CN114253786A - Method, device, equipment and medium for improving function test efficiency of solid state disk - Google Patents

Method, device, equipment and medium for improving function test efficiency of solid state disk Download PDF

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Publication number
CN114253786A
CN114253786A CN202111598375.9A CN202111598375A CN114253786A CN 114253786 A CN114253786 A CN 114253786A CN 202111598375 A CN202111598375 A CN 202111598375A CN 114253786 A CN114253786 A CN 114253786A
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data
test
data model
module
executing
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陈道华
赵军委
王伟良
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Shenzhen Union Memory Information System Co Ltd
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Shenzhen Union Memory Information System Co Ltd
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor

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  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)

Abstract

The embodiment of the invention discloses a method, a device, equipment and a medium for improving the efficiency of function test of a solid state disk, wherein the method comprises the steps of executing a retention test of a data model of memory particles; executing a data erasing and writing test of the flash memory particles in the process of executing the holding test of the data model; after the data erasing and reading test of the executing flash memory particles is finished, directly entering the data erasing and reading test of the next round of flash memory particles, and judging whether the holding test of the data model of the executing memory particles is finished; if the retention test of the data model of the memory grain being executed is completed, the retention test of the data model of the memory grain of the next round is entered. The invention improves the testing efficiency and reduces the time required by the whole test.

Description

Method, device, equipment and medium for improving function test efficiency of solid state disk
Technical Field
The invention relates to a solid state disk, in particular to a method, a device, equipment and a medium for improving the function test efficiency of the solid state disk.
Background
Generally, a one-by-one test method is adopted in the SSD (solid state disk) test process to confirm the functions of an SOC (controller), a DDR (memory particles) and a NAND Flash (Flash memory particles), with the increasing product capacity and the increasing test time of the DDR (memory particles), the general 512M DDR (memory particles) needs about 2 minutes to complete a Pattern test (different data model tests) of a full address, if the waiting time is 30 minutes to test the data Retention capability of the DDR, the execution of 10 Pattern retentions tests needs more than 6 hours, the test time is long, and the test efficiency is low.
Disclosure of Invention
The invention aims to overcome the defects of the prior art and provides a method, a device, equipment and a medium for improving the function test efficiency of a solid state disk.
In order to achieve the purpose, the invention adopts the following technical scheme:
in a first aspect, a method for improving efficiency of testing functions of a solid state disk, where the solid state disk includes memory particles and flash memory particles, includes:
executing a holding test of a data model of the memory grain;
executing a data erasing and writing test of the flash memory particles in the process of executing the holding test of the data model;
after the data erasing and reading test of the executing flash memory particles is finished, directly entering the data erasing and reading test of the next round of flash memory particles, and judging whether the holding test of the data model of the executing memory particles is finished;
if the retention test of the data model of the memory grain being executed is completed, the retention test of the data model of the memory grain of the next round is entered.
The further technical scheme is as follows: the executing of the retention test of the data model of the memory grain specifically includes:
setting parameters required by a holding test of a data model, wherein the parameters comprise writing time, a refreshing period and data holding duration;
selecting a data model to be tested;
comparing and checking the data model meeting the data holding duration requirement with the data model written in before to confirm the correctness of the data;
and storing the verification result data.
The further technical scheme is as follows: the data was held for a period of 25 minutes to 40 minutes.
The further technical scheme is as follows: the executing of the data erasing and reading test of the flash memory particles specifically comprises the following steps:
erasing data in all addresses of the flash memory granules;
writing all the erased addresses with full data;
reading data in all addresses and confirming the correctness of the data;
and storing the verification result data.
In a second aspect, a device for improving the efficiency of testing the functions of a solid state disk, where the solid state disk includes memory particles and flash memory particles, includes a first execution unit, a second execution unit, a determination unit, and a third execution unit;
the first execution unit is used for executing a holding test of a data model of the memory grain;
the second execution unit is used for executing the data erasing and writing test of the flash memory particles in the process of executing the holding test of the data model;
the judging unit is used for directly entering the next round of data erasing and writing test of the flash memory particles after the data erasing and writing test of the executing flash memory particles is executed, and judging whether the holding test of the data model of the executing memory particles is finished or not;
and the third execution unit is used for entering the holding test of the data model of the memory grain of the next round if the holding test of the data model of the memory grain being executed is finished.
The further technical scheme is as follows: the first execution unit comprises a setting module, a selection module, a comparison and verification module and a first storage module;
the setting module is used for setting parameters required by the holding test of the data model, and the parameters comprise writing time, a refreshing period and data holding duration;
the selection module is used for selecting a data model to be tested;
the comparison and verification module is used for comparing and verifying the data model meeting the data holding duration requirement and the data model written in before so as to confirm the correctness of the data;
and the first storage module is used for storing the verification result data.
The further technical scheme is as follows: the data was held for a period of 25 minutes to 40 minutes.
The further technical scheme is as follows: the second execution unit comprises an erasing module, a writing module, a reading module and a second storage module;
the erasing module is used for erasing data in all addresses of the flash memory particles;
the writing module is used for writing all the erased addresses with data;
the reading module is used for reading the data in all the addresses and confirming the correctness of the data;
and the second storage module is used for storing the verification result data.
In a third aspect, a computer device includes a memory, a processor, and a computer program stored on the memory and executable on the processor, and the processor executes the computer program to implement the method steps for improving the efficiency of testing the functions of the solid state disk as described above.
In a fourth aspect, a storage medium stores a computer program comprising program instructions which, when executed by a processor, cause the processor to perform the method steps of improving the efficiency of testing the functions of a solid state disk as described above.
Compared with the prior art, the invention has the beneficial effects that: according to the invention, the data erasing read-write test of the flash memory particles is executed in the process of executing the retention test of the data model, and because a waiting period of a period of time exists in the process of executing the retention test of the data model, the data erasing read-write test of the flash memory particles is executed by utilizing the waiting period, the waiting period of time can be effectively and fully utilized, the test efficiency is greatly improved on the basis of meeting the functional test, and the time required by the overall test is reduced.
The foregoing description is only an overview of the technical solutions of the present invention, and in order to make the technical means of the present invention more clearly understood, the present invention may be implemented according to the content of the description, and in order to make the above and other objects, features, and advantages of the present invention more apparent, the following detailed description will be given of preferred embodiments.
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In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a flowchart of a method for improving efficiency of testing functions of a solid state disk according to an embodiment of the present invention;
fig. 2 is a schematic block diagram of an apparatus for improving efficiency of testing functions of a solid state disk according to an embodiment of the present invention;
fig. 3 is a schematic block diagram of a computer device according to an embodiment of the present invention.
Detailed Description
In order to more fully understand the technical content of the present invention, the technical solution of the present invention will be further described and illustrated with reference to the following specific embodiments, but not limited thereto.
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
It is also to be understood that the terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in the specification of the present invention and the appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.
It should be further understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.
The specific embodiment of the invention provides a method for improving the efficiency of testing the functions of a solid state disk, which integrates a retention test of a data model of memory particles and a retention test of the data model, and executes a data erasing and reading test of flash memory particles in the process of executing the retention test of the data model so as to achieve the purposes of improving the testing efficiency and reducing the testing time. The invention is described below by means of specific embodiments.
A method for improving the efficiency of testing the functions of a solid state disk, wherein the solid state disk comprises memory particles and flash memory particles, and the method comprises the following steps: s10, S20, S30 and S40.
And S10, executing a retention test of the data model of the memory grain.
Memory granules are DDR, and the Retention test of the data model of the memory granules is the Retention test of Pattern of the DDR.
Step S10 specifically includes the following steps: s101, S102, S103 and S104.
S101, setting parameters required by a holding test of the data model, wherein the parameters comprise writing time, a refreshing period and data holding duration.
In the test, parameters required for the test need to be set, in this embodiment, the write time is set to 10ns, the refresh period is set to 64ms, and the data retention time is set to 30 minutes.
And S102, selecting a data model to be tested.
Because the data models may be different, the data model to be tested needs to be selected, and the selected data model is located in the memory granule.
S103, comparing and checking the data model meeting the data holding time requirement with the data model written before to confirm the correctness of the data.
The comparison and verification process is to compare the data model of the holding duration with the data model at the time of writing to see whether the data is changed after being held for a period of time.
And S104, storing the verification result data.
And S20, executing the data erasing and writing test of the flash memory particles in the process of executing the data model keeping test.
The Flash memory granule is NAND Flash.
Since there is a waiting period of time in the process of executing the retention test of the data pattern, the data read/write test of the flash memory granule is executed by using the waiting period.
Step S20 specifically includes the following steps: s201, S202, S203 and S204.
S201, erasing data in all addresses of the flash memory particles.
S202, writing all the erased addresses with data.
And S203, reading the data in all the addresses and confirming the correctness of the data.
And S204, storing the verification result data.
Before testing, data in all addresses of flash memory particles are erased to avoid interference to testing, data is written after erasing, and written data is read.
And S30, directly entering the next round of data erasing and writing test of the flash memory particles after the data erasing and writing test of the flash memory particles being executed is finished, and judging whether the holding test of the data model of the memory particles being executed is finished.
Probably because the process of data erasing and writing is faster, the holding test of the data model of the memory particles is finished without finishing the data erasing and writing, and then the flash memory particles can directly enter the data erasing and writing test of the next round without waiting.
And S40, if the holding test of the data model of the memory grain being executed is completed, entering the holding test of the data model of the memory grain of the next round.
If the retention test of the data model of the executing memory granule is not completed, then the process continues.
According to the invention, the data erasing read-write test of the flash memory particles is executed in the process of executing the retention test of the data model, and because a waiting period of a period of time exists in the process of executing the retention test of the data model, the data erasing read-write test of the flash memory particles is executed by utilizing the waiting period, the waiting period of time can be effectively and fully utilized, the test efficiency is greatly improved on the basis of meeting the functional test, and the time required by the overall test is reduced.
It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.
Corresponding to the method for improving the function test efficiency of the solid state disk, the specific embodiment of the invention also provides a device for improving the function test efficiency of the solid state disk.
As shown in fig. 2, the apparatus 100 for improving the efficiency of testing the functions of a solid state disk including memory granules and flash granules includes a first execution unit 110, a second execution unit 120, a determination unit 130, and a third execution unit 140.
The first execution unit 110 is configured to execute a retention test of a data model of a memory granule.
Memory granules are DDR, and the Retention test of the data model of the memory granules is the Retention test of Pattern of the DDR.
The first execution unit 110 includes a setting module, a selecting module, a comparing and checking module, and a first saving module.
And the setting module is used for setting parameters required by the holding test of the data model, wherein the parameters comprise writing time, a refreshing period and data holding duration.
In the test, parameters required for the test need to be set, in this embodiment, the write time is set to 10ns, the refresh period is set to 64ms, and the data retention time is set to 30 minutes.
And the selection module is used for selecting the data model to be tested.
Because the data models may be different, the data model to be tested needs to be selected, and the selected data model is located in the memory granule.
And the comparison and verification module is used for comparing and verifying the data model meeting the data holding duration requirement and the data model written in before so as to confirm the correctness of the data.
The comparison and verification process is to compare the data model of the holding duration with the data model at the time of writing to see whether the data is changed after being held for a period of time.
And the first storage module is used for storing the verification result data.
The second execution unit 120 is configured to execute a data read/write test of the flash memory granule during the retention test of the data model.
The Flash memory granule is NAND Flash.
Since there is a waiting period of time in the process of executing the retention test of the data pattern, the data read/write test of the flash memory granule is executed by using the waiting period.
The second execution unit 120 includes an erase module, a write module, a read module, and a second save module.
And the erasing module is used for erasing data in all addresses of the flash memory particles.
And the writing module is used for fully writing all the erased addresses with data.
And the reading module is used for reading the data in all the addresses and confirming the correctness of the data.
And the second storage module is used for storing the verification result data.
Before testing, data in all addresses of flash memory particles are erased to avoid interference to testing, data is written after erasing, and written data is read.
The determining unit 130 is configured to directly enter the next round of data erasing and writing test of the flash memory granule after the data erasing and writing test of the flash memory granule being executed is completed, and determine whether the maintenance test of the data model of the memory granule being executed is completed.
Probably because the process of data erasing and writing is faster, the holding test of the data model of the memory particles is finished without finishing the data erasing and writing, and then the flash memory particles can directly enter the data erasing and writing test of the next round without waiting.
The third execution unit 140 is configured to enter the next round of the retention test of the data model of the memory granule if the retention test of the data model of the memory granule being executed is completed.
If the retention test of the data model of the executing memory granule is not completed, then the process continues.
As shown in fig. 3, the embodiment of the present invention further provides a computer device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, the method steps for improving the efficiency of testing the functions of the solid state disk described above are implemented.
The computer device 700 may be a terminal or a server. The computer device 700 includes a processor 720, memory, and a network interface 750, which are connected by a system bus 710, where the memory may include non-volatile storage media 730 and internal memory 740.
The non-volatile storage medium 730 may store an operating system 731 and computer programs 732. The computer program 732 may cause the processor 720 to perform any method for improving the efficiency of testing the functions of the solid state disk when executed.
The processor 720 is used to provide computing and control capabilities, supporting the operation of the overall computer device 700.
The internal memory 740 provides an environment for the operation of the computer program 732 in the non-volatile storage medium 730, and when the computer program 732 is executed by the processor 720, the processor 720 may be enabled to perform any method for improving the efficiency of testing the functions of the solid state disk.
The network interface 750 is used for network communication such as sending assigned tasks and the like. Those skilled in the art will appreciate that the configuration shown in fig. 3 is a block diagram of only a portion of the configuration relevant to the present teachings and is not intended to limit the computing device 700 to which the present teachings may be applied, and that a particular computing device 700 may include more or less components than those shown, or may combine certain components, or have a different arrangement of components. Wherein the processor 720 is configured to execute the program code stored in the memory to perform the following steps:
executing a holding test of a data model of the memory grain;
executing a data erasing and writing test of the flash memory particles in the process of executing the holding test of the data model;
after the data erasing and reading test of the executing flash memory particles is finished, directly entering the data erasing and reading test of the next round of flash memory particles, and judging whether the holding test of the data model of the executing memory particles is finished;
if the retention test of the data model of the memory grain being executed is completed, the retention test of the data model of the memory grain of the next round is entered.
The further technical scheme is as follows: the executing of the retention test of the data model of the memory grain specifically includes:
setting parameters required by a holding test of a data model, wherein the parameters comprise writing time, a refreshing period and data holding duration;
selecting a data model to be tested;
comparing and checking the data model meeting the data holding duration requirement with the data model written in before to confirm the correctness of the data;
and storing the verification result data.
The further technical scheme is as follows: the data was held for a period of 25 minutes to 40 minutes.
The further technical scheme is as follows: the executing of the data erasing and reading test of the flash memory particles specifically comprises the following steps:
erasing data in all addresses of the flash memory granules;
writing all the erased addresses with full data;
reading data in all addresses and confirming the correctness of the data;
and storing the verification result data.
It should be understood that, in the embodiment of the present Application, the Processor 720 may be a Central Processing Unit (CPU), and the Processor 720 may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field Programmable Gate Arrays (FPGAs) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components, and the like. Wherein a general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.
Those skilled in the art will appreciate that the configuration of computer device 700 depicted in FIG. 3 is not intended to be limiting of computer device 700 and may include more or less components than those shown, or some components in combination, or a different arrangement of components.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the embodiments of the present invention may be implemented in the form of a software product, which is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, a network device, or the like) or a processor (processor) to execute all or part of the steps of the methods according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the above-mentioned apparatus may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
In the embodiments provided in the present invention, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described device embodiments are merely illustrative, and for example, the division of the modules or units is only one logical functional division, and there may be other divisions when actually implemented, for example, a plurality of units or components may be combined or may be integrated into another device, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
The synthesis of the following steps: according to the invention, the data erasing read-write test of the flash memory particles is executed in the process of executing the retention test of the data model, and because a waiting period of a period of time exists in the process of executing the retention test of the data model, the data erasing read-write test of the flash memory particles is executed by utilizing the waiting period, the waiting period of time can be effectively and fully utilized, the test efficiency is greatly improved on the basis of meeting the functional test, and the time required by the overall test is reduced.
While the invention has been described with reference to specific embodiments, the invention is not limited thereto, and various equivalent modifications and substitutions can be easily made by those skilled in the art within the technical scope of the invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims (10)

1. The method for improving the function test efficiency of the solid state disk comprises memory particles and flash memory particles, and is characterized by comprising the following steps:
executing a holding test of a data model of the memory grain;
executing a data erasing and writing test of the flash memory particles in the process of executing the holding test of the data model;
after the data erasing and reading test of the executing flash memory particles is finished, directly entering the data erasing and reading test of the next round of flash memory particles, and judging whether the holding test of the data model of the executing memory particles is finished;
if the retention test of the data model of the memory grain being executed is completed, the retention test of the data model of the memory grain of the next round is entered.
2. The method according to claim 1, wherein the performing of the retention test of the data model of the memory granules specifically comprises:
setting parameters required by a holding test of a data model, wherein the parameters comprise writing time, a refreshing period and data holding duration;
selecting a data model to be tested;
comparing and checking the data model meeting the data holding duration requirement with the data model written in before to confirm the correctness of the data;
and storing the verification result data.
3. The method for improving the efficiency of testing the functions of the solid state disk according to claim 1, wherein the data retention time is 25 minutes to 40 minutes.
4. The method for improving the efficiency of testing the functions of the solid state disk according to claim 1, wherein the performing of the data erasing/writing test of the flash memory particles specifically comprises:
erasing data in all addresses of the flash memory granules;
writing all the erased addresses with full data;
reading data in all addresses and confirming the correctness of the data;
and storing the verification result data.
5. The device for improving the function test efficiency of the solid state disk is characterized in that the solid state disk comprises memory particles and flash memory particles, and the device comprises a first execution unit, a second execution unit, a judgment unit and a third execution unit;
the first execution unit is used for executing a holding test of a data model of the memory grain;
the second execution unit is used for executing the data erasing and writing test of the flash memory particles in the process of executing the holding test of the data model;
the judging unit is used for directly entering the next round of data erasing and writing test of the flash memory particles after the data erasing and writing test of the executing flash memory particles is executed, and judging whether the holding test of the data model of the executing memory particles is finished or not;
and the third execution unit is used for entering the holding test of the data model of the memory grain of the next round if the holding test of the data model of the memory grain being executed is finished.
6. The apparatus according to claim 5, wherein the first execution unit includes a setting module, a selecting module, a comparison and verification module, and a first saving module;
the setting module is used for setting parameters required by the holding test of the data model, and the parameters comprise writing time, a refreshing period and data holding duration;
the selection module is used for selecting a data model to be tested;
the comparison and verification module is used for comparing and verifying the data model meeting the data holding duration requirement and the data model written in before so as to confirm the correctness of the data;
and the first storage module is used for storing the verification result data.
7. The apparatus for improving the efficiency of testing the functions of the solid state disk according to claim 5, wherein the data retention time is 25 minutes to 40 minutes.
8. The apparatus for improving the efficiency of testing the functions of the solid state disk according to claim 5, wherein the second execution unit comprises an erasing module, a writing module, a reading module and a second saving module;
the erasing module is used for erasing data in all addresses of the flash memory particles;
the writing module is used for writing all the erased addresses with data;
the reading module is used for reading the data in all the addresses and confirming the correctness of the data;
and the second storage module is used for storing the verification result data.
9. Computer device, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor executes the computer program to implement the method steps of improving the efficiency of testing the functions of a solid state disk according to any one of claims 1 to 4.
10. A storage medium, characterized in that the storage medium stores a computer program, the computer program comprises program instructions, and the program instructions, when executed by a processor, cause the processor to execute the method steps for improving the efficiency of testing the functions of a solid state disk according to any one of claims 1 to 4.
CN202111598375.9A 2021-12-24 2021-12-24 Method, device, equipment and medium for improving function test efficiency of solid state disk Pending CN114253786A (en)

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