CN109959818B - Current testing method, controller and device - Google Patents
Current testing method, controller and device Download PDFInfo
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- CN109959818B CN109959818B CN201711416762.XA CN201711416762A CN109959818B CN 109959818 B CN109959818 B CN 109959818B CN 201711416762 A CN201711416762 A CN 201711416762A CN 109959818 B CN109959818 B CN 109959818B
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Abstract
The disclosure provides a current testing method, a controller and a device, and relates to the technical field of automatic testing. The current testing method comprises the following steps: synchronously measuring each power supply circuit of the tested equipment to obtain the voltage value of each power supply circuit and the power-on time sequence of the power supply circuit; under the condition that the tested equipment is shut down, the measurement power supply is conducted according to the power-on time sequence and the voltage values of the measurement power supplies of the power supply circuits; the current value of each power supply circuit is measured. By the method, the voltage and the power-on time sequence of the test power supply can be automatically set, the test power supply is switched to supply power, the current test is carried out, the automation degree and the test efficiency of the current test are improved, and meanwhile, the power supply can be carried out according to the power-on time sequence, so that the normal work of the tested equipment is prevented from being influenced.
Description
Technical Field
The disclosure relates to the technical field of automated testing, in particular to a current testing method, a controller and a device.
Background
With the development of integration and miniaturization of devices, circuit boards become an indispensable part of each terminal. Many circuit boards are provided with multiple paths of power supply circuits, so that the power supply requirements of different functional devices are met, and in the test process, the power consumption current of each power supply circuit needs to be tested and analyzed to ensure the completeness of the test.
Disclosure of Invention
The inventor finds that in the related art, the current test is mostly carried out on a single-path or multi-path external ammeter, ammeter parameters need to be preset, the test cannot be carried out simultaneously, and the automatic test is not convenient.
An object of the present disclosure is to provide a concurrent current testing method, which improves testing efficiency.
According to an aspect of the present disclosure, there is provided a current testing method, including: synchronously measuring each power supply circuit of the tested equipment to obtain the voltage value of each power supply circuit and the power-on time sequence of the power supply circuit; under the condition that the tested equipment is shut down, the measurement power supply is conducted according to the power-on time sequence and the voltage values of the measurement power supplies of the power supply circuits; the current value of each power supply circuit is measured.
Optionally, the voltage value of the measurement power supply is greater than the voltage value of the power supply circuit, and a difference between the voltage value of the measurement power supply and the voltage value of the power supply circuit is within a predetermined range.
Optionally, turning on the measurement power supply according to the power-on sequence includes: determining the conduction sequence of each power supply circuit and the measurement power supply according to the power-on time sequence; and conducting each power supply circuit and the measuring power supply according to the conducting sequence.
Optionally, the method further comprises: and under the condition that the tested equipment is started, sequentially switching each power supply circuit to use the measurement power supply to supply power according to the power-on time sequence and the voltage value of the measurement power supply of each power supply circuit.
Optionally, the method further comprises: and adjusting the measuring range of the voltage measurement according to the measurement result to improve the measurement precision.
Optionally, at least one of the voltage value, the current value or the power-on sequence of each power supply circuit is uploaded to the upper computer.
By the method, the voltage and the power-on time sequence of the test power supply can be automatically set, the test power supply is switched to supply power, the current test is carried out, the automation degree and the test efficiency of the current test are improved, and meanwhile, the power supply can be carried out according to the power-on time sequence, so that the normal work of the tested equipment is prevented from being influenced.
According to another aspect of the present disclosure, there is provided a current test controller including: a memory; and a processor coupled to the memory, the processor configured to perform any of the above current testing methods based on instructions stored in the memory.
The current test controller can automatically set the voltage and the power-on time sequence of the test power supply, then switch to the test power supply for power supply and carry out current test, so that the automation degree and the test efficiency of the current test are improved, and meanwhile, the power supply can be carried out according to the power-on time sequence, and the influence on the normal work of the tested equipment is avoided.
According to yet another aspect of the present disclosure, a computer-readable storage medium is proposed, on which computer program instructions are stored, which instructions, when executed by a processor, implement the steps of any one of the above current testing methods.
By executing the instructions on the computer-readable storage medium, the voltage and the power-on time sequence of the test power supply can be automatically set, and then the test power supply is switched to supply power for current test, so that the automation degree and the test efficiency of the current test are improved, and meanwhile, the power can be supplied according to the power-on time sequence, and the influence on the normal work of the tested equipment is avoided.
According to still another aspect of the present disclosure, there is provided a current testing apparatus including: the controllable switch unit is used for controlling the connection between the test power supply and the sampling resistor unit to be switched on and off; the test power supply is used for supplying power to the tested equipment under the condition that the switch in the controllable switch unit is closed; the sampling resistance unit is used for providing the voltage value and the power-on time sequence of each power supply circuit to the test controller under the condition that the switch in the controllable switch unit is switched off, and providing the differential voltage value at two ends of the sampling resistance unit to the test controller under the condition that the switch in the controllable switch unit is switched on; the test controller is used for acquiring the voltage value and the power-on time sequence of the power supply circuit, determining the voltage value of the measurement power supply according to the voltage value of the power supply circuit, controlling the switches in the controllable switch unit to be sequentially closed according to the power-on time sequence under the condition that the tested equipment is shut down, and determining the current value of each power supply circuit according to the differential voltage value.
Optionally, the test controller comprises: and the measurement voltage determining subunit is used for determining the voltage value of the measurement power supply according to the voltage value of the power supply circuit, wherein the voltage value of the measurement power supply is greater than the voltage value of the power supply circuit, and the difference value between the voltage value of the measurement power supply and the voltage value of the power supply circuit is within a preset range.
Optionally, the test controller comprises: and the switch control subunit is used for determining the conduction sequence of each switch in the controllable switch unit according to the power-on time sequence and controlling the switch in the controllable switch unit to be closed according to the conduction sequence.
Optionally, the test controller is further configured to, in a case where the device under test operates, sequentially switch each power supply circuit to supply power using the measurement power supply according to the power-on timing and the voltage value of the measurement power supply of each power supply circuit.
Optionally, the test controller is further configured to adjust a span of the voltage measurement according to the measurement result to improve measurement accuracy.
Optionally, the test controller is further configured to upload at least one of a voltage value, a current value, or a power-on sequence of each power supply circuit to the upper computer.
Optionally, the method further comprises: and the amplifier is positioned between the sampling resistance unit and the test controller and is used for amplifying the voltage value from the sampling resistance unit.
The current testing device can automatically set the voltage and the power-on time sequence of the testing power supply, further switch to the testing power supply to supply power, and perform current testing, so that the automation degree and the testing efficiency of the current testing are improved, and meanwhile, the power can be supplied according to the power-on time sequence, and the influence on the normal work of the tested equipment is avoided.
Drawings
The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this disclosure, illustrate embodiments of the disclosure and together with the description serve to explain the disclosure and not to limit the disclosure. In the drawings:
FIG. 1 is a flow chart of one embodiment of a current testing method of the present disclosure.
Fig. 2 is a flow chart of another embodiment of a current testing method of the present disclosure.
FIG. 3 is a schematic diagram of one embodiment of a current test controller of the present disclosure.
Fig. 4 is a schematic diagram of another embodiment of a current test controller of the present disclosure.
FIG. 5 is a schematic diagram of one embodiment of a current testing apparatus of the present disclosure.
FIG. 6 is a schematic diagram of one embodiment of a usage scenario of the current testing apparatus of the present disclosure.
Detailed Description
The technical solution of the present disclosure is further described in detail by the accompanying drawings and examples.
A flow chart of one embodiment of the current testing method of the present disclosure is shown in fig. 1.
In step 101, each power supply circuit of the device under test is synchronously measured, and a voltage value of each power supply circuit and a power-on time sequence of the power supply circuit are obtained.
In step 102, in the case that the device under test is turned off, the measurement power supply is turned on according to the power-on sequence and the voltage values of the measurement power supplies of the respective power supply circuits.
In step 103, the current value of each power supply circuit is measured. In one embodiment, the voltage difference between two ends of a high-precision sampling resistor connected in series between a measurement power supply and the device to be tested can be measured, and then the current value of the power supply circuit can be calculated.
By the method, the voltage and the power-on time sequence of the test power supply can be automatically set, the test power supply is switched to supply power, the current test is carried out, the automation degree and the test efficiency of the current test are improved, and meanwhile, the power supply can be carried out according to the power-on time sequence, so that the normal work of the tested equipment is prevented from being influenced. In addition, the current change time point and the change magnitude caused before and after the program is adjusted can be roughly seen through the current in the multipoint simultaneous measurement, and the data analysis is favorably carried out.
Different power supply circuits of the circuit board have certain power-on time sequences, and abnormal driving and even starting up cannot be caused if the time sequences are not correct, so that automatic testing is inconvenient. By the method in the embodiment, the normal power-on time sequence of the circuit board can be acquired, and power is supplied according to the time sequence, so that the normal working state of the circuit board is ensured, meanwhile, the centralized external power supply can be used for supplying power without an external ammeter, the expenditure is saved, the manual parameter setting is not needed, the influence of human factors is reduced, and the accuracy is improved. In addition, the measurement of the power-on time sequence can provide richer information for data analysis, and the accuracy of the data analysis is improved.
In one embodiment, the voltage value of the measurement power supply of each power supply circuit is slightly higher than the measured voltage value of the power supply circuit, so that the requirement of the device to be tested can still be met when the measurement power supply is the supply voltage of the device to be tested after high-precision resistance voltage division.
In one embodiment, in the state of the device to be tested in the power-on operation, the power supply can be switched to the measurement power supply to supply power according to the determined voltage value of the measurement power supply. By the method, the normal working state of the equipment can be measured, and the accuracy of measurement is improved.
In one embodiment, in the state of the device to be tested being powered on and running, the switching sequence of each power supply circuit to the power supply using the measurement power supply also needs to satisfy the measured power-on sequence, thereby further ensuring the stable operation of the device.
In one embodiment, any content of the measured voltage value, the measured current value or the measured power-on time sequence including the power supply circuit can be uploaded to the upper computer, so that the upper computer can perform analysis processing, the recording and analysis of measured data are facilitated, and the automation degree and the efficiency of the test are further improved.
A flow chart of another embodiment of the current testing method of the present disclosure is shown in fig. 2.
In step 201, each power supply circuit of the device under test is synchronously measured, and a voltage value of each power supply circuit and a power-on time sequence of the power supply circuit are obtained.
In step 202, the conducting sequence of each power supply circuit and the measurement power supply is determined according to the power-on sequence.
In step 203, the power supply circuits and the measurement power supply are turned on in turn.
In step 204, the voltage across the sampling resistor is output. In one embodiment, the minimum measurement range may be preferred by default for measurements.
In step 205, the sampled voltage is amplified by an amplifier.
In step 206, whether the currently adopted measuring range (sampling resistance value) is appropriate is judged according to the differential voltage measurement result, and if not, step 207 is executed; if so, go to step 207. In one embodiment, the measurement result may be compared with a predetermined interval, and if the measurement result is lower than the predetermined interval, it is determined that the measurement range is larger; and if the measurement result is higher than the preset interval, determining that the measuring range is smaller.
In step 207, a current value of the power supply circuit is determined. In one embodiment, if the sampling resistor is R, the voltage difference between both ends of the resistor is Δ V, and the amplification factor of the amplifier is G, I is Δ V/(GR).
In step 208, the amplification factor is adjusted. If the measurement result is smaller, the amplification factor is increased, and if the measurement result is larger, the amplification factor is decreased. In one embodiment, the amplification factor may be adjusted multiple times according to the measurement result after the amplification factor is adjusted so that the measurement result falls within the predetermined interval until the adjustment is not possible or the target is reached without adjustment, and step 209 is performed.
In step 209, it is again determined whether the span is appropriate. If so, go to step 207; if it is still not appropriate, step 210 is performed.
In step 210, the resistance of the sampling resistor employed is adjusted. In one embodiment, the closed switches in the controllable switching unit may be switched, thereby switching the sampling resistors used. Step 204 is then performed. In one embodiment, if the measurement result is smaller, the resistance value of the sampling resistor is reduced; and if the measurement result is larger, the resistance value of the used sampling resistor is improved.
In step 211, the measured current calculated in step 207 is sent to an upper computer for processing.
By the method, the voltage measurement range can be adjusted by two modes of adjusting the amplification factor of the amplifier and the resistance value of the sampling resistor in the measurement process, so that the accuracy of power supply current calculation is improved.
A schematic structural diagram of an embodiment of the current test controller of the present disclosure is shown in fig. 3. The current test controller comprises a memory 301 and a processor 302. Wherein: the memory 301 may be a magnetic disk, flash memory, or any other non-volatile storage medium. The memory is for storing instructions in the corresponding embodiments of the current test method above. Processor 302 is coupled to memory 301 and may be implemented as one or more integrated circuits, such as a microprocessor or microcontroller. The processor 302 is configured to execute instructions stored in the memory, and can improve the automation degree and the testing efficiency of the current test, and simultaneously, can supply power according to the power-on sequence, thereby avoiding affecting the normal operation of the device under test.
In one embodiment, as also shown in FIG. 4, the current test controller 400 includes a memory 401 and a processor 402. Processor 402 is coupled to memory 401 by a BUS 403. The current test controller 400 may also be coupled to an external storage device 405 via a storage interface 404 for invoking external data, and may also be coupled to a network or another computer system (not shown) via a network interface 406. And will not be described in detail herein.
In the embodiment, the data instruction is stored in the memory, and the instruction is processed by the processor, so that the automation degree and the test efficiency of the current test can be improved, power can be supplied according to the power-on time sequence, and the influence on the normal work of the tested equipment is avoided.
In another embodiment, a computer readable storage medium has stored thereon computer program instructions which, when executed by a processor, implement the steps of the method in the corresponding embodiment of the current testing method. As will be appreciated by one skilled in the art, embodiments of the present disclosure may be provided as a method, apparatus, or computer program product. Accordingly, the present disclosure may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present disclosure may take the form of a computer program product embodied on one or more computer-usable non-transitory storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
A schematic diagram of one embodiment of the current testing apparatus of the present disclosure is shown in fig. 5. The controllable switch unit 501 is located between the test power supply 502 and the sampling resistance unit 503, the sampling resistance unit 503 is connected with the measurement point of the device under test, and the test controller 504 is connected with each part of the apparatus and executes the control function.
The controllable switch unit 501 can control the connection between the test power supply and the sampling resistor unit. The test power supply 502 is capable of supplying power to the device under test with the switches in the controllable switching unit closed. The sampling resistance unit 503 is capable of providing the test controller with the voltage values and power-on timing of the respective power supply circuits in case the switch in the controllable switch unit is open, and with the differential voltage values across the sampling resistance unit in case the switch in the controllable switch unit is closed. The test controller 504 can obtain the voltage value and the power-on sequence of the power supply circuit, determine the voltage value of the measurement power supply according to the voltage value of the power supply circuit, control the switches in the controllable switch unit to be sequentially closed according to the power-on sequence under the condition that the device to be tested is turned off, and determine the current value of each power supply circuit according to the differential voltage value.
The current testing device can automatically set the voltage and the power-on time sequence of the testing power supply, further switch to the testing power supply to supply power, and perform current testing, so that the automation degree and the testing efficiency of the current testing are improved, and meanwhile, the power can be supplied according to the power-on time sequence, and the influence on the normal work of the tested equipment is avoided.
In one embodiment, the test controller comprises a measurement voltage determining subunit capable of determining a voltage value of the measurement power supply according to the voltage value of the power supply circuit, and then the test controller controls the measurement power supply to perform external power supply on the power supply circuit of the device to be tested. The voltage value of the measuring power supply is slightly higher than the measured voltage value of the supply circuit. The current measuring device adopts a centralized external power supply, can supply power without an external ammeter, saves expenditure, does not need to manually set parameters, reduces the influence of human factors, and improves the accuracy.
In one embodiment, the test controller includes a switch control subunit, which is capable of determining a conducting sequence of each switch in the controllable switch unit according to the power-on timing sequence, and controlling the switches in the controllable switch unit to close according to the conducting sequence, so as to ensure stable operation of the device.
In one embodiment, an amplifier can be further included between the test controller and the sampling resistor unit, and the voltage across the sampling resistor can be subjected to a method, so that the requirement on the measurement precision of the test controller is reduced, and the accuracy of voltage measurement is improved.
A schematic diagram of one embodiment of a usage scenario for a current testing device of the present disclosure is shown in fig. 6. The device under test 60 includes a plurality of power supply circuits, and voltage values VCC1 to VCCn, respectively. The test controller 62 obtains and records the voltage value and the power-on time sequence of the power supply circuit by measuring the voltage of the end, close to the device under test 60, of the sampling resistor units 641-64 n.
The test controller 62 sets the power supply sequence and the power supply voltage of the different ports of the test power supply 61 so that the output voltage of each path to the power supply circuit is slightly higher than the measured voltage value of the power supply circuit. In one embodiment, the test power supply 61 may be a programmable power supply that is programmable to adjust the output voltage based on the voltage value from the test controller 62.
The test controller 62 controls the conduction sequence of the controllable switch units 631 to 63n according to the power-on sequence. Further, the voltages at the two ends of each sampling resistor unit 641-64 n are measured. The voltages at the two ends of the sampling resistor units 641-64 n can be amplified by the amplifier 65 and then reach the test controller. In one embodiment, the sampling resistor unit may be a high precision sampling resistor unit and amplifier 65 may be a programmable precision instrumentation amplifier. The test controller 62 can adjust the amplification factor of the amplifier according to the voltage measurement result, or switch the sampling resistor to be used by switching the closed switch in the controllable switch unit, thereby adjusting the voltage measurement range and improving the current measurement precision.
After obtaining the current values of the various paths, the test controller 62 may report the current values to the upper computer, and the upper computer performs display and data processing.
The current testing device can integrate power supply voltage measurement, power-on time sequence measurement, external irrigation voltage configuration and current measurement, and automatically set and switch, so that the automation degree and the testing efficiency of measurement are improved, the manpower requirement is reduced, and the testing cost is reduced.
The present disclosure is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the disclosure. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
Thus far, the present disclosure has been described in detail. Some details that are well known in the art have not been described in order to avoid obscuring the concepts of the present disclosure. It will be fully apparent to those skilled in the art from the foregoing description how to practice the presently disclosed embodiments.
The methods and apparatus of the present disclosure may be implemented in a number of ways. For example, the methods and apparatus of the present disclosure may be implemented by software, hardware, firmware, or any combination of software, hardware, and firmware. The above-described order for the steps of the method is for illustration only, and the steps of the method of the present disclosure are not limited to the order specifically described above unless specifically stated otherwise. Further, in some embodiments, the present disclosure may also be embodied as programs recorded in a recording medium, the programs including machine-readable instructions for implementing the methods according to the present disclosure. Thus, the present disclosure also covers a recording medium storing a program for executing the method according to the present disclosure.
Finally, it should be noted that: the above examples are intended only to illustrate the technical solutions of the present disclosure and not to limit them; although the present disclosure has been described in detail with reference to preferred embodiments, those of ordinary skill in the art will understand that: modifications to the specific embodiments of the disclosure or equivalent substitutions for parts of the technical features may still be made; all such modifications are intended to be included within the scope of the claims of this disclosure without departing from the spirit thereof.
Claims (10)
1. A current testing method, comprising:
synchronously measuring each power supply circuit of the tested equipment to obtain the voltage value of each power supply circuit and the power-on time sequence of the power supply circuit;
determining a voltage value of the measurement power supply from the voltage value of the supply circuit,
under the condition that the tested equipment is shut down, the measurement power supply is conducted according to the power-on time sequence and the voltage value of the measurement power supply of each power supply circuit;
under the condition that the tested device is started, sequentially switching each power supply circuit to use the measurement power supply for power supply according to the power-on time sequence and the voltage value of the measurement power supply of each power supply circuit;
measuring a current value of each of the power supply circuits;
according to the measuring result of the voltage at the two ends of the sampling resistor, the measuring range of the voltage measurement is adjusted to improve the measuring precision, and the method comprises the following steps: and adjusting the amplification coefficient of an amplifier for amplifying the voltage at the two ends of the sampling resistor.
2. The method of claim 1, wherein the voltage value of the measurement power supply is greater than the voltage value of the power supply circuit, and the difference between the voltage value of the measurement power supply and the voltage value of the power supply circuit is within a predetermined range.
3. The method of claim 1 or 2, wherein said turning on the measurement power supply at the power-up timing comprises:
determining the conduction sequence of each power supply circuit and the measurement power supply according to the power-on time sequence;
and conducting each power supply circuit and the measuring power supply according to the conducting sequence.
4. The method of claim 1 or 2, further comprising:
and uploading at least one of the voltage value, the current value or the power-on time sequence of each power supply circuit to an upper computer.
5. A current test controller comprising:
a memory; and
a processor coupled to the memory, the processor configured to perform the method of any of claims 1-4 based on instructions stored in the memory.
6. A computer readable storage medium having stored thereon computer program instructions which, when executed by a processor, implement the steps of the method of any one of claims 1 to 4.
7. A current testing device comprising:
the controllable switch unit is used for controlling the connection between the test power supply and the sampling resistor unit to be switched on and off;
the test power supply is used for supplying power to the tested equipment under the condition that the switch in the controllable switch unit is closed;
the sampling resistance unit is used for providing the voltage value and the power-on time sequence of each power supply circuit to the test controller under the condition that the switch in the controllable switch unit is switched off, and providing the differential voltage value at two ends of the sampling resistance unit to the test controller under the condition that the switch in the controllable switch unit is switched on;
a test controller to:
acquiring a voltage value and a power-on time sequence of a power supply circuit, determining the voltage value of a measurement power supply according to the voltage value of the power supply circuit, controlling switches in the controllable switch unit to be sequentially closed according to the power-on time sequence under the condition that the equipment to be tested is turned off, and determining the current value of each power supply circuit according to the differential voltage value;
under the condition that the tested equipment works, sequentially switching each power supply circuit to use the measurement power supply for power supply according to the power-on time sequence and the voltage value of the measurement power supply of each power supply circuit; and
according to the measuring result of the voltage at the two ends of the sampling resistor, the measuring range of the voltage measurement is adjusted to improve the measuring precision, and the method comprises the following steps: adjusting the amplification factor of the amplifier;
and
the amplifier is positioned between the sampling resistance unit and the test controller and used for amplifying the voltage value from the sampling resistance unit.
8. The apparatus of claim 7, wherein the test controller comprises: and the measurement voltage determining subunit is used for determining the voltage value of the measurement power supply according to the voltage value of the power supply circuit, wherein the voltage value of the measurement power supply is greater than the voltage value of the power supply circuit, and the difference value between the voltage value of the measurement power supply and the voltage value of the power supply circuit is within a preset range.
9. The apparatus of claim 7 or 8, wherein the test controller comprises:
and the switch control subunit is used for determining the conduction sequence of each switch in the controllable switch unit according to the power-on time sequence and controlling the switch in the controllable switch unit to be closed according to the conduction sequence.
10. The apparatus of claim 7 or 8, wherein the test controller is further to:
and uploading at least one of the voltage value, the current value or the power-on time sequence of each power supply circuit to an upper computer.
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| GB2336217B (en) * | 1997-12-02 | 2002-06-19 | Advantest Corp | Method of measuring current while applying a voltage and apparatus therefor |
| CN100347552C (en) * | 2005-01-07 | 2007-11-07 | 清华大学 | Transient current measuring method and system for IC chip |
| CN101452017B (en) * | 2007-11-30 | 2011-10-26 | 英业达股份有限公司 | Full automatic over current protection test system and method |
| CN203164253U (en) * | 2013-02-21 | 2013-08-28 | 深圳市江波龙电子有限公司 | Electrical parameter testing apparatus |
| CN105067928B (en) * | 2015-08-11 | 2018-01-30 | 惠州华阳通用电子有限公司 | A kind of automobile electronics dark current automated testing method and device |
| CN106526286B (en) * | 2016-11-11 | 2019-07-26 | 广州极飞科技有限公司 | Current detection circuit, method and battery system |
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