CN112005104B - 测量方法以及测量装置 - Google Patents

测量方法以及测量装置 Download PDF

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Publication number: CN112005104B
Authority: CN; China
Prior art keywords: image; unit; angle; plane; normal line
Prior art date: 2018-04-27
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.): Active

Application number

CN201980026383.0A

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English (en)

Chinese (zh)

Other versions

CN112005104A (zh

Inventor

大西史朗

得津裕太郎

杉本巖生

铃川正纮

小崎修司

Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)

Hitachi Zosen Corp

Original Assignee

Hitachi Zosen Corp

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

2018-04-27

Filing date

2019-03-08

Publication date

2024-03-12

2019-03-08 Application filed by Hitachi Zosen Corp filed Critical Hitachi Zosen Corp

2020-11-27 Publication of CN112005104A publication Critical patent/CN112005104A/zh

2024-03-12 Application granted granted Critical

2024-03-12 Publication of CN112005104B publication Critical patent/CN112005104B/zh

Status Active legal-status Critical Current

2039-03-08 Anticipated expiration legal-status Critical

Links

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238000003384 imaging method Methods 0.000 claims abstract description 25
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238000005286 illumination Methods 0.000 claims description 28
238000005259 measurement Methods 0.000 claims description 10
238000000691 measurement method Methods 0.000 claims description 4
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Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined

Landscapes

Engineering & Computer Science (AREA)
Textile Engineering (AREA)
Physics & Mathematics (AREA)
Health & Medical Sciences (AREA)
Life Sciences & Earth Sciences (AREA)
Chemical & Material Sciences (AREA)
Analytical Chemistry (AREA)
Biochemistry (AREA)
General Health & Medical Sciences (AREA)
General Physics & Mathematics (AREA)
Immunology (AREA)
Pathology (AREA)
Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Analysing Materials By The Use Of Radiation (AREA)
Length Measuring Devices By Optical Means (AREA)

CN201980026383.0A 2018-04-27 2019-03-08 测量方法以及测量装置 Active CN112005104B (zh)

Applications Claiming Priority (3)

Application Number	Priority Date	Filing Date	Title
JP2018-087428		2018-04-27
JP2018087428A JP7076280B2 (ja)	2018-04-27	2018-04-27	測定方法および測定装置
PCT/JP2019/009327 WO2019207973A1 (ja)	2018-04-27	2019-03-08	画像取得方法、測定方法および画像取得装置

Publications (2)

Publication Number	Publication Date
CN112005104A CN112005104A (zh)	2020-11-27
CN112005104B true CN112005104B (zh)	2024-03-12

Family

ID=68293843

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
CN201980026383.0A Active CN112005104B (zh)	2018-04-27	2019-03-08	测量方法以及测量装置

Country Status (4)

Country	Link
JP (1)	JP7076280B2 (ja)
CN (1)	CN112005104B (ja)
TW (1)	TWI795552B (ja)
WO (1)	WO2019207973A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
WO2022224636A1 (ja)	2021-04-22	2022-10-27	日立造船株式会社	検査装置

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2018
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2019
- 2019-03-08 WO PCT/JP2019/009327 patent/WO2019207973A1/ja active Application Filing
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JPH07243819A (ja) *	1994-02-28	1995-09-19	Takiron Co Ltd	透明樹脂板の歪み検査方法及びその装置
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JP2007170961A (ja) *	2005-12-21	2007-07-05	Fujifilm Corp	検査装置及び検査方法
CN101013093A (zh) *	2006-02-02	2007-08-08	株式会社理光	表面缺陷检查装置、表面缺陷检查方法及表面缺陷检查程序
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CN106104261A (zh) *	2014-03-07	2016-11-09	新日铁住金株式会社	表面性状指标化装置、表面性状指标化方法以及程序
CN107735673A (zh) *	2015-06-25	2018-02-23	杰富意钢铁株式会社	表面缺陷检测方法、表面缺陷检测装置及钢材的制造方法

Also Published As

Publication number	Publication date
TWI795552B (zh)	2023-03-11
JP7076280B2 (ja)	2022-05-27
WO2019207973A1 (ja)	2019-10-31
CN112005104A (zh)	2020-11-27
TW201945977A (zh)	2019-12-01
JP2019191112A (ja)	2019-10-31

Legal Events

Date	Code	Title
2020-11-27	PB01	Publication
2020-11-27	PB01	Publication
2020-12-15	SE01	Entry into force of request for substantive examination
2020-12-15	SE01	Entry into force of request for substantive examination
2024-03-12	GR01	Patent grant
2024-03-12	GR01	Patent grant

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US20200364491A1 (en)	2020-11-19	Image detection scanning method for object surface defects and image detection scanning system thereof
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JP2012078144A (ja)	2012-04-19	透明体シート状物の表面欠陥検査装置
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