CN106092905A - A kind of Polarized infrared light spectrometer - Google Patents
A kind of Polarized infrared light spectrometer Download PDFInfo
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- CN106092905A CN106092905A CN201610447666.0A CN201610447666A CN106092905A CN 106092905 A CN106092905 A CN 106092905A CN 201610447666 A CN201610447666 A CN 201610447666A CN 106092905 A CN106092905 A CN 106092905A
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- 238000001228 spectrum Methods 0.000 claims abstract description 41
- 230000010287 polarization Effects 0.000 claims abstract description 28
- 238000012360 testing method Methods 0.000 claims abstract description 23
- 238000000034 method Methods 0.000 claims abstract description 17
- 230000008569 process Effects 0.000 claims abstract description 13
- 230000009466 transformation Effects 0.000 claims abstract description 12
- 239000000203 mixture Substances 0.000 claims abstract description 8
- 230000005540 biological transmission Effects 0.000 claims description 31
- 238000005259 measurement Methods 0.000 claims description 9
- 238000005102 attenuated total reflection Methods 0.000 claims description 8
- 238000001514 detection method Methods 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims description 2
- 229920000642 polymer Polymers 0.000 description 9
- 238000011160 research Methods 0.000 description 5
- 238000002329 infrared spectrum Methods 0.000 description 4
- 230000000149 penetrating effect Effects 0.000 description 4
- 239000013078 crystal Substances 0.000 description 3
- 238000005033 Fourier transform infrared spectroscopy Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 238000011835 investigation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000012827 research and development Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000004611 spectroscopical analysis Methods 0.000 description 2
- 238000004566 IR spectroscopy Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 238000002197 infrared dichroism spectroscopy Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/19—Dichroism
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
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Abstract
The present invention proposes a kind of Polarized infrared light spectrometer, at least by 1 infrared light supply, 1 interferometer, 1 beam splitter, 1 test sample adnexa, 1 laser instrument, 1 laser detector, 2 polaroids, 2 infrared detectors, and the spectrum sample Circuits System composition mated with 2 detectors.It is in place of this spectrogrph feature to be divided into, through the light of test sample adnexa, the light that two bundles are impartial, after two-beam is the most respectively by the polaroid in respective light path, detected on detector in respective light path, obtaining interferogram, interferogram eventually passes parallel polarization spectrum and the perpendicular polarization spectrum simultaneously obtaining sample after Fourier transformation processes.
Description
Technical field
The invention belongs to spectrometric instrument technical field, relate to a kind of Polarized infrared light spectrometer.
Background technology
Infrared dichroism method is method based on polarized infrared light measuring samples infrared spectrum.Molecule infrared active depends on
Dipole moment is caused to change in vibration mode.Dipole moment changes the most greatly, and absorptance is the biggest.Infrared Absorption Coefficient also becomes with dipole moment
The direction (direction i.e. vibrated) changed is relevant.If the direction vector of vibrational transition square is equal with the electric vector direction of incident illumination
OK, it absorbs the strongest, referred to as parallel band A//；Whereas if both are perpendicular, absorption would not be produced, be referred to as vertical spectrum
Band A⊥As shown in Figure 1).The ratio of the two is referred to as dichroic ratio (R), R=A///A⊥.The orientation of polymer is generally with bands of a spectrum
Dichroism ratio or orientation function characterize.By measure different structure bands of a spectrum in polymer samples (as crystalline region and amorphous area,
Main chain and side base, hard section with soft section etc.) dichroism ratio and orientation function, study the different orientation feelings of these ad hoc structures
Condition, thus understand the overall picture of polymer Each part change, provide relevant for polymer orientation structure and to macro property
Necessary data.Generally, use Fourier transform infrared spectrometer, light path increase infrared polarization sheet and obtains polarized light, it is achieved
The Polarized infrared light spectrometry of sample.Changed the direction of polaroid by timesharing successively, measure parallel band A respectively//Vertically
Bands of a spectrum A⊥.But use conventional polarization infrared spectrometry method, it is impossible to obtain polymer in drawing process in real time and simultaneously
Parallel band A//With vertical bands of a spectrum A⊥Spectrum.Therefore, research real-time continuous obtains parallel band A simultaneously//With vertical bands of a spectrum A⊥
The method of polarized infrared spectrum become further investigation polymer orientation structure and the important topic with broad perspectives.Convenience goods Fu
In leaf transformation infrared spectrometer mainly by part groups such as optical table, light source, laser instrument, interferometer, detector, electrical systems
Become.But so far, the Fourier transform infrared spectrometer device only one of which detector of all producers research and development, it is impossible to enough moments are simultaneously
Gather parallel band A//With vertical bands of a spectrum A⊥Spectrum.Observe polymeric material drawing process Middle molecule chain segment orientation behavior, even
During continuous measurement sample infrared spectrum, need the test condition such as accurately control and record temperature, active force, draw speed, right
The design of still needing of different measurement adnexaes, the special accessoriess of a large amount of different research purposes is needed to open with thick sample research in ultra-thin sample
Send out.Therefore, research and development can simultaneously instantaneous measurement parallel band A in drawing process at polymeric material//With vertical bands of a spectrum A⊥Light
The scientific instrument device of spectrum and adnexa, provide the necessary technical instrument for Polymer Physics scientific research, has great science meaning
Justice.
Summary of the invention
The present invention is directed to the polymer research application demand to high-performance infrared spectrometer, propose based on the double light of single beam
Road, develops a kind of Polarized infrared light spectrometer.
A kind of Polarized infrared light spectrometer, it is characterised in that: at least by 1 infrared light supply, 2,1 interferometer of 1,1 laser instrument
4,2 reflecting mirrors of 3,1 laser detectors, 1 transmission adnexa, 8,2 polaroids of 7,1 beam splitter, 2 detector compositions；Dry
Place light source 1 and laser instrument 2 below interferometer 3, place laser detector 4 and the first reflecting mirror 5 in interferometer right, anti-first
Penetrate and below mirror 5, place the second reflecting mirror 6；It is transmission test sample adnexa 7, beam splitter 8 in the second reflecting mirror 6 front；Place in 8 fronts
First polaroid 9 and the first detector 11, places the second polaroid 10 and the second detector 12 below 8 respectively, the double light of composition
Road system；
The light that light source 1 and laser instrument 2 send enters interferometer 3, and laser instrument is visited by laser detector 4 through the light of interferometer
Survey；The infrared interference light produced through interferometer is reflected by two ir reflectors, enters transmission adnexa 7, and light transmission is contained in
After penetrating the sample on adnexa 7, through beam splitter 8；Light is divided into the light that 2 bundles are impartial after beam splitter 8, and light beam passes through first
After polaroid 9, being detected by the first detector 11, obtain interferogram, additionally light beam is after the second polaroid 10, by second
Detector 12 detects, obtains interferogram, eventually pass Fourier transformation process, obtain simultaneously sample parallel polarization spectrum and
Perpendicular polarization spectrum；
Another kind of scheme, transmission adnexa replaces with attenuated total reflectance ATR test sample adnexa；
A kind of Polarized infrared light spectrometer, it is characterised in that
At least by 2,1 interferometer of 1,1 laser instrument of 1 infrared light supply, 4,4 reflecting mirrors of 3,1 laser detector, 1
Transmission adnexa 13,2 chopping the light mirrors of 7,1 attenuated total reflectance ATR test sample adnexa, 8,2 polaroids of 1 beam splitter, 2 detectors
Composition；Place light source 1 and laser instrument 2 below interferometer 3, place laser detector 4 and the first reflecting mirror 5 in interferometer right,
The second reflecting mirror 6 is placed below the first reflecting mirror 5；It is the first chopping the light mirror 14, transmission test sample adnexa in the second reflecting mirror 6 front
7, the second chopping the light mirror 15, beam splitter 8；It it is attenuated total reflectance ATR test sample adnexa the 13, the 4th reflecting mirror in the 3rd reflecting mirror 16 front
17；
Place the first polaroid 9 and the first detector 11 in beam splitter 8 front, below 8, place the second polaroid respectively
10 and second detector 12, form double beam system；
The light that light source 1 and laser instrument 2 send enters interferometer 3, and laser instrument is visited by laser detector 4 through the light of interferometer
Survey；The infrared interference light produced through interferometer is reflected by a reflector,
If controlling light to pass through the first chopping the light mirror 14, then enter transmission measurement adnexa 7, control light and pass through the second chopping the light mirror 15,
It is divided into the light that 2 bundles are impartial after entering beam splitter 8, after light beam passes through the first polaroid 9, is detected by the first detector 11,
Obtaining interferogram, additionally light beam is after the second polaroid 10, is detected by the second detector 12, obtains interferogram, finally
Process through Fourier transformation, obtain parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously；
If controlling the first chopping the light mirror 14 to reflect light, the light after reflection enters decay after being reflected by the 3rd reflecting mirror 16 again and is all-trans
Penetrate ATR test sample attached 13, then reflected through the second chopping the light mirror 15 by the 4th reflecting mirror 17；Controlling the second chopping the light mirror 15 makes light by instead
Penetrating, be then divided into, by beam splitter 8, the light that 2 bundles are impartial, light beam is by, after the first polaroid 9, being examined by the first detector 11
Measuring, obtain interferogram, additionally light beam is after the second polaroid 10, is detected by the second detector 12, obtains interferogram,
Eventually pass Fourier transformation to process, obtain parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously.
Test sample adnexa of the present invention can be 1 transmission test sample adnexa, or 1 attenuated total reflectance ATR test sample adnexa, it is also possible to
1 transmission test sample adnexa and 1 ATR test sample adnexa are set simultaneously, make device can measure different-thickness sample parallel and
Vertical polarization infrared spectrum.
Advantages of the present invention:
1. the spectral instrument system proposed, uses single beam double light design, and the parallel polarization that can simultaneously record sample is red
External spectrum and vertical IR polarized spectrum, provide abundant spectroscopic data for further investigation polymer orientation structure and with broad perspectives；
2. the spectral instrument system structure proposed, can have transmission-type sample to measure adnexa and ATR test sample in the optical path simultaneously
Adnexa.The thickness of two kinds of adnexa measuring samples is different, makes instrument can measure the sample of different-thickness, is that IR polarized spectrum is surveyed
The breakthrough of amount technology.
Accompanying drawing explanation
Fig. 1 Polarized infrared light spectrometer structure chart comprises a transmission measurement adnexa
Fig. 2 Polarized infrared light spectrometer structure chart comprises an ATR and measures adnexa
Fig. 3 Polarized infrared light spectrometer structure chart comprises two and measures adnexa
Detailed description of the invention
Embodiment 1
As shown in Figure 1, a kind of Polarized infrared light spectrometer, it is characterised in that: at least by 1,1 laser of 1 infrared light supply
Device 2,1 interferometer, 4,2 reflecting mirrors of 3,1 laser detector, 1 transmission adnexa, 8,2 polaroids of 7,1 beam splitter, 2
Detector, composition；Place light source 1 and laser instrument 2 below interferometer 3, place laser detector 4 and first in interferometer right anti-
Penetrate mirror 5, below the first reflecting mirror 5, place the second reflecting mirror 6；It is transmission test sample adnexa 7, beam splitting in the second reflecting mirror 6 front
Device 8；Place the first polaroid 9 and the first detector 11 in 8 fronts, below 8, place the second polaroid 10 and the second inspection respectively
Survey device 12, form double beam system；
The light that light source 1 and laser instrument 2 send enters interferometer 3, and laser instrument is visited by laser detector 4 through the light of interferometer
Survey；The infrared interference light produced through interferometer is reflected by two ir reflectors, enters transmission adnexa 7, and light transmission is contained in
After penetrating the sample on adnexa 7, through beam splitter 8；Light is divided into the light that 2 bundles are impartial after beam splitter 8, and light beam is by polarization
After sheet 9, being detected by detector 11, obtain interferogram, additionally light beam is after polaroid 10, is detected by detector 12,
Obtain interferogram, eventually pass Fourier transformation and process, obtain parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously.
Embodiment 2
Embodiment 2 is with embodiment 1 difference, and transmission measurement adnexa 7 changes ATR into and measures adnexa 13, structure
Identical with Fig. 1.Spectrogrph is infrared instead by 1,1 laser instrument of 1 infrared light supply, 3,1 laser detector of 2,1 interferometer 4,2
Light microscopic, 7,1 beam splitter of 1 ATR adnexa, 9,10,2 infrared detectors 11,12 of 8,2 polaroids, and with two detectors
The spectrum sample Circuits System composition of coupling.Place light source 1 and laser instrument 2 below interferometer 3, place laser in interferometer right
Detector 4 and reflecting mirror 5, place 1 infrared reflecting mirror 6 below 5.It is ATR test sample adnexa 13, beam splitter 8 in 6 fronts.Should
Spectrogrph can obtain parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously.
The light that light source 1 and laser instrument 2 send enters interferometer 3, and laser instrument is visited by laser detector 4 through the light of interferometer
Survey；The infrared interference light produced through interferometer is reflected by a reflector, and enters ATR adnexa 13.Light is by the crystal in ATR adnexa
Project on the specimen surface being placed on crystal, be penetrated in specimen surface and again return to sample surfaces after certain depth, enter
Entering crystal, complete an attenuated total reflectance, after 1 time or MATR, light enters beam splitter 8.Light is through beam splitting
Being divided into the light that 2 bundles are impartial after device 8, light beam, by, after polaroid 9, being detected by detector 11, obtains interferogram, and other one
Shu Guang, after polaroid 10, is detected by detector 12, obtains interferogram, eventually passes Fourier transformation and processes, simultaneously
Parallel polarization spectrum and perpendicular polarization spectrum to sample.
Embodiment 3
Embodiment 3 is with the difference of embodiment 1 and 2, and this embodiment has transmission adnexa and ATR is attached
Part, structure is as shown in Figure 3.It is with Fig. 1 difference, below transmission adnexa 7, increases an ATR measure adnexa 13, thoroughly
Increase by 1 chopping the light mirror before and after penetrating adnexa respectively, before and after ATR adnexa, increase an ir reflector respectively.This spectrogrph is by 1
Infrared light supply 1,3,1 laser detector of 2,1 interferometer of 1 laser instrument, 8,2 polaroids of 4,1 beam splitter 9,10,2 are red
External detector 11,12,7,1 ATR adnexa of 1 transmission adnexa, 14,15,4 reflecting mirrors 5 of 13,2 chopping the light mirrors, 6,16,17, with
And the spectrum sample Circuits System composition mated with two detectors.
The light that light source 1 and laser instrument 2 send enters interferometer 3, and laser instrument is visited by laser detector 4 through the light of interferometer
Survey；The infrared interference light produced through interferometer is reflected by a reflector, through the first chopping the light mirror 14.During measurement, by controlling light
Reflect by chopping the light mirror or by chopping the light mirror, control light entry into the arbitrary light path in transmission adnexa and ATR adnexa, thus carry out
Penetrate mode or ATR mode is measured.
Transmission adnexa light path: if controlling light to pass through the first chopping the light mirror 14, then enter transmission measurement adnexa 7, control light and pass through
Second chopping the light mirror 15, is divided into the light that 2 bundles are impartial after entering beam splitter 8, light beam is by, after polaroid 9, being examined by detector 11
Measuring, obtain interferogram, additionally light beam is after polaroid 10, is detected by detector 12, obtains interferogram, eventually passes
Fourier transformation processes, and obtains parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously.
ATR adnexa light path: control the first chopping the light mirror 14 and reflect light, the light after reflection enters after being reflected by reflecting mirror 16 again
ATR adnexa 13, is then reflected through the second chopping the light mirror 15 by reflecting mirror 17.Controlling the second chopping the light mirror 15 makes light be reflected by 15, so
It is divided into the light that 2 bundles are impartial afterwards by beam splitter 8, after they pass through respective polaroid the most respectively, quilt on each self-detector
Detection, obtains interferogram, eventually passes Fourier transformation and processes parallel polarization spectrum and the orthogonal polarized light simultaneously obtaining sample
Spectrum.
Claims (3)
1. a Polarized infrared light spectrometer, it is characterised in that: at least by 1 infrared light supply (1), 1 laser instrument (2), 1 interference
Instrument (3), 1 laser detector (4), 2 reflecting mirrors, 1 transmission adnexa (7), 1 beam splitter (8), 2 polaroids, 2 inspections
Survey device forms；Light source (1) and laser instrument (2) is placed in interferometer (3) lower section, in interferometer right placement laser detector (4) and
First reflecting mirror (5), places the second reflecting mirror (6) in the first reflecting mirror (5) lower section；It is transmission in the second reflecting mirror (6) front
Test sample adnexa (7), beam splitter (8)；The first polaroid (9) and the first detector (11) is placed, in (8) lower section point in (8) front
Do not place the second polaroid (10) and the second detector (12), form double beam system；
Light that light source (1) and laser instrument (2) send enters interferometer (3), laser instrument through the light of interferometer by laser detector
(4) detection；The infrared interference light produced through interferometer is reflected by two ir reflectors (5), (6), enters transmission adnexa
(7), after light transmission is contained in the sample on transmission adnexa (7), through beam splitter (8)；Light is divided into 2 bundles after beam splitter (8)
Impartial light, light beam is by, after the first polaroid (9), being detected by the first detector (11), obtain interferogram, the most a branch of
Light, after the second polaroid (10), is detected by the second detector (12), obtains interferogram, eventually pass at Fourier transformation
Reason, obtains parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously.
A kind of Polarized infrared light spectrometer the most according to claim 1, it is characterised in that:
Transmission adnexa replaces with attenuated total reflectance ATR test sample adnexa.
A kind of Polarized infrared light spectrometer the most according to claim 1, it is characterised in that:
At least by 1 infrared light supply (1), 1 laser instrument (2), 1 interferometer (3), 1 laser detector (4), 4 reflections
Mirror, 1 transmission adnexa (7), 1 attenuated total reflectance ATR test sample adnexa (13), 2 chopping the light mirrors, 1 beam splitter (8), 2 polarizations
Sheet, 2 detector compositions；Light source (1) and laser instrument (2) are placed in interferometer (3) lower section, place laser acquisition in interferometer right
Device (4) and the first reflecting mirror (5), place the second reflecting mirror (6) in the first reflecting mirror (5) lower section；In the second reflecting mirror (6) front
It is the first chopping the light mirror (14), transmission test sample adnexa (7), the second chopping the light mirror (15), beam splitter (8)；Front at the 3rd reflecting mirror (16)
Side is attenuated total reflectance ATR test sample adnexa (13), the 4th reflecting mirror (17)；
Place the first polaroid (9) and the first detector (11) in beam splitter (8) front, place second respectively in (8) lower section inclined
Shake sheet (10) and the second detector (12), forms double beam system；
Light that light source (1) and laser instrument (2) send enters interferometer (3), laser instrument through the light of interferometer by laser detector
(4) detection；The infrared interference light produced through interferometer is reflected by a reflector,
If controlling light to pass through the first chopping the light mirror (14), then enter transmission measurement adnexa (7), control light and pass through chopping the light mirror (15), enter
Being divided into the light that 2 bundles are impartial after entering beam splitter (8), light beam, by after the first polaroid (9), is detected by the first detector (11)
Arriving, obtain interferogram, additionally light beam is after the second polaroid (10), is detected by the second detector (12), is interfered
Figure, eventually passes Fourier transformation and processes, obtain parallel polarization spectrum and the perpendicular polarization spectrum of sample simultaneously；
If controlling the first chopping the light mirror (14) reflection light, the light after reflection is entered decay after the 3rd reflecting mirror (16) reflection again and is all-trans
Penetrate ATR test sample adnexa (13), then reflected through the second chopping the light mirror (15) by the 4th reflecting mirror (17)；Control chopping the light mirror (15) to make
Light is reflected, and is then divided into, by beam splitter (8), the light that 2 bundles are impartial, and light beam is by after the first polaroid (9), by first
Detector (11) detects, obtains interferogram, and additionally light beam is after the second polaroid (10), is examined by the second detector (12)
Measure, obtain interferogram, eventually pass Fourier transformation and process, obtain parallel polarization spectrum and the orthogonal polarized light of sample simultaneously
Spectrum.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107589076A (en) * | 2017-10-30 | 2018-01-16 | 中国科学院合肥物质科学研究院 | Infrared polarization binary channels spectral measurement system |
| CN109115341A (en) * | 2018-07-12 | 2019-01-01 | 郑州轻工业学院 | A kind of Fourier spectrometer spectrum recovering device and restored method |
| CN112362592A (en) * | 2020-10-30 | 2021-02-12 | 华中科技大学 | Polarization reflection measurement system and detection method thereof |
| CN113804646A (en) * | 2020-06-12 | 2021-12-17 | 中国科学院微电子研究所 | Near-infrared Fourier transform polarization spectrometer |
| CN114018850A (en) * | 2021-10-11 | 2022-02-08 | 江苏科技大学 | Fourier infrared polarization spectrum measurement system and measurement method |
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| CN114018850A (en) * | 2021-10-11 | 2022-02-08 | 江苏科技大学 | Fourier infrared polarization spectrum measurement system and measurement method |
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