CN109613418A - Thyristor valves high potential board test device and test method - Google Patents
Thyristor valves high potential board test device and test method Download PDFInfo
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- CN109613418A CN109613418A CN201910001208.8A CN201910001208A CN109613418A CN 109613418 A CN109613418 A CN 109613418A CN 201910001208 A CN201910001208 A CN 201910001208A CN 109613418 A CN109613418 A CN 109613418A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
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- General Engineering & Computer Science (AREA)
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- Microelectronics & Electronic Packaging (AREA)
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- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of thyristor valves high potential board test device and test method, which includes: thyristor test fixture, waveform generating unit, waveform acquisition unit, man-machine interaction unit and the control unit of at least one high potential board；Man-machine interaction unit is for receiving board selection instruction；Control unit is used for according to board selection instruction, control waveform generating unit generates the corresponding pumping signal of high potential board to be measured, and control the corresponding thyristor test fixture of high potential board to be measured and connect with high potential board to be measured, to test high potential board to be measured；Waveform acquisition unit is used to acquire the various signal waveforms in high potential board test process to be measured；Wherein, control unit is also used to be analyzed and processed the various signal waveforms in high potential board test process to be measured, obtains test result, and controls man-machine interaction unit and show test result.The purpose tested a plurality of types of high potential boards may be implemented in the present invention.
Description
Technical field
The present invention relates to field of power system more particularly to a kind of thyristor valves high potential board test device and surveys
Method for testing.
Background technique
This part intends to provides background or context for the embodiment of the present invention stated in claims.Description herein
Recognize it is the prior art not because not being included in this section.
Converter valve is the core equipment that high-voltage dc transmission goes out engineering, and converter valve uses modularized design, by multiple thyristors
It is composed in series.Every grade of thyristor is required to be equipped with a high potential board, thus, the detection of high potential board is converter station maintenance
With an important process in change of current valve system malfunction elimination.Currently, existing high potential board detection mode is by artificial
Each high potential board is detected manually, due to requiring about thousands of pieces boards of test due to each engineering, and it is every
Block board requires to record a large amount of data, so the time for usually requiring to expend some months of testing of board could complete, and
And this long-term duplicate work of dullness can also make personnel tired, so as to cause manual operation fault, there are personnel safeties and production
Quality hidden danger.
And existing some change of current valve testers can only test the high potential board of a certain type (for example, TCU converter valve is surveyed
Examination instrument detects TCU board), do not have versatility.
Summary of the invention
The embodiment of the present invention provides a kind of thyristor valves high potential board test device, to solve the prior art only
It is able to achieve and the technical issues of test leads to poor universality is carried out to the high potential plate of single type, which includes: at least one
Thyristor test fixture, waveform generating unit, waveform acquisition unit, man-machine interaction unit and the control unit of high potential board；
Wherein, man-machine interaction unit is for receiving board selection instruction, the type comprising high potential board to be measured in board selection instruction；
Control unit is connect with man-machine interaction unit, for controlling waveform generating unit and generating high electricity to be measured according to board selection instruction
The corresponding pumping signal of position board, and control the corresponding thyristor test fixture of high potential board to be measured and high potential plate to be measured
Card connection, to test high potential board to be measured；Waveform acquisition unit and high potential board to be measured and high potential plate to be measured
Block corresponding thyristor test fixture connection, for acquiring the various signal waveforms in high potential board test process to be measured；Its
In, control unit is also used to be analyzed and processed the various signal waveforms in high potential board test process to be measured, is surveyed
Test result, and control man-machine interaction unit and show test result.
The embodiment of the present invention also provides a kind of thyristor valves high potential board test method, and this method is applied to above-mentioned
Thyristor valves high potential board test device, can only realize high potential plate to single type to solve the prior art
The technical issues of test leads to poor universality is carried out, this method comprises: receiving board selection instruction, wherein board selection instruction
In include at least high potential board to be measured type；According to board selection instruction, export that high potential board to be measured is corresponding to swash
Encourage signal；Receive test instruction, wherein test instruction includes the finger tested at least one parameter of high potential board to be measured
It enables；Acquire the various signal waveforms in high potential board test process to be measured；To each in high potential board test process to be measured
Kind signal waveform is analyzed and processed, and obtains test result；Output test result.
In the embodiment of the present invention, a variety of high potential board classes are set on thyristor valves high potential board test device
The thyristor test fixture of type, by replacing corresponding thyristor test fixture, comes real when testing high potential board
The purpose that now different types of high potential board is tested.By man-machine interaction unit receiver board Card Type selection instruction,
Corresponding pumping signal is generated by waveform generating unit, and high potential plate to be measured is applied to by respective thyristor test fixture
On card, the various waveform signals in high potential plate test process to be measured are then acquired by waveform acquisition unit, to collecting
Signal be analyzed and processed after, then test result shown by man-machine interaction unit.
The embodiment of the invention provides a kind of general thyristor valves high potential board detection devices, may be implemented to not
The technical effect of the global function detection of same type high potential board.
Detailed description of the invention
In order to more clearly explain the embodiment of the invention or the technical proposal in the existing technology, to embodiment or will show below
There is attached drawing needed in technical description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
Some embodiments of invention for those of ordinary skill in the art without creative efforts, can be with
It obtains other drawings based on these drawings.In the accompanying drawings:
Fig. 1 is a kind of high potential board test device of the thyristor valves provided in the embodiment of the present invention；
Fig. 2 is a kind of high potential board test method flow chart of the thyristor valves provided in the embodiment of the present invention.
Specific embodiment
Understand in order to make the object, technical scheme and advantages of the embodiment of the invention clearer, with reference to the accompanying drawing to this hair
Bright embodiment is described in further details.Here, the illustrative embodiments of the present invention and their descriptions are used to explain the present invention, but simultaneously
It is not as a limitation of the invention.
A kind of high potential board test device of thyristor valves is provided in the embodiment of the present invention, Fig. 1 is the present invention
The high potential board test device of a kind of thyristor valves provided in embodiment, as shown in Figure 1, the device includes: at least
A kind of thyristor test fixture 11 of high potential board, waveform generating unit 12, waveform acquisition unit 13, man-machine interaction unit 14
With control unit 15；
Wherein, man-machine interaction unit 14 includes high potential to be measured in board selection instruction for receiving board selection instruction
The type of board；
Control unit 15 is connect with man-machine interaction unit 14, for controlling waveform generating unit according to board selection instruction
12 generate the corresponding pumping signal of high potential board to be measured, and control the corresponding thyristor test fixture of high potential board to be measured
11 connect with high potential board 16 to be measured, to test high potential board 16 to be measured；
The thyristor test fixture corresponding with high potential board 16 to be measured and high potential board to be measured of waveform acquisition unit 13
11 connections, for acquiring the various signal waveforms in high potential board test process to be measured；
Wherein, control unit 15 is also used to analyze the various signal waveforms in high potential board test process to be measured
Processing, obtains test result, and controls man-machine interaction unit 14 and show test result.
It should be noted that above-mentioned thyristor test fixture includes but is not limited to any one or more following high potential plate
The test fixture of card: TCU (Thyristor Control Uint) board, TVM (Thyristor Voltage Monitor) plate
Card and TFM (Thyristor Firing Monitor) board.
Preferably, high potential board to be measured can be installed on thyristor test work by way of buckle, slot or clamping
Dress, to realize the purpose of quick-replaceable high potential board.
Further, the high potential board test device of thyristor valves provided in an embodiment of the present invention is using removable
Cabinet-type structure, so as to all tests of one achievable board alone.
The high potential board test device of thyristor valves provided in an embodiment of the present invention can be applied to high voltage direct current
Transmit electricity light-operated and automatically controlled converter valve high potential board global function test, according to the different type of high potential board to be measured, pass through
Different thyristor grade test fixtures is replaced, to complete the global function test according to high potential board to be measured.
Due in converter valve turn on thyristors need to satisfy two conditions:: 1. thyristor anode voltage be higher than cathode voltage；
2. gate circuit transistor gate receives trigger pulse.Thus, as an alternative embodiment, as shown in Figure 1, above-mentioned waveform occurs
Unit 12 may include: the first driving source U1 and the second driving source U2, and the first driving source U1, which is used to generate, is applied to thyristor two
The industrial frequency AC electric signal at end；Second driving source U2 be used for generates triggering turn on thyristors impact signal, thyristor for to
Survey the thyristor in the thyristor grade of high potential plate connection.First driving source U1 and the second driving source U2 can be by control units 15
Control generates respective pumping signal, as shown in figure 1 waveform control 1 and waveform control 2.
It should be noted that above-mentioned waveform acquisition unit is for acquiring following but being not limited to signal: the first driving source generates
Industrial frequency AC electric signal (waveform acquisition 1), the second driving source generate impact signal (waveform acquisition 2), high potential plate to be measured
Clamping receives the light return arteries and veins of light emitting pulse signal (waveform acquisition 3) from photoelectric conversion module, high potential board to be measured
Rush signal (waveform acquisition 5), the gate pulse signals (waveform acquisition that high potential board to be measured is generated according to light trigger pulse signal
4).The pumping signal that second driving source generates is electric signal, needs to be converted to light trigger signal by photoelectric conversion module, and lead to
Fibre optical transmission is crossed to high potential board, after high potential board receives light trigger signal, generation is led for triggering gate circuit transistor gate
Logical gate pulse signals.
As an alternative embodiment, above-mentioned man-machine interaction unit can be touch display screen.Operator can be with
Corresponding board type selection command or test instruction are inputted by the touch display screen, to realize corresponding function.
Optionally, a kind of high potential board test method of thyristor valves is additionally provided in the embodiment of the present invention, it should
Method is applied to that any one of the above is optional or the high potential board test device of preferred thyristor valves, such as following
Described in embodiment.The principle and the high potential board test device phase of thyristor valves solved the problems, such as due to this method embodiment
Seemingly, therefore the implementation of this method embodiment may refer to the implementation of device, and overlaps will not be repeated.
Fig. 2 is a kind of high potential board test method flow chart of the thyristor valves provided in the embodiment of the present invention,
As shown in Fig. 2, this method comprises the following steps:
S201 receives board selection instruction, wherein the class of high potential board to be measured is included at least in board selection instruction
Type；
S202 exports the corresponding pumping signal of high potential board to be measured according to board selection instruction；
S203 receives test instruction, wherein test instruction includes surveying to high potential board at least one parameter to be measured
The instruction of examination；
S204 acquires the various signal waveforms in high potential board test process to be measured；
S205 is analyzed and processed the various signal waveforms in high potential board test process to be measured, obtains test knot
Fruit；
S206 outputs test result.
It should be noted that the scheme that above-mentioned S201 to S206 is provided, can apply but be not limited to control list shown in FIG. 1
In member 15.In a kind of optional embodiment, the intelligent terminals remote control thyristor converter such as mobile phone, tablet computer can also be passed through
The high potential board test device of valve, the then scheme that above-mentioned S201 to S206 is provided can execute on these intelligent terminals.
As the first optional embodiment, in the case that above-mentioned high potential board to be measured is TCU board, above-mentioned survey
Examination instruction may include to the instruction that at least one parameter is tested as follows of TCU board: light-receiving pulse width, light emitting arteries and veins
Rush that width, take can voltage, gate pulse width, forward voltage foundation value, negative voltage foundation value, overvoltage protection value and reversed extensive
Multiple phase protection value.
As the first optional embodiment, in the case that above-mentioned high potential board to be measured is TVM board, above-mentioned survey
Examination instruction may include to the instruction that at least one parameter is tested as follows of TVM board: forward voltage foundation value, forward voltage
It establishes return pulse width, backward voltage foundation value, backward voltage and establishes return pulse width, overvoltage action value and overvoltage
Movement return pulse width.
As the first optional embodiment, in the case that above-mentioned high potential board to be measured is TFM board, above-mentioned survey
Examination instruction may include to the instruction that at least one parameter is tested as follows of TFM board: light-receiving pulse width, light emitting arteries and veins
Rush that width, take can voltage, gate pulse width, forward voltage foundation value, negative voltage foundation value, overvoltage protection value and reversed extensive
Multiple phase protection value.
In conclusion thyristor valves high potential board test device provided in an embodiment of the present invention has versatility,
The waste that resource distribution can be reduced, by thyristor test fixture, waveform generating unit, waveform acquisition unit, human-computer interaction list
Member and control unit are integrated into an equipment, and integrated level is high, using removable cabinet-type structure, so that one can complete not
The global function of same type high potential board is tested.
It should be understood by those skilled in the art that, the embodiment of the present invention can provide as method, system or computer program
Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the present invention
Apply the form of example.Moreover, it wherein includes the computer of computer usable program code that the present invention, which can be used in one or more,
The computer program implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) produces
The form of product.
The present invention be referring to according to the method for the embodiment of the present invention, the process of equipment (system) and computer program product
Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions
The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs
Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real
The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates,
Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or
The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one
The step of function of being specified in a box or multiple boxes.
Particular embodiments described above has carried out further in detail the purpose of the present invention, technical scheme and beneficial effects
Describe in detail it is bright, it should be understood that the above is only a specific embodiment of the present invention, the guarantor being not intended to limit the present invention
Range is protected, all within the spirits and principles of the present invention, any modification, equivalent substitution, improvement and etc. done should be included in this
Within the protection scope of invention.
Claims (10)
1. a kind of thyristor valves high potential board test device characterized by comprising at least one high potential board
Thyristor test fixture, waveform generating unit, waveform acquisition unit, man-machine interaction unit and control unit；
Wherein, the man-machine interaction unit includes high electricity to be measured in the board selection instruction for receiving board selection instruction
The type of position board；
Described control unit is connect with the man-machine interaction unit, for controlling the waveform according to the board selection instruction
Generating unit generates the corresponding pumping signal of the high potential board to be measured, and it is corresponding to control the high potential board to be measured
Thyristor test fixture is connect with the high potential board to be measured, to test the high potential board to be measured；
Waveform acquisition unit thyristor test corresponding with the high potential board to be measured and the high potential board to be measured
Tooling connection, for acquiring the various signal waveforms in the high potential board test process to be measured；
Wherein, described control unit is also used to divide the various signal waveforms in the high potential board test process to be measured
Analysis processing, obtains test result, and controls the man-machine interaction unit and show test result.
2. high potential board test device as described in claim 1, which is characterized in that the waveform generating unit includes:
One driving source and the second driving source, first driving source is for generating the industrial frequency AC electric signal for being applied to thyristor both ends；
Second driving source is for generating the impact signal for triggering the turn on thyristors, and the thyristor is and the height to be measured is electric
Thyristor in the thyristor grade of position plate connection.
3. high potential board test device as claimed in claim 2, which is characterized in that the waveform acquisition unit is for acquiring
Following at least one signal: the impact of industrial frequency AC electric signal, second driving source generation that first driving source generates
Signal, the high potential board to be measured receive light emitting pulse signal, the high potential to be measured from photoelectric conversion module
The gate pulse signals that light return pulse signal, the high potential board to be measured of board are generated according to light trigger pulse signal.
4. high potential board test device as described in claim 1, which is characterized in that the man-machine interaction unit is to touch to show
Display screen.
5. high potential board test device as described in claim 1, which is characterized in that the high potential board test device is adopted
With removable cabinet-type structure.
6. high potential board test device as claimed in claim 1 to 5, which is characterized in that the thyristor tests work
Dress includes the test fixture of following at least one high potential board: TCU board, TVM board and TFM board.
7. a kind of thyristor valves high potential board test method, which is characterized in that this method is applied to claim 1 to 6
Any thyristor valves high potential board test device, comprising:
Receive board selection instruction, wherein the type of high potential board to be measured is included at least in the board selection instruction；
According to the board selection instruction, the corresponding pumping signal of the high potential board to be measured is exported；
Receive test instruction, wherein the test instruction includes surveying to the high potential board at least one parameter to be measured
The instruction of examination；
Acquire the various signal waveforms in the high potential board test process to be measured；
Various signal waveforms in the high potential board test process to be measured are analyzed and processed, test result is obtained；
Export the test result.
8. high potential board test method as claimed in claim 7, which is characterized in that be in the high potential board to be measured
In the case where TCU board, the test instruction includes to the TCU board instruction that at least one parameter is tested as follows:
Light-receiving pulse width, light emitting pulse width take energy voltage, gate pulse width, forward voltage foundation value, negative voltage to establish
Value, overvoltage protection value and recovery protection firing value.
9. high potential board test method as claimed in claim 7, which is characterized in that be in the high potential board to be measured
In the case where TVM board, the test instruction includes to the TVM board instruction that at least one parameter is tested as follows:
Forward voltage foundation value, forward voltage foundation return pulse width, backward voltage foundation value, backward voltage foundation return pulse are wide
Degree, overvoltage action value and overvoltage movement return pulse width.
10. high potential board test method as claimed in claim 7, which is characterized in that be in the high potential board to be measured
In the case where TFM board, the test instruction includes to the TFM board instruction that at least one parameter is tested as follows:
Light-receiving pulse width, light emitting pulse width take energy voltage, gate pulse width, forward voltage foundation value, negative voltage to establish
Value, overvoltage protection value and recovery protection firing value.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910001208.8A CN109613418A (en) | 2019-01-02 | 2019-01-02 | Thyristor valves high potential board test device and test method |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910001208.8A CN109613418A (en) | 2019-01-02 | 2019-01-02 | Thyristor valves high potential board test device and test method |
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| CN109613418A true CN109613418A (en) | 2019-04-12 |
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| CN201910001208.8A Pending CN109613418A (en) | 2019-01-02 | 2019-01-02 | Thyristor valves high potential board test device and test method |
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Cited By (4)
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| CN112345916A (en) * | 2020-10-26 | 2021-02-09 | 西安西电电力***有限公司 | High-potential board card test system and test method |
| CN112415354A (en) * | 2020-10-15 | 2021-02-26 | 许继集团有限公司 | Method for detecting thyristor-level unit of alternating-current energy-consumption converter valve |
| CN114966359A (en) * | 2022-05-17 | 2022-08-30 | 中国南方电网有限责任公司超高压输电公司广州局 | Thyristor test method, device, computer equipment, storage medium and product |
| WO2024011801A1 (en) * | 2022-07-14 | 2024-01-18 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | Thyristor voltage monitoring board testing system and method |
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Application publication date: 20190412 |