CN110186654B - Longitudinal resolution testing device - Google Patents
Longitudinal resolution testing device Download PDFInfo
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- CN110186654B CN110186654B CN201910459755.0A CN201910459755A CN110186654B CN 110186654 B CN110186654 B CN 110186654B CN 201910459755 A CN201910459755 A CN 201910459755A CN 110186654 B CN110186654 B CN 110186654B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
- G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/04—Optical benches therefor
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Abstract
The invention belongs to the optical technology, and particularly relates to a longitudinal resolution testing device. The device comprises: the device comprises a first light-transmitting plate and a second light-transmitting plate, wherein one end of the first light-transmitting plate and one end of the second light-transmitting plate are connected in a propping mode, and the other end of the first light-transmitting plate and the other end of the second light-transmitting plate are connected through a connecting structure, so that a wedge-shaped air gap with gradually changed thickness is formed between the first light-transmitting plate and the second light-transmitting plate. The longitudinal resolution testing device provided by the embodiment of the invention can simply, conveniently and objectively test the longitudinal resolution; and the measuring precision is high, the manufacture is convenient, the cost is low, and the realization is easy.
Description
Technical Field
The invention belongs to the optical technology, and particularly relates to a longitudinal resolution testing device.
Background
In the field of optical imaging, to illustrate the capabilities of an optical imaging system, the resolution of the optical imaging system is typically measured. The resolution of the optical imaging system includes a transverse resolution and a longitudinal resolution, and the transverse resolution can be directly measured through some test boards, for example, a standard resolution test board provided by Thorlab corporation, the test board is composed of transverse lines and vertical lines with various different linear degrees, and what dimension an optical imaging system can clearly image is shows how high the resolution of the optical imaging system is, so that the method is very convenient and practical.
The imaging system corresponding to the lateral resolution is mainly directed to the conventional optical systems, such as a microscope, a magnifying glass, and the like. Modern computed tomography can be used for tomography, that is, not only surface imaging but also depth-direction imaging, such as Optical Coherence Tomography (OCT). However, there is no standard vertical resolution test board for measuring the imaging resolution (i.e. vertical resolution) in the depth direction. In engineering practice, the above-described method of measuring the lateral resolution cannot be used to test the longitudinal resolution. In the optical calculation imaging technology, for the test of longitudinal resolution, only one reflector is used as an imaging surface, and the point spread function of the reflector is measured, so that the real longitudinal resolution of the optical imaging system is measured. However, the point spread function measurement needs to measure the imaging data of a group of reflectors under the best signal-to-noise ratio condition and the best system condition, then certain specific operation is carried out to obtain the imaging waveform of the reflectors, and the real longitudinal resolution is calculated by measuring the value of 3db intensity attenuation. Moreover, different computational imaging systems, such as laser scanning confocal imaging, photoacoustic imaging and other imaging modes, have different methods for measuring longitudinal resolution. Therefore, no standard longitudinal resolution test method exists at present.
Secondly, the accuracy of testing the longitudinal resolution using the point spread function is not high enough. The reason is that: the value used to calculate the 3dB length of the point spread function is the data collected by the data collection device, and the sampling rate and bandwidth of the data collection device cannot be infinitely high, so the data measured in this way is a discrete value, so there are no real data points at-3 dB, and the resolution can only be calculated by interpolation. Under the influence of noise, the method for measuring the longitudinal resolution has large errors, and the longitudinal resolution of a typical frequency-sweeping OCT system is about 2-3 μm of measurement error of 10-15 μm.
Therefore, the existing method for measuring the longitudinal resolution of the optical imaging system is complex, has low precision, and does not have the longitudinal resolution testing equipment and method which can be generally used for various depth imaging.
Disclosure of Invention
The embodiment of the invention aims to provide a longitudinal resolution testing device, and aims to solve the problems that the longitudinal resolution of an optical imaging system is complex and inaccurate in testing in the prior art.
The embodiment of the invention is realized in such a way that a longitudinal resolution testing device comprises:
the device comprises a first light-transmitting plate and a second light-transmitting plate, wherein one end of the first light-transmitting plate and one end of the second light-transmitting plate are connected in a propping mode, and the other end of the first light-transmitting plate and the other end of the second light-transmitting plate are connected through a connecting structure, so that a wedge-shaped air gap with gradually changed thickness is formed between the first light-transmitting plate and the second light-transmitting plate.
Furthermore, the abutting connection ends of the first light-transmitting plate and the second light-transmitting plate are fixedly connected or rotatably connected.
Further, the first and second light-transmitting plates may be integrally or separately manufactured.
Furthermore, the abutting connection end of the first light-transmitting plate and the second light-transmitting plate is fixedly connected, the connection structure is an optical fiber, and the optical fiber is clamped and fixed between the first light-transmitting plate and the second light-transmitting plate.
Furthermore, the abutting connection ends of the first light-transmitting plate and the second light-transmitting plate are rotatably connected, and the connection structure is a telescopic structure.
Further, the maximum gap between the first light-transmitting plate and the second light-transmitting plate is 20-120 micrometers.
Furthermore, the second light-transmitting plate is provided with scale marks, and the scale marks are used for marking the distance from the current position of the second light-transmitting plate to the position where the thickness of the wedge-shaped air gap is zero.
Furthermore, the second light-passing board is equipped with opaque scale plate on the one side of first light-passing board dorsad, it is equipped with the scale mark to correspond the scale on the scale plate, is used for supplying during the test of optical imaging system will the scale mark is regarded as the formation of image target is observed.
The longitudinal resolution testing device provided by the embodiment of the invention can simply, conveniently and objectively test the longitudinal resolution; and the measuring precision is high, the manufacture is convenient, the cost is low, and the realization is easy.
Drawings
Fig. 1 is a schematic structural diagram of a longitudinal resolution testing apparatus according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating a longitudinal resolution testing apparatus according to an embodiment of the present invention.
In the drawings: 1. a first light-transmitting panel; 2. a second light-transmitting panel; 3. a wedge-shaped air gap; 4. an optical fiber; 5. and (5) coordinate paper.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Specific implementations of the present invention are described in detail below with reference to specific embodiments.
As shown in fig. 1 to 2, a structure diagram and a schematic use diagram of a longitudinal resolution testing apparatus according to an embodiment of the present invention are provided, where the longitudinal resolution testing apparatus according to an embodiment of the present invention includes:
first light-passing board 1 and second light-passing board 2, first light-passing board 1 and 2 one end of second light-passing board lean on each other to be connected, and the other end is connected through connection structure to form the wedge air gap 3 of thickness size gradual change between messenger first light-passing board 1 and the second light-passing board 2.
In the embodiment of the present invention, the optical imaging system refers to an imaging system formed by combining a plurality of optical elements such as a lens, a mirror, a prism, and a diaphragm in a certain order. When the longitudinal resolution of the optical imaging system is tested, the longitudinal resolution testing device is arranged between the optical imaging system and an imaging target, the first light-transmitting plate 1 faces one side of the optical imaging system, and the plate surface of the second light-transmitting plate 2 is vertical to the observation direction of the optical imaging system; by moving the longitudinal resolution testing device, when a clear image of an imaging target can be observed through the optical imaging system, the corresponding wedge-shaped air gap thickness on the longitudinal resolution testing device is the resolution of the optical imaging system. The whole testing process is simple to operate, the testing is convenient, large data processing and analysis are not needed, and the testing operation efficiency of the longitudinal resolution is greatly improved.
In the embodiment of the invention, the image judgment of the imaging target which can be observed clearly through the optical imaging system can adopt the more traditional limit observation, for example, the imaging condition is observed in the process of moving the longitudinal resolution testing device, when the imaging is gradually blurred after being gradually cleared, the position with the best definition is repeatedly moved and searched, the position is positioned as the test point with the best resolution, and the longitudinal resolution of the optical imaging system can be obtained by measuring the thickness of the wedge-shaped air gap at the position.
In the embodiment of the invention, the abutting connection ends of the first light-transmitting plate 1 and the second light-transmitting plate 2 are fixedly connected or rotatably connected; meanwhile, the first transparent plate 1 and the second transparent plate 2 can be integrally manufactured or manufactured independently; in addition, the first light-transmitting plate and the second light-transmitting plate in the embodiment of the present invention are made of a transparent flat material, such as a glass material, and specifically, common components such as a glass cover glass can be selected according to the actual use.
Specifically, as shown in fig. 1, in the embodiment of the present invention, the abutting connection end of the first transparent plate 1 and the second transparent plate 2 is fixedly connected, the connection structure is an optical fiber 4, and the optical fiber is clamped and fixed between the first transparent plate 1 and the second transparent plate 2. Specifically, the optical fiber can be fixed between the first transparent plate 1 and the second transparent plate 2 by optical glue, and the optical fiber can be fixed by irradiating and curing with ultraviolet light, and other common optical fiber mounting and fixing methods are not further illustrated and described in the present invention.
In other embodiments of the present invention, the abutting connection ends of the first transparent plate 1 and the second transparent plate 2 are rotatably connected, and the connection structure is a retractable structure. Specifically, the telescopic structure may include a first connecting rod and a second connecting rod rotatably fixed to the first transparent plate and the second transparent plate, respectively, and an adjusting sleeve threadedly coupled to the first connecting rod and the second connecting rod. The distance between the first connecting rod and the second connecting rod is enlarged and reduced by rotating the adjusting sleeve, so that the maximum gap thickness value of the wedge-shaped air gap is adjusted, the longitudinal resolution of various optical imaging systems with different spans is better tested, and more requirements are met. In particular, simple adjustment structures the present invention is not further enumerated and illustrated, as can be appreciated and implemented by those skilled in the art in the foregoing description of the present invention.
In the embodiment of the invention, the maximum gap between the first transparent plate 1 and the second transparent plate 2 is 20-120 micrometers, and the slower the thickness change of the wedge-shaped air gap is, the higher the accuracy of the tested longitudinal resolution is.
In the embodiment of the invention, the second light-transmitting plate 2 is provided with a scale mark, and the scale mark is used for marking the distance from the current position of the second light-transmitting plate 2 to the position where the thickness of the wedge-shaped air gap 3 is zero. Specifically, the scale can be generated by directly engraving on the second transparent plate, or by means of external reference. For example, by pasting the coordinate paper 5 on the back of the second light-transmitting plate, when the imaging can be clearly resolved, the thickness of the corresponding wedge-shaped air gap is the longitudinal resolution of the system, and at the moment, the thickness of the wedge-shaped air gap at the position can be calculated by combining the included angle between the first light-transmitting plate and the second light-transmitting plate and the corresponding scale distance, namely the longitudinal resolution of the optical imaging system. Specifically, as shown in fig. 2, the thickness of the wedge-shaped air gap at the corresponding position can be obtained by a preset maximum value h of the air gap and a distance value L between the maximum value h of the gap and the zero gap and by a scale distance L recorded by the coordinate paper 5 by using a proportional relationship, and then the longitudinal resolution of the optical imaging system is obtained.
In addition, in other embodiments of the present invention, an opaque scale plate may be disposed on a side of the second transparent plate 2 opposite to the first transparent plate 1, and scale marks are disposed on the scale plate corresponding to the scale marks for observing the scale marks as an imaging target when the optical imaging system is tested.
In addition, in the embodiment of the invention, the testing device can be arranged on a precise moving platform, such as a micrometer driving platform, so as to ensure the precision of the testing device during moving and further ensure the precision of a testing result.
According to the longitudinal resolution testing device provided by the embodiment of the invention, the longitudinal resolution can be tested simply, conveniently and objectively by constructing the wedge-shaped air gap with the longitudinal size gradually increased from 0; and the measuring precision is high, the manufacture is convenient, the cost is low, and the realization is easy.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (6)
1. A longitudinal resolution testing apparatus, the apparatus comprising:
one ends of the first light-transmitting plate and the second light-transmitting plate are connected in an abutting mode, and the other ends of the first light-transmitting plate and the second light-transmitting plate are connected through a connecting structure, so that a wedge-shaped air gap with gradually changed thickness is formed between the first light-transmitting plate and the second light-transmitting plate;
the abutting connection end of the first light-transmitting plate and the second light-transmitting plate is fixedly connected, the connection structure is an optical fiber, and the optical fiber is clamped and fixed between the first light-transmitting plate and the second light-transmitting plate;
an opaque scale plate is arranged on one side, back to the first light-transmitting plate, of the second light-transmitting plate, scale lines are arranged on the scale plate corresponding to the scales and used for observing the scale lines as imaging targets when an optical imaging system tests;
when the optical imaging system can just clearly distinguish, the corresponding wedge-shaped air gap thickness is the longitudinal resolution of the optical imaging system.
2. The apparatus for testing longitudinal resolution according to claim 1, wherein the abutting connection ends of the first and second transparent plates are fixedly or rotatably connected.
3. The apparatus of claim 1, wherein the first transparent plate and the second transparent plate are integrally or separately fabricated.
4. The apparatus for testing longitudinal resolution according to claim 2, wherein the abutting connection ends of the first transparent plate and the second transparent plate are rotatably connected, and the connection structure is a retractable structure.
5. The apparatus for testing longitudinal resolution of claim 1 or 4, wherein a maximum gap between the first and second transparent plates is 20-120 μm.
6. The longitudinal resolution testing device of claim 1, wherein the second transparent plate is provided with a scale mark, and the scale mark is used for marking a distance from a current position of the second transparent plate to a position where the thickness of the wedge-shaped air gap is zero.
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| CN201910459755.0A CN110186654B (en) | 2019-05-29 | 2019-05-29 | Longitudinal resolution testing device |
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| CN201910459755.0A CN110186654B (en) | 2019-05-29 | 2019-05-29 | Longitudinal resolution testing device |
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| CN110186654B true CN110186654B (en) | 2021-04-06 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN112057050B (en) * | 2019-09-17 | 2022-07-12 | 苏州阿格斯医疗技术有限公司 | OCT system axial resolution measuring method |
| CN112957012B (en) * | 2021-02-01 | 2022-09-30 | 浙江省医疗器械检验研究院 | Axial resolution measuring device and method for optical interference tomography system |
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| JPS52110684A (en) * | 1976-03-15 | 1977-09-16 | Nippon Telegr & Teleph Corp <Ntt> | Measuring apparatus for refractive index distribution |
| GB2250884B (en) * | 1990-12-07 | 1995-05-10 | Philips Electronic Associated | Optical image sensing systems |
| JPH11248597A (en) * | 1998-03-06 | 1999-09-17 | Nikon Corp | Method for measuring laser durability |
| CN1184927C (en) * | 2002-06-14 | 2005-01-19 | 清华大学 | Method and system of raising longitudinal resolution of optical coherent chromatographic imaging |
| CN101055343A (en) * | 2006-04-12 | 2007-10-17 | 明基电通信息技术有限公司 | Resolution-adjustable imaging device |
| CN103822971B (en) * | 2014-03-06 | 2016-08-17 | 北京理工大学 | A kind of ultrasonic microscope resolution test and calibration steps |
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