CN112133072B - Test system and test method for LoRa wireless data acquisition device - Google Patents
Test system and test method for LoRa wireless data acquisition device Download PDFInfo
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- G08—SIGNALLING
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Abstract
The invention discloses a test system for a LoRa wireless data acquisition device and a test method thereof.A circuit to be tested receives and analyzes a test instruction sent by an upper computer; starting to execute a test program by a first circuit to be tested corresponding to the minimum serial number contained in the test instruction; the first circuit to be tested returns test data to the upper computer after completing the test, and the first circuit to be tested modifies the test instruction so that the test instruction no longer contains the serial number corresponding to the first circuit to be tested, and the modified test instruction is continuously sent to the circuits to be tested corresponding to other serial numbers; after the circuits to be tested corresponding to other serial numbers detect the test instruction, the circuit to be tested corresponding to the minimum serial number contained in the test instruction continues to execute the test program; and sending the test instruction after zero clearing to the upper computer to finish the test until the test instruction does not contain the sequence number information any more. The method saves the cost and time of the test, improves the test efficiency and can avoid data conflict.
Description
Technical Field
The invention relates to a system and a method for testing LoRa wireless data acquisition.
Background
Data acquisition device can realize remote control and wireless data transmission through being equipped with loRa wireless module. The prior art only discusses the problem of testing a single circuit or system for realizing data collection and transmission of a wireless internet of things by using an LoRa module in different application scenes, for example, the following patents: the present invention provides an automatic test system and a test method thereof, which is provided with no discussion about the problem of simultaneous testing of a plurality of circuits of the same kind when a data acquisition device with a LoRa is produced in batch, and is disclosed in application No. 201910629905.8, a test system and a test method thereof for a LoRa wireless electromechanical device, and application No. 201910629382.7, a test system and a test method thereof for a LoRa wireless data acquisition device.
Disclosure of Invention
The purpose of the invention is as follows: reduce the wireless data acquisition device of loRa test time one by one, carry out the test of a plurality of circuit functions automatically, improve production efficiency of software testing.
The technical solution for realizing the purpose of the invention is as follows:
a test method of a test system for a LoRa wireless data acquisition device comprises the following steps:
after the first circuit to be tested is tested, returning test data to the upper computer according to a specific format, modifying the test instruction by the first circuit to be tested so that the test instruction does not contain the serial number corresponding to the first circuit to be tested any more, and continuously sending the modified test instruction to the circuits to be tested corresponding to other serial numbers;
and 4, repeating the steps 2 to 3 until the test instruction does not contain the sequence number information any more, and sending the test instruction after zero clearing to the upper computer to finish the test.
Further, the upper computer controls the LoRa wireless module to send a specific format test instruction with a test circuit serial number to the circuit to be tested through the serial port.
Further, the upper computer receives the test data fed back by all the circuits to be tested and the modified test instruction in sequence, and checks whether the automatic test process is executed according to the sequence of the set serial numbers of the circuits to be tested from small to large according to the modified test instruction.
Further, the format of the test instruction sent by the upper computer and/or the received modified test instruction is as follows: header byte + sequence number byte + command byte + check byte.
Furthermore, the frame header occupies two repeatedly sent bytes, the serial number of the circuit to be tested is combined into one byte, the command is a reserved instruction byte, the command occupies one byte, and the check occupies one byte by adopting cyclic redundancy check.
Further, the test data format fed back by the circuit to be tested is as follows: header byte + sequence number byte + data byte + check byte.
Further, the frame header occupies two repeatedly sent bytes, the serial number occupies two bytes, wherein the serial number of the circuit to be tested occupies one byte, the serial number of the rest circuits to be tested occupies one byte, the data occupies three bytes, the check adopts the cyclic redundancy check to occupy one byte, and the total number of the bytes is 8.
Furthermore, the test instruction sent by the upper computer and the received modified test instruction comprise two repeatedly sent frame header bytes, and the test data fed back by the circuit to be tested comprises two repeatedly sent bytes which are different from the test instruction sent by the upper computer and the received modified test instruction.
Further, the step 2 comprises the following specific steps:
the method comprises the steps that after a circuit to be tested is electrified and initialized, data collection is automatically carried out, when a frame header of a test instruction frame is detected, whether a received frame header is correct or not is judged, if the correct frame header is not received, a re-receiving frame header is returned, if the correct frame header is received, test instructions of all the remaining bytes are continuously received, CRC (cyclic redundancy check) is carried out, and if the CRC is wrong, the frame header which waits for receiving the test instructions again is returned;
if the CRC is correct, judging whether the serial number corresponding to the circuit of the circuit to be tested in the received instruction has the serial number corresponding to the circuit of the circuit, if the serial number corresponding to the circuit of the circuit does not exist in the serial number instruction byte to be tested or the serial number corresponding to the circuit of the circuit to be tested is not the minimum serial number contained in the current test instruction, returning to receive the test instruction again;
if the received test instruction has a serial number corresponding to the circuit of the test instruction and the serial number is the circuit with the minimum serial number in the current test instruction, inquiring the data acquisition state of the device, and sending the obtained state data to an upper computer by a LoRa wireless module according to the format after inquiring the data acquisition state of the device;
and clearing the corresponding serial number in the test instruction after the data is sent, and sending the test instruction to other circuits to be tested according to the test instruction format.
The invention creates the advantages and achieves the effects that:
(1) the upper computer is only required to send a test instruction once, the set test module can automatically return test results, the circuit functions of a plurality of devices can be tested once, and compared with the mode that one module sends a command and then receives a return command, the test device saves multiple instruction time and improves test efficiency.
(2) The invention returns the test result in turn from small to large according to the module serial number of the module to be tested in the instruction, thereby avoiding the data conflict.
(3) The time for returning data can be adjusted according to requirements, so that one circuit to be tested can be tested to return one test result, and all the circuits to be tested can be tested to return the test result together, thereby further simplifying the test.
(4) The test method has wide applicability. The LoRa wireless data acquisition device provided by the invention is used for acquiring audio signals and is also suitable for acquiring other types of data.
(5) The test method has flexibility. The circuit to be tested can adjust the test sequence according to actual demand, namely if the circuit to be tested 1 needs to feed back data for many times, the circuit to be tested 1 can be set in other large-serial-number circuits to be tested again, and thus the multifunctional circuit device with the LoRa wireless peripheral can be tested simultaneously. In addition, the number of bytes of the serial number of the circuit to be tested in the test method can be set according to the number of the test circuits, and can be one byte or a plurality of bytes.
Drawings
Fig. 1 illustrates a circuit structure of a LoRa wireless data acquisition device;
FIG. 2 is a schematic diagram of a test system and method;
FIG. 3 is a flowchart of the procedure for measuring the distance to be measured;
FIG. 4 is a circuit for receiving waveforms of an oscilloscope instructed by an upper computer;
FIG. 5 illustrates a waveform of a circuit feedback data oscilloscope;
the first circuit of fig. 6 updates the oscilloscope waveforms of the test instructions.
Detailed Description
The invention is further described below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
The LoRa wireless data acquisition device is shown in figure 1 and comprises a system power supply, a main controller, a LoRa wireless module and other peripheral devices. The system power supply module provides various power supplies required by the whole circuit, and the circuit work is guaranteed. The main controller coordinates data acquisition of other peripheral equipment, and is responsible for receiving the test instruction that the host computer sent and feeding back test data to the host computer through loRa wireless module simultaneously.
The test system for the LoRa wireless data acquisition device is shown in figure 2 and comprises an upper computer and a circuit to be tested. The upper computer controls a LoRa wireless module to send a test instruction in the serial port assistant software through the serial port, and receives data fed back by the circuit to be tested and the modified test instruction. The circuit to be tested is the LoRa wireless data acquisition device.
The test method takes three tested circuits as an example, and the No. 1, the No. 2 and the No. 3 in the dashed line frame of the figure 2 are the circuits to be tested. After the circuit 1, the circuit 2 and the circuit 3 to be tested are electrified, the test instructions of the upper computer are waited. The host computer controls a LoRa wireless module through a serial port to send out a specific format test instruction with the serial numbers of the test circuit 1, the circuit 2 and the circuit 3, after the test instruction sent by the host computer is analyzed by the circuit to be tested, the circuit to be tested with the minimum serial number starts to execute a test program, namely the circuit 1 in the figure 2, and other circuits to be tested continue to wait for the test instruction.
After the test of the circuit No. 1 is finished, test data are returned to an upper computer according to a specific format, then the circuit No. 1 modifies a test instruction, the test instruction does not contain the serial number of the circuit No. 1 any more, only contains the serial numbers of the circuit No. 2 and the circuit No. 3, after the modification is finished, a new test instruction is sent to other circuits to be tested according to the specific format, the circuit No. 2 and the circuit No. 3 continue to execute the test by the circuit No. 2 with the smallest serial number after detecting the test instruction, then the circuit No. 2 feeds back the test data to the upper computer, the circuit No. 2 modifies the test instruction again and sends the test instruction again, the instruction only contains the serial number of the circuit No. 3, the circuit No. 1 and the circuit No. 3 execute the test after receiving the instruction, the test data are fed back to the upper computer, the test instruction is modified again, serial number information in the test instruction is cleared, the test instruction after the zero clearing is sent, and whether the automatic test process is executed according to the sequence of the set serial number of the tested circuit from small to large is checked through the modified test instruction, and the automatic test work of the LoRa wireless data acquisition device is completed after the work is finished.
When the circuit function is tested, the work of a test instruction sending end can be greatly reduced by setting the same address, the same speed and the same channel for the LoRa wireless module, but the problem that a plurality of circuits to be tested simultaneously feed back test data and conflict mutually is caused. This is because the radio frequency signals in the same frequency band interfere with each other when the radio frequency is transmitted, and the multiple circuits simultaneously feed back data to the upper computer through their own LoRa wireless modules, which causes signal collision, and results in that accurate data cannot be obtained or data is lost, so the format of the transceiving protocol is very important.
The format of the upper computer sending instruction and the updating test instruction of the circuit to be tested is as follows: the method comprises the steps of frame header, sequence number, command and verification, wherein the frame header is AA, the AA occupies two bytes, the sequence number of a circuit to be tested is combined into one byte, the command occupies one byte, the verification occupies one byte, and the total number of the bytes is 5. The frame header repeats the character sending setting, and the possibility of mistakenly receiving the instruction by the circuit to be tested is reduced. The serial number combination of the circuit to be tested is respectively set according to 8 bits in the bytes, the '00000010' indicates that the circuit to be tested is the No. 2 circuit, the hexadecimal system of the circuit to be tested is 0x02, the '00000111' indicates that the circuit to be tested is the No. 1 circuit, the No. 2 circuit and the No. 3 circuit, the hexadecimal system of the circuit to be tested is 0x07, the currently set combination of the circuit to be tested can test 8 circuits to be tested, and the number of the circuits to be tested can. The command byte is a reserved command byte, different test data can be returned according to the command, cyclic redundancy check CRC8 is adopted for the check byte, the check formula is x8+ x5+ x4+1, and the test command is AA 07011E by taking the circuit to be tested as No. 1, No. 2 and No. 3 as examples.
The feedback data format of the circuit to be tested is as follows: the method comprises the steps of frame header + serial number + data + verification, wherein the frame header is '5555' and occupies two bytes, the circuit serial number of current feedback data occupies one byte, the serial number of the rest circuit to be tested occupies one byte, the data occupies three bytes, the verification occupies one byte, and 8 bytes are counted. The feedback data frame header is different from the sending instruction frame header and is used for a circuit to be tested to quickly identify a receiving instruction and ignore data feedback of other circuits, the data bit number is determined according to data fed back by the actual requirement of the system, the system needs 3 bits of data, and the check bit is the same as the sending instruction algorithm and is cyclic redundancy check CRC 8. Taking the feedback of the number 1 data of the circuit to be tested as an example, the feedback data is "55550106 XX XX CRC".
The program flow chart of the tested circuit testing method designed by the testing method of fig. 2 is shown in fig. 3, the system initialization is started after the circuit to be tested is powered on, the initialization comprises the configuration of the global and related functional registers of the controller, the configuration of the working mode of the hardware peripheral circuit, the data acquisition work is automatically carried out after the initialization is finished, the LoRa enters the receiving state at the same time, the testing instruction of the upper computer is prepared to be received, when the system detects the frame head of the testing instruction frame, whether the received frame head is correct is judged, if the correct frame head is not received, the program returns to re-receive the frame head, if the correct frame head is received, the testing instruction of all the remaining bytes is continuously received, the CRC check is carried out, and if the CRC check is wrong, the frame;
if the CRC is correct, judging whether the serial number corresponding to the circuit of the circuit to be tested in the received instruction has the serial number corresponding to the circuit of the circuit, if the serial number corresponding to the circuit of the circuit does not exist in the serial number instruction byte to be tested or the serial number corresponding to the circuit of the circuit to be tested is not the minimum serial number contained in the current test instruction, returning to receive the test instruction again;
if the received test instruction has a serial number corresponding to the circuit of the test instruction and the serial number is the circuit with the minimum serial number in the current test instruction, inquiring the data acquisition state of the device, and sending the obtained state data to an upper computer by a LoRa wireless module according to the format after inquiring the data acquisition state of the device;
and clearing the corresponding serial number in the serial number byte of the instruction to be tested after the data is sent, and sending a test instruction according to the test instruction format, namely, the test work of the circuit is completed, and the circuit is qualified. After the test command is sent in the previous three examples of the circuit under test, the data received by the host computer is "55550106 XX XX CRC1 AA 0601 DA 55550204 XX XX XX CRC2 AA 04014B 55550300 XX XX CRC3 AA 000170".
Oscilloscope waveforms for transmitting and receiving data in the test process of the circuit No. 1 are shown in FIGS. 4, 5 and 6.
The above feedback results are feedback results when the circuit function is normal, and when the circuit function is failed, there are several states, or No. 1, No. 2, and No. 3 circuits to be tested are taken as an example. After sending test 1, 2, 3 the instruction back, there is not any feedback, send test 2, 3 the instruction has the correct feedback, 1 circuit is unusual, if still there is not feedback, only send the instruction of test 3 circuit, if 3 circuit has the correct feedback, 1 and 2 circuit function to be measured are unusual, if three instructions do not all have the feedback, test host computer loRa wireless module function, confirm whether host computer loRa wireless module function is normal. If host computer loRa wireless module function is normal, the loRa wireless module who changes unusual circuit carries out above-mentioned test again, if the circuit that awaits measuring still does not have feedback data after changing the normal loRa wireless module of function, needs detection circuitry peripheral hardware chip function and main control unit function. If the frame header fed back is correct '5555', the data after the circuit serial number is abnormal, which indicates that the peripheral function of the circuit is abnormal and needs to be further checked.
The test work of batch circuits can be completed quickly and efficiently according to the method.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, several modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.
Claims (10)
1. A test system for a LoRa wireless data acquisition device is characterized by comprising an upper computer and at least one circuit to be tested;
the upper computer controls the LoRa wireless module to send a test instruction through a serial port, and receives test data fed back by a circuit to be tested and a modified test instruction;
the circuit to be tested comprises a system power supply, a main controller, a LoRa wireless module and a peripheral;
the system power supply is used for providing required power supply;
the main controller coordinates data acquisition of peripheral equipment, and simultaneously receives a test instruction sent by the upper computer and feeds back test data to the upper computer through the LoRa wireless module;
the test method of the test system for the LoRa wireless data acquisition device comprises the following steps:
step 1, a circuit to be tested receives and analyzes a test instruction sent by an upper computer;
step 2, starting to execute a test program by the first circuit to be tested corresponding to the minimum serial number contained in the test instruction, and continuously waiting for the test instruction by the circuits to be tested corresponding to other serial numbers;
after the first circuit to be tested is tested, returning test data to the upper computer according to a specific format, modifying the test instruction by the first circuit to be tested so that the test instruction does not contain the serial number corresponding to the first circuit to be tested, and continuously sending the modified test instruction to the circuits to be tested corresponding to other serial numbers;
step 3, after the circuit to be tested corresponding to other serial numbers detects the test instruction, continuing to execute the test program by the circuit to be tested corresponding to the minimum serial number contained in the test instruction;
and 4, repeating the steps 2 to 3 until the test instruction does not contain the sequence number information any more, and sending the test instruction after zero clearing to the upper computer to finish the test.
2. A test method of a test system for a LoRa wireless data acquisition device is characterized by comprising the following steps:
step 1, a circuit to be tested receives and analyzes a test instruction sent by an upper computer;
step 2, starting to execute a test program by the first circuit to be tested corresponding to the minimum serial number contained in the test instruction, and continuously waiting for the test instruction by the circuits to be tested corresponding to other serial numbers;
after the first circuit to be tested is tested, returning test data to the upper computer according to a specific format, modifying the test instruction by the first circuit to be tested so that the test instruction does not contain the serial number corresponding to the first circuit to be tested, and continuously sending the modified test instruction to the circuits to be tested corresponding to other serial numbers;
step 3, after the circuit to be tested corresponding to other serial numbers detects the test instruction, continuing to execute the test program by the circuit to be tested corresponding to the minimum serial number contained in the test instruction;
and 4, repeating the steps 2 to 3 until the test instruction does not contain the sequence number information any more, and sending the test instruction after zero clearing to the upper computer to finish the test.
3. The testing method of the testing system for the LoRa wireless data acquisition device as claimed in claim 2, wherein the upper computer controls the LoRa wireless module to send the testing instruction with the specific format of the serial number of the testing circuit to the circuit to be tested through the serial port.
4. The testing method of the testing system for the LoRa wireless data acquisition device according to claim 2, wherein the upper computer receives the testing data and the modified testing instructions fed back by all the circuits to be tested in sequence, and checks whether the automatic testing process is executed according to the sequence of the set serial numbers of the circuits to be tested from small to large through the modified testing instructions.
5. The testing method of the testing system for the LoRa wireless data acquisition device according to claim 2, wherein the format of the test instruction sent by the upper computer and/or the received modified test instruction is as follows: header byte + sequence number byte + command byte + check byte.
6. The method as claimed in claim 5, wherein the frame header occupies two bytes repeatedly transmitted, the serial number of the circuit to be tested is combined into one byte, the command is a reserved command byte, the command occupies one byte, and the check occupies one byte by using cyclic redundancy check.
7. The method for testing the testing system for the LoRa wireless data acquisition device according to claim 2, wherein the format of the test data fed back by the circuit to be tested is as follows: header byte + sequence number byte + data byte + check byte.
8. The method as claimed in claim 7, wherein the frame header comprises two bytes and the serial number comprises two bytes, wherein the serial number of the circuit to be tested comprises one byte, the serial number of the remaining circuit to be tested comprises one byte, the data comprises three bytes, and the check comprises one byte and 8 bytes in total.
9. The method for testing the testing system of the LoRa wireless data acquisition device according to claim 2, wherein the test instruction sent by the upper computer and the received modified test instruction comprise two repeatedly sent frame header bytes, and the test data fed back by the circuit to be tested comprises two repeatedly sent bytes which are different from the test instruction sent by the upper computer and the received modified test instruction.
10. The method for testing the testing system for the LoRa wireless data acquisition device according to claim 2, wherein the step 2 comprises the following steps:
the method comprises the steps that after a circuit to be tested is electrified and initialized, data collection is automatically carried out, when a frame header of a test instruction frame is detected, whether a received frame header is correct or not is judged, if the correct frame header is not received, a re-receiving frame header is returned, if the correct frame header is received, test instructions of all the remaining bytes are continuously received, CRC (cyclic redundancy check) is carried out, and if the CRC is wrong, the frame header which waits for receiving the test instructions again is returned;
if the CRC is correct, judging whether the serial number corresponding to the circuit of the circuit to be tested in the received instruction has the serial number corresponding to the circuit of the circuit, if the serial number corresponding to the circuit of the circuit does not exist in the serial number instruction byte to be tested or the serial number corresponding to the circuit of the circuit to be tested is not the minimum serial number contained in the current test instruction, returning to receive the test instruction again;
if the received test instruction has a serial number corresponding to the circuit of the test instruction and the serial number is the circuit with the minimum serial number in the current test instruction, inquiring the data acquisition state of the device, and sending the obtained state data to the upper computer by the LoRa wireless module according to the format of claim 7 after inquiring the data acquisition state of the device;
and clearing the corresponding serial number in the test instruction after the data is sent, and sending the test instruction to other circuits to be tested according to the test instruction format.
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