CN109783850A - The residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest - Google Patents

The residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest Download PDF

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CN109783850A
CN109783850A CN201811499195.3A CN201811499195A CN109783850A CN 109783850 A CN109783850 A CN 109783850A CN 201811499195 A CN201811499195 A CN 201811499195A CN 109783850 A CN109783850 A CN 109783850A
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analysis
hass
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CN109783850B (en
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王海东
孔宪光
马洪波
钟健飞
杨胜康
王肇喜
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Xidian University
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Abstract

The invention belongs to highly accelerated stress screeningtest technical fields, disclose the residual life evaluation and analysis method for reliability of a kind of highly accelerated stress screeningtest;Solid modelling is carried out using finite element analysis software;To screening object model according to high accelerated aging screen (HASS) test in the limit of rupture and working limit load;Finite Element Simulation Analysis is carried out at temperature and vibration stress respectively according to the determining limit of rupture and working limit, obtains the damage factor and equivalent lifetime under different stress levels;Screening object failure mode and out-of-service time are carried out to arrange statistics and analysis, select reliability analysis model;The synthesis progressive damage factor under temperature and vibration stress is constructed, equivalent lifetime is calculated, obtains the reliability model under HASS section, residual life evaluation and fail-safe analysis are carried out to the object by HASS test.

Description

The residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest
Technical field
The invention belongs to highly accelerated stress screeningtest technical field more particularly to a kind of highly accelerated stress screeningtests Residual life evaluation and analysis method for reliability.
Background technique
Currently, the prior art commonly used in the trade is such that the reliability of product is to design, manufacture, managing Out, the various uncertainties in manufacture course of products cause the more or less existing defects of product and hidden danger, so that producing The reliability of product there are great differences, thus need to carry out product 100% screening, to reject due to raw material, no Initial failure caused by good component, defective workmanship and other reasons achievees the purpose that improve product quality and reliability.It is high Accelerated stress screens (Highly Accelerated Stress Screening, HASS) and uses temperature cycles and random vibration Etc. combined stresses and the stress level more much higher than use environment acceleration screening is carried out to product, be the practical feelings of combination product Condition, meet can either quickly, it is economical, effectively inspire all kinds of defects that may cause product failure under use environment, again In the case that the useful life of not excessive consumable products requires, according to obtained from certain design criteria.HASS test profile Figure is made of the cycle period of the environmental stress comprehensive functions such as several vibrations between two limiting temperatures and temperature.It is high The conventional method for accelerating the assessment of the remaining life of screening test is to obtain the service life of intact product and making for product after sieve With the service life, could accurately compare in this way and assess HASS is influenced to by sieve life of product, but these lifetime datas is It is difficult, can not be carried out for product to newly grinding.Therefore, verifying most common method currently used for section is to research pair As applying 20 HASS sections, it could be theoretically argued that if research object fails after test, the product after a section At least there is 95% remaining life.In the actual production of the Section Design and product of HASS, due to technology and the limit of funds System hinders the development and further development of HASS to a certain extent.Existing high acceleration screening test life appraisal experimentation cost It is high, and the problem of be difficult to ensure precision and reliability.
In conclusion problem of the existing technology is: existing high acceleration screening test life appraisal experimentation cost is high, And precision and reliability are lower.
It solves the difficulty and meaning of above-mentioned technical problem: for electric appliance component, obtaining life of product data and often deposit In certain difficulty, a small amount of sample data can only obtain with conventional method, and with high costs.Obtained life appraisal can only be Approximation can not provide reliability index.How to realize and the remaining life of electric appliance component is accurately assessed, and provides Corresponding RELIABILITY INDEX, health control and maintenance decision for the component of electric appliance are all of great significance.
Summary of the invention
In view of the problems of the existing technology, the present invention provides a kind of remaining life of highly accelerated stress screeningtest to comment Estimate and analysis method for reliability.
The invention is realized in this way a kind of residual life evaluation of highly accelerated stress screeningtest and fail-safe analysis side Method, residual life evaluation and the analysis method for reliability of the highly accelerated stress screeningtest include:
Step 1, using finite element analysis software carry out solid modelling, respectively to resistance, capacitor, inductance, integrated circuit, Electric connector, pad, conducting wire connection, mechanical attachment, circuit board and cabinet carry out Geometric Modeling;
Step 2 loads modified model according to the result that HASS is tested, and temperature and vibration stress are using circulation It is loaded with step-by-step system;
Step 3 calculates the damage factor under two kinds of stress and waits according to the simulation result at temperature and vibration stress Imitate the service life;
Step 4 carries out arrangement statistics to screening object failure mode and equivalent lifetime, passes through analysis stress and deformation number It is found that main failure forms are component performance failures, and screw thread pair falls off, component pin fracture, in failure mode analysis (FMA) On the basis of, suitable reliability analysis model is selected, there are commonly following several: distribution function method (including exponential distribution, two/ Three-parameter Weibull distribution, normal distribution, logarithm normal distribution etc.);Stress-strength Interference is theoretical;Nominal stress method, stress Strain Method etc.;
Step 5 constructs the synthesis progressive damage factor under temperature and vibration stress, calculates equivalent lifetime, obtains HASS and cut open Reliability model under face carries out residual life evaluation and fail-safe analysis to the object by HASS test;
Further, it is needed before carrying out solid modelling using finite element analysis software to stress concentration and vulnerable portion Position carries out continuous stress and deformation data acquisition, utilizes the test process and as a result, the performance including subjects, mistake of HASS Effect form.
It further, should be according to practical HASS cross-sectional data and object when in step 1 to subjects progress grid dividing Characteristic concentrates stress and vulnerable position refines, and is modified to model according to practical HASS cross-sectional data, to establishing Model carry out simulation analysis respectively according to the load loading method of practical HASS, by comparative test result, find out which ginseng Variation relation between number and analysis result, is finely adjusted parameter, carries out Modifying model.
Further, the temperature working limit of the working limit and vibration working limit;
Temperature working limit includes temperature high-low limit and warm variability;
Vibrate working limit, magnitude and time of vibration including random vibration.
Further, the damage factor is obtained respectively in the case where different magnitude of temperature and vibration stress are horizontal;
The remaining life using highly accelerated stress screeningtest is utilized another object of the present invention is to provide a kind of The application method of assessment and the electric elements of analysis method for reliability, the application methods of the electric elements the following steps are included:
Step 1, using HALT the and HASS test data of exemplar, analysis shows the failure mode of electromechanical assemblies is first device Part performance failure, screw thread pair fall off, the fracture of component pin;
Step 2, simulation modeling, concentrates stress and vulnerable position carries out continuous stress and deformation data acquires, Solid modelling is carried out to subjects using finite element analysis software, to pin, solder joint position, screw thread pair application finite element software Grid subdivision function, choose and need to carry out the position of grid subdivision, setting needs the horizontal parameters segmented, completes in software Mesh refinement, and comparative test result, are modified model;It is 23Grms by vibration mark in modified simulation model, The temperature damage limit is -50 DEG C~80 DEG C, according to the comparative analysis of emulation and HASS test result, adjusts answering in simulation model Power loads parameter;
Step 3, using stress loading parameter obtained in step 3, using progressive damage theory, according to simulation analysis knot Fruit carries out damage factor calculating;
Step 4, Reliability modeling, onset index Weibull Function model;
Step 5, the damage factor obtained according to step 3 and the reliability analysis model established in step 4, obtain not With the equivalent lifetime under stress level, reliability model distribution inspection is carried out to test specimen;
Step 6, the damage factor at temperature and vibration stress according to obtained in step 3 construct the complex damage factor, Equivalent lifetime is calculated, using the reliability model distribution inspection in step 6 as a result, obtaining the reliability model under HASS section, Residual life evaluation and fail-safe analysis are carried out to the electronic product by HASS test;
Further, in step 2, final adjustment stress value parameter is as follows: the range for taking temperature cycles is -50 DEG C~80 DEG C, initial temperature is 20 DEG C of room temperature, and warm variability is 60 DEG C/min, and temperature cycles are 2 times/circulation, the Initial Quantity Order of random vibration For 5Grms, highest magnitude is 10Grms, residence time 10min;
Further, the reliability model under obtained HASS section last in step 6 is index Weibull model, Model parameter is as follows: location parameter μ=5714.422, form parameter α=1.15, form parameter γ=3.3, and scale parameter η= 1994.047.After a HASS section, the remaining life percentage of electric appliance component is p=0.9914, reliability R= 0.994。
Another object of the present invention is to provide a kind of residual life evaluations using the highly accelerated stress screeningtest With the automatic switchover electric appliance of analysis method for reliability.
Another object of the present invention is to provide a kind of residual life evaluations using the highly accelerated stress screeningtest With the non-automatic switching electric appliance of analysis method for reliability.
In conclusion advantages of the present invention and good effect are as follows: actual loading test, the remaining life of existing HASS test are commented The method of estimating is that stress loading is repeated by actual loading test to obtain;And method of the invention is directly calculated really by reliability model Fixed, consumption in kind can reduce 80% or more;The remaining life of the quantization of HASS reliability, existing HASS test determines that method lacks Accurate quantizating index can not provide corresponding reliability;Method of the invention calculates remaining life using reliability method, with This can provide corresponding reliability with accurate quantizating index.
Detailed description of the invention
Fig. 1 is residual life evaluation and the fail-safe analysis side of highly accelerated stress screeningtest provided in an embodiment of the present invention Method flow chart.
Fig. 2 is practical HASS section instance graph provided in an embodiment of the present invention.
Specific embodiment
In order to make the objectives, technical solutions, and advantages of the present invention clearer, with reference to embodiments, to the present invention It is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, it is not used to Limit the present invention.
For it is existing it is high accelerate the experimentation cost of screening test life appraisal high, and precision and the lower problem of reliability. Method of the invention calculates remaining life using reliability method, with this with accurate quantizating index, and can provide phase The reliability answered.
Application principle of the invention is explained in detail with reference to the accompanying drawing.
As shown in Figure 1, the residual life evaluation and reliability of highly accelerated stress screeningtest provided in an embodiment of the present invention Analysis method the following steps are included:
S101: the existing HASS section of analysis exemplar and HALT experimental result carry out exemplar respectively and have carried out respectively at random Vibration test and combined environment test, the results showed that the main failure forms of electromechanical assemblies are component performance failure, screw thread pair It falls off, the fracture of component pin;
S102: simulation modeling concentrates stress and vulnerable position carries out continuous stress and deformation data acquires, right Stress is concentrated and vulnerable position carries out continuous stress and deformation data acquisition, using finite element analysis software to test pair As carry out solid modelling, to pin, solder joint position, screw thread pair application finite element software grid subdivision function, choose need into The position of row grid subdivision, setting need the horizontal parameters segmented, complete mesh refinement, and comparative test result in software, Model is modified;Modified model is loaded according to the general type that HASS is tested, and analyzes the failure shape of subjects Formula and destruction position determine the limit of rupture and the work pole of subjects with reference to a small amount of HALT test result in step S101 Limit;
S103: using stress loading parameter obtained in S102, using progressive damage theory, according to simulation analysis result into Row damage factor calculates;
S104: Reliability modeling, in view of the diversity of analysis method for reliability, before Reliability modeling, with reference to step Failure mode analysis (FMA) in one selects suitable reliability analysis model as a result, on the basis of failure mode analysis (FMA);
S105: it according to reliability analysis model S104 obtained damage factor and established in step 5, obtains difference and answers Equivalent lifetime under power level carries out reliability model distribution inspection to test specimen;
S106: the damage factor at temperature and vibration stress according to obtained in S103 constructs the complex damage factor, calculates Equivalent lifetime, using the reliability model distribution inspection in S105 as a result, the reliability model under HASS section is obtained, to process The electronic product of HASS test carries out residual life evaluation, obtains remaining life and is obtained by distribution function, and can provide phase The reliability answered.
The building method of highly accelerated stress screeningtest section of the invention, including analysis HASS data and a small amount of HALT Data, the final residue lifetime estimation method for realizing HASS test.
The present invention refers to the reliability method of general remaining life, then by HASS data and HALT test between emulation Comparative result carries out the further adjustment of loading stress, and finally determining remaining life has reliability index, and specific steps are such as Under:
Step 1: the existing HASS section of analysis exemplar and HALT experimental result, carry out respectively exemplar carried out respectively with Machine vibration test and combined environment test, the results showed that the main failure forms of electromechanical assemblies are component performance failure, screw thread Pair falls off, the fracture of component pin;
Step 2: simulation modeling, the residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest are corresponding Power is concentrated and vulnerable position carries out continuous stress and deformation data acquisition, using finite element analysis software to subjects Carry out solid modelling, to pin, solder joint position, screw thread pair application finite element software grid subdivision function, choose need to carry out The position of grid subdivision, setting needs the horizontal parameters segmented, completes mesh refinement, and comparative test result in software, right Model is modified;Modified model is loaded according to the general type that HASS is tested, and analyzes the failure mode of subjects And it destroys position and determines the limit of rupture of subjects with reference to a small amount of HALT test result in step 1;
Step 3, using stress loading parameter obtained in step 2, using progressive damage theory, according to simulation analysis knot Fruit carries out damage factor calculating, and damage factor is obtained by MINER progressive damage criterion;
Step 4, Reliability modeling before Reliability modeling, need pair in view of the diversity of analysis method for reliability The failure mode of subjects carries out arranging statistics and analysis, and the failure mode of subjects can lead to step 1 and obtain, lose On the basis of imitating pattern analysis, suitable reliability analysis model is selected, there are commonly following several: distribution function method (including Exponential distribution, two/three-parameter Weibull distribution, normal distribution, logarithm normal distribution etc.);Stress-strength Interference is theoretical;Name Stress method, ess-strain method etc.;
Step 5, the damage factor obtained according to step 3 and the reliability analysis model established in step 4, obtain not With the equivalent lifetime under stress level, equivalent lifetime is converted according to NELSON equivalent rule, carries out reliability mould to test specimen Type distribution inspection;
Step 6, the damage factor at temperature and vibration stress according to obtained in step 3 construct the complex damage factor, Equivalent lifetime is calculated, using the reliability model distribution inspection in step 5 as a result, obtaining the index Weibull under HASS section Model carries out residual life evaluation to the electronic product by HASS test, obtains remaining life and obtained by distribution function, and Corresponding reliability can be provided;
Below using a typical electromechanical assemblies as subjects, the use of method is further described.Selected The shell of typical electromechanical assemblies is full aluminium cabinet, and fixation is bolted in the built-in circuit board with enlarging function, specific point Analysis process is as follows.
Step 1: the existing HASS section of analysis exemplar and HALT experimental result, carry out respectively exemplar carried out respectively with Machine vibration test and combined environment test, the results showed that the main failure forms of electromechanical assemblies are component performance failure, screw thread Pair falls off, the fracture of component pin;
Step 2: simulation modeling concentrates stress and vulnerable position carries out continuous stress and deformation data acquires, Solid modelling is carried out to subjects using finite element analysis software, to pin, solder joint position, screw thread pair application finite element software Grid subdivision function, choose and need to carry out the position of grid subdivision, setting needs the horizontal parameters segmented, completes in software Mesh refinement, and comparative test result, are modified model;Modified model is added according to the general type that HASS is tested It carries, analyze the failure mode of subjects and destroys position, with reference to a small amount of HALT test result in step 1, determine test pair The limit of rupture of elephant;Finally determining stress loading parameter is as follows: the range of temperature cycles is -50 DEG C~80 DEG C, initial temperature It is 20 DEG C of room temperature, warm variability is 60 DEG C/min, and temperature cycles are 2 times/circulation, and the Initial Quantity Order of random vibration is 5Grms, highest Magnitude is 10Grms, residence time 10min;
Step 3 is carried out using progressive damage theory according to simulation analysis result using the loading stress parameter of step 2 Damage factor calculates, and damage factor is obtained by MINER progressive damage criterion;
Step 4, Reliability modeling before Reliability modeling, need pair in view of the diversity of analysis method for reliability The failure mode of subjects carries out arranging statistics and analysis, and the failure mode of subjects can be obtained by step 1, On the basis of failure mode analysis (FMA), suitable reliability analysis model is selected, there are commonly following several: distribution function method (packet Include exponential distribution, two/three-parameter Weibull distribution, normal distribution, logarithm normal distribution etc.);Stress-strength Interference is theoretical;Name Adopted stress method, ess-strain method etc.;
Step 5, the damage factor obtained according to step 3 and the reliability analysis model established in step 4, obtain not With the equivalent lifetime under stress level, equivalent lifetime is converted according to NELSON equivalent rule, carries out reliability mould to test specimen Type distribution inspection;
Step 6, the damage factor at temperature and vibration stress according to obtained in step 3 construct the complex damage factor, Calculate equivalent lifetime, using the reliability model distribution inspection in step 5 as a result, under last obtained HASS section can It is index Weibull model by property model, model parameter is as follows: location parameter μ=5714.422, form parameter α=1.15, shape Shape parameter m=3.3, scale parameter η=1994.047.After a HASS section, the remaining life percentage p of electric appliance component =0.9914, reliability R=0.994.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all in essence of the invention Made any modifications, equivalent replacements, and improvements etc., should all be included in the protection scope of the present invention within mind and principle.

Claims (10)

1. the residual life evaluation and analysis method for reliability of a kind of highly accelerated stress screeningtest, which is characterized in that the height The residual life evaluation of accelerated stress screening test includes: with analysis method for reliability
Step 1 carries out solid modelling using finite element analysis software, respectively to resistance, capacitor, inductance, integrated circuit, electrical Connector, pad, conducting wire connection, mechanical attachment, circuit board and cabinet carry out Geometric Modeling;
Step 2 loads modified model according to the result that HASS is tested, and temperature and vibration stress are using circulation and step It is loaded into mode;
Step 3 calculates the damage factor under two kinds of stress and equivalent longevity according to the simulation result at temperature and vibration stress Life;
Step 4 carries out screening object failure mode and equivalent lifetime to arrange statistics and analysis, selects reliability distribution models;
Step 5 constructs the synthesis progressive damage factor under temperature and vibration stress, calculates equivalent lifetime, obtains under HASS section Reliability model, residual life evaluation and fail-safe analysis are carried out to the object by HASS test.
2. the residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest as described in claim 1, special Sign is, needs to concentrate stress before carrying out solid modelling using finite element analysis software and vulnerable position connects Continuous stress and deformation data acquisition utilize the test process and as a result, the performance including subjects, failure mode of HASS.
3. highly accelerated stress screeningtest residual life evaluation as described in claim 1 and analysis method for reliability, feature It is, it should be according to practical HASS cross-sectional data and plant characteristic to stress when in step 1 to subjects progress grid dividing Concentrate and the refinement of vulnerable position, model be modified according to practical HASS cross-sectional data, to established model according to The load loading method of practical HASS carries out simulation analysis respectively, and by comparative test result, which parameter and analysis knot found out Variation relation between fruit, is finely adjusted parameter, carries out Modifying model.
4. highly accelerated stress screeningtest residual life evaluation as described in claim 1 and analysis method for reliability, feature It is, the temperature working limit and vibration working limit of the working limit;
Temperature working limit includes temperature high-low limit and warm variability;
Vibrate working limit, magnitude and time of vibration including random vibration.
5. the residual life evaluation and analysis method for reliability of highly accelerated stress screeningtest as described in claim 1, special Sign is that the damage factor is obtained respectively in the case where different magnitude of temperature and vibration stress are horizontal.
6. a kind of utilize the residual life evaluation and the fail-safe analysis side that use highly accelerated stress screeningtest described in claim 1 The application method of the electric elements of method, which is characterized in that the application methods of the electric elements the following steps are included:
Step 1, using HALT the and HASS test data of exemplar, analysis shows the failure mode of electromechanical assemblies is component It can fail, screw thread pair falls off, the fracture of component pin;
Step 2, simulation modeling, concentrates stress and vulnerable position carries out continuous stress and deformation data acquires, and uses Finite element analysis software to subjects carry out solid modelling, to pin, solder joint position, screw thread pair application finite element software net Lattice segment function, choose the position for needing to carry out grid subdivision, and setting needs the horizontal parameters segmented, completes grid in software Refinement, and comparative test result, are modified model;It is 23Grms, temperature by vibration mark in modified simulation model The limit of rupture is -50 DEG C~80 DEG C, and according to the comparative analysis of emulation and HASS test result, the stress adjusted in simulation model adds Carry parameter;
Step 3, using stress loading parameter obtained in step 3, using progressive damage theory, according to simulation analysis result into Row damage factor calculates;
Step 4, Reliability modeling, onset index Weibull Function model;
Step 5, the damage factor obtained according to step 3 and the reliability analysis model established in step 4, obtain difference and answer Equivalent lifetime under power level carries out reliability model distribution inspection to test specimen;
Step 6, the damage factor at temperature and vibration stress according to obtained in step 3 construct the complex damage factor, calculate Equivalent lifetime, using the reliability model distribution inspection in step 6 as a result, the reliability model under HASS section is obtained, to warp The electronic product for crossing HASS test carries out residual life evaluation and fail-safe analysis.
7. the application method of electric elements as claimed in claim 6, which is characterized in that in step 2, final adjustment stress Value parameter is as follows: the range for taking temperature cycles is -50 DEG C~80 DEG C, and initial temperature is 20 DEG C of room temperature, and warm variability is 60 DEG C/min, Temperature cycles are 2 times/circulation, and the Initial Quantity Order of random vibration is 5Grms, and highest magnitude is 10Grms, and the residence time is 10min。
8. the application method of electric elements as claimed in claim 6, which is characterized in that last in step 6 to obtain Reliability model under HASS section is index Weibull model, and model parameter is as follows: location parameter μ=5714.422, shape Parameter alpha=1.15, form parameter γ=3.3, scale parameter η=1994.047.After a HASS section, electric appliance component Remaining life percentage is p=0.9914, reliability R=0.994.
9. a kind of residual life evaluation using highly accelerated stress screeningtest described in Claims 1 to 5 any one and reliable The automatic switchover electric appliance of property analysis method.
10. a kind of residual life evaluation using highly accelerated stress screeningtest described in Claims 1 to 5 any one and reliable The non-automatic switching electric appliance of property analysis method.
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Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110222428A (en) * 2019-06-10 2019-09-10 哈尔滨工程大学 A kind of reliability analysis system and method for system-oriented grade encapsulation SIP device
CN110260907A (en) * 2019-07-11 2019-09-20 中国电子科技集团公司第四十九研究所 A kind of temperature stress no-failure acceleration service life test method for sensor
CN110988531A (en) * 2019-11-28 2020-04-10 上海新时达电气股份有限公司 High-acceleration stress screening method of frequency converter
CN111060795A (en) * 2019-11-22 2020-04-24 中国空间技术研究院 Method for evaluating extreme low-temperature characteristics of CMOS (complementary Metal oxide semiconductor) device
CN111579972A (en) * 2020-07-03 2020-08-25 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Service life detection method for PCBA board-level component
CN113092911A (en) * 2021-04-07 2021-07-09 西安苏试广博环境可靠性实验室有限公司 Temperature acceleration reference stress determination method in space electronic equipment acceleration life test
CN113515810A (en) * 2021-05-17 2021-10-19 中车长春轨道客车股份有限公司 Motor train unit bogie design and development method based on reliability and safety analysis
CN113732617A (en) * 2021-11-08 2021-12-03 滨州学院 Workpiece damage repairing method and device and electronic equipment
CN113970436A (en) * 2021-11-12 2022-01-25 北京亿华通科技股份有限公司 Fatigue performance testing method for fuel cell cantilever support
CN114580118A (en) * 2022-03-25 2022-06-03 兰州空间技术物理研究所 Quantitative evaluation method for service life and reliability of ion thruster
CN116306179A (en) * 2023-05-22 2023-06-23 湖南云箭科技有限公司 Load screening method and system for impact damage evaluation of airborne store lifting

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102556365A (en) * 2011-12-21 2012-07-11 西安航空制动科技有限公司 Accelerated life test method of aircraft brake system
JP2013050377A (en) * 2011-08-31 2013-03-14 National Institute Of Advanced Industrial & Technology Non-destructive inspection apparatus with life or remaining life evaluation function
CN104182603A (en) * 2013-05-24 2014-12-03 上海空间电源研究所 Reliability evaluation method for long-service-life and high-reliability electronic product
CN104899372A (en) * 2015-06-03 2015-09-09 西安电子科技大学 Construction method for highly accelerated stress screening test section by combining simulation and reliability analysis

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013050377A (en) * 2011-08-31 2013-03-14 National Institute Of Advanced Industrial & Technology Non-destructive inspection apparatus with life or remaining life evaluation function
CN102556365A (en) * 2011-12-21 2012-07-11 西安航空制动科技有限公司 Accelerated life test method of aircraft brake system
CN104182603A (en) * 2013-05-24 2014-12-03 上海空间电源研究所 Reliability evaluation method for long-service-life and high-reliability electronic product
CN104899372A (en) * 2015-06-03 2015-09-09 西安电子科技大学 Construction method for highly accelerated stress screening test section by combining simulation and reliability analysis

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
孙玉玉: "高加速应力筛选剖面验证技术分析", 《环境试验》 *
樊强: "高加速寿命试验和高加速应力筛选试验技术综述", 《电子产品可靠性与环境试验》 *

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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CN110260907A (en) * 2019-07-11 2019-09-20 中国电子科技集团公司第四十九研究所 A kind of temperature stress no-failure acceleration service life test method for sensor
CN110260907B (en) * 2019-07-11 2021-07-16 中国电子科技集团公司第四十九研究所 Temperature stress failure-free accelerated life test method for sensor
CN111060795B (en) * 2019-11-22 2022-03-04 中国空间技术研究院 Method for evaluating extreme low-temperature characteristics of CMOS (complementary Metal oxide semiconductor) device
CN111060795A (en) * 2019-11-22 2020-04-24 中国空间技术研究院 Method for evaluating extreme low-temperature characteristics of CMOS (complementary Metal oxide semiconductor) device
CN110988531A (en) * 2019-11-28 2020-04-10 上海新时达电气股份有限公司 High-acceleration stress screening method of frequency converter
CN110988531B (en) * 2019-11-28 2022-06-28 上海新时达电气股份有限公司 High-acceleration stress screening method of frequency converter
CN111579972A (en) * 2020-07-03 2020-08-25 中国电子产品可靠性与环境试验研究所((工业和信息化部电子第五研究所)(中国赛宝实验室)) Service life detection method for PCBA board-level component
CN113092911A (en) * 2021-04-07 2021-07-09 西安苏试广博环境可靠性实验室有限公司 Temperature acceleration reference stress determination method in space electronic equipment acceleration life test
CN113092911B (en) * 2021-04-07 2023-08-15 西安苏试广博环境可靠性实验室有限公司 Temperature acceleration reference stress determination method in accelerated life test of space electronic equipment
CN113515810A (en) * 2021-05-17 2021-10-19 中车长春轨道客车股份有限公司 Motor train unit bogie design and development method based on reliability and safety analysis
CN113515810B (en) * 2021-05-17 2022-08-26 中车长春轨道客车股份有限公司 Motor train unit bogie design and development method based on reliability and safety analysis
CN113732617A (en) * 2021-11-08 2021-12-03 滨州学院 Workpiece damage repairing method and device and electronic equipment
CN113732617B (en) * 2021-11-08 2022-03-15 滨州学院 Workpiece damage repairing method and device and electronic equipment
CN113970436A (en) * 2021-11-12 2022-01-25 北京亿华通科技股份有限公司 Fatigue performance testing method for fuel cell cantilever support
CN113970436B (en) * 2021-11-12 2023-11-14 北京亿华通科技股份有限公司 Fatigue performance testing method for fuel cell cantilever bracket
CN114580118A (en) * 2022-03-25 2022-06-03 兰州空间技术物理研究所 Quantitative evaluation method for service life and reliability of ion thruster
CN114580118B (en) * 2022-03-25 2023-12-15 兰州空间技术物理研究所 Quantitative evaluation method for service life and reliability of ion thruster
CN116306179A (en) * 2023-05-22 2023-06-23 湖南云箭科技有限公司 Load screening method and system for impact damage evaluation of airborne store lifting
CN116306179B (en) * 2023-05-22 2023-09-12 湖南云箭科技有限公司 Load screening method and system for impact damage evaluation of airborne store lifting

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