CN111190064B - Test method and test system for voltage sag immunization time and storage medium - Google Patents
Test method and test system for voltage sag immunization time and storage medium Download PDFInfo
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- CN111190064B CN111190064B CN202010001241.3A CN202010001241A CN111190064B CN 111190064 B CN111190064 B CN 111190064B CN 202010001241 A CN202010001241 A CN 202010001241A CN 111190064 B CN111190064 B CN 111190064B
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Abstract
The application relates to a test method, a test system and a storage medium of voltage sag immunity time, wherein the device immunity time of each tested device is obtained by identifying each subprocess in an industrial process and the tested device in each subprocess and loading corresponding voltage sag signals to a plurality of tested devices, the process immunity time of each subprocess is obtained through the device immunity time, the process immunity time of the whole industrial process is obtained according to the process immunity time, and the influence degree of the voltage sag on the whole industrial process can be reflected through the test method.
Description
Technical Field
The application relates to the technical field of voltage sag immunity, in particular to a test method and a test system for voltage sag immunity time and a storage medium.
Background
With the development of modern industrial technologies, industrial users tend to use devices with high automation degree, better performance and higher production efficiency, and the devices usually include a large number of power electronic components and are sensitive to the disturbance of short-time power quality, so that the power quality is usually required to be tested, especially the voltage sag test in the power quality.
In order to test the Voltage sag immunity of the sag device, a test platform is usually constructed to test the sag immunity of the device, however, the existing test platform can only measure the Voltage Tolerance Curve (VTC) of a single device, so as to obtain an evaluation of the immunity of the single device, but the evaluation of the single device cannot reflect the influence degree of the Voltage sag on the industrial process.
Disclosure of Invention
The embodiment of the application provides a test method, a test system and a test system for voltage sag immunity time, which can evaluate the influence degree of voltage sag on an industrial process.
A method for testing voltage sag immunization time, comprising:
identifying a plurality of sub-processes of the industrial process and the corresponding tested equipment of each sub-process;
loading corresponding voltage sag signals to a plurality of pieces of tested equipment;
obtaining device immunization time of a plurality of tested devices;
acquiring process immunization time of each subprocess according to the plurality of equipment immunization times;
obtaining an immunization time for the industrial process based on a plurality of the process immunization times.
In one embodiment, the obtaining the process immunization time of each of the sub-processes according to the plurality of device immunization times includes:
obtaining a minimum device immunization time of the plurality of device immunization times of each subprocess, wherein the minimum device immunization time is the process immunization time of the subprocess.
In one embodiment, the obtaining the immunization time of the industrial process according to the process immunization time comprises:
obtaining a minimum process immunization time of a plurality of process immunization times of the industrial process, the minimum process immunization time being the immunization time of the industrial process.
In one embodiment, the obtaining the device immunization time of the device under test includes:
acquiring process parameters of the tested equipment in a voltage sag state;
and acquiring the immunization time of the equipment according to the voltage sag signal and the process parameters.
In one embodiment, the obtaining the device immunization time according to the voltage sag signal and the process parameter includes:
acquiring the occurrence time of the voltage sag state according to the voltage sag signal;
acquiring the fault time of the tested equipment according to the process parameters;
and obtaining the equipment immunization time according to the occurrence time and the fault time.
In one embodiment, the fault time is a time when the process parameter meets a preset condition.
A voltage sag immunization time assay system comprising:
the identification module is used for identifying a plurality of sub-processes of the industrial process and the tested equipment corresponding to each sub-process;
the voltage sag generating module is used for loading corresponding voltage sag signals to the tested devices;
a first obtaining module, configured to obtain device immunization times of the multiple devices under test;
the second acquisition module is used for acquiring the process immunization time of each subprocess according to the plurality of equipment immunization times;
and the third acquisition module is used for acquiring the immunization time of the industrial process according to the plurality of process immunization times.
In one embodiment, the voltage sag generating module comprises:
the voltage sag generator is connected with the tested devices and used for loading corresponding voltage sag signals to the tested devices;
and the power supply with the breaker is connected with the voltage sag generator and is used for supplying power to the voltage sag generator.
A testing system comprising a memory and a processor, the memory having stored therein a computer program which, when executed by the processor, causes the processor to perform the steps of the testing method as described above.
A storage medium having stored thereon a computer program which, when executed by a processor, carries out the steps of the assay method as described above.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of the assay method as described above.
According to the test method, the test system and the storage medium of the voltage sag immunity time, the device immunity time of each tested device is obtained by identifying each subprocess in the industrial process and the tested device in each subprocess and loading the corresponding voltage sag signal to the plurality of tested devices, the process immunity time of each subprocess is obtained through the device immunity time, the process immunity time of the whole industrial process is obtained according to the process immunity times, and the influence degree of the whole industrial process by the voltage sag can be reflected through the test method.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the embodiments or the prior art descriptions will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
FIG. 1 is a flow chart of an experimental method in one embodiment;
FIG. 2 is a flow diagram of step 106 in one embodiment;
FIG. 3 is a detailed flow chart of the test method in one embodiment;
FIG. 4 is a schematic view of the immunity curve of the apparatus of the water pump in one embodiment of the cooling process;
FIG. 5 is a block diagram showing the structure of a test system in one embodiment;
FIG. 6 is a block diagram of a detailed structure of a voltage sag generator in one embodiment;
FIG. 7 is a block diagram illustrating a detailed structure of a first obtaining module in one embodiment;
FIG. 8 is a block diagram showing a detailed structure of the test system in one embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.
FIG. 1 is a flow chart of a method for testing voltage sag immunization time in one embodiment. As shown in fig. 1, the test method includes steps 102 to 108.
The industrial process is an integral test object of the voltage sag immunity time and comprises a plurality of sub-processes, and each sub-process comprises at least one tested device. In one embodiment, the industrial process is a sensitive industrial process below 1000V. The device under test is a voltage sag sensitive element or device capable of producing a withstand characteristic in the event of a voltage sag. The tolerance capabilities of different devices under test vary.
After a given industrial process, a plurality of sub-processes of the industrial process are identified, while the device under test in each sub-process is identified. The sub-processes and the tested devices can be identified from the lowest-layer device of the industrial process, and boundaries of the sub-processes are identified layer by layer upwards according to functions of the devices, so that the industrial process is divided. After the sub-processes are determined, if a plurality of devices correspond to each sub-process, one or more devices which are more important can be selected as the tested devices, wherein the more important devices refer to devices which affect the normal operation of the sub-processes and even the whole industrial process once a fault occurs due to voltage sag.
For example, the industrial process is a chemical process of a chemical plant, the chemical process includes three sub-processes of a cooling process, a reaction process and a control process, and sensitive elements or devices in the cooling process, the reaction process and the control process can be tested devices. For example, the water pump, the oil pump and the variable frequency fan are important devices in the cooling process, and the water pump, the oil pump and the variable frequency fan can be determined to be tested devices.
An industrial process requiring voltage sag immunization time is identified, such that a plurality of sub-processes of the industrial process are identified, and a device under test in each sub-process is determined, via step 102. Further, the setting position of each tested device and the logical connection relation in the industrial process can be determined.
And 104, loading corresponding voltage sag signals to a plurality of pieces of tested equipment.
The voltage sag signal refers to a disturbed voltage source, and the working state of the device under test is affected by the disturbed voltage source. The voltage sag signal includes information such as phase, amplitude, and duration, which may be set according to the specific device type of the device under test. The voltage sag signal is loaded to the tested equipment, so that the working state of the tested equipment is influenced, the process parameter of the tested equipment is changed along with the influence, and a process parameter waveform is generated. So that the subsequent step obtains the immunization time of the tested equipment according to the change of the process parameter or the change of the process parameter waveform.
In one embodiment, the voltage sag signal can be output by the voltage sag generator, and the output time and duration of the voltage sag signal can be controlled by the voltage sag generator. One voltage sag generator may correspond to one device under test, or may correspond to a plurality of devices under test at the same time. The voltage sag generator can be combined with a touch screen to serve as a man-machine interaction mode, and the phase, amplitude and duration of a voltage sag signal are accurately set through the touch screen, so that the operation is simple and convenient, and the accuracy of the test is improved.
In one embodiment, the voltage sag generator may employ a programmable power supply, which may implement a three-phase ac output or a single-phase ac output, or a three-phase dc output or a single-phase dc output. The voltage sag generator is connected with a power supply with a breaker, and the power supply with the breaker is used for supplying power to the voltage sag generator so as to ensure the performance and normal work of the voltage generator.
In an embodiment, when the voltage sag signal is loaded to the device under test, voltage and current information of the power supply of the voltage sag generator and voltage and current information of the voltage sag signal can be acquired, so that whether the current voltage sag signal meets a preset phase, amplitude and duration or not is judged according to the voltage and current information, and accuracy of a test process is ensured.
The device Immunity Time (PIT) refers to a tolerance Time of the device under test when a voltage sag occurs on the power supply side, and the Immunity Time is an index for evaluating the voltage sag tolerance capability of the device under test. Different devices under test may correspond to different device immunization times.
In one embodiment, referring to FIG. 2, step 106 includes step 202 and step 204.
The process parameters refer to relevant physical parameters of each tested device in the industrial process, and the relevant physics comprises one or more of voltage parameters, current parameters and working condition parameters. The working condition parameters can be parameters such as the rotating speed, the torque and the oxygen content of the motor.
In an embodiment, when the same device under test has multiple process parameters, a key process parameter of the multiple process parameters may be obtained, and the device immunization time may be obtained through the key process parameter. The key process parameters refer to key parameters that the tested device has a large influence on the corresponding sub-process.
For example, a chemical process includes three sub-processes of a cooling process, a reaction process and a control process. Wherein, the tested equipment in the cooling process comprises a water pump, an oil pump and a variable frequency fan. The cooling system in the cooling process relies on the water pump drive to supply water, and the normal operating of water pump influences the temperature of reactor cooling water, and then influences whole chemical industry process, consequently, the key process parameter of water pump can be regarded as to the temperature of cooling water. The oil pump is also an important device in the cooling system, and the normal operation of the water pump is ensured mainly by controlling the oil pressure to lubricate the water pump, so that the oil pressure can be used as a key process parameter of the oil pump. The cooling water of the water loop in the cooling system is cooled by the variable frequency fan, the temperature of the cooling water of the water loop directly influences the temperature of the reaction pushing cooling water, and the temperature of the cooling water in the water loop can also be used as a key process parameter of the variable frequency fan.
In one embodiment, the process parameters may be acquired by providing various types of sensors on each device under test, wherein the sensors include voltage sensors, current sensors, temperature sensors, acceleration sensors, and the like.
And step 204, acquiring the immunization time of the equipment according to the voltage sag signal and the process parameters.
Specifically, the occurrence time of the voltage sag state, that is, the initial time of the immunization time of the device, can be obtained according to the voltage sag signal. The fault time of the tested equipment during voltage sag can be obtained according to the value of the process parameter and the waveform change condition, so that the equipment immunity time can be obtained according to the occurrence time and the fault time.
The fault time can be the time when the process parameter of the tested device of the industrial process meets the preset condition after the voltage sag signal with the given amplitude is subjected to. In one embodiment, the predetermined condition may be a time when the process parameter exceeds a corresponding reference threshold. For example, when the process parameter is a voltage parameter, then it is the time of failure of the device under test when the process parameter exceeds a voltage reference threshold. Different process parameter types correspond to different reference thresholds, and in one embodiment, the reference thresholds corresponding to the process parameters can be determined according to the required target output value by establishing a functional relationship between the process parameters and the target output.
In one embodiment, after step 106, the process parameters, the occurrence time of the voltage sag state, the failure time of the device under test, and the obtained device immunization time may be stored and displayed, so that the user can know the test condition. Wherein, the parameter waveform of the process parameter can be recorded and displayed in real time by a waveform recording device with a storage function, such as an oscilloscope, a wave recorder, a sensor and the like; and the change condition of the process parameters, the occurrence time of the voltage sag state, the fault time of the tested equipment, the obtained equipment immunization time and other information can be displayed in real time through the display screen.
And step 108, acquiring the process immunization time of each sub-process according to the plurality of equipment immunization times.
The process immunization time of each subprocess has a correlation with the immunization times of a plurality of devices in the subprocess, and the process immunization time of each subprocess can be obtained according to the immunization times of the plurality of devices.
In one embodiment, step 108 includes: and acquiring the minimum equipment immunization time in the multiple equipment immunization times of each subprocess, wherein the minimum equipment immunization time is the process immunization time of the subprocess. Therefore, the influence degree of the voltage sag on the sub-process can be evaluated according to the voltage sag immunity condition of each tested device of each sub-process.
And step 110, obtaining the immunization time of the industrial process according to the plurality of process immunization times.
The immunization time of the industrial process and the process immunization time of the plurality of sub-processes have a correlation, and the process immunization time of each sub-process can be obtained according to the immunization time of the plurality of devices.
In one embodiment, step 110 includes: obtaining a minimum process immunization time of a plurality of process immunization times of the industrial process, wherein the minimum process immunization time is the immunization time of the industrial process. Therefore, the influence degree of the whole industrial process by the voltage sag can be evaluated according to the voltage sag immunity conditions of a plurality of sub-processes.
Referring to fig. 3, fig. 3 illustrates an example of a method for testing the voltage sag immunity time in a chemical process. The testing method includes steps 302 through 310.
In the cooling system, the temperature of the reaction cooling water is a key process parameter of the water pump, the oil pressure can be used as a key process parameter of the oil pump, and the temperature of the cooling water in the water circulation loop can be used as a key process parameter of the variable frequency fan. In the reaction process, the feed pump is used for controlling the flow rate of reactants, so that the flow rate of the reactants can be used as a key process parameter of the feed pump; the speed-adjustable stirrer is used for stirring reactants, and the stirring speed of the speed-adjustable stirrer determines the speed of chemical reaction, so that the reaction time can be used as a key process parameter of the speed-adjustable stirrer; meanwhile, the reaction process is also influenced by the oxygen content, the oxygen content of the reactor is 20% -30% during normal operation, the chemical reaction is abnormal when the oxygen content exceeds the range, the production process is interrupted, the adjustable speed driver adjusts the oxygen content by controlling inlet air, and the oxygen content of the reactor is ensured to be in the normal range, so the oxygen content can be used as a key parameter of the adjustable speed driver. In the control process, the temperature sensor and the oxygen content sensor are connected by a PLC to control the temperature and the oxygen content, so that the temperature and the oxygen content can be respectively used as key process parameters of the temperature sensor and the oxygen content sensor. Since the UPS is directly a programmable controller, it is generally not affected by voltage sags. Thus, the process parameters of the device under test in each sub-process are shown in the following table:
Taking the cooling process as an example, please refer to fig. 4, the water pump can be stabilized before the voltage sag occursSupplying water to the cooling system, the temperature of the reaction cooling water being maintained at a desired value Tnom，t1Voltage sag occurs at any moment, after time delay of delta T, water supply of the water pump is reduced due to the influence of the voltage sag, and then the temperature begins to deviate from a rated value TnomAt t2At the moment the process parameter crosses the lower acceptable limit value TLlimitAnd the cooling process is interrupted because the normal running state cannot be maintained, so that the immunization time of the equipment of the water pump is measured to be PIT11＝t2-t1. The rest are analogized, so that the immunization time of the oil pump equipment is PIT12And the equipment immunity time corresponding to the variable frequency fan is PIT13。
And 308, respectively acquiring the minimum equipment immunization time in the multiple corresponding equipment immunization times in the cooling process, the reaction process and the control process, thereby respectively acquiring the process immunization times of the cooling process, the reaction process and the control process.
Taking the cooling process as an example, the equipment immunity time of the water pump is PIT11The immunization time of the oil pump is PIT12And the equipment immunity time corresponding to the variable frequency fan is PIT13And satisfy PIT11>PIT13>PIT12And the corresponding equipment immunity time PIT of the oil pump12Namely the cooling sub-process for temporarily reducing the immunization time PIT1. By analogy, the immune time of the reaction process is PIT2The process immunization time of the control process is PIT3。
And 310, acquiring the minimum process immunization time in the cooling process immunization time, the reaction process immunization time and the control process immunization time, wherein the minimum process immunization time is the chemical process immunization time. Suppose PIT1、PIT2And PIT3Satisfies PIT3>PIT2>PIT1Then the industrial process corresponds to a brownout immunization time PIT equal to PIT 1.
In the test method in this embodiment, the device immunity time of each device under test is obtained by identifying each sub-process in the industrial process and the device under test in each sub-process and loading the corresponding voltage sag signal to the multiple devices under test, the process immunity time of each sub-process is obtained through the device immunity time, and then the process immunity time of the whole industrial process is obtained according to the multiple process immunity times, so that the degree of influence of the voltage sag on the whole industrial process can be reflected through the test method.
It should be understood that although the various steps in the flow charts of fig. 1-3 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 1-3 may include multiple sub-steps or multiple stages that are not necessarily performed at the same time, but may be performed at different times, and the order of performance of the sub-steps or stages is not necessarily sequential, but may be performed in turn or alternating with other steps or at least some of the sub-steps or stages of other steps.
Referring to fig. 5, fig. 5 is a block diagram showing a configuration of a test system for performing the test method according to the above embodiment.
For details, please refer to fig. 1 and the related description in the embodiment corresponding to fig. 1, which are not repeated herein. In this embodiment, the testing system includes an identification module 502, a voltage sag generation module 504, a first obtaining module 506, a second obtaining module 508, and a third obtaining module 510. Specifically, the method comprises the following steps:
the identification module 502 is used for identifying a plurality of sub-processes of the industrial process and the corresponding tested equipment of each sub-process.
The voltage sag generating module 504 is configured to load corresponding voltage sag signals to the multiple devices under test.
A first obtaining module 506, configured to obtain device immunization times of multiple devices under test.
A second obtaining module 508, configured to obtain the process immunization time of each sub-process according to the multiple device immunization times.
A third obtaining module 510 for obtaining an immunization time of the industrial process according to the process immunization time.
In the test system provided in this embodiment, an industrial process is determined by the identification module 402, each sub-process in the industrial process and a device to be tested in each sub-process are identified, the voltage sag generation module 404 provides a voltage sag signal to each device to be tested, so that the acquisition module 406 acquires the device immunity time of each device to be tested, the analysis module 408 acquires the process immunity time of each sub-process through the device immunity time and the first mapping relationship, and acquires the process immunity time of the entire industrial process according to the process immunity times and the second mapping relationship, thereby reflecting the influence degree of the voltage sag on the entire industrial process through a test method.
In one embodiment, referring to fig. 6, the voltage sag generator module 504 includes a voltage sag generator 602 and a power supply with circuit breaker 604.
The voltage sag generator 602 is connected to the multiple devices under test, and configured to apply corresponding voltage sag signals to the multiple devices under test.
A power supply 604 with a circuit breaker is connected to the voltage sag generator 602 for providing power to the voltage sag generator 602.
In an embodiment, referring to fig. 7, the first obtaining module 506 includes an acquiring unit 702 and an analyzing unit 704.
The acquisition unit 702 is configured to acquire process parameters of the device under test in a voltage sag state;
and the analysis unit 704 is used for acquiring the immunization time of the equipment according to the voltage sag signal and the process parameters.
The acquisition unit 702 and the analysis unit 704 are configured to execute steps in the embodiment corresponding to fig. 2, please refer to fig. 2 and the related description in the embodiment corresponding to fig. 2, which are not described herein again.
Please refer to fig. 8, wherein fig. 8 illustrates a system for testing the voltage sag immunity time in a chemical process. The testing system comprises an identification module 802, a voltage sag generation module 804 and an acquisition and analysis device 806.
The identification module 802 is used for identifying that a plurality of sub-processes of the chemical process are respectively a cooling process, a reaction process and a control process, and tested equipment in each sub-process is respectively a water pump, an oil pump, a variable frequency fan, a feeding pump, a speed-adjustable stirrer, a speed-adjustable driver, a temperature measurement sensor, an oxygen content measurement sensor and a PLC with a UPS.
The voltage sag generating module 804 includes a power supply 804a with a breaker and a voltage sag generator 804b, the power supply 804a with the breaker provides power to the voltage sag generator 804b, and the voltage sag generator 804b outputs a voltage sag signal to each device under test in the chemical process.
The collection and analysis device 806 integrates functions of the first acquisition module, the second acquisition module, and the third acquisition module, and is configured to acquire process parameters of each device under test, and acquire the device immunization time of each device according to the process parameters, thereby further acquiring the process immunization time of each sub-process and the immunization time of the chemical process. Further, the collecting and analyzing device 806 can also collect the voltage and current information of the power source 804a with the circuit breaker and the voltage and current information of the voltage sag generator 804b, so as to determine whether the current voltage sag signal conforms to the preset phase, amplitude and duration according to the above voltage and current information, thereby ensuring the accuracy of the test process.
The division of the modules in the test system is only for illustration, and in other embodiments, the test system may be divided into different modules as needed to complete all or part of the functions of the test system.
For the specific limitations of the assay system, reference may be made to the limitations of the assay method described above, which are not described in detail herein. The various modules in the test system described above may be implemented in whole or in part by software, hardware, and combinations thereof. The modules can be embedded in a hardware form or independent from a processor in the computer device, and can also be stored in a memory in the computer device in a software form, so that the processor can call and execute operations corresponding to the modules.
The embodiment of the present application further provides a testing system, which includes a memory and a processor, where the memory stores a computer program, and when the computer program is executed by the processor, the processor is enabled to execute the steps of the testing method according to the above embodiment.
The embodiment of the application also provides a computer readable storage medium. One or more non-transitory computer-readable storage media containing computer-executable instructions that, when executed by one or more processors, cause the processors to perform the steps of the assay method in any of the embodiments described above.
Any reference to memory, storage, database, or other medium used herein may include non-volatile and/or volatile memory. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM), which acts as external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms, such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), Enhanced SDRAM (ESDRAM), synchronous Link (Synchlink) DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and bus dynamic RAM (RDRAM).
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present application. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (8)
1. A method for testing voltage sag immunization time, comprising:
identifying a plurality of sub-processes of the industrial process and the corresponding tested equipment of each sub-process;
loading corresponding voltage sag signals to a plurality of pieces of tested equipment;
obtaining device immunization time of a plurality of tested devices;
acquiring process immunization time of each subprocess according to the plurality of equipment immunization times;
obtaining an immunization time for the industrial process from a plurality of the process immunization times;
wherein the voltage sag signal is output by a voltage sag generator, and the loading of the plurality of devices under test with corresponding voltage sag signals includes:
when the voltage sag signal is loaded to the tested equipment, acquiring voltage and current information of a power supply of the voltage sag generator and voltage and current information of the voltage sag signal;
judging the current voltage sag signal according to the voltage and current information of the voltage sag generator power supply and the voltage and current information of the voltage sag signal;
wherein obtaining device immunization times for a plurality of said devices under test comprises:
acquiring process parameters of the tested equipment in a voltage sag state, and acquiring key process parameters of a plurality of process parameters when the same tested equipment has the plurality of process parameters;
acquiring the occurrence time of the voltage sag state according to the voltage sag signal;
acquiring the fault time of the tested equipment according to the key process parameters;
and obtaining the equipment immunization time according to the occurrence time and the fault time.
2. The method of claim 1, wherein said obtaining a procedure immunization time for each of said sub-procedures from a plurality of said device immunization times comprises:
obtaining a minimum device immunization time of the device immunization times of each subprocess, wherein the minimum device immunization time is the process immunization time of the subprocess.
3. The method of claim 1, wherein obtaining the immunization schedule for the industrial process based on the process immunization schedule comprises:
obtaining a minimum process immunization time of a plurality of process immunization times of the industrial process, the minimum process immunization time being the immunization time of the industrial process.
4. The method of claim 1, wherein the fault time is a time at which the process parameter meets a preset condition.
5. A system for testing the duration of a voltage sag immunization, comprising:
the identification module is used for identifying a plurality of sub-processes of the industrial process and the tested equipment corresponding to each sub-process;
the voltage sag generating module is used for loading corresponding voltage sag signals to the tested devices;
a first obtaining module, configured to obtain device immunization times of the multiple pieces of equipment under test;
the second acquisition module is used for acquiring the process immunization time of each subprocess according to the plurality of equipment immunization times;
the third acquisition module is used for acquiring the immunization time of the industrial process according to the plurality of process immunization times;
the acquisition and analysis device is used for acquiring the voltage and current information of the voltage sag generation module and the voltage and current information of the voltage sag signal, and judging the current voltage sag signal according to the voltage and current information of the voltage sag generation module and the voltage and current information of the voltage sag signal;
the first obtaining module is further configured to obtain process parameters of the device under test in the voltage sag state, and when the same device under test has multiple process parameters, obtain key process parameters of the multiple process parameters; acquiring the occurrence time of the voltage sag state according to the voltage sag signal; acquiring the fault time of the tested equipment according to the key process parameters; and obtaining the equipment immunization time according to the occurrence time and the fault time.
6. The testing system of claim 5, wherein the voltage sag generation module comprises:
the voltage sag generator is connected with the tested devices and used for loading corresponding voltage sag signals to the tested devices;
and the power supply with the breaker is connected with the voltage sag generator and is used for supplying power to the voltage sag generator.
7. A testing system comprising a memory and a processor, the memory having stored therein a computer program which, when executed by the processor, causes the processor to carry out the steps of the testing method of any one of claims 1 to 4.
8. A storage medium having stored thereon a computer program, characterized in that the computer program, when being executed by a processor, carries out the steps of the assay method according to one of claims 1 to 4.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106384199A (en) * | 2016-09-19 | 2017-02-08 | 国网四川省电力公司经济技术研究院 | Voltage sag assessment method based on process immunization uncertainty |
| CN109064026A (en) * | 2018-08-03 | 2018-12-21 | 福州大学 | A kind of industrial process procedure parameter immunization time appraisal procedure considering the power supply system method of operation |
| CN109856505A (en) * | 2019-01-11 | 2019-06-07 | 广州供电局有限公司 | The immunization time detection method of voltage dip |
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| US20050007713A1 (en) * | 2003-07-08 | 2005-01-13 | Wen-Chang Chang | Control circuit of voltage sag immunity |
| KR101445087B1 (en) * | 2013-05-01 | 2014-10-02 | 한국전기연구원 | A voltage sag generation equipments for LVRT test |
| CN103424654B (en) * | 2013-08-02 | 2016-08-10 | 华南理工大学 | A kind of appraisal procedure of voltage dip sensitivity of sensitive equipment |
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| CN106384199A (en) * | 2016-09-19 | 2017-02-08 | 国网四川省电力公司经济技术研究院 | Voltage sag assessment method based on process immunization uncertainty |
| CN109064026A (en) * | 2018-08-03 | 2018-12-21 | 福州大学 | A kind of industrial process procedure parameter immunization time appraisal procedure considering the power supply system method of operation |
| CN109856505A (en) * | 2019-01-11 | 2019-06-07 | 广州供电局有限公司 | The immunization time detection method of voltage dip |
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