CN114121697A - Hot spot risk detection method for solar cell - Google Patents

Hot spot risk detection method for solar cell Download PDF

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Publication number
CN114121697A
CN114121697A CN202010895003.1A CN202010895003A CN114121697A CN 114121697 A CN114121697 A CN 114121697A CN 202010895003 A CN202010895003 A CN 202010895003A CN 114121697 A CN114121697 A CN 114121697A
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hot spot
test
risk
solar cell
cell
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Inventor
杨金鑫
王丰彦
胥洋
唐正海
谢凤兰
浦云龙
刘立兵
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Yancheng Artes Sunshine Energy Technology Co ltd
CSI Cells Co Ltd
Canadian Solar Inc
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Yancheng Artes Sunshine Energy Technology Co ltd
CSI Cells Co Ltd
Atlas Sunshine Power Group Co Ltd
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Priority to CN202010895003.1A priority Critical patent/CN114121697A/en
Publication of CN114121697A publication Critical patent/CN114121697A/en
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/10—Measuring as part of the manufacturing process
    • H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/34—Sorting according to other particular properties
    • B07C5/344—Sorting according to other particular properties according to electric or electromagnetic properties
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
    • Y02P70/50—Manufacturing or production processes characterised by the final manufactured product

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Photovoltaic Devices (AREA)

Abstract

The invention provides a hot spot risk detection method of a solar cell, which comprises the following steps: s1, carrying out hot spot test on the battery piece to obtain the dark current I and the hot spot temperature T of the battery piece; s2 if dark current I is in [0, I ]1]The hot spot temperature T belongs to [0, T ∈1]Or dark current I ∈ [ I ]1，I2]The hot spot temperature T belongs to [0, T ∈2]The solar cell slice has no risk of hot spots; wherein I1＜I2，T1＞T2. According to the method, the hot spot risk of the cell is judged through the dark current I and the hot spot temperature T of the cell, on one hand, the cell does not need to be prepared into a laminated assembly and then subjected to hot spot test, the solar cell can be directly tested on line, the solar cell without risk or with low risk can be rapidly screened out, and the test time and the test period are greatly savedThe analysis is convenient to improve; on the other hand, the method can be suitable for various types of battery slices and is wide in test range.

Description

Hot spot risk detection method for solar cell
Technical Field
The invention relates to the field of photovoltaics, in particular to a hot spot risk detection method for a solar cell, which can directly test the cell.
Background
The hot spot effect is one of adverse factors influencing the power generation performance and the service life of the photovoltaic module; the hot spot of the solar cell is one of important factors causing the hot spot of the photovoltaic module; therefore, how to screen out the battery plates with hot spot risks is particularly important.
In the prior art, under the conditions of reverse bias voltage of-12V and standard simulated sunlight, if the dark current value is less than 1A, the risk of hot spots is judged to be absent. But the method has single judgment standard, and has the defects of inapplicability to hot spot resistance of various product types.
Or after the assembly is laminated, connecting the laminating part with a reverse voltage [ the maximum power point working voltage of a single cell sheet and the number-1 of the cells controlled by one diode in the laminating part assembly ], providing standard simulated sunlight, testing the light intensity when the maximum current Impp is tested, stabilizing the light intensity at the moment, randomly selecting the cell sheet on the laminating part, shielding partial area, measuring the maximum temperature and the infrared image of the cell sheet, and observing whether the corresponding position of the cell sheet has abnormal appearance such as burn-through, oil production and the like after the temperature curve is stabilized for a plurality of times. The detection method has long test time, the time for single cell is about 30 minutes, and the time consumption is increased along with the increase of the test quantity.
In view of the above, there is a need to provide an improved method for detecting hot spot risk of a solar cell, so as to solve the above technical problems.
Disclosure of Invention
The invention aims to provide a hot spot risk detection method of a solar cell, which can directly test the cell.
In order to achieve the purpose, the invention adopts the following technical scheme:
a hot spot risk detection method for a solar cell comprises the following steps:
s1, carrying out hot spot test on the battery piece to obtain the dark current I and the hot spot temperature T of the battery piece;
s2 if dark current I is in [0, I ]1]The hot spot temperature T belongs to [0, T ∈1]Or dark current I ∈ [ I ]1，I2]The hot spot temperature T belongs to [0, T ∈2]The solar cell slice has no risk of hot spots; wherein I1＜I2，T1＞T2。
Furthermore, if the dark current I belongs to [0,0.3A ] and the hot spot temperature T belongs to [0, 4 ℃ C ], or the dark current I belongs to [0.3A, 1A ] and the hot spot temperature T belongs to [0, 2 ℃ C ], the solar cell slice has no hot spot risk.
Further, before step S2, the method for detecting hot spot risk of a solar cell further includes a step of establishing a screening criterion, where the step of establishing the screening criterion includes:
carrying out hot spot test on a plurality of cell samples to obtain dark current I and hot spot temperature T of the cell samples;
preparing the cell samples into a laminated assembly and carrying out hot spot test to obtain the hot spot temperature T of each cell sample in the laminated assemblyVerificationScreening out TVerificationNot higher than the hot spot risk threshold TRisksThe selected cell samples are used to form a laminated assemblyThe previous dark current H and the hot spot temperature T together define conditions that are free of hot spot risk.
Further, the step of establishing the screening criteria comprises:
defining a plurality of dark current intervals and a plurality of temperature intervals, wherein a detection interval is defined by any one of the dark current intervals and any one of the temperature intervals;
carrying out hot spot test on a plurality of cell samples, and screening out cell samples with dark current I and hot spot temperature T falling into a plurality of detection intervals as calibration samples;
manufacturing the checking samples into a laminated assembly and carrying out hot spot test to obtain the hot spot temperature T of each checking sample in the laminated assemblyVerificationScreening out TVerificationNot higher than the hot spot risk threshold TRisksThe detection interval where the dark current H and the hot spot temperature T of the screened calibration samples are located before the lamination assembly is formed is the detection interval without the hot spot risk.
Further, the several dark current intervals include: [0,0.3A ], (0.3A,1A ], wherein the hot spot temperature ranges include [0[2 ℃ ], (2 ℃ [4 ℃ ], (4 ℃. (. degree.C., + ∞).
Further, after the hot spot test is carried out on the battery piece sample, marking the position of the hot spot on the battery piece sample; and scribing before laminating, and selecting a plurality of half sheets with hot spots to laminate to form the laminated assembly.
Further, TRisksBetween 1(0 ℃ C. [180 ℃ C.).
Further, the hot spot risk detection method of the solar cell further comprises the following steps of: horizontally placing the battery piece on a test platform, rotating the battery piece for a plurality of angles in the plane, carrying out hot spot test at each angle, and adjusting at least one of the height and the angle of a temperature detector until the difference value of the hot spot temperature T measured by the battery piece at different angles is not more than a threshold value TDifference (D)。
Further, the hot spot risk detection method of the solar cell further comprises the following steps of calibrating the test voltage V and the test time length H:
applying a fixed test voltage V to the cell, adjusting the test duration H, performing multiple hot spot tests under the condition of each test duration H, and selecting the test duration H with the measurement deviation of the cell not more than 5%0；
And/or fixing the test duration H, adjusting the test voltage V, performing multiple hot spot tests under each test voltage V, and selecting the test voltage V with the measurement deviation of the battery piece not more than 5%0。
Furthermore, the difference of the hot spot temperature T of the battery cells on different test lines is less than or equal to 0.25, and the measurement deviation of the hot spot temperature T of the battery cells on each test line is less than or equal to 5%.
The invention has the beneficial effects that: according to the hot spot risk detection method of the solar cell, the hot spot risk of the cell is judged according to the dark current I and the hot spot temperature T of the cell, on one hand, the cell does not need to be prepared into a laminated assembly and then subjected to hot spot test, the solar cell can be directly tested on line, the solar cell without risk or with low risk is rapidly screened out, the test time and period are greatly saved, and the analysis and improvement are facilitated; on the other hand, the method can be suitable for various types of battery slices and is wide in test range.
Drawings
FIG. 1 is a schematic diagram of a hot spot detection apparatus according to a preferred embodiment of the present invention;
FIG. 2 is a graph showing the relationship between the test voltage V and the hot spot temperature T under the conditions that the test time length H is the same and the test voltage V is V1, V2 and V3 respectively;
FIG. 3 is a graph showing the relationship between the test duration H and the hotspot temperature T under the conditions that the test voltages V are the same and the test durations H are H1, H2 and H3, respectively;
FIG. 4 is a graph of hot spot temperature T of a cell sheet as a function of cell dark current when characterized by a laminate hot spot test;
FIG. 5 is a graph comparing the hot spot temperature T on different test lines;
FIG. 6 is a graph comparing the measured deviation of the hotspot temperature T on different test lines.
Detailed Description
The present invention will be described in detail below with reference to specific embodiments shown in the drawings. These embodiments are not intended to limit the present invention, and structural, methodological, or functional changes made by those skilled in the art according to these embodiments are included in the scope of the present invention.
In the various drawings of the present invention, some dimensions of structures or portions are exaggerated relative to other structures or portions for convenience of illustration, and thus, are used only to illustrate the basic structure of the subject matter of the present invention.
The hot spot risk detection method of the solar cell provided by the invention is used for testing through the hot spot detection device 100, and the hot spot detection device 100 can adopt the prior art and can also be a subsequently developed test device.
For example, as shown in fig. 1, the hot spot detection device 100 at least includes a test platform 1 for carrying a solar cell, a simulated light source 2 for providing simulated sunlight to the solar cell, a power supply 3 for providing electric energy to the solar cell, and a temperature detector 4 for acquiring a temperature of the solar cell; the drawing is intended to show the positional relationship of the respective components, and the connection structure between them is omitted.
The testing platform 1 is provided with a hollow part and an upper probe 5 and a lower probe 5 which are electrically connected with the power supply 3, and the testing platform 1 is a rotating platform and can drive the solar cell M to horizontally rotate. The simulation light source 2 and the temperature detector 4 are both located above the test platform 1 so as to test the front surface of the solar cell. The temperature detector 4 is an infrared camera and can capture the temperature of the solar cell M.
The test process is as follows: the method comprises the steps of placing a solar cell M on a test platform 1, pressing down an upper probe 5 and a lower probe 5 to enable the upper probe and the lower probe to be respectively contacted with the positive electrode and the negative electrode of the solar cell M, starting a temperature detector 4 to obtain an initial temperature T1 of the surface of the solar cell M, connecting a test voltage V to the solar cell M, keeping a test duration H, obtaining a highest temperature T2 of the surface of the solar cell through the temperature detector 4, and testing an output hot spot temperature T ═ T1-T1.
The invention discloses a hot spot risk detection method of a solar cell, which comprises the following steps: s1, carrying out hot spot test on the battery piece to obtain the dark current I and the hot spot temperature T of the battery piece; s2 if dark current I is in [0, I ]1]The hot spot temperature T belongs to [0, T ∈1]Or dark current I ∈ [ I ]1，I2]The hot spot temperature T belongs to [0, T ∈2]The solar cell slice has no risk of hot spots; wherein I1＜I2，T1＞T2。
According to the method, the hot spot risk of the cell is evaluated through the dark current I and the hot spot temperature T of the cell, on one hand, the cell does not need to be prepared into a laminated assembly and then subjected to hot spot test, the solar cell can be directly tested on line, the solar cell without risk or with low risk is rapidly screened out, the test time and period are greatly saved, and the analysis and improvement are facilitated; on the other hand, the method can be suitable for various types of battery slices and is wide in test range.
In order to improve the accuracy of the test, the hot spot risk detection method for the solar cell further comprises the following steps: before the hot spot test is carried out on the battery piece, the hot spot detection device is verified to eliminate test errors.
Specifically, a battery piece is horizontally placed on a test platform 1, the battery piece is rotated by a plurality of angles in a plane and hot spot test is carried out at each angle, at least one of the height and the angle of a temperature detector 4 is adjusted until the difference value of hot spot temperatures T measured by the battery piece at different angles is not more than a threshold value TDifference (D)(ii) a And fixing the position of the temperature detector. By checking the position of the temperature detector 4 through this step, a test error caused by inconsistency of the test directions can be avoided.
As will be appreciated by those skilled in the art, the threshold T isDifference (D)The smaller the value of (A), the smaller the test error; preferably 0 or close to 0.
In a specific embodiment, the battery piece is repeatedly tested for several times at two angles of 0 ° and 180 °, and the point where the hot spot temperature T of the battery piece is similar or identical at 0 ° and 180 ° is found by adjusting the height and angle of the temperature detector 4.
The hot spot risk detection method of the solar cell further comprises the following steps: before the hot spot test is carried out on the battery piece, the calibration steps of the test voltage V and the test duration H are as follows: applying a fixed test voltage V to the cell, adjusting the test duration H, performing multiple hot spot tests under the condition of each test duration H, and selecting the test duration H with the measurement deviation of the cell not more than 5%0(ii) a And/or fixing the test duration H, adjusting the test voltage V, performing multiple hot spot tests under each test voltage V, and selecting the test voltage V with the measurement deviation of the battery piece not more than 5%0. Wherein the test voltage V is in the range of-20V < -10V, and the test duration H is in the range of 12ms [84 ms.
In the step, a plurality of solar cells are selected, the solar cells are tested repeatedly for a plurality of times at the same angle, for example, the solar cells are tested for 3 times at 0 degrees, the test voltage V is adjusted under the condition that the test time length H is constant, or the test time length H is adjusted under the condition that the test voltage V is constant, and the test condition that the measurement deviation of each solar cell is not greater than the threshold value is selected, so that the dynamic repeatability error can be reduced, and the test accuracy is improved.
In a preferred embodiment, the deviation (T) is measuredMaximum value-TMinimum value]/[TMaximum value+TMinimum value]Not more than 5%; the accuracy of the test is ensured.
In the process, the preferable test duration H is unchanged, the magnitude of the test voltage V is adjusted, and the test data is prevented from generating displacement.
Further, the hot spot risk detection method for the solar cell further comprises the following steps: and simulating the relation between the test voltage V and the hot spot temperature T or the relation between the test duration H and the hot spot temperature T. Specifically, a plurality of solar cells, for example 9 solar cells, are selected as samples; under the condition that the test time length H is constant, the test voltage V is adjusted to be V1, V2 and V3 … … respectively, and the test is carried out to obtain the curve relation between the hot spot temperature T and the test voltage V and to be used as a reference basis for adjusting the test voltage V.
In a specific embodiment, 9 solar cells are selected, and under the condition that the test time length H is not changed, different voltages | V1| < | V2| < | V3|, are selected for testing, and the relationship between the hot spot temperature T and the test voltage V is shown in fig. 2.
Or, the hot spot risk detection method of the solar cell further comprises the following steps: the relationship between the test duration H and the hot spot temperature T was simulated. Specifically, several solar cells, for example, 9 solar cells, are selected as a sample; under the condition that the test voltage V is fixed, adjusting the test time length H to be H1, H2 and H3 … … respectively, and measuring to obtain the curve relation between the hot spot temperature T and the test time length H; as a reference when adjusting the test duration H.
In a specific embodiment, 9 solar cells are selected, the test duration H1 < H2 < H3 is selected under the condition that the test voltage V is not changed, and the test is performed, and the relationship between the hot spot temperature T and the test duration H is shown in fig. 3, where the data of the sample 3 with abnormal data is removed, and when the test voltages V are the same, the larger the test duration H is, the smaller the hot spot temperature T is.
Before the battery piece is subjected to hot spot test, the verification of the hot spot detection device and the calibration of the test voltage V and the test duration H are completed; then under the preferred conditions, to test the voltage V0Duration of test H0The hot spot test was performed for the test conditions.
Further, before step S2, the method for detecting hot spot risk of a solar cell further includes a step of establishing a screening criterion, where the step of establishing the screening criterion includes:
carrying out hot spot test on a plurality of cell samples to obtain dark current I and hot spot temperature T of the cell samples; the number of the cell samples is at least 30, preferably at least 100, and more accurate screening conditions can be obtained through a large amount of data.
Preparing the cell samples into a laminated assembly and carrying out hot spot test to obtain the hot spot temperature T of each cell sample in the laminated assemblyVerificationScreening out TVerificationNot higher than the hot spot risk threshold TRisksThe screening ofThe dark current H and the hot spot temperature T of the cell sheet samples taken prior to forming the laminate assembly collectively define conditions that are free of the risk of hot spots.
Specifically, the step of establishing the screening criteria comprises the following steps:
defining a plurality of dark current intervals and a plurality of temperature intervals, wherein a detection interval is defined by any one of the dark current intervals and any one of the temperature intervals; through quantizing the detection interval, the subsequent screening of the cell samples is facilitated.
Carrying out hot spot test on a plurality of cell samples, and screening out cell samples with dark current I and hot spot temperature T falling into a plurality of detection intervals as calibration samples; in the process, the check samples cover all the detection intervals as much as possible, that is, each detection interval has at least one check sample, and preferably, each detection interval has a plurality of check samples according to euro-meter, so that each detection interval can be effectively checked.
Manufacturing the checking samples into a laminated assembly and carrying out hot spot test to obtain the hot spot temperature T of each checking sample in the laminated assemblyVerificationScreening out TVerificationNot higher than the hot spot risk threshold TRisksThe detection interval where the dark current H and the hot spot temperature T of the screened calibration samples are located before the lamination assembly is formed is the detection interval without the hot spot risk. In one embodiment, TRisksBetween 1(0 ℃ C. [180 ℃ C., for example 170 ℃ C.).
In an embodiment, according to the statistics of the test big data, the dark current intervals include: the method comprises the following steps of [0,0.3A ], (0.3A,1A ], wherein a plurality of hot spot temperature ranges comprise [0[2 ], (2 [4 ], (4 [ (° C), (+ ∞) or more, the detection range is reasonable, only the cell samples falling into the corresponding range are verified, and unnecessary workload is greatly reduced.
After the hot spot test is carried out on the battery piece sample, marking the position of the hot spot on the battery piece sample; and scribing before lamination, selecting a plurality of half sheets with hot spots to be laminated to form the laminated assembly, and abandoning further testing after lamination for other half sheets, wherein the testing data is more accurate.
As shown in fig. 4, the screening criteria of the battery piece established by the above steps: when the solar cell is subjected to a hot spot test, if the dark current I belongs to [0,0.3A ], the hot spot temperature T belongs to [0, 4 ℃ or the dark current I belongs to [0.3A, 1A ], the hot spot temperature T belongs to [0, 2 ℃), the solar cell has no hot spot risk; and the dark current I belongs to [0,0.3A ], the hot spot temperature T belongs to [4 ℃, + ∞ ], or the dark current I belongs to [0.3A, 1A ], the hot spot temperature T belongs to [2 ℃, + ∞ ], the solar cell has the risk of hot spot, and the laminated assembly can not be further manufactured.
Therefore, the hot spot of the laminated assembly is not needed to be tested again, the battery piece has the hot spot control standard, the testing time can be only dozens of ms, whether the hot spot risk exists can be judged, the testing time and the testing period are greatly saved, and meanwhile, the analysis and the improvement are convenient.
Further, as shown in fig. 5 and the drawings (which show that, according to the module safety interval standard, that is, the screening standard of the battery piece, the battery piece is imported for hot spot testing, by adjusting the parameters of the testing voltage V or the testing time H, the difference of the hot spot temperatures T of the battery piece on different testing lines is less than or equal to 0.25, and the measurement deviation of the hot spot temperatures T of the battery piece on each testing line is less than or equal to 5%.
In conclusion, according to the hot spot risk detection method of the solar cell, the hot spot risk of the solar cell is evaluated through the dark current I and the hot spot temperature T of the solar cell, on one hand, the solar cell can be directly tested on line without preparing the solar cell into a laminated assembly and then carrying out hot spot test, and the solar cell without risk or with low risk is rapidly screened out, so that the test time and period are greatly saved, and the analysis and improvement are facilitated; on the other hand, the method can be suitable for various types of battery slices and is wide in test range.
It should be understood that although the present description refers to embodiments, not every embodiment contains only a single technical solution, and such description is for clarity only, and those skilled in the art should make the description as a whole, and the technical solutions in the embodiments can also be combined appropriately to form other embodiments understood by those skilled in the art.
The above-listed detailed description is only a specific description of a possible embodiment of the present invention, and they are not intended to limit the scope of the present invention, and equivalent embodiments or modifications made without departing from the technical spirit of the present invention should be included in the scope of the present invention.

Claims (10)

1. A hot spot risk detection method of a solar cell is characterized by comprising the following steps:
s1, carrying out hot spot test on the battery piece to obtain the dark current I and the hot spot temperature T of the battery piece;
s2 if dark current I is in [0, I ]1]The hot spot temperature T belongs to [0, T ∈1]Or dark current I ∈ [ I ]1，I2]The hot spot temperature T belongs to [0, T ∈2]The solar cell slice has no risk of hot spots; wherein I1＜I2，T1＞T2。
2. The method for detecting the hot spot risk of the solar cell sheet according to claim 1, wherein the solar cell sheet has no hot spot risk if the dark current I e [0,0.3A ], the hot spot temperature T e [0, 4 ℃ ], or the dark current I e [0.3A, 1A ], the hot spot temperature T e [0, 2 ℃ ].
3. The method for detecting the risk of hot spots of a solar cell slice according to claim 1, wherein before the step S2, the method for detecting the risk of hot spots of a solar cell slice further comprises a step of establishing a screening criterion, and the step of establishing the screening criterion comprises:
carrying out hot spot test on a plurality of cell samples to obtain dark current I and hot spot temperature T of the cell samples;
preparing the cell samples into a laminated assembly and carrying out hot spot test to obtain the hot spot temperature T of each cell sample in the laminated assemblyVerificationScreening out TVerificationNot higher than the hot spot risk threshold TRisksThe dark current H and the hot spot temperature T of the selected cell sheet samples together define a condition without the risk of hot spots before forming the laminated assembly.
4. The method for detecting the risk of hot spots of a solar cell according to claim 3, wherein the step of establishing the screening criteria comprises:
defining a plurality of dark current intervals and a plurality of temperature intervals, wherein a detection interval is defined by any one of the dark current intervals and any one of the temperature intervals;
carrying out hot spot test on a plurality of cell samples, and screening out cell samples with dark current I and hot spot temperature T falling into a plurality of detection intervals as calibration samples;
manufacturing the checking samples into a laminated assembly and carrying out hot spot test to obtain the hot spot temperature T of each checking sample in the laminated assemblyVerificationScreening out TVerificationNot higher than the hot spot risk threshold TRisksThe detection interval where the dark current H and the hot spot temperature T of the screened calibration samples are located before the lamination assembly is formed is the detection interval without the hot spot risk.
5. The method for detecting the hot spot risk of the solar cell slice according to claim 4, wherein the dark current intervals comprise: [0,0.3A ], (0.3A,1A ], wherein the hot spot temperature ranges include [0[2 ℃ ], (2 ℃ [4 ℃ ], (4 ℃. (. degree.C., + ∞).
6. The method for detecting the hot spot risk of the solar cell slice according to claim 4, wherein after the hot spot test is performed on the cell slice sample, the position of the hot spot is marked on the cell slice sample; and scribing before laminating, and selecting a plurality of half sheets with hot spots to laminate to form the laminated assembly.
7. The method for detecting the hot spot risk of the solar cell according to claim 4, wherein T is TRisksBetween 1(0 ℃ C. [180 ℃ C.).
8. The method for detecting the risk of hot spots of a solar cell according to any one of claims 1 to 7, further comprising the step of verifying a hot spot detection device: horizontally placing the battery piece on a test platform, rotating the battery piece for a plurality of angles in the plane, carrying out hot spot test at each angle, and adjusting at least one of the height and the angle of a temperature detector until the difference value of the hot spot temperature T measured by the battery piece at different angles is not more than a threshold value TDifference (D)。
9. The method for detecting the hot spot risk of the solar cell piece according to any one of claims 1[7 ], wherein the method for detecting the hot spot risk of the solar cell piece further comprises a calibration step of a test voltage V and a test time length H:
applying a fixed test voltage V to the cell, adjusting the test duration H, performing multiple hot spot tests under the condition of each test duration H, and selecting the test duration H with the measurement deviation of the cell not more than 5%0；
And/or fixing the test duration H, adjusting the test voltage V, performing multiple hot spot tests under each test voltage V, and selecting the test voltage V with the measurement deviation of the battery piece not more than 5%0。
10. The method for detecting the hot spot risk of the solar cell according to any one of claims 1 to 7, wherein the difference of the hot spot temperatures T of the cell on different test lines is less than or equal to 0.25, and the measurement deviation of the hot spot temperatures T of the cell on each test line is less than or equal to 5%.
CN202010895003.1A 2020-08-31 2020-08-31 Hot spot risk detection method for solar cell Pending CN114121697A (en)

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Citations (4)

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