CN112485648A - Test equipment and test method for cooperative mechanical arm driving power board - Google Patents
Test equipment and test method for cooperative mechanical arm driving power board Download PDFInfo
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- CN112485648A CN112485648A CN202011463376.8A CN202011463376A CN112485648A CN 112485648 A CN112485648 A CN 112485648A CN 202011463376 A CN202011463376 A CN 202011463376A CN 112485648 A CN112485648 A CN 112485648A
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Abstract
The invention discloses a test device for a driving power board of a cooperative mechanical arm, which comprises a mounting table, and a test fixture, a test mainboard and a power supply device which are positioned on the mounting table, wherein the test fixture is provided with a conductive probe for electrically connecting with the driving power board to be tested; the test main board is provided with a communication interface for outputting a detection result and a plurality of functional interfaces for electrically connecting with the tested drive power board; the power supply device is used for being electrically connected with the test main board and supplying power to the tested driving power board. The invention simplifies the test mode of the driving power board, thereby being beneficial to improving the detection efficiency. In addition, the invention also discloses a test method of the cooperative mechanical arm driving power board.
Description
Technical Field
The invention relates to the technical field of cooperative mechanical arms, in particular to a test device and a test method for a driving power board of a cooperative mechanical arm.
Background
The cooperative mechanical arm generally comprises a plurality of joint modules, wherein each joint module comprises a motor, a speed reducer, a brake, a magnetic code disc, a magnetic encoder board, a joint servo drive controller board and a joint servo drive power board, so that the cooperative mechanical arm is structurally characterized by small volume, high joint integration level and the like.
The conventional method for detecting the driving power board generally includes mounting the driving power board on the joint module, and then detecting whether the joint module can normally operate. However, this detection method requires manual repeated mounting and dismounting of the drive power board, which results in low detection efficiency.
Disclosure of Invention
The invention mainly aims to provide a test device and a test method for a cooperative mechanical arm driving power board, and aims to solve the technical problem that the efficiency of detecting the driving power board is low.
In order to achieve the purpose, the invention provides a test device for a driving power board of a cooperative mechanical arm, which comprises a mounting table, a test fixture, a test main board and a power supply device, wherein the test fixture, the test main board and the power supply device are positioned on the mounting table, and a conductive probe electrically connected with the driving power board to be tested is arranged on the test fixture; the test main board is provided with a communication interface for outputting a detection result and a plurality of functional interfaces for electrically connecting with the tested drive power board; the power supply device is used for being electrically connected with the test main board and supplying power to the tested driving power board.
The functional interface comprises a first power input interface positioned on the test mainboard and a first AD detection interface electrically connected with a power module on the tested driving power board, and the first power input interface is used for being electrically connected with the power supply device.
The functional interface also comprises a first current detection interface and a first signal interface which are positioned on the test mainboard; the test equipment still includes three first relay and a test subplate, and is three wherein one end of first relay all with first current detection interface electricity is connected, and the other end is used for being connected with the three-phase drive bridge circuit electricity on the drive power board of being surveyed, be provided with on the test subplate be used for with the second signal interface of first signal interface electricity connection, be used for with the three-phase PEM signal interface of being connected of the three-phase pre-drive circuit electricity on the drive power board of being surveyed, be used for with the second current detection interface of being connected of the two-phase current detection module electricity on the drive power board of being surveyed and the second power input interface that is used for the power supply.
And the test auxiliary board is also provided with a second AD detection interface which is electrically connected with a power board version circuit on the tested driving power board and a third AD detection interface which is electrically connected with a self-detection circuit on the tested driving power board.
The function interface further comprises a fourth AD detection interface positioned on the test mainboard, and the fourth AD detection interface is used for being electrically connected with a brake circuit on the tested drive power board.
The test equipment further comprises a voltmeter which is arranged on the mounting table and electrically connected with the power supply device, and the voltmeter is used for displaying the voltage value input by the power supply device to the test main board and the tested driving power board.
The mounting table comprises a test box, a mounting plate and a pressing block, the mounting plate is arranged on the top surface of the test box, the pressing block is arranged on the mounting plate in a sliding mode and used for sliding along the vertical direction, the test jig is located on the top surface of the test box and located under the pressing block, and the test main board is located inside the test box.
The test equipment further comprises a driving mechanism arranged on the mounting plate, and the output end of the driving mechanism is connected with the pressing block to drive the pressing block to move.
The power supply device comprises a power supply, a manual switch, an air switch and a second relay, wherein one output end of the power supply is electrically connected with the test mainboard through the manual switch; and the other output end of the power supply is electrically connected with the tested driving power board through the air switch and the second relay in sequence.
The test equipment further comprises an identification device which is arranged on the mounting table and used for communicating with an external terminal, and the identification device is used for collecting the serial numbers on the tested driving power board.
The invention also provides a test method of the cooperative mechanical arm driving power board, which comprises the following steps:
supplying power to the driving power board to be tested;
acquiring actual state data of a tested driving power board, and comparing the actual state data with standard state data;
and outputting a comparison result.
The step of obtaining actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises the following steps:
acquiring first actual voltage data of each power supply module;
and comparing the first actual voltage data with first standard voltage data.
The step of obtaining actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises the following steps:
conducting the test main board with any one of three phases of the three-phase drive bridge circuit U, V, W, and disconnecting the upper and lower MOS tubes of each phase;
respectively acquiring first actual current data after each phase is conducted and second actual current data of the two-phase current detection module;
and comparing the first actual current data and the second actual current data with first standard current data respectively.
Wherein, the step of comparing the first actual current data and the second actual current data with the first standard current data respectively further comprises:
conducting the test main board with any one of three phases of the three-phase drive bridge circuit U, V, W and conducting the MOS tube under the phase;
respectively acquiring third actual current data after each phase is conducted and fourth actual current data of the two-phase current detection module;
and comparing the third actual current data and the fourth actual current data with second standard current data respectively.
The step of obtaining actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises the following steps:
connecting three phases of the three-phase drive bridge circuit U, V, W in series, and disconnecting the upper MOS tube and the lower MOS tube of each phase;
acquiring fifth current data of the two-phase current detection module;
comparing the fifth actual current data with third standard current data.
Wherein, the step of comparing the fifth actual current data with the third standard current data further comprises:
three phases of the three-phase drive bridge circuit U, V, W are connected in series, and an upper MOS tube of any phase and lower MOS tubes of the other two phases are conducted;
acquiring sixth actual current data of the two-phase current detection module;
and comparing the sixth actual current data with fourth standard current data.
The step of obtaining actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises the following steps:
the external connection of a resistor with a preset resistance value at the position of the internal contracting brake circuit
Controlling the MOS tube in the band-type brake circuit to be switched on and off;
respectively acquiring second actual voltage data and third actual voltage data of the resistor in the on-state and the off-state of the MOS tube;
and comparing the second actual voltage data and the third actual voltage data with second standard voltage data and third standard voltage data respectively.
The step of obtaining actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises the following steps:
acquiring fourth actual voltage data of the power board version circuit;
and comparing the fourth actual voltage data with fourth standard voltage data.
According to the test equipment for the driving power board of the cooperative mechanical arm, provided by the embodiment of the invention, the tested driving power board is placed on the test fixture, and after the power supply device is used for respectively supplying power to the test main board and the tested driving power board, corresponding data can be obtained through each functional interface and the working state of the tested driving power board can be automatically judged, so that the test mode of the driving power board is simplified, and the detection efficiency is favorably improved.
Drawings
FIG. 1 is a schematic structural diagram of an embodiment of a testing apparatus for testing a power board driven by a cooperative robot arm according to the present invention;
FIG. 2 is a schematic diagram of an electrical connection relationship between a test main board, a test sub-board power supply device and a tested driving power board of the test apparatus shown in FIG. 1;
FIG. 3 is a schematic structural diagram of the test motherboard shown in FIG. 2;
FIG. 4 is a schematic structural diagram of the power supply apparatus shown in FIG. 2;
FIG. 5 is a schematic structural view of the test sub-board shown in FIG. 2;
FIG. 6 is a schematic structural diagram of the tested driving power board shown in FIG. 2;
FIG. 7 is a schematic diagram of a portion of the test apparatus shown in FIG. 1;
FIG. 8 is a schematic structural diagram of the test fixture shown in FIG. 1;
FIG. 9 is a flowchart illustrating an embodiment of a method for testing a power board driven by a cooperative mechanical arm according to the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to the same or similar elements throughout or are provided with the same or similar functions. The embodiments described below with reference to the drawings are exemplary and intended to be illustrative of the present invention and should not be construed as limiting the present invention, and all other embodiments that can be obtained by one skilled in the art based on the embodiments of the present invention without inventive efforts shall fall within the scope of protection of the present invention.
The invention provides a test device for a power board driven by a cooperative mechanical arm, which comprises a mounting table 100, a test fixture 200, a test mainboard 300 and a power supply device 400, wherein the test fixture 200, the test mainboard 300 and the power supply device 400 are positioned on the mounting table 100, and a conductive probe 210 for electrically connecting with the driven power board to be tested is arranged on the test fixture 200; the test main board 300 is provided with a communication interface 330 for outputting test results and a plurality of functional interfaces for electrically connecting with a tested driving power board; the power supply device 400 is used for electrically connecting with the test motherboard 300 and supplying power to the driving power board to be tested.
In this embodiment, as shown in fig. 1 and 8, the top surface of the test fixture 200 is provided with the conductive probe 210, and meanwhile, the preferred test fixture 200 is provided with the fixing position 220, the fixing position 220 may be a positioning column that can be inserted into a mounting hole on the tested driving power board, so as to fix the tested driving power board by using the positioning column, of course, the fixing position 220 may also be a holding cavity that is provided on the test fixture 200, and the shape of the holding cavity may be set according to the tested driving power board, so as to fix the tested driving power board.
The power supply device 400 supplies power to the test motherboard 300 and the tested drive power board respectively, and the specific power supply mode may be that the power supply device 400 is provided with two output ends to supply power to the test motherboard 300 and the tested drive power board respectively, or that the power supply device 400 supplies power to the test motherboard 300 first and then the test motherboard 300 is used to supply power to the tested drive power board.
The test main board 300 is provided with a communication interface 330 for outputting a detection result and a plurality of functional interfaces electrically connected with the tested drive power board, after the power supply device 400 is used for supplying power to the test main board 300 and the tested drive power board, parameters or specific signals of each functional module (such as a power module, a three-phase drive bridge circuit, a power board version circuit and the like) on the tested driver control board can be conveniently collected through each functional interface, so that the test main board 300 can compare the parameters or the specific signals with preset parameters or signals, the working state of each functional module on the tested drive power board is automatically judged, finally, the test main board 300 outputs a judgment result through the communication interface 330, preferably, the communication interface 330 is in communication connection with an external terminal, and the judgment result is conveniently displayed. The tested driving power board may be electrically connected to each functional interface by a corresponding conductive probe 210 disposed on the test fixture 200, and the conductive probe 210 may be directly located on the test motherboard 300 (at this time, the test fixture 200 only serves to fix the tested driving power board). In this embodiment, by placing the tested driving power board in the testing fixture 200, and after the power supply device 400 is used to supply power to the testing motherboard 300 and the tested driving power board respectively, corresponding data can be acquired through each functional interface and the working state of the tested driving power board can be automatically determined, so that the testing mode of the driving power board is simplified, and the improvement of the detection efficiency is facilitated.
In a preferred embodiment, as shown in fig. 2 and fig. 3, the functional interface includes a first power input interface 310 located on the test motherboard 300 and a first AD detection interface 320 electrically connected to a power module on the driving board to be tested, and the power supply device 400 is electrically connected to the first power input interface 310 and a power supply port on the driving board to be tested, respectively. After the power supply device 400 is used to supply power to the test motherboard 300 and the driving power board to be tested, the first AD detection interface 320 obtains the voltage values of the power modules on the driving power board to be tested, determines whether the voltage values of the power modules are consistent with preset values, and outputs the determination result through the communication result, where the specific output mode of the communication interface 330 may be output to an external terminal for display, or may also be output to a warning light disposed on the mounting platform 100, where a red light indicates that the driving power board to be tested is abnormal in operation, and a green light indicates that the driving power board to be tested is normal in operation, and the logic circuit and the processor on the test motherboard 300 may be implemented with reference to the existing implementation mode to implement the above functions, which will not be described in detail herein. In this embodiment, after the tested driving power board is placed on the testing fixture 200 and the power supply device 400 is used to supply power to the testing motherboard 300 and the tested driving power board, the voltage values of the power modules on the tested driving power board can be obtained through the first AD detection interface 320, and whether the collected voltage values are consistent with the preset values or not is judged.
In a preferred embodiment, as shown in fig. 3 and 4, the power supply device 400 includes a power supply 410, a manual switch 420, an air switch 430 and a second relay 440, wherein the power supply 410 is provided with two output ports, one of the output ports is electrically connected to the first power input interface 310 through the manual switch 420, so as to conveniently control the on/off of the power supply circuit of the test motherboard 300; and the other output port is electrically connected with a power supply input port on the tested driving power board through an air switch 430 and a second relay 440 in sequence. The air switch 430 is preferably of a current-limiting 2A specification, the test motherboard 300 may control the operating state of the second relay 440, that is, the second relay 440 is turned on or off, and the power supply 410 may be in the form of an adapter, so as to respectively step down the 220VAC mains voltage and output the voltage to the test motherboard 300(12VDC) and the drive power board (48 VDC). Of course, the power source 410 may also be a rechargeable battery (e.g., a lithium battery) to facilitate testing of the testing device in different environments.
In a preferred embodiment, as shown in fig. 3 to fig. 6, the functional interface further includes a first current detection interface 340 and a first signal interface 350 located on the test main board 300, preferably, the first current detection interface 340 is electrically connected to the three-phase driving bridge circuit on the driving power board to be tested through three first relays 111, that is, the three first relays 111 are electrically connected to U, V and W phases in the three-phase driving bridge circuit, respectively, and the test main board 300 can further control the operating states of the three first relays 111, that is, the on/off states of the first relays 111. Meanwhile, the test equipment further comprises a test sub-board 500, and a second signal interface 510 capable of being electrically connected with the first signal interface 350, a three-phase PEM signal interface 520 capable of being electrically connected with a three-phase pre-driving circuit on the tested driving power board, a second current detection interface 530 capable of being electrically connected with a two-phase current detection module on the tested driving power board, and a second power input interface 540 for supplying power are arranged on the test sub-board 500. The functional interfaces on the test sub-board 500 may be electrically connected to the tested driving power board by corresponding conductive probes 210 on the test fixture 200, and the functional interfaces on the test sub-board 500 may be electrically connected to the corresponding conductive probes 210, or the test sub-board 500 and the tested driving power board may be directly electrically connected in an assembled manner by a transition card board, the pattern of the test sub-board 500 may be set by referring to the existing servo control board, and the data collected on the test sub-board 500 may be transmitted to the test main board 300 through the second signal interface 510, and the power supply to the test sub-board 500 may be through the power supply device 400, that is, the second power input interface 540 is electrically connected to the power supply device 400, or may be supplied by a power supply module on the tested driving power board.
In a preferred embodiment, the test sub-board 500 is further provided with a second AD detection interface 550 and a third AD detection interface 560, wherein the second AD detection interface 550 is electrically connected to the power board version circuit on the tested driving power board to obtain an actual voltage value of the power board version circuit, and the actual voltage value is transmitted to the test main board 300 through the second signal interface 510, and the actual voltage value is compared with a plurality of standard voltage values, so as to obtain a good or bad status of the power board version circuit. The third AD detection interface 560 is electrically connected to the 48V self-test circuit on the tested driving power board, so as to obtain a voltage value input by the power input port on the tested driving power board, which is collected by the 48V self-test circuit, and transmit the voltage value to the test motherboard 300 through the second signal interface 510.
In a preferred embodiment, as shown in fig. 3, the test motherboard 300 is further provided with a fourth AD detection interface 360, and the fourth AD detection interface 360 can be electrically connected to the brake circuit on the tested driving power board, specifically, the test motherboard 300 outputs a specific digital level to the Break-Relay1 port on the tested driving power board, and controls the on/off of the MOS transistor in the brake circuit on the tested driving power board, when the fourth AD detection interface 360 detects that the voltage across the brake circuit in the tested driving power board changes from 48V to 0V, it can determine that the brake circuit is normal. The test equipment further comprises a test adapter plate, the fourth AD detection interface 360 on the test main board 300 is electrically connected with the brake circuit on the tested driving power board through the adapter plate, and a resistor with a preset size, such as 10K, is arranged on the adapter plate.
In a preferred embodiment, as shown in fig. 1, the testing apparatus further includes a voltmeter 121 disposed on the mounting table 100, and the voltmeter 121 is electrically connected to the power supply device 400. At this time, the number of the voltage meters 121 is preferably two, wherein one of the voltage meters 121 is electrically connected to the power supply terminal of the power supply device 400 to the test motherboard 300, and the other one of the voltage meters 121 is electrically connected to the power supply port of the power supply device 400 to the tested driving power board, so that whether the voltage value input to the test motherboard 300 is normal and whether the voltage input to the tested driving power board is normal can be respectively observed through the two voltage meters 121.
In a preferred embodiment, as shown in fig. 1 and 7, the mounting table 100 preferably includes a test box 110, a mounting plate 120 and a pressing block 130, the mounting plate 120 is disposed on the top surface of the test box 110 in a vertical state, and the pressing block 130 is slidably disposed on the mounting plate 120 and can slide in a vertical direction. At this time, the test fixture 200 is also located on the top surface of the test box 110 and located right below the press block 130, so that the press block 130 can apply a predetermined pressure to the tested driving power circuit board located on the test fixture 200, and the test motherboard 300 is located in the inner space of the test box 110. At this time, preferably, two voltage meters 121 are rotatably connected to the mounting plate 120, so that the angle of the voltage meters 121 can be adjusted conveniently, and the voltage values can be conveniently observed by different users. In this embodiment, the pressing block 130 applies a predetermined pressure to the tested driving power board located in the testing fixture 200, so as to facilitate the stability of the tested driving power board placed on the testing fixture 200, i.e. the stability of the electrical connection between the tested driving power board and the conductive probe 210 on the testing fixture 200.
In a preferred embodiment, as shown in fig. 1, the testing apparatus further comprises a driving mechanism 600 disposed on the mounting plate 120, in which case, the driving mechanism for driving the pressing block 130 to move may be manual (such as a linkage mechanism) or automatic (such as a lead screw assembly + a motor). In this embodiment, the driving mechanism 600 preferably includes a handle with one end hinged to the mounting plate 120 and a connecting rod with two ends hinged to the handle and the pressing block 130, so that the pressing block 130 can be driven to move by swinging the handle.
In a preferred embodiment, the test box 110 preferably includes a box body and a lid, and one side of the lid is hinged to one side of the box body and can be pivoted out of the hinged position to close off the open end of the box body. At this time, the mounting plate 120 and the test fixture 200 are both located on the lid. The testing box 110 may further include a fixing structure to fix the box cover on the box body, such as by screws or hanging. In this embodiment, through being connected lid and box body articulated mode to the convenience is installed and is maintained the test mainboard 300 that is located the box body.
In a preferred embodiment, as shown in fig. 1, in order to record the test information of the tested driving power board, preferably, the mounting table 100 is further provided with an identification device 700 capable of communicating with an external terminal, and the specific device may be arranged according to the serial number information pattern set on the tested driving power board, for example, if the serial number information is a two-dimensional code, a barcode or a numeric string, a barcode scanning gun corresponding to the serial number information pattern is adopted. The identification device 700 and the external terminal may communicate with each other by transmitting information obtained by scanning to the test motherboard 300, and then the test motherboard 300 associates the serial number information with the test information of the tested drive power board and sends the serial number information to the external terminal, thereby avoiding the situation that the serial number information is not matched with the test information. Meanwhile, the identification device 700 may be directly connected to the external terminal, so as to directly send the serial number information of the driving power board to be tested to the external terminal. Of course, the recognition device 700 may be provided separately, and is not necessarily provided on the mounting table 100.
In a preferred embodiment, the preferred test fixture 200 includes a bottom plate disposed on the mounting table 100, an elastic member and a top plate, wherein the top plate is slidably disposed on the bottom plate and can slide along a vertical direction, the sliding connection may be in the form of a sliding pillar matching with a sliding hole, the elastic member is respectively connected to the bottom plate and the top plate, and the preferred elastic member is a return spring sleeved on the sliding pillar. The conductive probe 210 is located on the bottom plate, the fixing portion 220 is located on the top surface of the top plate, and a through hole for the conductive probe 210 to pass through is formed in the region of the top plate located at the fixing portion 220, so that after the pressing block 130 descends, the top plate can move towards the bottom plate to enable the detected driving power plate located on the top plate to be electrically connected with the conductive probe 210 on the bottom plate, and meanwhile, after the pressing block 130 ascends, the elastic piece can be used for driving the top plate to automatically reset to enable the detected driving power plate located on the top plate to be separated from the conductive probe 210 on the bottom plate.
The invention provides a test method of a cooperative mechanical arm driving power board aiming at the test equipment, which comprises the following steps:
and step S10, supplying power to the driving power board to be tested. In this step, the specific way of supplying power to the tested driving power board may be that the power supply device supplies power to the test motherboard first, and then the test motherboard controls the power supply device to supply power to the tested driving power board. The manual switch is preferably manually started in a power supply mode of the test mainboard, and then the test mainboard can control the second relay to supply power to the drive power board to be tested, specifically to supply 48V voltage to the drive power board to be tested.
And step S20, acquiring actual state data of the driving power board to be tested, and comparing the actual state data with the standard state data. In this step, the actual state data includes any one or more of actual voltage data of the power supply on the driving power board to be tested, actual current data of each phase of the three-phase bridge driving circuit on the driving power board to be tested, actual voltage data of the band-type brake circuit on the driving power board to be tested, and actual voltage data of the power board version circuit on the driving power board to be tested. In this case, the functional interface also has a plurality of functional interfaces corresponding to the actual state parameters to be acquired.
And step S30, outputting the comparison result. In this step, the test motherboard may control the communication interface to output in a form of directly feeding back the comparison result to an upper computer such as a computer in communication connection with the communication interface, or directly outputting the determination result to an indicating component on the test device, such as a green light representing normal and a red light representing abnormal, or a buzzer capable of emitting different sounds.
In this embodiment, the voltage and current data of each circuit or module on the tested driving power board are automatically obtained, so that the quality of the tested driving power board can be automatically judged, and the test efficiency is improved.
In a preferred embodiment, the step of obtaining the actual state data of the driving power board to be tested and comparing the actual state data with the standard state data comprises:
acquiring first actual voltage data of each power supply module;
comparing the first actual voltage data with the first standard voltage data.
In this step, the manner of obtaining the voltage value of the power supply on the measured driving power board is as follows: the voltage values (namely first actual voltage data) of power modules such as 14V power supplies, 5V power supplies and 3V power supplies on the driving power board to be tested are respectively obtained by utilizing the first AD detection interface, and the voltage values acquired by the power modules are respectively and correspondingly compared with 14V power supplies, 5V power supplies and 3V power supplies (namely first standard voltage data), so that a comparison result of whether the actual voltage values are the same as the standard voltage values is obtained, and the quality states of the power modules are judged.
In a preferred embodiment, the step of obtaining the actual state data of the driving power board to be tested and comparing the actual state data with the standard state data comprises:
conducting the test main board with any one of three phases of the three-phase drive bridge circuit U, V, W, and disconnecting the upper and lower MOS tubes of each phase;
respectively acquiring first actual current data after each phase is conducted and second actual current data of the two-phase current detection module;
comparing the first actual current data and the second actual current data with the first standard current data respectively;
conducting the test main board with any one of three phases of the three-phase drive bridge circuit U, V, W and conducting the MOS tube under the phase;
respectively acquiring third actual current data after each phase is conducted and fourth actual current data of the two-phase current detection module;
and comparing the third actual current data and the fourth actual current data with the second standard current data respectively.
In this step, the actual current data of each phase of the three-phase drive bridge circuit is specifically obtained in the following manner:
MOS tube driving circuit under detection three-phase
1. U-phase lower MOS tube drive detection
The preconditions are as follows: the test main board controls a first relay and a second relay which are electrically connected with the U phase to be conducted, and the first relay which is electrically connected with the V phase and the W phase to be disconnected;
when the test subplate controls all MOS tubes in the three-phase drive bridge circuit to be disconnected through the three-phase PEM signal interface, if the current values (namely the first actual current data and the second actual current data, the same below) acquired by the first current detection interface and the second current detection interface are both 0A (namely the first standard current data, the same below);
when the test auxiliary board controls the conduction of the U-phase lower MOS tube through the three-phase PEM signal interface, other MOS tubes are disconnected, and if the current values (namely the third actual current data and the fourth actual current data, the same below) acquired by the first current detection interface and the second current detection interface are both 0.12A (namely the second standard current data, the same below), the normal work of the U-phase lower MOS tube driving circuit and the U-phase current circuit can be judged.
2. MOS tube drive detection under V phase
The preconditions are as follows: the test main board controls a first relay and a second relay which are electrically connected with the V phase to be conducted, and the first relay which is electrically connected with the U phase and the W phase to be disconnected;
when the test auxiliary board controls all the MOS tubes to be disconnected through the three-phase PEM signal interface, if the current values detected by the first current detection interface and the second current detection interface are both 0A;
when the test auxiliary board controls the conduction of the MOS tube under the V phase through the three-phase PEM signal interface and other MOS tubes are disconnected, if the current value detected by the second current detection interface is 0.12A, the normal work of the MOS tube driving circuit under the V phase and the V phase current circuit can be judged.
3. Drive detection of MOS tube under W phase
The preconditions are as follows: the test main board controls a first relay and a second relay which are electrically connected with the W phase to be conducted, and the first relay which is electrically connected with the U phase and the V phase to be disconnected;
when the test auxiliary board controls all the MOS tubes to be disconnected through the three-phase PEM signal interface, if the current values detected by the first current detection interface and the second current detection interface are both 0A;
when the test auxiliary board controls the conduction of the MOS tube under the W phase through the three-phase PEM signal interface and other MOS tubes are disconnected, if the current values detected by the first current detection interface and the second current detection interface are 0.12A, the normal work of the MOS tube driving circuit under the W phase and the W phase current circuit can be judged.
In addition, if the detected actual current data is as follows, the corresponding device may be damaged as follows:
(1) phenomenon of U-phase MOS tube burning VDS direct conduction
When all MOS tubes are disconnected, the actual current data detected by the first current detection interface and the second current detection interface is 0.12A.
(2) U-phase current circuit abnormity or U-phase lower MOS tube pre-drive chip abnormity
And when the MOS tube under the U-phase is conducted and the other MOS tubes are disconnected, the actual current data detected by the first current detection interface and the second current detection interface is not equal to 0.12A.
(3) When the MOS tube on the U-phase is burnt out
And the MOS tube under the U-phase is conducted, and when the other MOS tubes are disconnected, the direct current air switch starts over-current protection, so that the voltage detection is abnormal.
The V, W phase circuit abnormality is similar to the U-phase circuit abnormality, and the method described above is only required, and will not be described in detail here.
In a preferred embodiment, the step of obtaining the actual state data of the driving power board to be tested and comparing the actual state data with the standard state data comprises:
connecting three phases of the three-phase drive bridge circuit U, V, W in series, and disconnecting the upper MOS tube and the lower MOS tube of each phase;
acquiring fifth current data of the two-phase current detection module;
comparing the fifth actual current data with the third standard current data;
three phases of the three-phase drive bridge circuit U, V, W are connected in series, and an upper MOS tube of any phase and lower MOS tubes of the other two phases are conducted;
acquiring sixth actual current data of the two-phase current detection module;
and comparing the sixth actual current data with the fourth standard current data.
In this step, the actual current data of each phase of the three-phase drive bridge circuit is specifically obtained in the following manner:
testing a three-phase upper MOS tube driving circuit:
1. u-phase MOS tube drive circuit detection
The preconditions are as follows: the three first relays are electrically connected with each other, the testing system further comprises a third relay, the first current detection interface is electrically connected with the three first relays through the third relay respectively, the testing main board controls the three first relays and the second relay to be connected, and the third relay is disconnected;
when the test sub-board controls all the MOS tubes to be disconnected through the three-phase PEM signal interface, if the current value detected by the second current detection interface (namely the fifth current data, the same below) is 0A (namely the third standard current data, the same below);
when the test auxiliary board controls the conduction of the U-phase upper MOS tube and the V-phase lower MOS tube through the three-phase PEM signal interface, and other MOS tubes are disconnected, if the current value (namely sixth actual current data, the same below) detected by the second current detection interface is 0.32A +/-0.1 (namely fourth standard current data, the same below), the normal work of the U-phase upper MOS tube driving circuit can be judged.
2. MOS tube drive circuit detection on V phase
The preconditions are as follows: the test main board controls the three first relays and the three second relays to be switched on, and the three third relays are switched off;
when the test auxiliary board controls all the MOS tubes to be disconnected through the three-phase PEM signal interface, if the current value detected by the second current detection interface is 0A;
when the test auxiliary board controls the U, W lower MOS tube and the V upper MOS tube to be conducted through the three-phase PEM signal interface, and other MOS tubes are disconnected, if the current value detected by the second current detection interface is-0.15A, the V upper MOS tube driving circuit can be judged to work normally.
3. W-phase upper MOS tube drive circuit detection
The preconditions are as follows: the test main board controls the three first relays and the three second relays to be switched on, and the three third relays are switched off;
when the test auxiliary board controls all the MOS tubes to be disconnected through the three-phase PEM signal interface, if the current value of the second current detection interface is 0A;
when the test auxiliary board controls the conduction of the V-phase lower MOS tube, the U-phase lower MOS tube and the W-phase upper MOS tube through the three-phase PEM signal interface, and other MOS tubes are disconnected; if the current value detected by the second current detection interface is 0.32A, the normal work of the MOS tube driving circuit on the W phase can be judged.
In a preferred embodiment, the step of obtaining the actual state data of the driving power board to be tested and comparing the actual state data with the standard state data comprises:
the external connection of a resistor with a preset resistance value at the position of the internal contracting brake circuit
Controlling the MOS tube in the band-type brake circuit to be switched on and off;
respectively acquiring second actual voltage data and third actual voltage data of the resistor in the on-state and the off-state of the MOS tube;
the second actual voltage data and the third actual voltage data are compared with the second standard voltage data and the third standard voltage data, respectively.
In this step, the resistance value of the resistor is preferably 10K, and the MOS transistor in the band-type brake circuit is controlled to be turned on and off by the test motherboard, specifically, the test motherboard sends a corresponding digital level to the tested driving power board to control the turn-on and turn-off of the MOS transistor. Under the MOS pipe on state, if the voltage value (being the second actual voltage data) that the test mainboard gathered through fourth AD detection interface is 48V (being the second standard voltage data), under MOS pipe off state, the voltage value (being the third actual voltage data) that the test mainboard gathered through fourth AD detection interface is 0V (being the third standard voltage data) to can judge that band-type brake circuit is normal.
In a preferred embodiment, the step of obtaining the actual state data of the driving power board to be tested and comparing the actual state data with the standard state data comprises:
acquiring fourth actual voltage data of the power board version circuit;
and comparing the fourth actual voltage data with the fourth standard voltage data.
In this step, the actual state of the version circuit of the power board on the tested driving power board is obtained by electrically connecting the second AD detection interface on the test sub-board with the version circuit of the power board on the tested driving power board to acquire an actual voltage value (i.e., fourth actual voltage data), so that the actual voltage value can be compared with a standard voltage value (i.e., fourth standard voltage data) according to the actual voltage value, and then the good or bad state of the version circuit of the power board can be obtained.
The above is only a part or preferred embodiment of the present invention, and neither the text nor the drawings should limit the scope of the present invention, and all equivalent structural changes made by the present specification and the contents of the drawings or the related technical fields directly/indirectly using the present specification and the drawings are included in the scope of the present invention.
Claims (19)
1. The test equipment for the driving power board of the cooperative mechanical arm is characterized by comprising an installation table, a test fixture, a test main board and a power supply device, wherein the test fixture, the test main board and the power supply device are positioned on the installation table; the test main board is provided with a communication interface for outputting a detection result and a plurality of functional interfaces for electrically connecting with the tested drive power board; the power supply device is used for being electrically connected with the test main board and supplying power to the tested driving power board.
2. The test equipment as claimed in claim 1, wherein the functional interface comprises a first power input interface located on the test motherboard and a first AD detection interface for electrically connecting with a power module on the drive power board under test, the first power input interface being for electrically connecting with the power supply device.
3. The test equipment of claim 1, wherein the functional interface further comprises a first current sense interface and a first signal interface located on the test motherboard; the test equipment still includes three first relay and a test subplate, and is three wherein one end of first relay all with first current detection interface electricity is connected, and the other end is used for being connected with the three-phase drive bridge circuit electricity on the drive power board of being surveyed, be provided with on the test subplate be used for with the second signal interface of first signal interface electricity connection, be used for with the three-phase PEM signal interface of being connected of the three-phase pre-drive circuit electricity on the drive power board of being surveyed, be used for with the second current detection interface of being connected of the two-phase current detection module electricity on the drive power board of being surveyed and the second power input interface that is used for the power supply.
4. The test equipment as claimed in claim 3, wherein the test sub board is further provided with a second AD detection interface for electrically connecting with a power board version circuit on the drive power board to be tested and a third AD detection interface for electrically connecting with a self-test circuit on the drive power board to be tested.
5. The test equipment according to claim 1, wherein the functional interface further comprises a fourth AD detection interface located on the test motherboard, and the fourth AD detection interface is used for electrically connecting with a brake circuit on a drive power board to be tested.
6. The test equipment as claimed in claim 2, further comprising a voltmeter disposed on the mounting platform and electrically connected to the power supply device, wherein the voltmeter is configured to display a voltage value input by the power supply device to the test motherboard and the drive power board to be tested.
7. The test equipment as claimed in claim 1, wherein the mounting table comprises a test box, a mounting plate arranged on the top surface of the test box, and a pressing block arranged on the mounting plate in a sliding manner and used for sliding along a vertical direction, the test fixture is arranged on the top surface of the test box and is positioned right below the pressing block, and the test mainboard is positioned inside the test box.
8. The test apparatus of claim 7, further comprising a drive mechanism disposed on the mounting plate, an output of the drive mechanism being coupled to the mass to drive the mass to move.
9. The test equipment of claim 1, wherein the power supply device comprises a power supply, a manual switch, an air switch and a second relay, and one output end of the power supply is electrically connected with the test main board through the manual switch; and the other output end of the power supply is electrically connected with the tested driving power board through the air switch and the second relay in sequence.
10. The test equipment as claimed in claim 1, further comprising an identification device disposed on the mounting table and used for communicating with an external terminal, wherein the identification device is used for collecting the number on the driving power board to be tested.
11. The testing apparatus according to claim 7, wherein the testing fixture includes a bottom plate, a top plate, and an elastic member, the bottom plate is disposed on the mounting table, the conductive probe is located on the bottom plate, the top plate is slidably disposed on the bottom plate and can slide in a vertical direction, a fixing position is disposed on a top surface of the top plate, a through hole for the conductive probe to pass through is disposed in a region of the top plate located at the fixing position, and the elastic member is respectively connected to the bottom plate and the top plate.
12. A test method for a cooperative mechanical arm driving power board is characterized by comprising the following steps:
supplying power to the driving power board to be tested;
acquiring actual state data of a tested driving power board, and comparing the actual state data with standard state data;
and outputting a comparison result.
13. The testing method according to claim 12, wherein the step of acquiring actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises:
acquiring first actual voltage data of each power supply module;
and comparing the first actual voltage data with first standard voltage data.
14. The testing method according to claim 12, wherein the step of acquiring actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises:
conducting the test main board with any one of three phases of the three-phase drive bridge circuit U, V, W, and disconnecting the upper and lower MOS tubes of each phase;
respectively acquiring first actual current data after each phase is conducted and second actual current data of the two-phase current detection module;
and comparing the first actual current data and the second actual current data with first standard current data respectively.
15. The method of claim 14, wherein the step of comparing the first actual current data and the second actual current data with the first standard current data further comprises:
conducting the test main board with any one of three phases of the three-phase drive bridge circuit U, V, W and conducting the MOS tube under the phase;
respectively acquiring third actual current data after each phase is conducted and fourth actual current data of the two-phase current detection module;
and comparing the third actual current data and the fourth actual current data with second standard current data respectively.
16. The testing method according to claim 12, wherein the step of acquiring actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises:
connecting three phases of the three-phase drive bridge circuit U, V, W in series, and disconnecting the upper MOS tube and the lower MOS tube of each phase;
acquiring fifth current data of the two-phase current detection module;
comparing the fifth actual current data with third standard current data.
17. The method of claim 16, wherein the step of comparing the fifth actual current data with the third standard current data further comprises:
three phases of the three-phase drive bridge circuit U, V, W are connected in series, and an upper MOS tube of any phase and lower MOS tubes of the other two phases are conducted;
acquiring sixth actual current data of the two-phase current detection module;
and comparing the sixth actual current data with fourth standard current data.
18. The testing method according to claim 12, wherein the step of acquiring actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises:
the external connection of a resistor with a preset resistance value at the position of the internal contracting brake circuit
Controlling the MOS tube in the band-type brake circuit to be switched on and off;
respectively acquiring second actual voltage data and third actual voltage data of the resistor in the on-state and the off-state of the MOS tube;
and comparing the second actual voltage data and the third actual voltage data with second standard voltage data and third standard voltage data respectively.
19. The testing method according to claim 12, wherein the step of acquiring actual state data of the driving power board to be tested and comparing the actual state data with standard state data comprises:
acquiring fourth actual voltage data of the power board version circuit;
and comparing the fourth actual voltage data with fourth standard voltage data.
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CN116540682A (en) * | 2023-07-05 | 2023-08-04 | 天津信天电子科技有限公司 | Method, system, device, equipment and medium for testing analog single machine |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN116540682A (en) * | 2023-07-05 | 2023-08-04 | 天津信天电子科技有限公司 | Method, system, device, equipment and medium for testing analog single machine |
CN116540682B (en) * | 2023-07-05 | 2023-09-05 | 天津信天电子科技有限公司 | Method, system, device, equipment and medium for testing analog single machine |
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