CN110441034A - Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer - Google Patents
Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer Download PDFInfo
- Publication number
- CN110441034A CN110441034A CN201910786204.5A CN201910786204A CN110441034A CN 110441034 A CN110441034 A CN 110441034A CN 201910786204 A CN201910786204 A CN 201910786204A CN 110441034 A CN110441034 A CN 110441034A
- Authority
- CN
- China
- Prior art keywords
- light
- light source
- optical device
- mach
- zehnder interferometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0207—Details of measuring devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0228—Testing optical properties by measuring refractive power
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer, device include first light source, 1/2 wave plate, Brewster window, beam splitter, reflecting mirror, detector, second light source, Glan prism and processing system;By being inserted into optical device to be tested on the one arm of Mach-Zehnder interferometer, the phase change of laser irradiation is measured, the refractive index of optical device is obtained;On optical device under test plus RGB laser is as test light, and the Output optical power of optical device under test is detected by detector, obtains the variation of optical device amplitude, changes available accurate attenuation characteristic using phase change and amplitude.
Description
Technical field
The invention belongs to optical material attenuation measurement fields, specifically, the present invention provides one kind to be based on Mach Zeng Degan
The optical device attenuation characteristic test device and method of interferometer.
Background technique
In laser display technology, optical device laser -induced damage problem is limit Laser energy transmission efficiency one big
Bottleneck, optical device by the irradiation of laser beam, cause optical device lattice structure that defect occurs, lead to optical device for a long time
The optical characteristics such as absorption coefficient, refractive index change, the laser delivery efficiency decline of optical device.Therefore, Study of Laser irradiates
The attenuation characteristic of lower optical device helps to improve optical device progress performance.
In the method for existing optical device attenuation characteristic measurement, has and device for non-linear optical is carried out using laser freuqency doubling
The patent of damage and damage detection has considerable restraint to the optical device that can be tested, and system constitutes complexity, tests environment
It is required that it is high, it is expensive;In addition there is the optical device damage check for LED light source, but what is predominantly detected is optical device
The defects of external microlesion.And it is more single currently for the test method of optical device laser -induced damage, it can only measure
Single optical parameter lacks the test method and device of optical device attenuation characteristic under complete evaluation laser irradiation comprehensively.
Summary of the invention
In view of the problems of the existing technology, the present invention provides a kind of optical devices based on Mach-Zehnder interferometer to decline
Subtract characteristic test device and method, by being inserted into optical device to be tested on the one arm of Mach-Zehnder interferometer, measures
The phase change of laser irradiation obtains the refractive index of optical device;On optical device under test plus RGB laser is as test
Light is detected the Output optical power of optical device under test by detector, obtains the variation of optical device amplitude, utilize phase change
Change available accurate attenuation characteristic with amplitude.
Optical device attenuation characteristic test device based on Mach-Zehnder interferometer, including first light source, 1/2 wave plate, cloth
Scholar this special window, beam splitter, reflecting mirror, detector, second light source, Glan prism and processing system;Wherein:
Mach-Zehnder interferometer part: first light source exit end sequence places 1/2 wave plate and Brewster window, after Brewster window
Place the first beam splitter, light beam is divided into two-way after the first beam splitter, curb original direction transmission, another way perpendicular to
Former direction;It constitutes Mach-Zehnder interferometer two-arm: the first reflecting mirror being added in all the way, makes beam propagation side at 45 degree of angles with light beam
Change to 90 degree of generation, which is reference arm;The second reflecting mirror is added in another way in the same way, the light beam after reflection according to
It is secondary to pass through the first Glan prism and the second Glan prism;The second combiner device is placed in two-way light intersection, the light quilt after closing beam
First detector receives, and enters processing system afterwards.
Optical system for testing part: second light source emergent light passes through third beam splitter, and the light along the transmission of former direction is visited by second
Device is surveyed to receive;Pass through above-mentioned first Glan prism respectively perpendicular to the light of former direction transmission, when then passing through the second Glan prism
90 degree of variations occur for beam Propagation direction, are received by third detector;Second, third detector accesses processing system.
The first light source, using narrow linewidth laser, for providing coherent light signal;
1/2 wave plate and Brewster window combination, for coherent light signal to be polarized, make its polarization state and second light source
It is vertical to be emitted polarization state;
Described first, the light that third beam splitter is used to for incident light being divided into two beam isocandelas is emitted, and the second combiner device is used for
Two beam incident lights are combined into light beam outgoing;
The reflecting mirror, for changing the transmission direction of light;
The detector, for received optical signal to be converted to electric signal;
The light source of any required test can be used in the second light source;
The Glan prism is emitted for incident light to be divided into two bundles orthogonal linearly polarized light;
The processing system handles acquisition signal, finally obtains amplitude and phase information.
Optical device attenuation characteristic test method based on Mach-Zehnder interferometer, this method the specific implementation process is as follows:
1, adjustment Mach-Zehnder interferometer makes it to generate clearly interference fringe;
2, system source, that is, first light source is opened, observes and records interference pattern at the first optical detector;
3, first light source is closed, testing light source, that is, second light source is opened, records second light source power with second and third detector;
4, second light source is closed, optical device under test is placed between two Glan prisms;
5, the first, second light source, the power that the second third detector of record receives are opened, while recording the first detector and receiving
The interference pattern arrived;
6, it is handled by computer, obtains the decaying of laser irradiation optical device generation.
One aspect of the present invention is another by the phase change using Mach-Zehnder interferometer measurement laser irradiation optical device
Aspect is changed by the amplitude of laser irradiation optical device, is calculated the complex refractivity index of laser irradiation optical device, is completely commented
Valence goes out optical device laser -induced damage.The system structure that the invention is related to is simple and stablizes, and multi-parameter is automatic, and error is smaller.
Detailed description of the invention
Fig. 1 is optical element attenuation characteristic optical system for testing schematic diagram.
Specific embodiment
In conjunction with Fig. 1, to based on Mach-Zehnder interferometer optical device attenuation characteristic test device and method carry out it is detailed
Description.
The test device includes Mach-Zehnder interferometer, optical device under test, Glan prism, beam splitter, test light
Source and corresponding detector.
The Mach-Zehnder interferometer scheme isometric using two-arm.
The Mach-Zehnder interferometer is using He-Ne laser as system source.
The combination of one of plus thirty wave plate and Brewster window after the light source, for by the polarization direction of He-Ne laser
It is adjusted to orthogonal with second light source polarization direction.
The beam splitter uses half-silvered mirror.
The second light source preferably uses redgreenblue laser.
The conjunction beam and beam splitting of test light and system light are all made of Glan devating prism, will be inclined using its polarization spectro principle
The orthogonal two-beam in direction that shakes closes beam and beam splitting.
The interference fringe detector of the Mach-Zehnder interferometer is ccd detector.
The testing light source selects redgreenblue laser respectively.It can according to need and carry out red green combination, red Lan Zuhe,
Bluish-green combination and redgreenblue combination, and when being tested using combined light source, attempt different color proportions.
First detector is ccd detector, for receiving interference pattern;
Second, third described detector is photodetector, is used for received optical power;
Based on optical device under test, refractive index in the case where laser irradiation can change and with declining to light this programme
Subtract, the variations in refractive index of optical device under test can be accurately acquired by the variation of the interference fringe of Mach-Zehnder interferometer,
And added test light is the refractive index of optical device and the function of decaying in the transmitance of optical device under test, is obtained using detector
To the input-output power of test light, and then can solve to obtain the attenuation characteristic of optical device under test.Its basic principle is as follows:
According to the absorption of light in wave optics, when laser irradiation is added on optical device, the part energy of light wave in communication process
Amount is absorbed and converted to the energy of other forms, causes the decaying of light.When considering the absorption loss of light, complex refractivity index is defined
N:
Real part n, commonly referred to as medium refraction index, and imaginary part K is known as extinction coefficient, indicates the loss of light.
When light wave normal incidence is to optical device, transmission coefficient at this time is
WhereinFor air refraction.So transmissivity is
And transmitance can be obtained by the detector in optical system for testing:
WhereinThe optical power received for input power known to optical system for testing, i.e. the second detector;For optical system for testing
The optical power that the Output optical power that middle detector detects, i.e. third detector receive.
The medium refraction index variation for measuring optical device under test is realized by the interference fringe in interferometer.It is being not added
When optical device under test, with the interference fringe of the first detector record at this time;Optical device under test is put into wherein, is added first
Light source, as test light, the mobile number of interference fringe at this time is recorded by the first detector as system light and second light source,
Assuming that mobile number is N, then at this time optical path difference relatively before knots modification beFor the wavelength interfered, then have
Wherein d is optical device under test along optical transport
The length in direction.Pass through the refractive index of the available optical device under test of (5) formula during laser irradiation
(6) formula is substituted into the available extinction coefficient K of (3) (4) formula
Finally byThe absorption coefficient of optical device is calculated, whereinFor the propagation constant in vacuum.
Steps are as follows for a kind of optical device attenuation characteristic test method based on Mach-Zehnder interferometer:
1, Mach-Zehnder interferometer is adjusted, two-arm equal length is kept, opens He-Ne laser, it is clear high right to be allowed to generate
Than the interference fringe of degree, record is received with detector D1, that is, ccd detector;
2, He-Ne laser is closed, the RGB laser light source of optical system for testing is opened, in power meter D2 and D3 record optical system for testing
Two Glan prism bring fixed loss;
3, optical device under test is put into signal arm, adjustment optical device under test position makes laser pass through its center;
4, He-Ne laser and RGB laser are opened, the mobile feelings of recording interference fringe are received with detector D1, that is, ccd detector
Condition;Light power meter D2 and D3 are opened simultaneously, incident light and the emergent light after optical device under test are received;
5, ccd detector pass through A/D converter, be linked into computer with light power meter D2 and D3, according to theoretical calculation go out to
Phase change and the amplitude variation that photometry device introduces, and then its variations in refractive index and attenuation coefficient are obtained, realize optics device
The measurement of part attenuation characteristic.
Note: since this technology is most commonly used in laser display, and the light source of laser display is red green blue tricolor laser, because
This when being tested using this device and method, testing light source select redgreenblue laser, while can according to need into
The red green combination of row, red Lan Zuhe, bluish-green combination and redgreenblue combination, and when being tested using combined light source, it attempts not
Same color proportion.
Claims (9)
1. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, it is characterised in that: including first light source, 1/
2 wave plates, Brewster window, beam splitter, reflecting mirror, detector, second light source, Glan prism and processing system;Wherein:
Mach-Zehnder interferometer part: first light source exit end sequence places 1/2 wave plate and Brewster window, after Brewster window
Place the first beam splitter, light beam is divided into two-way after the first beam splitter, curb original direction transmission, another way perpendicular to
Former direction;It constitutes Mach-Zehnder interferometer two-arm: the first reflecting mirror being added in all the way, makes beam propagation side at 45 degree of angles with light beam
Change to 90 degree of generation, which is reference arm;The second reflecting mirror is added in another way in the same way, the light beam after reflection according to
It is secondary to pass through the first Glan prism and the second Glan prism;The second combiner device is placed in two-way light intersection, the light quilt after closing beam
First detector receives, and enters processing system afterwards;
Optical system for testing part: second light source emergent light passes through third beam splitter, and the light along the transmission of former direction is by the second detector
It receives;Pass through above-mentioned first Glan prism, light beam when then passing through the second Glan prism respectively perpendicular to the light of former direction transmission
90 degree of variations occur for transmission direction, are received by third detector;Second, third detector accesses processing system.
2. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: the first light source, using narrow linewidth laser, for providing coherent light signal.
3. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: 1/2 wave plate and Brewster window combination for coherent light signal to be polarized, make its polarization state and second light source
It is vertical to be emitted polarization state.
4. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: first, second Glan prism, for incident light to be divided into two bundles to orthogonal linearly polarized light, it is therefore intended that the first light
Source is separated with second light source.
5. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: described first, the light that third beam splitter is used to for incident light being divided into two beam isocandelas is emitted, and the second combiner device is used for will
Two beam incident lights are combined into light beam outgoing.
6. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: the detector, for received optical signal to be converted to electric signal.
7. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: the second light source, using the light source of any need test.
8. the optical device attenuation characteristic test device based on Mach-Zehnder interferometer, feature exist according to claim 1
In: the processing system handles acquisition signal, finally obtains amplitude and phase information.
9. the optical device attenuation characteristic test method based on Mach-Zehnder interferometer, it is characterised in that: specific implementation process is such as
Under:
1, adjustment Mach-Zehnder interferometer makes it to generate clearly interference fringe;
2, system source, that is, first light source is opened, observes and records interference pattern at the first optical detector;
3, first light source is closed, testing light source, that is, second light source is opened, records second light source power with second and third detector;
4, second light source is closed, optical device under test is placed between two Glan prisms;
5, the first, second light source, the power that the second third detector of record receives are opened, while recording the first detector and receiving
The interference pattern arrived;
6, it is handled by computer, obtains the decaying of laser irradiation optical device generation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910786204.5A CN110441034A (en) | 2019-08-24 | 2019-08-24 | Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910786204.5A CN110441034A (en) | 2019-08-24 | 2019-08-24 | Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer |
Publications (1)
Publication Number | Publication Date |
---|---|
CN110441034A true CN110441034A (en) | 2019-11-12 |
Family
ID=68437424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910786204.5A Pending CN110441034A (en) | 2019-08-24 | 2019-08-24 | Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN110441034A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115266650A (en) * | 2022-09-30 | 2022-11-01 | 安徽创谱仪器科技有限公司 | Spectrophotometer system |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007086810A (en) * | 1997-01-10 | 2007-04-05 | Marconi Uk Intellectual Property Ltd | Operation method of optical modulator |
CN101567723A (en) * | 2009-06-04 | 2009-10-28 | 西南交通大学 | Microwave frequency measuring method based on optical power detection and device thereof |
CN101995211A (en) * | 2010-09-29 | 2011-03-30 | 哈尔滨工程大学 | On-line debugging device and method for single frequency laser polarization interferometer |
CN106292203A (en) * | 2015-05-24 | 2017-01-04 | 上海微电子装备有限公司 | A kind of automatic focusing to Barebone and alignment methods |
CN107064001A (en) * | 2017-02-28 | 2017-08-18 | 福建师范大学 | Monochromatic light spectrometer polarization domain optical coherence tomography system based on photoswitch |
CN107356409A (en) * | 2017-07-05 | 2017-11-17 | 中国工程物理研究院激光聚变研究中心 | A kind of measurement apparatus and measuring method of polarization extinction prism extinction ratio |
CN109343236A (en) * | 2018-11-28 | 2019-02-15 | 武汉光迅科技股份有限公司 | A kind of adjusting method of optical attenuator and optical attenuator |
CN109814204A (en) * | 2019-03-09 | 2019-05-28 | 北京爱杰光电科技有限公司 | A kind of on piece adjustable optical attenuator based on Mach-Zehnder interferometers |
-
2019
- 2019-08-24 CN CN201910786204.5A patent/CN110441034A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007086810A (en) * | 1997-01-10 | 2007-04-05 | Marconi Uk Intellectual Property Ltd | Operation method of optical modulator |
CN101567723A (en) * | 2009-06-04 | 2009-10-28 | 西南交通大学 | Microwave frequency measuring method based on optical power detection and device thereof |
CN101995211A (en) * | 2010-09-29 | 2011-03-30 | 哈尔滨工程大学 | On-line debugging device and method for single frequency laser polarization interferometer |
CN106292203A (en) * | 2015-05-24 | 2017-01-04 | 上海微电子装备有限公司 | A kind of automatic focusing to Barebone and alignment methods |
CN107064001A (en) * | 2017-02-28 | 2017-08-18 | 福建师范大学 | Monochromatic light spectrometer polarization domain optical coherence tomography system based on photoswitch |
CN107356409A (en) * | 2017-07-05 | 2017-11-17 | 中国工程物理研究院激光聚变研究中心 | A kind of measurement apparatus and measuring method of polarization extinction prism extinction ratio |
CN109343236A (en) * | 2018-11-28 | 2019-02-15 | 武汉光迅科技股份有限公司 | A kind of adjusting method of optical attenuator and optical attenuator |
CN109814204A (en) * | 2019-03-09 | 2019-05-28 | 北京爱杰光电科技有限公司 | A kind of on piece adjustable optical attenuator based on Mach-Zehnder interferometers |
Non-Patent Citations (1)
Title |
---|
刘铁根 等: "分立式与分布式光纤传感关键技术研究进展", 《物理学报》 * |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115266650A (en) * | 2022-09-30 | 2022-11-01 | 安徽创谱仪器科技有限公司 | Spectrophotometer system |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106404794B (en) | A kind of high-speed measuring device and method of the scattering of heavy caliber material surface | |
JP5540017B2 (en) | Optical imaging for optical device inspection | |
CN104730279B (en) | A kind of chirped pulse velocity interferometer | |
CN104677299A (en) | Film detection device and method | |
CN105387933B (en) | A kind of broadband Brewster window regulating device and method | |
CN109115690A (en) | Real-time polarization sensitive terahertz time-domain ellipsometer and optical constant measuring method | |
CN109253801B (en) | Near-infrared polarization spectrum testing device and method | |
CN105548722A (en) | Measuring system of ferromagnetic material terahertz dielectric constant | |
CN106019259B (en) | Laser frequency discrimination device and frequency discrimination method based on Mach-Zehnder interferometer | |
Ko et al. | Diagnostic development for current density profile control at KSTAR | |
CN105277136B (en) | Transmission-type microscopic imaging device and its method based on dual wavelength Digital Holography | |
CN106092905A (en) | A kind of Polarized infrared light spectrometer | |
CN110031093A (en) | A wide range of laser power transmits detection device | |
CN110441034A (en) | Optical device attenuation characteristic test device and method based on Mach-Zehnder interferometer | |
CN102252828A (en) | Method for monitoring real-time change of reflectivity of high-reflection optical element under laser irradiation | |
US20230035404A1 (en) | Combined ocd and photoreflectance method and system | |
CN219694503U (en) | Device for measuring radial misalignment distance of light beams in double-beam optical trap | |
CN204903381U (en) | Nonlinearity thin film materials's optical nonlinearity measuring device | |
CN106840008A (en) | A kind of optical fiber distance measurement system and measuring method | |
CN208888135U (en) | The system that ultrashort one pulse time differentiates pump probe is realized using ladder window | |
US20030075676A1 (en) | Apparatus for measuring state of polarization of a lightwave | |
US7046360B2 (en) | Image pickup device | |
Ning et al. | Efficient acquisition of Mueller matrix via spatially modulated polarimetry at low light field | |
CN211122503U (en) | Wide-range imaging type birefringence distribution measuring device | |
CN207937345U (en) | One kind is coaxially without angle pump probe instrument |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
WD01 | Invention patent application deemed withdrawn after publication | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20191112 |