CN112327223A - Connector test probe module for multiple measuring points - Google Patents

Connector test probe module for multiple measuring points Download PDF

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Publication number
CN112327223A
CN112327223A CN202011071425.3A CN202011071425A CN112327223A CN 112327223 A CN112327223 A CN 112327223A CN 202011071425 A CN202011071425 A CN 202011071425A CN 112327223 A CN112327223 A CN 112327223A
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CN
China
Prior art keywords
test
probe module
test probe
head
carrier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
CN202011071425.3A
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Chinese (zh)
Inventor
丁崇亮
翟康康
申啸
付盼红
李红叶
张小英
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Weinan Hi Tech Zone Wood King Technology Co Ltd
Original Assignee
Weinan Hi Tech Zone Wood King Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Weinan Hi Tech Zone Wood King Technology Co Ltd filed Critical Weinan Hi Tech Zone Wood King Technology Co Ltd
Priority to CN202011071425.3A priority Critical patent/CN112327223A/en
Publication of CN112327223A publication Critical patent/CN112327223A/en
Withdrawn legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/66Testing of connections, e.g. of plugs or non-disconnectable joints
    • G01R31/68Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07357Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention discloses a multi-point connector test probe module, which comprises: a carrier, wherein an inner cavity is arranged in the carrier; a spring, said spring comprising: an elastic portion located in the inner cavity; a head connected to one end of the flexible portion and extending beyond the carrier; and the tail part is connected with the other end of the elastic part and extends out of the carrier. The connector test probe module for the multiple test points solves the problems of unstable test and large resistance of the existing test module.

Description

Connector test probe module for multiple measuring points
Technical Field
The invention belongs to the technical field of electronic testing, and particularly relates to a multi-point connector testing probe module.
Background
Along with functions of mobile phones and wearable devices are more and more, internal electronic components of the mobile phones and the wearable devices are continuously developed towards miniaturization and precision, and under the background, various board-to-board integrated connectors are developed. The connectors need to be tested before being assembled, the connectors are in various forms, contact points of the connectors are groove structures, modules for testing the connectors with the grooves are available at present, for example, integrated ICT test modules.
However, these test modules currently have the following problems:
(1) the test is unstable;
(2) the resistance is large.
Therefore, in this situation, how to improve the reliability of the test probe module is very urgent and important.
Disclosure of Invention
The invention aims to provide a multi-point connector test probe module, which solves the problems of unstable test and high resistance of the existing test module.
In order to solve the above problems, the present invention discloses a multi-point connector test probe module, which comprises:
the device comprises a plurality of carriers which are arranged together in a stacked mode, wherein an inner cavity is formed in each carrier, and an elastic sheet is arranged in each carrier;
the shell fragment includes:
an elastic portion located in the inner cavity;
a head connected to one end of the flexible portion and extending beyond the carrier;
and the tail part is connected with the other end of the elastic part and extends out of the carrier.
The technical scheme of the invention also has the following characteristics:
further, one end of the elastic part is provided with an outer edge, the innermost part of the inner cavity is provided with a sliding groove, and the outer edge is positioned in the sliding groove.
Further, the elastic part comprises a plurality of U-shaped bodies which are transversely arranged, the U-shaped bodies are arranged up and down, and the adjacent edges of the opening ends of every two adjacent U-shaped bodies are connected together.
Further, the number of the U-shaped bodies is two.
Further, the tail portion includes a plurality of test heads.
Further, the number of the test heads is three.
Further, a plurality of the test heads includes:
a first test head;
two second test heads disposed on both sides of the first test head.
Further, a portion of each of the second test heads is bent outward.
Furthermore, a sharp foot is arranged on the outer edge of the bottom of the second testing head.
Further, the bottom of the first test head is tapered.
Compared with the prior art, the multi-point connector test probe module has the following advantages: (1) in the prior art, single-point contact is carried out in the use process, if the test condition of misplug occurs, the situation of needle bending occurs when a test probe contacts the inner wall with the inclined plane of the contact groove of the tested connector, and the problems of needle bending, needle falling and the like occur in the probe after multiple measurements, so that the test stability is seriously influenced; the multi-point connector test probe module can adapt to various plug-in conditions due to the adoption of three-point elastic contact, for example, when the plug-in is not correct, the three points of the test head can adapt to different plug-in states according to actual conditions, and can still stably contact the contact of the tested connector, thereby effectively solving the problem of unstable test of the existing test equipment; (2) according to the connector test probe module, R = U/I can be known according to the ampere formula, when three contact points of a test head are in contact with the groove wall of the contact groove, the situation that each contact point passes through each contact is assumedThe resistances of the points are all R, then the resistances R of the three contacts in parallelGeneral assemblyThat is, the resistance of the three-point contact is necessarily smaller than that of the one-point contact, thereby illustrating that the multi-point connector test probe module of the present invention has smaller resistance and better performance than the previous test probe module.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic structural diagram of a multi-test point connector test probe module according to the present invention;
FIG. 2 is a schematic structural diagram of a single carrier and its internal spring plate in the multi-test point connector test probe module of the present invention;
FIG. 3 is a schematic diagram of a conventional test probe module;
FIG. 4 is a schematic structural diagram of a first usage state of the multi-test point connector test probe module according to the present invention;
FIG. 5 is a structural diagram of a second usage state of the multi-point connector test probe module according to the present invention.
In the figure: 1. the test device comprises a carrier, a head, an outer edge, a sliding groove, a second test head, a first test head, an inner cavity, a U-shaped body, a printed board, a connector, a contact groove and a contact groove, wherein the head is 2, the outer edge is 3, the sliding groove is 4, the second test head is 5, the first test head is 6, the inner cavity is 7, the U-.
Detailed Description
The following embodiments are described in detail with reference to the accompanying drawings, so that how to implement the technical features of the present invention to solve the technical problems and achieve the technical effects can be fully understood and implemented.
As shown in fig. 1 and 2, the multi-site connector test probe module of the present invention mainly comprises the following components:
the device comprises a plurality of carriers 1 which are arranged together in a stacked mode, wherein an inner cavity 7 is arranged in each carrier 1, and an elastic sheet is arranged in each carrier 1;
the shell fragment contains:
an elastic part which is positioned in the inner cavity 7;
a head 2, the head 2 is connected with one end of the elastic part, and the head 2 extends out of the carrier 1;
the tail part is connected with the other end of the elastic part and extends out of the carrier 1; specifically, the method comprises the following steps: the tail comprises a first test head 6 and two second test heads 5, the two second test heads 5 being arranged on either side of the first test head 6.
As shown in fig. 3, in the prior art, a single point is contacted in the use process, if a test condition of misplugging occurs, when a test probe contacts the inner wall with an inclined plane of the contact groove 11 of the tested connector 10, the situation of needle bending occurs, and after multiple measurements, the probe may have problems of needle bending, needle falling and the like, which seriously affects the stability of the test.
As shown in fig. 4 and 5, the multi-test-point connector test probe module of the present invention adopts three-point elastic contact, so that the multi-test-point connector test probe module can adapt to various mating conditions, for example, when the mating condition is not correct, three test heads can adapt to different mating conditions according to actual conditions, and can still stably contact the contact of the tested connector, thereby effectively solving the problem of unstable test of the existing test equipment.
In addition, from the ampere equation, R = U/I, when the three contact points of the test head are all in contact with the groove wall of the contact groove 11, assuming that the resistance through each contact point is R, the resistance R of the three contact points in parallel is RGeneral assemblyThat is, the resistance of the three-point contact is necessarily smaller than that of the one-point contact, thereby illustrating that the multi-point connector test probe module of the present invention has smaller resistance and better performance than the previous test probe module.
Referring to fig. 2, in the multi-test-point connector test probe module of the present invention, a part of each second test head 5 is bent outward, so that a good elastic deformation can be formed to ensure a smooth recovery.
Referring to fig. 2, in the multi-test-point connector test probe module of the present invention, the outer edge of the bottom of the second test head 5 is provided with a sharp foot, which is convenient for touching the contact groove, so as to form a good contact.
Referring to fig. 2, in the multi-test-point connector test probe module of the present invention, the bottom of the first test head 6 is tapered to facilitate touching the contact groove, so as to form a good contact.
Referring to fig. 2, in the multi-test point connector test probe module of the present invention, one end of the elastic portion is provided with an outer edge 3, the innermost portion of the inner cavity 7 is provided with a sliding groove 4, and the outer edge 3 is located in the sliding groove 4 and can slide in the sliding groove, so as to facilitate the assembly.
Referring to fig. 2, in the multi-test-point connector test probe module of the present invention, the elastic portion includes two U-shaped bodies 8 arranged in a transverse direction, the two U-shaped bodies 8 are arranged in an up-down direction, and adjacent sides of the open ends of every two adjacent U-shaped bodies 8 are connected together, so that a certain recoverable elastic deformation can be formed in a wide range.
While the foregoing description shows and describes several preferred embodiments of the invention, it is to be understood, as noted above, that the invention is not limited to the forms disclosed herein, but is not to be construed as excluding other embodiments and is capable of use in various other combinations, modifications, and environments and is capable of changes within the scope of the inventive concept as expressed herein, commensurate with the above teachings, or the skill or knowledge of the relevant art. And that modifications and variations may be effected by those skilled in the art without departing from the spirit and scope of the invention as defined by the appended claims.

Claims (10)

1. The utility model provides a connector test probe module for multiple measurement points which characterized in that includes:
the device comprises a plurality of carriers (1) which are arranged together in a stacked mode, wherein an inner cavity (7) is formed in each carrier (1), and an elastic sheet is arranged in each carrier (1);
the shell fragment includes:
an elastic portion located in the inner cavity (7);
a head (2), the head (2) being connected to one end of the resilient portion and the head (2) extending beyond the carrier (1);
a tail part which is connected with the other end of the elastic part and extends out of the carrier (1).
2. The multi-test point connector test probe module as recited in claim 1, wherein an outer edge (3) is disposed at one end of the elastic portion, a sliding groove (4) is disposed at the innermost portion of the inner cavity (7), and the outer edge (3) is located in the sliding groove (4).
3. The multi-site connector test probe module as recited in claim 1, wherein the resilient portion comprises a plurality of laterally arranged U-shaped bodies (8), the plurality of U-shaped bodies (8) are arranged vertically, and adjacent sides of the open ends of every two adjacent U-shaped bodies (8) are connected together.
4. The multi-site connector test probe module as recited in claim 3, wherein the number of said U-shaped bodies (8) is two.
5. The multi-site connector test probe module of claim 1, wherein the tail portion comprises a plurality of test heads.
6. The multi site connector test probe module of claim 5, wherein the number of test heads is three.
7. The multi-site connector test probe module as recited in claim 6, wherein a plurality of said test heads comprise:
a first test head (6);
two second test heads (5), the two second test heads (5) being arranged on both sides of the first test head (6).
8. The multi-site connector test probe module as recited in claim 7, wherein each of the second test heads (5) is partially bent outward.
9. The multi-test point connector test probe module as recited in claim 8, wherein the outer bottom edge of the second test head (5) is provided with a sharp foot.
10. The multi-site connector test probe module as recited in claim 9, wherein the bottom of the first test head (6) is tapered.
CN202011071425.3A 2020-10-09 2020-10-09 Connector test probe module for multiple measuring points Withdrawn CN112327223A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011071425.3A CN112327223A (en) 2020-10-09 2020-10-09 Connector test probe module for multiple measuring points

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011071425.3A CN112327223A (en) 2020-10-09 2020-10-09 Connector test probe module for multiple measuring points

Publications (1)

Publication Number Publication Date
CN112327223A true CN112327223A (en) 2021-02-05

Family

ID=74314635

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011071425.3A Withdrawn CN112327223A (en) 2020-10-09 2020-10-09 Connector test probe module for multiple measuring points

Country Status (1)

Country Link
CN (1) CN112327223A (en)

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Application publication date: 20210205

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