CN111367734A - Method for carrying out pressure test in testing machine - Google Patents
Method for carrying out pressure test in testing machine Download PDFInfo
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- CN111367734A CN111367734A CN202010127776.5A CN202010127776A CN111367734A CN 111367734 A CN111367734 A CN 111367734A CN 202010127776 A CN202010127776 A CN 202010127776A CN 111367734 A CN111367734 A CN 111367734A
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- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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Abstract
The invention discloses a method for carrying out pressure test in a tester, wherein the tester comprises M test single boards, and the method comprises the following steps: s01: respectively carrying out test configuration on N test single boards to be subjected to pressure test in a control center to form configuration data, wherein the configuration data comprises a distinguishing code corresponding to the test single boards, a test item, test time and a test sequence; s02: the control center sends the configuration data of each test single board to the corresponding test single board; s03: the test single board acquires and analyzes configuration data, and performs pressure test after matching the configuration data with a locally stored test flow; s04: and the test single board sends the test result to the control center. According to the method for testing the pressure by the testing machine, provided by the invention, the pressure of each testing single board can be flexibly tested by the unified configuration of the control center, so that the manual configuration is reduced, and the overall efficiency is improved.
Description
Technical Field
The invention relates to the field of integrated circuit testing, in particular to a method for carrying out pressure testing in a testing machine.
Background
The semiconductor automatic testing machine comprises a plurality of testing single boards, each testing single board comprises a plurality of testing chips, a single testing machine needs to verify a plurality of different types of chips, and in order to meet different use requirements in production, the types and the number of the testing single boards in the testing machine are large. In the prior art, when a testing machine is used for testing the pressure of a single board, the different types of single boards to be tested are different greatly, and therefore, the pressure needs to be tested specifically.
Stress Test (Stress Test), also known as strength Test, load Test. The pressure test is to simulate the software and hardware environment of practical application and the system load of the user in the using process, and run the test software for a long time or with an ultra-large load to test the performance, reliability, stability and the like of the tested system.
In the prior art, when each test single board is subjected to customized and differentiated pressure tests, different test codes are required to be compiled each time to adapt to test items, test times, test time and test sequence. If the pressure test is performed on a plurality of test single boards at the same time, the code adaptation needs to be performed on each test single board in the control center, and then the test is performed on the plurality of test single boards in sequence. In the prior art, coding is complicated during pressure testing, when the test items, test time and test sequence of a plurality of test single boards are completely the same, coding adaptation on two sides is also required to be carried out in a control center, and particularly, repeated labor is more, manpower is wasted, and the flexibility is not achieved.
Disclosure of Invention
The invention aims to provide a method for testing the pressure of a testing machine, which can flexibly test the pressure of each testing single board through the unified configuration of a control center, reduce manual configuration and improve the overall efficiency.
In order to achieve the purpose, the invention adopts the following technical scheme: a method for carrying out pressure test in a tester, wherein the tester comprises M test single boards, comprises the following steps:
s01: respectively carrying out test configuration on N test single boards to be subjected to pressure test in a control center to form configuration data, wherein the configuration data comprises a distinguishing code corresponding to the test single boards, a test item, test time and a test sequence; m and N are positive integers greater than 0, and M is greater than or equal to N;
s02: the control center sends the configuration data of each test single board to the corresponding test single board;
s03: the test single board acquires and analyzes configuration data, and performs pressure test after matching the configuration data with a locally stored test flow;
s04: the test single board sends the test result to a control center;
s05: and the control center analyzes and displays the test result of each test single board.
Further, the test single board includes at least one chip, and the chips of the same kind correspond to one test item.
Further, the configuration data further includes a number of tests.
Further, the test time in the configuration data corresponds to the test items one to one, and the test board converts the test time corresponding to each test item into the test times of the test item.
Further, the step S03 specifically includes:
s031: the test single board obtains and analyzes configuration data, and determines a test sequence in the configuration data;
s032: according to the test sequence, matching the test flow of the first test item in the locally stored test flows, testing the first test item according to the flow, and executing the pressure test for corresponding times;
s033: and sequentially performing the pressure test of each test item according to the method in the step S032.
Further, the test time in the configuration data is the total test time of each test item; the test single board distributes the total test time to each test item according to the locally stored test flow; and the test single board converts the test time corresponding to each test item into the test times of the test item.
Further, the step S03 specifically includes:
s031: the test single board obtains and analyzes configuration data, and determines a test sequence in the configuration data; distributing the test time to each test item according to the locally stored test flow;
s032: matching the test flow of the first test item in the locally stored test flows, testing the first test item according to the flow, and executing the pressure test for corresponding times;
s033: and sequentially performing the pressure test of each test item according to the method in the step S032.
Further, the test items comprise one or more of CPLD test, EEPROM test, DDR test, CPU test and CPLD upgrade.
Further, when a new test board is added to the test machine, the control center performs test configuration on the test board to form corresponding configuration data.
The invention has the beneficial effects that: the configuration data of each test single board is uniformly configured in the control center, and the configuration data formats in each test single board are the same, so that only the corresponding difference codes, test items, test time and test sequence need to be changed for different test single boards; the pressure test of a plurality of test single boards can be completed through one-time configuration in the control center; meanwhile, if a new test single board is added, only new configuration data needs to be added in the control center, and the pressure test method can flexibly perform pressure test on each test single board, reduce manual configuration and improve the overall efficiency.
Drawings
FIG. 1 is a flow chart of a method for performing pressure testing in a testing machine according to the present invention;
FIG. 2 is a schematic diagram of the connection relationship of the testing machine of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention are described in detail below with reference to the accompanying drawings.
As shown in fig. 1 and 2, the present invention relates to a method for performing a pressure test in a testing machine, in which the pressure test is performed by simulating a software and hardware environment of an actual application and a system load during a user using process, and running test software for a long time or with an excessive load to test the performance, reliability, stability, etc. of a system to be tested. The testing machine comprises M testing single boards, and each testing single board is positioned in one of the slot positions of the testing machine. Each test single board comprises at least one chip, the chips of the same kind correspond to one test item, for example, if one chip is used for temperature measurement, the corresponding test item is temperature test; when one of the chips is used for current measurement, the corresponding test item is current test. The specific test items are related to the composition and performance of the chip. The test items in the invention include but are not limited to one or more of CPLD test, EEPROM test, DDR test, CPU test and CPLD upgrade. The invention specifically comprises the following steps:
s01: respectively carrying out test configuration on N test single boards to be subjected to pressure test in a control center to form configuration data, wherein the configuration data comprises a distinguishing code corresponding to the test single boards, a test item, test time and a test sequence; m and N are positive integers greater than 0, and M is greater than or equal to N.
The distinguishing code may be represented by a slot, an IP, or other marks capable of distinguishing the test boards, and only the test boards need to be distinguished. The test items are set according to the specific structure of the test single board, all chips in the test single board can be configured, or only the chips to be tested in the test single board can be configured, and the test sequence is the sequence of testing each test item in the test items.
The configuration data in the invention can also comprise the test times, namely the test times corresponding to each test item. The time for testing each test item once is fixed, and the time for each test is stored in the test flow stored locally in the test board. Therefore, the test time and the test times in the configuration can be converted, namely the test time in the configuration data can be converted into the test times, and in the test process, the pressure test of the corresponding test times is executed.
When a new test single board is added to the test machine, the test single board only needs to be tested and configured in the control center to form corresponding configuration data. The advantage of doing so is that can carry on the pressure test of the individual test project to the individual test veneer flexibly, can also carry on the pressure test of the identical disposition of the batch to all test veneers; the pressure test can be carried out according to the issued test times, and the pressure test can also be carried out according to the issued pressure test time.
S02: and the control center sends the configuration data of each test single board to the corresponding test single board. As shown in fig. 2, the control center assembles the configured configuration data into a data stream according to a transmission protocol and corresponding to each test board according to a difference code in the configuration data through SWITCH, thereby completing the issuing of the configuration data.
S03: and the test single board acquires and analyzes the configuration data, and performs pressure test after matching the configuration data with a locally stored test flow. The test single board analyzes and matches the received configuration data in sequence according to the transmission protocol, and the test single board analyzes the configuration data according to the transmission protocol to obtain the test items, the test time and the test sequence of the corresponding test single board in sequence.
The locally stored test flow represents a specific test method of each test chip in the test single board. Because the test items in each test board are different, when the instruction of the control center is sent to the test board, the test board needs to be combined with its own structure after acquiring and analyzing the configuration data. The testing methods and flows of different types of resource boards for the same test item may be inconsistent, which is determined by the testing flows locally stored by each testing board: for example, the resource single board a has 2 CPLDs, the CPLD1 supports 16-bit access, and the CPLD2 only supports 8-bit access; the resource veneer B is provided with 3 CPLDs, all support 16bit mode access, but only receive CPLD test instructions, all match with a local test flow to carry out pressure test on the CPLDs. The test flow locally stored in each test board may specifically include the following two parts: (1) the sequence corresponding to each test item in the test single board; (2) the specific test method for each test item. The specific test method of each test item is related to the structure and performance of the corresponding test chip, so that the specific test method can be stored in the test flow stored locally in the test single board without being configured in a control center.
With regard to test time in the configuration data, there are two cases:
first, the test time and the test items in the configuration data are in one-to-one correspondence, and the test single board converts the test time corresponding to each test item into the test times of the test item. The method specifically comprises the following steps:
s031: the test single board obtains and analyzes the configuration data, and determines the test sequence in the configuration data;
s032: according to the test sequence, matching the test flow of the first test item in the locally stored test flows, testing the first test item according to the flow, and executing the pressure test for corresponding times; if the test items can not be matched, returning by reporting an error;
s033: and sequentially performing the pressure test of each test item according to the method in the step S032.
Secondly, configuring the total test time of each test item in the data; the test single board distributes the total test time to each test item according to the locally stored test flow; the test single board converts the test time corresponding to each test item into the test times of the test item. Step S03 specifically includes:
s031: the test single board obtains and analyzes the configuration data, and determines the test sequence in the configuration data; distributing the test time to each test item according to the locally stored test flow;
s032: matching the test flow of the first test item in the locally stored test flows, testing the first test item according to the flow, and executing the pressure test for corresponding times; if the test items can not be matched, returning by reporting an error;
s033: and sequentially performing the pressure test of each test item according to the method in the step S032.
S04: and the test single board sends the test result to the control center. The specific control center is a user side, and the resource test single board returns the test result to the user side after each pressure test single item is finished.
S05: and the control center analyzes and displays the test result of each test single board. And after the analysis, the user side presents the corresponding test result and the test progress to the user, so that the user can know the pressure test progress in real time conveniently.
The configuration data of each test single board is uniformly configured in the control center, and the configuration data formats in each test single board are the same, so that only the corresponding difference codes, test items, test time and test sequence need to be changed for different test single boards; the pressure test of a plurality of test single boards can be completed through one-time configuration in the control center; meanwhile, if a new test single board is added, only new configuration data needs to be added in the control center, and the pressure test method can flexibly perform pressure test on each test single board, reduce manual configuration and improve the overall efficiency.
The above description is only a preferred embodiment of the present invention, and the embodiment is not intended to limit the scope of the present invention, so that all equivalent structural changes made by using the contents of the specification and the drawings of the present invention should be included in the scope of the appended claims.
Claims (9)
1. A method for carrying out pressure test in a tester, wherein the tester comprises M test single boards, is characterized by comprising the following steps:
s01: respectively carrying out test configuration on N test single boards to be subjected to pressure test in a control center to form configuration data, wherein the configuration data comprises a distinguishing code corresponding to the test single boards, a test item, test time and a test sequence; m and N are positive integers greater than 0, and M is greater than or equal to N;
s02: the control center sends the configuration data of each test single board to the corresponding test single board;
s03: the test single board acquires and analyzes configuration data, and performs pressure test after matching the configuration data with a locally stored test flow;
s04: the test single board sends the test result to a control center;
s05: and the control center analyzes and displays the test result of each test single board.
2. The method as claimed in claim 1, wherein the testing board includes at least one chip, and the chips of the same kind correspond to a testing item.
3. The method as claimed in claim 1, wherein the configuration data further includes a number of tests.
4. The method according to claim 1, wherein the test time in the configuration data corresponds to the test items one to one, and the test board converts the test time corresponding to each test item into the number of tests for the test item.
5. The method according to claim 4, wherein the step S03 specifically includes:
s031: the test single board obtains and analyzes configuration data, and determines a test sequence in the configuration data;
s032: according to the test sequence, matching the test flow of the first test item in the locally stored test flows, testing the first test item according to the flow, and executing the pressure test for corresponding times;
s033: and sequentially performing the pressure test of each test item according to the method in the step S032.
6. The method according to claim 1, wherein the testing time in the configuration data is a total testing time of each testing item; the test single board distributes the total test time to each test item according to the locally stored test flow; and the test single board converts the test time corresponding to each test item into the test times of the test item.
7. The method according to claim 6, wherein the step S03 specifically includes:
s031: the test single board obtains and analyzes configuration data, and determines a test sequence in the configuration data; distributing the test time to each test item according to the locally stored test flow;
s032: matching the test flow of the first test item in the locally stored test flows, testing the first test item according to the flow, and executing the pressure test for corresponding times;
s033: and sequentially performing the pressure test of each test item according to the method in the step S032.
8. The method of claim 1, wherein the test items include one or more of a CPLD test, an EEPROM test, a DDR test, a CPU test, and a CPLD upgrade.
9. The method as claimed in claim 1, wherein when a new testing board is added to the testing machine, the control center performs test configuration on the testing board to form corresponding configuration data.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN117724443A (en) * | 2023-12-13 | 2024-03-19 | 镁佳(北京)科技有限公司 | Cabin machine testing method and device, computer equipment and storage medium |
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