CN114882937A - Solid state disk durability testing method, sample amount calculating method and device - Google Patents
Solid state disk durability testing method, sample amount calculating method and device Download PDFInfo
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Abstract
The invention relates to the field of durability test of solid state disks, and particularly discloses a method and a device for testing the durability of a solid state disk, and a method and a device for calculating sample quantity, wherein the method comprises the steps of extracting the functional failure rate and the uncorrectable error rate of the solid state disk; establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function; determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size; substituting the upper limit of confidence control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity; and selecting the larger sample size from the first sample size and the second sample size as the test sample size. The invention can improve the accuracy and efficiency of testing sample amount while ensuring the testing quality, thereby remarkably saving the research and development cost.
Description
Technical Field
The invention relates to the field of durability testing of solid state disks, in particular to a method and a device for testing the durability of a solid state disk and a method and a device for calculating sample quantity.
Background
Flash NAND, the basic memory cell is a floating gate transistor, the structure of which is the lowest of a substrate, a source and a drain. On the substrate, there are tunnel oxide layer, Floating Gate layer, oxide layer and control Gate. The floating gate in the middle is surrounded by the insulating layer, electrons are easy to enter and difficult to exit, and the transistor is written and erased by charging and discharging the electrons to the floating gate. The electrons stored therein do not disappear due to power loss, so the flash memory is a non-volatile memory.
Flash NAND erasing principle:
1) in writing, positive voltage is applied to the control gate, so that electrons pass through the tunnel oxide layer to reach the floating gate and are gathered on the floating gate to store information.
2) During erasing, positive voltage is applied to the substrate for a long time to absorb electrons from the floating gate, so that the information is removed. If there are electrons before writing, it is necessary to erase before writing.
3) The electrons can irreversibly wear the tunnel oxide layer during repeated back and forth passes, making it ineffective in retaining the charge in the floating gate and eventually failing.
In the process of continuous and repeated erasing, the durability or reliability of the SSD Flash medium is gradually reduced. It is generally verified by a huge sample size test whether the durability of SSD products can meet the quality requirements.
The conventional method for determining the SSD endurance test sample size generally estimates the test sample size through FFR and AFR. Generally, after 5 years of warranty in SSD products, AFR = FFR/5. Typically, FFR =2.19%, then AFR = 2.19%/5= 0.44%. That is, 1000 disks fail in not more than 4 disks within 1 year, the durability of the SSD is considered to be satisfactory. From the above estimation, 1000 blocks are determined as the sample size of the test.
The cost of testing 1000 SSD disks is significant, including labor and material costs. Even halving, 400 disks is a significant capital investment. Because the durability is tested, the test disc reaches the end of life, and can only be scrapped and cannot be used for other purposes.
Therefore, a method for accurately calculating the test sample size and a corresponding method for testing the durability of the solid state disk are needed, and unnecessary cost investment is reduced on the premise of ensuring the quality.
Disclosure of Invention
In order to solve the above problems, the present invention provides a method for testing the endurance of a solid state disk, a method for calculating the sample size, and a device thereof, which accurately calculate the sample size and reduce the testing cost by introducing a set of relational models including influence factors such as uncorrectable error rate, functional errors, and UCL function values of data errors.
In a first aspect, a technical solution of the present invention provides a method for calculating a sample amount for a solid state disk endurance test, including the following steps:
extracting the specification of a solid state disk product to be detected;
extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from a storage end according to the specification of the solid state disk product to be detected;
establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function;
determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size;
substituting the upper limit of confidence control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity;
and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
Further, the functional failure error and sample size relation model created based on the confidence upper limit control function is represented by the following formula:
ucl (ff) = FFR × sample size (1)
Wherein, UCL () represents a confidence upper limit control function, FF represents a function failure error, and FFR represents a function failure rate.
Further, the data error and sample size relation model created based on the confidence upper limit control function is represented by the following formula:
ucl (de) = TBW 8 1012 ube sample size (2)
Where DE denotes a data error, TBW denotes a total data write amount in TB bytes, and UBER denotes an uncorrectable error rate.
Further, substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size, specifically including:
searching a confidence upper limit control function value table, and finding a confidence upper limit control function value corresponding to the standard functional failure error;
and substituting the searched confidence upper limit control function value into the formula (1) to obtain a first sample size.
Further, substituting the upper limit control function value of the confidence under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity, specifically comprising:
and substituting the confidence upper limit control function value corresponding to the standard function failure error into the formula (2) to obtain a second sample size.
In a second aspect, the present invention provides a sample size calculation apparatus for testing endurance of a solid state disk, including,
a product specification extraction module: extracting the specification of a solid state disk product to be detected;
a parameter extraction module: extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from a storage end according to the specification of the solid state disk product to be detected;
a relational model creation module: establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function;
a first sample amount calculation module: determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size;
a second sample size calculation module: substituting the upper limit of confidence control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity;
a test sample size determination module: and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
Further, the relational model creating module creates a functional failure error and sample size relational model based on the confidence upper limit control function, and the relational model is represented by the following formula:
ucl (ff) = FFR × sample size (1)
Wherein, UCL () represents a confidence upper limit control function, FF represents a function failure error, and FFR represents a function failure rate;
the relational model creating module creates a data error and sample size relational model based on the confidence upper limit control function, and the relational model is represented by the following formula:
ucl (de) = TBW 8 1012 ube sample size (2)
Where DE denotes a data error, TBW denotes a total data write amount in TB bytes, and UBER denotes an uncorrectable error rate.
Further, the step of substituting the standard functional failure error into a functional failure error and sample size relation model by the first sample size calculation module to obtain a first sample size specifically includes:
searching a confidence upper limit control function value table, and finding a confidence upper limit control function value corresponding to the standard functional failure error;
and substituting the searched confidence upper limit control function value into the formula (1) to obtain a first sample size.
Further, the substituting the confidence upper limit control function value under the first sample quantity into the data error and sample quantity relation model by the second sample quantity calculation module to obtain a second sample quantity specifically includes:
and substituting the confidence upper limit control function value corresponding to the standard function failure error into the formula (2) to obtain a second sample size.
In a third aspect, a technical solution of the present invention provides a method for testing durability of a solid state disk, including the following steps:
determining the test sample size by performing the method of any one of the above;
substituting the test sample amount into a formula (2) to obtain standard data errors;
carrying out solid state disk durability test based on the test sample amount;
and if the functional failure error does not exceed the standard functional failure error and the data error does not exceed the standard data error in the test process, the durability test of the solid state disk passes.
Compared with the prior art, the solid state disk durability testing method, the sample amount calculating method and the device provided by the invention have the following beneficial effects: by introducing a group of relational models containing influence factors such as uncorrectable error rate, functional errors and UCL function values of data errors, the sample size is accurately calculated, the test quality is guaranteed, the accuracy of the test sample size and the test efficiency are improved, and the research and development cost is remarkably saved.
Drawings
For a clearer explanation of the embodiments or technical solutions of the prior art of the present application, the drawings needed for the description of the embodiments or prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic flow chart of a method for calculating a sample amount for testing endurance of a solid state disk according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of a solid state disk endurance test sample size calculation apparatus according to a second embodiment of the present invention.
Fig. 3 is a schematic flow chart of a method for testing endurance of a solid state disk according to a third embodiment of the present invention.
Fig. 4 is a schematic structural diagram of a terminal according to a fourth embodiment of the present invention.
Detailed Description
The following explains the english terms related to the present invention.
SSD Solid State Drive Solid State disk
FFR Functional Failure rate Requirement
Annual Failure Rate of AFR nualized Failure Rate
FF Functional Failure error
DD Data Error
UBER unorderable Bit Error Rate Uncorrectable Error Rate
UCL upper confidence limit control
DWPD drive-writes-per-day write volume
In order that those skilled in the art will better understand the disclosure, the following detailed description will be given with reference to the accompanying drawings. It is to be understood that the embodiments described are only a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
Example one
Fig. 1 is a schematic flow chart of a method for calculating a sample amount for testing endurance of a solid state disk according to an embodiment of the present invention, including the following steps.
S101, extracting the specification of the solid state disk product to be detected.
The product specification of the solid state disk to be tested can be extracted by scanning the information code of the solid state disk and the like.
And S102, extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from the storage end according to the specification of the solid state disk product to be detected.
In the embodiment, the functional failure rate and the uncorrectable error rate are introduced as the influence factors to create the relationship model to calculate the sample size, so that the functional failure rate and the uncorrectable error rate of the solid state disk to be detected are extracted from the storage terminal in advance according to the product specification of the solid state disk.
S103, a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor are created based on the confidence upper limit control function.
The embodiment is based on a functional failure error and sample size relation model created by a confidence upper limit control function, and is represented by the following formula:
ucl (ff) = FFR × sample size (1)
Wherein, UCL () represents a confidence upper limit control function, FF represents a function failure error, and FFR represents a function failure rate.
The data error and sample size relation model created based on the confidence upper limit control function is represented by the following formula:
ucl (de) = TBW 8 1012 ube sample size (2)
Where DE denotes a data error, TBW denotes a total data write amount in TB bytes, and UBER denotes an uncorrectable error rate.
S104, determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size.
The test requirements are needed to determine a standard failure error for the endurance test, e.g., a standard failure error of 0.
Wherein, substituting the standard functional failure error into the functional failure error and sample size relation model to obtain a first sample size, specifically comprising:
searching a confidence upper limit control function value table, and finding a confidence upper limit control function value corresponding to the standard functional failure error;
and substituting the searched confidence upper limit control function value into the formula (1) to obtain a first sample size.
And S105, substituting the confidence upper limit control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity.
Specifically, the confidence upper limit control function value corresponding to the standard functional failure error is substituted into the formula (2), and the second sample size is obtained.
And S106, selecting a larger sample size as a test sample size from the first sample size and the second sample size.
In order to enable the test sample size to simultaneously satisfy the two relation models, a larger sample size is selected as the test sample size.
According to the method for calculating the endurance test sample quantity of the solid state disk, the sample quantity is accurately calculated by introducing a group of relational models containing influence factors such as uncorrectable error rate, functional errors and UCL function values of data errors, the accuracy and the test efficiency of the test sample quantity are improved while the test quality is ensured, and the research and development cost is remarkably saved.
Example two
On the basis of the first embodiment, the second embodiment provides a sample size calculation device for testing the endurance of the solid state disk, which is used for implementing the method of the first embodiment.
Fig. 2 is a schematic structural diagram of a solid state disk endurance test sample size calculation apparatus according to the second embodiment, including the following functional modules.
Product specification extraction module 101: and extracting the specification of the solid state disk product to be detected.
The parameter extraction module 102: and extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from the storage end according to the specification of the solid state disk product to be detected.
The relationship model creation module 103: and creating a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on the confidence upper limit control function.
The first sample amount calculation module 104: and determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size.
The second sample amount calculation module 105: and substituting the upper limit of confidence control function value under the first sample amount into the data error and sample amount relation model to obtain a second sample amount.
Test sample size determination module 106: and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
In this embodiment, the relational model creating module 103 is configured to create a functional failure error and sample size relational model based on the confidence upper-limit control function, which is represented by the following formula:
ucl (ff) = FFR × sample size (1)
Wherein, UCL () represents a confidence upper limit control function, FF represents a function failure error, and FFR represents a function failure rate.
The relational model creating module 103 creates a data error and sample size relational model based on the confidence upper limit control function, which is expressed by the following formula:
ucl (de) = TBW 8 1012 ube sample size (2)
Where DE denotes a data error, TBW denotes a total data write amount in TB bytes, and UBER denotes an uncorrectable error rate.
The first sample amount calculating module 104 substitutes the standard functional failure error into the functional failure error and sample amount relation model to obtain a first sample amount, which specifically includes:
searching a confidence upper limit control function value table, and finding a confidence upper limit control function value corresponding to the standard functional failure error;
and substituting the searched confidence upper limit control function value into the formula (1) to obtain a first sample size.
The second sample size calculation module substitutes the upper limit of confidence control function value under the first sample size into the data error and sample size relation model to obtain a second sample size, and the method specifically comprises the following steps:
and substituting the confidence upper limit control function value corresponding to the standard function failure error into the formula (2) to obtain a second sample size.
According to the solid state disk endurance test sample size calculating device provided by the invention, the sample size is accurately calculated by introducing a group of relational models containing influence factors such as uncorrectable error rate, functional errors and UCL function values of data errors, the test quality is ensured, the accuracy and the test efficiency of the test sample size are improved, and the research and development cost is further remarkably saved.
EXAMPLE III
In a third embodiment, a method for testing the endurance of a solid state disk according to the first embodiment is provided, as shown in fig. 3, and the method includes the following steps.
S301, the method of the first embodiment is executed to determine the test sample size.
And S302, substituting the test sample size into the formula (2) to obtain standard data errors.
And S303, carrying out the durability test of the solid state disk based on the test sample size.
S304, if the functional failure error does not exceed the standard functional failure error and the data error does not exceed the standard data error in the test process, the solid state disk durability test is passed.
The method for testing the endurance of the solid state disk in this embodiment is implemented based on the foregoing method for calculating the endurance test sample size of the solid state disk, so that the specific implementation of the method can be found in the foregoing embodiment of the method for calculating the endurance test sample size of the solid state disk, and therefore, the specific implementation thereof may refer to the description of the corresponding embodiments of each part, and will not be further described herein.
In addition, since the method for testing the endurance of the solid state disk of the present embodiment is implemented based on the method for calculating the endurance test sample amount of the solid state disk, the function of the method corresponds to that of the method described above, and details are not described here.
To further understand the present invention, a specific example is provided below to explain the present invention, and the specific process is as follows.
1) Creating a functional failure error versus sample size equation 1:
ucl (ff) = FFR × sample size.
2) Create data error versus sample size equation 2:
ucl (de) = TBW 8 × 1012 × ube sample size;
TBW is the total data write amount in TB bytes.
3) UCL function value table:
table 1: UCL function value table
| X | UCL(x) | X | UCL(x) | X | UCL(x) | X | UCL(x) |
| 0 | 0.92 | 20 | 21.84 | 40 | 42.31 | 60 | 62.66 |
| 1 | 2.05 | 21 | 22.87 | 41 | 43.33 | 61 | 63.68 |
| 2 | 3.12 | 22 | 23.88 | 42 | 44.34 | 62 | 64.69 |
| 3 | 4.17 | 23 | 24.93 | 43 | 45.36 | 63 | 65.71 |
| 4 | 5.23 | 24 | 25.95 | 44 | 46.38 | 64 | 66.72 |
| 5 | 6.28 | 25 | 26.97 | 45 | 47.4 | 65 | 67.74 |
| 6 | 7.35 | 26 | 28 | 46 | 48.42 | 66 | 68.75 |
| 7 | 8.37 | 27 | 29.12 | 47 | 49.43 | 67 | 69.77 |
| 8 | 9.44 | 28 | 30.26 | 48 | 50.46 | 68 | 70.79 |
| 9 | 10.48 | 29 | 31.07 | 49 | 51.47 | 69 | 71.8 |
| 10 | 11.52 | 30 | 32.09 | 50 | 52.49 | 70 | 72.82 |
| 11 | 12.55 | 31 | 33.12 | 51 | 53.51 | 71 | 73.83 |
| 12 | 13.59 | 32 | 34.14 | 52 | 54.52 | 72 | 74.85 |
| 13 | 14.62 | 33 | 35.16 | 53 | 55.55 | 73 | 75.86 |
| 14 | 15.66 | 34 | 36.18 | 54 | 56.56 | 74 | 76.88 |
| 15 | 16.69 | 35 | 37.2 | 55 | 57.58 | 75 | 77.89 |
| 16 | 17.72 | 36 | 38.22 | 56 | 58.6 | 76 | 78.91 |
| 17 | 18.75 | 37 | 39.24 | 57 | 59.61 | 77 | 79.92 |
| 18 | 19.78 | 38 | 40.26 | 58 | 60.63 | 78 | 80.94 |
| 19 | 20.81 | 39 | 41.29 | 59 | 61.64 | 79 | 81.95 |
The UCL function-value table is predetermined and stored.
4) Generally, a sample size scheme with 0 functional failure error is selected, and the product specification follows FFR =2.19%, UBER =10 -17 。
5) Taking SSD with capacity 1.6T, DWPD =3 as an example, TBW =3 × 365 × 5 × 1.6T = 8760 TB.
6) According to equation 1: UCL (0) = FFR = sample size,
looking up the UCL function value table can obtain UCL (0) =0.92,
substituting equation 1, 0.92 =2.19% sample size,
then sample size = 42.
7) According to equation 2: UCL (0) = 8760 × 8 × 1012 × 10-17 × sample size,
then sample size = 0.92/(8760 × 8 × 1012 × 10-17) = 1.3.
8) If the sample size obtained by equation 1 and equation 2 is to be satisfied, the sample size can be determined to be 42 disks.
9) The sample size 42 is substituted into equation 2,
UCL（DE）= 8760* 8 * 1012 * 10-17 * 42 =29.4336；
by substituting 29.4336 into the value sequence in the UCL function value table, Data Error = 27 can be obtained.
10) Through the calculation, the sample size of the test can be determined to be 42 blocks, and if no Function Failed occurs in the test process and the number of Data errors is not more than 27, the product durability of the model is considered to pass the verification, so that the quality requirement is met.
Example four
Fig. 4 is a schematic structural diagram of a terminal device 400 according to an embodiment of the present invention, including: a processor 410, a memory 420, and a communication unit 430. The processor 410 is configured to implement the following steps when implementing the solid state disk endurance test sample size calculation program stored in the memory 420:
extracting the specification of a solid state disk product to be detected;
extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from a storage end according to the specification of the solid state disk product to be detected;
establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function;
determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size;
substituting the upper limit of confidence control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity;
and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
According to the method for calculating the endurance test sample quantity of the solid state disk, the sample quantity is accurately calculated by introducing a group of relational models containing influence factors such as uncorrectable error rate, functional errors and UCL function values of data errors, the accuracy and the test efficiency of the test sample quantity are improved while the test quality is ensured, and the research and development cost is remarkably saved.
The terminal apparatus 400 includes a processor 410, a memory 420, and a communication unit 430. The components communicate via one or more buses, and those skilled in the art will appreciate that the architecture of the servers shown in the figures is not intended to be limiting, and may be a bus architecture, a star architecture, a combination of more or less components than those shown, or a different arrangement of components.
The memory 420 may be used for storing instructions executed by the processor 410, and the memory 420 may be implemented by any type of volatile or non-volatile storage terminal or combination thereof, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The executable instructions in memory 420, when executed by processor 410, enable terminal 400 to perform some or all of the steps in the method embodiments described below.
The processor 410 is a control center of the storage terminal, connects various parts of the entire electronic terminal using various interfaces and lines, and performs various functions of the electronic terminal and/or processes data by operating or executing software programs and/or modules stored in the memory 420 and calling data stored in the memory. The processor may be composed of an Integrated Circuit (IC), for example, a single packaged IC, or a plurality of packaged ICs connected with the same or different functions. For example, the processor 410 may include only a Central Processing Unit (CPU). In the embodiment of the present invention, the CPU may be a single operation core, or may include multiple operation cores.
A communication unit 430, configured to establish a communication channel so that the storage terminal can communicate with other terminals. And receiving user data sent by other terminals or sending the user data to other terminals.
EXAMPLE five
The present invention also provides a computer storage medium, wherein the storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM) or a Random Access Memory (RAM).
The computer storage medium stores a solid state disk endurance test sample amount calculation program, and when executed by a processor, the solid state disk endurance test sample amount calculation program implements the steps of:
extracting the specification of a solid state disk product to be detected;
extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from a storage end according to the specification of the solid state disk product to be detected;
establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function;
determining a standard functional failure error of the endurance test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size;
substituting the upper limit of confidence control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity;
and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
According to the method for calculating the endurance test sample quantity of the solid state disk, the sample quantity is accurately calculated by introducing a group of relational models containing influence factors such as uncorrectable error rate, functional errors and UCL function values of data errors, the accuracy and the test efficiency of the test sample quantity are improved while the test quality is ensured, and the research and development cost is remarkably saved.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented as software plus a required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be embodied in the form of a software product, where the computer software product is stored in a storage medium, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, and the storage medium can store program codes, and includes instructions for enabling a computer terminal (which may be a personal computer, a server, or a second terminal, a network terminal, and the like) to perform all or part of the steps of the method in the embodiments of the present invention.
In the embodiments provided in the present invention, it should be understood that the disclosed system, apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the units is only one logical division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
The above disclosure is only for the preferred embodiments of the present invention, but the present invention is not limited thereto, and any non-inventive changes that can be made by those skilled in the art and several modifications and amendments made without departing from the principle of the present invention shall fall within the protection scope of the present invention.
Claims (10)
1. A method for calculating the sample quantity of the durability test of a solid state disk is characterized by comprising the following steps:
extracting the specification of a solid state disk product to be detected;
extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from a storage end according to the specification of the solid state disk product to be detected;
establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function;
determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size;
substituting the upper limit of confidence control function value under the first sample quantity into the data error and sample quantity relation model to obtain a second sample quantity;
and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
2. The method for calculating the sample amount of the solid state disk endurance test according to claim 1, wherein the functional failure error and sample amount relation model created based on the confidence upper limit control function is represented by the following formula:
ucl (ff) = FFR × sample size (1)
Wherein, UCL () represents a confidence upper limit control function, FF represents a function failure error, and FFR represents a function failure rate.
3. The method for calculating the sample amount of the solid state disk endurance test according to claim 2, wherein the data error-sample amount relation model created based on the upper confidence limit control function is represented by the following formula:
ucl (de) = TBW 8 1012 ube sample size (2)
Where DE denotes a data error, TBW denotes a total data write amount in TB bytes, and UBER denotes an uncorrectable error rate.
4. The method for calculating the sample amount for the endurance test of the solid state disk according to claim 3, wherein the step of substituting the standard functional failure error into a functional failure error and sample amount relation model to obtain the first sample amount specifically comprises:
searching a confidence upper limit control function value table, and finding a confidence upper limit control function value corresponding to the standard functional failure error;
and substituting the searched confidence upper limit control function value into the formula (1) to obtain a first sample size.
5. The method for calculating the sample size for the endurance test of the solid state disk of claim 4, wherein the step of substituting the upper limit of confidence control function value in the first sample size into the data error and sample size relationship model to obtain the second sample size specifically comprises:
and substituting the confidence upper limit control function value corresponding to the standard function failure error into the formula (2) to obtain a second sample size.
6. A sample size calculation device for testing the durability of a solid state disk is characterized by comprising,
a product specification extraction module: extracting the specification of a solid state disk product to be detected;
a parameter extraction module: extracting the function failure rate and the uncorrectable error rate of the solid state disk to be detected from a storage end according to the specification of the solid state disk product to be detected;
a relational model creation module: establishing a functional failure error and sample size relation model taking the functional failure rate as an influence factor and a data error and sample size relation model taking the uncorrectable error rate as an influence factor based on a confidence upper limit control function;
a first sample amount calculation module: determining a standard functional failure error of the durability test, and substituting the standard functional failure error into a functional failure error and sample size relation model to obtain a first sample size;
a second sample size calculation module: substituting the upper limit of confidence control function value under the first sample amount into the data error and sample amount relation model to obtain a second sample amount;
a test sample size determination module: and selecting the larger sample size from the first sample size and the second sample size as the test sample size.
7. The apparatus according to claim 6, wherein the relational model creating module is based on a functional failure error and sample size relational model created by the upper confidence limit control function, and is represented by the following formula:
ucl (ff) = FFR × sample size (1)
Wherein, UCL () represents a confidence upper limit control function, FF represents a function failure error, and FFR represents a function failure rate;
the relational model creating module creates a data error and sample size relational model based on the confidence upper limit control function, and the relational model is represented by the following formula:
ucl (de) = TBW 8 1012 ube sample size (2)
Where DE denotes a data error, TBW denotes a total data write amount in TB bytes, and UBER denotes an uncorrectable error rate.
8. The apparatus of claim 7, wherein the first sample amount calculating module substitutes the standard functional failure error into a functional failure error and sample amount relation model to obtain the first sample amount, and specifically comprises:
searching a confidence upper limit control function value table, and finding a confidence upper limit control function value corresponding to the standard function failure error;
and substituting the searched confidence upper limit control function value into the formula (1) to obtain a first sample size.
9. The apparatus of claim 8, wherein the second sample size calculating module substitutes the upper confidence limit control function value in the first sample size into the data error and sample size relation model to obtain a second sample size, and specifically comprises:
and substituting the confidence upper limit control function value corresponding to the standard function failure error into the formula (2) to obtain a second sample size.
10. A method for testing the durability of a solid state disk is characterized by comprising the following steps:
determining a test sample size by performing the method of any one of claims 1-5;
substituting the test sample amount into a formula (2) to obtain standard data errors;
carrying out solid state disk durability test based on the test sample amount;
and if the functional failure error does not exceed the standard functional failure error and the data error does not exceed the standard data error in the test process, the durability test of the solid state disk passes.
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