CN112946454B

CN112946454B - Chip data access test system and working method thereof

Info

Publication number: CN112946454B
Application number: CN202110090282.9A
Authority: CN
Inventors: 叶显; 陶晶; 周一鸣; 吕中明; 张龙; 周迎亚; 李沈飞; 景枭; 高思琪
Original assignee: Chongqing Qinsong Technology Co ltd
Current assignee: Chongqing Qinsong Technology Co ltd
Priority date: 2021-01-22
Filing date: 2021-01-22
Publication date: 2023-07-07
Anticipated expiration: 2041-01-22
Also published as: CN112946454A

Abstract

The invention belongs to the technical field of chip testing, and discloses a chip data access testing system and a working method thereof. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis that the chip connection speed is not greatly reduced.

Description

Chip data access test system and working method thereof

Technical Field

The invention belongs to the technical field of chip testing, and particularly relates to a chip data access testing system and a working method thereof.

Background

In recent years, with the progress of related technologies such as electronic technology and networks, and the improvement of the global electronic market consumption level, the demand for electronic products such as personal computers, multimedia, workstations, networks, and communication related devices has proliferated, driving the rapid development of the semiconductor industry around the world.

Among various electronic products, the integrated circuit chip is regarded as a heart junction, so that purchasing standards of the integrated circuit chip are also the most stringent for electronic factories around the world. Therefore, each chip is tested in the chip manufacturing process, and when the chip is tested, the chip is placed into the test tool, the test tool is led into the upper computer, the test command is directly input or forwarded to the chip through the test tool, the data processing capacity of the chip is tested, and finally the processing performance data of the chip is obtained by the upper computer, so that the data access performance test of the chip is completed.

In order to facilitate the subsequent test during the manufacture of the chip, a test point A is reserved on the chip during the manufacture of the chip, as shown in FIG. 1, and the probe of the test system is connected with the test point A, so that the test can be started. However, the probes of the existing test system are driven by air cylinders, the air cylinders drive the probes to do reciprocating linear motion and drive the probes to be connected with the test points A, but the accurate positioning capability of the air cylinders is weak, the probes are easy to collide with the test points A during connection, and the chips are damaged. If the electric screw rod type device is used for driving, although the position and moment are better in the capability of accurately controlling, the electric driving device is converted from rotary motion into linear motion, and compared with the air cylinder for driving, the problem that the test speed of the chip is slow due to the fact that the time spent in the process of connecting the probe with the test point A on the chip is longer.

Disclosure of Invention

Therefore, the invention aims to provide a chip data access test system and a working method thereof, which can avoid the chip from being bumped by a probe on the basis of ensuring the test speed of the chip.

The invention solves the technical problems by the following technical means: the chip data access test system comprises a detection tool, wherein the detection tool comprises a bottom plate; the first cylinder and the second cylinder are fixed on the bottom plate, and the chip inserting structure is driven by the first cylinder to do up-and-down reciprocating motion, and a probe capable of vertically stretching is arranged on the chip inserting structure; and the chip bearing structure is driven by the second air cylinder to do horizontal reciprocating motion, the chip bearing structure and the chip plugging structure are arranged up and down oppositely, chip mounting positions are distributed on the chip bearing structure, test holes communicated with the chip mounting positions are further formed in the chip bearing structure, and sliding grooves communicated with the test holes are further formed in the side wall of the chip bearing structure, which faces the probe.

The invention also provides a scheme, a working method of the chip data access test system, which comprises a chip connection method; the chip connection method comprises the following steps: the first cylinder is controlled to lift up so that the probe is abutted in a chute on the chip bearing structure; controlling the second cylinder to move so that the probe slides along the chute towards the test hole on the chip bearing structure; under the action of the preset elastic force of the first spring, the probe penetrates through the test hole to be connected with the test point A on the chip.

The effects of the scheme are as follows:

the probe is driven to move upwards by the first air cylinder and is firstly abutted in the groove, so that the probe and the chip are prevented from being directly collided, and the working procedure time spent by the equipment such as an electric screw rod is greatly shortened in comparison with the working procedure time spent by the equipment such as the electric screw rod although the probe is directly pushed upwards by the air cylinder at one time and is connected with the test point A by a second air cylinder to drive the needle to horizontally slide along the sliding groove and the probe to stretch out and draw back to the test hole. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis that the chip connection speed is not greatly reduced.

Drawings

FIG. 1 is a schematic diagram of a prior art chip;

FIG. 2 is a schematic diagram of a chip data access test system according to the present invention;

FIG. 3 is a schematic structural diagram of a detection tool according to the present invention;

FIG. 4 is a schematic view of the structure at B in FIG. 3;

FIG. 5 is a schematic cross-sectional view of a probe according to the present invention;

FIG. 6 is a schematic view of another view angle structure of the inspection tool according to the present invention;

FIG. 7 is a bottom view of a carrier substrate of the present invention;

FIG. 8 is an enlarged view of a portion of FIG. 7 at C;

FIG. 9 is a partial cross-sectional view of a chute on a carrier substrate in accordance with the present invention;

FIG. 10 is a schematic view of a carrier substrate according to the present invention;

fig. 11 is a schematic structural view of a chip carrier according to the present invention.

Wherein: 100-chip data access test system, 1-chip to be tested, 10-host computer, 20-tool control board, 30-detection tool, 31-bottom plate, 32-first cylinder, 33-second cylinder, 34-chip plugging structure, 341-supporting shaft, 342-supporting plate, 343-first limiting piece, 35-probe, 351-first rod, 352-first spring, 353-second rod, 354-ball, 36-chip bearing structure, 361-chip mounting position, 362-test hole, 3621-first through hole, 3622-second through hole, 363-chute, 3631-tight section, 3632-open section, 3633-buffer pad, 3634-baffle, 364-supporting frame, 365-bearing substrate, 3651-dovetail groove, 366-chip bearing plate, 3661-protrusion, 367-stop bar, 368-second spring, 369-L template, 3691-third through hole, 400-handle, 410-slide bar, 420-third limiting piece.

Detailed Description

The following embodiments of the present invention are described in terms of specific examples, and those skilled in the art will appreciate the advantages and capabilities of the present invention from the disclosure herein.

Referring to fig. 1 to 11, a chip testing system 100 includes a detection tool 30, where the detection tool 30 includes a bottom plate 31;

and a first cylinder 32 and a second cylinder 33 fixed to the bottom plate 31,

the chip plugging structure 34 is driven by the first cylinder 32 to reciprocate up and down, and a probe 35 which can vertically stretch out and draw back is arranged on the chip plugging structure 34;

and a chip bearing structure 36 driven by the second cylinder 33 to reciprocate horizontally, the chip bearing structure 36 and the chip plugging structure 34 are arranged up and down oppositely, chip mounting positions 361 are distributed on the chip bearing structure 36, test holes 362 communicated with the chip mounting positions 361 are further formed in the chip bearing structure 36, and a chute 363 communicated with the test holes 362 is further formed in the side wall of the chip bearing structure 36 facing the probe 35.

In practice, the chip test system 100 includes a host computer 10 for receiving and processing data, a tool control board 20 for directly inputting or forwarding test commands, and a test tool 30 for connecting the chip to the chip test system 100. The upper computer 10 and the tool control board 20 are connected by adopting a wireless network. In order to perform the test of the data processing capability of the chip, it is preferable to use the test fixture 30 to connect the tested chip to the chip test system 100.

In use, the bottom plate 31 is fixedly mounted on the floor of the inspection shop, and then the inspected chip is fixed on the chip mounting position 361, and the shape of the chip mounting position 361 is adapted to the chip so that the test point a of the chip is aligned with the test hole 362 of the chip carrier structure 36. After the detection tool 30 finishes detection, the first air cylinder 32 is started, and the movable end of the first air cylinder 32 drives the chip plugging structure 34 to move from bottom to top, so that the probe 35 fixed on the chip plugging structure 34 moves upwards along with the chip plugging structure until the top end of the probe 35 abuts against the inside of the sliding groove 363 on the chip bearing structure 36. Then, the second air cylinder 33 is started, the second air cylinder 33 drives the chip receiving structure to slide, so that the probe 35 slides along the sliding groove 363 until the probe 35 moves into the test hole 362 communicated with the sliding groove 363, and finally, under the action of the probe 35, the probe 35 stretches upwards and stretches out and draws back to pass through the test hole 362 until the top end of the probe 35 is connected with the test point A of the detected chip. After the chip is detected, the second cylinder 33 is started to drive the chip carrying structure 36, and then the probe 35 is driven to be drawn out downwards from the test hole 362.

In this way, the first cylinder 32 drives the probe 35 to move upwards, and the probe 35 is firstly abutted in the groove, so that the probe 35 is prevented from directly colliding with the chip, and the working procedure time spent by the equipment such as an electric screw rod is greatly shortened, although the probe 35 is directly pushed upwards by the cylinder at one time to be connected with the test point A by one more horizontal sliding and the probe 35 is in telescopic action. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis that the chip connection speed is not greatly reduced.

In addition, in the present embodiment, the length extending direction of the chute 363 is parallel to the moving direction of the second cylinder 33, so that the pushing direction of the second cylinder 33 and the moving direction of the probe 35 are always the same, and the slow sliding of the probe 35 caused by the component force in other directions is avoided, thereby shortening the chip connection process time.

The probe 35 includes a first rod 351 fixed on the chip plugging structure 34, a first spring 352 installed inside the first rod 351, and a second rod 353 having one end extending into the first rod 351 and abutting against the first spring 352, the second rod 353 being slidably connected with the first rod 351, and one end of the second rod 353 facing away from the first rod 351 facing the chute 363.

Thus, when the probe 35 is moved to the test hole 362, the second rod 353 slides upward through the test hole 362 with respect to the first rod 351 under the force of the first spring 352 to connect with the test site a. The probe 35 is automatically telescopic to be connected with the chip, and the transmission of chip detection data is realized.

Wherein the end of the second rod 353 remote from the first rod 351 is mounted with a ball 354.

In this way, when the probe 35 slides along the sliding slot 363, the rolling of the balls 354 can reduce the friction force generated by the sliding of the probe 35 along the sliding slot 363, so that the sliding of the probe 35 along the sliding slot 363 is quicker, and the effects of shortening the chip connection time and improving the detection speed are achieved.

Wherein, the sliding groove 363 comprises a tight opening section 3631 and an open section 3632, one end of the tight opening section 3631 is communicated with the test hole 362, the open section 3632 is communicated with one end of the tight opening section 3631 far away from the test hole 362, and the width of the open end is gradually reduced from one end far away from the tight opening section 3631 to one end communicated with the tight opening section 3631, and the width of the tight opening section 3631 is consistent with the diameter and the length of the ball 354.

In this way, the diameter of the open section 3632 is larger than that of the ball 354, so that the fault tolerance rate of the probe 35 in the process of abutting in the sliding groove 363 under the driving of the first cylinder 32 is higher, and the probe 35 is prevented from being staggered with the sliding groove 363 when being lifted upwards. Then, under the drive of the second cylinder 33, the tight opening section 3631 plays a role in guiding the probe 35 to slide from the open section 3632 to the tight opening section 3631 to the test hole 362, the tight opening section 3631 is in transitional fit with the ball 354, displacement of the ball 354 in the width direction of the sliding groove 363 in the sliding process of the sliding groove 363 is reduced, and the effects of shortening chip connection time and improving detection speed are achieved.

Specifically, the top surface of the chute 363 is also fixed with a cushion 3633 made of rubber, so as to avoid the probe 35 from being bumped in the process of abutting on the chute 363.

Wherein the downward inner wall of the chute 363 is gradually inclined upward in the direction from the open section 3632 to the close section 3631.

Therefore, when the probe 35 gradually slides towards the direction of the sliding groove 363 gradually towards the test hole 362, the elastic force of the first spring 352 in the probe 35 is gradually released, so that the instantaneous elastic force release energy of the first spring 352 can be gradually reduced, the impact force of the probe 35 on the chip is reduced, and the chip is prevented from being damaged in the connection process.

Wherein the tight opening section 3631 extends towards the probe 35 with a baffle 3634, the baffle 3634 being located at a side remote from the open section 3632.

In this way, the baffle 3634 can act to ultimately prevent misalignment of the probe 35 with the test aperture 362 as the probe 35 slides from the open end toward the test aperture 362.

Wherein, the chip plugging structure 34 comprises a supporting shaft 341 fixed on the bottom plate 31;

the supporting plate is in sliding connection with the supporting shaft 341, is positioned between the air cylinder and the chip bearing structure 36, is fixedly connected with the movable end of the first air cylinder 32, and is uniformly provided with a plurality of probes 35;

thus, by activating the first cylinder 32 to push the support plate to slide along the support shaft 341, the probe 35 moves along the support plate synchronous moving net to abut in the groove.

Specifically, a first limiting member 343 is further fixed on the supporting shaft 341, where the first limiting member 343 is located at a side of the supporting plate away from the chip carrying structure 36. The first limiting piece 343 can limit the position point of the support plate sliding downwards in the return process of the first cylinder 32 driving the support plate to move, so as to avoid damage to some parts of the support plate, which are arranged between the bottom plate 31 and the support plate, in the emergency of failure of the first cylinder 32.

The chip carrying structure 36 includes a supporting frame 364 fixedly connected to the supporting shaft 341; the bearing substrate 365 is slidably connected with the support frame 364, the bearing substrate 365 is driven by the second air cylinder 33 to horizontally reciprocate, and the sliding track length of the bearing substrate 365 relative to the support frame 364 is equal to the length of the sliding groove 363;

the chip bearing plate 366 is detachably connected to the bearing substrate 365, the chip bearing plate 366 is positioned on one side of the bearing substrate 365 away from the probes 35, a plurality of chip mounting positions 361 are uniformly distributed on the chip bearing plate 366, and the relative intervals of the plurality of chip mounting positions 361 are consistent with the relative intervals of the plurality of probes 35; the carrier substrate 365 is provided with a first through hole 3621, the chip carrier plate 366 is provided with a second through hole 3622, and the first through hole 3621 and the second through hole 3622 form a test hole 362.

In this way, the chip carrier plates 366 can be detachably connected to the carrier substrate 365, so that chips can be mounted on the chip carrier plates 366 in advance, and when the chips on one chip carrier plate 366 are detected, the other chip carrier plate 366 filled with the chips 1 to be detected is replaced on the carrier substrate 365, so that the time for mounting the chips 1 to be detected on the detection tool 30 is shortened, and the chip detection speed is improved.

After the chip carrier plate 366 is mounted on the carrier substrate 365, the first through hole 3621 and the second through hole 3622 are communicated to form the test hole 362. The second cylinder 33 is started to drive the bearing substrate 365 to slide, and the bearing substrate 365 drives the chip bearing plate 366 to slide horizontally. Since the length of the sliding track of the carrier substrate 365 relative to the support frame 364 is equal to the length of the chute 363, when the carrier substrate 365 slides to the end, the probe 35 just moves into the test hole 362 along the chute 363 to complete the chip connection.

Specifically, a barrier 367 is further fixed on the support frame 364 and located right above the chip mounting position 361, the chip mounting position 361 is a groove with the same size as the chip, the chip is placed in the groove, the degree of freedom of movement of the chip in the horizontal direction is limited, and the barrier plays a role in limiting the degree of freedom of movement of the chip in the vertical direction when the chip is tested.

Wherein, the bearing substrate 365 is provided with a dovetail groove 3651 along the horizontal direction, the chip bearing plate 366 is integrally formed with a protrusion 3661 matched with the dovetail groove 3651, the protrusion 3661 is in sliding fit with the bearing substrate 365, one end of the dovetail groove 3651 is communicated with the side wall of the bearing substrate 365, one end of a second spring 368 is fixed on the side wall of the bearing substrate 365 communicated with the dovetail groove 3651, the other end of the second spring 368 is fixedly connected with an L-shaped plate 369, the L-shaped plate 369 is propped against the chip bearing plate 366, and a handle 400 is fixed on the L-shaped plate 369.

In this way, the degree of freedom of movement in the vertical direction after the chip carrier plate 366 is mounted on the carrier substrate 365 can be restricted by the dovetail groove 3651. After the chip on the chip carrier plate 366 is detected, the handle 400 is pulled outwards, the L-shaped plate 369 is pulled outwards against the elasticity of the second spring 368, the degree of freedom of the L-shaped plate 366 in the horizontal direction is relieved, and the chip carrier plate 366 filled with the detected chip is pulled out from one end of the chip carrier plate 366 which is communicated with the side wall of the carrier substrate 365 through the dovetail groove 3651. Then another chip carrier plate 366 filled with the chip 1 to be detected is fixed on the carrier substrate 365 by the L-shaped plate 369 under the elastic force of the second spring 368 from one end of the dovetail groove 3651 communicating with the side wall of the carrier substrate 365. Thus, the chip carrier plate 366 is circularly replaced, the time for mounting the chip 1 to be detected on the detection tool 30 is shortened, and the chip detection speed is improved.

Specifically, the L-shaped plate 369 is provided with a third through hole 3691, the bearing substrate 365 is fixed with a sliding rod 410, the axis extending direction of the sliding rod 410 is consistent with the sliding direction of the chip bearing plate 366 relative to the bearing substrate 365, and one end of the sliding rod 410 away from the bearing substrate 365 is fixedly connected with a second limiting member 420.

In this way, the second stopper 420 serves to restrict the L-shaped plate 369 from being separated from the slide bar 410, and the slide bar 410 is in transition engagement with the third through hole 3691. It is possible to prevent the chip carrier plate 366 from being restricted from being stabilized by the biasing occurring during the pulling of the L-shaped plate 369.

Specifically, one end of the handle 400 is fixedly connected with the chip carrier plate 366, the middle section passes over the L-shaped plate 369, and a ring body for holding the hand is fixed on the other end, and the diameter direction of the ring body is parallel to the horizontal plane. Can make the pulling of the handle 400 more labor-saving and convenient.

The working method of the chip test system comprises a chip connection method, wherein the chip connection method comprises the following steps: the first cylinder 32 is controlled to lift up so that the probe 35 is abutted in the sliding groove 363 on the chip carrying structure 36; controlling the second cylinder 33 to move so that the probe 35 slides along the sliding slot 363 towards the test hole 362 on the chip carrying structure 36; under the action of the preset elastic force of the first spring 352, the probe 35 passes through the test hole 362 to be connected with the test point A on the chip. The first cylinder 32 drives the probe 35 to move upwards, and the probe 35 is firstly abutted in the groove, so that the probe 35 is prevented from directly colliding with the chip, and the working procedure time spent by the equipment such as an electric screw rod is greatly shortened compared with that of the equipment such as the electric screw rod although the probe 35 is directly pushed upwards by the cylinder at one time to be connected with the test point A and the second cylinder 33 drives the needle to slide horizontally along the sliding groove 363 and the probe 35 to stretch out and draw back to the test hole 362. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis that the chip connection speed is not greatly reduced.

The above embodiments are only for illustrating the technical solution of the present invention and not for limiting the same, and although the present invention has been described in detail with reference to the preferred embodiments, it should be understood by those skilled in the art that modifications and equivalents may be made thereto without departing from the spirit and scope of the technical solution of the present invention, which is intended to be covered by the scope of the claims of the present invention. The invention is not to be considered as limited in its details, but rather to its technology, shape and construction and is within the scope of the claims of the known technology. The technology, shape, and construction parts of the present invention, which are not described in detail, are known in the art.

Claims

1. The utility model provides a chip data access test system, includes detection frock, its characterized in that: the detection tool comprises a bottom plate;

and a first cylinder and a second cylinder fixed on the bottom plate,

the chip plugging structure is driven by the first air cylinder to do up-and-down reciprocating motion, and a probe capable of vertically stretching is arranged on the chip plugging structure;

the chip bearing structure is driven by the second air cylinder to do horizontal reciprocating motion, the chip bearing structure and the chip inserting structure are arranged up and down oppositely, chip mounting positions are distributed on the chip bearing structure, a test hole communicated with the chip mounting positions is also formed in the chip bearing structure, and a chute communicated with the test hole is also formed in the side wall of the chip bearing structure facing the probe;

the probe comprises a first rod fixed on the chip plugging structure, a first spring arranged in the first rod, and a second rod with one end extending into the first rod and propped against the first spring, wherein the second rod is in sliding connection with the first rod, and one end of the second rod far away from the first rod is opposite to the chute;

the chip plugging structure comprises a supporting shaft fixed on the bottom plate;

the support plate is positioned between the first air cylinder and the chip bearing structure and is fixedly connected with the movable end of the first air cylinder, and a plurality of probes are uniformly arranged on the support plate;

the chip bearing structure comprises a supporting frame fixedly connected with the supporting shaft;

the bearing substrate is driven by the second cylinder to do horizontal reciprocating motion, and the sliding track length of the bearing substrate relative to the support frame is equal to the length of the chute;

the chip bearing plate is detachably connected to the bearing substrate, the chip bearing plate is positioned on one side, far away from the probes, of the bearing substrate, a plurality of chip mounting positions are uniformly distributed on the chip bearing plate, and the relative intervals of the plurality of chip mounting positions are consistent with the relative intervals of the plurality of probes;

the chip carrier plate is provided with a first through hole, the chip carrier plate is provided with a second through hole, and the first through hole and the second through hole form the test hole.

2. The chip data access test system of claim 1, wherein: the end of the second rod, which is far away from the first rod, is provided with a ball.

3. The chip data access test system of claim 2, wherein: the spout includes tight mouthful section and open section, the one end of tight mouthful section with test hole intercommunication, open section with the one end intercommunication that test hole was kept away from to tight mouthful section, open section's width from keeping away from tight mouthful section's one end to with tight mouthful section intercommunication's one end reduces gradually, tight mouthful section's width with the diameter length of ball is unanimous.

4. The chip data access test system of claim 3, wherein: the downward inner wall of the chute gradually inclines upwards along the direction from the open section to the close section.

5. The chip data access test system of claim 4, wherein: the tight mouth section extends towards the probe and is provided with a baffle plate, and the baffle plate is positioned at one side far away from the open mouth section.

6. The chip data access test system of claim 1, wherein: the chip carrier plate is characterized in that a dovetail groove is formed in the carrier substrate along the horizontal direction, a bulge matched with the dovetail groove is integrally formed in the chip carrier plate, the bulge is in sliding fit with the carrier substrate, one end of the dovetail groove is communicated with the side wall of the carrier substrate, one end of a second spring is fixed on the side wall of the carrier substrate communicated with the dovetail groove, an L-shaped plate is fixedly connected with the other end of the second spring, the L-shaped plate abuts against the chip carrier plate, and a handle is fixed on the L-shaped plate.

7. A method of operation employing the chip data access test system of claim 1, comprising a chip attach method, characterized by: the chip connection method comprises the following steps:

the first cylinder is controlled to lift up so that the probe is abutted in a chute on the chip bearing structure;

controlling the second cylinder to move so that the probe slides along the chute towards the test hole on the chip bearing structure;

under the action of the preset elastic force of the first spring, the probe penetrates through the test hole to be connected with a test point on the chip.