 is disposed between the voltage source 11 and the pulse generation module 12 and the monitoring board 20 to be detected, and is respectively connected to a power port of the monitoring board 20 to be detected, an input end of the monitoring board 20 to be detected, the voltage source 11, and the pulse generation module 12, and is configured to respectively adjust phases of the voltage signal and the test signal so that a phase difference between the voltage signal and the test signal is a preset phase difference, and transmit the adjusted voltage signal to the power port of the monitoring board 20 to be detected, and transmit the adjusted test signal to the input end of the monitoring board 20 to be detected.
Specifically, the phase adjustment module 13 can adjust the phases of the voltage signal and the test signal respectively, and can synchronize them for transmission, for example, the phase adjustment module 13 detects the phase of the voltage signal, and when the phase of the voltage signal reaches a set value, the test signal is output in synchronization, so as to facilitate the accuracy of the subsequent test result, and simulate the input condition of the to-be-detected monitoring board 20 in practice. Secondly, the phase adjustment module 13 can also adjust the phase difference between the voltage signal and the test signal to a preset phase difference, so as to simulate the input condition of the monitoring board 20 to be detected, which may be encountered in practice. The function of the monitoring board 20 to be detected under various working environments is further tested.
In this embodiment, by setting the phase adjustment module 13, various phase differences of different input signals can be simulated for the to-be-detected monitoring board 20, so as to simulate various inputs that the to-be-detected monitoring board 20 may receive in practice, perform a more complete test on the to-be-detected monitoring board 20, and improve the reliability of the to-be-detected monitoring board 20.
In one embodiment, as shown in fig. 6, the thyristor voltage monitor board detection system further comprises: impedance measuring device 50.
The impedance measuring device 50 is connected to the processor 40 and a preset port of the monitoring board 20 to be detected, and is used for measuring an equivalent impedance value of the preset port of the monitoring board 20 to be detected under a preset condition, and transmitting the equivalent impedance value to the processor 40.
Specifically, the impedance measuring device 50 measures the impedance of the preset port by adopting an equivalent network impedance test mode and adopting an ac mode and a dc mode respectively. For example, a dc voltage is applied to the monitor board 20 to be detected, an equivalent resistance of a dc voltage equalizing port of the monitor board 20 to be detected is tested, an ac voltage of 1kHz is applied to the monitor board 20 to be detected, an equivalent capacitance, resistance and capacitance angle of an ac power supply port of the monitor board 20 to be detected are measured, and a capacitance angle is calculated.
The processor 40 is further configured to determine the health status of the monitoring board 20 to be detected according to the waveform signals of the nodes 21 to be detected when the monitoring board 20 to be detected is in the working status, the parameters of the monitoring board 20 to be detected, and the equivalent impedance value of the preset port of the monitoring board 20 to be detected under the preset condition.
Specifically, the processor 40 includes health status determining software of the monitoring board 20 to be detected, and the software includes a man-machine interaction module, an information acquisition module, an automation test module, a flow editing module, a data presentation module, a data storage module, and a data analysis module. The man-machine interaction module is used for carrying out operation interaction between personnel and the software, can receive operation instructions of the user, executes corresponding actions according to the operation instructions, and feeds back the actions to the user in a visual mode. The information collection module is used for recording relevant information of the monitoring board 20 to be detected, including but not limited to production date, installation site, working time, and historical fault information of the monitoring board 20 to be detected, and providing original information for subsequent analysis. The automatic test module can send out control instructions according to a given test flow, control the voltage source 11 and the pulse generation module 12 to apply different stresses to the monitoring board 20 to be detected, collect signal waveforms of key nodes, automatically switch the nodes 21 to be detected, input automatic test signals and collect and output in real time. The flow editing module is capable of editing a test flow, and switching the test to-be-detected monitoring board 20 and the test method, including setting corresponding input parameters, outputting signal positions, and the like. The data presentation module, the data storage module and the data analysis module can present, store and analyze the test result to give the health status of the monitoring board 20 to be detected. The processor 40 comprehensively determines the health status of the monitoring board 20 to be detected according to the production date, the installation site, the working time, the historical fault information, the impedance value of the preset port and the waveform signals of the plurality of nodes 21 to be detected. Each parameter is provided with a corresponding standard value, and the health state of the monitoring board 20 to be detected can be comprehensively determined according to the error between each parameter and the corresponding standard value and the preset weight corresponding to each parameter.
In this embodiment, by providing the impedance measuring device 50, the impedance of the preset port on the monitoring board 20 to be detected can be measured, so as to provide a parameter input for the subsequent determination of the health status of the monitoring board 20 to be detected by the processor 40. The processor 40 comprehensively determines the health status of the monitoring board 20 to be detected according to the parameters, the impedance and the waveform signals of the monitoring board 20 to be detected, so that the health status of the monitoring board 20 to be detected can be accurately determined.
In one embodiment, as shown in fig. 7, the thyristor voltage monitor board detection system further comprises: isolating the power supply 60.
The input end of the isolation power supply 60 is used for being connected with the mains supply, and the output end of the isolation power supply 60 is respectively connected with the signal generating device 10, the acquisition device 30 and the processor 40 and is used for respectively supplying power to the signal generating device 10, the acquisition device 30 and the processor 40.
Specifically, the isolation power supply 60 can filter the mains supply to remove noise in the mains supply, has a signal isolation function, and can ensure that no noise exists in the power supply voltage.
In this embodiment, by setting the isolation power supply 60, interference signals possibly existing in the power supply voltage are removed, and the accuracy of the result of determining the health status of the monitoring board 20 to be detected later is improved.
In one embodiment, as shown in fig. 8, there is provided a method for detecting a thyristor voltage monitoring board, including:
step S800, sending a test signal of the function to be verified to the monitoring board to be detected.
Step S820, obtaining the optical pulse signal output by the monitoring board to be detected after receiving the test signal.
Step S840, according to the test signal and the optical pulse signal, determining the working state of the monitoring board to be detected.
Step S860, respectively acquiring waveform signals of each node to be detected when the monitoring board to be detected is in a working state.
Specifically, the working state of the monitoring board to be detected corresponds to the function to be verified, and the working state comprises one of a positive voltage monitoring state, a negative voltage monitoring state and a thyristor breakdown voltage monitoring state.
Step S880, determining the health state of the monitoring board to be detected according to the waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state and the parameters of the monitoring board to be detected.
In this embodiment, a test signal is sent to the monitor board to be detected, where the test signal corresponds to the function to be verified. Therefore, an actual working environment is simulated for the monitoring board to be detected, and various functions of the monitoring board to be detected can be verified conveniently. And acquiring the optical pulse signals output by the monitoring board to be detected, and determining the working state of the monitoring board to be detected according to the optical pulse signals output by the monitoring board to be detected and the test signals sent by the signal generating device, so that the corresponding waveform signals can be acquired conveniently. After the working state of the monitoring board to be detected is determined, waveform signals of all nodes to be detected are sequentially obtained, so that when the monitoring board to be detected works in a certain state, the waveform signals of all corresponding nodes to be detected are obtained. According to the waveform signals of the nodes to be detected of the monitoring board to be detected in the working state and the parameters of the monitoring board to be detected, whether the function to be verified corresponding to the current working state of the monitoring board to be detected is normal or not can be determined, after whether the function to be verified of the monitoring board to be detected is normal or not is determined, the health state of the monitoring board to be detected can be further comprehensively determined, and accordingly prediction of the service life of the monitoring board to be detected is achieved.
It should be understood that, although the steps in the flowchart of fig. 8 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not strictly limited to the order of execution unless explicitly recited herein, and the steps may be executed in other orders. Moreover, at least a portion of the steps in fig. 8 may include a plurality of steps or stages that are not necessarily performed at the same time, but may be performed at different times, and the order of execution of the steps or stages is not necessarily sequential, but may be performed in rotation or alternately with at least a portion of the steps or stages in other steps or other steps.
Those skilled in the art will appreciate that implementing all or part of the above described methods may be accomplished by way of a computer program stored on a non-transitory computer readable storage medium, which when executed, may comprise the steps of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in embodiments provided herein may include at least one of non-volatile and volatile memory. The nonvolatile Memory may include Read-Only Memory (ROM), magnetic tape, floppy disk, flash Memory, optical Memory, or the like. Volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory. By way of illustration, and not limitation, RAM can be in various forms such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc.
In the description of the present specification, reference to the terms "some embodiments," "other embodiments," "desired embodiments," and the like, means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.
The technical features of the above embodiments may be arbitrarily combined, and all possible combinations of the technical features in the above embodiments are not described for brevity of description, however, as long as there is no contradiction between the combinations of the technical features, they should be considered as the scope of the description.
The above examples illustrate only a few embodiments of the application, which are described in detail and are not to be construed as limiting the scope of the application. It should be noted that it will be apparent to those skilled in the art that several variations and modifications can be made without departing from the spirit of the application, which are all within the scope of the application. Accordingly, the scope of protection of the present application is to be determined by the appended claims.

Claims (7)

1. A thyristor voltage monitor board detection system, comprising:
the signal generating device is connected with the input end of the monitoring board to be detected and is used for sending a test signal of the function to be verified to the monitoring board to be detected;
The acquisition device is connected with the signal generation device, the output end of the monitoring board to be detected and a plurality of nodes to be detected in the monitoring board to be detected, and is used for determining the working state of the monitoring board to be detected according to the test signal and the optical pulse signal output by the monitoring board to be detected after the monitoring board to be detected receives the test signal, and sequentially acquiring waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state, wherein the working state of the monitoring board to be detected corresponds to the function to be verified, and the working state comprises one of a positive voltage monitoring state, a negative voltage monitoring state and a thyristor breakdown voltage monitoring state;
the acquisition device comprises:
The node switching module comprises a plurality of signal input ports and a signal output port, the plurality of signal input ports of the node switching module are respectively connected with a plurality of nodes to be detected of the monitoring board to be detected in a one-to-one correspondence manner, and the control end of the node switching module is connected with the processor and is used for sequentially conducting the passages between the signal input ports and the signal output ports under the control of the processor;
The photoelectric conversion module is connected with the output end of the monitoring board to be detected and is used for converting the optical pulse signal output by the monitoring board to be detected into a feedback signal;
The waveform acquisition module is respectively connected with the signal generation device, the signal output port of the node switching module and the photoelectric conversion module, and is used for determining the working state of the monitoring board to be detected according to the test signal and the feedback signal, acquiring waveform signals of target nodes to be detected, aligning the acquired waveform signals of the nodes to be detected corresponding to the same working state of the monitoring board to be detected, and carrying out normalization processing, wherein the target nodes to be detected correspond to the signal input ports which are conducted currently;
The impedance measuring device is connected with the preset port of the monitoring board to be detected, and is used for measuring the equivalent impedance value of the preset port of the monitoring board to be detected under the preset condition and transmitting the equivalent impedance value to the processor;
And the processor is respectively connected with the acquisition device and the impedance measurement device and is used for determining the health state of the monitoring board to be detected according to the waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state and the parameters of the monitoring board to be detected, and the equivalent impedance value of the preset port of the monitoring board to be detected under the preset condition.
2. The system of claim 1, wherein the node switch module further comprises:
The filtering units are connected with the signal input ports in a one-to-one correspondence manner and are used for filtering waveform signals input by the corresponding signal input ports.
3. The system of claim 1, wherein the signal generating means comprises: the device comprises a voltage source and a pulse generation module, wherein the voltage source is connected with a power port of the monitoring board to be detected, and the pulse generation module is connected with an input end of the monitoring board to be detected;
the voltage source is used for supplying power to the monitoring board to be detected, wherein the frequency and the amplitude of the voltage signal output by the voltage source are both corresponding preset values;
The pulse generation module is used for outputting the test signal to verify each function to be verified of the monitoring board to be detected, wherein the test signal is a pulse signal with preset pulse width and preset amplitude.
4. A system according to claim 3, wherein the signal generating means further comprises:
the phase adjustment module is arranged between the voltage source and the pulse generation module and the monitoring board to be detected, is respectively connected with a power port of the monitoring board to be detected, an input end of the monitoring board to be detected, the voltage source and the pulse generation module, and is used for respectively adjusting the phase of the voltage signal and the phase of the test signal so that the phase difference of the voltage signal and the phase of the test signal is a preset phase difference, transmitting the adjusted voltage signal to the power port of the monitoring board to be detected and transmitting the adjusted test signal to the input end of the monitoring board to be detected.
5. The system of any one of claims 1-4, wherein the system further comprises:
The input end of the isolation power supply is used for being connected with the mains supply, and the output end of the isolation power supply is respectively connected with the signal generating device, the acquisition device and the processor and is used for respectively supplying power to the signal generating device, the acquisition device and the processor.
6. The system of any of claims 1-4, wherein the function to be verified of the monitor board to be detected comprises one of a positive voltage monitor function, a negative voltage monitor function, a thyristor breakdown voltage monitor function.
7. A method for detecting a thyristor voltage monitoring board, which is applied to a thyristor voltage monitoring board detection system according to any one of claims 1 to 6, the method comprising:
sending a test signal of a function to be verified to a monitoring board to be detected;
acquiring an optical pulse signal output by the monitoring board to be detected after receiving the test signal;
determining the working state of the monitoring board to be detected according to the test signal and the optical pulse signal;
Respectively acquiring waveform signals of each node to be detected when the monitoring board to be detected is in the working state, wherein the working state of the monitoring board to be detected corresponds to the function to be verified, and the working state comprises one of a positive voltage monitoring state, a negative voltage monitoring state and a thyristor breakdown voltage monitoring state;
And determining the health state of the monitoring board to be detected according to the waveform signals of the nodes to be detected when the monitoring board to be detected is in the working state and the parameters of the monitoring board to be detected.
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