CN112946454A

CN112946454A - Chip data access test system and working method thereof

Info

Publication number: CN112946454A
Application number: CN202110090282.9A
Authority: CN
Inventors: 叶显; 陶晶; 周一鸣; 吕中明; 张龙; 周迎亚; 李沈飞; 景枭; 高思琪
Original assignee: Chongqing Qinsong Technology Co ltd
Current assignee: Chongqing Qinsong Technology Co ltd
Priority date: 2021-01-22
Filing date: 2021-01-22
Publication date: 2021-06-11
Anticipated expiration: 2041-01-22
Also published as: CN112946454B

Abstract

The invention belongs to the technical field of chip testing and discloses a chip data access testing system and a working method thereof.A probe is driven by a first cylinder to move upwards and is firstly abutted in a groove, so that the direct collision between the probe and a chip is avoided. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis of not greatly reducing the connection speed of the chip.

Description

Chip data access test system and working method thereof

Technical Field

The invention belongs to the technical field of chip testing, and particularly relates to a chip data access testing system and a working method thereof.

Background

In recent years, with the progress of related technologies such as electronic technology and network and the improvement of the consumption level of the global electronic market, the demand of electronic products such as personal computers, multimedia, workstations, networks, communication related devices and the like has increased dramatically, which drives the explosion of the semiconductor industry in the whole world.

In various electronic products, the ic chip is regarded as the heart hub, so that the procurement standards of the ic chip are the most stringent in all electronic factories in the world. Therefore, each chip is required to be tested in the chip manufacturing process, during testing, the chip is placed into a testing tool and led into an upper computer, a testing command is directly input or forwarded to the chip through the testing tool, the data processing capability of the chip is tested, and finally the processing performance data of the chip is acquired by the upper computer to complete the data access performance test of the chip.

When the chip is manufactured, a test point a is reserved on the chip, and as shown in fig. 1, a probe of a test system is connected with the test point a, so that the test can be started. However, the probe of the existing test system is driven by an air cylinder, the air cylinder drives the probe to do reciprocating linear motion to drive the probe to be connected with the test point A, but the accurate positioning capability of the air cylinder is weak, so that the probe and the test point A are easy to collide when being connected, and the chip is damaged. If adopt electronic lead screw type equipment to drive, though the ability that position and moment carry out accurate control is better, because this type of electric drive equipment is by rotary motion conversion linear motion, compare the cylinder and drive, there is the process that the probe is connected with test point A on the chip and takes longer, will cause the slow problem of test speed of chip.

Disclosure of Invention

In view of the above, an object of the present invention is to provide a chip data access testing system and a working method thereof, which can prevent a probe from damaging a chip on the basis of ensuring a testing speed of the chip.

The invention solves the technical problems by the following technical means: a chip data access test system comprises a detection tool, wherein the detection tool comprises a bottom plate; the chip inserting structure is driven by the first cylinder to reciprocate up and down, and a probe capable of stretching vertically is arranged on the chip inserting structure; and the chip bearing structure is driven by the second cylinder to do horizontal reciprocating motion, the chip bearing structure and the chip inserting structure are arranged up and down oppositely, chip mounting positions are distributed on the chip bearing structure, a testing hole communicated with the chip mounting positions is further formed in the chip bearing structure, and a sliding groove communicated with the testing hole is further formed in the side wall, facing the probe, of the chip bearing structure.

The invention also provides a scheme, and the working method of the chip data access test system comprises a chip connection method; the chip connection method comprises the following steps: controlling the first cylinder to lift so that the probe is abutted to the sliding groove on the chip bearing structure; controlling the second cylinder to move so that the probe slides towards the test hole on the chip bearing structure along the sliding groove; under the action of the preset elastic force of the first spring, the probe penetrates through the test hole to be connected with the test point A on the chip.

The effect of the scheme is as follows:

drive the probe through first cylinder and up move, at first the butt has avoided probe and chip direct bump, though compare the probe and once only up promote by the cylinder and test point A be connected one more second cylinder drive needle along spout horizontal slip and probe to the flexible action in test hole, but the process time of spending than this kind of equipment of electronic lead screw does be very big shortening. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis of not greatly reducing the connection speed of the chip.

Drawings

FIG. 1 is a schematic diagram of a chip in the prior art;

FIG. 2 is a schematic diagram of a chip data access test system according to the present invention;

FIG. 3 is a schematic structural view of the inspection tool of the present invention;

FIG. 4 is a schematic diagram of the structure at B in FIG. 3;

FIG. 5 is a schematic cross-sectional view of a probe of the present invention;

FIG. 6 is a schematic view of another structure of the inspection tool of the present invention;

FIG. 7 is a bottom view of a carrier substrate according to the present invention;

FIG. 8 is an enlarged view of a portion of FIG. 7 at C;

FIG. 9 is a partial cross-sectional view of the carrier substrate at the chute of the present invention;

FIG. 10 is a schematic view of a carrier substrate according to the present invention;

FIG. 11 is a schematic structural diagram of the chip carrier board of the present invention.

Wherein: 100-chip data access test system, 1-chip to be tested, 10-upper computer, 20-tool control board, 30-detection tool, 31-bottom board, 32-first cylinder, 33-second cylinder, 34-chip plug structure, 341-support shaft, 342-support board, 343-first limit piece, 35-probe, 351-first rod, 352-first spring, 353-second rod, 354-ball, 36-chip bearing structure, 361-chip mounting position, 362-test hole, 3621-first through hole, 3622-second through hole, 363-sliding groove, 3631-tightening section, 3632-opening section, 3633-buffer pad, 3634-baffle 364-support frame, 365-bearing substrate, 3651-dovetail groove, 366-chip carrier board, 3661-bump, 367-stop strip, 368-second spring, 369-L template, 3691-third through hole, 400-handle, 410-slide bar, 420-third locating part.

Detailed Description

The following description of the embodiments of the present invention is provided by way of specific examples, and those skilled in the art will appreciate the advantages and utilities of the present invention from the disclosure herein.

Referring to fig. 1 to 11, a chip testing system 100 includes a detection tool 30, where the detection tool 30 includes a bottom plate 31;

and a first cylinder 32 and a second cylinder 33 fixed to the base plate 31,

the chip inserting structure 34 is driven by the first air cylinder 32 to reciprocate up and down, and a probe 35 which can stretch vertically is arranged on the chip inserting structure 34;

and a chip bearing structure 36 driven by the second cylinder 33 to perform horizontal reciprocating motion, wherein the chip bearing structure 36 and the chip plug-in structure 34 are arranged oppositely up and down, chip mounting positions 361 are distributed on the chip bearing structure 36, a testing hole 362 communicated with the chip mounting positions 361 is further formed in the chip bearing structure 36, and a sliding groove 363 communicated with the testing hole 362 is further formed in the side wall, facing the probe 35, of the chip bearing structure 36.

In practice, the chip testing system 100 includes an upper computer 10 for receiving and processing data, a tool control board 20 for directly inputting or forwarding a test command, and a test tool 30 for connecting a chip to the chip testing system 100. The upper computer 10 and the tool control board 20 are connected through a wireless network. When detecting the data processing capability performance of the chip, it is first required to connect the detected chip with the chip testing system 100 by using the detection tool 30.

During the use, be fixed mounting bottom plate 31 on the ground in detecting the workshop, then will detect the chip and fix on chip installation position 361, the shape and the chip adaptation of chip installation position 361 for the test point A of chip aligns with test hole 362 of chip bearing structure 36 can. After the detection tool 30 finishes detecting, the first cylinder 32 is started, and the movable end of the first cylinder 32 drives the chip insertion structure 34 to move from bottom to top, so that the probe 35 fixed on the chip insertion structure 34 moves upwards along with the chip insertion structure, until the top end of the probe 35 abuts against the sliding groove 363 on the chip bearing structure 36. Then the second cylinder 33 is started, the second cylinder 33 drives the chip carrying structure to slide, so that the probe 35 slides along the sliding groove 363 until the probe 35 moves into the testing hole 362 communicated with the sliding groove 363, and finally, under the action of the probe 35, the probe 35 stretches upwards to penetrate through the testing hole 362 until the top end of the probe 35 is connected with the testing point a of the chip to be tested. After the chip detection is finished, the second cylinder 33 is started to drive the chip carrying structure 36, and further the probe 35 is driven to be drawn out from the test hole 362.

In this way, the first cylinder 32 drives the probe 35 to move upwards and abut against the groove at first, so that the probe 35 is prevented from directly colliding with the chip, and although one horizontal sliding and probe 35 stretching action is added compared with the case that the probe 35 is directly pushed upwards by the cylinder to be connected with the test point a in one step, the process time spent by the device such as an electric screw rod is greatly shortened. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis of not greatly reducing the connection speed of the chip.

In addition, in this embodiment, the length extending direction of the sliding slot 363 is set to be parallel to the moving direction of the second cylinder 33, so that the thrust direction of the second cylinder 33 and the moving direction of the probe 35 are the same, thereby avoiding the slow sliding of the probe 35 caused by component forces in other directions, and obtaining the effect of shortening the chip connection process time.

The probe 35 includes a first rod 351 fixed on the chip plugging structure 34, a first spring 352 mounted inside the first rod 351, and a second rod 353 having one end extending into the first rod 351 and abutting against the first spring 352, wherein the second rod 353 is slidably connected to the first rod 351, and one end of the second rod 353 away from the first rod 351 faces the sliding slot 363.

Thus, when the probe 35 moves to the test hole 362, the second rod 353 slides upward relative to the first rod 351 through the test hole 362 to connect with the test point a under the elastic force of the first spring 352. The probe 35 can be automatically stretched to be connected with the chip, and the transmission of chip detection data is realized.

Wherein, a ball 354 is installed on one end of the second rod 353 far away from the first rod 351.

Thus, when the probe 35 slides along the slide slot 363, the rolling of the balls 354 can reduce the friction force generated by the sliding of the probe 35 along the slide slot 363, so that the probe 35 slides along the slide slot 363 more rapidly, thereby shortening the chip connection time and improving the detection speed.

The chute 363 comprises a tight opening section 3631 and an open section 3632, one end of the tight opening section 3631 is communicated with the test hole 362, the open section 3632 is communicated with one end of the tight opening section 3631 far away from the test hole 362, the width of the open end is gradually reduced from one end far away from the tight opening section 3631 to one end communicated with the tight opening section 3631, and the width of the tight opening section 3631 is consistent with the diameter and the length of the ball 354.

In this way, the diameter of the opening 3632 is larger than that of the ball 354, so that the fault tolerance rate of the probe 35 in the process of being pressed against the chute 363 under the driving of the first cylinder 32 is higher, and the probe 35 is prevented from being staggered with the chute 363 when being lifted. Then, under the driving of the second cylinder 33, the mouth-tightening section 3631 plays a role of guiding the probe 35 to slide to the test hole 362 from the opening section 3632 to the direction of the mouth-tightening section 3631, the mouth-tightening section 3631 is in transition fit with the ball 354, so that the displacement of the ball 354 in the width direction of the sliding groove 363 in the sliding process along the sliding groove 363 is reduced, and the effects of shortening the chip connection time and improving the detection speed are achieved.

Specifically, a cushion 3633 is fixed on the top surface of the chute 363 and made of rubber, so that the probe 35 can be prevented from being damaged in the process of abutting against the inside of the chute 363.

Wherein, the downward inner wall of the sliding slot 363 gradually inclines upward along the direction from the open section 3632 to the tightening section 3631.

Therefore, when the probe 35 gradually slides towards the sliding slot 363 towards the testing hole 362, the elastic force of the first spring 352 in the probe 35 is gradually released, so that the instantaneous elastic force release energy of the first spring 352 can be gradually reduced, the impact force of the probe 35 on the chip is reduced, and the chip is prevented from being damaged in the connection process.

Wherein the mouth-tight section 3631 extends with a baffle 3634 towards the probe 35, the baffle 3634 being located at a side away from the open section 3632.

Thus, the baffle 3634 can prevent the probe 35 from being misaligned with the test hole 362 when the probe 35 slides from the open end toward the test hole 362.

The chip plugging structure 34 includes a supporting shaft 341 fixed on the bottom plate 31;

the supporting plate is in sliding connection with the supporting shaft 341, is positioned between the air cylinder and the chip bearing structure 36 and is fixedly connected with the movable end of the first air cylinder 32, and a plurality of probes 35 are uniformly arranged on the supporting plate;

thus, by actuating the first cylinder 32, pushing the support plate to slide along the support shaft 341, the probe 35 moves along the support plate synchronously moving the web to abut against the groove.

Specifically, the supporting shaft 341 is further fixed with a first limiting member 343, and the first limiting member 343 is located on a side of the supporting plate away from the chip carrying structure 36. The first limiting member 343 can limit the position point of the support plate sliding downward in the return process of the first cylinder 32 driving the support plate to move, and prevent the support plate from damaging some parts installed between the bottom plate 31 and the support plate in an emergency situation that the first cylinder 32 fails.

The chip carrying structure 36 includes a supporting frame 364 fixedly connected to the supporting shaft 341; the bearing substrate 365 is connected with the support frame 364 in a sliding manner, the bearing substrate 365 is driven by the second air cylinder 33 to do horizontal reciprocating motion, and the length of the sliding track of the bearing substrate 365 relative to the support frame 364 is equal to the length of the sliding chute 363;

the chip bearing plate 366 is detachably connected to the bearing substrate 365, the chip bearing plate 366 is positioned on one side of the bearing substrate 365 far away from the probes 35, a plurality of chip mounting positions 361 are uniformly distributed on the chip bearing plate 366, and the relative intervals of the chip mounting positions 361 are consistent with the relative intervals of the probes 35; the carrier substrate 365 is provided with a first through hole 3621, the chip carrier plate 366 is provided with a second through hole 3622, and the first through hole 3621 and the second through hole 3622 form a test hole 362.

Thus, the chip bearing plate 366 can be detachably connected to the bearing substrate 365, the chip can be mounted on the chip bearing plate 366 in advance, after the chip on one chip bearing plate 366 is detected, another chip bearing plate 366 full of chips 1 to be detected is replaced on the bearing substrate 365, the time for mounting the chips 1 to be detected on the detection tool 30 is shortened, and the chip detection speed is improved.

After the chip carrier plate 366 is mounted on the carrier substrate 365, the first through hole 3621 and the second through hole 3622 are communicated to form the testing hole 362. The second cylinder 33 is activated to drive the carrying substrate 365 to slide, and the carrying substrate 365 drives the chip carrying board 366 to slide horizontally. Since the length of the sliding track of the supporting substrate 365 relative to the supporting frame 364 is equal to the length of the sliding slot 363, when the supporting substrate 365 slides to the end, the probe 35 just moves along the sliding slot 363 into the testing hole 362 to complete the connection of the chip.

Specifically, the holding frame 364 is further fixed with a barrier 367 and located right above the chip mounting location 361, the chip mounting location 361 is a groove with the same size as the chip, the chip is placed in the groove, the freedom degree of movement of the chip in the horizontal direction is limited, and the barrier plays a role in limiting the freedom degree of movement of the chip in the vertical direction when the chip is tested.

Wherein, dovetail 3651 has been seted up along the horizontal direction on the bearing substrate 365, integrated into one piece has on the chip loading board 366 protruding 3661 with dovetail 3651 complex, protruding 3661 and bearing substrate 365 sliding fit, the one end of dovetail 3651 communicates with each other with the lateral wall of bearing substrate 365, be fixed with the one end of second spring 368 on the communicating lateral wall of bearing substrate 365 and dovetail 3651, the other end fixedly connected with L template 369 of second spring 368, L template 369 supports with chip loading board 366 and holds, be fixed with handle 400 on the L template 369.

In this way, the degree of freedom of movement in the vertical direction after the chip carrier plate 366 is mounted on the carrier substrate 365 can be restricted by the dovetail grooves 3651. After the chip on one chip bearing plate 366 is detected, the handle 400 is pulled outwards to overcome the elastic force of the second spring 368 to pull the L-shaped plate 369 outwards, so as to remove the degree of freedom of the L-shaped plate 366 in the horizontal direction, and the chip bearing plate 366 filled with the detected chip is pulled out from the dovetail groove 3651 from the end, communicated with the side wall of the bearing substrate 365, of the chip bearing plate 366. Then, another chip carrier plate 366 filled with the chip 1 to be detected is fixed on the carrier substrate 365 by the L-shaped plate 369 under the elastic force of the second spring 368 from the end of the dovetail 3651 communicating with the side wall of the carrier substrate 365. Thereby accomplishing the cyclic replacement of the chip bearing plate 366, shortening the time for installing the chip 1 to be detected on the detection tool 30, and improving the chip detection speed.

Specifically, a third through hole 3691 is formed in the L-shaped plate 369, a slide bar 410 is fixed on the carrier substrate 365, the axial extension direction of the slide bar 410 is consistent with the sliding direction of the chip carrier plate 366 relative to the carrier substrate 365, and one end of the slide bar 410, which is far away from the carrier substrate 365, is fixedly connected with a second limiting member 420.

In this way, the second limiting member 420 limits the L-shaped plate 369 from being separated from the sliding rod 410, and the L-shaped plate 369 is transitionally matched with the third through hole 3691 through the sliding rod 410. It is possible to prevent the chip carrier plate 366 from being unstably restrained due to the occurrence of a deviation in pulling the L-shaped plate 369 while being pulled.

Specifically, one end of the handle 400 is fixedly connected to the chip carrier plate 366, the middle section of the handle crosses over the L-shaped plate 369, a ring body for holding by a hand is fixed to the other end of the handle, and the diameter direction of the ring body is parallel to the horizontal plane. It is possible to make it more convenient and labor-saving when pulling the handle 400.

A working method of a chip testing system comprises a chip connection method, wherein the chip connection method comprises the following steps: controlling the first cylinder 32 to lift up so that the probe 35 abuts in the chute 363 on the chip carrying structure 36; controlling the second cylinder 33 to move so that the probe 35 slides along the slide slot 363 toward the testing hole 362 on the chip carrying structure 36; under the preset elastic force of the first spring 352, the probe 35 is connected to the test point a on the chip through the test hole 362. The first air cylinder 32 drives the probe 35 to move upwards and is firstly abutted in the groove, so that the probe 35 is prevented from directly colliding with a chip, and although the probe 35 is directly pushed upwards by the air cylinder once and is connected with the test point A, the second air cylinder 33 drives the needle to horizontally slide along the sliding groove 363 and the probe 35 stretches and retracts towards the test hole 362, the process time spent by the equipment is greatly shortened compared with that of electric screw rods. Therefore, the scheme realizes that the risk of collision injury of the chip during connection is avoided on the basis of not greatly reducing the connection speed of the chip.

Although the present invention has been described in detail with reference to the preferred embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the spirit and scope of the invention as defined in the appended claims. The technology, the shape and the construction part which are not described in detail in the invention are all in the scope of the claims of the invention of the known technology. The techniques, shapes, and configurations not described in detail in the present invention are all known techniques.

Claims

1. The utility model provides a chip data access test system, includes the detection frock which characterized in that: the detection tool comprises a bottom plate;

and a first cylinder and a second cylinder fixed on the bottom plate,

the chip inserting structure is driven by the first air cylinder to do up-and-down reciprocating motion, and a probe capable of vertically stretching is arranged on the chip inserting structure;

the chip bearing structure and the chip inserting structure are arranged oppositely from top to bottom, chip mounting positions are distributed on the chip bearing structure, a testing hole communicated with the chip mounting positions is further formed in the chip bearing structure, and a sliding groove communicated with the testing hole is further formed in the side wall, facing the probe, of the chip bearing structure.

2. The chip data access test system of claim 1, wherein: the probe comprises a first rod fixed on the chip inserting structure, a first spring arranged in the first rod, and a second rod, wherein one end of the second rod extends into the first rod and is abutted against the first spring, the second rod is connected with the first rod in a sliding mode, and one end, far away from the first rod, of the second rod is opposite to the sliding groove.

3. The chip data access test system of claim 2, wherein: and a ball is arranged at one end, far away from the first rod, of the second rod.

4. The chip data access test system of claim 2, wherein: the spout includes tight mouthful of section and open mouth section, the one end of tight mouthful of section with the test hole intercommunication, open mouth section with the one end intercommunication of test hole is kept away from to tight mouthful of section, the width of open mouth end is from keeping away from tight mouthful of one end of section to with the one end of tight mouthful of section intercommunication reduces gradually, the width of tight mouthful of section with the diameter length of ball is unanimous.

5. The chip data access test system according to one of claims 1 to 4, characterized in that: the downward inner wall of the sliding chute is gradually inclined upwards along the direction from the open section to the tight section.

6. The chip data access test system of claim 5, wherein: the tight mouth section extends towards the probe and has a baffle, the baffle is located and keeps away from one side of open section.

7. The chip data access test system of claim 1, wherein: the chip inserting structure comprises a supporting shaft fixed on the bottom plate;

and the supporting plate is connected with the supporting shaft in a sliding manner, is positioned between the air cylinder and the chip bearing structure and is fixedly connected with the movable end of the first air cylinder, and a plurality of probes are uniformly arranged on the supporting plate.

8. The chip data access test system of claim 7, wherein: the chip bearing structure comprises a supporting frame fixedly connected with the supporting shaft;

the bearing substrate is driven by the second cylinder to horizontally reciprocate, and the length of the sliding track of the bearing substrate relative to the support frame is equal to the length of the sliding chute;

the chip bearing plate is detachably connected to the bearing substrate, the chip bearing plate is positioned on one side of the bearing substrate, which is far away from the probes, a plurality of chip mounting positions are uniformly distributed on the chip bearing plate, and the relative intervals of the chip mounting positions are consistent with the relative intervals of the probes;

the test device comprises a bearing substrate, a chip bearing plate and a test hole, wherein the bearing substrate is provided with a first through hole, the chip bearing plate is provided with a second through hole, and the first through hole and the second through hole form the test hole.

9. The chip data access test system of claim 8, wherein: the bearing substrate is provided with a dovetail groove along the horizontal direction, the chip bearing plate is integrally formed with a protrusion matched with the dovetail groove, the protrusion is in sliding fit with the bearing substrate, one end of the dovetail groove is communicated with the side wall of the bearing substrate, one end of a second spring is fixed on the side wall of the bearing substrate communicated with the dovetail groove, the other end of the second spring is fixedly connected with an L-shaped plate, the L-shaped plate is abutted to the chip bearing plate, and a handle is fixed on the L-shaped plate.

10. A working method of a chip data access test system comprises a chip connection method, and is characterized in that: the chip connection method comprises the following steps:

controlling the first cylinder to lift so that the probe is abutted to the sliding groove on the chip bearing structure;

controlling the second cylinder to move so that the probe slides towards the test hole on the chip bearing structure along the sliding groove;

under the action of the preset elastic force of the first spring, the probe penetrates through the test hole to be connected with the test point on the chip.