CN117538672A - Test method and device for target capacitive screen and electronic equipment - Google Patents
Test method and device for target capacitive screen and electronic equipment Download PDFInfo
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- CN117538672A CN117538672A CN202410033362.4A CN202410033362A CN117538672A CN 117538672 A CN117538672 A CN 117538672A CN 202410033362 A CN202410033362 A CN 202410033362A CN 117538672 A CN117538672 A CN 117538672A
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Abstract
The application provides a test method and device for a target capacitive screen and electronic equipment, and relates to the field of electric digital data processing. The method comprises the following steps: responding to test operation of a user on the IC master control in the target capacitive screen, and acquiring master control information corresponding to the IC master control, wherein the master control information comprises chip scheme manufacturer information, model information and chip version information; acquiring a first test tool corresponding to the main control information from a preset test database, wherein the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool; and performing test operation on the target capacitive screen through a first test tool, and acquiring a test result. According to the technical scheme, the problems that the time consumption is high and the efficiency is low due to the fact that testing operation is carried out on the target capacitive screen only by a tester are solved.
Description
Technical Field
The application relates to the field of electric digital data processing, in particular to a testing method and device for a target capacitive screen and electronic equipment.
Background
With the development of electronic products, the application of the target capacitive screen is increasingly wide. A target capacitive screen, also called a capacitive touch screen, is a screen that performs a touch operation using current induction of a human body. Compared with the traditional resistive touch screen, the target capacitive screen has higher sensitivity and wider application range.
Today, in the process of producing the target capacitive screen, firstly, a tester needs to judge a scheme manufacturer corresponding to IC (Integrated Circuit) master control in the target capacitive screen, and then according to the scheme manufacturer, a testing tool corresponding to IC master control is selected to test the target capacitive screen. However, the number of the target capacitive screens in production is large, and scheme vendors corresponding to the IC main control in different target capacitive screens can be different, and at this time, only test personnel are used for testing the target capacitive screens, so that the time consumption is high, and the efficiency is low.
Therefore, a test method and device for the target capacitive screen and an electronic device are needed.
Disclosure of Invention
The application provides a test method and device for a target capacitive screen and electronic equipment, and solves the problems that the time consumption is high and the efficiency is low due to the fact that test operation is carried out on the target capacitive screen only by a tester.
In a first aspect of the present application, a method for testing a target capacitive screen is provided, the method comprising: responding to test operation of a user on a target capacitive screen, and acquiring main control information corresponding to the IC main control in the target capacitive screen, wherein the main control information comprises chip scheme business information, model information and chip version information; acquiring a first test tool corresponding to the main control information from a preset test database, wherein the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool; and performing test operation on the target capacitive screen through a first test tool, and acquiring a test result.
Through adopting above-mentioned technical scheme, through discernment to the test operation of target capacitive screen of user to acquire the master control information of IC master control in the target capacitive screen, thereby through presetting the corresponding relation of test database master control information and first test tool, obtain the first test tool that is used for testing target capacitive screen, and through first test tool, realize the automatic test operation to target capacitive screen, and then solved only rely on the tester to carry out test operation to target capacitive screen, consuming time is higher, and the lower problem of efficiency.
Optionally, after the first test tool corresponding to the master control information is obtained in the preset test database, the method further includes: acquiring first tool version information corresponding to a first test tool; judging whether the first tool version information is version information corresponding to the chip version information; if the first tool version information is not the version information corresponding to the chip version information, updating the first test tool to a second test tool at a preset website, wherein the second test tool corresponds to the second tool version information, and the second tool version information is the version information corresponding to the chip version information.
By adopting the technical scheme, by judging whether the version information of the test tool corresponding to the first test tool is the same version information as the version information of the chip in the main control information corresponding to the IC main control, when the version information of the test tool corresponding to the first test tool is not the same version information as the version information of the chip in the main control information corresponding to the IC main control, the first tool can be updated to the second test tool by downloading the second tool at the preset website, so that the problem that incompatibility occurs due to the fact that the version is not corresponding, namely, the first test tool cannot test the target capacitive screen or cannot test part of functions in the target capacitive screen is avoided.
Optionally, the first testing tool is used for testing the target capacitive screen corresponding to the same scheme quotient.
Through adopting above-mentioned technical scheme, through designing and configuration first test tool for the IC master control of same scheme merchant, can detect the operation to the IC master control more accurately, also can avoid using other test tools to detect the incompatible condition that appears to the IC master control of this scheme merchant to reduce test error.
Optionally, the test operation includes a failure test and a line drawing test, and when the test operation is the failure test, the test operation is performed on the target capacitive screen by using the first test tool, which specifically includes: acquiring a plurality of failure test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of failure test items comprise an open circuit test, a short circuit test and a node failure test; and respectively performing test operation on the plurality of failure test items through the first test tool.
Through adopting above-mentioned technical scheme, when test operation is failure test, through master control information, can confirm a plurality of failure test items that the IC master control corresponds, and through carrying out test operation to a plurality of failure test items, can more comprehensively carry out failure test to the target capacitive screen to guarantee the reliability and the stability of target capacitive screen.
Optionally, after performing a test operation on the target capacitive screen by using the first test tool and obtaining a test result, the method further includes: judging whether the test result is abnormal in failure test; if the test result is failure test abnormality, obtaining failure abnormality information corresponding to the test result, wherein the failure abnormality information comprises one or more of open-circuit abnormality, short-circuit abnormality and node failure abnormality; and sending the failure abnormal information to the user.
By adopting the technical scheme, whether the test result is abnormal or not is automatically judged after the test operation is finished, and if the test result shows that the failure abnormality exists, corresponding abnormal information is further acquired and reported, so that a user is helped to quickly identify and solve the potential failure test abnormality.
Optionally, when the test operation is a line drawing test, the test operation is performed on the target capacitive screen by using a first test tool, and specifically includes: acquiring a plurality of drawing test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of line drawing test items comprise a precision test, a sensitivity test and a report point test; and respectively performing test operation on the plurality of line drawing test items through the first test tool.
Through adopting above-mentioned technical scheme, when test operation is the setting-out test, through master control information, can confirm a plurality of setting-out test items that the IC master control corresponds, and through carrying out test operation to a plurality of setting-out test items, can carry out the setting-out test to the target capacitive screen more comprehensively to ensure the accuracy, the sensitivity of target capacitive screen when touching.
Optionally, after performing a test operation on the target capacitive screen by using the first test tool and obtaining a test result, the method further includes: judging whether the test result is abnormal in the line drawing test; if the test result is the line drawing test abnormality, obtaining line drawing abnormality information corresponding to the test result, wherein the line drawing abnormality information comprises one or more of accuracy abnormality, sensitivity abnormality and point reporting abnormality; and sending the line drawing abnormality information to a user.
By adopting the technical scheme, whether the test result is abnormal or not is automatically judged after the test operation is finished, if the test result shows that the line drawing is abnormal, corresponding abnormal information is further acquired and reported, and therefore a user is helped to quickly identify and solve the potential line drawing test abnormality.
In a second aspect of the present application, a test apparatus for a target capacitive screen is provided, the apparatus comprising an acquisition module and a processing module, wherein,
the acquisition module is used for responding to the test operation of a user on the target capacitive screen and acquiring main control information corresponding to the IC main control in the target capacitive screen, wherein the main control information comprises chip scheme business information, model information and chip version information; and acquiring a first test tool corresponding to the main control information from a preset test database, wherein the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool.
And the processing module is used for carrying out test operation on the target capacitive screen through the first test tool and obtaining a test result.
In a third aspect the present application provides an electronic device comprising a processor, a memory for storing instructions, a user interface and a network interface for communicating with other devices, the processor for executing instructions stored in the memory to cause the electronic device to perform a method as any one of the above.
In a fourth aspect of the present application there is provided a computer readable storage medium storing a computer program for execution by a processor of a method as any one of the above.
One or more technical solutions provided in the embodiments of the present application at least have the following technical effects or advantages:
1. through adopting above-mentioned technical scheme, through discernment to the test operation of target capacitive screen of user to acquire the master control information of IC master control in the target capacitive screen, thereby through presetting the corresponding relation of test database master control information and first test tool, obtain the first test tool that is used for testing target capacitive screen, and through first test tool, realize the automatic test operation to target capacitive screen, and then solved only rely on the tester to carry out test operation to target capacitive screen, consuming time is higher, and the lower problem of efficiency.
2. When the test operation is failure test, a plurality of failure test items corresponding to the IC main control can be confirmed through the main control information, and the failure test can be more comprehensively carried out on the target capacitive screen through the test operation on the plurality of failure test items, so that the reliability and the stability of the target capacitive screen are ensured.
3. When the test operation is the line drawing test, a plurality of line drawing test items corresponding to the IC main control can be confirmed through the main control information, and the line drawing test can be carried out on the target capacitive screen more comprehensively through the test operation on the plurality of line drawing test items, so that the accuracy and the sensitivity of the target capacitive screen in touch are ensured.
Drawings
Fig. 1 is a schematic flow chart of a test method for a target capacitive screen according to an embodiment of the present application;
fig. 2 is a schematic drawing of a line drawing test for a target capacitive screen according to an embodiment of the present application;
FIG. 3 is a schematic block diagram of a testing apparatus for a target capacitive screen according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Reference numerals illustrate: 200. a target capacitive screen; 31. an acquisition module; 32. a processing module; 401. a processor; 402. a communication bus; 403. a user interface; 404. a network interface; 405. a memory.
Detailed Description
In order to make those skilled in the art better understand the technical solutions in the present specification, the technical solutions in the embodiments of the present specification will be clearly and completely described below with reference to the drawings in the embodiments of the present specification, and it is obvious that the described embodiments are only some embodiments of the present application, but not all embodiments.
The terminology used in the following embodiments of the application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the specification of this application, the singular forms "a", "an", "the" and "the" are intended to include the plural forms as well, unless the context clearly indicates to the contrary. It should also be understood that the term "and/or" as used in this application refers to and encompasses any or all possible combinations of one or more of the listed items.
The terms "first," "second," and the like, are used below for descriptive purposes only and are not to be construed as implying or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature, and in the description of embodiments of the present application, unless otherwise indicated, the meaning of "a plurality" is two or more.
In order to better understand the technical solutions of the present application, the present invention will be further described in detail below with reference to the accompanying drawings.
Referring to fig. 1, a flow chart of a testing method for a target capacitive screen according to an embodiment of the present application is shown, and the method is applied to a server, and the flow chart mainly includes the following steps: s101 to S103.
Step S101, in response to a test operation of a user on a target capacitive screen, acquiring main control information corresponding to an IC main control in the target capacitive screen, wherein the main control information comprises chip scheme manufacturer information, model information and chip version information.
Specifically, in the process of producing the target capacitive screen, a test operation needs to be performed in the target capacitive screen. When the server identifies the test operation of the user on the target capacitive screen, the server acquires main control information of the IC main control in the target capacitive screen, wherein the main control information comprises, but is not limited to, scheme manufacturer information of a target chip, chip model information, chip version information and the like, and the scheme manufacturer information is information of a manufacturer providing a chip design scheme; the chip model information is identifier information of the IC master control and is used for distinguishing different IC master control types; the chip version information is information of different versions and update states of the IC master control. The server can acquire the main control information of the IC main control in the target capacitive screen in real time, at the moment, the user needs to manually connect the test interface of the server with the target capacitive screen, and then the server can automatically acquire the main control information of the IC main control in the target capacitive screen; the server can also automatically acquire the main control information of the IC main control in the target capacitive screen, before each target capacitive screen is produced, the server can number each target capacitive screen according to the production sequence and bind the number with the IC main control and the main control information corresponding to each target capacitive screen, after the production is finished, the server also performs test operation on each target capacitive screen according to the production sequence, at this time, when the server performs detection operation on the target capacitive screen, only the number corresponding to the target capacitive screen is required to be identified, and the IC main control and the main control information corresponding to the target capacitive screen can be acquired, so that corresponding detection operation is performed on the target capacitive screen according to the main control information. It should be noted that, whether the user performs the test manually or the server performs the test automatically, the server can supply power to the target capacitive screen through the power supply device, so as to ensure the normal performance of the test operation.
Step S102, a first test tool corresponding to the main control information is obtained from a preset test database, and the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool.
Specifically, in a preset test database, a plurality of IC masters, a plurality of test tools, and corresponding relations between different IC masters and different test tools are stored, wherein the plurality of test tools include a first test tool, and the first test tool is used for testing a target capacitive screen corresponding to the same scheme merchant. The server acquires the testing tool corresponding to the target capacitive screen from a preset testing database by identifying the main control information of the IC main control, namely by identifying the scheme quotient information corresponding to the IC main control.
For example, assume that the correspondence between the three IC masters and the test tools is stored in a preset test database, and the corresponding relations are respectively the a-type IC masters provided by the scheme company a, the corresponding test tools 1, the B-type IC masters provided by the scheme company B, the corresponding test tools 2, the C-type IC masters provided by the scheme company C, and the corresponding test tools 3, at this time, when the target capacitive screen is detected, the master control information corresponding to the IC masters in the target capacitive screen is obtained, and if the server determines that the target capacitive screen is the a-type IC master provided by the scheme company a, the test operation on the target capacitive screen can be confirmed by the corresponding relations stored in the preset test database by using the test tools 1. It should be noted that, in this embodiment, the number of correspondence relations stored in the preset test database is not limited, and may be determined according to the number of scheme vendors providing the IC master control during actual production, and when a new scheme vendor is added to the preset database, all the IC master controls corresponding to the scheme vendor are added, and according to the IC master control corresponding to the scheme vendor, a test tool capable of performing a test operation for a corresponding target capacitive screen is updated.
In a possible implementation manner, after step S102, the method further includes: acquiring first tool version information corresponding to a first test tool; judging whether the first tool version information is version information corresponding to the chip version information; if the first tool version information is not the version information corresponding to the chip version information, updating the first test tool to a second test tool at a preset website, wherein the second test tool corresponds to the second tool version information, and the second tool version information is the version information corresponding to the chip version information.
Specifically, after the server obtains the first test tool corresponding to the IC master control in the target capacitive screen, it may determine whether the version information of the test tool corresponding to the first test tool is the same version information as the version information of the chip in the master control information corresponding to the IC master control, if the version information of the test tool corresponding to the first test tool is different from the version information of the chip in the master control information corresponding to the IC master control, if the first test tool is still used to test the target capacitive screen corresponding to the IC master control, an incompatibility problem may occur due to the fact that the version is not corresponding, for example, a circuit in the target capacitive screen is greatly changed compared with the version tested by the first test tool, or different use functions are newly added, the first test tool may not be able to test the target capacitive screen corresponding to the IC master control, or may not be able to test some functions in the target capacitive screen corresponding to the IC master control. At this point, the server may make a version update to the first test tool. The server can update the corresponding relation in the preset test database into the corresponding relation between the main control information and the second test tool through the server after the downloading is successful in the relevant websites (the websites of the scheme providers, the historical version downloading websites which are specially established for the test tools by the scheme providers and the like) of the corresponding scheme providers of the IC main control, namely the preset websites, the first test tool, namely the second test tool after the downloading is successful, and test operation is carried out on the target capacitor corresponding to the main control of the IC through the second test tool.
Step S103, testing operation is carried out on the target capacitive screen through a first testing tool, and a testing result is obtained.
Specifically, after the server obtains a first testing tool corresponding to the IC master control in the target capacitive screen, testing operation is performed on the target capacitive screen through the first testing tool, and a testing result is obtained. According to the test result, when the test result does not have abnormal information, the server judges that the target capacitive screen is qualified in detection; when abnormal information exists in the test result.
In one possible implementation, the test operation includes a failure test and a line drawing test, and when the test operation is the failure test, step S103 further includes: acquiring a plurality of failure test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of failure test items comprise an open circuit test, a short circuit test and a node failure test; and respectively performing test operation on the plurality of failure test items through the first test tool.
Specifically, when the server performs test operation on the target capacitive screen through the first test tool, multiple test operations are required to be performed on the target capacitive screen, and when the target capacitive screen passes multiple test operations at the same time, the server judges that the target capacitive screen is qualified in detection. The test operation comprises failure test and line drawing test, when the test operation is failure test, the server needs to determine a plurality of failure test items corresponding to the IC main control, the number of the failure test items corresponding to the IC main control is related to the main control information corresponding to the IC main control, and the server inputs the main control information corresponding to the IC main control into the first test tool, so that the first test tool determines the failure test items corresponding to the target capacitive screen according to the main control information. The failure test items include, but are not limited to, open circuit test, short circuit test, poor node test, etc., wherein the open circuit test is used for detecting whether an open circuit exists in the target capacitive screen; the short circuit test is used for detecting whether a circuit short circuit exists in the target capacitive screen; the node bad test is used for detecting whether the channel node in the circuit is connected poorly or not in the target capacitive screen. And the server performs one-to-one test on the determined multiple failure test items through a first test tool.
In a possible implementation manner, after step S103, the method further includes: judging whether the test result is abnormal in failure test; if the test result is failure test abnormality, obtaining failure abnormality information corresponding to the test result, wherein the failure abnormality information comprises one or more of open-circuit abnormality, short-circuit abnormality and node failure abnormality; and sending the failure abnormal information to the user.
Specifically, if after the first test tool finishes testing the plurality of failure test items, any failure test item has a test abnormality, the server judges that abnormality information exists in the test result, that is, the server judges that the test result is a failure test abnormality, at this time, the server obtains abnormal failure test items in the test result, obtains failure abnormality information corresponding to the abnormal failure test items, where the failure abnormality information includes, but is not limited to, one or more of open circuit abnormality, short circuit abnormality and node abnormality, and the server sends the abnormal failure test items detected abnormal and result data corresponding to the abnormal failure test items detected abnormal to the user, that is, sends the abnormal failure information to the user.
In one possible implementation, when the test operation is a line drawing test, step S103 further includes: acquiring a plurality of drawing test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of line drawing test items comprise a precision test, a sensitivity test and a report point test; and respectively performing test operation on the plurality of line drawing test items through the first test tool.
Specifically, when the server performs test operation on the target capacitive screen through the first test tool, multiple test operations are required to be performed on the target capacitive screen, and when the target capacitive screen passes multiple test operations at the same time, the server judges that the target capacitive screen is qualified in detection. The test operation comprises a failure test and a line drawing test, when the test operation is the line drawing test, the server needs to determine a plurality of line drawing test items corresponding to the IC main control, the number of the line drawing test items corresponding to the IC main control is related to the main control information corresponding to the IC main control, and the server inputs the main control information corresponding to the IC main control into the first test tool, so that the first test tool determines the line drawing test items corresponding to the IC main control according to the main control information. The line drawing test items comprise, but are not limited to, a precision test, a sensitivity test, a point reporting test and the like, wherein the precision test is used for testing the precision of the target capacitive screen and ensuring that the clicked position on the target capacitive screen is consistent with the actual position; the sensitivity test is to adjust different sensitivity settings and test the response conditions of the target capacitive screen to touches of different degrees; the report point test is used for testing whether the target capacitive screen has a report missing point or not. And the server performs one-to-one test on the determined plurality of line drawing test items through a first test tool. In addition, the server can set different system drawing tools for different testing tools, the server controls the touch tool to conduct drawing test on the target capacitive screen according to the drawing track through the drawing track set in the system drawing tool, and therefore the operation of drawing detection is completed, and the touch tool executes the touch operation on the target capacitive screen, such as a capacitive pen. When the server sets a drawing track in the system drawing tool, the factors such as the shape and the size of the target capacitive screen need to be considered, and the drawing track needs to cover the whole target capacitive screen as much as possible.
For example, please refer to fig. 2, which illustrates a drawing test schematic diagram for a target capacitive screen provided in the embodiment of the present application, a server may draw a line in a target capacitive screen 200 according to an elliptical track in the drawing, so as to draw a line test on a middle area of the target capacitive screen 200, so as to ensure that a main area of the target capacitive screen can be tested; and then, drawing lines in the target capacitive screen 200 according to the rice-shaped track in the figure so as to carry out line drawing test on the edge area of the target capacitive screen 200, thereby ensuring that the secondary area of the target capacitive screen can be tested. In addition, the drawing track in the drawing tool may be set in a user-defined manner, which is not described in the present embodiment.
In a possible implementation manner, after step S103, the method further includes: judging whether the test result is abnormal in the line drawing test; if the test result is the line drawing test abnormality, obtaining line drawing abnormality information corresponding to the test result, wherein the line drawing abnormality information comprises one or more of accuracy abnormality, sensitivity abnormality and point reporting abnormality; and sending the line drawing abnormality information to a user.
Specifically, if after the first test tool finishes testing a plurality of line drawing test items controlled by the IC in the target capacitive screen, any one of the line drawing test items is abnormal, the server determines that abnormal information exists in the test result, that is, the server determines that the test result is abnormal in the line drawing test, at this time, the server acquires the abnormal line drawing test item in the test result, and acquires line drawing abnormal information corresponding to the abnormal line drawing test item, where the line drawing abnormal information includes but is not limited to one or more of accuracy abnormality, sensitivity abnormality and point reporting abnormality. And the server sends each abnormal drawing test item and corresponding result data of each abnormal drawing test item to the user, namely sending the abnormal drawing information to the user.
After the server controls the touch tool to draw lines on the target capacitive screen according to the drawing track, if the lines displayed on the target capacitive screen are irregular, the server judges that the target capacitive screen is abnormal in accuracy, and the accuracy abnormality in the target capacitive screen and the abnormal point positions are used as drawing line abnormality information to be sent to a user; if the line displayed on the target capacitive screen is disconnected, the server judges that the target capacitive screen is abnormal in reporting points, and the abnormal reporting points and abnormal points in the target capacitive screen are used as line drawing abnormal information to be sent to a user.
By adopting the method, the beneficial effects which can be achieved include at least one of the following:
1. through adopting above-mentioned technical scheme, through discernment to the test operation of target capacitive screen of user to acquire the master control information of IC master control in the target capacitive screen, thereby through presetting the corresponding relation of test database master control information and first test tool, obtain the first test tool that is used for testing target capacitive screen, and through first test tool, realize the automatic test operation to target capacitive screen, and then solved only rely on the tester to carry out test operation to target capacitive screen, consuming time is higher, and the lower problem of efficiency.
2. By judging whether the version information of the testing tool corresponding to the first testing tool is the same version information as the version information of the chip in the main control information corresponding to the IC main control, when the version information of the testing tool corresponding to the first testing tool is not the same version information as the version information of the chip in the main control information corresponding to the IC main control, the first testing tool can be updated to the second testing tool by downloading the second tool on a preset website, so that the problem that incompatibility occurs due to the fact that the version is not corresponding, namely the first testing tool cannot test a target capacitive screen or cannot test part of functions in the target capacitive screen is avoided.
3. Through designing and configuring the first testing tool for the IC main control of the same scheme merchant, the IC main control can be detected more accurately, and incompatibilities occurring when other testing tools are used for detecting the IC main control of the scheme merchant can be avoided, so that testing errors are reduced.
Referring to fig. 3, a test apparatus for a target capacitive screen according to an embodiment of the present application is shown, where the apparatus is a server, and the server includes an obtaining module 31 and a processing module 32, where,
the acquiring module 31 is configured to respond to a test operation of a user on the target capacitive screen, and acquire main control information corresponding to an IC main control in the target capacitive screen, where the main control information includes chip scheme manufacturer information, model information and chip version information; and acquiring a first test tool corresponding to the main control information from a preset test database, wherein the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool.
The processing module 32 is configured to perform a test operation on the target capacitive screen through the first test tool, and obtain a test result.
In a possible implementation manner, the obtaining module 31 is configured to, after obtaining, in a preset test database, a first test tool corresponding to the master control information, the method further includes: acquiring first tool version information corresponding to a first test tool; judging whether the first tool version information is version information corresponding to the chip version information; if the first tool version information is not the version information corresponding to the chip version information, updating the first test tool to a second test tool at a preset website, wherein the second test tool corresponds to the second tool version information, and the second tool version information is the version information corresponding to the chip version information.
In one possible implementation, the first test tool is used to test the target capacitive screen corresponding to the same vendor.
In one possible implementation manner, the test operation includes a failure test and a line drawing test, and when the test operation is the failure test, the processing module 32 is configured to perform, by using a first test tool, the test operation on the target capacitive screen, specifically including: acquiring a plurality of failure test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of failure test items comprise an open circuit test, a short circuit test and a node failure test; and respectively performing test operation on the plurality of failure test items through the first test tool.
In one possible implementation manner, the processing module 32 is configured to determine, after performing a test operation on the target capacitive screen by using the first test tool and obtaining a test result, whether the test result is a failure test anomaly; if the test result is failure test abnormality, obtaining failure abnormality information corresponding to the test result, wherein the failure abnormality information comprises one or more of open-circuit abnormality, short-circuit abnormality and node failure abnormality; and sending the failure abnormal information to the user.
In one possible implementation, when the test operation is a line drawing test, the processing module 32 is configured to perform, by using a first test tool, the test operation on the target capacitive screen, and specifically includes: acquiring a plurality of drawing test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of line drawing test items comprise a precision test, a sensitivity test and a report point test; and respectively performing test operation on the plurality of line drawing test items through the first test tool.
In one possible implementation manner, the processing module 32 is configured to determine, after performing a test operation on the target capacitive screen by using the first test tool and obtaining a test result, whether the test result is a line drawing test anomaly; if the test result is the line drawing test abnormality, obtaining line drawing abnormality information corresponding to the test result, wherein the line drawing abnormality information comprises one or more of accuracy abnormality, sensitivity abnormality and point reporting abnormality; and sending the line drawing abnormality information to a user.
It should be noted that: in the device provided in the above embodiment, when implementing the functions thereof, only the division of the above functional modules is used as an example, in practical application, the above functional allocation may be implemented by different functional modules according to needs, that is, the internal structure of the device is divided into different functional modules, so as to implement all or part of the functions described above. In addition, the embodiments of the apparatus and the method provided in the foregoing embodiments belong to the same concept, and specific implementation processes of the embodiments of the method are detailed in the method embodiments, which are not repeated herein.
The application also provides electronic equipment. Referring to fig. 4, fig. 4 is a schematic structural diagram of an electronic device according to an embodiment of the present application. The electronic device may include: at least one processor 401, at least one communication bus 402, a user interface 403, at least one network interface 404, and a memory 405.
Wherein communication bus 402 is used to enable connected communications between these components.
The user interface 403 may include a Display screen (Display) and a Camera (Camera), and the optional user interface 403 may further include a standard wired interface and a standard wireless interface.
The network interface 404 may optionally include a standard wired interface, a wireless interface (e.g., WI-FI interface), among others.
Wherein the processor 401 may include one or more processing cores. The processor 401 connects the various parts within the entire server using various interfaces and lines, performs various functions of the server and processes data by executing or executing instructions, programs, code sets, or instruction sets stored in the memory 405, and invoking data stored in the memory 405. Alternatively, the processor 401 may be implemented in at least one hardware form of digital signal processing (Digital Signal Processing, DSP), field programmable gate array (Field-Programmable Gate Array, FPGA), programmable logic array (Programmable Logic Array, PLA). The processor 401 may integrate one or a combination of several of a central processing unit (Central Processing Unit, CPU), an image processor (Graphics Processing Unit, GPU), a modem, etc. The CPU mainly processes an operating system, a user interface, an application program and the like; the GPU is used for rendering and drawing the content required to be displayed by the display screen; the modem is used to handle wireless communications. It will be appreciated that the modem may not be integrated into the processor 401 and may be implemented by a single chip.
The Memory 405 may include a random access Memory (Random Access Memory, RAM) or a Read-Only Memory (Read-Only Memory). Optionally, the memory 405 includes a non-transitory computer readable medium (non-transitory computer-readable storage medium). Memory 405 may be used to store instructions, programs, code sets, or instruction sets. The memory 405 may include a stored program area and a stored data area, wherein the stored program area may store instructions for implementing an operating system, instructions for at least one function (such as a touch function, a sound playing function, an image playing function, etc.), instructions for implementing the above-described various method embodiments, etc.; the storage data area may store data or the like involved in the above respective method embodiments. The memory 405 may also optionally be at least one storage device located remotely from the aforementioned processor 401. Referring to fig. 4, an operating system, a network communication module, a user interface module, and an application program of a test method for a target capacitive screen may be included in a memory 405 as a computer storage medium.
In the electronic device shown in fig. 4, the user interface 403 is mainly used for providing an input interface for a user, and acquiring data input by the user; and the processor 401 may be used to invoke an application in the memory 405 that stores a test method for a target capacitive screen, which when executed by the one or more processors 401, causes the electronic device to perform the method as described in one or more of the embodiments above. It should be noted that, for simplicity of description, the foregoing method embodiments are all expressed as a series of action combinations, but it should be understood by those skilled in the art that the present application is not limited by the order of actions described, as some steps may be performed in other order or simultaneously in accordance with the present application. Further, those skilled in the art will also appreciate that the embodiments described in the specification are all preferred embodiments, and that the acts and modules referred to are not necessarily required in the present application.
The present application also provides a computer-readable storage medium having instructions stored thereon. When executed by one or more processors, cause an electronic device to perform the method as described in one or more of the embodiments above.
In the foregoing embodiments, the descriptions of the embodiments are emphasized, and for parts of one embodiment that are not described in detail, reference may be made to related descriptions of other embodiments.
In the several embodiments provided herein, it should be understood that the disclosed apparatus may be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, such as a division of units, merely a division of logic functions, and there may be additional divisions in actual implementation, such as multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be through some service interface, device or unit indirect coupling or communication connection, electrical or otherwise.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed over a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.
The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable memory. Based on such understanding, the technical solution of the present application may be embodied in essence or a part contributing to the prior art or all or part of the technical solution in the form of a software product stored in a memory, including several instructions for causing a computer device (which may be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the methods of the embodiments of the present application. And the aforementioned memory includes: various media capable of storing program codes, such as a U disk, a mobile hard disk, a magnetic disk or an optical disk.
The foregoing is merely exemplary embodiments of the present disclosure and is not intended to limit the scope of the present disclosure. That is, equivalent changes and modifications are contemplated by the teachings of this disclosure, which fall within the scope of the present disclosure. Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure.
This application is intended to cover any adaptations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains.
Claims (9)
1. A method of testing a target capacitive screen, the method comprising:
responding to test operation of a user on a target capacitive screen, and acquiring main control information corresponding to an IC main control in the target capacitive screen, wherein the main control information comprises chip scheme business information, model information and chip version information;
acquiring a first test tool corresponding to the main control information from a preset test database, wherein the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool;
and carrying out the test operation on the target capacitive screen through the first test tool, and obtaining a test result.
2. The method according to claim 1, wherein after the first test tool corresponding to the master control information is acquired in the preset test database, the method further comprises:
acquiring first tool version information corresponding to the first test tool;
judging whether the first tool version information is version information corresponding to the chip version information;
if the first tool version information is not the version information corresponding to the chip version information, updating the first test tool to a second test tool in a preset website, wherein the second test tool corresponds to the second tool version information, and the second tool version information is the version information corresponding to the chip version information.
3. The method of claim 1, wherein the first test tool is configured to test the target capacitive screen corresponding to the same vendor.
4. The method according to claim 1, wherein the test operation includes a failure test and a line drawing test, and when the test operation is the failure test, the test operation is performed on the target capacitive screen by the first test tool, specifically including:
acquiring a plurality of failure test items corresponding to the IC master control in the target capacitive screen according to the master control information; the failure test items comprise an open circuit test, a short circuit test and a node failure test;
and respectively performing the test operation on the failure test items through the first test tool.
5. The method of claim 1, wherein after the performing the test operation on the target capacitive screen by the first test tool and obtaining a test result, the method further comprises:
judging whether the test result is abnormal in failure test;
if the test result is the failure test abnormality, acquiring failure abnormality information corresponding to the test result, wherein the failure abnormality information comprises one or more of open-circuit abnormality, short-circuit abnormality and node failure abnormality;
and sending the failure abnormal information to the user.
6. The method according to claim 4, wherein when the test operation is the line drawing test, the performing, by the first test tool, the test operation on the target capacitive screen specifically includes:
acquiring a plurality of line drawing test items corresponding to the IC master control in the target capacitive screen according to the master control information; the plurality of line drawing test items comprise a precision test, a sensitivity test and a point report test;
and respectively carrying out the test operation on the plurality of line drawing test items through the first test tool.
7. The method of claim 1, wherein after performing the test operation on the target capacitive screen and obtaining a test result by the first test tool, the method further comprises:
judging whether the test result is abnormal in the line drawing test;
if the test result is the line drawing test abnormality, obtaining line drawing abnormality information corresponding to the test result, wherein the line drawing abnormality information comprises one or more of accuracy abnormality, sensitivity abnormality and point reporting abnormality;
and sending the line drawing abnormality information to the user.
8. A test device for a target capacitive screen, characterized in that the device comprises an acquisition module (31) and a processing module (32), wherein,
the acquisition module (31) is used for responding to the test operation of a user on a target capacitive screen and acquiring main control information corresponding to the IC main control in the target capacitive screen, wherein the main control information comprises chip scheme manufacturer information, model information and chip version information; acquiring a first test tool corresponding to the main control information from a preset test database, wherein the preset test database is used for storing the main control information, the first test tool and the corresponding relation between the main control information and the first test tool;
the processing module (32) is configured to perform the test operation on the target capacitive screen through the first test tool, and obtain a test result.
9. An electronic device, characterized in that the electronic device comprises a processor (401), a communication bus (402), a user interface (403), a network interface (404) and a memory (405), the memory (405) being for storing instructions, the user interface (403) and the network interface (404) being for communicating to other devices, the processor (401) being for executing the instructions stored in the memory (405) for causing the electronic device to perform the method according to any one of claims 1 to 7.
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