CN110391242A - Step-like word line structure of L shape and preparation method thereof and three-dimensional storage - Google Patents

Step-like word line structure of L shape and preparation method thereof and three-dimensional storage Download PDF

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Publication number
CN110391242A
CN110391242A CN201910705463.0A CN201910705463A CN110391242A CN 110391242 A CN110391242 A CN 110391242A CN 201910705463 A CN201910705463 A CN 201910705463A CN 110391242 A CN110391242 A CN 110391242A
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word line
metal layer
short side
shape
region
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CN110391242B (en
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张刚
霍宗亮
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Institute of Microelectronics of CAS
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Institute of Microelectronics of CAS
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B41/00Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/20Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels
    • H10B41/23Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
    • H10B41/27Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B41/00Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/40Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the peripheral circuit region
    • H10B41/41Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the peripheral circuit region of a memory region comprising a cell select transistor, e.g. NAND
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B43/00EEPROM devices comprising charge-trapping gate insulators
    • H10B43/20EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
    • H10B43/23EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
    • H10B43/27EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B43/00EEPROM devices comprising charge-trapping gate insulators
    • H10B43/40EEPROM devices comprising charge-trapping gate insulators characterised by the peripheral circuit region

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Abstract

A kind of step-like word line structure of L shape and preparation method thereof and three-dimensional storage, word line structure includes: multiple L shape word line cells, each L shape word line cell long side side extends along second direction and one grid line gap of neighbour, and short side side extends along a first direction and short side includes a wordline exit;Wherein, the wordline exit is formed in a step-like laminated construction, the laminated construction includes multiple laminations pair being formed by insulating materials, replacement metal area is used as close to the region in grid line gap by one of lamination in each lamination pair, the replacement metallic region includes the short side region surface metal layer and internally positioned short side region inner metal layer positioned at surface, in a first direction, the length of short side region surface metal layer is greater than the length of short side region inner metal layer, and the wordline exit corresponds to the short side region surface metal layer.Ensure in the case where etching selection ratio is not high enough, even if etching is excessively, also there is a phenomenon where wordline short circuits.

Description

Step-like word line structure of L shape and preparation method thereof and three-dimensional storage
Technical field
The disclosure belongs to semiconductor memory and integrated technology field, is related to a kind of step-like word line structure of L shape and its system Make method and three-dimensional storage.
Background technique
Three dimensional NAND memory technology is the technology that current country is giving priority to.
Three dimensional NAND memory faces the problem that the following integrated difficulty increases.128 layers and the above three dimensional NAND memory face Face wordline Joining Technology problem, as the three-dimensional storage number of plies increases, the etching of wordline connecting hole requires higher and higher selection Than otherwise connecting hole etching breakdown wordline exit/solder joint (pad) probability can be significantly greatly increased, to cause word short-circuit between conductors. The design difficulty of three-dimensional storage wordline exit (SS) also gradually increases simultaneously.
Summary of the invention
(1) technical problems to be solved
Present disclose provides a kind of step-like word line structure of L shape and preparation method thereof and three-dimensional storages, at least partly Solve technical problem set forth above.
(2) technical solution
According to one aspect of the disclosure, a kind of step-like word line structure of L shape is provided, comprising: multiple L shape wordline lists Member, each L shape word line cell long side side extends along second direction (direction y) and one grid line gap of neighbour, one lateral edge of short side First direction (direction x) extend and short side include a wordline exit;Wherein, it is step-like to be formed in one for the wordline exit Laminated construction, the laminated construction include multiple laminations pair being formed by insulating materials, by each lamination pair wherein One lamination includes the short side region positioned at surface as metal area, the replacement metallic region is replaced close to the region in grid line gap Surface metal-layer and internally positioned short side region inner metal layer, in a first direction, the length of short side region surface metal layer Degree is greater than the length of short side region inner metal layer, and the wordline exit corresponds to the short side region surface metal layer.
In some embodiments of the present disclosure, wordline exit is used to connect the connecting hole solder joint of logic control circuit, position Distance in short side region surface metal layer apart from grid line gap is the position greater than the short side region inner metal layer length It sets.
In some embodiments of the present disclosure, the replacement metallic region also includes the long side region surface gold positioned at surface Belong to layer and internally positioned long border region inner metal layer, in a second direction, the length and length of long side region surface metal layer The equal length of border region inner metal layer.
In some embodiments of the present disclosure, multiple L shape word line cells are sequentially connected along a first direction and in step-like Distribution.
In some embodiments of the present disclosure, multiple word line cells, which are laminated along third direction and along second direction, is in Step-like distribution.
In some embodiments of the present disclosure, the multiple L shape word line cell is at least a pair of L-shaped word line cell, in pairs Two L shape word line cells separated by grid line gap and be in dislocation mirror image distribution, dislocation difference one step height, it is described The height of one step is equal to the height of a lamination pair, and the direction of dislocation is along third direction (direction z), third direction and the One direction and second direction are vertical.
In some embodiments of the present disclosure, the step-like word line structure of L shape, further includes: protective layer is covered in multiple L shapes Between word line cell and its above each word line cell, protective layer upper surface is run through in grid line gap.
In some embodiments of the present disclosure, the L shape word line cell long side is for connecting the area core (core).
A kind of production method of the step-like word line structure of L shape another aspect of the present disclosure provides, comprising: system Make a step-like laminated construction, which includes multiple laminations pair being formed by insulating materials, and each lamination is to conduct One step;Multiple regions are divided into the laminated construction, the laminated construction in each region is used to form a L shape wordline list Member;The surface layer step end of the laminated construction in each region is handled, so that along a first direction, surface layer step end Etch rate is higher than the etch rate for the structure being disposed below;To treated, laminated construction is performed etching to form a grid line Gap, surface of the depth direction which extends and etch along second direction perpendicular to laminated construction;Based on described Grid line gap performs etching one of lamination of each lamination centering close to the region in grid line gap and empties, along first Direction, the corresponding size in region that one of lamination in the step of surface layer is etched away are greater than structure immediately below it and are etched away The corresponding size in region;In etched-off area deposited metal material, replacement metallic region is obtained, which includes position Short side region surface metal layer and internally positioned short side region inner metal layer in surface, in a first direction, short side area The length of field surface metal layer is greater than the length of short side region inner metal layer, and wordline exit corresponds to the short side region surface gold Belong to layer;To form multiple L shape word line cells, each L shape word line cell long side side extends along second direction and neighbour one Grid line gap, short side side extends along a first direction and short side includes the wordline exit.
In some embodiments of the present disclosure, when the lamination clock synchronization of lamination packs silicon oxide-containing and silicon nitride, to each The mode that the surface layer step end of the laminated construction in region is handled are as follows: improved by way of ion implanting or selection deposition Nitrogen concentration in the silicon nitride of surface layer step end.
In some embodiments of the present disclosure, to treated, laminated construction performed etching to form a grid line gap Before step, further includes: the step of forming protective layer.
In some embodiments of the present disclosure, after the step of obtaining replacement metallic region further include: formed for connecting The step of connecing the connecting hole of logic control circuit, the connecting hole run through protective layer and the connecting hole bond pad locations with wordline exit It corresponds to and connects, it is short greater than described which, which is located at the distance in short side region surface metal layer apart from grid line gap, The position of border region inner metal layer length.
In some embodiments of the present disclosure, the step-like laminated construction is along a first direction and/or second direction It protrudes outward.
In some embodiments of the present disclosure, the replacement metallic region also includes the long side region surface gold positioned at surface Belong to layer and internally positioned long border region inner metal layer, in a second direction, the length and length of long side region surface metal layer The equal length of border region inner metal layer.
According to the another aspect of the disclosure, a kind of three-dimensional storage is provided, any L shape referred to comprising the disclosure Step-like word line structure.
(3) beneficial effect
It can be seen from the above technical proposal that step-like word line structure of L shape that the disclosure provides and preparation method thereof and three Memory is tieed up, is had the advantages that
By the way that the replacement metallic region on L shape short side step end surface layer is arranged based on grid line gap than internal replacement metal The size in region (direction x) in a first direction is big, so as to the connecting hole based on the positioning of grid line gap perpendicular to plane (SSCT) position sets SSCT to be greater than the replacement metallic region ruler of L shape short side step terminus inner in a first direction Very little position, so that corresponding be lamination below when SSCT is connect with the replacement metallic region on L shape short side step end surface layer Multiple laminations pair in structure, for example, multiple silica/silicon nitride stacks pair, then realizing each connection (contact) All it is insulating layer below the metal layer of drop point, is ensured with this in the case where etching selection ratio is not high enough, even if etching is excessively, There is a phenomenon where wordline short circuits.
Detailed description of the invention
Fig. 1 is the top view of the step-like word line structure of L shape according to shown in one embodiment of the disclosure.
Fig. 2 is to iris out the structural representation that part A is splitted along A1-A1 line in the step-like word line structure of L shape as shown in Figure 1 Figure, the x sectional view of corresponding L shape short side.
Fig. 3 is to iris out the structural representation that part B is splitted along B1-B1 line in the step-like word line structure of L shape as shown in Figure 1 Figure, the y sectional view of corresponding L shape short side.
Fig. 4 is to iris out the structural representation that part A is splitted along A2-A2 line in the step-like word line structure of L shape as shown in Figure 1 Figure, the x sectional view of corresponding L shape long side.
Fig. 5 is to iris out the structural representation that part B is splitted along B2-B2 line in the step-like word line structure of L shape as shown in Figure 1 Figure, the y sectional view of corresponding L shape long side.
Fig. 6 is (a) that the step-like word line structure of L shape includes multiple word line cells of (direction z) stacking along a first direction Top view and the amplified schematic perspective view of (b) detail section.
Fig. 7 is short to be touched in the three-dimensional storage comprising the step-like word line structure of L shape as shown in Figure 1 by connecting hole Border region surface metal-layer realizes the structural schematic diagram that logic control circuit is connect with wordline.
Fig. 8 is the structural schematic diagram of structure as shown in Figure 7 irising out part A and splitting along A3-A3 line, and corresponding L shape is short The x sectional view on side.
Fig. 9 is the production method flow chart of the step-like word line structure of L shape according to shown in one embodiment of the disclosure.
[symbol description]
1- word line cell;
11 protective layers;12- laminated construction;
The first laminated material of 121-;The second laminated material of 122-;
22- replaces metallic region;
221- short side region surface metal layer;222- short side region inner metal layer;
223- long side region surface metal layer;224- long border region inner metal layer;
3- grid line gap (GSL, Gate Line Slit);4- connecting hole.
Specific embodiment
In the prior art, the control circuit Yu wordline (wordline or gateline) of three-dimensional storage by perpendicular to The connecting hole (SSCT) and step-like wordline exit (SS, Stair Step) of plane connect.With three-dimensional storage height It is continuously increased, SSCT breakdown SS is continuously increased so as to cause the probability of two or more pieces wordline short circuit.128 layers and 192 layers of three-dimensional The selection of memory requirement SSCT etching is compared higher than 400 and 600, and 192 layers or more of three-dimensional storage requires higher SSCT Etching selection ratio.However current lithographic technique is unable to satisfy the selection than requiring.
The disclosure proposes a kind of step-like word line structure of L shape and preparation method thereof and three-dimensional storage, by being based on grid line Replacement metallic region in a first direction (the x side of the replacement metallic region than inside on L shape short side step end surface layer is arranged in gap To) size it is big, so as to based on grid line gap positioning perpendicular to plane connecting hole (SSCT) position, SSCT is arranged For be greater than in a first direction L shape short side step terminus inner replacement metallic region size position, thus when SSCT and L shape When the replacement metallic region connection on short side step end surface layer, corresponding is below multiple laminations pair in laminated construction, such as For multiple silica/silicon nitride stacks pair, then realizing below the metal layer of each connection (contact) drop point is insulation Layer, is ensured with this in the case where etching selection ratio is not high enough, even if etching is excessively, also there is a phenomenon where wordline short circuits.
In the step-like word line structure of L shape of the disclosure, L shape is the shape that top view is presented, the step-like word line structure of L shape Contain at least two word line cell.In one embodiment, multiple (two or more numbers) word line cells can be along first party It is sequentially connected to (direction x) and is in step-like distribution, i.e., (direction x) includes multiple word line cells, multiple words along a first direction The wordline exit head end of the wordline exit end of previous word line cell and the latter word line cell is in step in line unit Shape distribution, four word line cells along x directional spreding as schematically shown in Figure 1, wherein the connection of two neighboring word line cell is closed System is as shown in Figure 2.In another embodiment, multiple word line cells can also be laminated along third direction (direction z) and be in step Shape distribution, that is, the multiple word line cells being laminated along second direction (direction y, (b) is illustrated to be negative direction of the y-axis in Fig. 6) according to It is secondary to protrude outward, the lamination of multiple word line cells of step-like distribution is formed, the difference in height h of step is the height of a lamination pair Degree, in Fig. 6 (a) illustrated along the word line cell of two, the direction z stacking and as what (b) illustrated in Fig. 6 is in step-like The form of distribution.
In embodiment of the disclosure, in the step-like word line structure of L shape, the production method for replacing metallic region is to pass through utilization Grid line gap etching is located at what then subregional second laminated material in grid line gap both ends obtained after metal is filled, Therefore in one embodiment, word line cell occurs in pairs, is illustrated (shows in Fig. 1 with pairs of L shape word line cell in full Anticipate two word line cells assumed a " convex " shape), two pairs of word line cells separate by grid line gap and be in that the mirror image that misplaces divides Cloth (height of one step of difference), as depicted in figs. 1 and 2.Other preparation methods can be individually in the side shape in grid line gap At L-shaped word line cell, therefore the number of word line cell can be multiple (being greater than 1), includes odd and even number, is not limited into Pair even number form.
In the step-like word line structure of L shape of the disclosure, L shape long side for connecting the area core (core), L shape short side be used as with Contact jaw/solder joint (pad) of control circuit connection.By to L shape short side step end surface region adjust ion concentration (or Using other control methods, any mode that can be realized etch rate differentiation), so that interior zone is compared in surface region Etch rate it is fast (wet etching or other etch tools), thus the etch rate difference based on surface layer and internal material, It is bigger than the size of short side region inner metal layer below that short side region surface metal layer is obtained on (direction x) in a first direction Structure, i.e., in a first direction, the length of short side region surface metal layer is greater than the length of short side region inner metal layer, In It is short side region inner metal layer by inner part below short side region surface metal layer, outer part is in laminated construction (reservation not being etched away) multiple laminations pair.In this way, just foring the corresponding bottom of L shape surface metal marginal position and being The structure of insulating layer, when being attached hole etching contact, it can be ensured that in the case where etching selection ratio is not high enough, even if carving Excessively, also there is a phenomenon where wordline short circuits for erosion.
For the purposes, technical schemes and advantages of the disclosure are more clearly understood, below in conjunction with specific embodiment, and reference The disclosure is further described in attached drawing.
First embodiment
In first exemplary embodiment of the disclosure, a kind of step-like word line structure of L shape is provided.
Fig. 1 is the top view of the step-like word line structure of L shape according to shown in one embodiment of the disclosure.Fig. 2 is as shown in Figure 1 The step-like word line structure of L shape in iris out the structural schematic diagram that part A is splitted along A1-A1 line, the direction x of corresponding L shape short side Cross-sectional view.Fig. 3 is to iris out the structural representation that part B is splitted along B1-B1 line in the step-like word line structure of L shape as shown in Figure 1 Figure, the y sectional view of corresponding L shape short side.Fig. 4 be the step-like word line structure of L shape as shown in Figure 1 in iris out part A along The structural schematic diagram that A2-A2 line is splitted, the x sectional view of corresponding L shape long side.Fig. 5 is the step-like word of L shape as shown in Figure 1 The structural schematic diagram that part B is splitted along B2-B2 line, the y sectional view of corresponding L shape long side are irised out in cable architecture.
It should be noted that illustrate a word line cell to the laminated construction of formation in the present embodiment with four laminations, Therefore the cross-sectional view of corresponding diagram 3 and the long side in Fig. 5, it is apparent that the short side region surface metal of corresponding wordline exit Layer 221 is located at the top layer of four laminations pair, corresponds to insulating layer below the wordline exit in order to illustrate two word line cells Lamination pair, therefore Fig. 3 and Fig. 5 illustrate 6 laminations pair;In Fig. 2 and Fig. 4, the two of (direction x) along a first direction are illustrated A L shape word line cell pair, the wordline exit end of the previous word line cell pair of two adjacent L shape word line cells pair with it is latter The wordline exit head end of a word line cell pair is in step-like distribution.In each L shape word line cell to inside, two pairs of words Line unit is separated by grid line gap and is in dislocation mirror image distribution, is misplaced and is differed the height of a step, clearly shows in figure Meaning along a first direction, is located at the length of the short side region surface metal layer 221 of surface layer (top layer) greater than (inside) below The length of short side region inner metal layer 222 illustrates 5 laminations pair.Those skilled in the art can illustrate according to above-mentioned Know multiple (being more than or equal to two) short sides of L shape word line cell pair and the schematic cross-sectional view of long side.
In conjunction with shown in Fig. 1-Fig. 5, the step-like word line structure of L shape of the disclosure, comprising: at least a pair of L-shaped word line cell, often To in L shape word line cell, each 1 long side side of L shape word line cell extends along second direction (direction y) and one grid line of neighbour stitches Gap 3, (direction x) extension and short side include a wordline exit along a first direction for short side side;Wherein, the wordline exit It is formed in a laminated construction 12, which includes multiple laminations pair being formed by insulating materials, by each lamination One of lamination (lamination that for example, the second laminated material 122 is formed) of centering is used as close to the region in grid line gap 3 to be replaced Metal area 22 is changed, which includes positioned at the short side region surface metal layer 221 on surface and internally positioned short Border region inner metal layer 222, in a first direction, the length of short side region surface metal layer 221 are greater than inside short side region The length of metal layer 222, the wordline exit correspond to the short side region surface metal layer 221.
In the present embodiment, L shape long side is connect for connecting the area core (core), L shape short side as what is connected to the control circuit Contravention/solder joint (pad).
In conjunction with shown in Fig. 1-Fig. 3, in L shape short side, which includes the short side region surface positioned at surface Metal layer 221 and internally positioned short side region inner metal layer 222, in a first direction, short side region surface metal layer 221 Length be greater than short side region inner metal layer 222 length.In conjunction with shown in Fig. 1, Fig. 4 and Fig. 5, in L shape long side, replacement gold Belonging to region 22 includes the long side region surface metal layer 223 and internally positioned long border region inner metal layer 224 positioned at surface, In a second direction (y-direction), the length of the length of long side region surface metal layer 223 and long border region inner metal layer 224 It is equal.
It should be noted that generally speaking, long side region surface metal layer 223 and short side region surface metal layer 221 are Same diffusion layer (the being surface diffusion layer) part that in two directions (first direction and second direction) diffuses out, point Not Wei Yu long side and short side described as different titles, two therefore in order to introduce differentiation that is convenient and carrying out long short side Person is substantially the both direction of the same L shape diffusion layer;Similarly, inside long border region inner metal layer 224 and short side region Metal layer 222 is also the part that the same diffusion layer (being internal diffusion layer) in two directions indicates.Correspondingly, L shape platform For L shape long side in stepped structure for connecting the area core (core), the length of the corresponding replacement metallic region of L shape long side is homogeneous It is used as contact jaw/the solder joint (pad) connected to the control circuit, table in the corresponding replacement metallic region of L shape short side Deng, L shape short side Layer is bigger compared to internal size, if surface layer and internal replacement metallic region are integrally compared, the replacement on surface layer Metallic region is that short side is longer " L shape ", and internal replacement metallic region is " I shape ", and the long side length of the two is quite (along y Direction is equal);Or in other embodiments, the replacement metallic region on surface layer is that short side is longer " L shape ", internal replacement gold Belonging to region is shorter " the L shape " of short side, and the long side length of the two is suitable.
In the present embodiment, as depicted in figs. 1 and 2, two pairs of word line cells 1 are separated by grid line gap 3 and in mistakes Position mirror image distribution, the height of dislocation one step of difference, the height of one step are equal to the height of a lamination pair, dislocation Direction along third direction (direction z), third direction and first direction and second direction are vertical.
In the present embodiment, lamination includes multiple laminations pair being formed by insulating materials to 12, and each lamination is to including first Laminated material 121 and the second laminated material 122, for example, the first laminated material 121 is silica, the second laminated material 122 is nitrogen SiClx.
The distribution form of multiple word line cells or multiple word line cells pair is introduced with reference to the accompanying drawing.Fig. 6 is L shape step Shape word line structure includes that (a) top view and (b) detail section of multiple word line cells of (direction z) stacking along a first direction are put Schematic perspective view after big.Fig. 7 is to pass through in the three-dimensional storage comprising the step-like word line structure of L shape as shown in Figure 1 Connecting hole touches short side region surface metal layer and realizes the structural schematic diagram that logic control circuit is connect with wordline.Fig. 8 is The structural schematic diagram of structure as shown in Figure 7 irising out part A and being splitted along A3-A3 line, the direction the x section view of corresponding L shape short side Figure.
In one embodiment, multiple (two or more numbers) word line cells can (direction x) successively along a first direction It connects and is in step-like distribution, i.e., (direction x) includes multiple word line cells along a first direction, previous in multiple word line cells The wordline exit end of word line cell and the wordline exit head end of the latter word line cell are in step-like distribution, such as Fig. 1 institute Four word line cells along x directional spreding of signal, wherein the connection relationship of two neighboring word line cell is as shown in Figure 2.
It in the present embodiment, is illustrated by taking word line cell pair as an example, as shown in Figure 1-Figure 3, along a first direction comprising extremely Few two pairs of word line cells, are irised out as shown in figure 1 shown in the A of region, the previous word line cell pair of two adjacent L shape word line cells pair The wordline exit head end of wordline exit end and the latter word line cell pair is in step-like distribution.In each L shape wordline list To inside, two pairs of word line cells are separated by grid line gap and are in dislocation mirror image distribution, dislocation one step of difference member Height.
In another embodiment, multiple word line cells can also be laminated and along second along third direction (direction z) Direction (direction y) is in step-like distribution, the word line cell and such as Fig. 6 along the stacking of two, the direction z that (a) is illustrated in Fig. 6 In (b) illustrated in the form of step-like distribution, i.e., along third direction stacking multiple word line cells along second direction (direction y) successively protrudes outward, and forms the lamination of multiple word line cells of step-like distribution, here outwardly projecting direction reference The negative direction of the y-axis that (b) is illustrated in Fig. 6, the difference in height h of step are the height of a lamination pair, in the present embodiment, a lamination Pair height be silica/silicon nitride stack pair height.Certainly, corresponding multiple word line cells pair, the z-axis lamination the case where with Two word line cell modes stacked on top of one another are similar, and which is not described herein again.The difference of word line cell pair is, in each wordline list It is necessary to have following layouts to inside for member: two pairs of word line cells are separated by grid line gap and are in dislocation mirror image distribution, The height of dislocation one step of difference.
Certainly, in other embodiments, it can also be the combination of above two distribution form, i.e., multiple word line cells can be with It is laminated along third direction, along multiple word line cells of third direction stacking along second direction (direction y) successively to evagination Out, and in a first direction multiple word line cells are sequentially connected and in step-like distribution.
Referring to shown in Fig. 7 and Fig. 8, in the present embodiment, the connecting hole 4 that wordline exit is used to connect logic control circuit is welded It is greater than short side region inner metal layer that point, which is located at the distance in short side region surface metal layer 221 apart from grid line gap 3, The position of 222 length.
In the present embodiment, referring to shown in Fig. 2-Fig. 5, the step-like word line structure of L shape further include: protective layer 11 is covered in Between multiple L shape word line cells 1 and its 1 top of each word line cell, 11 upper surface of protective layer is run through in grid line gap 3.
In conclusion passing through the replacement metal based on grid line gap setting L shape short side step end surface layer in the present embodiment The size in region (direction x) in a first direction than internal replacement metallic region is big, so as to be hung down based on the positioning of grid line gap Directly in the position of the connecting hole of plane (SSCT), set SSCT to be greater than L shape short side step terminus inner in a first direction Replacement metallic region size position, thus when SSCT is connect with the replacement metallic region on L shape short side step end surface layer, Corresponding is below multiple laminations pair in laminated construction, for example, multiple silica/silicon nitride stacks pair, then realizing every All it is insulating layer below the metal layer of a connection (contact) drop point, is ensured with this in the case where etching selection ratio is not high enough, Even if etching is excessively, also there is a phenomenon where wordline short circuits.
Second embodiment
In second exemplary embodiment of the disclosure, a kind of production method of step-like word line structure of L shape is provided. The present embodiment carries out example how to make the step-like word line structure of the L shape in one embodiment.
Fig. 9 is the production method flow chart of the step-like word line structure of L shape according to shown in one embodiment of the disclosure.
Referring to shown in Fig. 9, the production method of the step-like word line structure of L shape of the present embodiment, comprising:
Step S201: one step-like laminated construction of production, the laminated construction include it is multiple be formed by insulating materials it is folded Layer is right, and each lamination is to as a step;
In an embodiment of the disclosure, the step-like laminated construction 12 is along a first direction and/or second direction It protrudes outward.
The meaning of " A and/or B " is only comprising A or only comprising B or simultaneously comprising A and B.
In the present embodiment, lamination includes multiple laminations pair being formed by insulating materials to 12, and each lamination is to including first Laminated material 121 and the second laminated material 122, for example, the first laminated material 121 is silica, the second laminated material 122 is nitrogen SiClx.
Step S202: multiple regions are divided into the laminated construction, the laminated construction in each region is used to form a L Shape word line cell;
In the present embodiment, L shape long side is connect for connecting the area core (core), L shape short side as what is connected to the control circuit The design needs of contravention/solder joint (pad), the area core and the end SS (step-like wordline exit, corresponding short side) circuit pass through top The selection of selection grid (select gate) divides region (block).
Step S203: handling the surface layer step end of the laminated construction in each region, so that along a first direction, The etch rate of surface layer step end is higher than the etch rate for the structure being disposed below;
In some embodiments of the present disclosure, when the lamination clock synchronization of lamination packs silicon oxide-containing and silicon nitride, to each The mode that the surface layer step end of the laminated construction in region is handled are as follows: improved by way of ion implanting or selection deposition Nitrogen concentration in the silicon nitride of surface layer step end.
Certainly, formed different etching rate form there are many, in the present embodiment using wet etching by the way of simultaneously With the use of the form for changing ion concentration, in other embodiments, other control methods can also be used, it is any to can be realized The mode of etch rate differentiation is within the protection scope of the disclosure.
Step S204: to treated, laminated construction is performed etching to form a grid line gap, and the grid line gap is along Surface of the depth direction of the extension of two directions and etching perpendicular to laminated construction;
Grid line gap 3 is formed between adjacent subregion or on the middle line of the same subregion to form word line cell pair, Two pairs of word line cells 1 are separated by grid line gap 3 and in dislocation mirror image distributions.The side in grid line gap is (such as in Fig. 2 Left side) other step layers tangent with the surface layer step of one of laminated construction and that run through lower section, as depicted in figs. 1 and 2.
Step S205: based on the grid line gap for each lamination centering one of lamination close to grid line gap Region, which performs etching, to be emptied;
Along a first direction, since surface layer step end is by handling, the etch rate of surface layer step end is higher than The etch rate for the structure being disposed below, then based on grid line gap 3 to one of lamination of each lamination centering (such as For the lamination comprising the second laminated material 122) perform etching and empty after, one of lamination in the step of surface layer is etched away The corresponding size in region be greater than the corresponding size in region that is etched away of structure, that is, the L shape short side being subsequently formed immediately below it Corresponding situation;
Along second direction, the standby corresponding size in region etched away of one of lamination in the step of surface layer and its just The region that rectangular structure is etched away is corresponding equal sized, that is, is subsequently formed the corresponding situation of L shape long side.
Step S206: in etched-off area deposited metal material, replacement metallic region is obtained, wordline exit corresponds to short side area Field surface metal layer;To form multiple L shape word line cells, each L shape word line cell long side side extends along second direction And one grid line gap of neighbour, short side side extends along a first direction and short side includes the wordline exit;
In the present embodiment, as shown in Figures 2 and 3, which includes the short side region surface positioned at surface Metal layer 221 and internally positioned short side region inner metal layer 222, in a first direction, short side region surface metal layer 221 Length be greater than the length of short side region inner metal layer 222, wordline exit corresponds to the short side region surface metal layer 221;
As shown in Figure 4 and Figure 5, the replacement metallic region 11 is also comprising the long side region surface metal layer positioned at surface 223 and internally positioned long border region inner metal layer 224, in a second direction, the length of long side region surface metal layer 223 With the equal length of long border region inner metal layer 224.
In some embodiments of the present disclosure, the step of laminated construction after etching processing is to form a grid line gap Before S204, further includes: the step of forming protective layer;In the embodiment, step S203 is first carried out, to the lamination to each region After the surface layer step end of structure is handled, in order to during subsequent step S204 performs etching production grid line gap It forms exposure mask or plays the role of protecting surface, be initially formed protective layer 11, the technique for being then based on dry method or wet etching Grid line gap 3 is made in laminated construction 12.
In some embodiments of the present disclosure, after the step S206 for obtaining replacement metallic region further include: formed and used In the step of connecting connecting hole 4 of logic control circuit, as shown in Figure 7 and Figure 8, which runs through protective layer and and wordline The connecting hole bond pad locations of exit are corresponding and connect, which is located in short side region surface metal layer apart from grid line The distance in gap is the position greater than the short side region inner metal layer length.
The production method of the present embodiment further includes that other general procedures or execution sequence can be changed;Certainly, The production method of the step-like word line structure of L shape of the disclosure is not limited to shown in the present embodiment, any L for being capable of forming the disclosure The technique of each component part of the step-like word line structure of shape and corresponding positional relationship the protection scope of the disclosure it It is interior.
3rd embodiment
In the third exemplary embodiment of the disclosure, a kind of three-dimensional storage is provided, is referred to comprising the disclosure Any step-like word line structure of L shape.
In the present embodiment, which includes: the step-like word line structure of L shape and logic control circuit, the logic Control circuit passes through the connecting hole on the wordline exit in each word line cell 1 in connecting hole 4 and the step-like word line structure of L shape Bond pad locations are corresponding and connect, and the distance which is located in short side region surface metal layer apart from grid line gap is big In the position of the short side region inner metal layer length.Due to being insulating layer below connecting hole solder joint, it is being attached When the etching contact of hole, it can be ensured that in the case where etching selection ratio is not high enough, even if wordline short circuit excessively, does not occur yet for etching The phenomenon that.
In conclusion leading to present disclose provides a kind of step-like word line structure of L shape and preparation method thereof and three-dimensional storage The replacement metallic region based on grid line gap setting L shape short side step end surface layer is crossed than internal replacement metallic region first The size in direction (direction x) is big, will so as to the position based on the positioning of grid line gap perpendicular to the connecting hole (SSCT) of plane SSCT is set as in a first direction greater than the position of the replacement metallic region size of L shape short side step terminus inner, to work as When SSCT is connect with the replacement metallic region on L shape short side step end surface layer, corresponding be multiple folded in laminated construction below Right, for example, multiple silica/silicon nitride stacks pair of layer, then realizing under each metal layer for connecting (contact) drop point Side is all insulating layer, is ensured with this in the case where etching selection ratio is not high enough, even if wordline short circuit excessively, does not occur yet for etching The phenomenon that.
Through attached drawing, identical element is indicated by same or similar appended drawing reference.It may cause to the disclosure When understanding causes to obscure, conventional structure or construction will be omitted.And the shape and size of each component do not reflect actual size in figure And ratio, and only illustrate the content of the embodiment of the present disclosure.It, should not will be between parentheses any in addition, in the claims Reference symbol is configured to limitations on claims.
The word of ordinal number such as " first ", " second ", " third " etc. used in specification and claim, with modification Corresponding element, itself is not meant to that the element has any ordinal number, does not also represent the suitable of a certain element and another element Sequence in sequence or manufacturing method, the use of those ordinal numbers are only used to enable an element and another tool with certain name Clear differentiation can be made by having the element of identical name.
Furthermore word "comprising" or " comprising " do not exclude the presence of element or step not listed in the claims.Positioned at member Word "a" or "an" before part does not exclude the presence of multiple such elements.
Unless there are technology barrier or contradiction, each feature in above embodiment of the invention can be freely combined with Other embodiment is formed, these other embodiments are within the protection scope of the present invention.
Particular embodiments described above has carried out further in detail the purpose of the disclosure, technical scheme and beneficial effects Describe in detail it is bright, it is all it should be understood that be not limited to the disclosure the foregoing is merely the specific embodiment of the disclosure Within the spirit and principle of the disclosure, any modification, equivalent substitution, improvement and etc. done should be included in the guarantor of the disclosure Within the scope of shield.

Claims (10)

1. a kind of step-like word line structure of L shape characterized by comprising
Multiple L shape word line cells, each L shape word line cell long side side extends along second direction (direction y) and one grid of neighbour Linear slit gap, (direction x) extension and short side include a wordline exit along a first direction for short side side;
Wherein, the wordline exit is formed in a step-like laminated construction, which includes multiple by insulating materials The lamination pair of formation is used as replacement metal close to the region in grid line gap by one of lamination in each lamination pair Area, the replacement metallic region include the short side region surface metal layer and internally positioned short side region interior metal positioned at surface Layer, in a first direction, the length of short side region surface metal layer are greater than the length of short side region inner metal layer, the wordline Exit corresponds to the short side region surface metal layer.
2. the step-like word line structure of L shape according to claim 1, which is characterized in that wordline exit is for connecting logic The connecting hole solder joint of control circuit, the distance in short side region surface metal layer apart from grid line gap are greater than the short side The position of region inner metal layer length.
3. the step-like word line structure of L shape according to claim 1, which is characterized in that the replacement metallic region also includes Long side region surface metal layer and internally positioned long border region inner metal layer positioned at surface, in a second direction, long side The equal length of the length of region surface metal layer and long border region inner metal layer.
4. the step-like word line structure of L shape according to claim 1, which is characterized in that multiple L shape word line cells are along first Direction is sequentially connected and is in step-like distribution.
5. the step-like word line structure of L shape according to claim 1 or 4, which is characterized in that multiple word line cells are along third Direction is laminated and is in step-like distribution along second direction.
6. the step-like word line structure of L shape according to any one of claims 1-5, which is characterized in that the multiple L shape word Line unit is that at least a pair of L-shaped word line cell, two pairs of L shape word line cells are separated by grid line gap and are in dislocation mirror image Distribution, the height of dislocation one step of difference, the height of one step are equal to the height of a lamination pair, the direction of dislocation Along third direction (direction z), third direction and first direction and second direction are vertical.
7. the step-like word line structure of L shape according to claim 1, which is characterized in that further include: protective layer is covered in more Between a L shape word line cell and its above each word line cell, protective layer upper surface is run through in grid line gap.
8. the step-like word line structure of L shape described in any one of -7 according to claim 1, which is characterized in that the L shape wordline list First long side is for connecting the area core (core).
9. the production method of any step-like word line structure of L shape in a kind of such as claim 1-8 characterized by comprising
A step-like laminated construction is made, which includes multiple laminations pair being formed by insulating materials, each lamination To as a step;
Multiple regions are divided into the laminated construction, the laminated construction in each region is used to form a L shape word line cell;
The surface layer step end of the laminated construction in each region is handled, so that along a first direction, surface layer step end Etch rate be higher than the etch rate of structure being disposed below;
To treated, laminated construction is performed etching to form a grid line gap, which extends and carve along second direction Surface of the depth direction of erosion perpendicular to laminated construction;
It is performed etching based on one of lamination of the grid line gap for each lamination centering close to the region in grid line gap It empties, along a first direction, the corresponding size in region that one of lamination in the step of surface layer is etched away is being greater than it just The corresponding size in the region that rectangular structure is etched away;
In etched-off area deposited metal material, replacement metallic region is obtained, which includes the short side positioned at surface Region surface metal layer and internally positioned short side region inner metal layer, in a first direction, short side region surface metal layer Length be greater than the length of short side region inner metal layer, wordline exit corresponds to the short side region surface metal layer;
To form multiple L shape word line cells, each L shape word line cell long side side extends along second direction and one grid of neighbour Linear slit gap, short side side extends along a first direction and short side includes the wordline exit;
Optionally, when the lamination clock synchronization of lamination packs silicon oxide-containing and silicon nitride, to the surface layer of the laminated construction in each region The mode that step end is handled are as follows: the silicon nitride of surface layer step end is improved by way of ion implanting or selection deposition In nitrogen concentration;
Optionally, to treated laminated construction performs etching to form a grid line gap the step of before, further includes: formed The step of protective layer;
Optionally, after the step of obtaining replacement metallic region further include: form the connection for connecting logic control circuit The step of hole, the connecting hole is through protective layer and corresponding with the connecting hole bond pad locations of wordline exit and connect, the connecting hole It is long greater than short side region inner metal layer that solder joint, which is located at the distance in short side region surface metal layer apart from grid line gap, The position of degree;
Optionally, the step-like laminated construction is along a first direction and/or second direction protrudes outward;
Optionally, the replacement metallic region also includes long side region surface metal layer and the internally positioned long side positioned at surface Region inner metal layer, in a second direction, the length of the length of long side region surface metal layer and long border region inner metal layer It spends equal.
10. a kind of three-dimensional storage, which is characterized in that include the step-like wordline knot of L shape of any of claims 1-8 Structure.
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11233007B2 (en) 2020-06-05 2022-01-25 Yangtze Memory Technologies Co., Ltd. Staircase structure in three-dimensional memory device and method for forming the same
US11450604B2 (en) 2020-06-05 2022-09-20 Yangtze Memory Technologies Co., Ltd. Staircase structure in three-dimensional memory device and method for forming the same
US11985820B2 (en) 2020-10-15 2024-05-14 Samsung Electronics Co., Ltd. Semiconductor devices and data storage systems including the same

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101919046A (en) * 2007-12-31 2010-12-15 桑迪士克3D有限责任公司 Methods and apparatus for forming memory lines and vias in three dimensional memory arrays using dual damascene process and imprint lithography
CN103824859A (en) * 2012-11-16 2014-05-28 爱思开海力士有限公司 Semiconductor device and method of manufacturing the same
US20150069499A1 (en) * 2013-09-10 2015-03-12 Kabushiki Kaisha Toshiba Semiconductor memory device and method for manufacturing same
CN104733462A (en) * 2013-12-20 2015-06-24 爱思开海力士有限公司 Semiconductor device and method of manufacturing the same
CN105206610A (en) * 2014-06-10 2015-12-30 旺宏电子股份有限公司 Integrated circuit and operation method and manufacturing method thereof
CN105374795A (en) * 2014-08-28 2016-03-02 爱思开海力士有限公司 Semiconductor device having stable structure and method of manufacturing the same
CN106981494A (en) * 2016-01-15 2017-07-25 三星电子株式会社 Three-dimensional semiconductor devices
CN107924922A (en) * 2015-08-25 2018-04-17 英特尔公司 Etch stop is provided for the wordline in memory devices

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101919046A (en) * 2007-12-31 2010-12-15 桑迪士克3D有限责任公司 Methods and apparatus for forming memory lines and vias in three dimensional memory arrays using dual damascene process and imprint lithography
CN103824859A (en) * 2012-11-16 2014-05-28 爱思开海力士有限公司 Semiconductor device and method of manufacturing the same
US20150069499A1 (en) * 2013-09-10 2015-03-12 Kabushiki Kaisha Toshiba Semiconductor memory device and method for manufacturing same
CN104733462A (en) * 2013-12-20 2015-06-24 爱思开海力士有限公司 Semiconductor device and method of manufacturing the same
CN105206610A (en) * 2014-06-10 2015-12-30 旺宏电子股份有限公司 Integrated circuit and operation method and manufacturing method thereof
CN105374795A (en) * 2014-08-28 2016-03-02 爱思开海力士有限公司 Semiconductor device having stable structure and method of manufacturing the same
CN107924922A (en) * 2015-08-25 2018-04-17 英特尔公司 Etch stop is provided for the wordline in memory devices
CN106981494A (en) * 2016-01-15 2017-07-25 三星电子株式会社 Three-dimensional semiconductor devices

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11233007B2 (en) 2020-06-05 2022-01-25 Yangtze Memory Technologies Co., Ltd. Staircase structure in three-dimensional memory device and method for forming the same
US11450604B2 (en) 2020-06-05 2022-09-20 Yangtze Memory Technologies Co., Ltd. Staircase structure in three-dimensional memory device and method for forming the same
TWI793433B (en) * 2020-06-05 2023-02-21 大陸商長江存儲科技有限責任公司 Staircase structure in three-dimensional memory device and method for forming the same
US11699659B2 (en) 2020-06-05 2023-07-11 Yangtze Memory Technologies Co., Ltd. Staircase structure in three-dimensional memory device and method for forming the same
US12002757B2 (en) 2020-06-05 2024-06-04 Yangtze Memory Technologies Co., Ltd. Staircase structure in three-dimensional memory device and method for forming the same
US11985820B2 (en) 2020-10-15 2024-05-14 Samsung Electronics Co., Ltd. Semiconductor devices and data storage systems including the same

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