CN109884185B - Automatic testing system and testing method for angle of special ultrasonic probe for wheel axle detection - Google Patents
Automatic testing system and testing method for angle of special ultrasonic probe for wheel axle detection Download PDFInfo
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Abstract
The invention discloses an automatic angle testing system of an ultrasonic probe special for wheel axle detection, which comprises an FPGA module, an ultrasonic transmitting module, an ultrasonic receiving module, a signal conditioning module and an AD sampling module、The device comprises a gate position control module, a gate width control module, an MCU module and a human-computer interface module; the ultrasonic emission module is connected with the probe, the ultrasonic receiving module is connected with the probe, the signal conditioning module is connected with the ultrasonic receiving module, the AD sampling module is connected with the signal conditioning module, the FPGA module is connected with the ultrasonic emission module and the AD sampling module, the gate position control module and the gate width control module are respectively connected with the FPGA module, the MCU module is connected with the FPGA module, and the human-computer interface module is connected with the MCU module. The invention has high accuracy of test result and reduces the influence of human factors on test data.
Description
Technical Field
The invention relates to a system and a method for automatically testing the angle of a probe, in particular to a system and a method for automatically testing the angle of an ultrasonic probe special for wheel axle detection.
Background
Railway transportation is an important component of national economy, and the safety of railway transportation is very important. The regular detection of the truck axles plays an important role in ensuring the railway driving safety. The ultrasonic flaw detection has the advantages of high sensitivity, strong penetration speed, good sound beam directivity, high defect detection rate, no harm to human bodies and the like, and becomes a main method for detecting the railway wheel axle. The ultrasonic probe is used as an ultrasonic wave transmitting and echo receiving device and is an important component of the whole detection system. The performance of the ultrasonic flaw detector directly influences the accuracy of ultrasonic flaw detection, and is one of the keys for ensuring the flaw detection quality. During the use of the probe, the angle of the probe changes due to the abrasion of the wafer. The user continues to use under the unknown condition, easily causes the defect location inaccurate to cause erroneous judgement. Therefore, before flaw detection, daily check is carried out, the angle and the zero point of the probe are measured, and the accuracy of the flaw detection result is ensured.
When the shaft end detects the defect at the root of the shaft neck, the moving range of the probe is restricted, and the small-angle longitudinal wave probe is generally adopted for detecting the defect. When testing the angle, the tester needs one hand to stabilize the probe after finding the highest echo of the edge angle of the TZS-R test block, and the other hand measures the distance from the probe to the front end of the test block. The measured data also needs to be recorded and calculated, so that the time for testing one probe is long, and the working efficiency is low.
When the wheel is detected, in order to make the probe closely fit with the wheel tread, the contact surface of the oblique probe is generally provided with a curved surface with a certain curvature. Inspection of loader [2000 ]]Document No. 335 specifies: and detecting an R100 arc surface on the LG-R test block, moving the probe back and forth and keeping the probe parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest, wherein the position of the probe corresponding to the center of the R100 arc surface is the incident point of the probe. According to the size of the probe angle, detecting the middle of the LG-R test block with the depth of 20rm or 30rm
And the transverse through hole moves the probe back and forth and keeps the probe parallel to the side surface of the test block until the reflection wave of the transverse through hole is the highest, and the scale value on the test block corresponding to the incident point of the probe is the refraction angle of the probe.
Due to different operation methods of testers, the inaccuracy of the marked incidence point leads to inaccurate tested angle value and poor consistency. And the operation is inconvenient, the testing time is long, the labor intensity is high, the testing efficiency is low, and the artificial influence factor is large.
Disclosure of Invention
The invention aims to solve the technical problem of providing an automatic angle testing system and method of an ultrasonic probe special for wheel axle detection, which have high accuracy of a test result and reduce the influence of human factors on test data.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows:
the utility model provides a special ultrasonic probe angle automatic test system of wheel spindle detection which characterized in that: the system comprises an FPGA module, an ultrasonic transmitting module, an ultrasonic receiving module, a signal conditioning module, an AD sampling module, a gate position control module, a gate width control module, an MCU module and a human-computer interface module;
the ultrasonic transmitting module is connected with the probe and used for transmitting ultrasonic waves;
the ultrasonic receiving module is connected with the probe and used for receiving ultrasonic echoes;
the signal conditioning module is connected with the ultrasonic receiving module and is used for amplifying the received ultrasonic echo;
the AD sampling module is connected with the signal conditioning module and used for converting the analog signal into a digital signal;
the FPGA module is connected with the ultrasonic transmitting module and the AD sampling module and is used for data sampling, most value searching, data buffering, data compression and data storage control;
the gate position control module and the gate width control module are respectively connected with the FPGA module and used for working together with the maximum value searching module in the FPGA module to determine the index of the highest echo in the sampling point sequence, so that the transmission time is determined;
the MCU module is connected with the FPGA module and used for controlling the whole system;
the human-computer interface module is connected with the MCU module and used for carrying out human-computer conversation, checking waveforms, setting parameters and carrying out key operation.
Further, the human-machine interface module comprises a keyboard and a display.
A test method of an automatic angle test system of an ultrasonic probe special for wheel axle detection is characterized by comprising the following steps:
the method comprises the following steps: a user sets system parameters through a man-machine interface module to complete circuit initialization;
step two: carrying out small-angle probe angle test;
the probe is arranged on the B surface of the TZ-R test block, and when the lower corner echo of the A surface in the gate is the highest, the system automatically calculates and records the current time value by pressing a confirmation key;
the probe is arranged on the surface B of the TZ-R test block, and when the corner echo on the surface A in the gate is highest, the zero point of the probe is automatically calculated by pressing a confirmation key system;
step three: carrying out angle test on the inclined probe;
the probe is placed on the LG-R test block to detect the R100 arc surface, the probe is moved back and forth and kept parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest, and a confirmation key is pressed to automatically calculate the zero point of the probe by a system; the probe is placed on the wheel tread, when the echo of the artificial hole in the gate is highest, the confirmation key is pressed, and the system automatically calculates the angle value and displays the result.
Further, the first step is specifically that after the system is powered on, a user sets system parameters through the human-computer interface module and transmits the system parameters to the MCU control module through the communication interface, and the MCU control module transmits the parameters to the FPGA module to complete circuit initialization.
Further, the system parameters comprise the width of the gate, the position of the gate, the sound velocity C in the test block, the sampling sound path and the compression ratio of the sampling point.
Further, in the second step, the first step,
when the small-angle incidence angle is 9-12 degrees, the system program automatically calculates the angle value and displays the result;
when the small-angle incident angle is 6-8 degrees, the probe is placed on the C surface of the TZ-R test block, the confirmation key is pressed when the edge angle echo on the A surface in the gate is highest, and the system program automatically calculates the angle value and displays the result.
Further, the specific process of the echo peak confirmation is
After sampling is started, the counter starts to work and starts to count from zero, and the value of the counter is added by 1 at each sampling point;
from the time of the gate position, the current value after AD conversion is sent to the a [7:0] end and the b [7:0] end of the comparator for size comparison; b [7:0] end data is provided by the output end of the most significant register, and the maximum value collected in the gate width range is reserved in the most significant register;
the loading process of the most valued register in the system is controlled by a Signal 1; signal1 indicates that the comparator is greater than the output Signal, which means that the current input AD digital semaphore is greater than the value in the most significant register, and this Signal will make the most significant register load the current new value into the most significant register, and update the value in the most significant register;
the loading process of the most-valued index register is controlled by a Signal2, the AD digital semaphore input currently is larger than the value in the most-valued register, the current value of the counter is loaded into the most-valued index register by the Signal, and the value of the most-valued index register is updated;
after the gate width time, the counter and the comparator stop working; the system obtains a value MaxIndex in a most valued index register, namely the position of the maximum amplitude, the sampling frequency of an AD sampling module is 100MHz/8bit, each point is sampled at an interval of 10ns, and the transmission time of ultrasonic waves from emission to a defect is as follows: 10 xMaxIndex/1000 mus, and storing the sample in a memory for calculation;
after the echo signals are collected, the FPGA module compresses the data sampled by the AD sampling module and stores the data into an FIFO buffer area, and finally the data are read out by the MCU module and sent to a display for display. When the screen has the highest echo, the MCU module acquires a confirmation command given by a user through a keyboard in the man-machine interface module, and calls a program to automatically calculate the angle value.
Further, the specific process of the angle test of the small-angle probe in the second step is
The probe is arranged on the B surface of the TZ-R test block, and when the echo of the lower edge angle of the A surface is highest, the propagation time from emission to the lower edge angle of the A surface is t1；
The probe is arranged on the B surface of the TZ-R test block, and when the edge angle echo on the A surface is highest, the propagation time from the emission to the edge angle on the A surface is t2；
The time T of the transmission of the ultrasonic wave in the probe wafer is obtained to be 2 Xt1-t2；
When the small angle incidence angle is between 9 and 12 degrees, the formula is obtained
When the small-angle incidence angle is 6-8 degrees, the probe is arranged on the C surface of the TZ-R test block, and when the edge angle echo on the A surface is highest, the propagation time from the emission to the edge angle on the A surface is t3To obtain a formula
Wherein: theta is the refraction angle of the probe, and C is the propagation speed of the ultrasonic wave in the test block.
Further, the specific process of the step three-oblique probe angle test is
The probe is arranged on the LG-R test block to detect the R100 arc surface, the probe is moved back and forth and is kept parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest value, and the time from transmitting to the arc surface is t4；
The time T of transmission of ultrasonic wave in the probe wafer is T4-100/C×1000；
The probe is arranged on the wheel tread, the ultrasonic wave can generate echo when meeting the artificial hole, and the transmission time from the emission to the artificial hole is t5；
Setting the radius of a wheel to be R, the artificial aperture to be R, the refraction angle of a probe to be theta, and the sound velocity of ultrasonic waves in a workpiece to be C, establishing a mathematical model, and obtaining AO by cosine law in a triangular OAB formed by an incident point A of the probe, a central point O of the wheel and a central point B of the artificial aperture2+AB2-2×AB×AO×cosθ＝BO2，
Determining θ ═ arccos ((AO)2+AB2-BO2)/(2×AB×AO))
Wherein, theta is a refraction angle of the probe, C is a sound velocity of the ultrasonic wave propagating in the test block, AO is R, AB is Cx (t)5-T)/1000+r，BO＝R-(h+r)。
Compared with the prior art, the invention has the following advantages and effects: the method has the advantages of simple operation, short test time and high test result accuracy, and reduces the influence of human factors on test data; the testing time is saved, and the working efficiency is greatly improved; the tester only needs to strictly follow the test steps, and the system program automatically calculates the result.
Drawings
Fig. 1 is a schematic diagram of an automatic angle testing system of an ultrasonic probe special for wheel axle detection.
FIG. 2 is a schematic diagram of the test of the B-side of the TZ-R test block according to the embodiment of the present invention when the A-side lower edge angle echo is highest.
FIG. 3 is a schematic diagram of the test of the B-plane of the TZ-R test block according to the embodiment of the present invention when the peak echo of the A-plane is highest.
FIG. 4 is a schematic diagram of the test block TZ-R of the embodiment of the present invention showing the highest corner echo on the A-plane during the C-plane test.
FIG. 5 is a schematic diagram of a tilt probe angle test of an embodiment of the present invention.
Fig. 6 is a flow chart of an echo peak acknowledge signal of an embodiment of the present invention.
Detailed Description
The present invention is further illustrated by the following examples, which are illustrative of the present invention and are not to be construed as being limited thereto.
As shown in fig. 1, the automatic angle testing system for the ultrasonic probe special for wheel axle detection of the present invention includes an FPGA module, an ultrasonic transmitting module, an ultrasonic receiving module, a signal conditioning module, an AD sampling module, a gate position control module, a gate width control module, an MCU module and a human-machine interface module.
The ultrasonic transmitting module is connected with the probe and used for transmitting ultrasonic waves;
the ultrasonic receiving module is connected with the probe and used for receiving ultrasonic echoes;
the signal conditioning module is connected with the ultrasonic receiving module and is used for amplifying the received ultrasonic echo;
the AD sampling module is connected with the signal conditioning module and used for converting the analog signal into a digital signal;
the FPGA module is connected with the ultrasonic transmitting module and the AD sampling module and is used for data sampling, most value searching, data buffering, data compression and data storage control;
the gate position control module and the gate width control module are respectively connected with the FPGA module and used for working together with the maximum value searching module in the FPGA module to determine the index of the highest echo in the sampling point sequence, so that the transmission time is determined;
the MCU module is connected with the FPGA module and used for controlling the whole system;
the human-computer interface module is connected with the MCU module and used for carrying out human-computer conversation, checking waveforms, setting parameters and carrying out key operation. The human-machine interface module comprises a keyboard and a display.
After the system is electrified and initialized, the MCU module controls the FPGA module to send an excitation signal to the ultrasonic transmitting module at a certain frequency, the ultrasonic transmitting module drives the transducer, and the ultrasonic transducer converts the received electric signal into mechanical energy and sends an ultrasonic signal. After ultrasonic signals enter a workpiece through a coupling agent and are subjected to artificial defects, the ultrasonic probe converts received echo signals into electric energy to generate voltage signals, and after the electric energy is amplified and conditioned through the ultrasonic receiving module and the signal conditioning module, the FPGA module controls the AD sampling module to sample and convert analog signals into digital signals.
A test method of an automatic angle test system of an ultrasonic probe special for wheel axle detection comprises the following steps:
the method comprises the following steps: a user sets system parameters through the man-machine interface module and transmits the system parameters to the MCU control module through the communication interface, and the MCU control module transmits the parameters to the FPGA module to complete the initialization of the circuit. The system parameters comprise the width of the gate, the position of the gate, the sound velocity C in the test block, the sampling sound path and the compression ratio of the sampling point.
Step two: carrying out small-angle probe angle test;
the probe is arranged on the B surface of the TZ-R test block, and when the lower corner echo of the A surface in the gate is the highest, the system automatically calculates and records the current time value by pressing a confirmation key;
the probe is arranged on the surface B of the TZ-R test block, and when the corner echo on the surface A in the gate is highest, the zero point of the probe is automatically calculated by pressing a confirmation key system;
when the small-angle incidence angle is 9-12 degrees, the system program automatically calculates the angle value and displays the result;
when the small-angle incident angle is 6-8 degrees, the probe is placed on the C surface of the TZ-R test block, the confirmation key is pressed when the edge angle echo on the A surface in the gate is highest, and the system program automatically calculates the angle value and displays the result.
The procedure of the system small angle probe angle test is as follows:
the probe is arranged on the B surface of the TZ-R test block, and when the echo of the lower edge angle of the A surface is highest, the propagation time from emission to the lower edge angle of the A surface is t1；
The probe is arranged on the B surface of the TZ-R test block, and when the edge angle echo on the A surface is highest, the propagation time from the emission to the edge angle on the A surface is t2；
The time T of the transmission of the ultrasonic wave in the probe wafer is obtained to be 2 Xt1-t2；
When the small angle incidence angle is between 9 and 12 degrees, the formula is obtained
When the small-angle incidence angle is 6-8 degrees, the probe is arranged on the C surface of the TZ-R test block, and when the edge angle echo on the A surface is highest, the propagation time from the emission to the edge angle on the A surface is t3To obtain a formula
Wherein: theta is the refraction angle of the probe, and C is the propagation speed of the ultrasonic wave in the test block.
Step three: carrying out angle test on the inclined probe;
the probe is placed on the LG-R test block to detect the R100 arc surface, the probe is moved back and forth and kept parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest, and a confirmation key is pressed to automatically calculate the zero point of the probe by a system; when the probe is placed on the wheel tread and the echo of the artificial hole in the gate is highest, the system can automatically calculate the angle value according to the program which is programmed in advance and stored in the memory and display the result by pressing the enter key.
The process of the angle test program of the system angle probe comprises the following steps:
the probe is arranged on the LG-R test block to detect the R100 arc surface, the probe is moved back and forth and is kept parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest value, and the time from transmitting to the arc surface is t4；
The time T of transmission of ultrasonic wave in the probe wafer is T4-100/C×1000；
The probe is arranged on the wheel tread, the ultrasonic wave can generate echo when meeting the artificial hole, and the transmission time from the emission to the artificial hole is t5；
Setting the radius of a wheel to be R, the artificial aperture to be R, the refraction angle of a probe to be theta, and the sound velocity of ultrasonic waves in a workpiece to be C, establishing a mathematical model, and obtaining AO by cosine law in a triangular OAB formed by an incident point A of the probe, a central point O of the wheel and a central point B of the artificial aperture2+AB2-2×AB×AO×cosθ＝BO2，
Determining θ ═ arccos ((AO)2+AB2-BO2)/(2×AB×AO))
Wherein, theta is a refraction angle of the probe, C is a sound velocity of the ultrasonic wave propagating in the test block, AO is R, AB is Cx (t)5-T)/1000+r，BO＝R-(h+r)。
Among the above procedures, the specific procedure for the highest echo confirmation is
As shown in fig. 6, after sampling is started, the counter starts to operate and starts counting from zero, and the counter value is increased by 1 for each sampling point;
from the time of the gate position, the current value after AD conversion is sent to the a [7:0] end and the b [7:0] end of the comparator for size comparison; b [7:0] end data is provided by the output end of the most significant register, and the maximum value collected in the gate width range is reserved in the most significant register;
the loading process of the most valued register in the system is controlled by a Signal 1; signal1 indicates that the comparator is greater than the output Signal, which means that the current input AD digital semaphore is greater than the value in the most significant register, and this Signal will make the most significant register load the current new value into the most significant register, and update the value in the most significant register;
the loading process of the most-valued index register is controlled by a Signal2, the AD digital semaphore input currently is larger than the value in the most-valued register, the current value of the counter is loaded into the most-valued index register by the Signal, and the value of the most-valued index register is updated;
after the gate width time, the counter and the comparator stop working; the system obtains a value MaxIndex in a most valued index register, namely the position of the maximum amplitude, the sampling frequency of an AD sampling module is 100MHz/8bit, each point is sampled at an interval of 10ns, and the transmission time of ultrasonic waves from emission to a defect is as follows: 10 xMaxIndex/1000 mus, and storing the sample in a memory for calculation;
after the echo signals are collected, the FPGA module compresses the data sampled by the AD sampling module and stores the data into an FIFO buffer area, and finally the data are read out by the MCU module and sent to a display for display. When the screen has the highest echo, the MCU module acquires a confirmation command given by a user through a keyboard in the man-machine interface module, and calls a program to automatically calculate the angle value.
The method has the advantages of simple operation, short test time and high test result accuracy, and reduces the influence of human factors on test data; the testing time is saved, and the working efficiency is greatly improved; the tester only needs to strictly follow the test steps, and the system program automatically calculates the result.
The above description of the present invention is intended to be illustrative. Various modifications, additions and substitutions for the specific embodiments described may be made by those skilled in the art without departing from the scope of the invention as defined in the accompanying claims.
Claims (4)
1. A test method of an automatic angle test system of an ultrasonic probe special for wheel axle detection comprises an FPGA module, an ultrasonic transmitting module, an ultrasonic receiving module, a signal conditioning module, an AD sampling module, a gate position control module, a gate width control module, an MCU module and a human-computer interface module; the ultrasonic transmitting module is connected with the probe and used for transmitting ultrasonic waves; the ultrasonic receiving module is connected with the probe and used for receiving ultrasonic echoes; the signal conditioning module is connected with the ultrasonic receiving module and is used for amplifying the received ultrasonic echo; the AD sampling module is connected with the signal conditioning module and used for converting the analog signal into a digital signal; the FPGA module is connected with the ultrasonic transmitting module and the AD sampling module and is used for data sampling, most value searching, data buffering, data compression and data storage control; the gate position control module and the gate width control module are respectively connected with the FPGA module and are used for working together with the maximum value searching module in the FPGA module to determine the index of the highest echo in the sampling point sequence, so that the transmission time is determined; the MCU module is connected with the FPGA module and used for controlling the whole system; the human-computer interface module is connected with the MCU module and used for carrying out human-computer conversation, checking waveforms, setting parameters and key operation, and the test method comprises the following steps:
the method comprises the following steps: a user sets system parameters through a man-machine interface module to complete circuit initialization;
step two: carrying out small-angle probe angle test;
the probe is arranged on the surface B of the TZS-R test block, and when the lower corner echo of the surface A in the gate is highest, the current time value is automatically calculated and recorded by pressing a confirmation key system;
the probe is arranged on the surface B of the TZS-R test block, and when the corner echo on the surface A in the gate is highest, the zero point of the probe is automatically calculated by pressing an enter key system;
when the small-angle incidence angle is 9-12 degrees, the system program automatically calculates the angle value and displays the result;
when the small-angle incident angle is 6-8 degrees, the probe is placed on the C surface of the TZS-R test block, a confirmation key is pressed when the edge angle echo on the A surface in the gate is highest, and a system program automatically calculates an angle value and displays a result;
the specific process of the angle test of the small-angle probe is as follows:
the probe is arranged on the B surface of the TZS-R test block, and when the echo of the lower edge angle of the A surface is highest, the propagation time from the emission to the lower edge angle of the A surface is t1；
The probe is arranged on the B surface of the TZS-R test block, and when the crest angle echo on the A surface is highest, the propagation time from the emission to the crest angle on the A surface is t2；
The time T of the transmission of the ultrasonic wave in the probe wafer is obtained to be 2 Xt1-t2；
When the small angle incidence angle is between 9 and 12 degrees, the formula is obtained
When the small-angle incidence angle is 6-8 degrees, the probe is arranged on the C surface of the TZS-R test block, and when the crest angle echo on the A surface is highest, the crest angle propagation time from the emission to the A surface is t3To obtain a formula
Wherein: theta is a refraction angle of the probe, and C is a propagation sound velocity of the ultrasonic wave in the test block;
step three: carrying out angle test on the inclined probe;
the probe is placed on the LG-R test block to detect the R100 arc surface, the probe is moved back and forth and kept parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest, and a confirmation key is pressed to automatically calculate the zero point of the probe by a system; the probe is arranged on the wheel tread, when the echo of the artificial hole in the gate is highest, the confirmation key is pressed, and the system automatically calculates the angle value and displays the result;
the angle test of the angle probe comprises the following specific processes:
the probe is arranged on the LG-R test block to detect the R100 arc surface, the probe is moved back and forth and is kept parallel to the side surface of the test block until the reflection wave of the R100 arc surface reaches the highest value, and the time from transmitting to the arc surface is t4；
The time T of transmission of ultrasonic wave in the probe wafer is T4-100/C×1000；
The probe is arranged on the wheel tread, the ultrasonic wave can generate echo when meeting the artificial hole, and the transmission time from the emission to the artificial hole is t5；
Setting the radius of a wheel to be R, the artificial aperture to be R, the refraction angle of a probe to be theta, the sound velocity of ultrasonic waves in a workpiece to be C, and the distance from the center point B of an artificial hole to the outer wall of the wheel to be h, establishing a mathematical model, and obtaining AO by cosine law in a triangular OAB formed by the incident point A of the probe, the center point O of the wheel and the center point B of the artificial hole2+AB2-2×AB×AO×cosθ＝BO2，
Determining θ ═ arccos ((AO)2+AB2-BO2)/(2×AB×AO))
Wherein, theta is a refraction angle of the probe, C is a sound velocity of the ultrasonic wave propagating in the test block, AO is R, AB is Cx (t)5-T)/1000+r，BO＝R-(h+r)。
2. The test method of claim 1, wherein: specifically, after the system is powered on, a user sets system parameters through the human-computer interface module and transmits the system parameters to the MCU control module through the communication interface, and the MCU control module transmits the parameters to the FPGA module to complete circuit initialization.
3. The test method of claim 2, wherein: the system parameters comprise the width of the gate, the position of the gate, the sound velocity C in the test block, the sampling sound path and the compression ratio of the sampling point.
4. The test method of claim 1, wherein: the specific process of the echo peak confirmation is that,
after sampling is started, the counter starts to work and starts to count from zero, and the value of the counter is added by 1 at each sampling point;
from the time of the gate position, the current value after AD conversion is sent to the a [7:0] end and the b [7:0] end of the comparator for size comparison; b [7:0] end data is provided by the output end of the most significant register, and the maximum value collected in the gate width range is reserved in the most significant register;
the loading process of the most valued register in the system is controlled by a Signal 1; signal1 is the output Signal of the comparator, which indicates that the current input AD digital semaphore is larger than the value in the most significant register, and this Signal will make the most significant register load the current new value into the most significant register, and update the value in the most significant register;
the loading process of the most-valued index register is controlled by a Signal2, the AD digital semaphore input currently is larger than the value in the most-valued register, the current value of the counter is loaded into the most-valued index register by the Signal, and the value of the most-valued index register is updated;
after the gate width time, the counter and the comparator stop working; the system obtains a value MaxIndex in a most valued index register, namely the position of the maximum amplitude, the sampling frequency of an AD sampling module is 100MHz/8bit, each point is sampled at an interval of 10ns, and the transmission time of ultrasonic waves from emission to a defect is as follows: 10 xMaxIndex/1000 mus, and storing the sample in a memory for calculation;
after the echo signals are collected, the FPGA module compresses the data sampled by the AD sampling module and stores the data into an FIFO buffer area, and finally the data are read out by the MCU module and sent to a display for display; when the screen has the highest echo, the MCU module acquires a confirmation command given by a user through a keyboard in the man-machine interface module, and calls a program to automatically calculate the angle value.
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