CN113015901A - 玻璃板的制造方法以及玻璃板的制造装置 - Google Patents

玻璃板的制造方法以及玻璃板的制造装置 Download PDF

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Publication number
CN113015901A
CN113015901A CN201980074032.7A CN201980074032A CN113015901A CN 113015901 A CN113015901 A CN 113015901A CN 201980074032 A CN201980074032 A CN 201980074032A CN 113015901 A CN113015901 A CN 113015901A
Authority
CN
China
Prior art keywords
light
glass plate
irradiation device
light irradiation
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201980074032.7A
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English (en)
Chinese (zh)
Inventor
井上厚司
本乡修司
植村弥浩
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Electric Glass Co Ltd
Original Assignee
Nippon Electric Glass Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Glass Co Ltd filed Critical Nippon Electric Glass Co Ltd
Publication of CN113015901A publication Critical patent/CN113015901A/zh
Pending legal-status Critical Current

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    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B33/00—Severing cooled glass
    • C03B33/02—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor
    • C03B33/023—Cutting or splitting sheet glass or ribbons; Apparatus or machines therefor the sheet or ribbon being in a horizontal position
    • C03B33/037—Controlling or regulating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P40/00—Technologies relating to the processing of minerals
    • Y02P40/50—Glass production, e.g. reusing waste heat during processing or shaping
    • Y02P40/57—Improving the yield, e-g- reduction of reject rates

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • Textile Engineering (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CN201980074032.7A 2018-11-21 2019-10-25 玻璃板的制造方法以及玻璃板的制造装置 Pending CN113015901A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018218233A JP2020085587A (ja) 2018-11-21 2018-11-21 ガラス板の製造方法、及びガラス板の製造装置
JP2018-218233 2018-11-21
PCT/JP2019/041955 WO2020105368A1 (ja) 2018-11-21 2019-10-25 ガラス板の製造方法、及びガラス板の製造装置

Publications (1)

Publication Number Publication Date
CN113015901A true CN113015901A (zh) 2021-06-22

Family

ID=70773993

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980074032.7A Pending CN113015901A (zh) 2018-11-21 2019-10-25 玻璃板的制造方法以及玻璃板的制造装置

Country Status (4)

Country Link
JP (1) JP2020085587A (ja)
CN (1) CN113015901A (ja)
TW (1) TW202043760A (ja)
WO (1) WO2020105368A1 (ja)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113628212A (zh) * 2021-10-12 2021-11-09 高视科技(苏州)有限公司 不良偏光片识别方法、电子设备和存储介质

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113484333B (zh) * 2021-09-08 2021-12-14 苏州高视半导体技术有限公司 多层结构屏幕的异物缺陷区分方法、电子设备及存储介质

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116703A (ja) * 1999-10-21 2001-04-27 M I L:Kk 容器内浮遊物判別方法及びその装置
JP2001208702A (ja) * 2000-01-31 2001-08-03 Nippon Sheet Glass Co Ltd 欠点検査方法及び欠点検査装置
JP2007198761A (ja) * 2006-01-24 2007-08-09 Canon Chemicals Inc 欠陥検出方法および装置
CN101311706A (zh) * 2007-05-24 2008-11-26 优志旺电机株式会社 图形检查装置及图形检查方法
CN101473218A (zh) * 2006-05-12 2009-07-01 康宁股份有限公司 用于表征透明基底中的缺陷的装置和方法
JP2010249552A (ja) * 2009-04-13 2010-11-04 Central Glass Co Ltd ガラス板の欠陥識別方法および装置
CN102132148A (zh) * 2008-08-25 2011-07-20 旭硝子株式会社 缺陷检查***及缺陷检查方法
US20130044209A1 (en) * 2011-08-18 2013-02-21 Samsung Corning Precision Materials Co., Ltd. Apparatus and method for detecting the surface defect of the glass substrate
CN105372267A (zh) * 2014-08-11 2016-03-02 东京威尔斯股份有限公司 透明基板的外观检查装置以及外观检查方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07234187A (ja) * 1994-02-24 1995-09-05 G T C:Kk ガラス基板の表面欠点検出方法およびその装置
JP2011203132A (ja) * 2010-03-25 2011-10-13 Seiko Epson Corp 外観検査装置
JP5806808B2 (ja) * 2010-08-18 2015-11-10 倉敷紡績株式会社 撮像光学検査装置
FR2983583B1 (fr) * 2011-12-02 2013-11-15 Saint Gobain Dispositif d'analyse des defauts d'aspect d'un substrat transparent
JP2013152206A (ja) * 2011-12-31 2013-08-08 Shibaura Mechatronics Corp 照明装置、照明方法及び検査装置

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001116703A (ja) * 1999-10-21 2001-04-27 M I L:Kk 容器内浮遊物判別方法及びその装置
JP2001208702A (ja) * 2000-01-31 2001-08-03 Nippon Sheet Glass Co Ltd 欠点検査方法及び欠点検査装置
JP2007198761A (ja) * 2006-01-24 2007-08-09 Canon Chemicals Inc 欠陥検出方法および装置
CN101473218A (zh) * 2006-05-12 2009-07-01 康宁股份有限公司 用于表征透明基底中的缺陷的装置和方法
CN101311706A (zh) * 2007-05-24 2008-11-26 优志旺电机株式会社 图形检查装置及图形检查方法
CN102132148A (zh) * 2008-08-25 2011-07-20 旭硝子株式会社 缺陷检查***及缺陷检查方法
JP2010249552A (ja) * 2009-04-13 2010-11-04 Central Glass Co Ltd ガラス板の欠陥識別方法および装置
US20130044209A1 (en) * 2011-08-18 2013-02-21 Samsung Corning Precision Materials Co., Ltd. Apparatus and method for detecting the surface defect of the glass substrate
CN105372267A (zh) * 2014-08-11 2016-03-02 东京威尔斯股份有限公司 透明基板的外观检查装置以及外观检查方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113628212A (zh) * 2021-10-12 2021-11-09 高视科技(苏州)有限公司 不良偏光片识别方法、电子设备和存储介质
CN113628212B (zh) * 2021-10-12 2022-03-11 高视科技(苏州)有限公司 不良偏光片识别方法、电子设备和存储介质

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Publication number Publication date
TW202043760A (zh) 2020-12-01
WO2020105368A1 (ja) 2020-05-28
JP2020085587A (ja) 2020-06-04

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