CN110109002A - Method, apparatus, system and the storage medium of testing capacitor screen control panel - Google Patents

Method, apparatus, system and the storage medium of testing capacitor screen control panel Download PDF

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Publication number
CN110109002A
CN110109002A CN201910390026.4A CN201910390026A CN110109002A CN 110109002 A CN110109002 A CN 110109002A CN 201910390026 A CN201910390026 A CN 201910390026A CN 110109002 A CN110109002 A CN 110109002A
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CN
China
Prior art keywords
test
control panel
capacitance plate
channel
plate control
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Pending
Application number
CN201910390026.4A
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Chinese (zh)
Inventor
黄俊辉
郝帅凯
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Guangzhou Shiyuan Electronics Thecnology Co Ltd
Guangzhou Shirui Electronics Co Ltd
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Guangzhou Shiyuan Electronics Thecnology Co Ltd
Guangzhou Shirui Electronics Co Ltd
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Application filed by Guangzhou Shiyuan Electronics Thecnology Co Ltd, Guangzhou Shirui Electronics Co Ltd filed Critical Guangzhou Shiyuan Electronics Thecnology Co Ltd
Priority to CN201910390026.4A priority Critical patent/CN110109002A/en
Publication of CN110109002A publication Critical patent/CN110109002A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281—Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812—Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The present invention relates to method, apparatus, system and the storage mediums of a kind of testing capacitor screen control panel, the method comprising the steps of: sending test instruction to capacitance plate control panel, so that the capacitance plate control panel is to multiple channel load test signals, and the external connection in each channel is pre-set according to test content, it may then pass through capacitance plate control panel and receive the test response fed back in the case where being loaded with above-mentioned test signal in each channel, the test result for obtaining the capacitance plate control panel is finally responded according to the test.The program directly can send test instruction to capacitance plate control panel, the test response fed back by each channel on the capacitance plate control panel is to judge the quality of the capacitance plate control panel performance, it is tested without external capacitor screen, test is more convenient easy, testing efficiency is higher, additionally it is possible to realize the open test and short-circuit test to capacitance plate control panel.

Description

Method, apparatus, system and the storage medium of testing capacitor screen control panel
Technical field
The present invention relates to equipment the field of test technology, method, test more particularly to a kind of testing capacitor screen control panel The system and computer readable storage medium of the device of capacitance plate control panel, testing capacitor screen control panel.
Background technique
Capacitance plate control panel is the circuit board for controlling capacitance plate, generally passes through FPC (Flexible Printed Circuit, flexible circuit board) or FFC (Flexible Flat Cable, flexible flat cable) be attached with capacitance plate , and capacitance plate control panel performance quality for the capacitance plate can normal use it is most important, such as when capacitance plate control May result in capacitance plate partial region when the inner passage generation short circuit of plate or open circuit can not show or can not receive user's Touch command seriously affects the normal use of capacitance plate.
In the conventional technology, testing capacitor screen control panel is usually that the capacitance plate control panel is directly connected corresponding capacitor Screen or corresponding sensor are tested, and the capacitance plate control panel is judged by the function of testing capacitor screen or sensor The quality of energy, however this test mode burden for needing external capacitor screen and test operation inconvenience.
Summary of the invention
Based on this, it is necessary to need external capacitor screen to cause to test capacitance plate control panel inconvenient skill for traditional technology Art problem provides a kind of method of testing capacitor screen control panel, the device of testing capacitor screen control panel, testing capacitor screen control panel System and computer readable storage medium.
A kind of method of testing capacitor screen control panel, comprising steps of
Test instruction is sent to capacitance plate control panel；Wherein, the test instruction is used to indicate the capacitance plate control panel To multiple channel load test signals；The external connection in the multiple channel is pre-set according to test content；
Obtain the test response that the multiple channel is fed back in the case where loading the test signal；The test response is to pass through What the capacitance plate control panel obtained；
The test result of the capacitance plate control panel is obtained according to the test response.
A kind of method of testing capacitor screen control panel is applied to capacitance plate control panel, comprising steps of
Receive the test instruction that test equipment is sent；
It is instructed according to the test to multiple channel load test signals；The external connection in the multiple channel is according to survey It is pre-set to try content；
Obtain the test response that the multiple channel is fed back in the case where loading the test signal；
Test response is sent to the test equipment, the test equipment is triggered according to the test and responds acquisition The test result of the capacitance plate control panel.
A kind of device of testing capacitor screen control panel, comprising:
Sending module, for sending test instruction to capacitance plate control panel；Wherein, the test instruction is used to indicate described Capacitance plate control panel is to multiple channel load test signals；The external connection in the multiple channel is set in advance according to test content It sets；
Receiving module, the test response fed back for obtaining the multiple channel in the case where loading the test signal；It is described Test response is obtained by the capacitance plate control panel；
Module is obtained, for obtaining the test result of the capacitance plate control panel according to the test response.
A kind of device of testing capacitor screen control panel is applied to capacitance plate control panel, comprising:
Command reception module, for receiving the test instruction of test equipment transmission；
Signal loading module, for being instructed according to the test to multiple channel load test signals；The multiple channel External connection be pre-set according to test content；
Response obtains module, the test response fed back for obtaining the multiple channel in the case where loading the test signal；
Sending module is responded, for test response to be sent to the test equipment, triggers the test equipment root The test result of the capacitance plate control panel is obtained according to the test response.
A kind of system of testing capacitor screen control panel, comprising: capacitance plate control panel and logical with the capacitance plate control panel Believe the computer equipment of connection；The capacitance plate control panel is equipped with multiple channels；The external connection in the multiple channel is root It is pre-set according to test content；Wherein,
The computer equipment, for the step of executing the method for above-mentioned testing capacitor screen control panel, to the capacitance plate Control panel is tested.
A kind of computer readable storage medium, is stored thereon with computer program, and the computer program is held by processor The step of method of above-mentioned testing capacitor screen control panel is realized when row.
Method, apparatus, system and the storage medium of above-mentioned testing capacitor screen control panel send to capacitance plate control panel and test Instruction, so that the capacitance plate control panel is to multiple channel load test signals, and the external connection in each channel is according to test What content was pre-set, then obtain what each channel was fed back in the case where being loaded with above-mentioned test signal by capacitance plate control panel Test response, finally responds the test result for obtaining the capacitance plate control panel according to the test, can directly control to capacitance plate Plate sends test instruction, and the test response fed back by each channel on the capacitance plate control panel is to judge the capacitance plate control The quality of making sheet performance is tested without external capacitor screen, and test is more convenient easy, and testing efficiency is higher, additionally it is possible to realize To the open test and short-circuit test of capacitance plate control panel.
Detailed description of the invention
Fig. 1 is the applied environment figure of the method for testing capacitor screen control panel in one embodiment；
Fig. 2 is the flow diagram of the method for testing capacitor screen control panel in one embodiment；
Fig. 3 is the connection relationship diagram of capacitance plate control panel and its test equipment in one embodiment；
Fig. 4 is the connection relationship diagram of capacitance plate control panel and its test equipment in another embodiment；
Fig. 5 is the flow diagram of the method for testing capacitor screen control panel in another embodiment；
Fig. 6 is the flow diagram of the method for testing capacitor screen control panel in another embodiment；
Fig. 7 is the structural block diagram of the device of testing capacitor screen control panel in one embodiment；
Fig. 8 is the structural block diagram of the device of testing capacitor screen control panel in another embodiment；
Fig. 9 is the internal structure chart of computer equipment in one embodiment.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to the accompanying drawings and embodiments, right The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the present invention, not For limiting the present invention.
It should be noted that it is to distinguish that such as " first second third " term involved in the embodiment of the present invention, which is only, Similar object does not represent the particular sorted for object, it is possible to understand that ground, " first second third " is in the case where permission Specific sequence or precedence can be interchanged.It should be understood that the object that " first second third " is distinguished in the appropriate case may be used To exchange, so that the embodiment of the present invention described herein can be with the sequence other than those of illustrating or describing herein Implement.
The method of testing capacitor screen control panel provided by the invention, can be applied in application environment as shown in Figure 1, figure 1 is the applied environment figure of the method for testing capacitor screen control panel in one embodiment, which includes computer equipment 100 With capacitance plate control panel 200.Wherein, which is equipped with communication port 210, which is used for the electricity Hold the screen computer equipments such as control panel and personal computer and laptop 100 to be communicatively coupled, which can be with Using USB or I2C interface；Capacitance plate control panel 200 is multiple on the capacitance plate control panel 200 for controlling capacitance plate Channel group, such as first passage group 310 and second channel group 320, each channel group may include multiple channels, such as first passage group 310 channel 311, second channel group channel 321, these channels be during capacitance plate control board work with capacitance plate phase Multiple channels on capacitance plate control panel can be attached by the channel of connection by FPC or FFC with capacitance plate, wherein Channel on capacitance plate control panel 200 may include the channel TX and the channel RX, and the channel TX refers to driving channel, and the channel RX refers to sense Channel is answered, the channel TX and the channel RX are all independent from each other channel, and the channel TX and the channel RX are capacitance plate control panel touch chips The most channel of occupancy cabling inside the channel being connected with capacitance plate and capacitance plate control panel.
It, can be first with data line 300 by computer equipment 100 and capacitor before testing capacitance plate control panel The communication port 210 for shielding control panel 200 connects, and allows users to realize by operation computer equipment 100 to capacitance plate control Making sheet 200 is tested.Specifically, user can be after determining the test content tested capacitance plate control panel, first root Multiple channels of capacitance plate control panel are subjected to corresponding external electrical connections according to specific test content, are then set by computer Standby 100 send test instruction to capacitance plate control panel, load so that capacitance plate control panel is instructed according to the test to multiple channels Corresponding test signal, multiple channels response of meeting feedback test, computer equipment 100 in the case where loading the test signal can pass through Capacitance plate control panel receives test response, and the test result for obtaining the capacitance plate control panel is responded according to test, such as should Situations such as capacitance plate control panel is with the presence or absence of poor short circuit or bad open circuit.
In one embodiment, a kind of method of testing capacitor screen control panel is provided, is an implementation with reference to Fig. 2, Fig. 2 The flow diagram of the method for testing capacitor screen control panel, this method can be applied to computer equipment as shown in Figure 1 in example In 100, the method for the testing capacitor screen control panel be may include steps of:
Step S101 sends test instruction to capacitance plate control panel.
In this step, before testing capacitance plate control panel, it can first determine and capacitance plate control panel is surveyed The test content of examination, in general, test content can be test the capacitance plate control panel inside whether formed short circuit and deposit In poor short circuit, the inside for being also possible to test the capacitance plate control panel whether occur to open a way and exist open a way it is bad etc..
After having determined to the test content of capacitance plate control panel, due to test content difference, need to capacitance plate control The corresponding external connection of carry out in multiple channels of making sheet, external connection here refer to the outside of capacitance plate control panel by this A little channels are electrically connected, such as the external connection in each channel are set as mutually being shorted, zero load etc., so specific outer Portion's type of attachment may include it is a variety of, need to be preset according to test content.It is surveyed to capacitance plate control panel 200 Before examination, computer equipment 100 can be connected at the communication port 210 of capacitance plate control panel 200 by data line, then User can view whether the computer equipment 100 builds with capacitance plate control panel by the content that computer equipment 100 is shown Connection has been stood, in the case where establishing connection, test can have been sent to capacitance plate control panel by computer equipment 100 and referred to It enabling, test instruction may include short-circuit test instruction and open test instruction etc., after test instruction issues, capacitance plate control Plate can receive test instruction, and test instruction is mainly used for indicating that the capacitance plate control panel is believed to multiple channel load tests Number, instruction refers to that capacitance plate control panel such as can send test signal operation to channel according to the test instruction execution, and counts The test instruction that calculation machine equipment 100 is sent to capacitance plate control panel 200 enables to capacitance plate control panel to instruct according to the test Corresponding test signal is loaded to multiple channels, which is usually voltage signal, and according to the difference of test content, it can To load the voltage signal of different amplitudes to different channels, such as high level and low level can be loaded to different channels, In Digital Logical Circuits, low level indicates 0, and high level indicates 1, and general provision low level is 0 to 0.25V, high level 3.5 To 5V.When needing to test some channel problem bad with the presence or absence of poor short circuit or open circuit, high electricity can be loaded to the channel It puts down and loads low level to rest channels；For another example need to test the problems such as each channel whether there is poor short circuit, open circuit is bad, it can Successively to load high level respectively to multiple channels, rest channels load low level to test each channel.
Step S102 obtains the test response fed back under load test signal in multiple channels；Wherein, test response can Being obtained by capacitance plate control panel.
Wherein, capacitance plate control panel is to after multiple channel load test signals, load of each channel in the test signal Lower meeting feedback test responds to capacitance plate control panel, loads the electric signals such as low and high level to multiple channels in capacitance plate control panel In the case of, test response can be the i.e. each channel of pressure drop generated between each channel and generate after load test signal respectively Voltage difference between channel, capacitance plate control panel can receive the test response of each channel feedback, and capacitance plate control panel can These test responses are sent to computer equipment 100, so that computer equipment 100 can be connect by the capacitance plate test board Receive the test response fed back in the case where being loaded with test signal in multiple channels.
Step S103 responds the test result for obtaining capacitance plate control panel according to test.
This step is mainly that the survey of the capacitance plate control panel is obtained according to the test response in each channel of capacitance plate control panel Test result, that is to say, that the problems such as capacitance plate control panel is bad with the presence or absence of performance is determined by the test response in channel, According to the test in response to determining that some channel has that the problem of poor short circuit or some channel are bad in the presence of opening a way, then may be used Test result to judge the capacitance plate control panel is bad as poor short circuit or open circuit.For example, the external connection in each channel is equal In the case where for zero load, if some channel load high level and rest channels load low level, and the channel is adjacent thereto To generate short-circuit numerical value higher in channel, then can determine that there is poor short circuit in corresponding channel, so as to judge the capacitance plate control Circuit is formd inside making sheet, test result is poor short circuit.
The method of above-mentioned testing capacitor screen control panel, after determining the test content tested capacitance plate control panel, Test instruction is sent to capacitance plate control panel, so that the capacitance plate control panel is to multiple channel load test signals, and each logical The external connection in road is pre-set according to test content, is then received each channel by capacitance plate control panel and is being loaded The test response fed back under above-mentioned test signal, finally responds the test knot for obtaining the capacitance plate control panel according to the test Fruit directly can send test instruction, the survey fed back by each channel on the capacitance plate control panel to capacitance plate control panel Examination response is tested to judge the quality of the capacitance plate control panel performance without external capacitor screen, test be more convenient it is easy, Testing efficiency is higher, additionally it is possible to realize the open test and short-circuit test to capacitance plate control panel.
In one embodiment, sending the step of test instructs to capacitance plate control panel may include:
Test instruction is sent by touch chip of the communication port of capacitance plate control panel on capacitance plate control panel.
Wherein, capacitance plate control panel 200 is equipped with touch chip, and multiple channels on capacitance plate control panel are the touch-control cores The channel of piece, the touch chip can be attached by multiple channel with capacitance plate, and multiple channel may include TX logical Road and the channel RX, the channel TX refer to that driving channel, the channel RX refer to induction channels, and the channel TX and the channel RX are all independent from each other Channel, the channel TX and the channel RX are the channel that capacitance plate control panel touch chip is connected with capacitance plate and capacitance plate control Intralamellar part occupies the most channel of cabling, so the present embodiment sends test instruction to touch chip, can test the touch-control core Multiple channels of piece, testing capacitor screen control panel inside occupy the most channel of cabling with the presence or absence of the problems such as opening short circuit.
Specifically, this implementation computer equipment 100 is by the communication port 210 of capacitance plate control panel 200 to capacitance plate control Touch chip in making sheet sends test instruction, and test instruction enables to the touch chip to be instructed according to the test to the touching Multiple channels such as channel RX and the corresponding test signal of the channel TX load for controlling chip, when needing to test whether some channel RX deposits In short circuit problem, the external connection in each channel RX and the channel TX is set as unloaded, it then can be with computer equipment to touch-control Chip sends test instruction, is instructed by the test so that the touch chip is to the channel RX load high level and simultaneously to other Channel loads low level, if to generate short-circuit numerical value higher in the channel RX channel adjacent thereto, can determine that corresponding RX is logical There is poor short circuit in road, and so as to judge to form circuit inside the capacitance plate control panel, test result is poor short circuit.
The present embodiment can be realized the packet to the touch chip by sending test instruction to multiple channels of touch chip It includes the channel RX and the channel TX to be tested with the presence or absence of performance issues such as open circuit or short circuits, since the channel RX and the channel TX are to occupy The most channel of the cabling of capacitance plate control panel carries out test to these channels and is conducive to find whether the touch chip deposits in time Opening the performance issues such as short circuit.
In one embodiment, test instruction is used to indicate the touch chip on capacitance plate control panel into multiple channels One channel loads high level, and loads low level to rest channels.
The present embodiment mainly during testing capacitance plate control panel, send out to capacitance plate control panel by computer equipment The test instruction sent can serve to indicate that the one high electricity of channel load into multiple channels of the touch chip on capacitance plate control panel Level electrical signal simultaneously loads low level electric signal to rest channels, which refers to the channel of the touch chip, and the channel is for electricity The touch chip for holding screen control panel is attached with capacitance plate, in this way, test instruction can be applied to test touch-control Each channel of chip, since the quantity in channel is usually multiple, in test, test instruction can be according to actual test need It triggers the touch chip and loads low level to some channel load high level and simultaneously to rest channels, each channel is in height electricity Corresponding test is fed back under the load of ordinary mail number and responds to touch chip, then test response is sent to calculating by touch chip Machine equipment is to obtain test result.
Specifically, Fig. 3 is that the connection relationship of capacitance plate control panel and its test equipment is shown in one embodiment with reference to Fig. 3 It is intended to, the multiple channel TX channels Zu HeRX group can be equipped on capacitance plate control panel 200, the channel TX group may include the first TX logical Road group 310, the 2nd channel TX group 320, the 3rd channel TX group 330 and the 4th channel TX group 340, the channel RX group may include first The channel RX group 410, the 2nd channel RX group 420 and the 3rd channel RX group 430, wherein each channel group is designed with multiple corresponding Channel, such as the first channel TX group 310 are equipped with the first channel TX 311, the 2nd channel TX 312, and the 2nd channel TX group 320 is equipped with the Three channels TX 321, the first channel RX group 410 are equipped with the first channel RX 411 and the 2nd channel RX 412, these channels are capacitance plates The channel of touch chip on control panel, the touch chip are not shown in Fig. 3.In the process tested capacitance plate control panel In, computer equipment 100 can to the touch chip of capacitance plate control panel 200 send test instruction so that the touch chip to A channel in multiple channels loads high level electric signal, and rest channels load low level signal, are to test respective channel Short circuit problem is opened in no presence.Touch chip can be triggered and load high level to the first channel TX 311, include second to rest channels The channel TX 312, the 3rd channel TX 321, the first channel RX 411 and the 2nd channel RX 412 load low level, and each channel is in height Corresponding test is fed back under the load of low level signal and responds to touch chip, then touch chip is sent to test response Computer equipment 100 is to obtain test result, the test for the problems such as can carrying out open short circuit for some channel in this way, can be with After testing the first channel TX 311, low level is loaded to rest channels simultaneously to the 2nd channel TX 312, in a similar way The short circuit problem of opening in each channel is tested in completion, can pointedly be tested some channel, can also be successively Test to each channel is completed, so that test mode is more flexible and more comprehensively, is also beneficial to find capacitance plate control panel in time There are performance issues in which channel.
In one embodiment, test content may include short-circuit test；The external connection in multiple channels is set as unloaded；
May include: according to the step of test result of test response acquisition capacitance plate control panel
The first short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value of the first of at least one channel is big In the threshold value of setting, then judge the test result of capacitance plate control panel for poor short circuit.
The present embodiment mainly carries out short-circuit test to capacitance plate control panel can be first by capacitor before short-circuit test The external connection for shielding each channel of control panel is set as unloaded, i.e., not external any part is used for testing capacitor screen control panel Inner passage whether there is short circuit problem.In short-circuit test, computer equipment 100 is by sending short circuit to capacitance plate control panel The test of test instructs, so that the capacitance plate control panel loads corresponding test signal to each channel, each channel is in the survey Corresponding test response can be fed back under trial signal, then computer equipment can receive the test by capacitance plate control panel and ring It answers, and accordingly obtains the short-circuit numerical value in each channel according to the test, which refers to for whether judging respective channel The data of short circuit occur.
Specifically, each channel test response can be each channel under the load of low and high level signal with rest channels Pressure drop if there is no short circuits between channel two-by-two, add and in the case where the external connection in each channel is zero load Pressure drop would not be generated when carrying voltage tester, so circuit would not be generated inside capacitance plate control panel, the short-circuit number of reading Value will be lower than the threshold value of setting, illustrate inside capacitance plate control panel without short circuit problem, wherein the threshold value is mainly and two-by-two Impedance magnitude between the short circuit of channel is related, can usually be directed to not two short-circuit channel itself for the setting of threshold value, It is manually loaded different size of resistance and is acquired related data, confirmation can have exception to touch-control under which maximum impedance It is worth as the above-mentioned threshold value determined for short circuit, and is arranged in computer equipment；If at least one channel read Short-circuit numerical value is greater than or equal to the threshold value of setting, then may determine that and form circuit, test result inside capacitance plate control panel For poor short circuit.
In one embodiment, test content may include open test；The external connection in multiple channels is set as mutually short It connects；
May include: according to the step of test result of test response acquisition capacitance plate control panel
The short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value at least one channel is less than setting Threshold value, then it is bad to open a way to judge the test result of capacitance plate control panel.
The present embodiment mainly carries out open test to the controllable making sheet of capacitance plate, can first will be electric before open test The external connection in each channel for holding screen control panel is set as mutually being shorted, i.e., each channel is carried out it is interconnected, for testing It whether there is open circuit problem inside capacitance plate control panel.In open test, computer equipment 100 is by capacitance plate control panel The test instruction of open test is sent, so that the capacitance plate control panel loads corresponding test signal, Ge Getong to each channel Road can feed back corresponding test response under the test signal, and then computer equipment can be received by capacitance plate control panel and is somebody's turn to do Test responds, and the short-circuit numerical value in each channel is accordingly obtained according to the test, which refers to accordingly logical for judging Whether road occurs the data of short circuit.
Specifically, Fig. 4 is the connection relationship of capacitance plate control panel and its test equipment in another embodiment with reference to Fig. 4 Schematic diagram, the capacitance plate control panel be equipped with multiple channel groups, each channel group includes multiple channels, carry out open test it Before, the channel of each channel group can be subjected to external short circuit by multiple FFC, that is, flexible flat cables, such as soft using first Property flat cable 510 each channel TX of the oneth channel TX group 310 is shorted, utilize the second flexible flat cable 520 will Each channel TX of 2nd channel TX group 320 is shorted, using third flexible flat cable 530 by the 3rd channel TX group 330 Each channel TX be shorted, carried out each channel TX of the 4th channel TX group 340 using the 4th flexible flat cable 540 It is shorted, each channel RX of the oneth channel RX group 410 is shorted using the 5th flexible flat cable 550, is soft using the 6th Property flat cable 560 each channel RX of the 2nd channel RX group 420 is shorted, utilize the 7th flexible flat cable 570 will Each channel RX of 3rd channel RX group 430 is shorted, and then be shorted by each flexible flat cable again can be completed The external of each channel of capacitance plate control panel is shorted.
After being shorted outside carrying out each channel of capacitance plate control panel, the test response in each channel can be each logical Road under the load of low and high level signal with the pressure drop of rest channels and the external connection in each channel is in the case where being shorted, If there is no problems of opening a way inside capacitance plate control panel, when load low and high level signal is tested, each of reading is led to The short-circuit numerical value in road will be higher than the threshold value of setting, illustrate that capacitance plate control panel is not opened a way problem, but if reading at least The short-circuit numerical value in channel is less than the threshold value of the setting all the way, then illustrates that the inside of capacitance plate control panel forms open circuit, tests As a result bad to open a way.
In one embodiment, short-circuit test first can be carried out to capacitance plate control panel, during obtaining short-circuit test After the short-circuit numerical value in each channel, if the short-circuit numerical value in each channel is respectively less than threshold value, open a way to capacitance plate control panel The external connection in multiple channels is carried out mutually being shorted setting, and sends test instruction to touch chip by test, indicates touch-control core A channel of the piece into multiple channels loads high level, and loads low level to rest channels, obtains multiple channels and is adding Carry the test response fed back under test signal；The short-circuit numerical value in each channel is obtained according to test response；If at least one channel Short-circuit numerical value be less than setting threshold value, then judge the test result of capacitance plate control panel be open circuit it is bad.
The present embodiment is mainly carrying out short-circuit test to capacitance plate control panel and then is carrying out the capacitance plate control panel Open test.In short-circuit test, the external connection in each channel of capacitance plate control panel is zero load, if short-circuit test shows respectively The short-circuit numerical value in a channel is respectively less than threshold value, then may determine that the capacitance plate control panel does not have the problem of poor short circuit, then again Open test is carried out, the external connection in multiple channels is mutually shorted, test instruction is sent to touch chip, so that touch-control Chip loads high level to a channel, and loads low level to remaining road, and each channel is under load test signal to touching The response of chip feedback test is controlled, the short-circuit numerical value in each channel then can be accordingly obtained according to the test, if capacitance plate control There is no problems of opening a way inside making sheet, and when load low and high level signal is tested, the short-circuit numerical value of reading will be higher than setting Fixed threshold value illustrates that capacitance plate control panel is not opened a way problem, but if the short-circuit numerical value at least one channel read is less than The threshold value of the setting then illustrates that the inside of capacitance plate control panel forms open circuit, and test result is that open circuit is bad.
The present embodiment can carry out open circuit and short-circuit test to capacitance plate control panel, first carry out short circuit to capacitance plate control panel Test, then carries out open test, due to capacitance plate control panel when carrying out short-circuit test, the capacitance plate control panel it is each Channel does not need to carry out external short circuit, so upper fairly simple convenience is operated, if finding capacitance plate control in short-circuit test There is poor short circuit in plate, that is, can determine whether that the capacitance plate control panel is defective in quality, then stops working as capacitance plate control panel Preceding open-short circuit carries out open test in the case where poor short circuit problem is not present again, is conducive to improve testing efficiency.
A kind of method of testing capacitor screen control panel is provided in one embodiment, is another reality with reference to Fig. 5, Fig. 5 The flow diagram of the method for testing capacitor screen control panel in example is applied, comprising steps of
The external connection in multiple channels of capacitance plate control panel is disposed as zero load by S401, is sent out to capacitance plate control panel Short-circuit test is sent to instruct.
This step is before carrying out short-circuit test to capacitance plate control panel, first by multiple channels of capacitance plate control panel External linkage is disposed as zero load, may then pass through computer equipment and refers to the test that capacitance plate control panel sends short-circuit test It enables, so that the touch chip of capacitance plate control panel receives test instruction, and logical to each channel TX of the touch chip and RX Road loads corresponding high level and low level signal respectively, and such as channel TX loads high level signal thereto, at the same to its He loads low level signal in channel.
S402 receives the test response fed back under load test signal in multiple channels by capacitance plate control panel.
Wherein, multiple channels of the touch chip of capacitance plate control panel can feed back phase in the case where load test signal The test answered responds to the touch chip, which can respond the test and be sent to computer equipment, and computer is set It is standby to receive test response.
S403 obtains the short-circuit numerical value in each channel according to test response.
Computer equipment can obtain each channel according to the test response that multiple channels are fed back under load test signal Short-circuit numerical value.
Whether S404, short-circuit numerical value are greater than the threshold value of setting.
This step is mainly whether the short-circuit numerical value for judging that multiple channels generate under load test signal is greater than setting Threshold value, if so, thening follow the steps S405；If it is not, thening follow the steps S406.
S405 judges the test result of capacitance plate control panel for poor short circuit.
If the short-circuit numerical value at least one channel is greater than the threshold value of setting, illustrate that the inside of capacitance plate control panel forms Circuit judges the test result of the capacitance plate control panel for poor short circuit.
The external connection in multiple channels is set as mutually being shorted by S406, and sends open test instruction to touch chip.
In this step, if the short-circuit numerical value in each channel is respectively less than the threshold value set, illustrate inside capacitance plate control panel Not formed circuit, it can be determined that the capacitance plate control panel does not have the problem of poor short circuit, then opens capacitance plate control panel Multiple channels are carried out external mutually short circuit, then send open test to touch chip by computer equipment by drive test examination Test instruction, so that the touch chip of capacitance plate control panel receives test instruction, and to each channel TX of the touch chip Corresponding high level and low level signal are loaded respectively with the channel RX, and such as a channel TX loads high level signal thereto, together When to other channels load low level signal.
Whether S407, short-circuit numerical value are less than the threshold value of setting.
Computer equipment can obtain each channel according to the test response that multiple channels are fed back under load test signal Short-circuit numerical value, and judge whether the short circuit numerical value is less than the threshold value of setting, if so, S408 is thened follow the steps, if it is not, then holding Row step S409.
S408, it is bad to open a way to judge the test result of capacitance plate control panel.
Wherein, if the short-circuit numerical value at least one channel is less than the threshold value of setting, illustrate the inside of capacitance plate control panel There are open circuit, it is bad to open a way to judge the test result of the capacitance plate control panel.
S409, the test result of capacitance plate control panel are that nothing opens poor short circuit.
In this step, if the short-circuit numerical value in each channel is all larger than the threshold value of setting, illustrate the interior of capacitance plate control panel Portion does not open a way bad problem, and then may determine that the test result of the capacitance plate control panel is both without poor short circuit or without having opened The bad problem in road.
The present embodiment may be implemented to carry out capacitance plate control panel open circuit and short-circuit test, and test mode is simple, tooling letter Singly and convenient for operation, tested without external capacitor screen, it is only necessary to which the flexible flat cable for preparing corresponding channel is shorted Test can be completed, and first carry out short-circuit test and carry out open test again, since the capacitance plate control panel is carrying out short-circuit survey Each channel does not need to carry out external short circuit when examination, so upper fairly simple convenience is operated, if finding electricity in short-circuit test Holding screen control panel has poor short circuit, that is, can determine whether that the capacitance plate control panel is defective in quality, then stop to capacitance plate The current open-short circuit of control panel carries out open test in the case where poor short circuit problem is not present again, is conducive to improve Testing efficiency.
In one embodiment, a kind of method of testing capacitor screen control panel is additionally provided, is another with reference to Fig. 6, Fig. 6 The flow diagram of the method for testing capacitor screen control panel, this method can be applied to capacitance plate as shown in Figure 1 in embodiment In control panel 200, this method be may include steps of:
Step S501 receives the test instruction that test equipment is sent.
Wherein, test equipment refers to the equipment for being tested capacitance plate control panel, can use as shown in Figure 1 Test equipment of the computer equipment 100 as capacitance plate control panel.In this step, test equipment can be sent out to capacitance plate control panel Test is sent to instruct, capacitance plate control panel receives test instruction.
Specifically, being illustrated for using computer equipment 100 shown in FIG. 1 as test equipment, to capacitance plate control Before making sheet 200 is tested, computer equipment 100 can be connected to the communication of capacitance plate control panel 200 by data line At port 210, then user can be viewed by the content that computer equipment 100 is shown the computer equipment 100 whether with Capacitance plate control panel establishes connection, and in the case where establishing connection, computer equipment 100 sends to capacitance plate control panel and surveys Examination instruction, test instruction may include short-circuit test instruction and open test instruction etc., after test instruction issues, capacitance plate Control panel can receive test instruction.
Step S502 is instructed according to test to multiple channel load test signals；The external connection in multiple channels is basis Test content is pre-set.
In this step, first determining before testing capacitance plate control panel capacitance plate control panel can be tested Test content, in general, test content can be test the capacitance plate control panel inside whether formed short circuit and exist Poor short circuit, the inside for being also possible to test the capacitance plate control panel whether occur to open a way and exist open a way it is bad etc..In determination After to the test content of capacitance plate control panel, due to test content difference, multiple channels to capacitance plate control panel are needed The corresponding external connection of carry out, external connection here, which refers to, is electrically connected these channels in the outside of capacitance plate control panel It connects, such as the external connection in each channel is set as mutually being shorted, zero load etc., so specific external connection form can be with Including a variety of, need to be preset according to test content.
With reference to Fig. 1, capacitance plate control panel 200, can be according to the test instruction execution such as after receiving test instruction To the corresponding test signal of multiple channels load being arranged on the capacitance plate test board 200, which is usually voltage Signal, and according to the difference of test content, the voltage signal of different amplitudes can be loaded to different channels, such as can be to not Same channel load high level and low level, in Digital Logical Circuits, low level indicates 0, and high level indicates 1, general provision Low level is 0 to 0.25V, and high level is 3.5 to 5V.It is bad with the presence or absence of poor short circuit or open circuit when needing to test some channel The problem of, high level can be loaded to the channel and load low level to rest channels；It for another example needs to test whether each channel deposits Poor short circuit, open circuit is bad the problems such as, successively can load high level respectively to multiple channels and rest channels load low electricity It puts down to test each channel.
Step S503 obtains the test response fed back under load test signal in multiple channels.
Capacitance plate control panel is to after multiple channel load test signals, the meeting under the load of the test signal of each channel Feedback test responds to capacitance plate control panel, the case where capacitance plate control panel loads the electric signals such as low and high level to multiple channels Under, test response can be the i.e. each channel of pressure drop generated between each channel and generate each channel after load test signal Between voltage difference, capacitance plate control panel can receive the test response of each channel feedback.
Test response is sent to test equipment by step S504, and triggering test equipment responds according to test and obtains capacitance plate The test result of control panel.
This step is mainly that can survey these after the test response that capacitance plate control panel receives each channel feedback Examination response is sent to the test equipments such as computer equipment 100 as shown in Figure 1, so that test equipment can be surveyed by the capacitance plate Test plate (panel) gets the test response fed back in the case where being loaded with test signal in multiple channels.
For test equipment after receiving test response, test equipment can be according to the test in each channel of capacitance plate control panel Response obtains the test result of the capacitance plate control panel, that is to say, that determines that the capacitance plate is controlled by the test response in channel The problems such as plate is bad with the presence or absence of performance, according to the test in response to determining that some channel there are problems that poor short circuit or some is logical Road has that open circuit is bad, then may determine that the test result of the capacitance plate control panel is that poor short circuit or open circuit are bad. For example, in the case where the external connection in each channel is zero load, if some channel loads high level and rest channels add Carry low level, and to generate short-circuit numerical value higher in channel channel adjacent thereto, then can determine that there is short circuit in corresponding channel not Good, so as to judge to form circuit inside the capacitance plate control panel, test result is poor short circuit.
The method of above-mentioned testing capacitor screen control panel, test equipment can send test instruction, electricity to capacitance plate control panel Hold screen control panel and receives the test instruction that test equipment is sent, according to test instruction to multiple channel load test signals, and should The external connection in each channel is pre-set according to test content on capacitance plate control panel, and then capacitance plate control panel obtains Test response is sent to test equipment, so that test is set by the test response for taking multiple channels to feed back under load test signal Standby that the test result for obtaining the capacitance plate control panel is responded according to the test, such test equipment can be controlled directly to capacitance plate Plate sends test instruction, and the test response fed back by each channel on the capacitance plate control panel is to judge the capacitance plate control The quality of making sheet performance is tested without external capacitor screen, and test is more convenient easy, and testing efficiency is higher, additionally it is possible to realize To the open test and short-circuit test of capacitance plate control panel.
In one embodiment, a kind of device of testing capacitor screen control panel is provided, is an implementation with reference to Fig. 7, Fig. 7 The structural block diagram of the device of testing capacitor screen control panel, the device of the testing capacitor screen control panel may include: in example
Sending module 101, for sending test instruction to capacitance plate control panel；Wherein, test instruction is used to indicate capacitor Shield control panel to multiple channel load test signals；The external connection in multiple channels is pre-set according to test content；
Receiving module 102, for obtaining the test fed back under load test signal in multiple channels response；Test responds It is obtained by capacitance plate control panel；
Module 103 is obtained, for responding the test result for obtaining capacitance plate control panel according to test.
In one embodiment, sending module 101 is further used for:
Test instruction is sent by touch chip of the communication port of capacitance plate control panel on capacitance plate control panel.
In one embodiment, test instruction is used to indicate the touch chip on capacitance plate control panel into multiple channels One channel loads high level, and loads low level to rest channels.
In one embodiment, module 103 is obtained to be further used for:
The short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value at least one channel is greater than setting Threshold value then judges the test result of capacitance plate control panel for poor short circuit；Wherein, test content includes short-circuit test；It is multiple logical The external connection in road is set as unloaded.
In one embodiment, module 103 is obtained to be further used for:
The short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value at least one channel is less than setting Threshold value, then it is bad to open a way to judge the test result of capacitance plate control panel；Wherein, test content includes drive test examination；Multiple channels External connection be set as mutually being shorted.
In one embodiment, further includes:
Instruction sending unit connects the outside in multiple channels if the short-circuit numerical value for each channel is respectively less than threshold value Tap into row and be mutually shorted setting, and send test instruction to touch chip, indicate touch chip one into multiple channels it is logical Road loads high level, and loads low level to rest channels, obtains the test fed back under load test signal in multiple channels and rings It answers；Numerical value acquiring unit, for obtaining the short-circuit numerical value in each channel according to test response；As a result judging unit, if for extremely The short-circuit numerical value in a few channel is less than the threshold value of setting, then it is bad to open a way to judge the test result of capacitance plate control panel.
In one embodiment, a kind of device of testing capacitor screen control panel is additionally provided, is another with reference to Fig. 8, Fig. 8 The structural block diagram of the device of testing capacitor screen control panel in embodiment, the device of the testing capacitor screen control panel can be applied to electricity Hold in screen control panel, the apparatus may include:
Command reception module 501, for receiving the test instruction of test equipment transmission；
Signal loading module 502, for being instructed according to test to multiple channel load test signals；The outside in multiple channels Connection is pre-set according to test content；
Response obtains module 503, for obtaining the test fed back under load test signal in multiple channels response；
Sending module 504 is responded, is sent to test equipment for response will to be tested, triggering test equipment is responded according to test Obtain the test result of capacitance plate control panel.
The method one of the device of testing capacitor screen control panel of the invention and testing capacitor screen control panel of the invention is a pair of It answers, the specific of the device about testing capacitor screen control panel limits the side that may refer to above for testing capacitor screen control panel The restriction of method is applicable in the technical characteristic and its advantages of the embodiment elaboration of the method for above-mentioned testing capacitor screen control panel In the embodiment of the device of testing capacitor screen control panel, details are not described herein.In the device of above-mentioned testing capacitor screen control panel Modules can be realized fully or partially through software, hardware and combinations thereof.Above-mentioned each module can embed in the form of hardware In processor in computer equipment, the memory that can also be stored in a software form in computer equipment In, the corresponding operation of the above modules is executed in order to which processor calls.
In one embodiment, the system of testing capacitor screen control panel is provided, which can see to include: capacitance plate control Making sheet and the computer equipment communicated to connect with the capacitance plate control panel；The capacitance plate control panel is equipped with multiple channels；It is more The external connection in a channel is pre-set according to test content；Wherein,
The computer equipment is used to execute the step of the method for testing capacitor screen control panel described in as above any one embodiment Suddenly, capacitance plate control panel is tested.
Specifically, the computer equipment can connect the communication port of capacitance plate control panel, the capacitance plate by data line It is equipped with touch chip on control panel, which is equipped with multiple channels.Wherein,
When test content is short-circuit test, the external connection in multiple channels of capacitance plate control panel is set as unloaded, should Computer equipment can send short-circuit test instruction to touch chip by communication port, and triggering touch chip refers to according to the test It enables a channel into multiple channels load high level and loads low level to rest channels, received by capacitance plate control panel The test response that multiple channels are fed back under load test signal, the short-circuit test for obtaining capacitance plate control panel is responded according to test As a result.
It is the connection relationship diagram of capacitance plate control panel and its test equipment in one embodiment with reference to Fig. 3, Fig. 3, this The system of the testing capacitor screen control panel of embodiment may include computer equipment 100 and capacitance plate control panel 200, the computer Equipment 100 can connect the communication port 210 of capacitance plate control panel 200 by data line 300, on the capacitance plate control panel 200 Equipped with touch chip, which is equipped with multiple channels, and multiple channel may include the channel RX and the channel TX.To the electricity Before holding the screen progress short-circuit test of control panel 200, the external connection in multiple channels of the capacitance plate control panel 200 is disposed as sky It carries, i.e. multiple channels of capacitance plate control panel 200 do not connect anything, and in short-circuit test, computer equipment 100 can lead to The test instruction that touch chip of the communication port 210 on capacitance plate control panel 200 sends short-circuit test is crossed, so that the touch-control core Piece loads high level to its channel and loads low level to rest channels, these channels can feed back survey under the load of low and high level Examination responds to touch chip, and touch chip is sent to computer equipment 100, computer equipment 100 after receiving test response The short-circuit numerical value for obtaining each channel can be responded according to the test, thus judge the short-circuit test of capacitance plate control panel as a result, The problem of whether there is poor short circuit.The system of testing capacitor screen control panel provided in this embodiment passes through user Computer equipment 100 completes the short-circuit test to capacitance plate control panel 200.
When test content is open test, multiple channels of capacitance plate control panel are mutually shorted, which sets Standby to send short-circuit test instruction to touch chip by communication port, triggering touch chip is instructed according to the test to multiple A channel in channel loads high level and loads low level to rest channels, passes through capacitance plate control panel and receives multiple channels The test response fed back under load test signal, the open test result for obtaining capacitance plate control panel is responded according to test.
It is the connection relationship diagram of capacitance plate control panel and its test equipment in another embodiment with reference to Fig. 4, Fig. 4, The system of the testing capacitor screen control panel of the present embodiment may include computer equipment 100 and capacitance plate control panel 200, the calculating Machine equipment 100 can connect the communication port 210 of capacitance plate control panel 200, the capacitance plate control panel 200 by data line 300 It is equipped with touch chip, which is equipped with multiple channels, and multiple channel may include the channel RX and the channel TX.To electricity Before holding the screen progress open test of control panel 200, the external connection in multiple channels of the capacitance plate control panel 200 is mutually short It connects, wherein each channel can be mutually shorted by multiple flexible flat cables, such as utilize the first flexible flat electricity Each channel TX of first channel TX group 310 is shorted, is led to the 2nd TX using the second flexible flat cable 520 by cable 510 Each channel TX of road group 320 is shorted etc., and then be shorted by each flexible flat cable again can be completed to capacitor Shield the external of each channel of control panel to be shorted.In open test, computer equipment 100 can by communication port 210 to Touch chip on capacitance plate control panel 200 sends the test instruction of short-circuit test, so that the touch chip is into multiple channels A channel load high level and to rest channels load low level, these channels can feed back survey under the load of low and high level Examination responds to touch chip, and touch chip is sent to computer equipment 100, computer equipment 100 after receiving test response The short-circuit numerical value for obtaining each channel can be responded according to the test, thus judge the open test of capacitance plate control panel as a result, The problem of whether there is poor short circuit.The system of testing capacitor screen control panel provided in this embodiment passes through user Computer equipment 100 completes the open test to capacitance plate control panel 200.
In one embodiment, a kind of computer equipment is provided, which can be applied to embodiment as above In the system of the testing capacitor screen control panel, which can be the meter such as personal computer, laptop Calculate machine equipment, internal structure chart can using as shown in figure 9, Fig. 9 as the internal structure chart of computer equipment in one embodiment.It should Computer equipment includes processor, memory, network interface, display screen and the input unit connected by system bus.Wherein, The processor of the computer equipment is for providing calculating and control ability.The memory of the computer equipment includes non-volatile deposits Storage media, built-in storage.The non-volatile memory medium is stored with operating system and computer program.The built-in storage is non-easy The operation of operating system and computer program in the property lost storage medium provides environment.The network interface of the computer equipment is used for It is communicated with external terminal by network connection.To realize a kind of testing capacitor screen control when the computer program is executed by processor The method of making sheet.The display screen of the computer equipment can be liquid crystal display or electric ink display screen, which sets Standby input unit can be the touch layer covered on display screen, be also possible to the key being arranged on computer equipment shell, rail Mark ball or Trackpad can also be external keyboard, Trackpad or mouse etc..
It will be understood by those skilled in the art that structure shown in Fig. 9, only part relevant to the present invention program is tied The block diagram of structure does not constitute the restriction for the computer equipment being applied thereon to the present invention program, specific computer equipment It may include perhaps combining certain components or with different component layouts than more or fewer components as shown in the figure.
In one embodiment, a kind of computer equipment is provided, including memory, processor and storage are on a memory And the computer program that can be run on a processor, processor perform the steps of when executing computer program
Test instruction is sent to capacitance plate control panel；The test fed back under load test signal in multiple channels is obtained to ring It answers；The test result for obtaining capacitance plate control panel is responded according to test.
In one embodiment, it is also performed the steps of when processor executes computer program
Test instruction is sent by touch chip of the communication port of capacitance plate control panel on capacitance plate control panel.
In one embodiment, it is also performed the steps of when processor executes computer program
The first short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value of the first of at least one channel is big In the threshold value of setting, then judge the test result of capacitance plate control panel for poor short circuit.
In one embodiment, it is also performed the steps of when processor executes computer program
The short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value at least one channel is less than setting Threshold value, then it is bad to open a way to judge the test result of capacitance plate control panel.
In one embodiment, it is also performed the steps of when processor executes computer program
If the short-circuit numerical value in each channel is respectively less than threshold value, the external connection in multiple channels is subjected to mutually short circuit and is set It sets, and sends test to touch chip and instruct, channel load high level of the instruction touch chip into multiple channels, and to Rest channels load low level, obtain the test response fed back under load test signal in multiple channels；It is obtained according to test response Take the short-circuit numerical value in each channel；If the short-circuit numerical value at least one channel is less than the threshold value of setting, capacitance plate control is judged The test result of plate is that open circuit is bad.
Above-mentioned computer equipment can be controlled directly to capacitance plate by the computer program run on the processor Plate sends test instruction, and the test response fed back by each channel on the capacitance plate control panel is to judge the capacitance plate control The quality of making sheet performance is tested without external capacitor screen, and test is more convenient easy, and testing efficiency is higher, additionally it is possible to realize To the open test and short-circuit test of capacitance plate control panel.
Those of ordinary skill in the art will appreciate that realizing testing capacitor screen control panel described in as above any one embodiment Method in all or part of the process, be that relevant hardware can be instructed to complete by computer program, the meter Calculation machine program can be stored in a non-volatile computer read/write memory medium, and the computer program is when being executed, it may include Such as the process of the embodiment of above-mentioned each method.Wherein, used in each embodiment provided by the present invention to memory, deposit Any reference of storage, database or other media, may each comprise non-volatile and/or volatile memory.Non-volatile memories Device may include read-only memory (ROM), programming ROM (PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include random access memory (RAM) or external cache.Make To illustrate rather than limit to, RAM is available in many forms, such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) directly RAM (RDRAM), direct memory bus dynamic ram (DRDRAM) and Memory bus dynamic ram (RDRAM) etc..
Accordingly, a kind of computer readable storage medium is provided in one embodiment, is stored thereon with computer program, It is performed the steps of when computer program is executed by processor
Test instruction is sent to capacitance plate control panel；The test fed back under load test signal in multiple channels is obtained to ring It answers；The test result for obtaining capacitance plate control panel is responded according to test.
In one embodiment, it is also performed the steps of when computer program is executed by processor
Test instruction is sent by touch chip of the communication port of capacitance plate control panel on capacitance plate control panel.
In one embodiment, it is also performed the steps of when computer program is executed by processor
The first short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value of the first of at least one channel is big In the threshold value of setting, then judge the test result of capacitance plate control panel for poor short circuit.
In one embodiment, it is also performed the steps of when computer program is executed by processor
The short-circuit numerical value in each channel is obtained according to test response；If the short-circuit numerical value at least one channel is less than setting Threshold value, then it is bad to open a way to judge the test result of capacitance plate control panel.
In one embodiment, it is also performed the steps of when computer program is executed by processor
If the short-circuit numerical value in each channel is respectively less than threshold value, the external connection in multiple channels is subjected to mutually short circuit and is set It sets, and sends test to touch chip and instruct, channel load high level of the instruction touch chip into multiple channels, and to Rest channels load low level, obtain the test response fed back under load test signal in multiple channels；It is obtained according to test response Take the short-circuit numerical value in each channel；If the short-circuit numerical value at least one channel is less than the threshold value of setting, capacitance plate control is judged The test result of plate is that open circuit is bad.
In one embodiment, a kind of computer readable storage medium is provided, computer program is stored thereon with, is calculated Machine program performs the steps of when being executed by processor
Receive the test instruction that test equipment is sent；It is instructed according to test to multiple channel load test signals；It obtains more The test response that a channel is fed back under load test signal；Test response is sent to test equipment, triggers test equipment root The test result for obtaining capacitance plate control panel is responded according to test.
Above-mentioned computer readable storage medium can be directly to capacitance plate control panel by the computer program that it is stored Test instruction is sent, the test response fed back by each channel on the capacitance plate control panel is to judge that the capacitance plate controls The quality of plate performance is tested without external capacitor screen, and test is more convenient easy, and testing efficiency is higher, additionally it is possible to be realized pair The open test and short-circuit test of capacitance plate control panel.
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance Shield all should be considered as described in this specification.
The embodiments described above only express several embodiments of the present invention, and the description thereof is more specific and detailed, but simultaneously It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art It says, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to protection of the invention Range.Therefore, the scope of protection of the patent of the invention shall be subject to the appended claims.

Claims (12)

1. a kind of method of testing capacitor screen control panel, which is characterized in that comprising steps of
Test instruction is sent to capacitance plate control panel；Wherein, test instruction is used to indicate the capacitance plate control panel to more A channel load test signal；The external connection in the multiple channel is pre-set according to test content；
Obtain the test response that the multiple channel is fed back in the case where loading the test signal；The test response is by described What capacitance plate control panel obtained；
The test result of the capacitance plate control panel is obtained according to the test response.
2. the method for testing capacitor screen control panel according to claim 1, which is characterized in that described to capacitance plate control panel Sending the step of test instructs includes:
The test is sent by touch chip of the communication port of the capacitance plate control panel on the capacitance plate control panel Instruction；The multiple channel is the channel of the touch chip.
3. the method for testing capacitor screen control panel according to claim 2, which is characterized in that the test instruction is for referring to Show channel load high level of the touch chip into the multiple channel, and loads low level to rest channels.
4. the method for testing capacitor screen control panel according to claim 3, which is characterized in that the test content includes short Drive test examination；The external connection in the multiple channel is set as unloaded；
It is described to include: according to the step of test result for testing the response acquisition capacitance plate control panel
The short-circuit numerical value in each channel is obtained according to the test response；
If the short-circuit numerical value at least one channel is greater than the threshold value of setting, the test knot of the capacitance plate control panel is judged Fruit is poor short circuit.
5. the method for testing capacitor screen control panel according to claim 3, which is characterized in that the test content includes opening Drive test examination；The external connection in the multiple channel is set as mutually being shorted；
It is described to include: according to the step of test result for testing the response acquisition capacitance plate control panel
The short-circuit numerical value in each channel is obtained according to the test response；
If the short-circuit numerical value at least one channel is less than the threshold value of setting, the test knot of the capacitance plate control panel is judged Fruit is that open circuit is bad.
6. the method for testing capacitor screen control panel according to claim 4, which is characterized in that further comprise the steps of:
If the short-circuit numerical value in each channel is respectively less than the threshold value, the external connection in the multiple channel is carried out mutual It is shorted setting, and sends the test instruction to the touch chip, indicates the touch chip into the multiple channel One channel loads high level, and loads low level to rest channels, obtains the multiple channel and is loading the test signal The test of lower feedback responds；
The short-circuit numerical value in each channel is obtained according to the test response；
If the short-circuit numerical value at least one channel is less than the threshold value of setting, the test knot of the capacitance plate control panel is judged Fruit is that open circuit is bad.
7. a kind of method of testing capacitor screen control panel is applied to capacitance plate control panel, which is characterized in that comprising steps of
Receive the test instruction that test equipment is sent；
It is instructed according to the test to multiple channel load test signals；The external connection in the multiple channel is according in test Hold pre-set；
Obtain the test response that the multiple channel is fed back in the case where loading the test signal；
Test response is sent to the test equipment, triggers the test equipment according to test response acquisition The test result of capacitance plate control panel.
8. a kind of device of testing capacitor screen control panel characterized by comprising
Sending module, for sending test instruction to capacitance plate control panel；Wherein, the test instruction is used to indicate the capacitor Shield control panel to multiple channel load test signals；The external connection in the multiple channel is preset according to test content 's；
Receiving module, the test response fed back for obtaining the multiple channel in the case where loading the test signal；The test Response is obtained by the capacitance plate control panel；
Module is obtained, for obtaining the test result of the capacitance plate control panel according to the test response.
9. a kind of device of testing capacitor screen control panel is applied to capacitance plate control panel characterized by comprising
Command reception module, for receiving the test instruction of test equipment transmission；
Signal loading module, for being instructed according to the test to multiple channel load test signals；Outside the multiple channel Portion's connection is pre-set according to test content；
Response obtains module, the test response fed back for obtaining the multiple channel in the case where loading the test signal；
Sending module is responded, for test response to be sent to the test equipment, triggers the test equipment according to institute State the test result that test response obtains the capacitance plate control panel.
10. a kind of system of testing capacitor screen control panel characterized by comprising capacitance plate control panel and with the capacitor Shield the computer equipment of control panel communication connection；The capacitance plate control panel is equipped with multiple channels；Outside the multiple channel Portion's connection is pre-set according to test content；Wherein,
The computer equipment, for executing such as the method for testing capacitor screen control panel as claimed in any one of claims 1 to 6 Step tests the capacitance plate control panel.
11. the system of testing capacitor screen control panel according to claim 10, which is characterized in that
When the test content is short-circuit test, the external connection in the multiple channel is set as unloaded；
When the test content is open test, the external connection in the multiple channel is set as mutually being shorted.
12. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the computer program The step of method of the described in any item testing capacitor screen control panels of claim 1 to 7 is realized when being executed by processor.
CN201910390026.4A 2019-05-10 2019-05-10 Method, apparatus, system and the storage medium of testing capacitor screen control panel Pending CN110109002A (en)

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Publication number Priority date Publication date Assignee Title
CN114152895A (en) * 2021-11-10 2022-03-08 深圳市德明利技术股份有限公司 Capacitive screen mutual capacitance short circuit testing method and device and computer readable storage medium
CN117538672A (en) * 2024-01-10 2024-02-09 深圳市坤巨实业有限公司 Test method and device for target capacitive screen and electronic equipment

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Application publication date: 20190809