CN111129307B - 一类含有端基酯基有机功能材料的存储性能 - Google Patents

一类含有端基酯基有机功能材料的存储性能 Download PDF

Info

Publication number
CN111129307B
CN111129307B CN201911332471.1A CN201911332471A CN111129307B CN 111129307 B CN111129307 B CN 111129307B CN 201911332471 A CN201911332471 A CN 201911332471A CN 111129307 B CN111129307 B CN 111129307B
Authority
CN
China
Prior art keywords
sio
organic functional
terminal ester
functional material
charge storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201911332471.1A
Other languages
English (en)
Other versions
CN111129307A (zh
Inventor
不公告发明人
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing Hesong Material Technology Co., Ltd
Original Assignee
Nanjing Hesong Material Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing Hesong Material Technology Co Ltd filed Critical Nanjing Hesong Material Technology Co Ltd
Priority to CN201911332471.1A priority Critical patent/CN111129307B/zh
Publication of CN111129307A publication Critical patent/CN111129307A/zh
Application granted granted Critical
Publication of CN111129307B publication Critical patent/CN111129307B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic Table
    • C07F7/02Silicon compounds
    • C07F7/08Compounds having one or more C—Si linkages
    • C07F7/18Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
    • C07F7/1804Compounds having Si-O-C linkages
    • CCHEMISTRY; METALLURGY
    • C07ORGANIC CHEMISTRY
    • C07FACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
    • C07F7/00Compounds containing elements of Groups 4 or 14 of the Periodic Table
    • C07F7/02Silicon compounds
    • C07F7/08Compounds having one or more C—Si linkages
    • C07F7/18Compounds having one or more C—Si linkages as well as one or more C—O—Si linkages
    • C07F7/1804Compounds having Si-O-C linkages
    • C07F7/1872Preparation; Treatments not provided for in C07F7/20
    • C07F7/1876Preparation; Treatments not provided for in C07F7/20 by reactions involving the formation of Si-C linkages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • H10K10/474Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure
    • H10K10/476Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics the gate dielectric comprising a multilayered structure comprising at least one organic layer and at least one inorganic layer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Inorganic Chemistry (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)

Abstract

本专利主要是设计一类具有电荷存储性能的含有端基酯基的有机功能材料,该类材料的化学结构为
Figure DEST_PATH_IMAGE001
,其中n=3‑16,键合基团R=Si(OCH3)3,Si(OC2H5)3或者SiCl3。本发明提供该类材料形成电荷存储层的方法及该电荷存储层可应用在非易失性有机场效应晶体管存储器,展示出这类材料较好的存储性能。

Description

一类含有端基酯基有机功能材料的存储性能
技术领域
本发明涉及一类含有端基酯基有机功能材料的存储性能。
背景技术
有机存储器件是基于具有电荷束缚与释放功能的有机材料。相对于基于无机材料的存储器来说,有机存储器具有成本低、重量轻、可大面积制备等优点。
类似于有机场效应晶体管,有机场效应晶体管存储器具有三明治层状结构;不同之处在于,有机存储器中含有电荷存储层,是通过物理、化学方法在栅极介电层与有机半导体层之间引入。在栅电极施加正向或反向电压时,载流子被限制,施加一个反向电压,载流子被释放,从而实现存储性能。
存储窗口和开关比是场效应晶体管存储器的两个重要性能衡量参数。存储窗口是指不同存储状态下阈值电压的差值,开关比是用漏电流的比值来衡量不同的存储状态;两个性能参数值越大,存储性能越好。
自组装过程是修饰材料与衬底通过化学反应键合而形成修饰层。键合基团三甲氧基硅烷基与介电层SiO2表面上活化羟基进行化学反应,3-氨丙基三甲氧基硅烷可在SiO2/Si衬底形成自组装膜,其单分子层用于场效应晶体管存储器中,表现出微弱的存储性能(H.M. Lv, H. Q. Wu, C. Huang, Y. D. Wang and H. Qian, Appl. Phys. Express.,2014, 7, 045101.)。因此在本领域中需要开发具有高存储性能的有机材料及其在有机场效应晶体管存储器中的应用。
发明内容
1.本发明的特征是设计一类具有电荷存储能力的有机功能材料,化学结构包括三部分:具有电荷存储功能的端基酯基、键合基团及烷基链,化学结构通式为:
Figure 357625DEST_PATH_IMAGE001
,其中n = 3-16;键合基团R = Si(OCH3)3, Si(OC2H5)3或者SiCl3
2.上述的R为Si(OC2H5)3、n为8,材料为SiAAE,结构式为
Figure 611889DEST_PATH_IMAGE002
3. 本发明提供用于上述材料SiAAE的合成方法。
4. 本发明提供该类材料可在SiO2表面自组装形成电荷存储层的方法。
5. 本发明将该类电荷存储材料应用在非易失性有机场效应晶体管存储器。
附图说明
结合如下附图及详细描述将会更清楚地理解本发明的上述和其它特征及优点,其中:
图1有机场效应晶体管存储器结构示意图;沟道的长和宽分别为100μm与2000μm。
图2晶体管的源漏极电流随栅源极电压变化的转移特征曲线;由图可以观察到,当栅源极电压V GS 向负方向移动时,源漏极电流随着栅源极电压的增大而增大。与此相反,当栅源极电压V GS 向正方向移动时,源漏极电流会随着栅源极电压的增大而减小。
图3电压写入光照擦除模式下的存储转移曲线;电压写入光照擦除模式下,写入电压为栅源极电压-30 V时间1 s,转移曲线向负方向移动,表明空穴载流子在栅压电场作用下,从并五苯pentacene半导体层转移到SiAAE电荷存储层,这是存储器的“写”操作;将发光二极管LED光源对着存储器器件的正上方照射1s后,可以观察到转移曲线几乎回到初始位置,这是存储器的“擦”操作。
具体实施方式
下面对本发明的优选实施案例进行详细阐述,以使本发明的优点和特征能更易于被本领域技术人员理解。下面对电荷存储材料SiAAE化学合成作详细说明。
实施案例1:材料SiAAE的合成:
合成如下:
Figure 160682DEST_PATH_IMAGE003
反应瓶中加入十一碳烯酸甲酯与三乙氧基硅烷(摩尔比为1:3),滴入卡斯特催化剂;在氮气气氛、温度50℃条件下,反应持续48h,反应溶液变为深棕色。后处理,硅胶柱法分离纯化,溶剂为石油醚与乙酸乙酯的混合溶液。
实施案例2:电荷存储层的制备
(1)SiO2(300 nm厚)/Si(n型)衬底依次在丙酮、乙醇、去离子水超声,在烘箱里80-120 ℃干燥。用氧等离子体处理10-30 min;
(2)将处理好的SiO2/Si浸泡到SiAAE的无水甲苯溶液里,在80 ℃下自组装48 h到60 h。从溶液中取出,用甲苯充分冲洗,转移到烘箱里,在110℃维持10-40 min。
实施案例3:有机场效应晶体管存储器的制备
将带有电荷存储层的衬底放入真空蒸镀室,在真空度为3 x 10-4 Pa、蒸镀速率为0.1 Å S-1下依次蒸镀50 nm有机半导体材料并五苯pentance、源、漏电极各50 nm Au,晶体管沟道的长和宽分别为100 μm与2000 μm。器件结构为SiO2/Si/电荷存储层/pentacene(50nm)/Au (50 nm)。
实施案例4:器件性能测试
使用Keithley2400对器件进行性能测试。性能指标综合在下表。
非易失性有机场效应晶体管存储器性能参数
Device <i>μ</i><sub><i>FET</i></sub> (cm<sup>2</sup> V<sup>-1</sup> s<sup>-1</sup>) <i>V</i><sub>th</sub> (V) <i>I</i><sub>on</sub>/<i>I</i><sub>off</sub> Memory window (V)
SiAAE 0.033 2.64 2.78 × 10<sup>3</sup> 14

Claims (3)

1.一类具有存储性能的含有端基酯基的有机功能材料,其特征在于:材料的化学结构式为
Figure 671063DEST_PATH_IMAGE002
,其中n = 3-16;键合基团R = Si(OCH3)3, Si(OC2H5)3或者SiCl3
2.根据权利要求1所述含有端基酯基的有机功能材料在SiO2表面形成电荷存储层的方法,其特征在于:SiO2/Si衬底依次在丙酮、乙醇、去离子水中超声,在烘箱里80-120 ℃干燥;用氧等离子体处理10-30 min;将处理好的SiO2/Si浸泡到含有端基酯基的有机功能材料的无水甲苯溶液里,在60-100 ℃下自组装48-60 h;从溶液中取出,用甲苯充分冲洗,转移到烘箱里,在110℃维持10-40 min;所用衬底是n型Si上厚度为300 nm的SiO2
3.根据权利要求1所述含有端基酯基的有机功能材料在非易失性有机场效应晶体管存储器中的应用,其特征在于:将按照权利要求2描述方法制备的带有电荷存储层的衬底放入真空蒸镀室,在高真空下,依次蒸镀30-80 nm有机半导体材料并五苯pentance、源、漏Au电极各50 nm,晶体管沟道的长和宽分别为60-120 μm与1000-2000 μm,构建结构为SiO2/Si/电荷存储层/pentacene/Au的场效应晶体管存储器。
CN201911332471.1A 2019-12-22 2019-12-22 一类含有端基酯基有机功能材料的存储性能 Active CN111129307B (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201911332471.1A CN111129307B (zh) 2019-12-22 2019-12-22 一类含有端基酯基有机功能材料的存储性能

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201911332471.1A CN111129307B (zh) 2019-12-22 2019-12-22 一类含有端基酯基有机功能材料的存储性能

Publications (2)

Publication Number Publication Date
CN111129307A CN111129307A (zh) 2020-05-08
CN111129307B true CN111129307B (zh) 2021-03-30

Family

ID=70500885

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201911332471.1A Active CN111129307B (zh) 2019-12-22 2019-12-22 一类含有端基酯基有机功能材料的存储性能

Country Status (1)

Country Link
CN (1) CN111129307B (zh)

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008016029A1 (fr) * 2006-07-31 2008-02-07 Nippon Soda Co., Ltd. procédé de fabrication d'une couche mince organique par l'utilisation d'un procédé d'amélioration des propriétés physiques du film
CN101592626B (zh) * 2009-03-19 2013-03-06 中国科学院苏州纳米技术与纳米仿生研究所 准一维金属氧化物纳米材料生物传感器及其制作方法
CN108558933B (zh) * 2018-03-10 2019-06-18 苏州和颂生化科技有限公司 一类具有电荷存储能力的芳香胺材料的开发与应用

Also Published As

Publication number Publication date
CN111129307A (zh) 2020-05-08

Similar Documents

Publication Publication Date Title
US6433359B1 (en) Surface modifying layers for organic thin film transistors
US9401489B2 (en) Attachment of conducting graphene electrode layer to an organic polymer
US20140021465A1 (en) Coating Materials for Oxide Thin Film Transistors
KR20110056505A (ko) 상단 게이트 유기 박막 트랜지스터용 표면 처리된 기판
Ko et al. Electrically and thermally stable gate dielectrics from thiol–ene cross-linked systems for use in organic thin-film transistors
JP2007512680A (ja) 薄膜トランジスタの封止方法
Li et al. Nonvolatile photoelectric memory with CsPbBr3 quantum dots embedded in poly (methyl methacrylate) as charge trapping layer
CN112349593A (zh) 一种石墨烯为源漏电极的二维薄膜晶体管及制备方法
CN111129307B (zh) 一类含有端基酯基有机功能材料的存储性能
KR101649553B1 (ko) 유기 전계 효과 트랜지스터의 제조방법
Ko et al. Surface organic chemistry for application to organic electronics
CN110964052B (zh) 含有端基醛基的一类有机功能材料的存储性能
CN110690347A (zh) 一类卟啉材料在有机存储中的应用
Li et al. Battery Drivable Organic Single‐Crystalline Transistors Based on Surface Grafting Ultrathin Polymer Dielectric
Li et al. Facile method for enhancing conductivity of printed carbon nanotubes electrode via simple rinsing process
KR100873997B1 (ko) 수분 차단 특성이 개선된 유기보호막을 적용한 유기박막트랜지스터의 제조방법
CN108558933A (zh) 一类具有电荷存储能力的芳香胺材料的开发与应用
KR102283716B1 (ko) 불소 함유 양친매성 유무기하이브리드 복합체 및 이를 이용한 유기박막 트랜지스터
Tanida et al. Investigation of electron trapping behavior in n-channel organic thin-film transistors with ultrathin polymer passivation on SiO2 gate insulator
CN109301067B (zh) 一种六甲基二硅氮烷修饰有机薄膜晶体管及其制备方法
CN110028691B (zh) 制造表面改性的聚合物膜的方法以及制作包含该表面改性的聚合物膜的有机电子器件的方法
US20110281393A1 (en) Method of Making an Organic Semiconductor Device
JPWO2008090828A1 (ja) 有機薄膜トランジスタ、その製造方法及び有機半導体デバイス
JP4323851B2 (ja) 有機半導体素子
Kolliopoulou et al. Field effect devices with metal nanoparticles integrated by langmuir–blodgett technique for non-volatile memory applications

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right

Effective date of registration: 20201026

Address after: 211500 No. 606, ningliu Road, Changlu street, Jiangbei new district, Nanjing City, Jiangsu Province

Applicant after: Nanjing Hesong Material Technology Co., Ltd

Address before: 215200, Pang Yang Road 8, Wujiang economic and Technological Development Zone, Suzhou, Jiangsu

Applicant before: SUZHOU HESONG BIOCHEMISTRY TECHNOLOGY Co.,Ltd.

TA01 Transfer of patent application right
GR01 Patent grant
GR01 Patent grant