CN109783850B - Residual life evaluation and reliability analysis method for high-acceleration stress screening test - Google Patents
Residual life evaluation and reliability analysis method for high-acceleration stress screening test Download PDFInfo
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Abstract
The invention belongs to the technical field of high-acceleration stress screening tests and discloses a method for evaluating residual life and analyzing reliability of a high-acceleration stress screening test; carrying out solid modeling by adopting finite element analysis software; loading a screening object model according to a damage limit and a working limit in a high accelerated life screening (HASS) test; carrying out finite element simulation analysis under temperature and vibration stress respectively according to the determined damage limit and working limit to obtain damage factors and equivalent life under different stress levels; sorting, counting and analyzing failure modes and failure time of the screened object, and selecting a reliability analysis model; and constructing comprehensive accumulated damage factors under temperature and vibration stress, calculating equivalent life to obtain a reliability model under the HASS profile, and performing residual life evaluation and reliability analysis on the object subjected to the HASS test.
Description
Technical Field
The invention belongs to the technical field of high-acceleration stress screening tests, and particularly relates to a method for evaluating residual life and analyzing reliability of a high-acceleration stress screening test.
Background
Currently, the current state of the art commonly used in the industry is such that: the reliability of the product is designed, manufactured and managed, and various uncertainties in the manufacturing process of the product cause that the product has defects and hidden dangers more or less, so that the reliability of the produced product has great difference, and therefore 100% screening needs to be carried out on the product, so that early faults caused by raw materials, poor components, process defects and other reasons are eliminated, and the purpose of improving the quality and the reliability of the product is achieved. The High Accelerated Stress Screening (HASS) is obtained according to a certain design criterion by adopting comprehensive Stress such as temperature circulation, random vibration and the like and Stress magnitude value much higher than the using environment to accelerate Screening of products, and combining the actual situation of the products, the method can meet the requirements of quickly, economically and effectively exciting various defects which can cause product failure under the using environment and not excessively consuming the effective service life of the products. The HASS test profile is composed of a plurality of cycle periods of combined action of vibration, temperature and other environmental stresses between two limit temperatures. The general method for evaluating the remaining life of the high-speed screening test is to obtain the service life of the intact product and the service life of the screened product, so that the influence of HASS on the service life of the screened product can be accurately compared and evaluated, but the obtaining of the life data is difficult and cannot be carried out on newly-researched products. Thus, the most common method currently used for profile verification is to apply 20 HASS profiles to a subject, theoretically suggesting that if the subject fails after the test, the product after one profile has at least 95% remaining life. In the profile design of HASS and the practical production of products, the development and further development of HASS are hindered to some extent due to the limitations of technology and expenses. The existing service life evaluation test of the high-acceleration screening test has high cost and is difficult to ensure the precision and the reliability.
In summary, the problems of the prior art are: the existing service life evaluation test of the high-acceleration screening test has high cost and low precision and reliability.
The difficulty and significance for solving the technical problems are as follows: for electrical components, obtaining product life data is often difficult, and only a small amount of sample data can be obtained by using a traditional method, and the cost is high. The resulting lifetime assessment is only an approximation and does not give a reliability index. How to accurately evaluate the residual service life of the electric appliance component and provide a corresponding reliability index has great significance for health management and maintenance decision of the electric appliance component.
Disclosure of Invention
Aiming at the problems in the prior art, the invention provides a residual life evaluation and reliability analysis method for a high-acceleration stress screening test.
The invention is realized in such a way that a method for evaluating the residual life and analyzing the reliability of a high-acceleration stress screening test comprises the following steps:
step one, carrying out solid modeling by adopting finite element analysis software, and respectively carrying out geometric modeling on a resistor, a capacitor, an inductor, an integrated circuit, an electric connector, a welding point, a wire connection, a mechanical connection and a circuit board and a chassis;
step two, loading the corrected model according to the result of the HASS test, and loading the temperature and the vibration stress in a circulating and stepping mode;
calculating damage factors and equivalent lives under two stresses according to simulation results under temperature and vibration stress;
step four, sorting and counting failure modes and equivalent lives of the screened objects, finding out that main failure modes are component performance failure, thread pair falling off and component pin fracture through analyzing stress and deformation data, and selecting a proper reliability analysis model on the basis of failure mode analysis, wherein the following common failure modes are adopted: a distribution function method (including exponential distribution, two/three parameter weibull distribution, normal distribution, lognormal distribution, etc.); stress-intensity interference theory; nominal stress method, stress strain method, etc.;
step five, constructing comprehensive accumulated damage factors under temperature and vibration stress, calculating equivalent life to obtain a reliability model under an HASS section, and performing residual life evaluation and reliability analysis on the object subjected to the HASS test;
furthermore, before the finite element analysis software is adopted for solid modeling, continuous stress and deformation data acquisition needs to be carried out on the parts with concentrated stress and easy failure, and the test process and results of HASS are utilized, including the performance and failure mode of a test object.
Further, when the test object is subjected to grid division in the step one, stress concentration and volatile effective parts are refined according to actual HASS section data and object characteristics, the model is corrected according to the actual HASS section data, the established model is subjected to simulation analysis respectively according to the load loading mode of the actual HASS, the change relation between parameters and the analysis result is found by comparing the test result, the parameters are subjected to fine adjustment, and model correction is carried out.
Further, a temperature operating limit and a vibration operating limit of the operating limits;
the temperature working limit comprises an upper temperature limit, a lower temperature limit and a temperature change rate;
vibration operating limits including magnitude of random vibration and vibration time.
Further, the damage factors are respectively obtained under different magnitudes of temperature and vibration stress levels;
another object of the present invention is to provide an application method of an electrical component using the method for evaluating remaining life and analyzing reliability using a high accelerated stress screening test, the application method of the electrical component including the steps of:
analyzing and showing that the failure modes of the electromechanical assembly are component performance failure, thread pair falling off and component pin fracture by using HALT and HASS test data of a sample piece;
step two, simulation modeling, namely acquiring continuous stress and deformation data of stress concentrated and easy-to-fail parts, carrying out solid modeling on a test object by adopting finite element analysis software, applying a grid subdivision function of the finite element software to pins, welding spot parts and thread pairs, selecting the parts needing grid subdivision, setting horizontal parameters needing subdivision, finishing grid refinement in the software, comparing test results and correcting the model; the vibration limit in the corrected simulation model is 23Grms, the temperature damage limit is-50-80 ℃, and stress loading parameters in the simulation model are adjusted according to comparative analysis of simulation and HASS test results;
thirdly, calculating damage factors by adopting the stress loading parameters obtained in the third step and utilizing an accumulated damage theory according to a simulation analysis result;
reliability modeling is carried out, and an exponential Weibull distribution function model is established;
step five, obtaining equivalent lives under different stress levels according to the damage factors obtained in the step three and the reliability analysis model established in the step four, and carrying out reliability model distribution inspection on the test piece;
step six, constructing a comprehensive damage factor according to the damage factors under the temperature and the vibration stress obtained in the step three, calculating the equivalent life, obtaining a reliability model under an HASS section by adopting the reliability model distribution inspection result in the step six, and carrying out residual life evaluation and reliability analysis on the electronic product subjected to the HASS test;
further, in step two, the stress value parameters are finally adjusted as follows: the temperature cycle range is-50-80 ℃, the initial temperature is 20 ℃ at room temperature, the temperature change rate is 60 ℃/min, the temperature cycle is 2 times/cycle, the initial magnitude of random vibration is 5Grms, the maximum magnitude is 10Grms, and the detention time is 10min;
further, the reliability model under the HASS profile finally obtained in the step six is an exponential weibull model, and the model parameters are as follows: position parameter μ =5714.422, shape parameter α =1.15, shape parameter γ =3.3, and scale parameter η =1994.047. After one HASS profile, the percentage of remaining life of the appliance assembly was p =0.9914 and the reliability was R =0.994.
Another object of the present invention is to provide an automatic switching apparatus using the method for evaluating remaining life and analyzing reliability of the high accelerated stress screening test.
The invention also aims to provide a non-automatic switching electric appliance applying the residual life evaluation and reliability analysis method of the high-acceleration stress screening test.
In summary, the advantages and positive effects of the invention are: in the physical test, the existing evaluation method for the residual service life of the HASS test is obtained by repeatedly carrying out stress loading on the physical test; the method of the invention is directly calculated and determined by the reliability model, and the consumption of the real object can be reduced by more than 80%; HASS reliability quantification, the existing method for determining the residual service life of the HASS test lacks accurate quantification indexes and cannot provide corresponding reliability; the method of the invention utilizes a reliability method to calculate the residual life, thereby having accurate quantitative index and being capable of providing corresponding reliability.
Drawings
Fig. 1 is a flowchart of a method for evaluating remaining life and analyzing reliability of a high-acceleration stress screening test according to an embodiment of the present invention.
Fig. 2 is a diagram of an example of a cross-section of an actual HASS according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail with reference to the following embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
The method aims at the problems that the service life evaluation test of the existing high-acceleration screening test is high in cost and low in precision and reliability. The method of the invention utilizes a reliability method to calculate the residual life, thereby having accurate quantitative index and being capable of providing corresponding reliability.
The following detailed description of the principles of the invention is provided in connection with the accompanying drawings.
As shown in fig. 1, the method for evaluating remaining life and analyzing reliability of a high-acceleration stress screening test provided by the embodiment of the invention comprises the following steps:
s101: analyzing the existing HASS section and HALT experimental results of the sample piece, respectively carrying out random vibration test and comprehensive environment test on the sample piece, wherein the results show that the main failure modes of the electromechanical assembly are component performance failure, thread pair falling off and component pin fracture;
s102: simulation modeling, namely, continuously acquiring stress and deformation data of stress concentrated and easy-to-fail parts, continuously acquiring the stress and deformation data of the stress concentrated and easy-to-fail parts, adopting finite element analysis software to perform solid modeling on a test object, applying a grid subdivision function of the finite element software to pins, welding spot parts and thread pairs, selecting the parts needing grid subdivision, setting horizontal parameters needing subdivision, finishing grid subdivision in the software, comparing test results and correcting the model; loading the corrected model according to the general form of the HASS test, analyzing the failure form and the failure part of the test object, and determining the failure limit and the working limit of the test object by referring to the result of the small amount of HALT test in the step S101;
s103: calculating a damage factor according to a simulation analysis result by using the stress loading parameter obtained in the S102 and an accumulative damage theory;
s104: reliability modeling, namely referring to the failure mode analysis result in the step one before reliability modeling in view of the diversity of the reliability analysis method, and selecting a proper reliability analysis model on the basis of failure mode analysis;
s105: obtaining equivalent life under different stress levels according to the damage factor obtained in the S104 and the reliability analysis model established in the step five, and carrying out reliability model distribution inspection on the test piece;
s106: and constructing a comprehensive damage factor according to the damage factors under the temperature and the vibration stress obtained in the step S103, calculating the equivalent life, obtaining a reliability model under the HASS section by adopting the reliability model distribution test result in the step S105, evaluating the residual life of the electronic product subjected to the HASS test, obtaining the residual life obtained by the distribution function, and giving corresponding reliability.
The construction method of the high-acceleration stress screening test section comprises the steps of analyzing HASS data and a small amount of HALT data, and finally realizing a residual life evaluation method of a HASS test.
Referring to a general reliability method of the residual life, the invention compares the HASS data with the HALT test between simulation results, further adjusts the loading stress, and finally determines that the residual life has a reliability index, and the specific steps are as follows:
the method comprises the following steps: analyzing the existing HASS section and HALT experimental results of the sample piece, respectively carrying out random vibration test and comprehensive environment test on the sample piece, wherein the results show that the main failure modes of the electromechanical assembly are component performance failure, thread pair falling off and component pin fracture;
step two: the method comprises the steps of carrying out continuous stress and deformation data acquisition on stress concentration and easy failure parts, carrying out solid modeling on a test object by adopting finite element analysis software, applying a grid subdivision function of the finite element software to pins, welding spot parts and thread pairs, selecting the parts needing grid subdivision, setting horizontal parameters needing subdivision, finishing grid refinement in the software, comparing test results and correcting the model; loading the corrected model according to the general form of the HASS test, analyzing the failure form and the damage part of the test object, and determining the damage limit of the test object by referring to the result of the small amount of HALT test in the step one;
thirdly, calculating a damage factor according to a simulation analysis result by adopting the stress loading parameter obtained in the second step and utilizing an accumulated damage theory, wherein the damage factor is obtained by a MINER accumulated damage criterion;
step four, reliability modeling, wherein in view of the diversity of the reliability analysis method, before the reliability modeling, the failure mode of the test object needs to be sorted, counted and analyzed, the failure mode of the test object can be obtained through the step one, and on the basis of the failure mode analysis, a proper reliability analysis model is selected, and the following types are commonly used: a distribution function method (including exponential distribution, two/three parameter weibull distribution, normal distribution, lognormal distribution, etc.); stress-intensity interference theory; nominal stress method, stress strain method, etc.;
step five, obtaining equivalent life under different stress levels according to the damage factor obtained in the step three and the reliability analysis model established in the step four, converting the equivalent life according to a NELSON equivalent criterion, and carrying out reliability model distribution inspection on the test piece;
step six, constructing a comprehensive damage factor according to the damage factors under the temperature and the vibration stress obtained in the step three, calculating the equivalent life, obtaining an index Weibull model under the HASS section by adopting the reliability model distribution inspection result in the step five, and evaluating the residual life of the electronic product subjected to the HASS test to obtain the residual life obtained by a distribution function and provide corresponding reliability;
the use of the method is further described below with a typical electromechanical assembly as the test object. The shell of the selected typical electromechanical component is an all-aluminum chassis, a circuit board with an amplifying function is arranged in the shell, and the shell is fixedly connected through bolts, and the specific analysis process is as follows.
The method comprises the following steps: analyzing the existing HASS section and HALT experimental results of the sample piece, respectively carrying out random vibration test and comprehensive environment test on the sample piece, wherein the results show that the main failure modes of the electromechanical assembly are component performance failure, thread pair falling off and component pin fracture;
step two: simulation modeling, namely acquiring continuous stress and deformation data of stress concentrated and easy-to-fail parts, performing solid modeling on a test object by adopting finite element analysis software, applying a grid subdivision function of the finite element software to pins, welding spot parts and a thread pair, selecting the parts needing grid subdivision, setting horizontal parameters needing subdivision, finishing grid refinement in the software, comparing test results and correcting the model; loading the corrected model according to the general form of the HASS test, analyzing the failure form and the damage part of the test object, and determining the damage limit of the test object by referring to the result of the small amount of HALT test in the step one; the stress loading parameters finally determined are as follows: the temperature cycle range is-50-80 ℃, the initial temperature is 20 ℃ at room temperature, the temperature change rate is 60 ℃/min, the temperature cycle is 2 times/cycle, the initial magnitude of random vibration is 5Grms, the highest magnitude is 10Grms, and the residence time is 10min;
thirdly, calculating a damage factor according to a simulation analysis result by adopting the loading stress parameter of the second step and utilizing an accumulated damage theory, wherein the damage factor is obtained by a MINER accumulated damage criterion;
step four, reliability modeling, wherein in view of the diversity of the reliability analysis method, before the reliability modeling, the failure mode of the test object needs to be sorted, counted and analyzed, the failure mode of the test object can be obtained through the step one, and on the basis of the failure mode analysis, a proper reliability analysis model is selected, wherein the following common methods are adopted: a distribution function method (including exponential distribution, two/three parameter weibull distribution, normal distribution, lognormal distribution, etc.); stress-intensity interference theory; nominal stress method, stress strain method, etc.;
step five, obtaining equivalent life under different stress levels according to the damage factor obtained in the step three and the reliability analysis model established in the step four, converting the equivalent life according to a NELSON equivalent criterion, and carrying out reliability model distribution inspection on the test piece;
step six, constructing a comprehensive damage factor according to the damage factors under the temperature and the vibration stress obtained in the step three, calculating the equivalent life, adopting the reliability model distribution inspection result in the step five, and finally obtaining a reliability model under the HASS section as an index Weibull model, wherein the model parameters are as follows: position parameter μ =5714.422, shape parameter α =1.15, shape parameter m =3.3, and scale parameter η =1994.047. After one HASS profile, the remaining life percentage p =0.9914 of the appliance assembly, reliability R =0.994.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.
Claims (10)
1. A method for evaluating residual life and analyzing reliability of a high-acceleration stress screening test is characterized by comprising the following steps of:
step one, carrying out solid modeling by adopting finite element analysis software, and respectively carrying out geometric modeling on a resistor, a capacitor, an inductor, an integrated circuit, an electric connector, a welding point, a wire connection, a mechanical connection and a circuit board and a chassis;
step two, loading the corrected model according to the result of the HASS test, and loading the temperature and the vibration stress in a circulating and stepping mode;
calculating damage factors and equivalent lives under two stresses according to simulation results under temperature and vibration stress;
step four, sorting, counting and analyzing the failure modes and equivalent lives of the screened objects, and selecting a reliability distribution model;
and step five, constructing comprehensive accumulated damage factors under temperature and vibration stress, calculating equivalent life to obtain a reliability model under the HASS profile, and performing residual life evaluation and reliability analysis on the object subjected to the HASS test.
2. The method for assessing residual life and analyzing reliability of a high-acceleration stress screening test as claimed in claim 1, wherein before the finite element analysis software is used for the solid modeling, continuous stress and deformation data acquisition is required for stress concentration and failure-prone parts, and the HASS test process and results are used, including the performance and failure mode of the test object.
3. The method for evaluating remaining life and analyzing reliability of a high-acceleration stress screening test as claimed in claim 1, wherein in the step one, when the grid division is performed on the test object, stress concentration and volatile effect parts are refined according to the actual HASS profile data and the object characteristics, the model is corrected according to the actual HASS profile data, the established model is subjected to simulation analysis according to the load loading mode of the actual HASS, and the change relationship between the parameters and the analysis result is found by comparing the test result, and the parameters are fine-tuned for model correction.
4. The method for residual life assessment and reliability analysis of high accelerated stress screening test of claim 1, wherein the working limits comprise temperature working limits and vibration working limits;
the temperature working limit comprises an upper temperature limit, a lower temperature limit and a temperature change rate;
and the vibration working limit comprises the magnitude and the vibration time of random vibration.
5. The method for residual life assessment and reliability analysis in high accelerated stress screening test of claim 1, wherein the damage factor is obtained separately at different magnitude of temperature and vibration stress levels.
6. A method for applying an electrical component using the method for evaluating remaining life and analyzing reliability of a high accelerated stress screening test of claim 1, wherein the method for applying an electrical component comprises the steps of:
analyzing and showing that the failure mode of the electromechanical assembly is element performance failure, thread pair falling off and element pin fracture by using HALT and HASS test data of a sample piece;
step two, simulation modeling, namely, continuously acquiring stress and deformation data of the parts with concentrated stress and easy failure, carrying out solid modeling on a test object by adopting finite element analysis software, applying a grid subdivision function of the finite element software to the pin, the welding spot part and the thread pair, selecting the parts needing grid subdivision, setting horizontal parameters needing subdivision, finishing grid refinement in the software, comparing test results and correcting the model; the vibration limit in the corrected simulation model is 23Grms, the temperature damage limit is-50-80 ℃, and stress loading parameters in the simulation model are adjusted according to comparative analysis of simulation and HASS test results;
thirdly, calculating damage factors according to simulation analysis results by adopting the stress loading parameters obtained in the third step and utilizing an accumulated damage theory;
reliability modeling is carried out, and an exponential Weibull distribution function model is established;
step five, obtaining equivalent lives under different stress levels according to the damage factors obtained in the step three and the reliability analysis model established in the step four, and carrying out reliability model distribution inspection on the test piece;
and step six, constructing a comprehensive damage factor according to the damage factors under the temperature and the vibration stress obtained in the step three, calculating the equivalent life, obtaining a reliability model under the HASS section by adopting the reliability model distribution inspection result in the step six, and carrying out residual life evaluation and reliability analysis on the electronic product subjected to the HASS test.
7. The method for applying an electrical component according to claim 6, wherein in step two, the stress value parameter is finally adjusted as follows: the temperature cycle range is-50-80 ℃, the initial temperature is 20 ℃ at room temperature, the temperature change rate is 60 ℃/min, the temperature cycle is 2 times/cycle, the initial magnitude of random vibration is 5Grms, the highest magnitude is 10Grms, and the residence time is 10min.
8. The method for applying an electrical component according to claim 6, wherein the reliability model under the HASS profile obtained in the step six is an exponential Weibull model, and the model parameters are as follows: position parameter μ =5714.422, shape parameter α =1.15, shape parameter γ =3.3, scale parameter η =1994.047; after one HASS profile, the percentage of remaining life of the appliance assembly was p =0.9914 and the reliability was R =0.994.
9. An automatic switching electric appliance applying the method for evaluating the residual service life and analyzing the reliability of the high accelerated stress screening test of any one of claims 1 to 5.
10. A non-automatic switching electric appliance applying the residual life evaluation and reliability analysis method of the high accelerated stress screening test of any one of claims 1 to 5.
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