CN109324229B - Micro resistor detection device and detection method - Google Patents
Micro resistor detection device and detection method Download PDFInfo
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- CN109324229B CN109324229B CN201810457783.4A CN201810457783A CN109324229B CN 109324229 B CN109324229 B CN 109324229B CN 201810457783 A CN201810457783 A CN 201810457783A CN 109324229 B CN109324229 B CN 109324229B
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- 238000001514 detection method Methods 0.000 title claims abstract description 78
- 239000000523 sample Substances 0.000 claims abstract description 85
- 238000003384 imaging method Methods 0.000 claims abstract description 46
- 238000007639 printing Methods 0.000 claims abstract description 19
- 238000000034 method Methods 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims 6
- 238000006073 displacement reaction Methods 0.000 abstract description 3
- 238000007689 inspection Methods 0.000 description 6
- 239000000758 substrate Substances 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 239000000969 carrier Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
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- Measurement Of Resistance Or Impedance (AREA)
Abstract
A micro-resistance detection device and a detection method are provided, the detection device comprises a base, a mechanical arm, a detection seat, a driving mechanism, a probe seat group and a plurality of micro-imaging devices. The mechanical arm is arranged on the base. The detecting seat is connected with the mechanical arm and can be driven by the mechanical arm to generate displacement. The probe seat is assembled at the bottom of the detection seat and comprises two oppositely arranged probe seats and a pair of probes arranged on the two probe seats, and at least one probe seat is connected with the driving mechanism and is controlled by the driving mechanism to change the distance between the two probe seats. The plurality of microscopic imaging devices are used for identifying the relative position and the printing offset angle of the micro resistor of a micro resistor carrier plate to be detected, so that the mechanical arm can adjust the detection position of the pair of probes according to the relative position and the printing offset angle.
Description
Technical Field
The present invention relates to a detection device, and more particularly, to a micro resistor detection device and a detection method.
Background
With the advancement of technology, the circuit boards of thin, small and multifunctional electronic products, such as smart phones, tablet computers, rf transceiver modules, micro hard disk drives, and memory cards, all need to use micro resistors to achieve high-density packaging.
The size of the micro resistor is different according to the requirement, for example, the 0201 type micro resistor, the size of which is 0.6mm multiplied by 0.3mm, belongs to the micro resistor with larger size and is suitable for the application needing the small thick film chip resistor; the 01005 type micro resistor has the size of 0.4mm multiplied by 0.2mm, the end electrode width of only 0.05mm, and is suitable for the application of the resistor needing the extremely small thick film chip; 0075 the miniature resistor has a size of 0.3mm × 0.15mm, which is 44% smaller than 01005 miniature resistor, and is more suitable for application requiring ultra-small thick film chip resistor.
In the prior art, a plurality of micro resistors (e.g. hundreds or more) are usually formed on a substrate by printing technology to form a micro resistor carrier, and then the micro resistor carrier is separated into individual micro resistors in the form of folded strips and folded particles by laser scribing. In response to the quality control requirement, manufacturers need to perform resistance value detection on the micro resistor carrier. However, taking the detection of 0201 type resistance as an example of the known technology, it is necessary to assist the quality control person to visually detect the resistance value via the CCD. However, the prior art detection method has a large error value of the detection result and cannot accurately contact the resistor position, so that the detection yield and efficiency are poor; the probe of the detection device is only suitable for detecting the miniature resistor with a single size, and if the miniature resistors with other sizes are to be detected, the detection can be carried out by manually adjusting the position of the probe again, which wastes time and labor.
Therefore, it is necessary to provide a micro resistor detection device and a detection method to solve the problems of the prior art.
Disclosure of Invention
The invention aims to provide a micro resistor detection device, which can improve the accuracy of a probe contacting with a terminal electrode of a resistor, reduce the measurement error of the micro resistor, automatically match with micro resistors with different sizes for detection and improve the detection yield and efficiency.
Another objective of the present invention is to provide a method for detecting a micro resistor, which can provide rotation correction during the automatic resistor detection, so as to improve the accuracy of the probe contacting the terminal electrode of the resistor, reduce the measurement error of the micro resistor, and improve the yield and efficiency of the detection.
To achieve the above object, the present invention provides a micro resistance detection device, comprising: a base; a mechanical arm arranged on the base; a detecting seat connected with the mechanical arm and driven by the mechanical arm to generate displacement; the driving mechanism is arranged at the bottom of the detection seat; a probe seat group which is arranged at the bottom of the detection seat and comprises two probe seats and a pair of probes which are oppositely arranged, wherein at least one probe seat is connected with the driving mechanism and is controlled by the driving mechanism to do linear motion so as to change the distance between the two probe seats; the probes are respectively arranged on the two probe seats and are opposite to each other; and the microscopic image devices are used for identifying the relative position and the printing offset angle of the micro resistor on the micro resistor carrier plate to be detected, so that the mechanical arm can adjust the detection position of the pair of probes according to the relative position and the printing offset angle.
In an embodiment of the present invention, the plurality of microscopic imaging devices include: a first microscopic imaging device installed on the detection seat and having a shooting angle parallel to the rotation axis of the second motor; a second microscopic imaging device installed on the detection seat and having a shooting angle coaxial with the rotating shaft of the second motor; and a third microscopic imaging device installed on the detection seat, wherein the shooting angle of the third microscopic imaging device forms an angle with the rotating shaft of the second motor.
In an embodiment of the present invention, the driving mechanism is composed of at least one stepping motor; at least one probe seat of the probe seat set is connected with the rotating shaft of the driving mechanism, and can move linearly along the rotating shaft by the rotation of the rotating shaft of the driving mechanism to change the distance between the two probe seats.
In an embodiment of the present invention, a first motor and a second motor are respectively disposed at two ends of the robot arm, and the robot arm rotates relative to the base with a rotating shaft of the first motor as an axis; the detecting base is connected to the second motor and rotates relative to the robot arm with the shaft of the second motor as the axis.
In one embodiment of the present invention, the first microscopic imaging device is provided with an annular light source; the second microscopic imaging device has the same center of photographing as the center of symmetry of the pair of probes; the third microscopic imaging device has the same center of imaging as the center of symmetry of the pair of probes.
In an embodiment of the present invention, the third microscopic imaging device has a photographing angle of 45 degrees with respect to the rotation axis of the second motor.
In an embodiment of the invention, the micro resistor detection device further includes a bearing seat having a square recess for bearing the micro resistor.
In an embodiment of the present invention, the carrying base has a plurality of vacuum suction holes, and a square area surrounded by the vacuum suction holes is smaller than an area of the square recess.
The invention also provides a micro-resistor detection method, which comprises the following steps: s1: identifying the micro resistor at least at three points on a micro resistor carrier plate; s2: calculating the relative positions and printing offset angles of all the micro resistors according to the relative positions of the micro resistors at the at least three points; s3: adjusting the detection positions of a pair of probes according to the relative positions of all the micro resistors and the printing offset angle to enable the pair of probes to offset to match the printing offset angle; s4: driving the probes to press and selectively contact the terminal electrode of one of the micro resistors according to the relative positions of all the micro resistors so as to detect the resistance value of the micro resistors; s5: under the condition that the resistance value can not be detected, further identifying the position of the micro resistor to be detected currently, and correcting the detection position of the pair of probes according to the identification result; s6: and step S4 is continued until the micro resistors of a certain number are detected, and the micro resistor detection of the micro resistor carrier plate is completed.
In an embodiment of the invention, the micro resistors at the at least three points are micro resistors located at three corners of the micro resistor carrier.
Therefore, the micro resistor detection device and the detection method of the invention can identify the relative position of the micro resistor or the rotation angle caused by the printing error, and further adjust the relative horizontal or vertical position of the probe, so as to improve the automation and accuracy of the micro resistor detection.
Drawings
FIG. 1 is a first perspective view of a micro resistor detection device according to a preferred embodiment of the present invention.
FIG. 2 is a second perspective view of the micro-resistor detecting device according to a preferred embodiment of the present invention.
FIG. 3 is a partially enlarged perspective view of a micro resistor detection device according to a preferred embodiment of the present invention.
FIG. 4 is a partially enlarged perspective view of a micro resistor detection device according to a preferred embodiment of the present invention.
FIG. 5 is a flowchart illustrating the steps of a method for detecting a micro resistor according to a preferred embodiment of the present invention.
Description of the symbols
Base 1
Probe holder group 4
Probe holder 40
Probe 41
First microscopic imaging device 51
Second microscopic imaging device 52
Third microscopic imaging device 53
Ring-shaped light source 6
Square recess 71
Miniature resistor carrier 9
Micro-resistor 91
Steps S1 to S6.
Detailed Description
Referring to fig. 1, fig. 2, fig. 3 and fig. 4, a micro resistance detecting device according to a preferred embodiment of the invention is shown. The micro resistor detection device mainly comprises a base 1, a mechanical arm 2, a detection seat 3, at least one driving mechanism 23, a probe seat group 4 and a plurality of micro image devices (51, 52 and 53), and can be used for detecting a micro resistor on a micro resistor support plate 9. As shown in fig. 4, the micro resistor carrier 9 includes a substrate 90 and a plurality of micro resistors 91 printed on the substrate 90, wherein the plurality of micro resistors 91 are arranged in a matrix.
As shown in fig. 1 and fig. 2, the robot 2 is mounted on the base 1, in this embodiment, a first motor 21 and a second motor 22 are respectively disposed at two ends of the robot 2, and the robot 2 can rotate relative to the base 1, for example, clockwise or counterclockwise, by taking a rotating shaft of the first motor 21 as an axis.
The detecting seat 3 is connected to the robot 2 and can be driven by the robot 2 to generate displacement. In this embodiment, the detecting base 3 is connected to the second motor 22 of the robot 2, i.e. the other end of the rotation shaft of the robot 2, and can rotate relative to the robot 2 by using the rotation shaft of the second motor 22 as the axis. The first motor 21 and the second motor 22 of the robot arm 2 are driven to cause the inspection stand 3 to be vertically and horizontally displaced.
The driving mechanism 23 is installed at the bottom of the detecting base 3, in this embodiment, the driving mechanism 23 may be composed of at least a stepping motor and a sliding table, and the positioning repeatability is, for example, below 10 μm.
The probe seat set 4 is installed at the bottom of the inspection seat 3 and includes two probe seats 40 and a pair of probes 41, wherein at least one probe seat 40 is connected to the driving mechanism 23 and is controlled by the driving mechanism 23 to perform linear motion to change the distance between the two probe seats 40. The pair of probes 41 are respectively disposed on the two probe holders 40 to face each other. The distance between the pair of probes 41 is preferably set to the length of the micro-resistor 90 to be detected. The pair of probes 41 are used to contact the two end electrodes of the micro resistor 90 respectively to detect the resistance value thereof. In one embodiment, the driving mechanism 23 may include two stepping motors respectively connected to the two oppositely disposed probe holders 40, so that the two probe holders 40 can be controlled by the driving mechanism 23 to perform linear motion to change the relative distance thereof, thereby responding to the micro resistors with different sizes.
The plurality of microscopic imaging devices (51, 52, 53) includes a first microscopic imaging device 51, a second microscopic imaging device 52, and a third microscopic imaging device 53. The plurality of microscopic imaging devices (51, 52, 53) can be realized by an imaging lens having, for example, a photosensitive coupled device (CCD).
The first microscopic imaging device 51 is installed on the inspection base 3, and its shooting angle is parallel to the rotation axis of the second motor 22. By using the first micro-imaging device 51 to identify the micro resistors 91 at least three corners of the micro resistor carrier 9, the micro resistor inspection device of the embodiment of the invention can determine the relative positions and the printing offset angles of all the micro resistors 91 printed on the substrate 90, and further control the robot arm 2 to adjust the orientation of the probe holder set 4, so that the pair of probes 41 can be aligned to the two end electrodes of the micro resistor 91 to be inspected on the micro resistor carrier 9. The first micro-imaging device 51 may be further provided with a ring-shaped light source 6 to enhance the recognition capability of the first micro-imaging device 51.
The second microscopic imaging device 52 is installed on the inspection base 3, and the shooting angle thereof is coaxial with the rotation axis of the second motor 22, so as to assist in identifying the horizontal relative position of the pair of probes 41, and provide the robot arm 2 with the capability of fine-tuning the horizontal relative position of the pair of probes 41. The center of the second microscopic imaging device 52 can be the same as the center of symmetry of the pair of probes 41 to enhance the recognition accuracy of the second microscopic imaging device.
The third microscopic imaging device 53 is installed on the inspection base 3, and the photographing angle thereof forms an angle with the rotation axis of the second motor 22, so as to assist in identifying the vertical relative position of the pair of probes 41, and provide the robot arm 2 to finely adjust the vertical relative position of the pair of probes 41. The center of the third microscopic imaging device 53 can be the same as the center of symmetry of the pair of probes 41 to enhance the accuracy of the third microscopic imaging device. Preferably, the angle of the third microscopic imaging device 53 is 45 degrees to the rotation axis of the second motor 22.
In the present embodiment, the micro resistor detection apparatus further includes a carrying seat 7 having a square recess 71 for carrying the micro resistor carrier 9. The carrying base 7 can be installed with a plurality of vacuum suction holes 72, and the vacuum suction holes 72 can suck air by installing a suction device below to form a suction force to suck the carried micro-resistor carrier 9, so as to enhance the stability of the micro-resistor carrier 9. Preferably, the area of the square surrounded by the vacuum suction holes 72 is smaller than the area of the square recess 71. Therefore, the micro resistor detection device of the embodiment of the invention can be simultaneously applied to the resistance detection of the micro resistor carriers 9 with different sizes. The area of the square recess 71 can be selected to be the same as the area of the larger-sized micro-resistor carrier. The square area surrounded by the vacuum suction holes 72 can be selected to be the same as the area of the miniature resistor carrier with smaller size.
During detection, a micro resistor carrier 9 to be detected is placed on the bearing seat 7, then the relative position and the printing offset angle of the micro resistor 91 of the micro resistor carrier 9 are identified and judged through the plurality of micro image devices (51, 52, 53), and the mechanical arm 2 and the driving mechanism 23 adjust the positions of the pair of probes 41 according to the identification result so as to match the offset angle of the micro resistor 9; then, the robot arm 2 drives the pair of probes 41 to sequentially press the terminal electrodes of the micro-resistor 91 according to the determined relative position of the micro-resistor 91 on the micro-resistor carrier 9, so as to detect the resistance value. If the probes 41 are driven to press down and no resistance value can be measured, the third microscopic imaging device 53 is further controlled to perform a second identification on the relative position of the micro-resistor 91, so as to correct the position of the probes 41. Therefore, the micro resistor detection device of the present invention can effectively improve the accuracy of micro resistor detection.
Referring to fig. 5, the present invention further provides a micro resistor detection method implemented by the micro resistor detection apparatus, which includes the following steps:
s1: identifying the micro resistor at least at three points on a micro resistor carrier plate; preferably, the micro-resistors at the at least three point positions are micro-resistors located at three corner positions. The identification means is performed by a plurality of microscopic imaging means (51, 52, 53) of the micro-resistance detection device.
S2: and calculating the relative positions of all the micro resistors and the printing offset angle according to the relative positions of the micro resistors at the at least three points.
S3: and adjusting the positions of a pair of probes according to the relative positions of all the micro resistors and the printing offset angle, so that the pair of probes are offset to match the printing offset angle.
S4: and driving the probes to press and selectively contact the terminal electrode of one of the micro resistors according to the relative positions of all the micro resistors so as to detect the resistance value of the micro resistors.
S5: if the resistance value can not be detected, the position of the micro resistor to be detected is further identified, and the detection position of the pair of probes is corrected according to the identification result. Specifically, the micro resistor detection device controls the third micro imaging device 53 to perform a second image recognition on the relative position of the micro resistor 91 to be detected, so as to perform a second calibration on the detection position of the pair of probes.
S6: and step S4 is continued until the micro resistors of a certain number are detected, and the micro resistor detection of the micro resistor carrier plate is completed.
In summary, the micro resistor detection apparatus and the detection method of the present invention can identify the relative position of the micro resistor or the offset angle caused by the printing error, and further adjust the relative horizontal or vertical position of the probe, so as to improve the automation and accuracy of the micro resistor detection. In addition, the detection method can perform secondary correction of the detection position of the probe through secondary image recognition when the probe fails to detect the resistance value. Moreover, the micro-resistance detection device can automatically adjust the distance between the probes through the driving mechanism connected with the probe seat, so that the probes can be matched with micro-resistors with different sizes to greatly increase the application range of the micro-resistance detection device.
Although the present invention has been described with respect to the preferred embodiments, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention, and it is intended that the scope of the invention be defined by the appended claims.
Claims (8)
1. A micro resistance detection device, comprising:
a base;
a mechanical arm, which is arranged on the base, wherein a first motor and a second motor are respectively arranged at two ends of the mechanical arm, and the mechanical arm rotates relative to the base by taking a rotating shaft of the first motor as an axis;
a detecting seat connected to the robot arm and driven by the robot arm to move, the detecting seat being connected to the second motor and rotating relative to the robot arm with the rotating shaft of the second motor as the axis;
the driving mechanism is arranged at the bottom of the detection seat;
a probe seat group which is arranged at the bottom of the detection seat and comprises two probe seats and a pair of probes which are oppositely arranged, wherein at least one probe seat is connected with the driving mechanism and is controlled by the driving mechanism to do linear motion so as to change the distance between the two probe seats; the probes are respectively arranged on the two probe seats and are opposite to each other; and
the micro-imaging devices are used for identifying the relative position and the printing offset angle of the micro resistor on the micro resistor carrier plate to be detected so that the mechanical arm can adjust the detection position of the pair of probes;
the plurality of microscopic imaging devices comprise:
a first microscopic imaging device installed on the detection seat and having a shooting angle parallel to the rotation axis of the second motor;
a second microscopic imaging device installed on the detection seat and having a shooting angle coaxial with the rotating shaft of the second motor; and
a third microscopic imaging device installed on the detection seat, wherein the shooting angle of the third microscopic imaging device forms an angle with the rotating shaft of the second motor.
2. The micro resistance testing device according to claim 1, wherein the driving mechanism comprises at least one stepping motor; at least one probe seat of the probe seat set is connected with the rotating shaft of the driving mechanism, and can move linearly along the rotating shaft by the rotation of the rotating shaft of the driving mechanism to change the distance between the two probe seats.
3. The micro resistance detecting device according to claim 1, wherein the first micro imaging device is provided with a ring-shaped light source; the second microscopic imaging device has the same center of photographing as the center of symmetry of the pair of probes; the third microscopic imaging device has the same center of imaging as the center of symmetry of the pair of probes.
4. The micro resistance testing device of claim 1, wherein the third microscopic imaging device is provided with an angle of 45 degrees with respect to the rotation axis of the second motor.
5. The device of claim 1, further comprising a carrier having a square recess for carrying the micro resistor.
6. The micro resistance testing device of claim 1, wherein the carrier has a plurality of vacuum holes, and the area of the square surrounded by the vacuum holes is smaller than the area of the square recess.
7. A micro resistance testing method using the micro resistance testing device according to any one of claims 1 to 6, the micro resistance testing method comprising the steps of:
s1: identifying the micro resistor at least at three points on a micro resistor carrier plate;
s2: calculating the relative positions and printing offset angles of all the micro resistors according to the relative positions of the micro resistors at the at least three points;
s3: adjusting the detection positions of a pair of probes according to the relative positions of all the micro resistors and the printing offset angle to enable the pair of probes to offset to match the printing offset angle;
s4: driving the probes to press and selectively contact the terminal electrode of one of the micro resistors according to the relative positions of all the micro resistors so as to detect the resistance value of the micro resistors;
s5: under the condition that the resistance value can not be detected, further identifying the position of the micro resistor to be detected currently, and correcting the detection position of the pair of probes according to the identification result;
s6: and step S4 is continued until the micro resistors of a certain number are detected, and the micro resistor detection of the micro resistor carrier plate is completed.
8. The method as claimed in claim 7, wherein the at least three micro resistors are at three corners of the micro resistor carrier.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW106125959A TWI640409B (en) | 2017-08-01 | 2017-08-01 | Micro resistance inspection device and inspection method thereof |
| TW106125959 | 2017-08-01 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109324229A CN109324229A (en) | 2019-02-12 |
| CN109324229B true CN109324229B (en) | 2020-09-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810457783.4A Active CN109324229B (en) | 2017-08-01 | 2018-05-14 | Micro resistor detection device and detection method |
Country Status (2)
| Country | Link |
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| CN (1) | CN109324229B (en) |
| TW (1) | TWI640409B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI697658B (en) * | 2019-03-05 | 2020-07-01 | 漢民科技股份有限公司 | Complex inspection system of image |
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| CN205353203U (en) * | 2015-11-02 | 2016-06-29 | 天津卡锐智科技发展有限公司 | Miniature resistance automatic testing of cell -phone machine |
| TW201723514A (en) * | 2011-07-26 | 2017-07-01 | 精工愛普生股份有限公司 | Electronic component carrying device and electronic component examination device |
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| CN101424870A (en) * | 2007-10-31 | 2009-05-06 | 鸿富锦精密工业（深圳）有限公司 | Lens seat testing device and method |
| CN102768013A (en) * | 2011-05-06 | 2012-11-07 | 姚福来 | Alignment method and device for pressing and touching circuit detection point of substrate by probe |
| TW201247374A (en) * | 2011-05-18 | 2012-12-01 | Hon Hai Prec Ind Co Ltd | Robot arm and detection device having same |
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Also Published As
| Publication number | Publication date |
|---|---|
| CN109324229A (en) | 2019-02-12 |
| TW201910081A (en) | 2019-03-16 |
| TWI640409B (en) | 2018-11-11 |
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