CN110133462A - 基于空间电荷效应的复合绝缘子老化性能试验***及方法 - Google Patents
基于空间电荷效应的复合绝缘子老化性能试验***及方法 Download PDFInfo
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- CN110133462A CN110133462A CN201910419513.9A CN201910419513A CN110133462A CN 110133462 A CN110133462 A CN 110133462A CN 201910419513 A CN201910419513 A CN 201910419513A CN 110133462 A CN110133462 A CN 110133462A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/14—Circuits therefor, e.g. for generating test voltages, sensing circuits
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CN201910419513.9A CN110133462B (zh) | 2019-05-20 | 2019-05-20 | 基于空间电荷效应的复合绝缘子老化性能试验***及方法 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113984813A (zh) * | 2021-09-27 | 2022-01-28 | 上海大学 | 一种高通量薄膜晶体结构表征装置及方法 |
CN114047229A (zh) * | 2021-11-11 | 2022-02-15 | 全球能源互联网研究院有限公司 | 一种聚合物薄膜介质电荷输运微观参数提取装置及方法 |
Citations (8)
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CN203337576U (zh) * | 2013-07-23 | 2013-12-11 | 中国科学院金属研究所 | 一种多功能二次电子发射系数分析测试装置 |
CN103713001A (zh) * | 2013-12-03 | 2014-04-09 | 西安交通大学 | 介质薄膜的二次电子发射系数的测量***及其测量方法 |
CN103776858A (zh) * | 2014-01-17 | 2014-05-07 | 西安交通大学 | 一种测量二次电子发射系数的平板型收集装置及测量方法 |
CN103776857A (zh) * | 2014-01-17 | 2014-05-07 | 西安交通大学 | 用于二次电子发射系数测量的半球型电子收集装置及测量方法 |
CN105740582A (zh) * | 2016-03-16 | 2016-07-06 | 华北电力大学 | 一种复合绝缘子老化状态预测方法 |
CN106093094A (zh) * | 2016-07-19 | 2016-11-09 | 西安交通大学 | 一种介质材料的二次电子能谱测量装置及测量方法 |
CN106771685A (zh) * | 2017-03-07 | 2017-05-31 | 天津大学 | 一种gil环氧树脂表面电荷的测量装置及方法 |
CN109142409A (zh) * | 2018-10-15 | 2019-01-04 | 中国科学院高能物理研究所 | 高、低温环境中材料二次电子特性参数的测量装置和方法 |
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- 2019-05-20 CN CN201910419513.9A patent/CN110133462B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
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CN203337576U (zh) * | 2013-07-23 | 2013-12-11 | 中国科学院金属研究所 | 一种多功能二次电子发射系数分析测试装置 |
CN103713001A (zh) * | 2013-12-03 | 2014-04-09 | 西安交通大学 | 介质薄膜的二次电子发射系数的测量***及其测量方法 |
CN103776858A (zh) * | 2014-01-17 | 2014-05-07 | 西安交通大学 | 一种测量二次电子发射系数的平板型收集装置及测量方法 |
CN103776857A (zh) * | 2014-01-17 | 2014-05-07 | 西安交通大学 | 用于二次电子发射系数测量的半球型电子收集装置及测量方法 |
CN105740582A (zh) * | 2016-03-16 | 2016-07-06 | 华北电力大学 | 一种复合绝缘子老化状态预测方法 |
CN106093094A (zh) * | 2016-07-19 | 2016-11-09 | 西安交通大学 | 一种介质材料的二次电子能谱测量装置及测量方法 |
CN106771685A (zh) * | 2017-03-07 | 2017-05-31 | 天津大学 | 一种gil环氧树脂表面电荷的测量装置及方法 |
CN109142409A (zh) * | 2018-10-15 | 2019-01-04 | 中国科学院高能物理研究所 | 高、低温环境中材料二次电子特性参数的测量装置和方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113984813A (zh) * | 2021-09-27 | 2022-01-28 | 上海大学 | 一种高通量薄膜晶体结构表征装置及方法 |
CN114047229A (zh) * | 2021-11-11 | 2022-02-15 | 全球能源互联网研究院有限公司 | 一种聚合物薄膜介质电荷输运微观参数提取装置及方法 |
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