CN109856505A - The immunization time detection method of voltage dip - Google Patents
The immunization time detection method of voltage dip Download PDFInfo
- Publication number
- CN109856505A CN109856505A CN201910025140.7A CN201910025140A CN109856505A CN 109856505 A CN109856505 A CN 109856505A CN 201910025140 A CN201910025140 A CN 201910025140A CN 109856505 A CN109856505 A CN 109856505A
- Authority
- CN
- China
- Prior art keywords
- sensitive equipment
- immunization time
- circuit
- time
- minimal cut
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Measurement Of Current Or Voltage (AREA)
Abstract
This application involves a kind of immunization time detection methods of voltage dip, comprising: parser circuitry obtains the sensitive equipment in the circuit；Obtain the immunization time of each sensitive equipment；The immunization time of the circuit is obtained according to the immunization time of each sensitive equipment.In the application, the immunization time of the sensitive procedures of circuit is obtained based on sensitive equipment immunization time, to effectively detect the power supply reliability of circuit.
Description
Technical field
This application involves power supply the field of test technology, more particularly to a kind of immunization time detection method of voltage dip.
Background technique
As the entirety of social productive forces is promoted, the basic problems such as power supply reliability have reached higher level, and guarantee high
It imitates the increasingly automated production process produced the demand growing to power supply quality and has become electric power enterprise in new era needs
One principal contradiction of reply, and voltage dip is that contribution degree is maximum in all kinds of power quality problems for leading to user's economic loss
The problem of.The first step for improving quality of voltage needs to recognize typical susceptible equipment by test and certain evaluation measures
Or the voltage dip tolerance of process.
Has certain research achievement in terms of sensitive equipment test at this stage.Ou Yangsen team, South China Science & Engineering University is to de-
Button device is tested, and depicts the voltage dip tolerance curve (voltage tolerance curve, VTC) of equipment, point
The influence of temporary decline, duration, onset wave point and phase hit feature to equipment immunity is analysed.North China electric power is big
Xiao Xiang is learned rather with Xu Yonghai team to sensitivities such as adjustable speed driving (adjustable speed drive, ASD), A.C. contactors
Equipment has carried out correlative study, and gives certain immunity measure for improvement.Wu Ya basin team, North China Electric Power University is to PLC's
Voltage dip tolerance is tested.External Milanovic team is equally to a variety of sensitive equipments such as A.C. contactor, PC
Temporary drop tolerance have conducted a thorough research.
Part researcher recognizes that the typical susceptible equipment in some production process can interact under study for action, independently grinds
The tolerance for studying carefully equipment is not enough the immune force estimation of entire production process."Experimental
investigation on the sensitivity of an industrial process to voltage dips[C]
.2015IEEE Eindhoven PowerTech.Eindhoven " build an induced electricity by ACC, ASD and fictitious load
The typical industrial processes that machine is constituted, and the tolerance of related sensitive equipment and process is tested, it obtains
Respective VTC, it was confirmed that each equipment room influence each other and its process tolerance between relationship.
Existing numerous studies pass through the VTC for testing and obtaining to equipment progress voltage dip tolerance assessment, and for
For user, the voltage-tolerance curve based on the building of net side index intuitively cannot accurately embody what actual production process was subjected to
It influences, to not utilize progress weak link examination and Economic loss evaluation."Voltage dip immunity of
Equipment and installations " in propose immunity concept, using immunization time (Immunity time, IT)
The index of tolerance is temporarily dropped as assessment equipment or process voltage, and lists some typical industrial processes to the index
Using being illustrated.The index is carried out side assessment with the time and is exempted from using user oriented industrial process parameter as judgment criteria
Epidemic disease power, more conducively establishing from user side influences intuitive understanding to temporary drop.But this article does not suggest that concrete implementation method, for
Specific typical industry production assessment also needs to carry out further to land research.
Summary of the invention
Based on this, it is necessary to provide a kind of immunization time detection method for capableing of voltage dip.
A kind of immunization time detection method of voltage dip, which comprises
Parser circuitry obtains the sensitive equipment in the circuit；
Obtain the immunization time of each sensitive equipment；
The immunization time of the circuit is obtained according to the immunization time of each sensitive equipment.
The parser circuitry in one of the embodiments, before the step of obtaining the sensitive equipment in the circuit also
Include:
Establish the test circuit of sensitive equipment；
Disturbance power supply is provided for the sensitive equipment, detects the voltage waveform at the both ends of the sensitive equipment；
According to the variation of the voltage waveform at the both ends of the sensitive equipment, the immunization time of the sensitive equipment is obtained.
The variation of the voltage waveform at the both ends according to the sensitive equipment in one of the embodiments, obtains institute
The step of stating the immunization time of sensitive equipment include:
The variation for obtaining the voltage waveform at the both ends of the sensitive equipment detects the temporary drop feature peace of the voltage waveform
Push up the appearance of wave；
According to the time of the appearance of the temporary drop feature of the voltage waveform and flat-topped wave, the temporary drop feature and described is obtained
The time difference of flat-topped wave take the time difference as the immunization time of the sensitive equipment.
It is described in one of the embodiments, to provide disturbance power supply for the sensitive equipment, detect the sensitive equipment
The voltage waveform step at both ends includes:
Disturbance power supply is provided for the sensitive equipment, the voltage wave at the both ends of the sensitive equipment is detected by oscillograph
Shape.
The step of immunization time for obtaining each sensitive equipment includes: in one of the embodiments,
According to logical connection structure of the sensitive equipment in the circuit, obtains in the circuit and set with the sensitivity
Standby corresponding multiple minimal cut sets；
Obtain the immunization time of each minimal cut set；
The step of immunization time according to each sensitive equipment obtains the immunization time of the circuit include:
The immunization time of the circuit is obtained according to the immunization time of each minimal cut set.
The step of immunization time for obtaining each minimal cut set in one of the embodiments, are as follows:
Determine the sensitive equipment in each minimal cut set；
It take the immunization time of the sensitive equipment as the immunization time of the minimal cut set.
The immunization time according to each minimal cut set obtains the immune of the circuit in one of the embodiments,
The step of time includes:
Using the maximum value of the immunization time for each minimal cut set being serially connected as the immunization time of the circuit.
The step of immunization time for obtaining each minimal cut set includes: in one of the embodiments,
Obtain the immunization time of multiple links parallel with one another in the minimal cut set, with each link it is immune when
Between immunization time of the maximum value as the minimal cut set.
Multiple links in the same minimal cut set have digital coupled characteristic in one of the embodiments,.
The logical connection structure according to the sensitive equipment in the circuit in one of the embodiments, is obtained
The step of taking multiple minimal cut sets of the circuit include:
According to logical connection structure of the sensitive equipment in the circuit, the number coupling based on the sensitive equipment
The circuit is divided into multiple minimal cut sets by characteristic；
Obtain multiple minimal cut sets of the circuit.
The immunization time detection method of above-mentioned voltage dip obtains the sensitive procedures of circuit based on sensitive equipment immunization time
Immunization time, to effectively detect the power supply reliability of circuit.
Detailed description of the invention
Fig. 1 is the flow diagram of the immunization time detection method of voltage dip in one embodiment；
Fig. 2 is the structural schematic diagram of typical susceptible equipment ACC in one embodiment；
Fig. 3 is the schematic diagram of PIT curve in one embodiment；
Fig. 4 is the circuit connection diagram that circuit is tested in one embodiment；
Fig. 5 is the electrical block diagram of the experiment porch of the canonical process in one embodiment；
Fig. 6 a is the attachment structure schematic diagram of random network in one embodiment；
Fig. 6 b is the attachment structure schematic diagram of equivalent network in one embodiment；
Fig. 7 is the structural schematic diagram of the industrial process in one embodiment.
Specific embodiment
It is with reference to the accompanying drawings and embodiments, right in order to which the objects, technical solutions and advantages of the application are more clearly understood
The application is further elaborated.It should be appreciated that specific embodiment described herein is only used to explain the application, not
For limiting the application.
In one embodiment, as shown in Figure 1, providing a kind of immunization time detection method of voltage dip, including with
Lower step:
Step 110, parser circuitry obtains the sensitive equipment in the circuit.
Specifically, sensitive equipment is the equipment that generates resistance characteristics in voltage dip.I.e. sensitive equipment is in voltage dip
When, resistance characteristics will be generated.The sensitive equipment has certain tolerance.The tolerance of different sensitive equipments is different.
In this step, circuit structure is parsed, obtains each sensitive equipment in circuit, which is in circuit
Element.By parsing to circuit, sensitive equipment can be determined from circuit.Determine the position of sensitive equipment in circuit
It sets and the logic connecting relation of sensitive equipment.In the present embodiment, multiple sensitive equipments in circuit are obtained, and obtain sensitivity
The device type of equipment.In one embodiment, sensitive equipment includes switch element.In the present embodiment, sensitive equipment includes ACC
(contactor) and ASD (adjustable speed drive, speed regulation driving), i.e. the type of sensitive equipment includes ACC and ASD.
Step 130, the immunization time of each sensitive equipment is obtained.
In the present embodiment, according to the sensitive equipment got, the immunization time of sensitive equipment is obtained.One embodiment is,
According to the device type of the sensitive equipment got, immunization time corresponding with the device type of sensitive equipment is obtained.
Specifically, immunization time (Immunity Time, IT) is temporarily to drop tolerance for assessment equipment or process voltage
Index.In one embodiment, immunization time is that sensitive equipment preparation is disconnected to the time span for being fully disconnected this process.
It should be understood that the immunization time is the time corresponding with sensitive equipment prestored, in other words, when this is immune
Between for prestore it is corresponding with sensitive equipment type.The corresponding immunization time of each device type, the i.e. immunization time prestore,
The multiple immunization times prestored are corresponded with the device type prestored.It is noted that the immunization time prestored can lead to
It crosses test to obtain, and stores.
Step 150, the immunization time of the circuit is obtained according to the immunization time of each sensitive equipment.
In the present embodiment, after the immunization time for getting each sensitive equipment, obtained by the immunization time of each sensitive equipment
The immunization time of the circuit, one embodiment are, with the maximum value in the immunization time of each sensitive equipment for the electricity
The immunization time on road.
In above-described embodiment, the immunization time of the sensitive procedures of circuit is obtained based on sensitive equipment immunization time, to have
Effect detects the power supply reliability of circuit.
In order to obtain the immunization time of sensitive equipment, need to detect sensitive equipment, in one of the embodiments,
The parser circuitry, before the step of obtaining the sensitive equipment in the circuit further include: establish the test circuit of sensitive equipment；
Disturbance power supply is provided for the sensitive equipment, detects the voltage waveform at the both ends of the sensitive equipment；According to the sensitive equipment
Both ends voltage waveform variation, obtain the immunization time of the sensitive equipment.
In the present embodiment, the test circuit of sensitive equipment is established；Disturbance power supply is provided for the sensitive equipment, described in detection
The situation of change of sensitive equipment key parameter；According to the situation of change of the sensitive equipment parameter and the time of origin temporarily dropped, obtain
Obtain the immunization time of the sensitive equipment.
One embodiment is that, according to the variation of the voltage waveform at the both ends of the sensitive equipment, detection obtains the sensitivity
The immunization time of equipment.
In the present embodiment, test circuit built is taken, includes a sensitive equipment in the test circuit, and the test circuit further includes
One power supply, for the power supply for providing disturbance power supply, i.e. the power supply is the voltage of fluctuation for providing disturbance voltage, disturbance voltage,
The voltage of disturbance power supply continued jitters within a preset time, are influenced by the disturbance voltage, sensitive equipment will will disconnect or
Conducting.
In the present embodiment, the voltage at the both ends of sensitive equipment is detected, obtains the voltage waveform at the both ends of sensitive equipment, when disturbing
When dynamic voltage fluctuation variation, the disconnection of sensitive equipment or on state will be affected, therefore, the electricity at the both ends of sensitive equipment
Pressure also changes therewith, and then generates voltage waveform.The variation of the transformation waveform is the variation based on time shaft, according to the voltage wave
The variation of shape is able to detect the immunization time for obtaining sensitive equipment.
It is described in one of the embodiments, to be set according to the sensitivity in order to detect the immunization time for obtaining sensitive equipment
The variation of the voltage waveform at standby both ends, the step of obtaining the immunization time of the sensitive equipment include: to obtain the sensitivity to set
The variation of the voltage waveform at standby both ends detects the appearance of temporary the drop feature and flat-topped wave of the voltage waveform；According to the electricity
The time of the appearance of the temporary drop feature and flat-topped wave of corrugating obtains the time difference of temporary the drop feature and the flat-topped wave, with
The time difference is the immunization time of the sensitive equipment.
One embodiment is, described to provide disturbance power supply for the sensitive equipment, detects the sensitive equipment key parameter
Situation of change the step of include: the situation of change for obtaining the sensitive equipment critical performance parameters, detect the main touching of contactor
The situation of change of the voltage of contact end, detects the variation feelings of the DC bus-bar voltage of frequency converter when the both ends external dc power supply of head
Condition；Occurred according to the observed equipment critical performance parameters mutation or out-of-limit time and supply side voltage dip
Time, obtain the two between time difference, with the time difference be the sensitive equipment immunization time.
In the present embodiment, the situation of change of the sensitive equipment critical performance parameters is obtained, needs to monitor for contactor
When its main contact both ends external dc power supply the case where contact end voltage, need to monitor its DC bus-bar voltage for frequency converter；
Occurred according to the observed equipment critical performance parameters mutation or out-of-limit time and supply side voltage dip
Time obtains the time difference between the two, take the time difference as the immunization time of the sensitive equipment.
The flat-topped wave for detecting the voltage waveform in one embodiment and the temporarily appearance of drop feature；According to the voltage wave
The flat-topped wave of shape and the temporarily time of the appearance of drop feature obtain the flat-topped wave and the temporarily time difference of drop feature, with the time
Difference is the immunization time of the sensitive equipment.
In the present embodiment, sensitive equipment can be considered switch, disturbs power supply as sensitive equipment and provides disturbance voltage, an implementation
In example, power supply is disturbed as the control terminal of sensitive equipment, disturbance voltage is provided, and the both ends of sensitive equipment are connected to test circuit, it is quick
Feel load in series in equipment and test circuit.Test circuit further includes a circuit power and load, circuit power and load and
Sensitive equipment series connection.
When sensitive equipment conducting, the voltage at sensitive equipment both ends is zero, when the variation of disturbance voltage is so that sensitive equipment
When disconnection, it is equivalent to circuit breaker, and oscillograph detection is the both end voltage of the sensitive equipment of off state, at this time sensitive equipment
The infinite at both ends, therefore, at this point, the voltage at sensitive equipment both ends is the voltage for the circuit power tested in circuit, this
When, there is flat-topped wave in the voltage waveform at the both ends of sensitive equipment, in this way, there is the time of temporarily drop feature in detection voltage waveform, and
Detect flat-topped wave appearance time, by calculate temporarily drop feature time of occurrence and the flat-topped wave appearance time it
Difference obtains the time difference of temporarily drop feature and the flat-topped wave, it is sensitivity that this, which temporarily drops feature and the time difference of the flat-topped wave,
The immunization time of equipment.
In order to detect sensitive equipment both ends voltage waveform, it is described in one of the embodiments, to be set for the sensitivity
Standby to provide disturbance power supply, the voltage waveform step for detecting the both ends of the sensitive equipment includes: to provide to disturb for the sensitive equipment
Dynamic power supply, the voltage waveform at the both ends of the sensitive equipment is detected by oscillograph.
In the present embodiment, which further includes an oscillograph, and two input terminals of oscillograph are connected to sensitive equipment
Both ends, oscillograph is in parallel with sensitive equipment, in this way, oscillograph is able to detect that the voltage at the both ends of sensitive equipment, Jin Erneng
Enough detect the voltage waveform of sensitive equipment.
When in circuit there are when multiple sensitive equipments, in order to accurately obtain the immunization time of circuit, an implementation wherein
In example, the step of immunization time for obtaining each sensitive equipment include: according to the sensitive equipment in the circuit
Logical connection structure, obtain multiple minimal cut sets corresponding with the sensitive equipment in the circuit；Obtain each minimum
The immunization time of cut set；The step of immunization time according to each sensitive equipment obtains the immunization time of circuit packet
It includes: obtaining the immunization time of the circuit according to the immunization time of each minimal cut set.
In the present embodiment, according to logical connection structure of the sensitive equipment in the circuit, obtain in the circuit
With the direct-connected relationship of the sensitive equipment, and the more minimal cut sets series connection of topological standardization-are further carried out using Minimal Cut Set
Topological form；The immunization time of each minimal cut set of Relation acquisition is sought using parallel module combination immunization time；Described
The step of obtaining the immunization time of the circuit according to the immunization time of each minimal cut set includes: according to each minimal cut set
The immunization time acquisition modes that are combined with serial module structure of immunization time obtain the immunization time of the circuit.
Specifically, minimal cut set includes multiple element, and in other words, multiple element constitutes minimal cut set, the minimal cut set
On-off enable to circuit with the minimum unit of on-off.It should be understood that for one by random element independent of each other
The process that part is constituted, cut set, which refers to that combination is stopped transport, will lead to the element combination of power failure, if removed from the cut set any
One element, which is no longer a cut set, then this cut set is exactly minimal cut set (minimum-cut-set, MCS).
According to the description, it is known that MCS internal element is parallel relationship, is series relationship between MCS.It is noted that minimal cut set packet
Include at least one sensitive equipment.
In the present embodiment, since the on-off of minimal cut set can influence the on-off of entire circuit, then, exist in circuit
Multiple minimal cut sets, in this way, corresponding multiple immunization times are by multiple minimal cut sets according to the immunization time of these minimal cut sets
The immune application of entirety for obtaining circuit can be calculated.
It is described in one of the embodiments, to obtain each minimal cut set in order to accurately obtain the immunization time of circuit
Immunization time the step of are as follows: determine the sensitive equipment in each minimal cut set；Immunization time with the sensitive equipment is
The immunization time of the minimal cut set.
It is described to seek each minimal cut set of Relation acquisition using parallel module combination immunization time in one embodiment
The step of immunization time, comprises determining that the sensitive equipment in each minimal cut set；When immune with the maximum of the sensitive equipment
Between be the minimal cut set immunization time.
In the present embodiment, with maximum one in the immunization time of the sensitive equipment for the minimal cut set it is immune when
Between.
One embodiment is to obtain the sensitive equipment in each minimal cut set, determine quick in each minimal cut set
Feel equipment device type, with the corresponding immunization time of the device type of the sensitive equipment be the minimal cut set it is immune when
Between.
In the present embodiment, obtained according to the immunization time of the sensitive equipment in minimal cut set the minimal cut set it is immune when
Between, and then determine the immunization time of circuit, so that the acquisition of the immunization time of circuit is more accurate.
It is described according to each minimal cut set in one of the embodiments, in order to accurately obtain the immunization time of circuit
Immunization time the step of obtaining the immunization time of the circuit include: with each minimal cut set for being serially connected it is immune when
Between immunization time of the minimum value as the circuit.
In the present embodiment, the immunization time that the immunization time according to each minimal cut set is combined with serial module structure is obtained
The step of taking mode to obtain the immunization time of the circuit includes: with the immunization time for each minimal cut set being serially connected
Immunization time of the minimum value as the circuit.
In the present embodiment, the immunization time according to each minimal cut set obtains the step of the immunization time of the circuit
Suddenly include: whether each minimal cut set of detection is serially connected；When each minimal cut set is serially connected, then with it is each it is described most
Immunization time of the minimum value of the immunization time of small cut set as the circuit.
In the present embodiment, when in circuit there are when multiple minimal cut sets, then to be serially connected between these minimal cut sets,
Circuit can accurately then be obtained as the immunization time of the circuit using the minimum value of the immunization time of each minimal cut set
Immunization time.
It is described in one of the embodiments, to obtain each minimal cut set in order to obtain the immunization time of minimal cut set
Immunization time the step of include: the immunization time for obtaining multiple links parallel with one another in the minimal cut set, Yi Gesuo
State immunization time of the maximum value of the immunization time of link as the minimal cut set.In the present embodiment, the acquisition is each described
The step of immunization time of minimal cut set, includes: whether the detection minimal cut set includes multiple links parallel with one another；Work as institute
When stating multiple links that minimal cut set includes parallel with one another, then the immunization time of each link is obtained, with each link
Immunization time of the maximum value of immunization time as the minimal cut set.
It include multiple links in minimal cut set in the present embodiment, each link can regard an independent element as,
It is also possible to multiple element.Multiple links in the same minimal cut set are parallel with one another.Therefore, which exempts from
The epidemic disease time is equal with maximum value in the immunization time of multiple links in the minimal cut set.Therefore, by with each link
Immunization time of the maximum value of immunization time as the minimal cut set can earn the immunization time for obtaining minimal cut set.
Multiple links in the same minimal cut set have digital coupled characteristic in one of the embodiments,.
Specifically, the digital coupled characteristic of link is referred to when the key parameter of link more can just make other rings in limited time
It saves because the variation of its output is affected, ensure that the mutual independence between link to a certain extent in this way.And for having
Two parameters of consecutive variations functional relation, are classified as in same link.
In order to divide the minimal cut set in circuit, in one of the embodiments, it is described according to the sensitive equipment in institute
The step of stating the logical connection structure in circuit, obtaining multiple minimal cut sets of the circuit includes: according to the sensitive equipment
The circuit is divided into more by the logical connection structure in the circuit, the digital coupled characteristic based on the sensitive equipment
A minimal cut set；Obtain multiple minimal cut sets of the circuit.
In the present embodiment, the minimal cut set of circuit is divided based on the digital coupled characteristic of link, enable to it is each most
Link in small cut set can have digital coupled characteristic.
In embodiments, the immunization time detection method of voltage dip is also referred to as exemplary voltages and temporarily drops exempting from for sensitive objects
The immunization time test method for the sensitive equipment that epidemic disease time test method or exemplary voltages temporarily drop.
Here is specific embodiment:
In order to obtain the immunization time of sensitive equipment, need to test sensitive equipment.
(1) typical susceptible equipment IT is tested
The determination of typical susceptible equipment IT includes determining key parameter, determining parameter threshold and carry out testing several steps, wherein
Parameter threshold can generally be obtained by associated technical parameters or standard.To embody this test method practicability, the technical program with
It is unfolded for the research of typical susceptible equipment ACC in industrial process.
Common double E type Direct Action Type ACC structures are as shown in Figure 2 in industrial process.When main coil is powered, generated in iron core
Magnetic flux, iron core pole end face generate electromagnetic force.In the case where overcoming restoring force reactive spring force, dynamic iron core link contact to
Lower movement causes dynamic and static contact to contact with each other.In the case that dynamic iron core overcomes all groups of springs active forces after major loop closure
Continue to move downward, guarantees that iron core is reliably attracted.The section of dynamic iron core, which moves, is referred to as reliable distance (reliable
distance,RD)。
According to CIGRE/CIRED/UIE Joint Working Group C4.110. " Voltage dip immunity
Of equipment and installations [R] " .Paris, France:CIGRE, 2010, judge sensitive objects failure
Condition is a certain critical physical parameter, and the selection of the key parameter will generate large effect to the assessment result of object.Due to
It is the immunity in order to speculate process to the purpose that force estimation is immunized in equipment, thus whether had an impact with equipment to follow-up link
Or the function of equipment is foundation to determine that key parameter is more appropriate.The main function of ACC in circuit is that controlling equipment supplies
Circuit is cut-off, therefore can be with the criterion whether contact of its contact as ACC triggering failure.Therefore description dynamic iron core phase
Key parameter can be used as to the displacement x of position, with the position under attracting state for 0, limit value is RD.
PIT (process IT, PIT, process immunization time) is defined as key parameter PnomIt is played from the generation moment is interrupted
Arrive at limit value PlimitTime, as shown in Figure 3, wherein Δ t be research object temporarily dropped after " dead time ".Similar, it is right
For ACC, from occurring temporary drop, the time for being more than RD to displacement x may be defined as the immunization time of the equipment
(equipment immunity time, EIT), and its corresponding dead time is that transient state electromagnetic force is decreased to counter-force (spring force
With the difference of dynamic iron core gravity) when cause iron core release time.
This test establishing criteria IEEE Std 1668-2017, IEEE Recommended Practice for
Voltage Sag and Short Interruption Ride-Through Testing for End-Use
Scheme described in Electrical Equipment Rated Less than 1000V is tested, and test environment is as shown in Figure 4:
Wherein, disturbance power supply uses the MX45 type programmable power supply of AMETEK company, 0~400V of voltage output range, peak power output
For 45kVA.Oscillograph uses the program-controlled type oscillograph of YOKOGAWA company DL850, for monitoring the voltage waveform at contactor both ends.
The major loop of ACC control is simulated using the lamps and lanterns of external power supply power supply, more preferably to embody the shadow temporarily dropped to ACC itself
It rings.When contactor, which is powered, to be attracted, major loop closure, lamp luminescence and contactor both end voltage is zero.When contactor is by temporary
When dropping and contact being efficiently separated, apparent lightness variation will occur in lamps and lanterns, will occur having one in oscillograph monitor window
Fixed width degree and amplitude are the flat-topped wave of indicator light supply voltage.By the way that temporarily drop occurs under the available current temporarily drop feature of oscillograph
When with flat-topped wave occur when time difference-EIT."Voltage dip immunity of equipment and
Installations [R] " in only PIT is defined under interrupt condition, it is clear that this is much for practical study
Inadequate, because the probability for temporarily dropping appearance under actual conditions is much higher than outage probability, and for contactor class equipment, when interrupting
Immunity with higher, using interrupt when the case where discuss do not have typicalness.Thus herein by the premise of this concept widen to
Temporarily drop, is more fully assessed so that the immunity to equipment has.EIT can be used as a new feature and original for voltage dip as a result,
Feature is combined to assess ACC immunity, if the X-Y scheme of EIT and amplitude Characteristics composition are with user oriented side
The VTC that is constituted as Rule of judgment of parameter.This experiment can be considered with the result that single-phase circuit situation is tested in multiphase feelings
Under condition, failure mutually appear in ACC power supply phase when this most serious the case where, EIT in this case is representative.
The test of ASD can copy above scheme, and for ASD, key parameter is chosen as the low of DC bus-bar voltage
Press limit value Udc-minAnd overcurrent protection limit Δ imax, when dc-link capacitance end voltage is lower than threshold value or the electricity of Restoration stage
Stream is higher than its threshold value, and ASD will trip, to generate the influence of mutation to follow-up link.
Motor itself can also be changed in the variation of supply voltage situation in terms of revolving speed, torque, thus it is right
The monitoring of motor state itself is also more important.For example, the revolving speed of motor is a key parameter towards industrial process, when it
Lower than rated value 80% when it is believed that its can not work normally, the parameter monitoring is more convenient, can be used motor special swash
The equipment such as light kinemometer, data collection system are obtained.
During the test, ACC, ASD and motor module are usually also considered as a typical combination to test, at this time may be used
The operating status of combination is defined to pay close attention to the situation of change of the parameter of electric machine emphatically.Here the presence of ACC and ASD is to motor pair
Original response of voltage dip generates added influence, and the failure of two class equipment can make power failure, this is to cause motor close
(L.E.Weldemariam, H.J. the main reason for failure in the case of nominal loadV.Cuk, J.F.G.Cobben
and W.L.Kling《Experimental investigation on the sensitivity of an industrial
Process to voltage dips " [C] .2015IEEE Eindhoven PowerTech.Eindhoven:IEEE
Press,2015.1-6).For motor, the changing rule of revolving speed can be by more after power failure under certain state original state
Kind method obtains, thus the IT of above-mentioned typical combination can be split as to preposition equipment failure required time and post equipment failure
Additional time two parts.In this way can be by the local link in measurement process come the immunological characteristic of estimation procedure, it below will be right
Testing scheme based on the thinking describes in detail.
(3) testing scheme of equipment PIT
When equipment PIT is some equipment failure, the IT of institute's research process.The index can be used for judging the crucial journey of equipment
Degree, to provide guiding performance with prevention for the improvement temporarily dropped, the index is in Voltage dip immunity of equipment
And installations [R] " in applied in multiple examples for enumerating.
Equipment PIT is not easy to obtain by directly test, because all sensitive equipments will receive shadow when by temporary drop
It rings, can not individually discuss to some equipment.Here, can be with independent analysis in the case where certain equipment fault, subsequent process
The situation of change of link parameter obtains the parameter out-of-limit time, and under the out-of-service time EIT that equipment is temporarily dropped and work condition state
Rotation speed change curve of motor when by temporary drop event can individually obtain, the close of equipment PIT is can be obtained into the two summation
Like value.
Above-mentioned is one containing only there are two the industrial process of level, also can be according to above-mentioned for the industrial process of multi-layer
Method is derived step by step.It, can be by way of reappearing industrial process come independent studies for certain simple industrial process
Influence of the relevant sensitization equipment to procedure parameter, so as to directly test to obtain equipment PIT.
(4) the determination scheme of canonical process PIT:
A) all sensitive equipments or link in research process are combed.
This part needs to pay attention to the condition for dividing link, should have certain digital coupled characteristic between divided link.
Exactly, ideally when the key parameter of link more can just make other links because the variation of its output is by shadow in limited time
It rings, ensure that the mutual independence between link to a certain extent in this way.And for two with consecutive variations functional relation
Parameter is classified as in same link.In order to enable the link marked off is easy to understand and investigates, it also can be from functional perspective
Link division is carried out, adjustment appropriate is carried out to above-mentioned division result.For specific equipment, with specific function
Can, and often also there is preferable digital coupled characteristic with other equipment, thus can be by it directly as a link.It is such as certain
The operating status of link depends on other certain links, then the link is the upper layer link being made of correlator link.
The experiment porch for the canonical process studied herein is as shown in figure 5, industrial structure shown in fig. 5 is widely present in
During all types of industries, sensitive equipment involved in the canonical process is ASD and ACC, and load link is by ASD and ACC
The upper layer link of decision.
B) the logical connection mode between analytical equipment or link.
Logical connection mode between link at the same level is most important to the determination of PIT, the equipment on Different Logic node
Failing, there are larger differences to the influence of process bring.The logical construction of each link may be complex in industrial process, but according to
According to Minimal Cut Set standardization processing can be carried out to it.The process being made of for one random element independent of each other, cut set
Referring to that combination is stopped transport will lead to the element combination of power failure, if removing any one element from the cut set, the cut set is not
It is a cut set again, then this cut set is exactly minimal cut set (minimum-cut-set, MCS), Bollen M H J.
《Understanding Power Quality Problems:Voltage Sags and Interruptions[M].New
York ": IEEE press, 2000.According to the description, it is known that MCS internal element is parallel relationship, is series relationship between MCS, then
Shown in the equivalent structure of network shown in Fig. 6 (a) such as Fig. 6 (b):
Above-mentioned theory shows that the link at the same level with digital coupled characteristic can be used and is constituted by connecting with parallel element
Equivalent network indicates.
For the upper layer link determined by several low-level links, research mode and single link or equipment
Mode is similar, with lower layer link contact be it by the time of influence being approximately the failure of lower layer's link at the time of.
Using above-mentioned analysis means, the power supply module analyzed above can be equivalent to the series network of ACC, ASD.And when power supply
After Module Fail, the key parameter of loading module can just occur obviously to deviate, thus it can be considered a upper layer link.
C) IT of subprocess or process is determined according to logical connection mode
For a link being connected in parallel to each other, the IT of MCS are as follows:
ITMCS=max (IT1,…,ITa) (1)
For b MCS being one another in series, the IT of all links of certain rank are as follows:
IT=min (ITMCS1,…,ITMCSb) (2)
In Fig. 7, the IT of power supply link depends on the minimum value of the EIT of ACC and ASD, and the IT of loading module is then power supply
The IT and loading module of link are individually by the sum of IT when interrupting.Herein, the IT of loading module is also PIT.
Those of ordinary skill in the art will appreciate that realizing all or part of the process in above-described embodiment method, being can be with
Relevant hardware is instructed to complete by computer program, the computer program can be stored in a non-volatile computer
In read/write memory medium, the computer program is when being executed, it may include such as the process of the embodiment of above-mentioned each method.Wherein,
To any reference of memory, storage, database or other media used in each embodiment provided herein,
Including non-volatile and/or volatile memory.Nonvolatile memory may include read-only memory (ROM), programming ROM
(PROM), electrically programmable ROM (EPROM), electrically erasable ROM (EEPROM) or flash memory.Volatile memory may include
Random access memory (RAM) or external cache.By way of illustration and not limitation, RAM is available in many forms,
Such as static state RAM (SRAM), dynamic ram (DRAM), synchronous dram (SDRAM), double data rate sdram (DDRSDRAM), enhancing
Type SDRAM (ESDRAM), synchronization link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM
(RDRAM), direct memory bus dynamic ram (DRDRAM) and memory bus dynamic ram (RDRAM) etc..
Each technical characteristic of above embodiments can be combined arbitrarily, for simplicity of description, not to above-described embodiment
In each technical characteristic it is all possible combination be all described, as long as however, the combination of these technical characteristics be not present lance
Shield all should be considered as described in this specification.
The several embodiments of the application above described embodiment only expresses, the description thereof is more specific and detailed, but simultaneously
It cannot therefore be construed as limiting the scope of the patent.It should be pointed out that coming for those of ordinary skill in the art
It says, without departing from the concept of this application, various modifications and improvements can be made, these belong to the protection of the application
Range.Therefore, the scope of protection shall be subject to the appended claims for the application patent.
Claims (10)
1. a kind of immunization time detection method of voltage dip, which comprises
Parser circuitry obtains the sensitive equipment in the circuit；
Obtain the immunization time of each sensitive equipment；
The immunization time of the circuit is obtained according to the immunization time of each sensitive equipment.
2. the method according to claim 1, wherein the parser circuitry, the sensitivity obtained in the circuit is set
Before standby step further include:
Establish the test circuit of sensitive equipment；
Disturbance power supply is provided for the sensitive equipment, detects the voltage waveform at the both ends of the sensitive equipment；
According to the variation of the voltage waveform at the both ends of the sensitive equipment, the immunization time of the sensitive equipment is obtained.
3. according to the method described in claim 2, it is characterized in that, the voltage waveform at the both ends according to the sensitive equipment
Variation, the step of obtaining the immunization time of the sensitive equipment includes:
The variation for obtaining the voltage waveform at the both ends of the sensitive equipment detects the temporary drop feature and flat-topped wave of the voltage waveform
Appearance；
According to the time of the appearance of the temporary drop feature of the voltage waveform and flat-topped wave, the temporary drop feature and the flat-top are obtained
The time difference of wave take the time difference as the immunization time of the sensitive equipment.
4. according to the method described in claim 2, it is characterized in that, described provide disturbance power supply for the sensitive equipment, detection
The voltage waveform step at the both ends of the sensitive equipment includes:
Disturbance power supply is provided for the sensitive equipment, the voltage waveform at the both ends of the sensitive equipment is detected by oscillograph.
5. according to the method described in claim 2, it is characterized in that, the step of the immunization time for obtaining each sensitive equipment
Suddenly include:
According to logical connection structure of the sensitive equipment in the circuit, obtain in the circuit with the sensitive equipment pair
The multiple minimal cut sets answered；
Obtain the immunization time of each minimal cut set；
The step of immunization time according to each sensitive equipment obtains the immunization time of the circuit include:
The immunization time of the circuit is obtained according to the immunization time of each minimal cut set.
6. according to the method described in claim 5, it is characterized in that, the step of the immunization time for obtaining each minimal cut set
Suddenly are as follows:
Determine the sensitive equipment in each minimal cut set；
It take the immunization time of the sensitive equipment as the immunization time of the minimal cut set.
7. according to the method described in claim 5, it is characterized in that, described obtain according to the immunization time of each minimal cut set
The step of immunization time of the circuit includes:
Using the maximum value of the immunization time for each minimal cut set being serially connected as the immunization time of the circuit.
8. according to the method described in claim 5, it is characterized in that, the step of the immunization time for obtaining each minimal cut set
Suddenly include:
The immunization time of multiple links parallel with one another in the minimal cut set is obtained, with the immunization time of each link
Immunization time of the maximum value as the minimal cut set.
9. according to the method described in claim 5, it is characterized in that, multiple links in the same minimal cut set have
Digital coupled characteristic.
10. according to the method described in claim 5, it is characterized in that, it is described according to the sensitive equipment in the circuit
Logical connection structure, the step of obtaining multiple minimal cut sets of the circuit include:
According to logical connection structure of the sensitive equipment in the circuit, the number coupling based on the sensitive equipment is special
Property, the circuit is divided into multiple minimal cut sets；
Obtain multiple minimal cut sets of the circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910025140.7A CN109856505B (en) | 2019-01-11 | 2019-01-11 | Immune time detection method for voltage sag |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910025140.7A CN109856505B (en) | 2019-01-11 | 2019-01-11 | Immune time detection method for voltage sag |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109856505A true CN109856505A (en) | 2019-06-07 |
| CN109856505B CN109856505B (en) | 2022-04-01 |
Family
ID=66894494
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910025140.7A Active CN109856505B (en) | 2019-01-11 | 2019-01-11 | Immune time detection method for voltage sag |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109856505B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111190064A (en) * | 2020-01-02 | 2020-05-22 | 深圳供电局有限公司 | Test method and test system for voltage sag immunization time and storage medium |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103399239A (en) * | 2013-08-12 | 2013-11-20 | 四川大学 | Voltage sag immunity detection method for industrial equipment |
| CN104239057A (en) * | 2014-09-18 | 2014-12-24 | 清华大学 | Method for improving power utilization reliability of major user based on active power seeking |
| CN104835018A (en) * | 2015-06-01 | 2015-08-12 | 国家电网公司 | Reliability estimation method and device of middle voltage distribution network |
| CN106291244A (en) * | 2016-08-24 | 2017-01-04 | 浙江群力电气有限公司 | One repeatedly voltage dip severity appraisal procedure and system |
| US20170102416A1 (en) * | 2013-03-05 | 2017-04-13 | Texas Instruments Incorporated | Detecting power supply sag in an integrated circuit |
| CN107561347A (en) * | 2017-08-16 | 2018-01-09 | 广州供电局有限公司 | Voltage dip order of severity evaluation method and system |
| CN208092174U (en) * | 2018-05-08 | 2018-11-13 | 深圳供电局有限公司 | Automatic test platform of voltage sag |
| CN109064026A (en) * | 2018-08-03 | 2018-12-21 | 福州大学 | A kind of industrial process procedure parameter immunization time appraisal procedure considering the power supply system method of operation |
-
2019
- 2019-01-11 CN CN201910025140.7A patent/CN109856505B/en active Active
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20170102416A1 (en) * | 2013-03-05 | 2017-04-13 | Texas Instruments Incorporated | Detecting power supply sag in an integrated circuit |
| CN103399239A (en) * | 2013-08-12 | 2013-11-20 | 四川大学 | Voltage sag immunity detection method for industrial equipment |
| CN104239057A (en) * | 2014-09-18 | 2014-12-24 | 清华大学 | Method for improving power utilization reliability of major user based on active power seeking |
| CN104835018A (en) * | 2015-06-01 | 2015-08-12 | 国家电网公司 | Reliability estimation method and device of middle voltage distribution network |
| CN106291244A (en) * | 2016-08-24 | 2017-01-04 | 浙江群力电气有限公司 | One repeatedly voltage dip severity appraisal procedure and system |
| CN107561347A (en) * | 2017-08-16 | 2018-01-09 | 广州供电局有限公司 | Voltage dip order of severity evaluation method and system |
| CN208092174U (en) * | 2018-05-08 | 2018-11-13 | 深圳供电局有限公司 | Automatic test platform of voltage sag |
| CN109064026A (en) * | 2018-08-03 | 2018-12-21 | 福州大学 | A kind of industrial process procedure parameter immunization time appraisal procedure considering the power supply system method of operation |
Non-Patent Citations (1)
| Title |
|---|
| 周凯等: "电压暂降对汽车制造业影响案例分析", 《第九届电能质量研讨会论文集》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111190064A (en) * | 2020-01-02 | 2020-05-22 | 深圳供电局有限公司 | Test method and test system for voltage sag immunization time and storage medium |
| CN111190064B (en) * | 2020-01-02 | 2022-06-03 | 深圳供电局有限公司 | Test method and test system for voltage sag immunization time and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| CN109856505B (en) | 2022-04-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Alinezhad et al. | Out-of-step protection based on equal area criterion | |
| Apostolov et al. | IEC 61850 GOOSE applications to distribution protection schemes | |
| CN107064714B (en) | MMC-HVDC electric transmission line fault detection method based on unilateral transient current | |
| CN103795022A (en) | Fault current detecting circuit | |
| CN113156261B (en) | Method and system for detecting and positioning series arc fault | |
| CN109856505A (en) | The immunization time detection method of voltage dip | |
| Baba et al. | Synchrophasor based real time monitoring of grid events in Indian power system | |
| EP4115483A1 (en) | Detecting an electrical fault within a monitored zone of a power transmission line | |
| Hasan et al. | A simulation testbed for cascade analysis | |
| Kumar et al. | Wide area islanding detection using phasor measurement unit | |
| Gomez et al. | A novel methodology to locate originating points of voltage sags in electric power systems | |
| Hasan et al. | Characterization of voltage sag based on point-on-wave | |
| CN100362718C (en) | Fault-tolerant complex judging self adaption high voltage parallel reactor turn-to-turn protection | |
| CN106410764B (en) | A kind of calculation method and device of positive sequence polarization voltage | |
| Yu et al. | Voltage-based fault identification for a PMU-based wide area backup protection scheme | |
| Erwin et al. | PG&E 500 kV series-compensated transmission line relay replacement: Design requirements and RTDS® testing | |
| Hoang et al. | A multiagent and IEC 61850-based fault location and isolation system for distribution network with high PV integration–a CHIL implementation | |
| CN105633922A (en) | Logic protection device for parallel node fault of electric loop | |
| Anjaiah et al. | Real-time fault diagnosis in photovoltaic based DC microgrids using modified change detection filter | |
| Jagadeesh et al. | An Intuitive Alert System for Fault Detection and Fuse Burn out Recognition at the Distribution Transf ormer | |
| CN205595775U (en) | Parallelly connected node failure's of electric loop logical formula protection device | |
| Krata et al. | The new frequency difference based out of step protection for multiterminal transmission system | |
| Jena et al. | Directional relaying during power swing and single-pole tripping | |
| Golshani et al. | Application of phasor-based functionality to HVDC control in reduced system strength | |
| Jafari et al. | New methods for monitoring neutral grounding resistors |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20200921 Address after: 510620 Tianhe District, Guangzhou, Tianhe South Road, No. two, No. 2, No. Applicant after: Guangzhou Power Supply Bureau of Guangdong Power Grid Co.,Ltd. Address before: 510620 Tianhe District, Guangzhou, Tianhe South Road, No. two, No. 2, No. Applicant before: GUANGZHOU POWER SUPPLY Co.,Ltd. |
|
| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |