CN109037091B - Sliced battery reference piece and calibration method thereof - Google Patents
Sliced battery reference piece and calibration method thereof Download PDFInfo
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- CN109037091B CN109037091B CN201810602727.5A CN201810602727A CN109037091B CN 109037091 B CN109037091 B CN 109037091B CN 201810602727 A CN201810602727 A CN 201810602727A CN 109037091 B CN109037091 B CN 109037091B
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67271—Sorting devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67282—Marking devices
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Abstract
The invention discloses a calibration method of a reference sheet of a sliced battery, which belongs to the field of photovoltaics and comprises the following steps: obtaining the short-circuit current of the whole battery piece and the short-circuit current of the sliced battery piece through QE test, testing the whole battery piece by using a battery piece detection machine, adjusting the light intensity of the battery piece detection machine to enable the measured short-circuit current to be the same as the short-circuit current of the whole battery piece, and taking the light intensity of the battery piece detection machine as the standard light intensity for testing the whole battery piece; connecting the sliced battery piece and the dummy piece to obtain a dummy piece; the whole battery piece is assumed to be the same as the whole battery piece in shape; and detecting the sliced battery piece by the battery piece detecting machine under the standard light intensity to obtain the open-circuit voltage Uoc and the filling factor FF of the sliced battery piece. The reference sheet calibrated by the calibration method can solve the problems that sliced battery sheets cannot be tested and graded according to efficiency because the sliced battery reference sheet calibrates a battery sheet detection machine after slicing. The invention also provides a sliced battery reference slice.
Description
Technical Field
The invention relates to the technical field of photovoltaics, in particular to a sliced battery reference piece and a calibration method thereof.
Background
With the continuous development and progress of the photovoltaic industry technology, the power of the crystalline silicon module is rapidly improved all the time, and high-power crystalline silicon solar modules such as half-piece and lamination become the mainstream direction of the development of the photovoltaic industry gradually.
The slice battery assembly is designed and packaged, so that power loss can be reduced better, output power is improved, and meanwhile, the hot spot resistance of the assembly is enhanced due to the optimized circuit design. Due to uneven distribution of defects inside the crystalline silicon material and process differences of the battery, spectral responses of all regions of the battery are not completely consistent, and therefore the obtained sliced batteries are different. In the existing production line, due to the fact that no sliced battery reference sheet exists, the sliced battery cannot be retested and graded, and therefore the phenomena of light and shade and the like of each sliced battery with differences in the same battery string under EL (electroluminescence) detection of the component finally affect the overall output power of the component.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a calibration method of a sliced battery reference piece, which solves the problem that no sliced battery reference piece exists at present.
A calibration method of a sliced battery reference plate comprises the following steps:
obtaining absolute spectral response of the whole cell through a QE test, and integrating the absolute spectral response of the whole cell with an AM1.5 spectrum to obtain short-circuit current of the whole cell;
obtaining absolute spectral response of the sliced cell through a QE test, and integrating the absolute spectral response of the sliced cell and an AM1.5 spectrum to obtain short-circuit current of the sliced cell;
testing the whole battery piece by adopting a battery piece detection machine platform, adjusting the light intensity of the battery piece detection machine platform to enable the measured short-circuit current to be the same as the short-circuit current of the whole battery piece, and taking the light intensity of the battery piece detection machine platform as the standard light intensity for testing the whole battery piece;
connecting the sliced battery piece with the dummy piece to obtain a dummy whole piece; the shape of the fake whole piece is the same as that of the whole battery piece;
and placing the fake whole piece into a battery piece detection machine, and detecting the sliced battery piece by the battery piece detection machine under the standard light intensity to obtain the open-circuit voltage Uoc and the filling factor FF of the sliced battery piece.
Preferably, in the QE test, the measured light spot is equal to or larger than the area of the cell.
Preferably, before the sliced battery is detected by the battery detection machine under the standard light intensity, the arrangement of the probes on the battery detection machine is adjusted, so that the arrangement of the probes on the battery detection machine is matched with the shape of the whole battery.
Preferably, when the sliced battery piece is detected by the battery piece detecting machine under the standard light intensity, the upper probe of the battery piece detecting machine is a flat-head probe with the diameter of 1.5mm, and the bottom probe is a plum-blossom probe.
Preferably, when the sliced battery piece and the dummy piece are connected, the sliced battery piece and the dummy piece are connected by using an insulating tape to insulate the sliced battery piece and the dummy piece.
Preferably, before the step of detecting the sliced battery piece by using a battery piece detection machine under standard light intensity, the bottom probe corresponding to the dummy piece position is pulled out, so that the bottom probe is not contacted with the dummy piece; and an insulating adhesive tape is arranged on the upper probe corresponding to the dummy piece position so as to insulate the upper probe from the dummy piece.
Preferably, before the whole battery is tested by using the battery detection machine, the battery detection machine is calibrated by using a Fraunhofer primary standard sheet.
Preferably, when the Fraunhofer primary standard sheet is used for calibrating the battery sheet detection machine, the temperature Tcell of a test environment is 24-26 ℃, and the difference value between the test voltage and the calibration voltage is-1 mV.
The invention also provides a sliced battery reference piece which is obtained by calibration through the calibration method.
Compared with the prior art, the invention has the following beneficial technical effects:
according to the calibration method of the reference slice of the sliced battery, disclosed by the invention, the short-circuit current of the whole battery slice and the short-circuit current of the sliced battery slice are obtained through QE (quality enhancement experiment); testing the whole battery piece by adopting a battery piece detection machine platform to obtain the standard light intensity of the whole battery piece; the battery piece detection machine station detects the sliced battery piece under the standard light intensity to obtain the open-circuit voltage Uoc and the filling factor FF of the sliced battery piece, so that the data calibration of the reference piece short-circuit current, the short-circuit voltage Uoc and the filling factor FF of the sliced battery piece is completed.
The sliced battery reference sheet obtained by the calibration method can be used for detecting and classifying the sliced battery sheets, is simple and convenient to operate, and solves the problems that the sliced battery sheets cannot be tested and are graded according to efficiency because the sliced battery reference sheet is not used for calibrating the battery sheet detection table machine after slicing.
Drawings
Fig. 1 is a flowchart of a calibration method for a sliced battery reference sheet according to an embodiment of the present invention.
Detailed Description
The present invention will now be described in further detail with reference to specific examples, which are intended to be illustrative, but not limiting, of the invention.
As shown in FIG. 1, the steps of the preferred embodiment of the calibration method for the reference sheet of the sliced battery of the invention are as follows:
Obtaining absolute spectral response of the sliced cell through QE test, and integrating the absolute spectral response of the sliced cell and the AM1.5 spectrum to obtain the short-circuit current Isc of the sliced cellCutting machine。
and 5, detecting the sliced battery piece by the battery piece detection machine under the standard light intensity obtained in the step 3 to obtain the open-circuit voltage Uoc and the filling factor FF of the sliced battery piece.
Short-circuit current Isc of sliced batteryCutting machineExamination ofAnd measuring the short-circuit current, the open-circuit voltage Uoc and the filling factor FF of the sliced battery piece as calibration values of the sliced battery piece to be calibrated, and using the sliced battery piece as a sliced battery reference piece, so that the sliced battery reference piece is calibrated, namely the sliced battery reference piece original data. When the slicing battery grading device is used, the slicing batteries are graded by using the calibrated slicing battery reference slices.
For convenience of description, the short-circuit current Isc of the whole cell obtained in the step 1 is describedMachine for finishingIs named as step A; obtaining the short-circuit current Isc of the sliced battery pieceCutting machineThe step (2) is named as B.
It is understood that, in the above step 1, step a and step B may be performed simultaneously; or step A can be carried out first, and then step B can be carried out; step B may also be performed first, followed by step a. It is also understood that the present invention has no particular limitation on when step B is performed, and for example, step B may be performed after any of step 2, step 3, step 4, and step 5.
As a preferred embodiment of the present invention: in the QE test, the measured light spot is equal to or larger than the area of the cell.
As a preferred embodiment of the present invention: before the battery piece detection machine is used for detecting the sliced battery pieces under standard light intensity, the arrangement of the probes on the battery piece detection machine is adjusted, so that the arrangement of the probes on the battery piece detection machine is matched with the shape of the whole battery.
As a preferred embodiment of the present invention: when a battery piece detection machine is used for detecting sliced battery pieces under standard light intensity, the upper probe of the battery piece detection machine is a flat-head probe with the diameter of 1.5mm, and the bottom probe is a plum-blossom probe.
As a preferred embodiment of the present invention: when the sliced battery piece and the dummy piece are connected, the sliced battery piece and the dummy piece are connected by using an insulating adhesive tape so as to insulate the sliced battery piece and the dummy piece. Thus, the influence of the false slice on the sliced cell can be avoided.
As a preferred embodiment of the present invention: before the step of detecting the sliced battery piece by using a battery piece detection machine under standard light intensity, pulling out a bottom probe corresponding to the dummy piece position so as to ensure that the bottom probe is not in contact with the dummy piece; and an insulating adhesive tape is arranged on the upper probe corresponding to the dummy piece position so as to insulate the upper probe from the dummy piece. Therefore, the influence of the dummy wafer area on the test result is further reduced, and the calibration accuracy is further improved.
As a preferred embodiment of the present invention: the battery piece detection machine adopts a palm detection machine.
The sliced battery reference piece is obtained by calibrating the calibration method provided by the invention.
The reference slice of the sliced battery provided by the invention is used for calibrating a battery slice test machine, the electrical performance parameters of the sliced battery are detected by the calibrated battery slice test machine, and then the sliced battery is graded according to the efficiency of the sliced battery.
The embodiments of the present invention are merely illustrative of the spirit of the present invention, and those skilled in the art can modify the described embodiments or substitute them with similar ones without departing from the spirit of the present invention.
Claims (7)
1. A calibration method of a sliced battery reference plate is characterized by comprising the following steps:
obtaining absolute spectral response of the whole cell through a QE test, and integrating the absolute spectral response of the whole cell with an AM1.5 spectrum to obtain short-circuit current of the whole cell;
obtaining absolute spectral response of the sliced cell through a QE test, and integrating the absolute spectral response of the sliced cell and an AM1.5 spectrum to obtain short-circuit current of the sliced cell;
testing the whole battery piece by adopting a battery piece detection machine platform, adjusting the light intensity of the battery piece detection machine platform to enable the measured short-circuit current to be the same as the short-circuit current of the whole battery piece, and taking the light intensity of the battery piece detection machine platform as the standard light intensity for testing the whole battery piece;
connecting the sliced battery piece with the dummy piece to obtain a dummy whole piece; the shape of the fake whole piece is the same as that of the whole battery piece;
placing the fake whole piece into a battery piece detection machine, and detecting the sliced battery piece by the battery piece detection machine under the standard light intensity to obtain the open-circuit voltage and the filling factor of the sliced battery piece;
when the sliced battery piece is connected with the dummy piece, the sliced battery piece is connected with the dummy piece by adopting an insulating adhesive tape so as to insulate the sliced battery piece from the dummy piece;
before the step of detecting the sliced battery piece by using a battery piece detection machine under standard light intensity, pulling out a bottom probe corresponding to the dummy piece position so as to ensure that the bottom probe is not in contact with the dummy piece; and an insulating adhesive tape is arranged on the upper probe corresponding to the dummy piece position so as to insulate the upper probe from the dummy piece.
2. The method for calibrating the sliced cell reference plate as claimed in claim 1, wherein the measured light spot in the QE test is equal to or larger than the area of the cell plate.
3. The method for calibrating the sliced cell reference plate of claim 1, wherein before the sliced cell is detected by the cell detection machine under the standard light intensity, the arrangement of the probes on the cell detection machine is adjusted to match the arrangement of the probes on the cell detection machine with the shape of the whole cell.
4. The method for calibrating the sliced battery reference plate as claimed in claim 3, wherein when the sliced battery is detected by the battery plate detecting machine under the standard light intensity, the upper probe of the battery plate detecting machine is a flat-head probe with the diameter of 1.5mm, and the bottom probe is a plum-blossom probe.
5. The method for calibrating the reference sheet of the sliced battery as claimed in claim 1, wherein before the whole battery is tested by the battery tester, the battery tester is calibrated by using a Fraunhofer primary standard sheet.
6. The method for calibrating the reference sheet of the sliced battery as claimed in claim 5, wherein when the Fraunhofer primary standard sheet is used for calibrating the battery sheet detection machine, the temperature Tcell of the test environment is 24-26 ℃, and the difference between the test voltage and the calibration voltage is-1 mV.
7. A sliced cell reference plate, characterized in that the sliced cell reference plate is calibrated by the calibration method of any one of claims 1 to 6.
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CN109714001A (en) * | 2018-12-27 | 2019-05-03 | 苏州阿特斯阳光电力科技有限公司 | A kind of detection method of solar battery cutting damage |
CN112289698A (en) * | 2020-10-28 | 2021-01-29 | 天合光能股份有限公司 | Calibration method of sliced battery standard slice |
CN114843369A (en) * | 2022-04-28 | 2022-08-02 | 晶科能源(海宁)有限公司 | Monitoring method of solar cell preparation process |
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CN101598763A (en) * | 2008-06-06 | 2009-12-09 | 上海太阳能科技有限公司 | The proving installation of small-size solar cell slice |
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JP4944231B2 (en) * | 2010-08-11 | 2012-05-30 | コニカミノルタセンシング株式会社 | Solar cell evaluation device and light source evaluation device used therefor |
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CN101598763A (en) * | 2008-06-06 | 2009-12-09 | 上海太阳能科技有限公司 | The proving installation of small-size solar cell slice |
CN103308841A (en) * | 2013-06-14 | 2013-09-18 | 奥特斯维能源(太仓)有限公司 | Method for calibrating four main gate marking piece |
CN103633935A (en) * | 2013-11-21 | 2014-03-12 | 上海伟信新能源科技有限公司 | Calibrating method and device of reference solar cell piece |
CN103944511A (en) * | 2014-04-22 | 2014-07-23 | 英利集团有限公司 | Calibration method for solar cells |
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